Semiconductor device, method for manufacturing the same, three-dimensional memory, and storage system
By forming annular grooves and widening the opening in the dielectric layer of the three-dimensional memory, the reliability problem of the sealing ring is solved, the yield and reliability of the device are improved, and the diffusion of fluorine-containing gas is reduced.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- YANGTZE MEMORY TECH CO LTD
- Filing Date
- 2022-05-24
- Publication Date
- 2026-06-12
AI Technical Summary
In the existing technology, the sealing ring formation process of three-dimensional memory has reliability issues, which affect the yield and reliability of the device.
By forming annular trenches in the dielectric layer and forming trench flares downwards at the top, and combining the trench flares with the etching steps to form the trench flares and openings, the filling quality of the trenches is improved. A two-step method is used to form deep holes to reduce the diffusion of fluorine-containing gases.
It improves the yield and reliability of the device, reduces the diffusion of fluorine-containing gas from the voids in the filling material, and improves the sealing effect of the sealing ring.
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Figure CN114999548B_ABST
Abstract
Citation Information
Patent Citations
US20120104564A1
US20210091103A1