Semiconductor device, method for manufacturing the same, three-dimensional memory, and storage system

By forming annular grooves and widening the opening in the dielectric layer of the three-dimensional memory, the reliability problem of the sealing ring is solved, the yield and reliability of the device are improved, and the diffusion of fluorine-containing gas is reduced.

CN114999548BActive Publication Date: 2026-06-12YANGTZE MEMORY TECH CO LTD
View PDF 2 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
YANGTZE MEMORY TECH CO LTD
Filing Date
2022-05-24
Publication Date
2026-06-12

AI Technical Summary

Technical Problem

In the existing technology, the sealing ring formation process of three-dimensional memory has reliability issues, which affect the yield and reliability of the device.

Method used

By forming annular trenches in the dielectric layer and forming trench flares downwards at the top, and combining the trench flares with the etching steps to form the trench flares and openings, the filling quality of the trenches is improved. A two-step method is used to form deep holes to reduce the diffusion of fluorine-containing gases.

Benefits of technology

It improves the yield and reliability of the device, reduces the diffusion of fluorine-containing gas from the voids in the filling material, and improves the sealing effect of the sealing ring.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN114999548B_ABST
    Figure CN114999548B_ABST
Patent Text Reader

Abstract

The application provides a semiconductor device, a manufacturing method thereof, a three-dimensional memory and a storage system. The manufacturing method of the semiconductor device comprises: forming a semiconductor structure, the semiconductor structure comprising a substrate, a stack structure on the substrate, a channel structure penetrating through the stack structure, and a dielectric layer covering the stack structure and at least part of the substrate; forming a ring-shaped trench, the ring-shaped trench penetrating through the dielectric layer and extending to the substrate, and surrounding the stack structure; forming a trench flaring portion downward at the top of the ring-shaped trench; forming an opening in the dielectric layer covering the channel structure; wherein the trench flaring portion and the opening are formed in the same etching step. By the method of the application, the trench flaring portion is formed downward at the top of the ring-shaped trench, i.e. the ring-shaped trench is flared, which is beneficial to the filling quality of the filling material of the trench, improves the problem that fluorine-containing gas diffuses out of the gap of the filling material, and improves the yield and reliability of the device.
Need to check novelty before this filing date? Find Prior Art

Citation Information

Patent Citations

  • US20120104564A1

  • US20210091103A1