Chip interconnection package structure and method of packaging the same
Patent Information
- Application Number
- CN202111141516.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2021-09-28
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2041-09-28
AI Technical Summary
[0004]为了克服现有芯片互联封装结构及方法对衬底的面积空间使用效率不佳,导致芯片间导通线路的设置面积及数量受到限制、母衬底面积无法有效缩小的问题,本发明提供一种芯片互联的封装结构及封装方法
[0022]本发明提出一种新的芯片互联的衬底连接技术,是在一基板中直接形成导通孔,以供设置于所述基板的相对二表面的线路层通过所述等导通孔形成电连接。如此一来,须进行信号互联的第一芯片及第二芯片可以直接设置于所述由所述基板完成的子衬底的相对二表面,并使得二个芯片直接通过所述子衬底中的线路层及基板中的导通孔达到电连接及信号连接。也就是说,第一芯片及第二芯片的信号互联的路径只须通过一个子衬底内的线路层,而无如先前技术所述须通过二个子衬底、一个母衬底之间的冗长的水平导通线路,大幅缩短信号互联的路径长度,以及降低电信号必须经过导通孔及水平导通线路的焊接点的次数,有效提升二个芯片之间的信号品质。
Smart Images

Figure CN115881546B_ABST
Abstract
Claims
1. A chip interconnect packaging method, characterized in that, Includes the following steps: Prepare a substrate having an upper surface and a lower surface; the substrate includes a sub-board unit having a plurality of through holes. A first circuit layer is formed on a first surface of the sub-board unit, and a second circuit layer is formed on a second surface of the sub-board unit. Through holes are formed in the through holes so that the first circuit layer is electrically connected to the second circuit layer through each of the through holes. A motherboard connecting bump is provided on the first circuit layer, and the motherboard connecting bump is provided along the periphery of the sub-board unit; A cutting procedure is performed along the periphery of the sub-plate unit to expose one side of each of the mother plate connecting protrusions; A welding layer is provided on the side of the connecting protrusion of the mother plate; A line layer addition procedure is performed on the first line layer and the second line layer to set a first added line structure on the first line layer and a second added line structure on the second line layer. A first solder resist layer is provided on the first augmented layer circuit structure, and a second solder resist layer is provided on the second augmented layer circuit structure. The first solder resist layer exposes a plurality of first chip pads of the first augmented layer circuit structure, and the second solder resist layer exposes a plurality of second chip pads of the second augmented layer circuit structure. A portion of the first solder resist layer and the first add-on circuit structure is removed along the periphery of the sub-board unit to expose a top surface of the motherboard connecting bump; wherein, during the step of setting a solder layer on the side of the motherboard connecting bump, the solder layer extends from the side of the motherboard connecting bump to the top surface of the motherboard connecting bump.
2. The chip interconnection packaging method as described in claim 1, characterized in that, Further steps include: A first chip is disposed on the first circuit layer of the sub-board unit, and a second chip is disposed on the second circuit layer of the sub-board unit, such that the first chip is electrically connected to the second chip through the first circuit layer, the second circuit layer and each of the vias.
3. The chip interconnection packaging method as described in claim 1, characterized in that, Includes the following steps: A sublayer is pre-formed on the upper and lower surfaces of the substrate; and after completing the step of setting the motherboard connection bump on the first circuit layer, the method further includes: Remove the portion of the seed layer that is not covered by the first and second line layers.
4. The chip interconnection packaging method as described in claim 1, characterized in that, in, The substrate comprises multiple sub-board units, and each sub-board unit is arranged periodically.
5. The chip interconnect packaging method as described in claim 4, characterized in that, in, The substrate further includes a plurality of dicing zones, each of which is disposed at intervals between the peripheries of each of the sub-board units; In the step of performing a cutting procedure along the periphery of the sub-plate unit to expose the sides of each of the mother plate connecting protrusions, all material in each of the cutting groove areas is removed so that the sides of the mother plate connecting protrusions are exposed toward the cutting groove areas.
6. The chip interconnect packaging method as described in claim 1, characterized in that, in, Before performing a cutting procedure along the periphery of the sub-plate unit to expose the sides of each of the mother plate connecting protrusions, the following steps are further included: A protective layer is respectively applied to the first circuit layer and the second circuit layer; and After completing the step of setting a welding layer on the side of the connecting protrusion on the mother plate, the following steps are further included: Remove the protective layer on the first line layer and the second line layer.
7. The chip interconnection packaging method as described in claim 2, characterized in that, After completing the step of setting a welding layer on the side of the connecting protrusion on the mother plate, the following steps are further included: Separate the sub-board unit from the other parts of the substrate to complete an independent sub-substrate; wherein, The first chip and the second chip are disposed on the sub-substrate.
8. The chip interconnect packaging method as described in claim 7, characterized in that, Further steps include: Prepare a mother substrate; the mother substrate includes multiple circuit layers and has a sub-substrate receiving groove; the sub-substrate receiving groove has a side wall, and one side contact of the multiple circuit layers protrudes from the side wall; The sub-substrate, together with the first chip and the second chip, is placed into the sub-substrate receiving groove, such that the side of the motherboard connecting bump faces the side wall of the chip receiving groove. The motherboard connecting bump is connected to the side contact of the mother substrate through the welding layer.
9. A chip interconnect packaging structure, characterized in that, Include: A sub-substrate includes a substrate, multiple circuit layers and a motherboard connecting bump, and has a first surface and a second surface opposite to the first surface; the motherboard connecting bump is disposed on one of the circuit layers and is disposed around the periphery of the sub-substrate, and one side of the motherboard connecting bump is exposed to the outside of the sub-substrate. A welding layer is disposed on the side of the connecting protrusion of the mother plate; wherein, The mother plate connecting protrusion has a top surface, and the welding material layer extends from the side of the mother plate connecting protrusion to the top surface of the mother plate connecting protrusion.
10. The chip interconnect packaging structure as described in claim 9, characterized in that, Further includes: A first chip is disposed on the first surface of the sub-substrate and electrically connected to the circuit layer of the first surface; A second chip is disposed on the second surface of the sub-substrate and electrically connected to the circuit layer of the second surface. The first chip and the second chip are electrically connected to each other through the plurality of circuit layers.
11. The chip interconnect packaging structure as described in claim 10, characterized in that, Further includes: A mother substrate includes multiple circuit layers and has a sub-substrate receiving groove; the sub-substrate receiving groove penetrates at least two circuit layers therethrough; the sub-substrate receiving groove has a side wall, and the multiple circuit structures include a side contact, the side contact protruding from the side wall. The sub-substrate, the first chip, and the second chip are disposed in the sub-substrate receiving groove. The side of the motherboard connecting bump faces the side wall of the sub-substrate receiving groove, and the motherboard connecting bump of the sub-substrate is connected to the side contact of the mother substrate by the solder layer on the side.
12. The chip interconnect packaging structure as described in claim 9, characterized in that, in, The side of the connecting protrusion of the mother plate is flush with a cut surface of the substrate.
Citation Information
Patent Citations
Manufacturing method of printed circuit board with side pattern
JP2007201125A
Semiconductor assembly package having shielding layer and method therefor
US20110221046A1
Double-sided package module and substrate strip
US20170221835A1
Semiconductor device packages with electromagnetic interference shielding
US8022511B2