Ion probe and diagnostic equipment

Abstract

The invention relates to the technical field of high-energy particle diagnosis, and discloses an ion probe and diagnosis device.According to the scheme, an insulating plate is arranged in a probe, the insulating plate is plated with a plurality of aluminum films (forming conductive parts) arranged at intervals, when high-energy ions bombard the aluminum films at different positions, current signals can be generated in the corresponding conductive parts, and the high-energy ions can be detected through the current signals; the current amplifier amplifies a generated current signal, transmits the current signal to the signal processing system through the isolation amplifier, collects and analyzes the current signal by the signal processing system, and judges whether the conductive part is bombarded by high-energy ions by detecting the current signals formed in different conductive parts; the angle range of the high-energy ions relative to magnetic lines and the energy distribution range of the high-energy ions are obtained; according to the scheme, the aluminum film is bombarded based on the high-energy ions, the current signal is generated, the experiment cost can be effectively reduced, collection is greatly facilitated, interference of other signals is avoided, and the accuracy of high-energy ion diagnosis is improved to a certain extent.

Description

Technical Field

[0001] The present invention relates to the technical field of high energy particle diagnosis, and in particular to an ion probe and diagnostic equipment. Background Art

[0002] Currently, large-scale magnetic confinement fusion devices, such as tokamaks, are equipped with neutral beam heating and ion cyclotron resonance heating. The power of these two auxiliary heating methods is in the megawatt range. Under such high-power heating conditions, a large number of high-energy ions can be produced. Since the lost high-energy ions take away a large amount of energy, it also affects whether fusion can be achieved. Therefore, it is of vital importance to study the distribution state of high-energy ions in magnetic confinement fusion devices. Summary of the invention

[0003] The object of the present invention is to provide an ion probe and a diagnostic device for solving the problem of measuring the distribution of high-energy ions inside a magnetic confinement fusion device when the fusion device is working.

[0004] In order to achieve the above objectives, in a first aspect, an embodiment of the present application provides an ion probe, comprising:

[0005] A box body, having a first end and a second end along the length direction of the box body, wherein the first end has an opening for high-energy ions to enter the box body from the outside;

[0006] An insulating plate, fixedly connected to the bottom wall of the box body; and

[0007] There are multiple conductive parts, and the multiple conductive parts are arranged on the upper end surface of the insulating plate at intervals along the width direction of the box body. The conductive parts are electrically connected to an external signal processor; the high-energy ions enter the box body through the opening and bombard the conductive parts to form current signals on the conductive parts, and the external signal processor receives the current signals generated by the conductive parts to determine whether the conductive parts are bombarded by the high-energy ions.

[0008] In some embodiments of the present application, the box body includes a front end cover provided at the first end, a rear end cover provided at the second end, and a frame provided between the front end cover and the rear end cover, and the front end cover and the rear end cover are both detachably connected to the frame;

[0009] The opening comprises a tapered hole penetrating the front end cover along the length direction of the box body and arranged horizontally, the tapered hole has an incident end and an emission end, and the size of the tapered hole along the width direction of the box body gradually increases from the incident end to the emission end.

[0010] In some embodiments of the present application, the ion probe further comprises an adjustment plate, which is detachably attached to the side of the front end cover facing the rear end cover, and an adjustment hole for adjusting the effective flow section of the emission end is provided through the thickness direction of the adjustment plate.

[0011] In some embodiments of the present application, the ion probe further comprises a protective cover mounted on the first end, the protective cover having a protective plate fitted to the outer surface of the front end cover, and a through hole corresponding to the incident end is penetrated along the thickness direction of the protective plate.

[0012] In some embodiments of the present application, the protective cover is detachably connected to the box body, and the material of the protective cover is graphite.

[0013] In some embodiments of the present application, the rear end cover is provided with a through hole corresponding to the conductive member, the through hole is used to install an adapter, one end of the adapter is connected to the conductive member correspondingly, and the other end of the adapter is connected to the signal processor.

[0014] In some embodiments of the present application, the conductive member is an aluminum film.

[0015] In a second aspect, an embodiment of the present application provides a diagnostic device, including:

[0016] The current amplification components, signal processing systems and

[0017] As for the ion probe described in the above embodiment, the adapter is connected to the current amplifying component at one end away from the conductive member; the current amplifying component is used to convert and amplify the current signal transmitted by the adapter, and the signal processing system is used to collect and store the converted and amplified current signal.

[0018] In some embodiments of the present application, the diagnostic device further includes an isolation amplifier connected between the current amplifying component and the signal processing system.

[0019] In some embodiments of the present application, the current amplifying component includes a current amplifier connected to match the conductive member, and a plurality of the current amplifiers are electrically connected to the isolation amplifier via radio frequency connecting lines.

[0020] Compared with the prior art, an ion probe and diagnostic equipment in an embodiment of the present invention have the following beneficial effects: in this solution, an insulating plate is arranged in the probe and a plurality of conductive parts are arranged on the insulating plate at intervals along the width direction of the box body. When high-energy ions bombard conductive paths at different positions, current signals are generated in the corresponding conductive parts and collected and analyzed by the signal processor. The signal processor receives the current signals generated by the conductive parts and then judges and obtains the conductive parts bombarded by the high-energy ions. Since the positions of the conductive parts are fixed and known, the bombardment positions of the high-energy ions are obtained, and the angular range of the high-energy ions relative to the magnetic lines of force is obtained (the distribution state of the high-energy ions is obtained). Based on the bombardment of the aluminum film by high-energy ions and the generation of current signals, this solution can effectively reduce the cost of the experiment, greatly facilitate collection and avoid interference from other signals, and to a certain extent improve the accuracy of high-energy ion diagnosis. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 It is a schematic diagram of the box structure of the present invention;

[0022] Figure 2 It is a schematic diagram of the internal structure of the box body after the cross section of the present invention;

[0023] Figure 3 It is a schematic diagram of the arrangement relationship between the insulating plate and the conductive member of the present invention;

[0024] Figure 4 This is a schematic diagram of the connection relationship between the front end cover and the adjustment plate of the present invention;

[0025] Figure 5 This is a schematic diagram of the front end cover structure of the present invention;

[0026] Figure 6 It is a schematic diagram of the front end cover of the present invention in a cross-section and top view;

[0027] Figure 7 This is a schematic diagram of the protective cover structure of the present invention;

[0028] Figure 8 This is a schematic diagram of the rear end cover structure of the present invention;

[0029] Fig. 9 It is a schematic diagram of the overall connection relationship of the diagnostic device of the present invention;

[0030] Fig.10 It is a top view schematic diagram of the angle relationship between high-energy ions and magnetic lines of force of the present invention.

[0031] In the figure, 1, box body; 11, first end; 12, second end; 13, front end cover; 131, tapered hole; 1311, incident end; 1312, emission end; 132, external leakage part; 133, embedded part; 14, rear end cover; 141, perforation; 15, frame;

[0032] 2. Insulation plate; 21. Welding plate;

[0033] 3. Adjustment plate; 31. Adjustment hole;

[0034] 4. protective cover; 41. protective plate; 411. through hole; 42. first plate; 43. second plate;

[0035] 5. Conductive parts;

[0036] 6. Current amplification component; 61. Current amplifier; 7. Signal processing system; 8. Isolation amplifier; 9. Fusion chamber. DETAILED DESCRIPTION

[0037] The specific implementation of the present invention is further described in detail below in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0038] In the description of the present invention, it should be understood that the terms "upper", "lower", "left", "right", "front", "back", "top", "bottom", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. It should be understood that the terms "first", "second", etc. are used in the present invention to describe various information, but such information should not be limited to these terms, which are only used to distinguish the same type of information from each other. For example, without departing from the scope of the present invention, "first" information may also be referred to as "second" information, and similarly, "second" information may also be referred to as "first" information.

[0039] Currently, large-scale magnetic confinement fusion devices, such as tokamaks, are equipped with neutral beam heating and ion cyclotron resonance heating. The power of these two auxiliary heating methods is in the megawatt range. Under such high-power heating conditions, a large number of high-energy ions can be generated. If the high-energy ions cannot be effectively confined, the lost high-energy ions will destroy the operation of the plasma and damage the tokamak device. Since the lost high-energy ions take away a large amount of energy, it also affects whether fusion can be achieved. Therefore, it is of vital importance to study the distribution state of high-energy ions in the magnetic confinement fusion device.

[0040] like Figure 1-Figure 10As shown, the embodiment of the present application proposes an ion probe, comprising: a box body 1, having a first end 11 and a second end 12 along the length direction of the box body 1, the first end 11 having an opening for high-energy ions to enter the box body 1 from the outside; an insulating plate 2, fixedly connected to the bottom wall of the box body 1, the insulating plate 2 in this solution is a quartz plate, and threaded holes are respectively provided at the four corners of the insulating plate 2, and the insulating plate 2 is fixedly installed on the bottom wall of the box body 1 by bolts (such as Figure 2 As shown); and a conductive member 5, which is provided with a plurality of conductive members 5, which are arranged at intervals on the upper end surface of the insulating plate 2 along the width direction of the box body 1, and the conductive member 5 is electrically connected to an external signal processor; high-energy ions enter the box body 1 through the opening and bombard the conductive member 5 arranged on the insulating plate 2 under the action of magnetic lines of force, so as to form a current signal on the corresponding conductive member 5 (after the high-energy ions bombard the conductive member 5, the charge inside the conductive member 5 moves, and then a current signal is generated inside the conductive member 5), and the external signal processor receives the current signal generated in the corresponding conductive member 5 and then determines whether there is a high-energy ion bombarding the conductive member 5, thereby determining the position bombarded by the high-energy ions after entering the box body 1, as shown Fig.10 As shown, by measuring whether a current signal is generated in the corresponding conductive member 5, the angle between the high-energy ions and the magnetic lines of force (that is, the pitch angle of the high-energy ions) is determined; in this scheme, the more conductive members 5 are arranged in the width direction of the box body 1, the higher the accuracy of the angle between the high-energy ions and the magnetic lines of force measured by the conductive members 5 and the signal processor will be; because the position of each conductive member 5 in the box body 1 is fixed and known, the more conductive members 5 are arranged in the width direction of the box body 1, the more current signals generated by the positions bombarded by the high-energy ions are collected by the signal processor, and the higher the accuracy of the judgment of the positions bombarded by the high-energy ions, the higher the accuracy of the angle between the high-energy ions and the magnetic lines of force finally obtained.

[0041] In some embodiments of the present application, Figure 1 , Figure 2 As shown, the box body 1 has a front end cover 13 arranged at the first end 11, a rear end cover 14 arranged at the second end 12, and a frame body 15 arranged between the front end cover 13 and the rear end cover 14 (the front end cover 13, the rear end cover 14, and the frame body 15 are all made of stainless steel), and the front end cover 13 and the rear end cover 14 are detachably connected to the frame body 15 and constitute the box body 1; Figure 4 , Figure 6 As shown, the front end cover 13 includes an external leakage portion 132 and an internal embedding portion 133 integrally connected to the external leakage portion 132. When the front end cover 13 is assembled to the frame 15, the internal embedding portion 133 is inserted into the frame 15 and the internal embedding portion 133 is in close contact with the inner side wall of the frame 15, so that the connection between the external leakage portion 132 and the internal embedding portion 133 abuts against the end position of the frame 15 (such as Figure 2As shown in the figure, the front end cover 13 and the rear end cover 14 are fixedly installed at the two ends of the frame 15 by bolts, and threaded holes are provided at the two ends of the embedded part 133 along the width direction of the frame 15 and the four corners of the rear end cover 14. The front end cover 13, the rear end cover 14 and the frame 15 can be assembled by threading them into the threaded holes.

[0042] like Figure 6 As shown, the opening includes a tapered hole 131 that passes through the front end cover 13 along the length direction of the box body 1 and is horizontally arranged. The tapered hole 131 has an incident end 1311 and an ejection end 1312. The size of the tapered hole 131 along the width direction of the box body 1 gradually increases from the incident end 1311 to the ejection end 1312. When high-energy ions enter from the incident end 1311, under the action of magnetic lines of force, in order to avoid the high-energy ions from colliding with the inner wall of the hole, thereby affecting the movement trajectory of the high-energy ions after entering the box body 1 and causing a decrease in measurement accuracy, in this solution, the opening is set to the shape of the tapered hole 131, and the size of the tapered hole 131 along the width direction of the box body 1 gradually increases from the incident end 1311 to the ejection end 1312, which can better avoid the high-energy ions from colliding with the inner wall of the hole under the action of magnetic lines of force after entering from the incident end 1311, thereby improving the measurement accuracy.

[0043] In some embodiments of the present application, Figure 4 As shown, the ion probe also includes an adjustment plate 3 which is detachably connected to the side of the front end cover 13 facing the rear end cover 14. An adjustment hole 31 for adjusting the effective flow section of the emission end 1312 is provided along the thickness direction of the adjustment plate 3. A threaded hole is provided on the side of the front end cover 13 facing the rear end cover 14. The adjustment plate 3 is fixedly mounted on the front end cover 13 by bolts. By selecting an adjustment plate 3 with adjustment holes 31 of different sizes, the effective flow section of the emission end 1312 of the tapered hole 131 can be adjusted, and corresponding flexible adjustments can be made according to actual needs.

[0044] In this embodiment, the width of the incident end 1311 of the conical hole 131 is 2 mm, and the height is 1.5 mm; the width of the emitting end 1312 is 40 mm, and the height is 1.5 mm; the maximum straight-line distance between the incident end 1311 and the emitting end 1312 is 11.04 mm.

[0045] In some embodiments of the present application, Figure 7As shown, the ion probe also includes a protective cover 4 sleeved on the first end 11, and the protective cover 4 has a protective plate 41 that fits with the outer surface of the front end cover 13, and a through hole 411 corresponding to the incident end 1311 is penetrated along the thickness direction of the protective plate 41; the protective plate 41 is integrally connected with second plates 43 on both sides along the width direction of the box body 1, and the upper ends of the two second plates 43 are integrally connected with a first plate 42. When the protective cover 4 is sleeved on the first end 11 of the box body 1, the protective plate 41 and the surface of the front end cover 13 are in contact with each other, the two second plates 43 and the two side walls of the box body 1 in the width direction are in contact with each other, and the first plate 42 and the upper top wall of the box body 1 are in contact with each other, so that the first end 11 of the box body 1 is finally wrapped and covered. When the protective cover 4 is mounted on the box body 1, the through hole 411 provided on the protective plate 41 corresponds to the incident end 1311 of the tapered hole 131, so that the high-energy ions in the fusion device enter the tapered hole 131 through the through hole 411 and the incident end 1311 in sequence, and finally enter the box body 1 and bombard the conductive member 5. The setting of the protective cover 4 is used to protect the first end 11 of the box body 1 to prevent damage caused by the long-term impact of the high-energy ions in the fusion device; in this solution, the front end of the front cover 13 is set as an arc surface, and the protective plate 41 is also set as a matching arc structure. The setting of the arc surface helps to reduce the bombardment of the box body 1 shell by the high-energy ions (when the high-energy ions in the fusion device hit the surface of the arc structure, the moving trajectory can be guided under the guidance of the arc surface, so that the trajectory of the high-energy ions is deviated), reducing the bombardment damage to the box body 1.

[0046] In some embodiments of the present application, the protective cover 4 is detachably connected to the box body 1. Specifically, threaded holes are provided on the first plate 42 and the second plate 43 (corresponding threaded holes are provided at corresponding positions on the box body 1), so that the protective cover 4 is fixedly installed on the box body 1 by bolts to achieve a detachable connection with the box body 1; the material of the protective cover 4 in this solution is graphite.

[0047] In some embodiments of the present application, Figure 8 As shown, a through hole 141 corresponding to the conductive member 5 is provided on the rear end cover 14, and the through hole 141 is used to install an adapter, one end of the adapter is electrically connected to the conductive member 5, and the other end of the adapter is electrically connected to the signal processor; Figure 3As shown, each conductive member 5 is connected to a connecting wire at one end close to the rear end cover 14 (a welding pad 21 corresponding to each conductive member 5 is provided on the insulating plate 2, and the welding pad 21 is a recessed hole excavated on the insulating plate 2. The setting of the recessed hole allows more solder to be accommodated when the connecting wire is welded to the corresponding conductive member 5, so as to ensure a firm and reliable connection between the connecting wire and the conductive member 5), and the other end of the connecting wire is electrically connected to an adapter installed in the through hole 141 of the rear end cover 14, and the other end of the adapter is electrically connected to a signal processor to collect and analyze whether a current signal is generated on the corresponding conductive member 5, and then determine the position bombarded by the high-energy ions.

[0048] In some embodiments of the present application, the conductive member 5 is an aluminum film (it may also be other conductive films, and the aluminum film is selected taking into account economy), which is plated on the insulating plate 2 (quartz plate) by a vacuum coating apparatus, and the thickness of the aluminum film is 0.2 μm; when the aluminum film is plated on the insulating plate 2, a plurality of masking lines may be arranged at intervals on the insulating plate 2, so that during electroplating, the insulating plate 2 corresponding to the masking lines will not be plated with aluminum film, so that after the electroplating is completed, the masking lines are removed, thereby dividing the aluminum film plated on the insulating plate 2 into a plurality of spaced and non-contacting areas, and each separate area is the conductive member 5.

[0049] In a second aspect, the present application provides a diagnostic device, such as Fig. 9 As shown, it includes: a current amplifying component 6 and a signal processing system 7 connected in sequence (the current amplifying component 6 and the signal processing system 7 are connected via a radio frequency connecting line); as in the ion probe in the above-mentioned embodiment, the adapter extends outward from the fusion chamber 9 through a high-temperature resistant 50-ohm coaxial line and is connected to the current amplifying component 6 (a vacuum breach is provided on the wall of the fusion chamber 9, so that the 50-ohm coaxial line extends outward from the fusion chamber 9 through the vacuum breach to ensure the sealing performance, and the vacuum breach serves as a component for isolating the fusion chamber 9 from the external environment), and the 50-ohm coaxial line extends outward. The end is connected to the current amplifier component 6 via a radio frequency connection line, and the radio frequency connection line transmits the current signal from the high temperature resistant 50 ohm coaxial line to the input end of the current amplifier component 6. The current signal is converted and amplified by the current amplifier component 6 and then transmitted to the output end of the current amplifier component 6. The amplified current signal is transmitted to the signal processing system 7 (for collecting and storing the current signal) via the radio frequency connection line, and then the conductive part 5 bombarded by the high-energy ions is judged (that is, which conductive part is bombarded by the high-energy ions). Since the position of the conductive part 5 is fixed and known, the throwing angle of the high-energy ions is obtained. The signal processing system 7 in this scheme has 16 channels. In this scheme, only an example with four conductive parts 5 is provided (the more conductive parts 5 are provided, the higher the accuracy of the data finally measured), and the scanning frequency of the system is 500kHz.

[0050] In this solution, a bellows is provided outside the 50-ohm coaxial line in the fusion chamber 9 to wrap the 50-ohm coaxial line to prevent the high-energy ions in the fusion chamber 9 from damaging the 50-ohm coaxial line.

[0051] In some embodiments of the present application, Fig. 9 As shown, the diagnostic device also includes an isolation amplifier 8 connected between the current amplifying component 6 and the signal processing system 7; the isolation amplifier 8 is connected to the current amplifying component 6 and the signal processing system 7 via a radio frequency line, and is used to isolate some relatively large DC signals (to prevent the DC signals from exceeding the range of the back-end signal processing system 7), thereby protecting the signal processing system 7 at the back end.

[0052] In some embodiments of the present application, the current amplifying component 6 includes a current amplifier 61 matched and connected to the conductive member 5 (each conductive member 5 corresponds to a current amplifier 61), and multiple current amplifiers 61 are electrically connected to the isolation amplifier 8 via RF connecting lines; the frequency and gain of the current amplifier 61 are adjustable, wherein the gain is 10 4 V / A, 10 6 V / A, 10 8 V / A has three adjustable gears. In this solution, 10 is selected 6 V / A gear position.

[0053] The working process of the present invention is as follows: first, a bracket for fixing the probe is installed in the fusion chamber 9, and the probe is fixed on the bracket. The high-energy ions in the fusion chamber 9 enter the box body 1 through the through hole 411 on the protective cover 4 and the tapered hole 131 on the front cover 13 in turn, and bombard the corresponding conductive member 5 under the action of the magnetic lines of force, and generate a current signal on the conductive member 5. The generated current signal is transmitted to the signal processing system 7 through the processing of the current amplifier 61 and the isolation amplifier 8 and is collected and analyzed by the signal processing system 7 to determine the bombardment position of the high-energy ions. Since the position of the conductive member 5 is fixed and known, the throwing angle of the high-energy ions (the angle between the moving trajectory of the high-energy ions and the magnetic lines of force) is obtained.

[0054] In summary, an embodiment of the present invention provides an ion probe and a diagnostic device. In this solution, an insulating plate 2 is arranged in the probe and a plurality of spaced aluminum films are plated on the insulating plate 2 (forming a conductive member 5). When high-energy ions bombard the aluminum films at different positions, current signals are generated in the corresponding conductive members 5 and collected and analyzed by the signal processor. The signal processor detects the current signals formed in different conductive members 5 and then obtains the position bombarded by the high-energy ions, thereby obtaining the angular range of the high-energy ions relative to the magnetic lines of force. This solution is based on high-energy ions bombarding the aluminum film and generating current signals, which can effectively reduce the cost of the experiment, greatly facilitate collection and avoid interference from other signals, and to a certain extent improve the accuracy of high-energy ion diagnosis.

[0055] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and substitutions can be made without departing from the technical principles of the present invention. These improvements and substitutions should also be regarded as the scope of protection of the present invention.

Claims

1. An ion probe, characterized in that: include: A box body (1) having a first end (11) and a second end (12) along the length direction of the box body (1), wherein the first end (11) has an opening for high-energy ions to enter the box body (1) from the outside; An insulating plate (2) fixedly connected to the inner bottom wall of the box body (1); as well as A plurality of conductive members (5) are provided, wherein the plurality of conductive members (5) are arranged at intervals on the upper end surface of the insulating plate (2) along the width direction of the box body (1), and the conductive members (5) are electrically connected to an external signal processor; the high-energy ions enter the box body (1) through the opening and bombard the conductive members (5) to form a current signal on the conductive members (5); the external signal processor receives the current signal generated by the conductive members (5) to determine whether the conductive members (5) are bombarded by the high-energy ions.

2. The ion probe according to claim 1, characterized in that The box body (1) comprises a front end cover (13) arranged at the first end (11), a rear end cover (14) arranged at the second end (12), and a frame body (15) arranged between the front end cover (13) and the rear end cover (14), wherein the front end cover (13) and the rear end cover (14) are both detachably connected to the frame body (15); The opening comprises a tapered hole (131) which penetrates the front end cover (13) along the length direction of the box body (1) and is arranged horizontally, the tapered hole (131) having an incident end (1311) and an emission end (1312), and the size of the tapered hole (131) along the width direction of the box body (1) gradually increases from the incident end (1311) to the emission end (1312).

3. The ion probe according to claim 2, characterized in that The ion probe further comprises an adjustment plate (3), wherein the adjustment plate (3) is detachably attached to the side of the front end cover (13) facing the rear end cover (14), and an adjustment hole (31) for adjusting the effective flow cross section of the emission end (1312) is provided through the adjustment plate (3) in the thickness direction.

4. The ion probe according to claim 2, characterized in that The ion probe further comprises a protective cover (4) sleeved on the first end (11), wherein the protective cover (4) comprises a protective plate (41) fitted with the outer surface of the front end cover (13), and a through hole (411) corresponding to the incident end (1311) is penetrated along the thickness direction of the protective plate (41).

5. The ion probe according to claim 4, characterized in that The protective cover (4) is detachably connected to the box body (1), and the material of the protective cover (4) is graphite.

6. The ion probe according to claim 2, characterized in that The rear end cover (14) is provided with a through hole (141) corresponding to the conductive member (5), and the through hole (141) is used to install an adapter, one end of the adapter is connected to the conductive member (5) correspondingly, and the other end of the adapter is connected to the signal processor.

7. The ion probe according to any one of claims 1 to 6, characterized in that: The conductive element (5) is an aluminum film.

8. A diagnostic device, characterized in that include: A current amplification component (6), a signal processing system (7) and According to the ion probe described in any one of claims 1 to 7, the end of the adapter away from the conductive member (5) is connected to the current amplifying component (6); the current amplifying component (6) is used to convert and amplify the current signal transmitted by the adapter, and the signal processing system (7) is used to collect and store the converted and amplified current signal.

9. The diagnostic device according to claim 8, characterized in that The diagnostic device further comprises an isolation amplifier (8) connected between the current amplification component (6) and the signal processing system (7).

10. The diagnostic device according to claim 9, characterized in that The current amplifying component (6) comprises a current amplifier (61) matched and connected to the conductive member (5), and a plurality of the current amplifiers (61) are electrically connected to the isolation amplifier (8) via radio frequency connection lines.

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