IPM socket test fixture and test device

By designing a split-connected IPM socket test fixture, the problems of troublesome disassembly and assembly, high maintenance costs and poor contact in the existing technology of IPM product test tools are solved, and simple disassembly and assembly, low maintenance costs and high accuracy are achieved. test data and have higher voltage resistance.

CN119511012APending Publication Date: 2025-02-25CHINA RESOURCES MICROELECTRONICS (CHONGQING) CO LTD
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Patent Information

Application Number
CN202311085628.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2023-08-25
Publication Date
2025-02-25

AI Technical Summary

Technical Problem

Existing IPM product testing tools are troublesome to disassemble and assemble, have high maintenance costs, and are prone to poor contact, which affects the accuracy of the test data.

Method used

Designed an IPM socket test fixture with a split-connected overall structure, including fixing components, test connection components and position adjustment components, simplifying the disassembly and assembly process, and improving contact with multiple gold fingers stability.

Benefits of technology

It realizes simplicity of disassembly and assembly, reduces maintenance costs, improves contact stability and accuracy of test data, and can withstand higher voltage resistance (1200V/70A) to meet actual testing needs.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention provides an IPM socket test tool and a test device, the test tool comprises a fixing assembly, a test connection assembly and a position adjusting assembly, the fixing assembly comprises a product fixing seat for fixing an IPM product to be tested, the test connection assembly comprises a first test connection piece and a second test connection piece which are respectively arranged at two sides of the product fixing seat and are arranged at intervals, and the position adjusting assembly comprises a position adjusting assembly. One end of each test connecting piece extends towards the product fixing seat, and the position adjusting assembly comprises a first position adjusting piece and a second position adjusting piece which are used for adjusting the positions of the ends, facing the product fixing seat, of the first test connecting piece and the second test connecting piece respectively, so that the first test connecting piece and the second test connecting piece are electrically connected with the first test end and the second test end of the IPM product to be tested respectively; the testing device comprises a PCB (printed circuit board) and the testing jig, wherein the PCB is electrically connected with the two testing connecting pieces. The test fixture is simple to disassemble and assemble, convenient to operate, accurate in test and excellent in pressure resistance, and can better meet actual test requirements.
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Description

Technical Field

[0001] The invention belongs to the field of semiconductor product testing devices and relates to an IPM socket testing fixture and a testing device. Background Art

[0002] IPM (Intelligent Power Module) is a high-reliability power electronic device that integrates power switching devices, gate-level drive circuits, and overvoltage and overcurrent protection circuits. It has functions such as short-circuit protection, overcurrent protection, overheating protection, and undervoltage lockout. It is mainly suitable for frequency converters and various inverter power supplies that drive motors.

[0003] When testing the electrical properties (such as current) of IPM products, it is necessary to fix the IPM products on the test fixture in advance and then connect them to the test circuit. Figure 1 , showing a schematic diagram of the top view of a general test jig. The jig used for IPM product testing is a solder paste welding one-piece molding type (also known as a copper sheet manual insertion type). When in use, the test pins of the IPM product to be tested are inserted into the interface of the test jig to form a test circuit. The one-piece molding test jig has the following disadvantages: the disassembly, assembly and replacement of parts of the test jig are more troublesome, and the maintenance cost is high; the structure inside the test jig that contacts the test pins of the IPM product is a copper sheet, which can only withstand the test conditions of 600V / 30A, and the test pins are prone to poor contact when inserted into the test jig and connected to the copper sheet, affecting the accuracy of the test data.

[0004] Therefore, how to provide an IPM socket test fixture and a test device to achieve simple assembly and disassembly, low maintenance cost, and improved contact stability and test data accuracy has become an important technical problem that needs to be urgently solved by technical personnel in this field.

[0005] It should be noted that the above introduction to the technical background is only for the convenience of providing a clear and complete description of the technical solutions of the present application and for the convenience of understanding by those skilled in the art. It cannot be considered that the above technical solutions are well known to those skilled in the art simply because they are described in the background technology section of the present application. Summary of the invention

[0006] In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide an IPM socket test fixture and a test device to solve the problems in the prior art that the test fixture is difficult to disassemble and assemble, has high maintenance costs, and is prone to poor contact and affects the accuracy of test data.

[0007] To achieve the above objectives and other related objectives, the present invention provides an IPM socket test fixture, comprising:

[0008] A fixing assembly, comprising a product fixing seat for fixing the IPM product to be tested, wherein the IPM product to be tested comprises a first test end and a second test end arranged opposite to each other;

[0009] a test connection assembly connected to the fixing assembly, the test connection assembly comprising a first test connection piece and a second test connection piece, the first test connection piece and the second test connection piece are arranged at opposite sides of the product fixing seat and are spaced apart from the product fixing seat by a preset distance, one end of the first test connection piece extends toward the product fixing seat, and one end of the second test connection piece extends toward the product fixing seat;

[0010] A position adjustment component is connected to the fixing component, and the position adjustment component includes a first position adjustment member and a second position adjustment member, the first position adjustment member is used to adjust the position of the first test connector toward one end of the product fixing seat so that the first test connector is electrically connected to the first test end, and the second position adjustment member is used to adjust the position of the second test connector toward one end of the product fixing seat so that the second test connector is electrically connected to the second test end.

[0011] Optionally, the fixing assembly also includes a base, the product fixing seat is arranged above the base, the base is provided with a first through slot and a second through slot vertically penetrating the base, the first through slot and the second through slot are arranged on both sides of the product fixing seat and both extend in the X direction, the other end of the first test connector passes through the first through slot to extend to the bottom of the base, and the other end of the second test part passes through the second through slot to extend to the bottom of the base.

[0012] Optionally, the base includes a first pad, a second pad and a third pad connected in sequence in the Y direction, the Y direction is perpendicular to the X direction, the product fixing seat is arranged above the second pad, the first pad is provided with a first groove, the second pad is provided with a second groove and a third groove, the third pad is provided with a fourth groove, the first groove is opposite to the second groove to form the first through groove, and the third groove is opposite to the fourth groove to form the second through groove.

[0013] Optionally, the fixing assembly further includes a first fixing block for fixing the first position adjusting member and a second fixing block for fixing the second position adjusting member, and the first fixing block and the second fixing block are both arranged above the base and arranged on both sides of the product fixing seat.

[0014] Optionally, the first position adjustment member includes a first push rod and a first rotating rod, the first fixed block is provided with a fifth groove, the first push rod, the first rotating rod and the fifth groove all extend along the Y direction and at least a portion of the first push rod is located in the fifth groove, the fifth groove includes a first groove wall and a second groove wall opposite to each other in the Y direction, one end of the first rotating rod sequentially penetrates the first groove wall, the first connecting rod and the second groove wall to connect the first push rod so that the first push rod rotates with the rotation of the first rotating rod; the second position adjustment member includes a second push rod and a second rotating rod, the second fixed block is provided with a sixth groove, the second push rod, the second rotating rod and the sixth groove all extend along the Y direction and at least a portion of the second push rod is located in the sixth groove, the sixth groove includes a third groove wall and a fourth groove wall opposite to each other in the Y direction, one end of the second rotating rod sequentially penetrates the second groove wall, the second connecting rod and the fourth groove wall to connect the second push rod so that the second push rod rotates with the rotation of the second rotating rod.

[0015] Optionally, the first test connector is spaced apart from the first push rod, and the first push rod pushes one end of the first test connector facing the product holder toward the product holder when the first push rod rotates, and the second test connector is spaced apart from the second push rod, and the second push rod pushes one end of the second test connector facing the product holder toward the product holder when the second push rod rotates.

[0016] Optionally, the first test connecting member vertically penetrates the first push rod, and when the first push rod rotates, it drives one end of the first test connecting member facing the product fixing seat to move closer to the product fixing seat; the second test connecting member vertically penetrates the second push rod, and when the second push rod rotates, it drives one end of the second test connecting member facing the product fixing seat to move closer to the product fixing seat.

[0017] Optionally, the first test connector includes a plurality of first gold fingers spaced apart in the Y direction, and the second test connector includes a plurality of second gold fingers spaced apart in the Y direction.

[0018] Optionally, the first test connector further includes a first fixing portion, which covers at least a portion of the first gold finger; the second test connector further includes a second fixing portion, which covers at least a portion of the second gold finger.

[0019] Optionally, at least one side surface of the product fixing seat in the Y direction is provided with a plurality of fixing seat grooves extending vertically, and the fixing seat grooves penetrate the upper surface of the product fixing seat.

[0020] The present invention also provides an IPM testing device, comprising: a PCB circuit board and the IPM socket testing jig as described above, wherein the other end of the first test connector and the other end of the second test connector are electrically connected to the PCB circuit board respectively.

[0021] As described above, compared with the existing one-piece solder paste welding test fixture, the IPM socket test fixture of the present invention has a split connection overall structure, which is simple and convenient to disassemble and assemble, reducing the difficulty and time of daily maintenance operations; it is small in size, which can improve the portability of operation and meet the needs of multiple applications; the test connector composed of multiple gold fingers has stable and good contact with the test end of the IPM product to be tested, which can ensure the accuracy of the test data, and the pressure resistance performance is doubled (can withstand 1200V / 70A test conditions), which better meets the actual test needs. The IPM test device of the present invention has a simple structure, is easy to use, has accurate testing, and has excellent pressure resistance performance, which better meets the actual test needs and has strong market competitiveness. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 The diagram shows a top view of a general one-piece solder paste welding test fixture.

[0023] Figure 2 Shown is a schematic diagram of the overall structure of the IPM socket test fixture of the present invention in the first embodiment.

[0024] Figure 3 Shown is a schematic diagram of the top view of the IPM socket test fixture of the present invention in the first embodiment.

[0025] Figure 4 Shown is a schematic diagram of the exploded structure of the IPM socket test fixture of the present invention.

[0026] Figure 5 Shown is a schematic diagram of the overall structure of the product fixing seat in the IPM socket test fixture of the present invention.

[0027] Figure 6 Shown is a schematic diagram of the top view of the base in the IPM socket test fixture of the present invention.

[0028] Figure 7 Shown is a schematic diagram of the exploded structure of the base in the IPM socket test fixture of the present invention.

[0029] Figure 8 Shown is a schematic diagram of the overall structure of the first push rod in the IPM socket test fixture of the present invention.

[0030] Fig. 9It is a schematic diagram of the overall structure of the first rotating rod in the IPM socket test fixture of the present invention.

[0031] Fig.10 It is a schematic diagram of the overall structure of the first fixing block in the IPM socket test fixture of the present invention.

[0032] Fig.11 It is a schematic diagram of the overall structure in which the first position adjustment member in the IPM socket test fixture of the present invention is fixed on the first fixing block.

[0033] Fig.12 It is a schematic diagram showing the overall structure of the first test connector in the IPM socket test fixture of the present invention.

[0034] Fig.13 It is a schematic diagram showing the overall structure of the first test connector in the IPM socket test fixture of the present invention.

[0035] Fig.14 It is a perspective structural diagram of the first test connector in the IPM socket test fixture of the present invention.

[0036] Fig.15 It is a schematic diagram showing the process of position adjustment of the test connection component by the position adjustment component of the IPM socket test fixture of the present invention in the first embodiment.

[0037] Fig.16 It is a schematic diagram of the overall structure of the IPM socket test fixture of the present invention in the second embodiment.

[0038] Fig.17 It is a schematic diagram showing the process of position adjustment of the test connection component by the position adjustment component of the IPM socket test fixture of the present invention in the second embodiment.

[0039] Component number description

[0040] Fixing assembly 100

[0041] Product fixing seat 11

[0042] Accommodating slot 111

[0043] Fixed seat groove 112

[0044] Limit block 113

[0045] Base 12

[0046] First through groove 121

[0047] The second through groove 122

[0048] The first cushion block 123

[0049] The first groove 1231

[0050] The second cushion block 124

[0051] The second groove 1241

[0052] The third groove 1242

[0053] The third pad 125

[0054] Fourth groove 1251

[0055] The first fixing block 13

[0056] Fifth groove 131

[0057] First groove wall 1311

[0058] Second groove wall 1312

[0059] The second fixing block 14

[0060] Test Connection Kit 200

[0061] First test connection 21

[0062] First Gold Finger 211

[0063] The first fixing portion 212

[0064] Second test connection 22

[0065] Second Gold Finger 221

[0066] The second fixing portion 222

[0067] Position adjustment assembly 300

[0068] First position adjusting member 31

[0069] First push rod 311

[0070] First rotating rod 312

[0071] Second position adjusting member 32

[0072] Second push rod 321

[0073] The second rotating rod 322

[0074] IPM products to be tested 400

[0075] The first test terminal 41

[0076] The second test terminal 42 DETAILED DESCRIPTION

[0077] The following describes the embodiments of the present invention through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention.

[0078] See also Figures 2 to 17 It should be noted that the illustrations provided in this embodiment are only used to illustrate the basic concept of the present invention in a schematic manner, and the drawings only show components related to the present invention rather than being drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component may be changed arbitrarily, and the component layout may also be more complicated.

[0079] Embodiment 1

[0080] This embodiment provides an IPM socket test fixture. Figure 2 and Figure 3 ,in, Figure 2 The overall structure diagram of the socket test fixture is shown. Figure 3 The schematic diagram is a top view of the socket test fixture, which includes a fixing component 100 , a test connection component 200 and a position adjustment component 300 .

[0081] For details, please refer to Figures 2 to 4 , Figure 4 The exploded structure diagram of the socket test fixture is shown in FIG. 1 , wherein the fixing assembly 100 includes a product fixing seat 11 for fixing the IPM product to be tested, and the IPM product to be tested 400 ( Figure 4 It should be noted that, in order to show and introduce the specific structure of the socket test fixture in detail, the structural diagram of the IPM product to be tested is not shown in this embodiment, and due to the different models and specifications of the IPM products, the shape, quantity and extension direction of the test pins included in the first test terminal 41 and the second test terminal 42 are not completely consistent. Therefore, the IPM product is not introduced in detail here, and can be combined with the IPM product structure in the prior art (such as Fig.16 ) for further information.

[0082] For details, please refer to Figures 2 to 4, the test connection assembly 200 is connected to the fixing assembly 100, and the test connection assembly 200 includes a first test connection piece 21 and a second test connection piece 22, the first test connection piece 21 and the second test connection piece 22 are arranged on opposite sides of the product fixing seat 11 and are spaced apart from the product fixing seat 11 by a preset distance, one end of the first test connection piece 21 extends toward the product fixing seat 11, and one end of the second test connection piece 22 extends toward the product fixing seat 11. It should be noted that since the test connection pieces (the first test connection piece 21 and the second test connection piece 22) both include a first end and a second end, wherein the first end extends toward the product fixing seat 11 to be connected to the test end of the IPM product 400 to be tested placed above the product fixing seat 11 under the adjustment of the position adjustment piece, and the second end is connected to the PCB circuit board for testing to form a loop for testing the IPM product. In order to ensure that the first end can contact the test end under the action of the position adjustment member, the distance of the first end relative to the product fixing seat 11 needs to be reasonably designed according to the specific structure of the IPM product to be tested and the position adjustment range of the position adjustment member for the test connector, to ensure that the test connector can contact the test end of the IPM product to be tested under the action of the position adjustment member.

[0083] For details, please refer to Figures 2 to 4 The position adjustment component 300 is connected to the fixing component 100, and the position adjustment component 300 includes a first position adjustment member 31 and a second position adjustment member 32. The first position adjustment member 31 is used to adjust the position of the first test connector 21 toward one end of the product fixing seat 11 so that the first test connector 21 is electrically connected to the first test end 41, and the second position adjustment member 32 is used to adjust the position of the second test connector 22 toward one end of the product fixing seat 11 so that the second test connector 22 is electrically connected to the second test end 42. That is, before the socket test jig is used for testing the IPM product to be tested, the IPM product to be tested is first fixed on the product fixing seat 11. At this time, the ends of the first test connector 21 and the second test connector 22 extending toward the product fixing seat 11 are not in contact with the test end of the IPM product to be tested. Before preparing for the test, the positions of the ends of the first test connector 21 and the second test connector 22 extending toward the product fixing seat 11 are adjusted by the first position adjusting member 31 and the second position adjusting member 32, respectively, so that the first test connector 21 is in contact with the first test end 41 of the IPM product 400 to be tested and the second test connector 22 is in contact with the second test end 42 of the IPM product 400 to be tested, and then the PCB circuit board is combined to form a test circuit (please refer to FIG. 2 ). Fig.15 ).

[0084] As an example, see Figure 5 , which is a schematic diagram of the overall structure of the product fixing seat. The upper surface of the product fixing seat 11 is provided with a receiving groove 111 for receiving the IPM product to be tested. The receiving groove 111, on the one hand, plays a role in installing and positioning the IPM product to be tested, and on the other hand, enables the bottom of the IPM product to be tested to be embedded in the receiving groove 111, thereby improving the position stability of the IPM product to be tested, and also improving the area utilization rate to reduce the overall volume of the test jig to achieve miniaturization.

[0085] As an example, Figure 5 As shown, the product fixing seat 11 is provided with at least one limit block 113 to limit the IPM product to be tested. The number of the limit blocks 113 is preferably an even number and they are symmetrically arranged in the extension direction of the accommodating groove 111 (the length direction of the accommodating groove 111), which can play a role in positioning and limiting the IPM product to be tested, ensure the position accuracy of the IPM product, and avoid poor contact between the test port and the test connector caused by the position deviation of the IPM product.

[0086] As an example, Figure 5 As shown, at least one side surface of the product fixing seat 11 located in the Y direction is provided with a plurality of fixing seat grooves 112 extending vertically, and the fixing seat grooves 112 penetrate the upper surface of the product fixing seat 11. Due to the different models and specifications of IPM products, the test pins provided on one or both sides (test ends) of most IPM products extend vertically, and the setting of the fixing seat grooves 112 can accommodate the test pins of the IPM product 400 to be tested, further improve the stability when the test connector is electrically connected to the test end, and can further reduce the volume. Of course, for some IPM products with special structures (without vertically extending pins), the corresponding product fixing seat 11 may not be provided with the fixing seat grooves 112. In addition, the width, number and spacing between adjacent fixing seat grooves 112 of the fixing seat grooves 112 can be set based on actual needs.

[0087] As an example, the fixing assembly 100 further includes a base 12, and the product fixing seat 11 is arranged above the base 12, see Figure 6 , which is a schematic diagram of the top structure of the base, wherein the base 12 is provided with a first through slot 121 and a second through slot 122 which vertically penetrate the base 12, wherein the first through slot 121 and the second through slot 122 are arranged on both sides of the product fixing seat 11 and both extend in the X direction, wherein the other end of the first test connector 21 extends downwardly through the first through slot 121, and the other end of the second test connector 22 extends downwardly through the second through slot 122.

[0088] As an example, see Figure 7 , which is a schematic diagram of the exploded structure of the base, wherein the base 12 includes a first pad 123, a second pad 124 and a third pad 125 connected in sequence in the Y direction, the Y direction being perpendicular to the X direction, the product fixing seat 11 being arranged above the second pad 124, the first pad 123 being provided with a first groove 1231, the second pad 124 being provided with a second groove 1241 and a third groove 1242, the third pad 125 being provided with a fourth groove 1251, the first groove 1231 being opposite to the second groove 1241 to form the first through groove 121, the third groove 1242 being opposite to the fourth groove 1251 to form the second through groove 122. In this embodiment, the first pad 123, the second pad 124 and the third pad 125 are connected separately, while in other embodiments, the first pad 123, the second pad 124 and the third pad 125 can be integrally formed (i.e., obtained by processing based on a whole plate).

[0089] As an example, see Figure 2 and Figure 4 , the fixing assembly 100 also includes a first fixing block 13 for fixing the first position adjusting member 31 and a second fixing block 14 for fixing the second position adjusting member 32, the first fixing block 13 and the second fixing block 14 are both arranged above the base 12 and arranged on both sides of the product fixing seat 11, when the base 12 is composed of the first cushion block 123, the second cushion block 124 and the third cushion block 125, the first fixing block 13 is located above the first cushion block 123, and the second fixing block 14 is located above the third cushion block 125. It should be noted that the first fixing block 13 and the second fixing block 14 need to maintain a preset distance from the product fixing seat 11 to expose the first through slot 121 and the second through slot 122 respectively. In this embodiment, the first fixing block 13 and the second fixing block 14 are both separately connected to the base 12, which can facilitate replacement and maintenance when some parts are damaged, thereby reducing costs. In other embodiments, the first fixing block 13 and the second fixing block 14 can also be integrally formed with the base 12, which can be selected based on actual needs.

[0090] As an example, see Figure 4 , Figures 8 to 10 ,in, Figure 8 It is a schematic diagram of the overall structure of the first push rod. Fig. 9 It is a schematic diagram of the overall structure of the first rotating rod. Fig.10The first position adjusting member includes a first push rod 311 and a first rotating rod 312. The first fixed block 13 is provided with a fifth groove 131. The first push rod 311, the first rotating rod 312 and the fifth groove 131 all extend along the Y direction and at least a portion of the first push rod 311 is located in the fifth groove 131. The fifth groove 131 includes a first groove wall 1311 and a second groove wall 1312 that are opposite to each other in the Y direction. Fig.11 , which is a schematic diagram of the overall structure in which the first position adjustment member is fixed to the first fixed block, one end of the first rotating rod 312 sequentially passes through the first groove wall 1311, the first push rod 311 and the second groove wall 1312 to connect the first push rod 311 so that the first push rod 311 rotates with the rotation of the first rotating rod 312; the second position adjustment member 32 includes a second push rod 321 and a second rotating rod 322, the second fixed block 14 is provided with a sixth groove (not shown in the figure), the second push rod 321, the second rotating rod 322 and the sixth groove all extend along the Y direction and the second push rod At least a portion of 321 is located in the sixth groove, and the sixth groove includes a third groove wall and a fourth groove wall opposite to each other in the Y direction. One end of the second rotating rod 322 sequentially penetrates the second groove wall 1312, the second push rod 321 and the fourth groove wall to connect the second push rod 321 so that the second push rod 321 rotates with the rotation of the second rotating rod 322. It should be noted that since the structures of the first position adjusting member and the first fixing block 13 are substantially the same as those of the second position adjusting member and the second fixing block 14, the specific structure and position relationship of the second position adjusting member and the second fixing block 14 can be referred to. Figures 8 to 11 It is understood that the provision of the fifth groove and the sixth groove further improves volume utilization.

[0091] As an example, see Fig. 9 At least one end of the first rotating rod 312 is provided with a bent handle, and at least one end of the second rotating rod 322 is provided with a bent handle, so as to facilitate rotation to adjust the distance of the test connector relative to the product fixing seat 11. Of course, the rotating rod structure can also be designed in other ways that are easy to hold and rotate.

[0092] As an example, see Fig.12 , which is a schematic diagram of the overall structure of the first test connector. The first test connector 21 includes a plurality of first gold fingers 211 spaced apart in the Y direction. Fig.13, which is a schematic diagram of the overall structure of the second test connector, wherein the second test connector 22 includes a plurality of second gold fingers 221 spaced apart in the Y direction. The schematic diagram of the structure of the first test connector 21 and the second test connector 22 in this embodiment is only used as an example. In actual application, the structures of the first test connector 21 and the second test connector 22 may be the same or different. The structural setting of the test connector is adjusted based on the specific structure of the first test end 41 and the second test end 42 of the IPM product 400 to be tested. Similarly, the size specifications (width, length, thickness and number) of each gold finger, the spacing between two adjacent gold fingers and other parameters are also reasonably set based on actual needs.

[0093] As an example, the first test connector 21 further includes a first fixing portion 212, which covers at least a portion of the first gold finger 211; the second test connector 22 further includes a second fixing portion 222, which covers at least a portion of the second gold finger 221. For example, see Fig.13 , which is a perspective structural diagram of the second test connector. When the first test connector includes a first fixing portion 212, the first fixing portion 212 covers most of the structure of the first gold finger 211. The setting of the fixing portion can prevent the gold finger from being damaged when the gold finger is fixed to the through groove of the base 12 alone. On the other hand, the fixing seat makes the position of each gold finger relatively fixed, thereby preventing the position of the gold finger from shifting and affecting the test result.

[0094] As an example, see Figure 2 and Fig.15 , Fig.15It is a schematic diagram of the position adjustment process of the position adjustment component for the test connection component in this embodiment, wherein the dotted lines correspond to the states of the structures before the position adjustment, and the solid lines correspond to the states of the structures after the position adjustment. The first test connection component 21 is spaced apart from the first push rod 311, and when the first push rod 311 rotates, it pushes the end of the first test connection component 21 facing the product fixing seat 11 toward the product fixing seat 11, and the second test connection component 22 is spaced apart from the second push rod 321, and when the second push rod 321 rotates, it pushes the end of the second test connection component 22 facing the product fixing seat 11 toward the product fixing seat 11. That is, in this embodiment, before the IPM product 400 to be tested is installed on the product fixing seat 11, the first position adjustment member 31 and the first test connection member 21 (including the first push rod 311) are spaced apart, and the second position adjustment member 32 and the second test connection member 22 (including the second push rod 321) are spaced apart. After the IPM product 400 to be tested is installed on the product fixing seat 11, the first rotating rod 312 is rotated to drive the first push rod 311 to rotate. During the rotation process, the side of the first push rod 311 away from the rotation center gradually approaches the first test connection member 21 until it contacts the first test connection member 21. The first push rod 311 and the first test connection member 22 are spaced apart. After contacting, the first test connector 21 still maintains the rotation trend and pushes the end of the first test connector 21 facing the product fixing seat 11 to gradually move closer to the product fixing seat 11 until it abuts against the first test end 41 of the IPM product 400 to be tested. Similarly, the second push rod 321, driven by the second rotating rod 322, pushes the second test connector 22 to abut against the second test end 42 of the IPM product 400 to be tested. However, since the extension directions of the first test connector 21 and the second test connector 22 facing one end of the product fixing seat 11 are opposite, when in use, the first rotating rod 312 and the second rotating rod 322 need to be rotated in opposite directions to enable the two test connectors to contact with the corresponding test ends. It should be noted that since the other ends of the first test connector 21 and the second test connector 22 extend downward through the through slots provided on the base 12, the portions within the through slots are fixed to the base 12 by fasteners. Under the pushing force of the push rod, the portions above the through slots will be slightly deformed. Therefore, the fixing portions of the first test connector and the second test connector need to be made of a tough material to avoid structural damage due to deformation and affect the accuracy of the test results.

[0095] As an example, the longitudinal section of the first push rod 311 in the Y direction is a waist round shape (also known as a runway shape, a capsule shape), a rounded rectangular shape, an elliptical shape, a circular shape or other suitable smooth surface morphology, which can avoid damage to the surface of the test connection piece due to sharp edges and corners in the process of pushing or driving the test connection piece to move. The second push rod 321 is consistent with the shape of the first push rod 311, but it should be noted that when the longitudinal section of the push rod is circular, the position where the rotating rod penetrates the push rod needs to be reasonably selected (not located at the center) to ensure that the push rod can push the test connection piece to facilitate the connection of the test end. In this embodiment, the first push rod 311 and the second push rod 321 are both waist round, and the first rotating rod 312 deviates from the center of the first push rod 311 and penetrates the first push rod 311, and the second rotating rod 322 deviates from the center of the second push rod 321 and penetrates the second push rod 321, while in other embodiments, the shape of the push rod and the specific position where the rotating rod penetrates the push rod can be adjusted based on actual needs, so that the technical effect of contacting the test connection piece with the test end can be achieved.

[0096] As an example, the connections between the structures in this embodiment are all made by fastener connection (such as screw connection). For example, the first cushion block 123, the second cushion block 124 and the third cushion block 125 are connected by screws to form the base 12, the first fixed block 13, the second fixed block 14 and the product fixing seat 11 are also connected to the base 12 by screws, the first push rod 311 and the first rotating rod 312 (the second push rod 321 and the second rotating rod 322) are also connected by screws, and the first test connector 21 (the second test connector 22) and the base 12 are also connected by screws. In other embodiments, the structures can also be glued or connected in other suitable ways to achieve the technical effect of easy disassembly and assembly.

[0097] As an example, the IPM socket test fixture of this embodiment performs an electrical performance test on the IPM product under the 1200V / 70A test condition, and in other embodiments, the IPM socket test fixture can also perform electrical performance tests on the IPM product under other test conditions. Taking the test of the current value of the IPM product as an example, the IPM (1200V / 70A) product is fixedly installed on the product fixing seat of the test fixture, and the other ends of the first test connector and the second test connector (extending through the through slot to the bottom of the base) are electrically connected to the PCB circuit board respectively, and the position of one end of the first test connector and the second test connector (the end extending toward the product fixing seat) is adjusted by the position adjustment member to make Kelvin contact with the test end of the product, and the Kelvin bridge principle is used to obtain the current information flowing in the circuit and output the current signal to the test board to achieve the measurement of the current of the IPM product.

[0098] The IPM socket test fixture of this embodiment is different from the existing one-piece solder paste welding test fixture (such as Figure 1 As shown), the split-connected overall structure is simple and convenient to disassemble and assemble, which reduces the difficulty and time of daily maintenance operations, and can customize exclusive test fixtures based on the size of the IPM product to be tested; the volume is relatively small, and the PCB circuit board and test adapter board used in conjunction with the test fixture are correspondingly small, which can improve the portability of operation and meet the needs of multiple applications; the test connector is first fixed to the fixed component, and then the position of one end of the test is adjusted through the position adjustment component to contact the test end of the IPM product to be tested. The contact stability is good, which can ensure the accuracy of the test data. The test connector is composed of multiple gold fingers, and the voltage resistance performance is doubled (can withstand 1200V / 70A test conditions), and it can withstand high temperatures of 150°C, which can better meet actual test needs.

[0099] Embodiment 2

[0100] The present embodiment provides an IPM socket test fixture. The difference between the IPM socket test fixture and the test fixture of the first embodiment is that the test connection component (including the first test connection component and the second test connection component) and the position adjustment component (including the first position adjustment component and the second position adjustment component) in the first embodiment are arranged at an interval, while the first test connection component in the present embodiment vertically penetrates the first push rod and the second test connection component vertically penetrates the second push rod.

[0101] For details, please refer to Fig.17 , which is a schematic diagram of the overall structure of the socket test fixture, and the socket test fixture includes a fixing component 100, a test connection component 200 and a position adjustment component 300 ( Fig.17 Not marked, please refer to Figure 2 and Figure 4 ).

[0102] As an example, see Fig.16 and Fig.17 , Fig.17It is a schematic diagram of the position adjustment process of the position adjustment component on the test connection component in this embodiment, wherein the first test connection component 21 vertically penetrates the first push rod 311, and when the first push rod 311 rotates, it drives one end of the first test connection component 21 facing the product fixing seat 11 to move closer to the product fixing seat 11; the second test connection component 22 vertically penetrates the second push rod 321, and when the second push rod 321 rotates, it drives one end of the second test connection component 22 facing the product fixing seat 11 to move closer to the product fixing seat 11. That is, in this embodiment, before the IPM product 400 to be tested is installed on the product fixing seat 11, the first test connecting member 21 vertically penetrates the first push rod 311, the second test connecting member 22 vertically penetrates the second push rod 321, and the ends of the two test connecting members facing the product fixing seat 11 both maintain a preset distance from the product fixing seat 11. After the IPM product 400 to be tested is installed on the product fixing seat 11, the first rotating rod 312 is rotated to drive the first push rod 311 to rotate. The first push rod 311 drives the first test connecting member 21 to rotate during the rotation process. During the rotation process, the end of the first test connecting member 21 facing the product fixing seat 11 gradually approaches the first test end 41 until it contacts the first test end 41. Similarly, the second test connecting member 22 is driven by the second push rod 321 to gradually approach the second test end 42 until it contacts the second test end 42. It should be noted that since the other ends of the first test connector 21 and the second test connector 22 extend downward through the through slots provided on the base 12, the portions within the through slots are fixed to the base 12 by fasteners. During the process of rotation with the push rod, the portions under the push rod will be slightly deformed. Therefore, the fixing portions of the first test connector and the second test connector need to be made of a tough material to avoid structural damage due to deformation and affect the accuracy of the test results.

[0103] Embodiment 3

[0104] This embodiment provides an IPM testing device, which includes a PCB circuit board and the IPM socket testing jig described in Embodiment 1 and / or Embodiment 2, and the other end of the first test connector and the other end of the second test connector are electrically connected to the PCB circuit board respectively.

[0105] As an example, the PCB circuit board is located below the IPM socket test fixture, preferably below the base, which can reduce the connection distance and reduce the test error. In other embodiments, the position of the PCB circuit board is not necessarily limited to below the test fixture, and it can meet the electrical connection with the other end of the first test connector and the other end of the second test connector to form a test loop.

[0106] Specifically, the IPM socket test jig includes a test connection assembly for electrically connecting to the IPM product to be tested, the test connection assembly includes a first test connector and a second test connector, one end of the first test connector and one end of the second test connector both extend toward the product fixing seat so as to subsequently contact the test end of the IPM product to be tested under the action of the position adjustment assembly, and the other end of the first test connector and the other end of the second test connector both extend downward through a through groove provided on the base until they are connected to the PCB circuit board located below the base.

[0107] The IPM testing device of this embodiment has a simple structure, is easy to use, has accurate testing, and has excellent pressure resistance performance. It can better meet actual testing needs and has strong market competitiveness.

[0108] In summary, the IPM socket test fixture of the present invention, compared with the existing one-piece solder paste welding test fixture, has a split connection overall structure, which is simple and convenient to disassemble and assemble, reducing the difficulty and time of daily maintenance operations; it is small in size, which can improve the portability of operation and meet the needs of multiple applications; the test connector composed of multiple gold fingers has stable and good contact with the test end of the IPM product to be tested, which can ensure the accuracy of the test data, and the pressure resistance performance is doubled (can withstand 1200V / 70A test conditions), and it can withstand high temperatures of 150°C, which better meets actual test needs. The IPM test device of the present invention has a simple structure, is easy to use, has accurate testing, and has excellent pressure resistance performance. It better meets actual test needs and has strong market competitiveness. Therefore, the present invention effectively overcomes the various shortcomings in the prior art and has a high industrial utilization value.

[0109] The above embodiments are merely illustrative of the principles and effects of the present invention, and are not intended to limit the present invention. Anyone familiar with the art may modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by a person of ordinary skill in the art without departing from the spirit and technical concept disclosed by the present invention shall still be covered by the claims of the present invention.

Claims

1. An IPM socket test fixture, characterized in that: include: A fixing assembly, comprising a product fixing seat for fixing the IPM product to be tested, wherein the IPM product to be tested comprises a first test end and a second test end arranged opposite to each other; a test connection assembly connected to the fixing assembly, the test connection assembly comprising a first test connection piece and a second test connection piece, the first test connection piece and the second test connection piece are arranged at opposite sides of the product fixing seat and are spaced apart from the product fixing seat by a preset distance, one end of the first test connection piece extends toward the product fixing seat, and one end of the second test connection piece extends toward the product fixing seat; A position adjustment component is connected to the fixing component, and the position adjustment component includes a first position adjustment member and a second position adjustment member, the first position adjustment member is used to adjust the position of the first test connector toward one end of the product fixing seat so that the first test connector is electrically connected to the first test end, and the second position adjustment member is used to adjust the position of the second test connector toward one end of the product fixing seat so that the second test connector is electrically connected to the second test end.

2. The IPM socket test fixture according to claim 1, characterized in that: The fixing assembly also includes a base, the product fixing seat is arranged above the base, and the base is provided with a first through slot and a second through slot vertically penetrating the base, the first through slot and the second through slot are arranged on both sides of the product fixing seat and both extend in the X direction, the other end of the first test connector passes through the first through slot and extends to the bottom of the base, and the other end of the second test part passes through the second through slot and extends to the bottom of the base.

3. The IPM socket test fixture according to claim 2, characterized in that: The base includes a first pad, a second pad and a third pad connected in sequence in the Y direction, the Y direction is perpendicular to the X direction, the product fixing seat is arranged above the second pad, the first pad is provided with a first groove, the second pad is provided with a second groove and a third groove, the third pad is provided with a fourth groove, the first groove is opposite to the second groove to form the first through groove, and the third groove is opposite to the fourth groove to form the second through groove.

4. The IPM socket test fixture according to claim 2, characterized in that: The fixing assembly also includes a first fixing block for fixing the first position adjusting member and a second fixing block for fixing the second position adjusting member. The first fixing block and the second fixing block are both arranged above the base and arranged on both sides of the product fixing seat.

5. The IPM socket test fixture according to claim 4, characterized in that: The first position adjustment member includes a first push rod and a first rotating rod, the first fixed block is provided with a fifth groove, the first push rod, the first rotating rod and the fifth groove all extend along the Y direction and at least a portion of the first push rod is located in the fifth groove, the fifth groove includes a first groove wall and a second groove wall opposite to each other in the Y direction, one end of the first rotating rod sequentially penetrates the first groove wall, the first connecting rod and the second groove wall to connect the first push rod so that the first push rod rotates with the rotation of the first rotating rod; the second position adjustment member includes a second push rod and a second rotating rod, the second fixed block is provided with a sixth groove, the second push rod, the second rotating rod and the sixth groove all extend along the Y direction and at least a portion of the second push rod is located in the sixth groove, the sixth groove includes a third groove wall and a fourth groove wall opposite to each other in the Y direction, one end of the second rotating rod sequentially penetrates the second groove wall, the second connecting rod and the fourth groove wall to connect the second push rod so that the second push rod rotates with the rotation of the second rotating rod.

6. The IPM socket test fixture according to claim 5, characterized in that: The first test connector is spaced apart from the first push rod, and when the first push rod rotates, it pushes one end of the first test connector facing the product holder toward the product holder, and the second test connector is spaced apart from the second push rod, and when the second push rod rotates, it pushes one end of the second test connector facing the product holder toward the product holder.

7. The IPM socket test fixture according to claim 5, characterized in that: The first test connection member vertically penetrates the first push rod, and when the first push rod rotates, it drives one end of the first test connection member facing the product fixing seat to move closer to the product fixing seat; the second test connection member vertically penetrates the second push rod, and when the second push rod rotates, it drives one end of the second test connection member facing the product fixing seat to move closer to the product fixing seat.

8. The IPM socket test fixture according to claim 1, characterized in that: The first test connector includes a plurality of first gold fingers spaced apart in the Y direction, and the second test connector includes a plurality of second gold fingers spaced apart in the Y direction.

9. The IPM socket test fixture according to claim 8, characterized in that: The first test connector further includes a first fixing portion, which covers at least a portion of the first gold finger; the second test connector further includes a second fixing portion, which covers at least a portion of the second gold finger.

10. The IPM socket test fixture according to claim 1, characterized in that: At least one side surface of the product fixing seat in the Y direction is provided with a plurality of fixing seat grooves extending vertically, and the fixing seat grooves penetrate the upper surface of the product fixing seat.

11. An IPM testing device, characterized in that: include: A PCB circuit board and an IPM socket test jig as described in any one of claims 1 to 10, wherein the other end of the first test connector and the other end of the second test connector are electrically connected to the PCB circuit board respectively.