Elastic element accelerated storage test method and related device

Abstract

The invention provides an accelerated storage test method for an elastic element. The method comprises the following steps: determining a target deformation amount of the elastic element; in a pre-stored test parameter database, determining acceleration coefficients of the accelerated storage test corresponding to the plurality of test temperatures; based on the target deformation and each acceleration coefficient, determining the acceleration duration of the accelerated storage test of the elastic element at the plurality of test temperatures; determining a target duration in the plurality of acceleration durations, and determining a test temperature corresponding to the target duration as a target temperature; and executing the accelerated storage test based on the target duration and the target temperature. According to the method, a user can conveniently carry out storage performance change analysis on the elastic element with the target deformation amount, then the deformation limit amount of the elastic element is conveniently evaluated, the storage life of the elastic element is evaluated on the basis, and macroscopic and microcosmic performance change research on the elastic element is enriched.

Description

Technical Field

[0001] The present application relates to the technical field, and in particular to an accelerated storage test method for elastic elements and related devices. Background Art

[0002] The function of metal shock absorbers is mainly to reduce vibration when installing a single machine or bracket. During use and storage, metal shock absorbers will age due to environmental factors, resulting in a gradual decline in functional performance indicators (such as damping ratio, vibration reduction efficiency, etc.), which cannot meet the use requirements or may even be completely destroyed. Therefore, it is necessary to analyze the storage environment of the metal shock absorber and conduct accelerated storage tests to evaluate the storage performance changes of the shock absorber and thereby assess its storage life. Summary of the invention

[0003] In view of this, the purpose of the present application is to provide an accelerated storage test method for elastic elements and a related device.

[0004] Based on the above purpose, the present application provides an accelerated storage test method for elastic elements, comprising:

[0005] determining a target deformation amount of the elastic element;

[0006] Determining acceleration coefficients of accelerated storage tests corresponding to a plurality of test temperatures in a pre-stored test parameter database;

[0007] Determining the acceleration duration of the accelerated storage test of the elastic element at multiple test temperatures based on the target deformation and each acceleration coefficient;

[0008] Determining a target duration among the plurality of acceleration durations, and determining a test temperature corresponding to the target duration as a target temperature;

[0009] The accelerated storage test is performed based on the target time and the target temperature.

[0010] Furthermore, determining the target deformation amount of the elastic element includes:

[0011] Get the preset simulation temperature and simulation duration;

[0012] Determining a simulation acceleration coefficient of the accelerated storage test corresponding to the simulation temperature based on a mapping relationship between the test temperature and the acceleration coefficient in the test parameter database;

[0013] Determining a deformation amount of the elastic element at the simulation temperature based on the simulation acceleration coefficient and the simulation duration, and determining the deformation amount as a target deformation amount;

[0014] Wherein, the simulation temperature is lower than the test temperature.

[0015] Furthermore, the pre-storage process of the test parameter database includes:

[0016] Obtain multiple sets of elastic elements;

[0017] Based on the multiple groups of elastic elements, respectively, an accelerated storage test of a preset duration at multiple test temperatures is performed;

[0018] Based on the accelerated storage test of the preset time at the multiple test temperatures, the deformation amounts of the multiple groups of elastic elements are obtained;

[0019] Based on the deformation amounts of the multiple groups of elastic elements and the preset time lengths, the acceleration coefficients at multiple test temperatures are calculated;

[0020] The multiple acceleration coefficients and the multiple test temperatures are matched one by one and stored in the test parameter database.

[0021] Furthermore, the process of determining the mapping relationship between the test temperature and the acceleration coefficient in the test parameter database includes:

[0022] Determine the linear relationship between the acceleration factor and the inverse of the test temperature by using the Arrhenius formula;

[0023] Based on the linear relationship, linear fitting is performed on multiple groups of test temperatures and acceleration coefficients in the test parameter database to obtain a mapping relationship between the test temperature and the acceleration coefficient.

[0024] Furthermore, the test process of the accelerated storage test includes:

[0025] Obtaining an elastic element to be tested;

[0026] Installing the elastic element to be tested between the stoppers to obtain the elastic element installed on the stoppers, wherein the stoppers are used to simulate the storage environment of the elastic element;

[0027] Placing the elastic element installed on the stopper in a temperature box with a target temperature, and setting the temperature action time of the temperature box to the target time;

[0028] In response to determining that the temperature box stops the temperature action, a tested elastic element is obtained.

[0029] Furthermore, the acceleration coefficients at multiple test temperatures are calculated based on the deformation amounts of the multiple groups of elastic elements and the preset time lengths, including:

[0030] Based on the stress relaxation regression equation of the metal material and the linear relationship between the load and deformation of the elastic element, the restorable deformation relaxation regression equation of the elastic element is determined;

[0031] Based on the restorable deformation relaxation regression equation, the deformation amounts of the multiple groups of elastic elements and the preset time length, an acceleration coefficient in the restorable deformation relaxation regression equation is determined.

[0032] Furthermore, the stress relaxation regression equation of the metal material is:

[0033] σ=a-blnt

[0034] In the formula, σ is the residual stress after relaxation time t; a is the intersection of the straight line equation and the ordinate axis; b is the stress relaxation rate, that is, the slope of the straight line segment; t is the relaxation time, in hours; a and b are related to the initial stress of the material and the test temperature.

[0035] Furthermore, the linear relationship between the load and deformation of the elastic element is:

[0036]

[0037] Among them, h i is the measured height of the elastic element after the test, h0 is the initial height of the elastic element, and h s is the height of the stopper used in the accelerated storage test of the elastic element, s is the force-bearing area of ​​the elastic element, and for products of the same specification, k is a constant.

[0038] Furthermore, the recoverable deformation relaxation regression equation of the elastic element is:

[0039]

[0040] Where h is the recoverable deformation, is the recoverable deformation stress relaxation rate, is the recoverable deformation constant, A and B are acceleration coefficients.

[0041] Based on the same inventive concept, the present disclosure also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable by the processor, wherein the processor implements the method as described above when executing the computer program.

[0042] From the above, it can be seen that the present application provides an accelerated storage test method for elastic elements. By determining the acceleration coefficients at multiple test temperatures in a pre-stored test parameter database, and on this basis, combined with the target deformation of the elastic element, the multiple acceleration times required for the elastic element to perform accelerated storage tests at multiple test temperatures to reach the target deformation are determined. Based on this, the target time is determined among the multiple acceleration times, and the test temperature corresponding to the target time is determined as the target temperature to perform an accelerated storage test. The elastic element obtained after the test is the elastic element after reaching the target deformation. The present application performs an accelerated storage test on the basis of the target deformation and the test parameter database so that the elastic element reaches the target deformation, which is convenient for users to analyze the storage performance changes of the elastic element with the target deformation, and then facilitates the evaluation of the deformation limit of the elastic element, and on this basis, the storage life of the elastic element is evaluated, enriching the research on the macro and micro performance changes of the elastic element. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] In order to more clearly illustrate the technical solutions in the present application or related technologies, the drawings required for use in the embodiments or related technical descriptions are briefly introduced below. Obviously, the drawings described below are only embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0044] Figure 1 This is a schematic diagram of the process of the accelerated storage test method for elastic elements according to an embodiment of the present application;

[0045] Figure 2 This is a schematic diagram of the structure of the accelerated storage test device for elastic elements according to an embodiment of the present application;

[0046] Figure 3 It is a schematic diagram of the structure of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0047] In order to make the objectives, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below in combination with specific embodiments and with reference to the accompanying drawings.

[0048] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present application should be the usual meanings understood by people with ordinary skills in the field to which the present application belongs. The "first", "second" and similar words used in the embodiments of the present application do not represent any order, quantity or importance, but are only used to distinguish different components. "Including" or "comprising" and similar words mean that the elements or objects appearing in front of the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0049] As mentioned in the background technology, metal shock absorbers will age during use and storage due to the influence of environmental factors, resulting in a gradual decline in functional performance indicators (such as damping ratio, vibration reduction efficiency, etc.), which cannot meet the use requirements or even completely destroyed. Therefore, it is necessary to analyze the storage environment of the metal shock absorber and conduct accelerated storage tests to evaluate the storage performance changes of the shock absorber and thereby assess its storage life.

[0050] Based on this, the present application proposes an accelerated storage test method and electronic equipment for elastic elements, so as to determine the target test temperature and target acceleration time of the accelerated storage test according to the target storage life of the elastic element, so as to obtain the target elastic element, and on this basis, analyze the performance of the target elastic element, determine the storage performance change of the elastic element, so as to determine the storage life of the elastic element.

[0051] The following is a detailed description of the embodiments of the present application in conjunction with the accompanying drawings. The present application provides an accelerated storage test method for elastic elements, such as Figure 1 As shown, including:

[0052] Step S100, determining a target deformation amount of the elastic element;

[0053] Specifically, the target deformation is related to the target storage temperature and target storage time of the elastic element. For example, an accelerated storage test is to be conducted to obtain an elastic element stored at room temperature for ten years in order to analyze the performance changes of the elastic element after ten years of storage at room temperature. First, it is determined that the deformation of the elastic element generated by storing it at room temperature (25°C) for 10 years is the target deformation.

[0054] Step S200, determining the acceleration coefficients of the accelerated storage test corresponding to the multiple test temperatures in the pre-stored test parameter database;

[0055] Specifically, the test temperature and the corresponding acceleration coefficient in the pre-stored test parameter database are values ​​obtained by performing an accelerated storage test, so as to determine the test duration of the accelerated storage test at different test temperatures based on the target deformation.

[0056] Step S300, determining the acceleration duration of the accelerated storage test of the elastic element at multiple test temperatures based on the target deformation and each acceleration coefficient;

[0057] Specifically, the deformation of the elastic element is related to the acceleration coefficient and the acceleration duration at different test temperatures. The acceleration duration of the accelerated storage test at different test temperatures is determined according to the target deformation and the acceleration coefficient at different test temperatures.

[0058] Exemplarily, h=A+Blnt, h is the target deformation, A and B are acceleration coefficients, and t is the acceleration time. Based on the known target deformation and the acceleration coefficients at different test temperatures, the acceleration time at different test temperatures can be determined.

[0059] Step S400, determining a target duration from the plurality of acceleration durations, and determining a test temperature corresponding to the target duration as a target temperature;

[0060] Specifically, after calculating the multiple acceleration time periods corresponding to the multiple test temperatures, the target time period is determined from the multiple acceleration time periods based on factors such as time period or test environment requirements, and the test temperature corresponding to the target time period is determined as the target temperature to conduct an accelerated storage test.

[0061] Step S500: performing the accelerated storage test based on the target duration and the target temperature.

[0062] Specifically, after the target duration and the target temperature are determined, the elastic element is subjected to a corresponding accelerated storage test, that is, the test temperature of the accelerated storage test is the target temperature, and the test duration is the target duration.

[0063] In this embodiment, the acceleration coefficients at multiple test temperatures are determined in a pre-stored test parameter database, and on this basis, combined with the target deformation of the elastic element, multiple acceleration times required for the elastic element to perform accelerated storage tests at multiple test temperatures to reach the target deformation are determined. Based on this, the target time is determined among the multiple acceleration times, and the test temperature corresponding to the target time is determined as the target temperature to perform an accelerated storage test. The elastic element obtained after the test is the elastic element that reaches the target deformation. The present application performs an accelerated storage test based on the target deformation and the test parameter database to enable the elastic element to reach the target deformation, which is convenient for users to analyze the storage performance changes of the elastic element with the target deformation, and then facilitates the evaluation of the deformation limit of the elastic element, and on this basis, the storage life of the elastic element is evaluated, enriching the research on the macro and micro performance changes of the elastic element.

[0064] In some embodiments, step S100: determining a target deformation amount of the elastic element includes:

[0065] Step S101, obtaining a preset simulation temperature and simulation duration;

[0066] Specifically, the simulation temperature and the simulation duration correspond to the target storage temperature and target storage duration of the elastic element. For example, an accelerated storage test is to be conducted to obtain an elastic element stored at room temperature for ten years in order to analyze the performance changes of the elastic element after being stored at room temperature for ten years. The deformation of the elastic element after being stored at room temperature (25°C) for 10 years is the target deformation, the preset simulation temperature is 25°C, and the preset simulation duration is 10 years.

[0067] Step S102, determining a simulation acceleration coefficient of the accelerated storage test corresponding to the simulation temperature based on a mapping relationship between the test temperature and the acceleration coefficient in the test parameter database;

[0068] Specifically, to determine the target deformation amount, based on the known simulation temperature and the simulation duration, it is necessary to determine the simulation acceleration coefficient of the accelerated storage test corresponding to the simulation temperature, and determine the simulation acceleration coefficient corresponding to the simulation temperature through the mapping relationship between the test temperature and the acceleration coefficient in the pre-stored test parameter database. That is, based on the test temperature and the acceleration coefficient in the test parameter database, the simulation acceleration coefficient corresponding to the simulation temperature is determined.

[0069] Step S103, determining the deformation amount of the elastic element at the simulation temperature based on the simulation acceleration coefficient and the simulation duration, and determining the deformation amount as a target deformation amount;

[0070] Wherein, the simulation temperature is lower than the test temperature.

[0071] Specifically, based on the known simulation temperature, simulation duration and simulation acceleration coefficient, the deformation corresponding to the simulation temperature and simulation duration, that is, the target deformation, can be calculated based on the formula of deformation, acceleration coefficient and acceleration duration.

[0072] It should be noted that the simulation temperature is lower than the test temperature. A higher temperature can accelerate the aging deformation of the elastic element, reflecting the purpose of accelerating the storage test. The simulation temperature is used to simulate the storage of the elastic element in an actual environment. Therefore, it is inevitable that the simulation temperature is lower than the test temperature.

[0073] In this embodiment, the simulated temperature and the simulated duration are to simulate the corresponding environmental temperature and storage duration of the elastic element after being stored in a natural environment for several years, that is, the purpose of performing the accelerated storage test based on the target duration and the target temperature is to simulate the test of the elastic element being stored in a natural environment, so as to analyze the performance changes caused by the storage of the elastic element. Through the mapping relationship between the test temperature and the acceleration parameter in the test parameter database, the deformation amount of the elastic element after being stored in a natural environment for a certain number of years can be estimated, and then it is convenient to determine the corresponding test temperature and test duration of the accelerated storage test, which is conducive to improving the accuracy and simplicity of the accelerated storage test.

[0074] Exemplarily, an accelerated storage test is carried out to obtain an elastic element after being stored at room temperature for ten years, so as to analyze the performance changes of the elastic element after being stored at room temperature for ten years. The deformation of the elastic element after being stored at room temperature (25°C) for 17 years is the target deformation, the preset simulation temperature is 25°C, and the preset simulation time is 17 years.

[0075] The mapping relationship between the test temperature and the acceleration factor in the test parameter database is: Substituting the simulation temperature, i.e. 25°C = 298K, and the simulation duration, i.e. 17 years = 17*365*24 = 148920 hours, into the mapping relationship between the acceleration coefficient and the test temperature, the simulation acceleration coefficients are obtained as A = 2.7674 and B = 0.1026.

[0076] Based on the known simulation acceleration coefficient, the recoverable deformation relaxation regression equation at the simulation temperature is determined as h i -h s =2.7674+0.1026lnt, and substituting t=148920 into the regression equation can obtain the deformation of the elastic element at the simulated temperature and the simulated duration, that is, the target deformation is 3.9895 mm.

[0077] It should be noted that the test temperature in the formula needs to be converted into Kelvin temperature, and the value obtained by adding 273 to the Celsius temperature value is the Kelvin temperature value to meet the requirements of the calculation formula.

[0078] In some embodiments, the pre-storage process of the test parameter database includes:

[0079] Step S601, obtaining multiple groups of elastic elements;

[0080] Specifically, the test parameter database includes multiple test temperatures and acceleration coefficients corresponding to the multiple test temperatures. The acceleration coefficient is determined by calculation based on the test data obtained after the accelerated storage test. Therefore, setting up multiple groups of elastic elements can improve the accuracy of the acceleration coefficient, thereby improving the accuracy of the storage life prediction of the elastic elements.

[0081] The multiple groups of elastic elements correspond to multiple test temperatures, and the multiple elastic elements are subjected to accelerated storage tests at each test temperature to obtain multiple groups of test data.

[0082] Step S602, based on the multiple groups of elastic elements, respectively perform accelerated storage tests at multiple test temperatures for preset time periods;

[0083] Specifically, at each test temperature, the plurality of elastic elements are subjected to an accelerated storage test for a preset time period, and the preset time period may be one or more.

[0084] Exemplarily, the multiple test temperatures include 110°C, 130°C, 150°C and 170°C. The multiple elastic elements at each test temperature are sequentially subjected to accelerated storage tests at multiple preset time lengths such as 168 hours, 504 hours, 672 hours, etc., to obtain the deformation of the elastic elements after being stored for different time lengths at a test temperature. This increases the sample data, which is beneficial to improving the accuracy of the acceleration coefficient, and thus is beneficial to the practicability and generalizability of the method.

[0085] Step S603, obtaining deformation amounts of multiple groups of elastic elements based on the accelerated storage test of preset durations at the multiple test temperatures;

[0086] Specifically, for accelerated storage tests with different preset durations, the deformation of each elastic element at different test temperatures and different preset durations is measured in sequence to form sample data.

[0087] Step S604, calculating acceleration coefficients at multiple test temperatures based on the deformation amounts of the multiple groups of elastic elements and the preset time lengths;

[0088] Specifically, based on the known test temperature, the preset time and the deformation, the acceleration coefficient of the elastic element at different test temperatures is calculated in combination with the stress relaxation curve of the corresponding metal material and the relationship between the stress and deformation of the elastic element. The deformation of the elastic element at the test temperature and after different test time periods can be determined based on the acceleration coefficient.

[0089] Step S605 , storing the multiple acceleration coefficients and the multiple test temperatures in the test parameter database in a one-to-one correspondence.

[0090] Specifically, the acceleration coefficient and the test temperature are stored in the test parameter database in a one-to-one correspondence, so as to facilitate user access.

[0091] The following describes in detail the pre-storage process of the test parameter database through a specific embodiment:

[0092] First, four groups of elastic elements are selected as test samples, each group includes 8 elastic elements. The selected elastic elements are metal shock absorbers. The height H0 of each metal shock absorber is measured respectively. Considering that the storage of metal shock absorbers is usually installed on a single machine or a bracket for shock absorption, two cover plates are installed at both ends of the metal shock absorber. There are limit blocks between the two cover plates, so that the metal shock absorber can be accelerated under the action of the limit blocks. The distance between the two limit blocks is a fixed value H S =8.7 mm. The cover plate and the limit block form a limiter.

[0093] A set of metal shock absorbers is installed on each limiter and is numbered so that accelerated storage tests can be carried out at the same test temperature and test duration at the same time, which is beneficial to the accuracy of the test.

[0094] After that, the four stoppers with metal shock absorbers installed were placed in temperature boxes at 110℃, 130℃, 150℃ and 170℃ respectively, and kept for 168 hours, 504 hours, 672 hours, 840 hours, 1008 hours, 1176 hours, 1344 hours, 1512 hours and 1680 hours. After being taken out and cooled to room temperature, the height H of the four groups of metal shock absorbers were measured respectively. i .

[0095] The specific measurement data are shown in Tables 1 to 4.

[0096] Table 1 Height measurement values ​​of metal shock absorbers after accelerated storage tests at 110°C for different test durations

[0097] Serial number 0 168h 504h 672h 840h 1008h 1176h 1344h 1512h 1680h 1 11.14 10.42 10.2 10.26 10.05 10.27 10.18 10.11 10 10.11 2 11.06 10.33 10.15 10.19 10.05 10.2 10.02 10.04 9.97 10.08 3 11.05 10.37 10.3 10.25 10.14 10.22 10.11 9.97 9.93 10.08 4 10.96 10.3 10.04 10.09 9.99 10.11 10.17 10.01 9.96 10.02 5 10.94 10.39 10.11 10.24 10.11 10.18 10.23 10.13 10.12 10.05 6 11.11 10.55 10.14 10.32 10.24 10.15 10.29 10.1 10.14 10.16 7 11.13 10.37 10.18 10.3 10.1 10.16 10.24 10.16 10.01 10.12 8 11.04 10.34 10.12 10.18 10.06 10.13 10.25 10.1 10.02 10.06

[0098] Table 2 Height measurement values ​​of metal shock absorbers after accelerated storage tests at 130°C for different test durations

[0099] Serial number 0 168h 504h 672h 840h 1008h 1176h 1344h 1512h 1680h 1 11.18 10.35 10.12 10.1 10.08 10.15 10.16 10.09 9.99 10.22 2 11.15 10.34 10.18 10.31 10.27 10.37 10.09 10.07 9.99 10.2 3 11.14 10.28 10.2 10.17 10.35 10.28 10.15 10.04 10.07 10.17 4 11.07 10.35 10.12 10.11 10.01 10.13 10.18 9.87 10.01 9.95 5 11.18 10.23 9.92 10.04 10.02 10.3 10.32 9.87 9.89 9.94 6 11.07 10.16 10.01 10.03 9.97 10.18 10.03 9.94 9.88 10.04 7 11.2 10.35 10.23 10.05 10.02 10.15 10.04 10.06 10.06 9.99 8 10.98 10.15 9.81 9.8 9.83 9.98 9.88 9.84 9.75 9.91

[0100] Table 3 Height measurement values ​​of metal shock absorbers after accelerated storage tests at 150°C with different test durations

[0101] Serial number 0 168h 504h 672h 840h 1008h 1176h 1344h 1512h 1680h 1 11.19 9.98 9.93 10.04 9.99 9.97 10.15 10.08 10.06 10.13 2 11.06 9.88 9.98 9.97 10.1 9.93 10.1 10.06 10.03 10.02 3 10.95 9.76 9.78 9.81 9.72 9.89 9.93 9.84 9.73 9.96 4 11.08 9.79 9.95 9.9 9.99 9.97 9.94 9.98 9.99 9.98 5 11.21 9.88 10.02 10.05 10.03 10.03 10.1 9.97 10.09 10.08 6 11.13 9.84 9.99 9.97 9.95 10 10.13 10.02 10.06 10.1 7 11.16 10.06 9.99 10.13 9.99 10.1 10.22 10.08 10.04 10.1 8 11.06 9.78 9.95 10 9.96 9.98 9.95 9.98 10.01 10.03

[0102] Table 4 Height measurement values ​​of metal shock absorbers after accelerated storage tests at 170°C for different test durations

[0103]

[0104]

[0105] Based on the above measured data, it is processed to obtain the relationship between the deformation amount and time of the metal shock absorber at different temperatures:

[0106] Based on the stress relaxation curve and regression analysis drawn from the relaxation test data of a large number of metal materials, the stress relaxation curve can be expressed by the regression equation to show its regular changes:

[0107] σ=a-blnt

[0108] In the formula, σ is the residual stress after relaxation time t; a is the intersection of the straight line equation and the ordinate axis; b is the stress relaxation rate, that is, the slope of the straight line segment; t is the relaxation time, in hours (h); a and b are related to the initial stress of the material and the test temperature.

[0109] According to the relationship between the load and deformation of the metal shock absorber, it can be obtained

[0110]

[0111] Among them, h i is the height measurement value of the metal shock absorber each time, h0 is the initial height of the metal shock absorber, h s is the height of the limiter, s is the force-bearing area of ​​the metal shock absorber, and for products of the same specification, k is a constant.

[0112] Combining the above two formulas, we can get

[0113]

[0114] The above formula is the stress relaxation equation for recoverable deformation, where h i -h s is the recoverable deformation, is the recoverable deformation stress relaxation rate, is the recoverable deformation constant. A and B are both related to h s, constants related to temperature T.

[0115] Based on the above-mentioned stress relaxation equation of recoverable deformation, each sample data was fitted to obtain 8 fitting regression equations at different test temperatures, as shown in Tables 5 to 8.

[0116] Table 5 110℃ metal shock absorber fitting regression equation

[0117]

[0118]

[0119] Table 6 130℃ metal shock absorber fitting regression equation

[0120] Serial number Fitting the regression equation 1 <![CDATA[h i -h s =-0.1487lnt+2.444]]> 2 <![CDATA[h i -h s =-0.1377lnt+2.4302]]> 3 <![CDATA[h i -h s =-0.1350lnt+2.4021]]> 4 <![CDATA[h i -h s =-0.1481lnt+2.3763]]> 5 <![CDATA[h i -h s =-0.1591lnt+2.4336]]> 6 <![CDATA[h i -h s =-0.1476lnt+2.3241]]> 7 <![CDATA[h i -h s =-0.1611lnt+2.4893]]> 8 <![CDATA[h i -h s =-0.1579lnt+2.2488]]>

[0121] Table 7 150℃ metal shock absorber fitting regression equation

[0122] Serial number Fitting the regression equation 1 <![CDATA[h i -h s =-0.1498lnt+2.3587]]> 2 <![CDATA[h i -h s =-0.1357lnt+2.2341]]> 3 <![CDATA[h i -h s =-0.1471lnt+2.1273]]> 4 <![CDATA[h i -h s =-0.1463lnt+2.2424]]> 5 <![CDATA[h i -h s =-0.1529lnt+2.3713]]> 6 <![CDATA[h i -h s =-0.1422lnt+2.2799]]> 7 <![CDATA[h i -h s =-0.1437lnt+2.3565]]> 8 <![CDATA[h i -h s =-0.1403lnt+2.2191]]>

[0123] Table 8 170℃ metal shock absorber fitting regression equation

[0124]

[0125]

[0126] After removing abnormal data points from the coefficients in the above fitting regression equation, average processing was performed to calculate the linear fitting regression equation of recoverable deformation of the metal shock absorber at 110℃, 130℃, 150℃ and 170℃, as shown in Table 9.

[0127] Table 9 Regression equation for recoverable deformation of metal shock absorber

[0128] temperature Recoverable deformation fitting regression equation 110℃ <h2 style=";text-align:left;direction:ltr"><![CDATA[h <h2 style=";text-align:left;direction:ltr"> i <h2 style=";text-align:left;direction:ltr"> -h<h2 style=";text-align:left;direction:ltr"> s <h2 style=";text-align:left;direction:ltr"> =-0.1333lnt+2.3671]]><h2 style=";text-align:left;direction:ltr"> 130℃ <![CDATA[h i -h s =-0.1494lnt+2.4142]]> 150℃ <![CDATA[h i -h s =-0.1448lnt+2.2732 <!-- 9 -->]]> 170℃ <![CDATA[h i -h s =-0.1561lnt+2.2393]]>

[0129] From Table 9, the acceleration coefficients corresponding to the test temperatures of 110°C, 130°C, 150°C and 170°C can be obtained respectively, and they are stored in the test parameter database to obtain the acceleration coefficients containing different test temperatures. The acceleration coefficients include the recoverable deformation constant A and the recoverable deformation rate B, as shown in Table 10.

[0130] Table 10 Test parameter database of metal shock absorber

[0131] temperature Acceleration factor A Acceleration factor B 110℃ 2.3671 -0.1333 130℃ 2.4142 -0.1494 150℃ 2.2732 -0.1448 170℃ 2.2393 -0.1561

[0132] In some embodiments, in step S102: the process of determining the mapping relationship between the test temperature and the acceleration coefficient in the test parameter database includes:

[0133] Step S102-1, determining the linear relationship between the acceleration coefficient and the inverse of the test temperature by using the Arrhenius formula;

[0134] Specifically, the Arrhenius formula is an empirical formula for the relationship between the chemical reaction rate constant and temperature, which was created by Arrhenius of Sweden. According to the Arrhenius formula, a linear relationship between the acceleration coefficient and the inverse of the time can be obtained.

[0135] For example, the Arrhenius formula can be obtained:

[0136]

[0137] In the formula, E a is the relaxation thermal activation energy of the metal shock absorber; R is the universal gas constant, R = 8.617 × 10-5 eV / K; Z is a constant related to the material.

[0138] Step S102-1, based on the linear relationship, linear fitting is performed on multiple groups of test temperatures and acceleration coefficients in the test parameter database to obtain a mapping relationship between the test temperature and the acceleration coefficient.

[0139] Specifically, after the linear relationship between the acceleration coefficient and the test temperature is known, the linear relationship is fitted based on multiple test temperatures and their corresponding acceleration coefficients in the test parameter database to obtain a mapping relationship between the test temperature and the acceleration coefficient, so as to facilitate the subsequent determination of the acceleration coefficient at different test temperatures.

[0140] Exemplarily, according to the stress relaxation rate B of recoverable deformation at different temperatures in Table 10 T The linear relationship between the temperature and the inverse 1 / T is obtained by fitting regression using the least squares method. T The linear relationship with 1 / T, that is, the mapping relationship,

[0141] Similarly, according to the recoverable deformation constant A at different temperatures in Table 10 T , use the least squares method to fit the regression and get lnA T The linear relationship with 1 / T, that is, the mapping relationship,

[0142] In this embodiment, based on multiple test temperatures and their corresponding acceleration coefficients in the test parameter database, the linear relationship and mapping relationship between the acceleration coefficient and the test temperature are determined. Based on this, the acceleration coefficient at different test temperatures can be determined, which is convenient for determining the test duration of the accelerated storage test at different test temperatures under the premise of producing the same deformation amount, so as to achieve the acceleration effect of the accelerated storage test, and facilitate the preset test duration and test effect of the accelerated storage test to conduct storage life analysis and research on the elastic element.

[0143] In some embodiments, the test process of the accelerated storage test includes:

[0144] Obtaining an elastic element to be tested;

[0145] The elastic element to be tested is mounted on a stopper to obtain an elastic element mounted on the stopper, wherein the stopper is used to simulate a storage environment of the elastic element;

[0146] Placing the elastic element installed on the stopper in a temperature box with a target temperature, and setting the temperature action time of the temperature box to the target time;

[0147] In response to determining that the temperature box stops the temperature action, a tested elastic element is obtained.

[0148] Specifically, the test process of the accelerated storage test is the same as the test process of the accelerated storage test performed by obtaining data from the test parameter database as described above, except that the test duration and the test temperature are different.

[0149] In some embodiments, in step S604: the acceleration coefficients at multiple test temperatures are calculated based on the deformation amounts of the multiple groups of elastic elements and the preset time lengths, including:

[0150] Step S604-1, determining a restorable deformation relaxation regression equation of the elastic element based on the stress relaxation regression equation of the metal material and the linear relationship between the load and deformation of the elastic element;

[0151] Step S604-2, based on the recoverable deformation relaxation regression equation, the deformation amounts of the multiple groups of elastic elements and the preset time length, determine the acceleration coefficient in the recoverable deformation relaxation regression equation.

[0152] Specifically, the transformation process of the recoverable deformation relaxation regression equation is the same as the process described above. Correspondingly, the determination process of the acceleration coefficient in the recoverable deformation relaxation regression equation is also the same as the above description, which will not be repeated here.

[0153] The following is an exemplary description of the first embodiment of the present application:

[0154] The target deformation is 3.9895 mm, and the test parameter database is shown in Table 10. Based on the test parameter database, the recoverable deformation fitting regression equations at four test temperatures are determined as shown in Table 9. The target deformation is substituted into the four recoverable deformation fitting regression equations shown in Table 9, and the acceleration time at four test temperatures is obtained as shown in Table 11.

[0155] Table 11 Acceleration time at different test temperatures for the same target deformation

[0156]

[0157] Based on this, the user can determine the test temperature and acceleration duration of the accelerated storage test to conduct the accelerated storage test of the elastic element to obtain the elastic element after being stored at room temperature (ie, 25 degrees Celsius) for 17 years.

[0158] The method and limiter provided in this application are highly versatile and suitable for accelerated storage tests of multiple groups of elastic elements. In addition, the data processing method provided in this application can reasonably evaluate the storage life of elastic elements such as metal shock absorbers, and provide accurate and reliable input conditions for the subsequent design and use of elastic elements such as metal shock absorbers. This application can fully consider the working conditions of elastic elements, the test method is scientific and reasonable, and the data processing method is detailed and reliable. While saving test costs and improving test efficiency, it solves the problem that it is difficult to evaluate the storage life of elastic elements under laboratory conditions.

[0159] It should be noted that the method of the embodiment of the present application can be performed by a single device, such as a computer or server. The method of this embodiment can also be applied to a distributed scenario and completed by multiple devices cooperating with each other. In the case of such a distributed scenario, one of the multiple devices can only perform one or more steps in the method of the embodiment of the present application, and the multiple devices will interact with each other to complete the described method.

[0160] It should be noted that the above describes some embodiments of the present application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the above embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0161] Based on the same inventive concept, corresponding to any of the above-mentioned embodiments and methods, the present application also provides an elastic element accelerated storage test device.

[0162] refer to Figure 2 , the elastic element accelerated storage test device comprises:

[0163] An acquisition module 100 is configured to determine a target deformation amount of the elastic element;

[0164] The determination module 200 is configured to determine the acceleration coefficients of the accelerated storage test corresponding to the multiple test temperatures in the pre-stored test parameter database;

[0165] The calculation module 300 is configured to determine the acceleration duration of the accelerated storage test of the elastic element at multiple test temperatures based on the target deformation and each acceleration coefficient;

[0166] The selection module 400 is configured to determine a target duration from the plurality of acceleration durations, and determine a test temperature corresponding to the target duration as a target temperature;

[0167] The execution module 500 is configured to execute the accelerated storage test based on the target duration and the target temperature.

[0168] For the convenience of description, the above device is described in terms of functions divided into various modules. Of course, when implementing the present application, the functions of each module can be implemented in the same or multiple software and / or hardware.

[0169] The device of the above embodiment is used to implement the corresponding elastic element accelerated storage test method in any of the above embodiments, and has the beneficial effects of the corresponding method embodiment, which will not be described in detail here.

[0170] Based on the same inventive concept, corresponding to any of the above-mentioned embodiments, the present application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the accelerated storage test method for elastic elements described in any of the above-mentioned embodiments is implemented.

[0171] Figure 3 A more specific schematic diagram of the hardware structure of an electronic device provided in this embodiment is shown, and the device may include: a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. The processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040 are connected to each other through the bus 1050 in the device.

[0172] The processor 1010 can be implemented by a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.

[0173] The memory 1020 may be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 1020 may store an operating system and other application programs. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program codes are stored in the memory 1020 and are called and executed by the processor 1010.

[0174] The input / output interface 1030 is used to connect the input / output module to realize information input and output. The input / output module can be configured in the device as a component (not shown in the figure), or it can be externally connected to the device to provide corresponding functions. The input device may include a keyboard, a mouse, a touch screen, a microphone, various sensors, etc., and the output device may include a display, a speaker, a vibrator, an indicator light, etc.

[0175] The communication interface 1040 is used to connect a communication module (not shown) to realize communication interaction between the device and other devices. The communication module can realize communication through a wired mode (such as USB, network cable, etc.) or a wireless mode (such as mobile network, WIFI, Bluetooth, etc.).

[0176] The bus 1050 includes a path that transmits information between the various components of the device (eg, the processor 1010, the memory 1020, the input / output interface 1030, and the communication interface 1040).

[0177] It should be noted that, although the above device only shows the processor 1010, the memory 1020, the input / output interface 1030, the communication interface 1040 and the bus 1050, in the specific implementation process, the device may also include other components necessary for normal operation. In addition, it can be understood by those skilled in the art that the above device may also only include the components necessary for implementing the embodiments of the present specification, and does not necessarily include all the components shown in the figure.

[0178] The electronic device of the above embodiment is used to implement the corresponding elastic element accelerated storage test method in any of the above embodiments, and has the beneficial effects of the corresponding method embodiment, which will not be described in detail here.

[0179] Based on the same inventive concept, corresponding to any of the above-mentioned embodiment methods, the present application also provides a non-transitory computer-readable storage medium, wherein the non-transitory computer-readable storage medium stores computer instructions, and the computer instructions are used to enable the computer to execute the elastic element accelerated storage test method described in any of the above embodiments.

[0180] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, read-only compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, tape disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device.

[0181] The computer instructions stored in the storage medium of the above embodiment are used to enable the computer to execute the elastic element accelerated storage test method described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0182] It is understandable that before using the technical solutions of each embodiment of the present disclosure, the type, scope of use, usage scenarios, etc. of the personal information involved will be informed to the user in an appropriate manner, and the user's authorization will be obtained.

[0183] For example, in response to receiving an active request from a user, a prompt message is sent to the user to clearly remind the user that the operation requested to be performed will require obtaining and using the user's personal information. Thus, the user can independently choose whether to provide personal information to software or hardware such as an electronic device, application, server, or storage medium that performs the operation of the technical solution of the present disclosure according to the prompt message.

[0184] As an optional but non-limiting implementation, in response to receiving the user's active request, the prompt information may be sent to the user in the form of a pop-up window, in which the prompt information may be presented in text form. In addition, the pop-up window may also carry a selection control for the user to choose "agree" or "disagree" to provide personal information to the electronic device.

[0185] It is understandable that the above notification and the process of obtaining user authorization are merely illustrative and do not constitute a limitation on the implementation of the present disclosure. Other methods that meet relevant laws and regulations may also be applied to the implementation of the present disclosure.

[0186] Those skilled in the art should understand that the discussion of any of the above embodiments is merely illustrative and is not intended to imply that the scope of the present application (including the claims) is limited to these examples. In line with the concept of the present application, the technical features in the above embodiments or different embodiments may be combined, the steps may be implemented in any order, and there are many other variations of the different aspects of the embodiments of the present application as described above, which are not provided in detail for the sake of simplicity.

[0187] In addition, to simplify the description and discussion, and in order not to make the embodiments of the present application difficult to understand, the known power supply / ground connection with the integrated circuit (IC) chip and other components may or may not be shown in the provided drawings. In addition, the device can be shown in the form of a block diagram to avoid making the embodiments of the present application difficult to understand, and this also takes into account the fact that the details of the implementation of these block diagram devices are highly dependent on the platform to be implemented in the embodiments of the present application (that is, these details should be fully within the scope of understanding of those skilled in the art). In the case of elaborating specific details (e.g., circuits) to describe exemplary embodiments of the present application, it is obvious to those skilled in the art that the embodiments of the present application can be implemented without these specific details or when these specific details are changed. Therefore, these descriptions should be considered to be illustrative rather than restrictive.

[0188] Although the present application has been described in conjunction with specific embodiments of the present application, many replacements, modifications and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may use the embodiments discussed.

[0189] The embodiments of the present application are intended to cover all such substitutions, modifications and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the embodiments of the present application should be included in the scope of protection of the present application.

Claims

1. An accelerated storage test method for elastic components, characterized in that: include: determining a target deformation amount of the elastic element; Determining acceleration coefficients of accelerated storage tests corresponding to a plurality of test temperatures in a pre-stored test parameter database; Determining the acceleration duration of the accelerated storage test of the elastic element at multiple test temperatures based on the target deformation and each acceleration coefficient; Determining a target duration among the plurality of acceleration durations, and determining a test temperature corresponding to the target duration as a target temperature; The accelerated storage test is performed based on the target time and the target temperature.

2. The accelerated storage test method for elastic elements according to claim 1, characterized in that: The step of determining a target deformation amount of the elastic element comprises: Get the preset simulation temperature and simulation duration; Determining a simulation acceleration coefficient of the accelerated storage test corresponding to the simulation temperature based on a mapping relationship between the test temperature and the acceleration coefficient in the test parameter database; Determining a deformation amount of the elastic element at the simulation temperature based on the simulation acceleration coefficient and the simulation duration, and determining the deformation amount as a target deformation amount; Wherein, the simulation temperature is lower than the test temperature.

3. The accelerated storage test method for elastic elements according to claim 1, characterized in that: The pre-storage process of the test parameter database includes: Obtain multiple sets of elastic elements; Based on the multiple groups of elastic elements, respectively, an accelerated storage test of a preset duration at multiple test temperatures is performed; Based on the accelerated storage test of the preset time at the multiple test temperatures, the deformation amounts of the multiple groups of elastic elements are obtained; Based on the deformation amounts of the multiple groups of elastic elements and the preset time lengths, the acceleration coefficients at multiple test temperatures are calculated; The multiple acceleration coefficients and the multiple test temperatures are matched one by one and stored in the test parameter database.

4. The accelerated storage test method for elastic elements according to claim 2, characterized in that: The process of determining the mapping relationship between the test temperature and the acceleration coefficient in the test parameter database includes: Determine the linear relationship between the acceleration factor and the inverse of the test temperature by using the Arrhenius formula; Based on the linear relationship, linear fitting is performed on multiple groups of test temperatures and acceleration coefficients in the test parameter database to obtain a mapping relationship between the test temperature and the acceleration coefficient.

5. The accelerated storage test method for elastic elements according to claim 1, characterized in that: The test process of the accelerated storage test includes: Obtaining an elastic element to be tested; The elastic element to be tested is mounted on a stopper to obtain an elastic element mounted on the stopper, wherein the stopper is used to simulate a storage environment of the elastic element; Placing the elastic element installed on the stopper in a temperature box with a target temperature, and setting the temperature action time of the temperature box to the target time; In response to determining that the temperature box stops the temperature action, a tested elastic element is obtained.

6. The accelerated storage test method for elastic elements according to claim 3, characterized in that: The acceleration coefficients at multiple test temperatures are calculated based on the deformation amounts of the multiple groups of elastic elements and the preset time lengths, including: Based on the stress relaxation regression equation of the metal material and the linear relationship between the load and deformation of the elastic element, the restorable deformation relaxation regression equation of the elastic element is determined; Based on the restorable deformation relaxation regression equation, the deformation amounts of the multiple groups of elastic elements and the preset time length, an acceleration coefficient in the restorable deformation relaxation regression equation is determined.

7. The accelerated storage test method for elastic elements according to claim 6, characterized in that: The stress relaxation regression equation of the metal material is: σ=a-blnt In the formula, σ is the residual stress after relaxation time t; a is the intersection of the straight line equation and the ordinate axis; b is the stress relaxation rate, that is, the slope of the straight line segment; t is the relaxation time, in hours; a and b are related to the initial stress of the material and the test temperature.

8. The accelerated storage test method for elastic elements according to claim 6, characterized in that: The linear relationship between the load and deformation of the elastic element is: Among them, h i is the measured height of the elastic element after the test, h0 is the initial height of the elastic element, and h s is the height of the stopper used in the accelerated storage test of the elastic element, s is the force-bearing area of ​​the elastic element, and for products of the same specification, k is a constant.

9. The accelerated storage test method for elastic elements according to claim 6, characterized in that: The restorable deformation relaxation regression equation of the elastic element is: In the formula, h is the recoverable deformation, is the recoverable deformation stress relaxation rate, is the recoverable deformation constant, A and B are both constants.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the program, the method according to any one of claims 1 to 9 is implemented.

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