Limit index testing method and device of intelligent gateway chip, equipment and medium

Abstract

The invention provides a limit index testing method, device and equipment of an intelligent gateway chip and a medium, and relates to the technical field of chip limit index testing. The method comprises the following steps: firstly, acquiring a target parameter configuration file; secondly, determining a selected target test script based on parameters in the target parameter configuration file; then, based on the target test script, testing the wireless emission limit index of the wireless chip within the target emission power range to obtain an emission limit index test result corresponding to the wireless chip; and finally, based on the target test script, testing the wireless receiving limit index of the wireless chip within the power range of the target signal generator to obtain a receiving limit index test result corresponding to the wireless chip. Based on the content, the problem of low efficiency of limit index testing in the prior art can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of chip limit indicator testing, and in particular to a limit indicator testing method, device, equipment and medium for an intelligent gateway chip. Background Art

[0002] With the development of Wi-Fi technology, wireless chips of different types and supporting different Wi-Fi are emerging in an endless stream, and the wireless performance indicators of each chip are also different. Many wireless chips need to comply with international standards and national regulatory requirements, such as IEEE802.11 (Wi-Fi), 3GPP (LTE, 5G), etc. These standards define the performance boundaries of chips. Among them, with the continuous advancement of wireless communication technology, especially under the high bandwidth and low latency requirements of 5G, Wi-Fi6, etc., the extreme test of chip performance has become the key to distinguishing competing products. Specifically, wireless chips need to maintain stable operation under different working environments, so testing their extreme indicators helps to ensure the reliability and adaptability of products, especially in harsh environments or high-density networks. For example, these extreme indicators reflect the capabilities of the chip under specific environmental conditions, such as minimum transmit power. In this way, by testing these extreme indicators, R&D personnel and engineers can understand the working performance of the chip under extreme conditions and determine its adaptability in different usage scenarios. However, in the prior art, manual testing is generally performed by hardware engineers, so there is a problem of relatively low testing efficiency. Summary of the invention

[0003] In view of this, the purpose of the present application is to provide a limit indicator testing method, device, equipment and medium for an intelligent gateway chip to improve the problem of low efficiency of limit indicator testing in the prior art.

[0004] To achieve the above objectives, this application adopts the following technical solutions: A limit index testing method for an intelligent gateway chip, comprising: Obtaining a target parameter configuration file, wherein the parameters in the target parameter configuration file are at least used to indicate a script for testing the limit indicators of the wireless chip of the target intelligent gateway; Based on the parameters in the target parameter configuration file, determining a selected target test script, wherein the target test script is used to indicate the content of testing the limit indicators of the wireless chip; Based on the target test script, within the target transmission power range, the wireless chip is tested for a wireless transmission limit indicator, and a transmission limit indicator test result corresponding to the wireless chip is obtained, wherein the wireless transmission limit indicator includes at least one of target power, actual power, modulation accuracy, frequency deviation, spectrum template and power edge data; Based on the target test script, the wireless chip is tested for a wireless reception limit indicator within a target signal generator power range to obtain a reception limit indicator test result corresponding to the wireless chip, wherein the wireless reception limit indicator includes at least one of a target power, a received signal strength, a packet reception rate, and an equivalent radiated power.

[0005] In a preferred embodiment of the present application, in the above-mentioned limit index test method of the intelligent gateway chip, the step of obtaining the target parameter configuration file includes: Determine an initial parameter configuration file, wherein the parameters in the initial parameter configuration file are at least used to indicate a script for testing the limit indicators of the wireless chip of the target intelligent gateway; Binding at least one parameter key in the initial parameter configuration file to at least one target control in the target parameter setting page, and monitoring the at least one target control; In response to monitoring a change in the value of any one of the target controls, the control name or identifier of the target control is mapped to a corresponding parameter key, so that the changed value of the target control is saved to form a target parameter configuration file corresponding to the initial parameter configuration file, wherein the changed value of the target control is saved to a data structure in memory, in which the key is the name or identifier of the target control and the value is the changed value of the target control.

[0006] In a preferred embodiment of the present application, in the above-mentioned limit index test method of the intelligent gateway chip, the step of testing the wireless transmission limit index of the wireless chip within the target transmission power range based on the target test script to obtain the transmission limit index test result corresponding to the wireless chip includes: Based on the target test script, determine a minimum transmit power and a maximum transmit power within a target transmit power range, wherein the minimum transmit power and the maximum transmit power belong to a lower limit value and an upper limit value of the target transmit power range, respectively; Using the minimum transmit power as the current transmit power; Generate a test instruction of a current wireless transmission limit index based on the current transmission power; Sending the current wireless transmission limit index test instruction to the wireless chip to test the wireless transmission limit index of the wireless chip and obtain the current transmission limit index test result of the wireless chip; Updating the current transmit power to form a new current transmit power; Based on the new current transmission power, the step of executing the test instruction for generating a current wireless transmission limit indicator based on the current transmission power is performed again until the new current transmission power reaches the maximum transmission power.

[0007] In a preferred embodiment of the present application, in the above-mentioned limit index test method of the intelligent gateway chip, the step of sending the test instruction of the current wireless transmission limit index to the wireless chip to test the wireless transmission limit index of the wireless chip and obtaining the current transmission limit index test result of the wireless chip includes: Sending the current wireless transmission limit index test instruction to the wireless chip to test the wireless transmission limit index of the wireless chip and obtain the current transmission limit index test data of the wireless chip; The current emission limit index test data of the wireless chip is saved to Excel through the InsertTxTestData method to form the current emission limit index test result of the wireless chip.

[0008] In a preferred embodiment of the present application, in the above-mentioned limit index test method of the intelligent gateway chip, the step of updating the current transmit power to form a new current transmit power includes: Determining a first step power in the target test script; The sum of the current transmit power and the first step power is calculated, and the sum is determined as a new current transmit power to update the current transmit power.

[0009] In a preferred embodiment of the present application, in the above-mentioned limit index test method of the intelligent gateway chip, the step of testing the wireless reception limit index of the wireless chip based on the target test script within the power range of the target signal generator to obtain the reception limit index test result corresponding to the wireless chip includes: Based on the target test script, determining a minimum signal generator power and a maximum signal generator power within a target signal generator power range, wherein the minimum signal generator power and the maximum signal generator power belong to a lower limit value and an upper limit value of the target signal generator power range, respectively; Using the maximum signal generator power as the current signal generator power; Generate a test instruction of a current wireless reception limit index based on the current signal generator power; Sending the current wireless reception limit index test instruction to the wireless chip to test the wireless reception limit index of the wireless chip and obtain the current transmission limit index test result of the wireless chip; Updating the current signal generator power to form a new current signal generator power; Based on the new current signal generator power, the step of generating a test instruction for a current wireless reception limit indicator based on the current signal generator power is executed again until the new current signal generator power reaches the minimum signal generator power.

[0010] In a preferred embodiment of the present application, in the above-mentioned limit index test method of the intelligent gateway chip, the step of sending the test instruction of the current wireless reception limit index to the wireless chip to test the wireless reception limit index of the wireless chip and obtain the current transmission limit index test result of the wireless chip includes: Sending the current wireless reception limit index test instruction to the wireless chip to test the wireless reception limit index of the wireless chip and obtain the current reception limit index test data of the wireless chip; The current reception limit index test data of the wireless chip is saved to Excel through the InsertRxTestData method to form the current reception limit index test result of the wireless chip.

[0011] The present application also provides a limit index testing device for an intelligent gateway chip, comprising: A configuration file acquisition module, used to acquire a target parameter configuration file, wherein the parameters in the target parameter configuration file are at least used to indicate a script for testing the limit indicators of the wireless chip of the target intelligent gateway; A test script determination module, used to determine a selected target test script based on the parameters in the target parameter configuration file, wherein the target test script is used to indicate the content of testing the limit indicators of the wireless chip; A transmission index test module, used to test the wireless transmission limit index of the wireless chip within the target transmission power range based on the target test script, and obtain the transmission limit index test result corresponding to the wireless chip, wherein the wireless transmission limit index includes at least one of target power, actual power, modulation accuracy, frequency deviation, spectrum template and power edge data; A receiving index test module is used to test the wireless receiving limit index of the wireless chip based on the target test script and within the power range of the target signal generator, and obtain the receiving limit index test result corresponding to the wireless chip, wherein the wireless receiving limit index includes at least one of the target power, received signal strength, packet reception rate and equivalent radiated power.

[0012] Based on the above, the present application also provides an electronic device, including: Memory for storing computer programs; A processor connected to the memory is used to execute a computer program stored in the memory to implement the above-mentioned limit index testing method for the intelligent gateway chip.

[0013] On the basis of the above, the present application also provides a computer-readable storage medium, in which a computer program is stored, and when the computer program is run, each step of the above-mentioned limit indicator testing method for the intelligent gateway chip is executed.

[0014] The limit index test method, device, equipment and medium of the intelligent gateway chip provided by the present application, first, obtain the target parameter configuration file; second, determine the selected target test script based on the parameters in the target parameter configuration file; then, based on the target test script, test the wireless transmission limit index of the wireless chip within the target transmission power range, and obtain the transmission limit index test result corresponding to the wireless chip; finally, based on the target test script, test the wireless reception limit index of the wireless chip within the target signal generator power range, and obtain the reception limit index test result corresponding to the wireless chip. Based on the above content, automatic testing of the wireless transmission limit index and the wireless reception limit index of the wireless chip can be achieved, so that it has higher efficiency than the conventional technical solution of manual testing, therefore, it can improve the problem of low efficiency of limit index testing existing in the prior art. In addition, it can also avoid the problem of relatively low test reliability due to manual operation errors to a certain extent. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings.

[0016] Figure 1 A structural block diagram of an electronic device provided in an embodiment of the present application.

[0017] Figure 2 A flowchart of a limit indicator testing method for an intelligent gateway chip provided in an embodiment of the present application.

[0018] Figure 3 A block diagram of a limit indicator testing device for an intelligent gateway chip provided in an embodiment of the present application. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations.

[0020] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for which protection is sought, but merely represents selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0021] like Figure 1 As shown, an embodiment of the present application provides an electronic device, wherein the electronic device may include an electronic device, a processor, and a limit indicator testing device for an intelligent gateway chip.

[0022] In detail, the electronic device and the processor are electrically connected directly or indirectly to achieve data transmission or interaction. For example, the electronic device and the processor can be electrically connected through one or more communication buses or signal lines. The limit indicator testing device of the intelligent gateway chip includes at least one software function module stored in the electronic device in the form of software or firmware. The processor is used to execute an executable computer program stored in the electronic device, for example, the software function module and computer program included in the limit indicator testing device of the intelligent gateway chip, so as to implement the limit indicator testing method of the intelligent gateway chip provided in the embodiment of the present application.

[0023] Optionally, the electronic device may be, but not limited to, a random access memory (RAM), a read only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable read-only memory (EEPROM), etc. In addition, the processor may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), a system on chip (SoC), etc.; it may also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0024] Understandably, Figure 1 The structure shown is for illustration only, and the electronic device may also include Figure 1 More or fewer components as shown, or with Figure 1 The different configurations shown, for example, may also include a communication unit for exchanging information with other devices.

[0025] Combination Figure 2 , the embodiment of the present application also provides a limit index test method for the smart gateway chip that can be applied to the above electronic device. Among them, the method steps defined in the process related to the limit index test method of the smart gateway chip can be implemented by the electronic device. Figure 2 The specific process shown is explained in detail.

[0026] Step S110, obtaining a target parameter configuration file.

[0027] In an embodiment of the present application, the electronic device can obtain a target parameter configuration file. Among them, the parameters in the target parameter configuration file are at least used to indicate a script for testing the limit indicators of the wireless chip of the target intelligent gateway (for example, it can be a set-top box, a government and enterprise gateway, or an optical modem, etc., and can be applied to scenarios such as FTTR). Exemplarily, in other embodiments, the target parameter configuration file can also be used for device login, etc. For example, the parameters in the target parameter configuration file may include, but are not limited to, Dut (Device Under Test, the device under test) IP, Dut port, primary user name and password, secondary user name and password, Dut login mode (primary or secondary), Vap (Virtual Access Point) or Wlan (Wireless Local Area Network), HiSilicon OFDM (Orthogonal Frequency Division Multiplexing, orthogonal frequency division multiplexing) Max value, enable printing function, wireless instrument device port (Wireless Instrument Port), script file, chip solution (selecting a chip solution suitable for testing is to ensure that the test can cover all functions and performance of the device. Different chip solutions will affect the debugging parameters, data processing capabilities and performance limitations during the test process), etc.

[0028] Step S120: Determine the selected target test script based on the parameters in the target parameter configuration file.

[0029] In an embodiment of the present application, after obtaining the target parameter configuration file, the electronic device can determine the selected target test script based on the parameters in the target parameter configuration file. The target test script is used to indicate the content of the test of the limit indicators of the wireless chip, for example, it can be used to determine the instruction format of the wireless chip test, respectively define the relevant parameters of the transmission test (TX) and the reception test (RX), and specify the test conditions, configuration items, and output file format.

[0030] Step S130: Based on the target test script, the wireless chip is tested for a wireless transmission limit index within a target transmission power range to obtain a transmission limit index test result corresponding to the wireless chip.

[0031] In an embodiment of the present application, after determining the target test script, the electronic device can test the wireless transmission limit index of the wireless chip within the target transmission power range based on the target test script to obtain the transmission limit index test result corresponding to the wireless chip. The wireless transmission limit index includes at least one of the target power (TarPower), actual power (TestPower), modulation accuracy (Evm), frequency deviation (FreqErr), spectrum mask (Mask), power edge data (Marg), or other indicators.

[0032] Step S140: Based on the target test script, the wireless chip is tested for a wireless reception limit index within a target signal generator power range to obtain a reception limit index test result corresponding to the wireless chip.

[0033] In an embodiment of the present application, after determining the target test script, the electronic device can test the wireless receiving limit index of the wireless chip within the target signal generator power range based on the target test script to obtain the receiving limit index test result corresponding to the wireless chip. The wireless receiving limit index includes at least one of the target power (TarPower), received signal strength (Rssi), packet reception rate (Total and Received), and equivalent radiated power (ERP), or may also include other indicators.

[0034] Based on the above content, the automatic test of the wireless transmission limit index and the wireless reception limit index of the wireless chip can be realized, so that it has higher efficiency than the conventional technical solution of manual testing, and therefore, the problem of low efficiency of limit index testing in the prior art can be improved. In addition, the problem of relatively low test reliability caused by manual operation errors can be avoided to a certain extent.

[0035] It should be noted that for step S110 , the specific method of obtaining the target parameter configuration file is not limited and can be selected according to actual needs.

[0036] For example, in an alternative implementation, in order to ensure the reliability of the acquired target parameter configuration file, the above step S120 may further include the following contents: First, an initial parameter configuration file is determined, wherein the parameters in the initial parameter configuration file are at least used to indicate a script for testing the limit indicators of the wireless chip of the target intelligent gateway. Exemplarily, the parameters in the initial parameter configuration file can be automatically generated or generated in response to a configuration operation performed by a corresponding person; Secondly, at least one parameter key in the initial parameter configuration file may be bound to at least one target control in the target parameter setting page, and the at least one target control may be monitored; illustratively, only some parameter keys may be bound to the target control, or all parameter keys may be bound to the target control, so that operations such as corresponding modification of each parameter may be performed efficiently and conveniently, and in addition, the target parameter setting page may be a configuration page that can be operated by a user, so that corresponding configuration operations may be performed based on the configuration page; Then, in response to monitoring a change in the value of any one of the target controls, the control name or identifier of the target control can be mapped to a corresponding parameter key, so that the changed value of the target control can be saved to form a target parameter configuration file corresponding to the initial parameter configuration file, wherein the changed value of the target control is saved to a data structure in memory, in which the key is the name or identifier of the target control, and the value is the changed value of the target control.

[0037] For example, for the "Parameter Setting" function, when the content of the input box is not empty, the program will automatically save the content to the local "Setting.ini" configuration file according to the control name or identifier (such as CardIp) after the user makes any changes, so that it can be used or loaded later. The specific process is as follows: Step 1: Control Binding Mechanism Each control (such as TextBox, ComboBox, etc.) is bound to a parameter key in the configuration file (such as CardIp, DutIp, etc.). The modification of the control value will trigger a save event in real time.

[0038] Step 2: Save the logic When the value of a control changes, the program listens for change events (such as TextChanged or SelectedIndexChanged).

[0039] Map the control's identifier (such as the control's Name property) to the corresponding key (such as CardIp).

[0040] Save the new value to an in-memory data structure such as a Dictionary<string, string> ), where key is the name of the control (such as CardIp) and value is the new value entered in the control.

[0041] It should be noted that for step S130, the specific method of testing the wireless emission limit index of the wireless chip is not limited and can be selected according to actual needs.

[0042] For example, in an alternative implementation, in order to reliably test the wireless transmission limit index of the wireless chip, the above-mentioned step S130 may further include step S131, step S132, step S133, step S134 and step S135, and the content of each step is described as follows.

[0043] Step S131, based on the target test script, determining the minimum transmit power and the maximum transmit power within the target transmit power range.

[0044] In an embodiment of the present application, the minimum transmit power and the maximum transmit power can be determined within the target transmit power range based on the target test script. The minimum transmit power and the maximum transmit power belong to the lower limit and the upper limit of the target transmit power range, respectively. Exemplarily, the target transmit power range is recorded in the target test script.

[0045] Step S132: taking the minimum transmit power as the current transmit power.

[0046] In the embodiment of the present application, after the minimum transmit power is determined, the minimum transmit power may be used as the current transmit power.

[0047] Step S133: Generate a test instruction for the current wireless transmission limit index based on the current transmission power.

[0048] In the embodiment of the present application, after the current transmission power is determined, a test instruction for the current wireless transmission limit indicator may be generated based on the current transmission power.

[0049] Step S134, sending the current wireless transmission limit index test instruction to the wireless chip to test the wireless transmission limit index of the wireless chip and obtain the current transmission limit index test result of the wireless chip.

[0050] In an embodiment of the present application, after generating a test instruction for the current wireless transmission limit indicator, the test instruction for the current wireless transmission limit indicator can be sent to the wireless chip to test the wireless transmission limit indicator of the wireless chip and obtain the current transmission limit indicator test result of the wireless chip.

[0051] Step S135: updating the current transmit power to form a new current transmit power.

[0052] In an embodiment of the present application, after completing a test, the current transmission power can be updated to form a new current transmission power. In this way, based on the new current transmission power, step S133 can be executed again, that is, a test instruction for the current wireless transmission limit indicator can be generated again based on the new current transmission power to perform another test.

[0053] It is understandable that, in the above step S134, the specific method of obtaining the current emission limit index test result of the wireless chip is not limited and can be selected according to actual needs. For example, in an alternative implementation, in order to improve the reliability of the emission limit index test result, the above step S134 can further include the following contents: First, the test instruction of the current wireless transmission limit index can be sent to the wireless chip to test the wireless transmission limit index of the wireless chip to obtain the current transmission limit index test data of the wireless chip; Secondly, the current emission limit index test data of the wireless chip can be saved to Excel through the InsertTxTestData method to form the current emission limit index test result of the wireless chip; specifically, the attributes of the entity object TxResultEntity can be directly mapped to the Excel cell, avoiding tedious manual field processing, improving the efficiency of data writing and the readability of the code, and reducing the probability of errors.

[0054] It is understandable that, in the above step S135, the specific method of updating the current transmit power is not limited and can be selected according to actual needs. For example, in an alternative implementation, in order to achieve full coverage within the power range and provide a reliable verification method for the device limit performance, the above step S135 can further include the following: First, the first step power may be determined in the target test script; illustratively, the first step power may be recorded in the target test script; Secondly, the sum of the current transmit power and the first step power can be calculated, and the sum can be determined as the new current transmit power to update the current transmit power; based on this, the transmission limit can be tested starting from the initialization power minPower (minimum transmit power), and the power can be gradually increased by steps stepSize (first step power), and the transmit power can be increased in sequence until the maximum power maxPower (maximum transmit power) is tested, and the test is ended, and finally the result Execel is named "outputFile" and saved locally.

[0055] It should be noted that for step S140, the specific method of testing the wireless reception limit index of the wireless chip is not limited and can be selected according to actual needs.

[0056] For example, in an alternative implementation, in order to ensure the reliability of the wireless reception limit index test of the wireless chip, the above-mentioned step S140 may further include step S141, step S142, step S143, step S144 and step S145, and the contents of each step are as follows.

[0057] Step S141 : determining a minimum signal generator power and a maximum signal generator power within a target signal generator power range based on the target test script.

[0058] In an embodiment of the present application, the minimum signal generator power and the maximum signal generator power can be determined within the target signal generator power range based on the target test script. The minimum signal generator power and the maximum signal generator power belong to the lower limit value and the upper limit value of the target signal generator power range, respectively. Exemplarily, the target signal generator power range is recorded in the target test script.

[0059] Step S142: taking the maximum signal generator power as the current signal generator power.

[0060] In the embodiment of the present application, after the maximum signal generator power is determined, the maximum signal generator power may be used as the current signal generator power.

[0061] Step S143: generating a test instruction of a current wireless reception limit index based on the current signal generator power.

[0062] In the embodiment of the present application, after the current signal generator power is determined, a test instruction for the current wireless reception limit index may be generated based on the current signal generator power.

[0063] Step S144, sending the current wireless reception limit index test instruction to the wireless chip to test the wireless reception limit index of the wireless chip and obtain the current transmission limit index test result of the wireless chip.

[0064] In an embodiment of the present application, after generating a test instruction for the current wireless reception limit indicator, the test instruction for the current wireless reception limit indicator can be sent to the wireless chip to test the wireless reception limit indicator of the wireless chip and obtain the current transmission limit indicator test result of the wireless chip. In this way, a test can be completed.

[0065] Step S145, updating the current signal generator power to form a new current signal generator power.

[0066] In the embodiment of the present application, after completing a test, the current signal generator power can be updated to form a new current signal generator power. In this way, based on the new current signal generator power, step S143 can be executed again, that is, a test instruction for the current wireless reception limit index can be generated again based on the new current signal generator power to perform another test.

[0067] It is understandable that, in the above step S144, the specific method of obtaining the current emission limit index test result of the wireless chip is not limited and can be selected according to actual needs. For example, in an alternative implementation, in order to ensure the reliability of the obtained emission limit index test result, the above step S144 can further include the following contents: First, the current wireless reception limit index test instruction may be sent to the wireless chip to test the wireless reception limit index of the wireless chip to obtain the current reception limit index test data of the wireless chip; Secondly, the current reception limit index test data of the wireless chip can be saved to Excel through the InsertRxTestData method to form the current reception limit index test result of the wireless chip; specifically, the attributes of the entity object RxResultEntity can be directly mapped to the Excel cell, avoiding tedious manual field processing, improving the efficiency of data writing and the readability of the code, and reducing the probability of errors.

[0068] It is understandable that, in the above step S145, the specific method of updating the current signal generator power is not limited and can be selected according to actual needs. For example, in an alternative implementation, in order to achieve full coverage within the power range and provide a reliable verification method for the device limit performance, the above step S145 may include the following: First, the second step power may be determined in the target test script; illustratively, the second step power may be recorded in the target test script; Secondly, the difference between the current signal generator power and the second step power can be calculated, and the difference can be determined as the new current signal generator power to update the current signal generator power; based on this, the receiving limit can be tested starting from the initialization power vsgStartPower (i.e., the maximum signal generator power), and gradually decreasing the power by step stepSize (i.e., the second step power), and successively reducing the transmission power until the minimum transmission power vsgStopPower (i.e., the minimum signal generator power) is tested, and the test is ended, and finally the result Execel is named "outputFile" and saved locally.

[0069] Based on the above solution, full coverage within the power range is achieved, and a reliable verification method is provided for the extreme performance of the device. By testing the minimum power, the signal coverage and modulation capability of the device in low power mode are verified. By testing the maximum power, it is ensured that the device can work normally under extreme conditions and the reliability of the hardware design is verified. By testing each power point, the change law of the transmission performance is analyzed to provide data support for the algorithm and hardware optimization of the device. Ensure that the device can meet the standards within the full power range to avoid product repairs or performance complaints due to power non-compliance. Verify the receiving performance and sensitivity through testing at each power point.

[0070] In order to facilitate the understanding of the above-mentioned limit index test method of the smart gateway chip, in a specific application scenario, the program will pre-read the script configuration content during the test and parse the test parameters in the specified format. The format and specific configuration process are as follows: Tx format: TX CCK_1Mbps channel=1,3,6 antenna=1,2 avgTimes=3 minPower=19maxPower=23 stepsize=0.5 FullPackage=0 outputFile=24G_TX_CCK_1; Rx format: RX CCK_11Mbps channel=3,8,12 antenna=1,2 avgTimes=3vsgStartPower=-86 vsgStopPower=-90 stepSize=0.5 numberPkts=1000 outputfile=24G_Rx_WiFi_11M.

[0071] Among them, TX (transmit test) part: TX: stands for transmit test (Transmit); CCK_1Mbps: indicates that the CCK (Complementary Code Keying) modulation mode is used, and the rate is 1Mbps; Channel configuration: channel=1,3,6, specifies the channel list for the test, which are channels 1, 3 and 6 respectively; Antenna configuration: antenna=1,2, specifies the antenna numbers to be used, antenna 1 and 2 respectively; Average times: avgTimes=3, which means each test is repeated 3 times to calculate the average value; Transmit power range: minPower=19: minimum transmit power is 19dBm, maxPower=23: maximum transmit power is 23dBm, stepSize=0.5: the power is adjusted in steps of 0.5dBm each time; Full Package Transmission: FullPackage=0, specifies whether to transmit the full package. A value of 0 indicates that the full package is not transmitted. Output file: outputFile=24G_TX_CCK_1, the name of the test result output file is 24G_TX_CCK_1; In addition, the RX (receive test) part: RX: indicates receiving test (Receive); CCK_11Mbps: indicates that CCK modulation is used and the rate is 11Mbps; Channel configuration: channel=3,8,12, specifies the channel list for the test, which are channels 3, 8 and 12 respectively; Antenna configuration: antenna=1,2, specifies the antenna numbers to be used, antenna 1 and 2 respectively; Average times: avgTimes=3, which means each test is repeated 3 times to calculate the average value; Signal generator power range: vsgStartPower=-86: the starting power of the signal generator (VSG) is -86dBm, vsgStopPower=-90: the ending power of the signal generator is -90dBm, stepSize=0.5: the power is adjusted in steps of 0.5dBm each time; Number of test packets: numberPkts=1000, which means 1000 packets are sent in each test; Output file: outputfile=24G_Rx_WiFi_11M. The name of the test result output file is 24G_Rx_WiFi_11M.

[0072] The above format defines the conditions for transmit (TX) and receive (RX) tests through parameterized configuration, covering modulation mode, channel selection, antenna configuration, power range, etc., and ensures the accuracy of the test through specified steps and average times. These parameters are used to verify the performance of wireless chips, such as transmit power adjustment and receive sensitivity testing for Wi-Fi communications, and the output file saves the test results for analysis.

[0073] In addition, the parameter configuration needs to be parsed and these parameters are used to adapt the test instructions. It is also the parameter configuration input by the wireless device. The following code involving the instruction code and the wireless interface gives the parsing logic of the key parameters. The specific process is as follows: Step 1: Parse Tx (transmit test) and Rx (receive test) commands The ParseSpecifiedParameterss method is used to parse and obtain the relevant parameters of the specified wireless communication mode, including modulation mode, channel, transmit power, etc., so as to execute related test commands later. It dynamically calculates the required configuration items through the passed parameters (such as mode, channel, target power, etc.) and returns the parsing result. If an error occurs during the parsing process, detailed error information is returned.

[0074] Parameter parsing process: Mode conversion and basic judgment: The input mode is converted to lowercase to facilitate unified processing; Determine whether the current channel is within the 24GHz range (channel>14 is 5GHz, otherwise it is 2.4GHz).

[0075] MCS (Modulation and Coding Scheme) analysis: Use the qxelApi.SetRateMCS method to parse the MCS of the current mode. If it fails, an error message is returned. Clear the "M" and "mcs" characters in the MCS string to get the final MCS value.

[0076] Bandwidth analysis: Get bandwidth information through qxelApi.SetBandwidth. If the acquisition fails, the corresponding error information is returned.

[0077] Channel analysis: Call SetBCM6764Channel to determine the final channel configuration according to the mode type (whether it is EHT mode) and the input channel number; If channel parsing fails, an error message is returned.

[0078] Target transmit power (tarPower) processing: Multiply the target power value by 4 according to the input tarPower to get cmdTarpower, which is the power parameter finally sent; Command index (cmdIndex) analysis: The corresponding cmdIndex is determined according to different substrings in mode (such as 1m, 2m, ht, vht, he, etc.), and different values ​​are determined according to whether it is 24GHz mode, which is used to match the Tx or Rx test command set.

[0079] Packet length (pkteng) calculation: Call SetTxPackLength to calculate the packet length based on cmdIndex, bindWidth and Mcs. If the parsing fails, an error message is returned.

[0080] Exception handling: If any exception occurs during the whole process, the error information will be captured and returned.

[0081] Return value: Success: returns true, and passes the parsed related parameters (such as cmdIndex, mcs, bindWidth, cmdChannel, cmdTarpower, pkteng, etc.) through ref; Failure: returns false, and returns error information through response.

[0082] Step 2: Capture indicators from wireless devices Call the IQxelDLL.WiFiTxTest function to perform a test on the wireless transmission indicators of the specified device. This function passes in a series of test parameters and interacts with the device through the underlying communication interface. It is mainly used to measure the relevant indicators of the transmission signal, including but not limited to transmission power, frequency deviation, error vector magnitude (EVM), spectrum mask, DC leakage, etc.

[0083] Parameter Description: Thread identifier (threadId): Used to distinguish test tasks of different threads and support concurrent operations in a multi-threaded environment.

[0084] Mode: Specify the Wi-Fi working mode (such as 11b, 11g, 11n, etc.), which affects the analysis of test indicators; Frequency (FreqHz*1000000): The center frequency of the device being tested in Hz. Convert MHz to Hz by multiplying by 1,000,000. Automatic gain control (AgcEnable): Whether to enable automatic gain control (AGC), which is used to adjust the receiver gain to adapt to the input signal strength; Sampling Rate The sampling rate used in the test affects the accuracy and speed of signal sampling; Target Power: The target transmit power value is set to compare the actual measured power; Cable Loss: Signal loss of the cable under test, used to compensate for measurement errors; Full Package Transmission: Whether a complete data packet transmission test is performed affects the accuracy of the test data; Measurement result parameters (ref keyword): Transmit power (MeasurePower): the actual transmit power measured; Frequency deviation (FreqError): measured frequency error; EVM (EVM): Error vector magnitude, used to measure modulation accuracy; Spectrum Mask: spectrum compliance test results; DC leakage (LOLeakageDb): The leakage value of the DC component, reflecting the quality of the RF signal; Other DSSS parameters (MargDsss): Includes specific test indicators of DSSS (Direct Sequence Spread Spectrum) signals.

[0085] And, for saving the test results: Tx data write: Write the following wireless transmission test indicators: Mode (working mode, such as 802.11a / b / g / n / ac, etc.); Ant (antenna number); Channel (working channel); Frequency (operating frequency, unit Hz); TarPower (target transmit power, in dBm); TestPower (actual test power, unit: dBm); Evm (modulation accuracy, unit %); FreqErr (frequency deviation, unit Hz); Mask (spectral mask test result); Tx Marg Data Processing: For the test data of is11b (whether it is 802.11b mode), the following power edge data (Marg) is processed: In 11b mode, only Lower2, Lower1, Upper1, and Upper2 are recorded; In non-11b mode, the edge data from Lower4 to Upper4 is fully recorded; Rx data writing: Write the following wireless reception test indicators: Mode (working mode, such as 802.11a / b / g / n / ac, etc.); Ant (antenna number); Channel (working channel); Frequency (operating frequency, unit Hz); TarPower (target received power, in dBm); CmdPower (command power, used to receive the target power of the test); Total (total number of packets sent); Received (number of packets received); ERP (Equivalent Radiated Power); Rssi (received signal strength, in dBm).

[0086] What needs to be further explained about the above content is that the Tx and Rx tests are automated through script configurable methods, and the real-time test results are displayed on the user interface. In addition, the test results are displayed in a table, and the table is customized to name and beautify the statistical results.

[0087] Universal and modular design The code divides the transmission test (Tx) and the reception test (Rx) into two independent methods, which process different types of data indicators respectively. The parameterized design of the method allows users to easily expand functions, such as supporting other wireless standards or adding new indicators. This improves the versatility and maintainability of the code, making it easier to expand functions or adapt to other wireless test requirements.

[0088] Flexibility in data formats Supports different data structures of two modes (such as 802.11b and other modes), dynamically writes different edge data fields for different modes, meets the testing requirements of multiple wireless protocols, and adapts to the flexible writing of multiple data formats.

[0089] Automated operation and seamless integration The starting row of the Excel table is automatically calculated, and there is no need to manually specify the write position. After the data is inserted, package.Save() is directly called to achieve seamless saving, ensuring that the results of each operation are persisted in real time. In this way, the operation process is simplified, the complexity of manual intervention is reduced, and the efficiency and reliability of test data storage are improved.

[0090] High visualization and standardization of results Set the text alignment (horizontally and vertically centered), automatic line wrapping and border style of the cell to make the data appear clearer and more beautiful in Excel. The border style is detailed (borders all around), which complies with the standard specifications of industrial data tables. This improves the readability of the test data and is suitable for direct display of test results or exporting them as reports, saving time for subsequent manual adjustments.

[0091] Support multi-dimensional wireless performance indicators The launch test data includes: Target power (TarPower), actual power (TestPower), modulation accuracy (Evm), frequency deviation (FreqErr), spectrum mask (Mask), power edge data (Marg).

[0092] The received test data includes: Target power (TarPower), received signal strength (Rssi), packet reception rate (Total and Received), equivalent radiated power (ERP).

[0093] In this way, a comprehensive wireless performance evaluation dimension can be provided, which is suitable for all-round testing needs from RF performance to packet reception rate.

[0094] Flexible expansion for wireless communication protocols Flexible support for multiple wireless protocols (such as 802.11b, 802.11ac, etc.), control the logic of writing fields through mode parameters, and distinguish the test requirements of different protocols. In this way, a unified interface is provided for the testing of complex wireless protocols, reducing the repeated development of code and improving development efficiency.

[0095] Efficient data structure mapping By directly mapping the properties of the two entity objects, TxResultEntity and RxResultEntity, to Excel cells, tedious manual field processing is avoided, which improves the efficiency of data writing and the readability of the code, while reducing the probability of errors.

[0096] Industrial wireless test report generation The whole process from wireless test data to Excel report generation is automated, and the generated table is the standardized result of industrial testing. In this way, the test results are easy to review, share and archive, which is suitable for wireless device development and quality inspection scenarios.

[0097] High efficiency of automated testing Integrate automation tools (such as EPPlus to save Excel data). Automatically calculate test indicators and write test reports. Improve test efficiency, reduce manual operations, and ensure the accuracy and repeatability of test data.

[0098] Real-time display and statistics Refresh test data in real time and display it in the user interface. The data includes key indicators of wireless communication (such as transmit power, frequency deviation, signal strength, bit error rate, etc.). Provide an intuitive test data view to facilitate monitoring of test progress. Quickly respond when abnormal data is found.

[0099] Combination Figure 3 The embodiment of the present application also provides a limit index test device for an intelligent gateway chip applicable to the above electronic device. The limit index test device for the intelligent gateway chip may include a configuration file acquisition module, a test script determination module, a transmission index test module, and a reception index test module.

[0100] The configuration file acquisition module is used to acquire a target parameter configuration file, wherein the parameters in the target parameter configuration file are at least used to indicate a script for testing the limit indicators of the wireless chip of the target intelligent gateway. Figure 2 As shown in step S110, the relevant contents of the configuration file acquisition module can refer to the above description of step S110.

[0101] The test script determination module is used to determine the selected target test script based on the parameters in the target parameter configuration file, wherein the target test script is used to indicate the content of testing the limit indicators of the wireless chip. In the embodiment of the present application, the test script determination module can be used to execute Figure 2 As shown in step S120, for the relevant contents of the test script determination module, reference can be made to the above description of step S120.

[0102] The emission index test module is used to test the wireless emission limit index of the wireless chip within the target emission power range based on the target test script to obtain the emission limit index test result corresponding to the wireless chip, wherein the wireless emission limit index includes at least one of target power, actual power, modulation accuracy, frequency deviation, spectrum template and power edge data. In the embodiment of the present application, the emission index test module can be used to perform Figure 2 As shown in step S130, the relevant contents of the emission index test module can refer to the above description of step S130.

[0103] The receiving index test module is used to test the wireless receiving limit index of the wireless chip within the power range of the target signal generator based on the target test script to obtain the receiving limit index test result corresponding to the wireless chip, wherein the wireless receiving limit index includes at least one of the target power, received signal strength, packet reception rate and equivalent radiated power. In the embodiment of the present application, the receiving index test module can be used to perform Figure 2 As shown in step S140, the relevant contents of the receiving index test module can refer to the description of step S140 in the previous text.

[0104] In an embodiment of the present application, corresponding to the above-mentioned limit indicator testing method of the intelligent gateway chip applied to the electronic device, a computer-readable storage medium is also provided, in which a computer program is stored, and when the computer program is run, each step of the limit indicator testing method of the intelligent gateway chip is executed.

[0105] Among them, the steps executed when the aforementioned computer program is running will not be described one by one here, and reference may be made to the explanation of the limit index testing method of the intelligent gateway chip in the previous article.

[0106] In summary, the limit index test method, device, equipment and medium of the intelligent gateway chip provided by the present application, first, obtain the target parameter configuration file; secondly, based on the parameters in the target parameter configuration file, determine the selected target test script; then, based on the target test script, test the wireless transmission limit index of the wireless chip within the target transmission power range, and obtain the transmission limit index test result corresponding to the wireless chip; finally, based on the target test script, test the wireless reception limit index of the wireless chip within the target signal generator power range, and obtain the reception limit index test result corresponding to the wireless chip. Based on the above content, automatic testing of the wireless transmission limit index and the wireless reception limit index of the wireless chip can be achieved, so that compared with the conventional technical solution of manual testing, it has higher efficiency, therefore, it can improve the problem of low efficiency of limit index testing in the prior art. In addition, it can also avoid the problem of relatively low test reliability due to manual operation errors to a certain extent.

[0107] In several embodiments provided in the embodiments of the present application, it should be understood that the disclosed device and method can also be implemented in other ways. The device and method embodiments described above are merely schematic, for example, the flowcharts and block diagrams in the accompanying drawings show the possible architecture, functions and operations of the device, method and computer program product according to multiple embodiments of the present application. In this regard, each box in the flowchart or block diagram can represent a module, a program segment or a part of a code, and the module, a program segment or a part of a code contains one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flowchart, and the combination of boxes in the block diagram and / or flowchart can be implemented with a dedicated hardware-based system that performs a specified function or action, or can be implemented with a combination of dedicated hardware and computer instructions.

[0108] In addition, the functional modules in the various embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

[0109] If the function is implemented in the form of a software function module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or the part of the technical solution can be embodied in the form of a software product, which is stored in a storage medium, including several instructions to enable a computer device (which can be a personal computer, electronic device, or network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk and other media that can store program code. It should be noted that in this article, the term "include", "include" or any other variant thereof is intended to cover non-exclusive inclusion, so that the process, method, article or device including a series of elements includes not only those elements, but also includes other elements that are not explicitly listed, or also includes elements inherent to such process, method, article or device. Without more constraints, an element defined by the phrase "comprising a..." does not exclude the existence of other identical elements in the process, method, article or apparatus comprising the element.

[0110] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A limit index testing method for an intelligent gateway chip, characterized in that: include: Obtaining a target parameter configuration file, wherein the parameters in the target parameter configuration file are at least used to indicate a script for testing the limit indicators of the wireless chip of the target intelligent gateway; Based on the parameters in the target parameter configuration file, determining a selected target test script, wherein the target test script is used to indicate the content of testing the limit indicators of the wireless chip; Based on the target test script, within the target transmission power range, the wireless chip is tested for a wireless transmission limit indicator, and a transmission limit indicator test result corresponding to the wireless chip is obtained, wherein the wireless transmission limit indicator includes at least one of target power, actual power, modulation accuracy, frequency deviation, spectrum template and power edge data; Based on the target test script, the wireless chip is tested for a wireless reception limit indicator within a target signal generator power range to obtain a reception limit indicator test result corresponding to the wireless chip, wherein the wireless reception limit indicator includes at least one of a target power, a received signal strength, a packet reception rate, and an equivalent radiated power.

2. The limit index testing method of the intelligent gateway chip according to claim 1 is characterized in that: The step of obtaining the target parameter configuration file includes: Determine an initial parameter configuration file, wherein the parameters in the initial parameter configuration file are at least used to indicate a script for testing the limit indicators of the wireless chip of the target intelligent gateway; Binding at least one parameter key in the initial parameter configuration file to at least one target control in the target parameter setting page, and monitoring the at least one target control; In response to monitoring a change in the value of any one of the target controls, the control name or identifier of the target control is mapped to a corresponding parameter key, so that the changed value of the target control is saved to form a target parameter configuration file corresponding to the initial parameter configuration file, wherein the changed value of the target control is saved to a data structure in memory, in which the key is the name or identifier of the target control and the value is the changed value of the target control.

3. The limit index testing method of the intelligent gateway chip according to claim 1 or 2, characterized in that: The step of testing the wireless transmission limit index of the wireless chip based on the target test script within the target transmission power range to obtain the transmission limit index test result corresponding to the wireless chip includes: Based on the target test script, determine a minimum transmit power and a maximum transmit power within a target transmit power range, wherein the minimum transmit power and the maximum transmit power belong to a lower limit value and an upper limit value of the target transmit power range, respectively; Using the minimum transmit power as the current transmit power; Generate a test instruction of a current wireless transmission limit index based on the current transmission power; Sending the current wireless transmission limit index test instruction to the wireless chip to test the wireless transmission limit index of the wireless chip and obtain the current transmission limit index test result of the wireless chip; Updating the current transmit power to form a new current transmit power; Based on the new current transmission power, the step of executing the test instruction for generating a current wireless transmission limit indicator based on the current transmission power is performed again until the new current transmission power reaches the maximum transmission power.

4. The limit index testing method of the intelligent gateway chip according to claim 3 is characterized in that: The step of sending the current wireless transmission limit index test instruction to the wireless chip to test the wireless transmission limit index of the wireless chip and obtaining the current transmission limit index test result of the wireless chip includes: Sending the current wireless transmission limit index test instruction to the wireless chip to test the wireless transmission limit index of the wireless chip and obtain the current transmission limit index test data of the wireless chip; The current emission limit index test data of the wireless chip is saved to Excel through the InsertTxTestData method to form the current emission limit index test result of the wireless chip.

5. The limit index testing method of the intelligent gateway chip according to claim 3 is characterized in that: The step of updating the current transmit power to form a new current transmit power includes: Determining a first step power in the target test script; The sum of the current transmit power and the first step power is calculated, and the sum is determined as a new current transmit power to update the current transmit power.

6. The limit index testing method of the intelligent gateway chip according to claim 1 or 2, characterized in that: The step of testing the wireless receiving limit index of the wireless chip based on the target test script within the power range of the target signal generator to obtain the receiving limit index test result corresponding to the wireless chip includes: Based on the target test script, determining a minimum signal generator power and a maximum signal generator power within a target signal generator power range, wherein the minimum signal generator power and the maximum signal generator power belong to a lower limit value and an upper limit value of the target signal generator power range, respectively; Using the maximum signal generator power as the current signal generator power; Generate a test instruction of a current wireless reception limit index based on the current signal generator power; Sending the current wireless reception limit index test instruction to the wireless chip to test the wireless reception limit index of the wireless chip and obtain the current transmission limit index test result of the wireless chip; Updating the current signal generator power to form a new current signal generator power; Based on the new current signal generator power, the step of generating a test instruction for a current wireless reception limit indicator based on the current signal generator power is executed again until the new current signal generator power reaches the minimum signal generator power.

7. The limit index testing method of the intelligent gateway chip according to claim 6 is characterized in that: The step of sending the current wireless reception limit index test instruction to the wireless chip to test the wireless reception limit index of the wireless chip and obtaining the current transmission limit index test result of the wireless chip includes: Sending the current wireless reception limit index test instruction to the wireless chip to test the wireless reception limit index of the wireless chip and obtain the current reception limit index test data of the wireless chip; The current reception limit index test data of the wireless chip is saved to Excel through the InsertRxTestData method to form the current reception limit index test result of the wireless chip.

8. A limit index testing device for an intelligent gateway chip, characterized in that: include: A configuration file acquisition module, used to acquire a target parameter configuration file, wherein the parameters in the target parameter configuration file are at least used to indicate a script for testing the limit indicators of the wireless chip of the target intelligent gateway; A test script determination module, used to determine a selected target test script based on the parameters in the target parameter configuration file, wherein the target test script is used to indicate the content of testing the limit indicators of the wireless chip; A transmission index test module, used to test the wireless transmission limit index of the wireless chip within the target transmission power range based on the target test script, and obtain the transmission limit index test result corresponding to the wireless chip, wherein the wireless transmission limit index includes at least one of target power, actual power, modulation accuracy, frequency deviation, spectrum template and power edge data; A receiving index test module is used to test the wireless receiving limit index of the wireless chip based on the target test script and within the power range of the target signal generator, and obtain the receiving limit index test result corresponding to the wireless chip, wherein the wireless receiving limit index includes at least one of the target power, received signal strength, packet reception rate and equivalent radiated power.

9. An electronic device, characterized in that: include: Memory for storing computer programs; A processor connected to the memory is used to execute a computer program stored in the memory to implement the limit indicator testing method for the intelligent gateway chip according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, which, when running, executes the limit indicator testing method for the intelligent gateway chip described in any one of claims 1 to 7.

Images