Adapter card service life prolonging processing system and method suitable for boundary scan test

Abstract

The invention discloses a riser card service life prolonging processing system and method suitable for a boundary scan test. The riser card service life prolonging processing system suitable for the boundary scan test comprises at least one boundary scan controller and an upper computer communicating with the boundary scan controller. One side of the boundary scanning controller is electrically connected with at least one boundary scanning simulation detection card; the other side of the boundary scanning controller is electrically connected with an adapter card service life processing control panel; the boundary scanning simulation detection card is in plug-in connection with at least one adapter card through a golden finger; the adapter card is in automatic butt joint with a board to be tested through a golden finger, and the butt joint action is automatically controlled through the adapter card service life processing control board. The riser card is internally provided with a first control chip used for realizing riser card service life management, and the service life of the riser card can be effectively prolonged by the adoption of the riser card service life prolonging processing method.

Description

Technical Field

[0001] The present invention belongs to the technical field of improving the service life of boundary scan adapter cards, and particularly relates to a system and method for improving the service life of an adapter card applicable to boundary scan testing. Background Art

[0002] In the field of boundary scan test fixtures, since the number of DUT's connectors to be tested is very large, especially for the connectors of server motherboards and server expansion cards, the number of connectors to be tested can reach dozens, and the types of connectors to be tested are also numerous, such as: DDR, MCIO, SLIMLINESAS, PICE, USB, RSIER, OCP, etc. Different connectors to be tested require different adapter cards. The gold fingers of the adapter cards are automatically plugged and unplugged with the connectors to be tested for automated testing. Adapter cards are consumables. During the production process, due to their long-term automatic plugging and unplugging, they need to be replaced in a timely manner. For situations where abnormal plugging affects the plugging and unplugging life of the adapter card, timely maintenance is required. Therefore, the management of the service life of adapter cards is crucial.

[0003] For consumable adapter cards, the current usage status of on-site maintenance personnel is that when a certain connector test fails (fails), a new adapter card may be installed for testing, or the previously used adapter card may be reused. It may be installed at any position corresponding to many identical connectors to be tested on a single fixture, or it may be taken by another parallel fixture for use. In short, the management of the service life of the board cards is very chaotic. In the actual application process, with the long-term use of the adapter card, the fixture will become increasingly unstable and the test pass rate will become lower and lower. Investigating the reasons, there are two factors regarding the adapter card. The first point is that if the normal service life of the adapter card expires and is not replaced in a timely manner, it will affect the test stability. The second point is that affected by the abnormal usage environment, although the service life of the adapter card has not reached its limit, it can no longer be used, which will also affect the test stability. At this time, simply replacing the adapter card cannot solve the problem. It is necessary to trace the root cause and find the fundamental reason on the fixture that affects the service life of the adapter card. For example, when it cannot be used normally, it may be caused by the incomplete alignment of the installation position of the adapter card, or it may be caused by the interference of the structure, which causes the adapter card to be rubbed for a long time and affects its service life. At this time, it is necessary to align the position or adjust the structure to fundamentally solve the problem affecting the service life of the adapter card. After solving the problem, replace the new adapter card for testing to ensure that the replaced adapter card can reach its normal service life. Otherwise, if the service life of the adapter card is not managed, the subsequent testing will be very unstable and the maintenance will be very troublesome.

[0004] Therefore, in view of the above technical problems and defects, it is urgently necessary to design and develop a system and method for improving the service life of an adapter card applicable to boundary scan testing. Summary of the Invention

[0005] To overcome the deficiencies and difficulties of the above-mentioned existing technologies, the purpose of the present invention is to provide a processing system and method for improving the service life of an adapter card applicable to boundary scan testing, which can effectively improve the service life of the adapter card.

[0006] The first object of the present invention is to provide a processing system for improving the service life of an adapter card applicable to boundary scan testing; the second object of the present invention is to provide a processing method for improving the service life of an adapter card applicable to boundary scan testing.

[0007] The first object of the present invention is achieved as follows: The system includes at least one boundary scan controller and a host computer communicating with the boundary scan controller; one side of the boundary scan controller is electrically connected to at least one boundary scan simulation detection card; the other side of the boundary scan controller is electrically connected to an adapter card life processing control board.

[0008] The boundary scan simulation detection card is plugged into at least one adapter card through a gold finger; the adapter card is automatically docked with the device under test through a gold finger, and the docking action is automatically controlled by the adapter card life processing control board; a first control chip for realizing the life management of the adapter card is provided in the adapter card.

[0009] Further, at least two connectors are provided in the adapter card.

[0010] One of the connectors is electrically connected to at least one BS chip provided in the boundary scan simulation detection card and at least one device under test connector provided in the device under test through a gold finger.

[0011] The other connector is electrically connected to the first control chip and the connector provided in the boundary scan simulation detection card respectively.

[0012] Further, the model of the first control chip is AT24C02.

[0013] Further, a double-pole double-throw relay for controlling the conduction of control signals is provided between the connector in the boundary scan simulation detection card and the adapter card life processing control board.

[0014] The working state of the double-pole double-throw relay is controlled in real time by a set of DIP switches.

[0015] Further, the model of the double-pole double-throw relay is G6K-2F-Y-TR.

[0016] Further, the JTAG signals between the BS chips are connected in series to form a combined chain and are electrically connected to the JTAG drive and receive pins TCK, TMS, TDI, and TDO of the boundary scan controller; among them, the combined chain includes a daisy chain, a string chain, and a cascade chain.

[0017] Further, the boundary scan simulation detection card is electrically connected to the 3.3V power bus and the adapter card life processing control board respectively through the provided single-pole double-throw relay; the

[0018] IO1 of the main control chip of the adapter card life processing control board controls whether the single-pole double-throw relay is turned on; wherein, the model of the single-pole double-throw relay is GAQY212GSX.

[0019] Further, the model of the main control chip of the adapter card life processing control board is STM32F103VCT6.

[0020] Further, at least one two-dimensional code is provided in the adapter card;

[0021] The two-dimensional code is used to count fixed information to the host computer and write it into the first control chip.

[0022] The second object of the present invention is achieved as follows: The processing method is applied to the adapter card service life improvement processing system; the method includes the following steps:

[0023] The information of unplugging and plugging at least two adapter cards at the same time is fed back to the host computer through USB to serial port communication. After receiving the signal, the host computer performs counting processing on each adapter card;

[0024] The host computer sends the life management command in the first control chip to the adapter card life processing control board;

[0025] The adapter card life processing control board accesses the first control chip through IO_X1 to control I2C communication, and reads the current fixture ID and boundary scan chain information of the first control chip;

[0026] Based on the current fixture ID and boundary scan chain information, it is determined whether the current adapter card has been used, and at the same time, the total number of times the adapter card was used before the original fixture is recorded.

[0027] The present invention provides a processing system for improving the service life of an adapter card applicable to boundary scan testing. Among them, the system includes at least one boundary scan controller and a host computer communicating with the boundary scan controller; on one side of the boundary scan controller, at least one boundary scan simulation detection card is electrically connected; on the other side of the boundary scan controller, an adapter card life processing control board is electrically connected; the boundary scan simulation detection card is plugged into at least one adapter card through a gold finger; the adapter card is automatically docked with a board under test through a gold finger, and the docking action is automatically controlled by the adapter card life processing control board; a first control chip for realizing the life management of the adapter card is arranged in the adapter card, and an adapter card service life improvement processing method, which can effectively improve the service life of the adapter card.

[0028] That is to say, through the life management of the adapter card in the solution of the present invention, random replacement on site can be eliminated, and anti-fooling for replacing the adapter card can be achieved. The replacement of the adapter card by on-site operators is also effectively managed to ensure that no mistakes occur during the operation and replacement process. In addition, through the solution of the present invention, the usage times details of each adapter card can be counted, specifically: considering the cross-usage situation, the usage times of each adapter card at each parallel connector under test on the same jig, the usage times of each adapter card on the previous parallel jig, and the total usage times of the adapter card. In addition, for the life management of the adapter card, on the one hand, for any adapter card, the usage times details of the adapter card can be viewed in real time. When the life of the adapter card expires, a prompt for replacing the adapter card is given in a timely manner. On the other hand, if the long-term test fails at any adapter card, a usage exception prompt is given, indicating that the jig needs to be repaired. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for description in the embodiments. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0030] Figure 1 It is a schematic diagram of the life management system framework of an adapter card service life improvement processing system applicable to boundary scan testing of the present invention, where each DUMMY card corresponds to one adapter card;

[0031] Figure 2 It is a schematic diagram of the life management system framework of an adapter card service life improvement processing system applicable to boundary scan testing of the present invention, which is a combination chain of m DUMMY cards;

[0032] Figure 3Schematic diagram of the adapter life management system framework where each DUMMY card corresponds to two adapters in a system for improving the service life of adapters suitable for boundary scan testing according to the present invention;

[0033] Figure 4 Schematic diagram of a system for improving the service life of adapters suitable for boundary scan testing according to the present invention;

[0034] Figure 5 Schematic diagram of the process flow of a method for processing an analog test link for boundary scan testing according to the present invention;

[0035] The realization of the purpose, functional features and advantages of the present invention will be further described in conjunction with embodiments with reference to the accompanying drawings. Detailed implementation manners

[0036] To better understand the purpose, technical solution and advantages of the present invention more clearly, the present invention will be further described below in conjunction with the accompanying drawings and specific implementation manners. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification.

[0037] The present invention can also be implemented or applied through other different specific examples. The details in this specification can also be modified and changed based on different viewpoints and applications without departing from the spirit of the present invention.

[0038] It should be noted that if there are directional indications (such as up, down, left, right, front, back...) involved in the embodiments of the present invention, then such directional indications are only used to explain the relative positional relationship and movement conditions between components in a certain specific posture (as shown in the accompanying drawings). If this specific posture changes, then such directional indications will also change accordingly.

[0039] In addition, if there are descriptions such as "first", "second", etc. involved in the embodiments of the present invention, then such descriptions of "first", "second", etc. are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the quantity of the indicated technical features. Thus, features defined with "first", "second" can explicitly or implicitly include at least one such feature. Secondly, the technical solutions between various embodiments can be combined with each other, but it must be based on the ability of those skilled in the art to implement. When the combination of technical solutions results in contradictions or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the protection scope required by the present invention.

[0040] The present invention will be further elaborated below in conjunction with the accompanying drawings, as Figures 1-4As shown in the figure, the present invention provides a processing system for improving the service life of an adapter card suitable for boundary scan testing. The system includes at least one boundary scan controller and a host computer communicating with the boundary scan controller. One side of the boundary scan controller is electrically connected to at least one boundary scan simulation detection card. The other side of the boundary scan controller is electrically connected to an adapter card life processing control board.

[0041] The boundary scan simulation detection card is plugged into at least one adapter card through a gold finger. The adapter card is automatically docked with the board under test through a gold finger, and the docking action is automatically controlled by the adapter card life processing control board. A first control chip for realizing the life management of the adapter card is provided in the adapter card.

[0042] At least two connectors are provided in the adapter card. One of the connectors is electrically connected to at least one BS chip provided in the boundary scan simulation detection card and at least one connector under test provided in the board under test through a gold finger.

[0043] The other connector is respectively electrically connected to the first control chip and the connector provided in the boundary scan simulation detection card.

[0044] The model of the first control chip is AT24C02. A double-pole double-throw relay for controlling the conduction of control signals is provided between the connector in the boundary scan simulation detection card and the adapter card life processing control board.

[0045] The working state of the double-pole double-throw relay is controlled in real time by a set of DIP switches. The model of the double-pole double-throw relay is G6K-2F-Y-TR.

[0046] The JTAG signals between the BS chips are connected in series to form a combined chain and are electrically connected to the JTAG drive and receive pins TCK, TMS, TDI, and TDO of the boundary scan controller. Among them, the combined chain includes a daisy chain, a string chain, and a cascade chain.

[0047] The boundary scan simulation detection card is respectively electrically connected to the 3.3V power bus and the adapter card life processing control board through a single-pole double-throw relay. The

[0048] IO1 of the main control chip of the adapter card life processing control board controls whether the single-pole double-throw relay is turned on. Among them, the model of the single-pole double-throw relay is GAQY212GSX.

[0049] The model of the main control chip of the adapter card life processing control board is STM32F103VCT6.

[0050] At least one two-dimensional code is provided in the adapter card; the two-dimensional code is used to count fixed information to the host computer and write it into the first control chip.

[0051] Specifically, in the embodiment of the present invention, as Figure 1 shown, 1 DUMMY card (boundary scan simulation detection card) is directly docked with 1 adapter card, that is, 1 DUMMY card corresponds to 1 adapter card.

[0052] That is to say, Figure 1 is the block diagram of the life management system where each DUMMY card in the embodiment of the present invention corresponds to one adapter card. First is the adapter card. The gold fingers 1.2 and 2.2 of the adapter cards 1 and 2 in the figure are respectively connected to the connectors 1.2 and 2.2. The gold fingers of the connectors 1.2 and 2.2 are respectively connected to the gold fingers 1.1 of DUMMY card 1 and the gold finger 2.1 of DUMMY card 2. The gold fingers 1.1 and 2.1 of DUMMY card 1 and DUMMY card 2 are respectively connected to the IO bundles 1 of BS chip 1 and the IO bundle 2 of BS chip 2. The IO bundle refers to the general term for many IOs of the chip. There is a one-to-one pin connection relationship between the gold finger and the IO bundle. The JTAG signals TCK1, TMS1, TDI1, and TDO1 of BS chip 1 and the JTAG signals TCK2, TMS2, TDI2, and TDO2 of BS chip 2 are connected in series to form a combined chain (daisy chain, serial chain, cascade chain), and finally connected to the JTAG drive and receive pins TCK, TMS, TDI, and TDO of the boundary scan controller; Patent Application No.: CN202410148766.8 details this method of internal wiring, which can ensure the consistency of each DUMMY card and will not be repeated here; the life management system of the adapter card in the present invention also needs to ensure that each DUMMY card is the same DUMMY card to ensure the consistency of the implementation of the combined chain.

[0053] The life management system of the adapter card is introduced on the basis of the conventional boundary scan test. After the gold fingers 1.2 and 2.2 of the adapter card are respectively docked with the DUT connectors J1 and J2 to be tested, the boundary scan test can be started. The docking method is automatic, as Figure 1 the automatic docking 1 and automatic docking 2 in the figure, so as to support the automatic boundary scan test of the DUT (device under test).

[0054] To achieve the lifespan management of the adapter cards, one EEPROM chip is added to each of adapter card 1 and adapter card 2. The VCC power supply of adapter card 1 is connected to point p11 through connector 1.3 and connector 1.1 respectively. The VCC power supply of adapter card 2 is connected to point p21 through connector 2.3 and connector 2.1 respectively. The GND pin of EEPROM1 on adapter card 1 is connected to point p12 through connector 1.3 and connector 1.1 respectively. Additionally, the WP pin of EEPROM1 is connected to the GND pin of EEPROM1 to achieve free read and write. The device address pins A1, A2, and A3 of EEPROM1 are also connected to GND to fix its device address. The GND pin of the EEPROM on adapter card 2 is connected to point p22 through connector 2.3 and connector 2.1 respectively. Additionally, the WP pin of EEPROM2 is connected to the GND pin of EEPROM2 to achieve free read and write. The device address pins A1, A2, and A3 of EEPROM2 are also connected to GND to fix its device address, ensuring the address consistency between EEPROM1 and EEPROM2, and further ensuring the consistency of the adapter card design corresponding to the same DUT connector. The EEPROM model can be referred to as: AT24C02.

[0055] Point P11 of DUMMY card 1 and point P21 of DUMMY card 2 are connected to the control board of the adapter card lifespan management system through the 3.3V power bus, and then connected to the 3.3V power supply through a single-pole double-throw relay 1. The IO1 of the main control chip on the control board of the adapter card lifespan management system controls whether the single-pole double-throw relay 1 is turned on, thereby controlling the 3.3V power supply. Point P12 of DUMMY card 1 and point P22 of DUMMY card 2 are also connected to the control board of the adapter card lifespan management system through the GND bus, and then connected to GND through a single-pole double-throw relay 2. The main control chip IO8 of the control board of the adapter card lifespan management system controls whether the single-pole double-throw relay 2 is turned on. The single-pole double-throw relay can use a solid-state relay with the model: Guojing Microelectronics GAQY212GSX. The driving current of the solid-state relay is 10mA. After calculation, a 200Ω resistor is connected in series, and it can be directly driven to conduct by the IO port.

[0056] The reference model of the main control chip of the solid-state relay is: STM32F103VCT6. The above method solves the power supply problem of the EEPROMs of the corresponding adapter cards of DUMMY1 and DUMMY2, powers on when the lifespan of the board needs to be read and recorded, and disconnects when not needed, without affecting the normal boundary scan test, and ensures the consistency between DUMMY card 1 and DUMMY card m.

[0057] The I2C pins SCL and SDA of the EEPROM1 on DUMMY Card 1 pass through Connector 1.3 of Adapter Card 1 and Connector 1.1 of DUMMY Card 1, and then are respectively connected to the normally open terminals of the double-pole double-throw relay.

[0058] The I2C pins SCL and SDA of the EEPROM2 on DUMMY Card 2 pass through Connector 2.3 of Adapter Card 1 and Connector 2.1 of DUMMY Card 2, and then are respectively connected to the normally open terminals of the double-pole double-throw relay.

[0059] The common terminals of the double-pole double-throw switch 1 on DUMMY Card 1 and the double-pole double-throw switch 2 on DUMMY Card 2 are respectively connected to IO6 and IO7 of the main control chip on the control board of the adapter card life management system. IO6 and IO7 are respectively SCL and SDA of the I2C signal, and are respectively pulled up to the 3.3V power supply through resistor R1 and resistor R2. The resistance values can both be taken as 4.7 kΩ.

[0060] The main control chip provides the I2C signals for reading and testing the EEPROM1 and EEPROM2 of DUMMY Cards 1 and 2. The common terminal of the double-pole double-throw switch 1 on DUMMY Card 1 is connected to IO6 and IO7 (I2C signal) of the control board of the adapter card life management system. The normally closed terminal of DUMMY Card 1 is connected to the common terminal of the double-pole double-throw switch 2 on DUMMY Card 2. The normally open terminal of DUMMY Card 1 is connected to the SCL and SDA pins of EEPROM1 (the I2C pins of the EEPROM chip). The normally open terminal of the double-pole double-throw switch 2 on DUMMY Card 2 is connected to the next-level DUMMY Card 3 (not shown in the figure, but the ability to connect to the next level is reserved). The double-pole double-throw switches 1 and 2 on DUMMY Cards 1 and 2 are respectively controlled by DIP switch group 1 and DIP switch group 2.

[0061] The DIP switch group 1 on DUMMY Card 1 includes switches K11 to K1n, and the DIP switch group 2 on DUMMY Card 2 includes switches K21 to K2n. Each DUMMY card has n DIP switches, which can be respectively connected to the I0_X1 to IO_Xn pins of the main control chip on the control board of the adapter card life management system through DIP. The double-pole double-throw relays 1 on DUMMY Card 1 and the double-pole double-throw relay 2 on DUMMY Card 2 can be respectively controlled through I0_X1 to IO_Xn, so that they can be respectively conducted with the I2C pins SCL and SDA on the EEPROM1 of Adapter Card 1 and the EEPROM2 of Adapter Card 2, and further support the reading and writing of the EEPROM chips of Adapter Card 1 and Adapter Card 2 on the hardware, preparing for the adapter card life management.

[0062] The double-pole double-throw relay model can refer to the Omron model: G6K-2F-Y-TR double-pole double-throw relay. In order to make the valid signals of I0_X1 to IO_Xn conduct the relay, an analog switch can be used for the valid signals of I0_X1 to IO_Xn. By the analog switch, the 3.3V power supply is conducted, and then a 100Ω resistor is connected in series and then acts on the relay coil to achieve effective drive. The method is relatively conventional and is not drawn in the block diagram in the present invention. The analog switch refers to the analog switch of the Taizhou model: TPAS179-92LF. I0_X1 to IO_Xn can directly drive it. The role of selecting the analog switch to act on the 3.3V power supply to drive the relay is to prevent the influence of leakage current on the I2C signal.

[0063] The pins of the main control chip I0_X1 to IO_Xn of the control board of the adapter card life management system pass through DUMMY card 1 and DUMMY card 2 respectively, and the function is to ensure the consistency of the designs of DUMMY card 1 and DUMMY card 2.

[0064] With the above consistency design, it will be consistent with the routing of the TCK and TMS signals of the JTAG of the combination chain. The DUMMY cards are connected level by level, and the implementation is very convenient.

[0065] DUMMY card 1 and 2 are automatically docked with adapter card 1 and 2 respectively, as Figure 1 shown. It involves the control of the actions by the control board of the adapter card life management system. The purpose is to complete the automated actions of the DUT test, which is relatively conventional and will not be described in detail here. Adapter card 1 and 2 have independent two-dimensional codes, which can count the fixed information to the host computer and write it into EEPROM1 and EEPROM2. The two-dimensional codes of the adapter cards are made by restricting the coding requirements before the board is manufactured, and each adapter card has a unique code.

[0066] Figure 2 This is the block diagram of the adapter card life management system with m cascaded DUMMY cards according to the embodiment of the present invention. Combining Figure 1 and Figure 2 , according to the method of the combination chain of 2 DUMMY cards in Figure 1 , continue to expand backward. Thus, Figure 2 it is extended to the scenario of the combination chain of m DUMMY cards.

[0067] Combining Figure 2As shown in the figure, the gold fingers 1.2 and m.2 of the adapter cards 1 to m in the figure are respectively connected to the connectors 1.2 and m.2. The gold fingers of the connectors 1.2 and m.2 are respectively connected to the gold fingers 1.1 to m.1 of the DUMMY cards 1 to m. The gold fingers 1.1 to m.1 of the DUMMY cards 1 to m are respectively connected to the IO bundles 1 of the BS chip 1 and the IO bundles 2 of the BS chip 2. The JTAG signals TCK1, TMS1, TDI1, and TDO1 of the BS chip 1 to the JTAG signals TCKm, TMSm, TDIm, and TDOm of the BS chip m are connected in series to form a combined chain, and finally connected to the JTAG drive and receive pins TCK, TMS, TDI, and TDO of the boundary scan controller; the adapter card life management system of the present invention ensures the consistency of the implementation of the combined chain.

[0068] After the gold fingers 1.2 and m.2 of the adapter card are respectively docked with the connectors J1 and Jm to be tested, the boundary scan test can start. The connection method is automatic docking, such as Figure 1 the automatic docking 1 to m in the figure, so as to support the boundary scan automation test of the board under test (DUT).

[0069] In order to implement the life management of the adapter card, one EEPROM chip is respectively added to the adapter cards 1 to m. The VCC power supply of the adapter card 1 is respectively connected to the point p11 through the connectors 1.3 and 1.1, the VCC power supply of the adapter card 2 is respectively connected to the point p21 through the connectors 2.3 and 2.1, and so on. The VCC power supply of the adapter card m is respectively connected to the point pm1 through the connectors m.3 and m.1.

[0070] The GND pin of the EEPROM1 on the adapter card 1 is connected to point p12 through connector 1.3 and connector 1.1 respectively. In addition, the WP pin of the EEPROM1 is connected to the GND pin of the EEPROM1 to achieve free reading and writing. The device address pins A1, A2, and A3 of the EEPROM1 are also connected to GND to fix its device address. The GND pin of the EEPROM on the adapter card 2 is connected to point p22 through connector 2.3 and connector 2.1 respectively. In addition, the WP pin of the EEPROM2 is connected to the GND pin of the EEPROM2 to achieve free reading and writing. The device address pins A1, A2, and A3 of the EEPROM2 are also connected to GND to fix its device address, and so on. The GND pin of the EEPROM on the adapter card m is connected to point pm2 through connector m.3 and connector m.1 respectively. In addition, the WP pin of the EEPROM2 is connected to the GND pin of the EEPROM2 to achieve free reading and writing. The device address pins A1, A2, and A3 of the EEPROMm are also connected to GND to fix its device address, thus ensuring the consistency of the addresses of the EEPROM1 to EEPROMm, and further ensuring the consistency of the adapter card designs corresponding to the same DUT connectors.

[0071] Points P11 on the DUMMY card 1 to point Pm1 on the DUMMY card m are connected to the adapter card life management system control board through the 3.3V power bus, and are connected to the 3.3V power supply through the single-pole double-throw relay 1. The IO1 of the main control chip on the adapter card life management system control board controls whether the single-pole double-throw relay 1 is turned on, and thus controls the 3.3V power supply. Points P12 on the DUMMY card 1 to point Pm2 on the DUMMY card m are also connected to the adapter card life management system control board through the GND bus, and are connected to GND through the single-pole double-throw relay 2. The main control chip IO8 on the adapter card life management system control board controls whether the single-pole double-throw relay 2 is turned on. The above method solves the power supply problem of the EEPROM corresponding to the DUMMY1 to DUMMYm adapter cards, powers on when the board card life needs to be read and recorded, and disconnects when not needed, without affecting the normal boundary scan test, and ensures the consistency of the DUMMY card 1 to DUMMY card m.

[0072] The I2C pins SCL and SDA of the EEPROM1 to m corresponding to the DUMMY cards 1 to m are respectively connected to the normally open ends of the double-pole double-throw relay through the connectors 1.3 to m.3 of the adapter cards 1 to m and the connectors 1.1 to m.1 of the DUMMY card 1.

[0073] The common terminals of the double - throw switches 1 to m of DUMMY cards 1 to m are respectively connected to IO6 and IO7 of the main control chip on the control board of the adapter card life management system. IO6 and IO7 are SCL and SDA of the I2C signal respectively, and are pulled up to the 3.3V power supply through resistor R1 and resistor R2 respectively.

[0074] The main control chip provides the I2C signals for reading and testing the EEPROMs 1 to m of DUMMY cards 1 to m. The double - throw switches 1 and m of DUMMY card 1 and DUMMY card m are respectively controlled by the DIP switch groups 1 to m.

[0075] The DIP switch group 1 of DUMMY card 1 includes switches K11 to K1n, the DIP switch group 2 of DUMMY card 2 includes switches K21 to K2n, and the DIP switch group m of DUMMY card m includes switches Km1 to Kmn. Each DUMMY card has n DIP switches. Each DIP switch group dials different codes and is respectively connected to m control pins of the main control chip on the control board of the adapter card life management system. The m control pins are any m of I0_X1 to IO_Xn. The double - throw relays 1 to m of DUMMY cards 1 to m can be respectively controlled through the m control pins, ensuring that the double - throw switches 1 to m can be respectively connected, and then respectively conducting with the I2C pins SCL and SDA on the corresponding EEPROMs 1 to m of adapter cards 1 to m, realizing I2C communication, supporting the reading and writing of the EEPROM chips of adapter cards 1 to m, and preparing for the life management of adapter cards.

[0076] Each DUMMY card has n DIP switches, and at most supports the separate conduction of the double - throw switches of n adapter cards, that is, 1 ≤ m ≤ n. At most, the life management of n adapter cards on the combination chain can be realized. For example, if m = n = 16, the 16 DIP switches on DUMMY cards 1 to m can be respectively controlled through the main control chip I0_X1 to IO_X16 of the control board, so as to realize the life management of 16 adapter cards; if m = 5 and n = 16, 5 out of 16 IOs in total, namely I0_X1 to IO_X16 of the main control chip of the control board, can be dialed through, so as to realize the life management of 5 adapter cards.

[0077] The function of the main control chip I0_X1 to IO_Xn pins of the control board of the adapter card life management system passing through DUMMY cards 1 to m is to ensure the consistency of the design of DUMMY cards 1 to m.

[0078] With the above consistent design, the TCK and TMS signals of JTAG of the combination chain of m DUMMY cards can have the same signal path. The DUMMY cards are connected level by level, and the implementation is very convenient.

[0079] The DUMMY cards 1 to m are automatically docked with the adapter cards 1 to m respectively. For example, Figure 1 , it involves the control of the action by the control board of the adapter card life management system, and the purpose is to complete the automated actions of DUT testing. This is relatively conventional and will not be described in detail here.

[0080] There are independent two-dimensional codes on the adapter cards 1 to m. By scanning the codes with a barcode scanner to the host computer, the fixed information can be written into the corresponding EEPROMs 1 to m.

[0081] Combined with Figure 1 and Figure 2 As shown, considering the anti-fooling of whether the adapter board is a real plugging and unplugging action, that is, after the signal is sent, whether there is an automated action response, there will be corresponding sensors to detect, such as the photoelectric sensor of the model GC-L25N of Guochuang Electronics, the optical sensor of the model TCRT1000 of Vishay Semiconductor, etc. To ensure that after the plugging and unplugging control signal of the adapter card is sent and the corresponding plugging and unplugging action is completed, there will be a level signal returned, which is received by the main control chip IO of the control board, and data will be recorded only when there is a real plugging and unplugging action.

[0082] There is signal interaction between the boundary scan controller and the adapter card life management control board. There are various interaction methods, such as: communication methods such as serial port, I2C, network port protocol, and even simple IO communication can be used. The purpose of the interaction is to complete the actions of the entire automated testing process.

[0083] For the signal interaction between the host computer and the adapter card life management control board, conventional USB-to-serial port interaction can be used. When the adapter card life management control board receives the level feedback signal of the sensor during the plugging and unplugging of the corresponding adapter card, and then through the USB-to-serial port signal, the received level feedback signal of the sensor is transmitted to the host computer. The level feedback signal is the level feedback signal of the real plugging and unplugging of the adapter board. After the host computer receives the level feedback signal, since the USB-to-serial port communication is bidirectional, the life statistics command can be sent to the life management control board, and the control board controls to connect the corresponding adapter card EEPROM and execute the corresponding EEPROM writing and reading to ensure the flexibility of life statistics writing and reading.

[0084] For example, Figure 3 As shown, 1 DUMMY card is docked with multiple adapter cards, that is, 1 DUMMY card corresponds to multiple adapter cards. Figure 3 This is the block diagram of the adapter card life management system where each DUMMY card in the embodiment of the present invention corresponds to 2 adapter cards. Compared with Figure 1 , the difference is that Figure 3 1 DUMMY card in Figure 1 cannot correspond to 1 adapter card, so the life management of the adapter card cannot be implemented as in the block diagram ofFigure 3 The adapter base shown in the figure is used to ensure the consistency of implementation. The IO bundle resources of DUMMY card 1 can be connected to the adapter base. After the gold finger 1.1 (such as DDR5 gold finger) is connected to the adapter base connector, the IO resources are transferred to adapter card 1 and adapter card 2 through adapter harness 1 and adapter harness 2, respectively, thereby realizing the boundary scan test of 1 DUMMY card being assigned to 2 adapter cards. The 2 adapter cards are adapter card 1 and adapter card 2. The introduction of the adapter base and harnesses 1 and 2 makes Figure 3 will be able to Figure 1 Similarly, life management of adapter card 1 and adapter card 2 is performed.

[0085] The above shows the implementation system of adapter card life management in which one DUMMY card corresponds to two adapter cards. The same is true for the system in which one DUMMY card corresponds to three or more adapter cards. In addition, the combination chain of multiple DUMMY cards can still be managed according to Figure 3 The method shown is implemented.

[0086] The above method is often used for the transfer of MCIO, SLIMLINESAS, PCIE, USB and other test connectors. These test connectors usually require fewer IO resources, while DDR5 gold fingers can bring out more resources. If the gold fingers of the DUMMY card are designed as DDR5 gold fingers, and then resources are allocated through the transfer base plate, one DUMMY card can be used to perform boundary scan tests on multiple non-DDR5 test connectors. The transfer base plate can be used for 1 to 1 logic management of the life of the transfer card. The management logic and Figure 1 The same, just the module division is different.

[0087] The adapter baseplate can also realize the end-to-end combination connection of one level after another, just like the JTAG signals TCK and TMS of the DUMMY card, optimize the internal wiring layout of the automated fixture, and support the standardized design of the adapter baseplate.

[0088] The connectors J1 and J2 to be tested correspond to n dip switches on the adapter base plate, and still support the double-pole double-throw switches of up to n adapter cards to be turned on respectively, and realize the life management of up to n adapter cards in the combination chain. For example, if n=16, the main control chips I0_X1 to IO_X16 of the control board can be used to control the I2C communication of 16 adapter cards respectively, thereby realizing the life management of up to 16 adapter cards.

[0089] The above has elaborated in detail the adapter card life management system. The adapter card QR code information includes: current fixture ID, boundary scan chain, adapter card unique code, adapter card number, production date, initial use date, card transfer type, card transfer function information, the data register positions corresponding to the address ranges allocated by the EEPROM of each adapter card. Different fixed information is allocated reasonable storage ranges according to the actual situation to ensure that the reading and writing of each adapter card are within the specified storage ranges and are executed according to the restricted rules.

[0090] Step 1: The control board of the adapter card life management system has two modes. The operation of the first mode is completed by the technical personnel at the supply end. In the offline environment without fixtures, the QR code scanning and burning of the EEPROM corresponding to each new adapter card are completed. Connect the barcode scanner to the host computer, and scan and record the fixed information of the QR code of each new adapter card. These fixed information include: adapter card unique code, adapter card number, production date, initial use date, card transfer type, card transfer function information. Burn the fixed information of these new adapter cards into the EEPROM of their respective new adapter cards. As long as it is a new adapter card, it is burned. Except for the burned information, all other storage ranges of the new adapter card are cleared to 0, and secondary QR code verification is completed to ensure that there are no errors in the burning and verification of the EEPROM of each adapter card at the supply end.

[0091] To avoid conflicts in QR code scanning and burning between new cards and old cards in the offline situation, the following method is adopted: Each time the QR code on the adapter card is scanned, first detect the adapter card unique code. The unique code of each adapter card is the same. Compare the unique code read from the EEPROM with the expected unique code of the host computer. If the correct adapter card unique code is detected, it means that it is an already burned or previously used adapter card, and a message indicating that it has been burned and verified OK is prompted. If the correct adapter card unique code is not detected, it means that the adapter card is a new card, then the scanned content is burned into the EEPROM of the adapter card, and a prompt for verification is given. Scan and verify again. The object of verification is still the adapter card unique code. The purpose of verification is to ensure that the adapter card communication and burned information are OK. After verification OK, the adapter card will be provided for use in the test fixture.

[0092] Based on the above adapter card life management system and the verification method in the first step, taking the life management of m adapter cards as an example, the adapter card life management method is elaborated in detail. The boundary scan test fixture is implemented according to the system block diagram in the Figure 2 way. Except for the adapter card that needs to be installed after QR code scanning, the hardware environment of the fixture is all built, including the control board of the adapter card life management system. The control board of the life management system is powered on. Figure 2 Step 2: Start the second working mode of the control board of the adapter card life management system. The second working mode is the service life management of the fixture adapter card.

[0093] ​

[0094] Since the positions of the connectors under test on the board under test are fixed, the order of controlling double-pole double-throw relays 1 to m by IO_X1 to IO_Xn of the main control chip of the adapter card life management control board is first allocated on the fixture. Only m of the IO_X1 to IO_Xn of the main control chip of the life management control board need to be selected and corresponding to double-pole double-throw relays 1 to m one by one. Generally, they are corresponding one by one in order. If n = 16 and m = 8, it can be allocated like this: control double-pole double-throw relays 1 to 8 by IO_X1 to IO_X8 respectively. Just dial K11 of DIP switch group 1, K22 of DIP switch group 2, K33 of DIP switch group 3, and so on... until dial K88 of DIP switch group 8.

[0095] Thus, double-pole double-throw relays 1 to 8 can be controlled by IO_X1 to IO_X8 in turn. For example: in each round of life management process, it is divided into multiple small steps. Only the EEPROM of one adapter card is always connected to the I2C communication of the life management control board, and all other EEPROMs are disconnected. The read and write life management of each adapter card is done in turn. In each round of life management, in the first small step, double-pole double-throw relay 1 is controlled by IO_X1, so as to connect EEPROM1 of adapter card 1. In the second small step, double-pole double-throw relay 2 is controlled by IO_X2, so as to connect EEPROM2 of adapter card 2, and so on... In the eighth small step, double-pole double-throw relay 8 is controlled by IO_X8, so as to connect EEPROM8 of adapter card 8. In each round of life management of the board card, the life record work of EERPOM is completed by controlling through IO_X1 to IO_X8 in turn. If the adapter card is unplugged and plugged multiple times, multiple rounds of life management records will be carried out.

[0096] On the automated test fixture, after the adapter card is unplugged and plugged once, an optoelectronic sensor signal will be returned. At this time, a round of adapter card life management counting will be started. There are 2 situations for the level feedback signal of the optoelectronic sensor. The first situation is that 1 level feedback signal corresponds to multiple connectors under test. Therefore, there is a corresponding level feedback signal for each unplugging and plugging, and the adapter card where the associated connector under test is located needs to be counted once. The second situation is that 1 level feedback signal corresponds to 1 connector under test. Therefore, for each unplugging and plugging of their respective adapter cards, there is their own level feedback signal, and the adapter card where the connector under test with the unplugging and plugging signal is located is counted once. It can be achieved by detecting the effective level through the IO of the life management control board. In short, the life management counting of each adapter card is real and effective. In addition, between the life management control board and the optoelectronic sensor, there is a conversion between different level standards, which is relatively conventional and will not be elaborated in detail here.

[0097] The host computer manages the adapter card sequence of the boundary scan chain of the current fixture one by one. The management criterion is the DUT connector of the board under test. Since a adapter card needs to be installed at the position corresponding to each DUT connector, the adapter card may be replaced, but the position of the DUT connector remains unchanged. Therefore, multiple scanning frames for QR codes entered by the host computer software are corresponded one by one with the positions where the DUT connectors of the boundary scan chain are located. For example, the host computer creates m scanning frames, namely scanning frame 1 to m, which are corresponded one by one with the DUT connectors J1 and Jm. If the number of DUT connectors in a boundary scan chain is 8, the host computer creates 8 scanning frames, namely scanning frame 1 to scanning frame 8, which are corresponded one by one with the DUT connectors J1 to J8.

[0098] Before installing each adapter card, it is necessary to scan the QR code first and then install the corresponding adapter card. The QR code information is recorded in a text or table file on the computer in the form of a table file, and the table details are also displayed on the host computer.

[0099] The adapter cards at the DUT connections 1 to m are all involved in the first installation or replacement of the adapter card. For example, at the position of the DUT connector 5, it is necessary to install the adapter card for the first time or replace the installed adapter card. Before installing the adapter card, the QR code of the adapter card will be scanned in the scanning frame 5. After scanning the code, the adapter card will be installed at the position corresponding to the DUT connector 5. Before the actual boundary scan test, the host computer first sends a command to read the EEPROM to the adapter card life management control board through USB to serial communication. At this time, the signal of IO_X5 of the main control chip of the adapter card life management control board is valid, connecting the EERPOM5 of the adapter card 5. The adapter card life management control board reads the adapter card number information in the EERPOM5 of the adapter card 5 through the I2C of the main control chip, and the read adapter card number information is uploaded to the host computer and compared with the adapter card number information currently scanned and entered into the host computer. If the numbers are the same, it means that the adapter card QR code is consistent with the installed position; otherwise, a message indicating that the installation position of the adapter card does not match the scanned code entry will be prompted, and at the same time, the boundary scan test is not allowed to start. The codes of each adapter card are different, so it can prevent the phenomenon of random installation of adapter cards by the client, ensure that the client will not install incorrectly, and the life of the adapter card can also be effectively managed.

[0100] The specific implementation method of life management is as follows:

[0101] For the adapter cards 1 to m where the DUT connectors J1 and Jm are located, if m = 8 and n = 16, that is, the number of adapter cards in the boundary scan chain is 8, respectively turn on K11 of the DIP switch group 1, K22 of the DIP switch group 2, K33 of the DIP switch group 3, and so on... until K88 of the DIP switch group 8 is turned on, then the EEPROM1 to EEPROM8 corresponding to the double-pole double-throw relays 1 to 8 can be controlled in sequence through IO_X1 to IO_X8 of the life management control board.

[0102] Step 1: After the signal feedback of the real plug-and-unplug optoelectronic sensor is sent to the life management control board, it is clear which adapter cards have been really plugged and unplugged. For example, adapter cards 1 to 8 have been plugged and unplugged simultaneously once.

[0103] Step 2: The information that adapter cards 1 to 8 have been plugged and unplugged simultaneously once is fed back to the host computer through USB-to-serial communication. After receiving the signal, the host computer increments the count of each adapter card by 1.

[0104] Step 3: The host computer sends an EEPROM life management command to the life management control board.

[0105] Step 4: The life management control board accesses EEPROM1 through I2C communication controlled by IO_X1 of the life management control board, and reads the current fixture ID and boundary scan chain information of EEPROM1.

[0106] If the information in this part of EEPROM1 is all zeros (before using a new card, the supplier enters the unique code of the adapter card, the adapter card number, the production date, the initial use date, the transfer card type, and the transfer card function information, and clears all other storage areas to 0), it indicates a new card. Then, through the USB-to-serial communication of the host computer, the current fixture ID and boundary scan chain information are respectively written into the specified allocated storage area of EEPROM1, and the life count of EEPROM1 of adapter card 1 on the host computer is updated.

[0107] If there is current fixture ID and boundary scan chain information, that is, not all zeros, it indicates an old card. At this time, it is necessary to compare the fixture IDs. If the read fixture ID is the same as the current fixture ID, it means that adapter card 1 was last used on the current fixture and is now reinstalled on this fixture for continued use. At this time, a write operation is performed on EEPROM1, incrementing the usage count of the current connector under test by 1 and the total count by 1. Through such management, the usage counts of adapter card 1 on different connectors under test on the current fixture are all counted, and the usage count and total usage count on the current connector under test J1 are known.

[0108] If the read fixture ID is different from the current fixture ID, it means that adapter card 1 was last used on other parallel fixtures and is now reinstalled on the current fixture for continued use. At this time, a write operation is performed on EEPROM1 to record the total number of times the adapter card was used before on the original fixture, and increment the plug-and-unplug count of the current connector under test position by 1 and the total count by 1. Through such management, not only the usage count and total usage count on the current connector under test J1 are known, but also the number of times adapter card 1 was plugged and unplugged before being used on the original fixture is clearly counted.

[0109] Step 5: The life management control board controls the I2C to access EEPROM2 through IO_X2, and reads the current fixture ID and boundary scan chain information of EEPROM2.

[0110] Analogous to the process of Step 4, if the information in this part of EEPROM2 is all zeros (before the new card is used, the supplier enters the unique code of the adapter card, the adapter card number, the production date, the initial use date, the adapter card type, and the adapter card function information, and clears all other storage areas to 0), it indicates a new card. Then, through the host computer's USB-to-serial communication, the current fixture ID and boundary scan chain information are respectively written into the specified storage areas allocated by EEPROM2, and the life count of EEPROM2 of adapter card 2 in the host computer is updated.

[0111] If there is the current fixture ID and boundary scan chain information, it indicates an old card. At this time, the ID of the fixture needs to be compared.

[0112] If the read fixture ID is the same as the current fixture ID, it indicates that adapter card 2 was last used on the current fixture and is now reinstalled on this fixture for continued use. At this time, a write operation is performed on EEPROM2, the usage count of the current DUT connector is incremented by 1, and the total count is incremented by 1. Through such management, the usage counts of adapter card 2 on different DUT connectors of the current fixture are all counted, and the usage count and total usage count on the current DUT connector J2 are known.

[0113] If the read fixture ID is different from the current fixture ID, it indicates that adapter card 2 was last used on other parallel fixtures and is now reinstalled on the current fixture for continued use. At this time, a write operation is performed on EEPROM2, the total usage count before the adapter card was used on the original fixture is recorded, and the plugging and unplugging count of the current DUT connector position is incremented by 1, and the total count is incremented by 1.

[0114] Step 6: Follow Steps 4 and 5.

[0115] And so on...

[0116] Step 11: If the information in this part of EEPROM8 is all 0 (before the new card is used, the supplier enters the unique code of the adapter card, the adapter card number, the production date, the initial use date, the adapter card type, and the adapter card function information, and clears all other storage areas to 0), it indicates a new card. Then, through the host computer's USB-to-serial communication, the current fixture ID and boundary scan chain information are respectively written into the specified storage areas allocated by EEPROM8, and the life count of EEPROM8 of adapter card 8 in the host computer is updated.

[0117] If there is the current fixture ID and boundary scan chain information, it indicates an old card. At this time, the ID of the fixture needs to be compared.

[0118] If the fixture ID read is the same as the current fixture ID, it indicates that the adapter card 8 was last used on the current fixture and is now reinstalled on this fixture for continued use. At this time, a write operation is performed on the EEPROM 8, incrementing the usage count of the current DUT connector by 1 and the total count by 1. Through such management, the usage counts of the adapter card 8 on different DUT connectors of the current fixture are tallied, and the usage count and total usage count of the current DUT connector J2 are known.

[0119] If the fixture ID read is different from the current fixture ID, it indicates that the adapter card 8 was last used on other parallel fixtures and is now reinstalled on the current fixture for continued use. At this time, a write operation is performed on the EEPROM 8 to record the total usage count of the adapter card before it was used on the original fixture, and the insertion / removal count of the current DUT connector position is incremented by 1, as well as the total count by 1.

[0120] The above tallies the lifespan statistics of the adapter card for one round of boundary scan testing. During the automated testing process, the actions in steps 1 to 11 are continuously repeated to perform real-time statistics on the adapter card.

[0121] To prevent the impact of lifespan data statistics on the stability of boundary scan testing, which involves the interaction between the boundary scan controller and the main control board, this part can also use IO interaction. Each round of boundary scan statistics will be performed after the boundary scan testing is completed. And during the boundary scan testing process, the single-pole double-throw relays 1 and 2 of the lifespan management control board are in the off state and are only turned on during the adapter card lifespan statistics. The testing of the fixture involves an automated process. After the boundary scan testing of 1 DUT board is completed, there are fixture actions and board placement actions to be completed, and there is at least 20 seconds during which the boundary scan testing of the DUT board is not performed. At this time, the above EEPROM read / write can be executed to complete the lifespan statistics management.

[0122] It is impossible for double-pole double-throw relays 1 to m to be controlled by m of the n IOs of the life management control board without errors forever. For example, double-pole double-throw relays 1 to 8 are controlled by IO_X1 to IO_X8 respectively. There are 8 adapter cards on a boundary scan chain. Every time adapter cards 1 to 8 are plugged in and out, life statistics are performed respectively. One round of statistics needs to control IO_X1 to IO_X8 in sequence, and then turn on EEPROM1 to EEPROM8 in sequence, and count once in sequence. There are the following abnormal situations: Situation 1, such as: the control line where IO_X5 is located is disconnected, EEPROM5 is not controlled, then EEPROM5 fault is reported, and the storage data of EEPROM5 will not change, so there is no problem with management, only need to be repaired, the second situation will be more It is tricky, such as: EEPROM1 to EEPROM4 corresponding to IO_X1 to IO_X4 can read and write normally, but when IO_X5 controls the double-pole double-throw relay 5, the double-pole double-throw relay 5 does not work properly and is always connected to the normally open end. Then EEPROM5 is always connected to the I2C bus of the life management control board. In the next step, when IO_X6 controls the double-pole double-throw relay 6 to be turned on, EEPROM6 is connected to the I2C bus of the life management control board. At this time, EEPROM5 and EEPROM6 are both connected to the I2C bus at the same time, and the address device addresses of EEPROM5 and EEPROM6 are connected to GND, which are consistent. Therefore, there will be confusion in reading and writing. If the wrong number of lifespans is written into the EEPROM and overwritten, it will be irreversible.

[0123] For the second situation, in order to solve this problem, you can use software to prevent foolishness and avoid random writing. The host computer needs to record the life cycle information and cooperate with EEPROM reading and writing. The foolproof method is as follows:

[0124] According to the process of life management statistics, the host computer first obtains the information of the adapter card life count + 1 and then synchronously updates the life information stored in the EEPROM. Therefore, the life count information of the EEPROM can only be at most 1 time less than the life count information counted by the host computer. If a round of life statistics is performed after the boundary scan test is completed, if there is an adapter card, such as adapter card 5, if the life count of the read EEPROM is greater than 1 time or less than 1 time than the life count counted by the host computer, no data will be written to the EEPROM, the EEPROM data will be maintained unchanged, and the life management fault of adapter card 5 will be reported, and timely maintenance will be carried out. After the maintenance is completed, the life statistics will be performed again.

[0125] In addition, power-off anti-fooling and interruption anti-fooling need to be considered. The host computer first obtains the transfer card life count +1. At this time, the +1 is a temporary record +1. The data of +1 is placed in an additional file of the host computer. Only when the transfer card life count +1 is obtained and the corresponding EEPROM data is correctly written, will the transfer card life count +1 information be updated to the official form file and displayed on the host computer. In this way, no matter what, the life count of the host computer is synchronized with the EEPROM, and it also supports the interruption anti-fooling in the second case where the EEPROM is not written due to an error.

[0126] After all, the process that needs anti-fooling occurs accidentally. For the number of service life times of the transfer card, several statistical errors have little impact.

[0127] The transfer card is a consumable item, which involves long-term life management and replacement. In fact, transfer cards 1 to m of the present invention are variable and are general references, not specifically referring to transfer cards 1 to m. Different transfer cards are determined by their respective different transfer card numbers. The number of transfer card 1 can be any name, such as B8. As long as it is connected to the position corresponding to the connector under test, it is considered transfer card 1; different from the connectors under test J1 and Jm, the connectors under test J1 and Jm are specific because the positions of the connectors under test J1 and Jm are fixed.

[0128] Table 1 Statistical Information Table of Transfer Card Life Management System

[0129]

[0130] Table 1 is the statistical information table of the transfer card life management system of the embodiment of the present invention. Table 1 summarizes the statistical results of the life management system, which are displayed on the host computer and recorded in the text or table file of the host computer. These information will also be synchronized to the corresponding EEPROM. As can be seen from Table 1, the current fixture ID is: B2310100052; the boundary scan chain is: CHAIN_DUMMY; the unique code of the transfer card is: 1100101001010011; the transfer card numbers are: B8, A3, B15... B6, corresponding to transfer cards 1 to transfer card m described above in sequence. The number of the transfer card on the fixture can be arbitrary, but the number of each transfer card is unique to ensure the freedom of installation and replacement; the production dates of the transfer cards are respectively: 2023-12-06, 2023-12-06, 2022-12-06,... 2023-12-06; the initial use dates are respectively: 2024-03-22, 2024-03-22, 2022-06-10,... 2024-03-22; the transfer card types are all DDR5, indicating the same transfer card; the function of the transfer card is: BST (Boundary Scan Test).

[0131] The above is the basic information of each adapter card. The unique code and serial number of the adapter card are described above and are the key information for implementing the adapter card life management method. The current fixture ID information indicates that the current adapter card is used on the current fixture. When the adapter card is cross-used on other parallel fixtures, the original fixture ID can still be read according to the constrained rules, which is the key information for cross-fixture life statistics. The adapter card is used on a boundary scan chain. It is stipulated that this table is statistically counted in units of the boundary scan chain. Other production dates, initial use dates, adapter card types, and functions are used to assist in the management of the life system.

[0132] As shown in the table, the real-time test positions of each adapter card are sequentially recorded as J1, J2, J3, … Jm, which correspond one-to-one with the DUT connectors J1 to Jm of the embodiment of the present invention, indicating the relative positions where each adapter card is installed.

[0133] The total real-time usage times information of each adapter card describes the total number of plugging and unplugging times of each card. It is the sum of the test times of adapter cards with different serial numbers at each connector J1, J2, J3, … Jk of the current fixture and the total usage times of the original fixture and previous uses, where k ≥ m. This is because the table only considers the case of one boundary scan chain, and there may be a second boundary scan chain on the fixture. k represents that there are k adapter cards on the fixture, and there may also be a situation of cross-use of the same adapter card on different chains of the current fixture before. Therefore, it needs to be statistically counted.

[0134] Generally, adapter cards of the same type may be randomly replaced. The present invention supports arbitrary replacement, but the QR code must be scanned first to count the usage times at each DUT connector J1 to Jm on the current fixture to ensure that the adapter card life management is error-free and not chaotic.

[0135] Now analyze each adapter card. If the normal life of each adapter card is 5000 times.

[0136] First, for the adapter card coded B8, it is statistically counted that it has been used 1089 times at the position of DUT connector J3 of the current fixture and 876 times at the position of the currently in-use DUT connector J1, with a total usage of 1965 times. It has not reached the normal service life yet. Therefore, the B8 adapter card is used normally.

[0137] Then analyze the adapter card coded A3. The total usage times of the original test fixture with fixture ID: A2208263578 and previous uses is 1287 times, and it has been used 101 times at the position of the currently in-use DUT connector J2, with a total usage of 1388 times. It has not reached the normal service life yet. Therefore, the A3 adapter card is used normally.

[0138] Although the adapter cards of the above adapter card B8 or A3 are in normal use, there may be unstable test phenomena. For example, the boundary scan test of the adapter card often fails. At this time, through the life management statistical table of the adapter card, it can be known that the adapter card becomes unstable before its normal life expires. At this time, it is necessary to trace the root cause and check the connection positions to be tested that have been used. Find the root cause that affects the life of the adapter card on the jig. It may be caused by the incomplete alignment of the installation position of the adapter card, or it may be caused by the interference of the structure, which affects the service life of the adapter card due to long-term friction. Only by starting from the jig to completely solve the problem, will it not affect the normal service life of the newly installed adapter card after installing a new adapter card.

[0139] Analyze the adapter card coded as B1 again. It is statistically used 5000 times at the position of the connector J3 to be tested in the currently used fixture. When the normal service life expires, it will remind to replace the B1 adapter card where it is located. Otherwise, it may affect the stability of the boundary scan test.

[0140] Finally, analyze the adapter card coded as B6. It is statistically used 126 times at the position of the connector J1 to be tested in the current fixture.

[0141] It is used 3872 times at the position of the connector J2 to be tested in the current fixture and 1002 times at the position of the connector Jm to be tested in the currently used fixture, for a total of 5000 times. When the normal service life expires, it will also remind to replace the B6 adapter card where it is located. Otherwise, it may affect the stability of the boundary scan test.

[0142] The above is a boundary scan chain adapter card life management system and method. If there are two or more boundary scan chains that need to manage the life of the adapter card, it can be implemented in parallel according to the same method.

[0143] To achieve the above object, as Figure 5 shown, the present invention also provides a method for improving the service life of an adapter card applicable to boundary scan testing. The processing method is applied to the adapter card service life improvement processing system; the method includes the following steps:

[0144] S1. Feed back the information of plugging and unplugging at least two adapter cards at the same time to the host computer through USB to serial communication. After receiving the signal, the host computer performs counting processing on each adapter card;

[0145] S2. The host computer sends the life management command in the first control chip to the adapter card life processing control board;

[0146] S3. The adapter card life processing control board controls the I2C communication to access the first control chip through IO_X1 and reads the current fixture ID and boundary scan chain information of the first control chip;

[0147] S4. Based on the current fixture ID and boundary scan chain information, determine whether the current adapter has been used, and record the total number of times the adapter was used before the original fixture.

[0148] The method steps involved in the embodiment of the method solution of the present invention have been described in detail above and will not be elaborated here.

[0149] The present invention provides a processing system for improving the service life of an adapter applicable to boundary scan testing. Among them, the system includes at least one boundary scan controller and a host computer communicating with the boundary scan controller; on one side of the boundary scan controller, at least one boundary scan simulation detection card is electrically connected; on the other side of the boundary scan controller, an adapter life processing control board is electrically connected; the boundary scan simulation detection card is plugged into at least one adapter through a gold finger; the adapter is automatically docked with the board under test through a gold finger, and the docking action is automatically controlled by the adapter life processing control board; a first control chip for realizing the life management of the adapter is provided in the adapter, and a method for improving the service life of the adapter can effectively improve the service life of the adapter.

[0150] That is to say, through the life management of the adapter in the solution of the present invention, random replacement on site can be eliminated, and anti-fooling for adapter replacement can be achieved. The replacement of the adapter by on-site operators is also effectively managed to ensure that there are no errors during operation and replacement. In addition, through the solution of the present invention, the usage details of each adapter can be counted, specifically: considering cross-usage situations, the number of times each adapter is used at each parallel connector under test on the same fixture, the number of times each adapter is used on the previous parallel fixture, and the total number of times the adapter is used. In addition, for the life management of the adapter, on the one hand, for any adapter, the usage details of the adapter can be viewed in real time. When the life of the adapter expires, a prompt for replacing the adapter is given in a timely manner. On the other hand, if the long-term test fails at any adapter, an abnormal usage prompt is given, indicating that the fixture needs to be repaired.

[0151] The above embodiments only represent several implementation manners of the present invention. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the patent of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several deformations and improvements can still be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention should be subject to the appended claims.

Claims

1. A processing system for improving the service life of an adapter card suitable for boundary scan testing, the system comprising at least one boundary scan controller and a host computer communicating with the boundary scan controller; characterized in that: One side of the boundary scan controller is electrically connected to at least one boundary scan simulation detection card; the other side of the boundary scan controller is electrically connected to an adapter card life processing control board; The boundary scan simulation detection card is plugged into at least one adapter card through a gold finger; the adapter card is automatically docked with the board to be tested through the gold finger, and the docking action is automatically controlled by the adapter card life processing control board; the adapter card is provided with a first control chip for realizing adapter card life management.

2. The system for improving the service life of an adapter card suitable for boundary scan testing according to claim 1, characterized in that: The adapter card is provided with at least two connectors; One of the connectors is electrically connected to at least one BS chip provided in the boundary scan simulation detection card and at least one connector to be tested provided in the board to be tested respectively through gold fingers; Another connector is electrically connected to the first control chip and the connectors provided in the boundary scan analog detection card respectively.

3. The adapter card service life improvement processing system suitable for boundary scan testing according to claim 1 or 2, characterized in that: The model of the first control chip is AT24C02.

4. The system for improving the service life of an adapter card suitable for boundary scan testing according to claim 1 or 2, characterized in that: A double-pole double-throw relay for controlling signal conduction is provided between the connector in the boundary scan simulation detection card and the adapter card life processing control board; The working state of the double-pole double-throw relay is controlled in real time by a set dial switch group.

5. The system for improving the service life of an adapter card suitable for boundary scan testing according to claim 4, characterized in that: The double-pole double-throw relay model is G6K-2F-Y-TR.

6. The system for improving the service life of an adapter card suitable for boundary scan testing according to claim 1, characterized in that: The JTAG signals between the BS chips are connected in series to form a combination chain and electrically connected to the JTAG drive and receiving pins TCK, TMS, TDI and TDO of the boundary scan controller; wherein the combination chain includes a daisy chain, a serial chain and a cascade chain.

7. The system for improving the service life of an adapter card suitable for boundary scan testing according to claim 1, characterized in that: The boundary scan simulation detection card is electrically connected to the 3.3V power bus and the adapter card life processing control board through a single-pole double-throw relay; The IO1 of the main control chip of the adapter card life processing control board controls whether the single-pole double-throw relay is connected; wherein the model of the single-pole double-throw relay is GAQY212GSX.

8. The system for improving the service life of an adapter card suitable for boundary scan testing according to claim 7, characterized in that: The model of the main control chip of the adapter card life processing control board is STM32F103VCT6.

9. The adapter card service life improvement processing system suitable for boundary scan testing according to claim 1 or 2, characterized in that: At least one QR code is provided in the adapter card; The two-dimensional code is used to count fixed information to the host computer and write it into the first control chip.

10. A method for improving the service life of an adapter card suitable for boundary scan testing, characterized in that: The processing method is applied to the processing system for improving the service life of the adapter card according to any one of claims 1 to 9; the method comprises the following steps: Feedback the information of at least two adapter cards being plugged and unplugged at the same time to the host computer through USB to serial communication, and after receiving the signal, the host computer performs counting processing on each adapter card on the host computer; The host computer sends the life management command in the first control chip to the adapter card life processing control board; The adapter card life processing control board controls I2C communication via IO_X1 to access the first control chip, and reads the current fixture ID and boundary scan chain information of the first control chip; Based on the current fixture ID and boundary scan chain information, determine whether the current adapter card has been used, and record the total number of times the adapter card has been used before the original fixture.

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