Test information transmission method and device, electronic equipment and storage medium

Abstract

The invention provides a test information transmission method and device, electronic equipment and a storage medium, and the method comprises the steps that a test control end generates an interface message according to test information, and the message structure of the interface message comprises a basic message structure part and an extended information structure part corresponding to a new field; and sending the interface message to an adaptation layer, so that the adaptation layer analyzes the interface message to obtain the test information. Through the scheme provided by the invention, decoupling of the script and the instrument adaptation layer interface can be realized, so that unnecessary script development is reduced, extra workload is avoided, and test efficiency is improved when a new field is added to the interface; moreover, when a problem occurs in version upgrading, the script or instrument version can be kept unchanged, the problem range is quickly locked, and project propulsion is accelerated.

Description

Technical Field

[0001] This application relates to the field of testing technologies, and particularly to a method for transmitting test information, an electronic device, a device, and a storage medium. Background Art

[0002] With the rapid development of communication technologies, communication test systems are also facing many new requirements. As an important part of a communication test system, scripts and test instruments cooperate closely. Since scripts and instruments belong to different hardware and have different computer languages, interface adaptation by an adaptation layer is required for their interaction.

[0003] Currently, for the coupling method of the script and instrument interfaces, if a certain script needs to add fields due to new feature interface messages, not only does the adaptation layer need to modify the interface, but other scripts also need to synchronously modify the interface, which will increase the workload and is not conducive to the progress of the project. Summary of the Invention

[0004] Aiming at the problems existing in the prior art, this application provides a method for transmitting test information, an electronic device, a device, and a storage medium.

[0005] In a first aspect, this application provides a method for transmitting test information, which is applied to a test control end and includes:

[0006] Generating an interface message according to test information, where the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the added fields;

[0007] Sending the interface message to the adaptation layer for the adaptation layer to parse the interface message to obtain test information.

[0008] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0009] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0010] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to an added field.

[0011] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0012] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0013] In a second aspect, this application also provides a method for transmitting test information, which is applied to the adaptation layer and includes:

[0014] Receive the interface message sent by the test control end. The message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the added fields;

[0015] Parse the interface message to obtain test information.

[0016] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0017] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0018] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to an added field.

[0019] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0020] In some embodiments, parsing the interface message to obtain test information includes:

[0021] Parse the extended element information part of the interface message, and according to the content indicated by the extended element information part, save the information of each extended element locally;

[0022] Parse the basic message structure part of the interface message, and according to the basic information of each extended element, associate each extended element with the sub-structure that calls the corresponding extended element in the basic message structure part respectively, and combine the information of each extended element and the information of the basic message structure part to obtain the complete test information.

[0023] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0024] In a third aspect, the present application further provides an electronic device, including a memory, a communication interface, and a processor;

[0025] The memory is used to store computer programs; the communication interface is used to transmit data under the control of the processor; the processor is used to read the computer programs in the memory and perform the following operations:

[0026] Generate an interface message according to the test information. The message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the added fields;

[0027] Send the interface message to the adaptation layer for the adaptation layer to parse the interface message to obtain test information.

[0028] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0029] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0030] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to a new field.

[0031] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0032] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0033] In a fourth aspect, the present application also provides an electronic device, including a memory, a communication interface, and a processor;

[0034] The memory is used to store a computer program; the communication interface is used to transmit data under the control of the processor; the processor is used to read the computer program in the memory and perform the following operations:

[0035] Receive an interface message sent by a test control end, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the new field;

[0036] Parse the interface message to obtain test information.

[0037] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0038] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0039] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to a new field.

[0040] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0041] In some embodiments, parsing the interface message to obtain test information includes:

[0042] Parse the extended element information part of the interface message, and according to the content indicated by the extended element information part, save the information of each extended element locally;

[0043] Analyze the basic message structure part of the interface message, and according to the basic information of each extension element, associate each extension element with the sub-structure that calls the corresponding extension element in the basic message structure part, and combine the information of each extension element and the information of the basic message structure part to obtain the complete test information.

[0044] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0045] In a fifth aspect, the present application further provides a test information transmission device, including:

[0046] A message generation unit, configured to generate an interface message according to the test information, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the added fields;

[0047] A sending unit, configured to send the interface message to the adaptation layer for the adaptation layer to parse the interface message to obtain the test information.

[0048] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0049] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0050] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to an added field.

[0051] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0052] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0053] In a sixth aspect, the present application further provides a test information transmission device, including:

[0054] A receiving unit, configured to receive an interface message sent by a test control end, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the added fields;

[0055] An analysis unit, configured to analyze the interface message to obtain the test information.

[0056] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0057] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0058] The extended element part includes the specific information of at least one extended element, and each extended element corresponds to a new field.

[0059] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0060] In some embodiments, parsing the interface message to obtain the test information includes:

[0061] Parsing the extended element information part of the interface message, and saving the information of each extended element locally according to the content indicated by the extended element information part;

[0062] Parsing the basic message structure part of the interface message, and associating each extended element with the sub-structure that calls the corresponding extended element in the basic message structure part according to the basic information of each extended element, and combining the information of each extended element and the information of the basic message structure part to obtain the complete test information.

[0063] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0064] In a seventh aspect, the present application further provides a non-transitory readable storage medium, and the non-transitory readable storage medium stores a computer program, and the computer program is used to cause a processor to execute the test information transmission method described in the first aspect above, or execute the test information transmission method described in the second aspect above.

[0065] In an eighth aspect, the present application further provides a communication device, and the communication device stores a computer program, and the computer program is used to cause the communication device to execute the test information transmission method described in the first aspect above, or execute the test information transmission method described in the second aspect above.

[0066] In a ninth aspect, the present application further provides a processor-readable storage medium, and the processor-readable storage medium stores a computer program, and the computer program is used to cause a processor to execute the test information transmission method described in the first aspect above, or execute the test information transmission method described in the second aspect above.

[0067] In a tenth aspect, the present application further provides a chip product, and the chip product stores a computer program, and the computer program is used to cause the chip product to execute the test information transmission method described in the first aspect above, or execute the test information transmission method described in the second aspect above.

[0068] The test information transmission method, electronic device, device and storage medium provided by this application enable the test control end to transmit test information to the adaptation layer through a new interface message structure. On the basis of retaining part of the original message structure, the information of the newly added fields is carried in the extended information structure part, achieving the decoupling of the script and the instrument adaptation layer interface. When new fields are added to the interface, unnecessary script development can be reduced, extra workload can be avoided, and test efficiency can be improved. Moreover, when problems occur during version upgrade, the script or instrument version can remain unchanged, the problem scope can be quickly locked, and the project progress can be accelerated. Brief Description of the Drawings

[0069] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the following will briefly introduce the drawings required for use in the description of the embodiments or related technologies. Obviously, the following drawings are some embodiments of this application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0070] Figure 1 The communication test system architecture diagram provided by related technologies;

[0071] Figure 2 The schematic diagram of the relationship between the script and the instrument provided by related technologies;

[0072] Figure 3 One of the flow diagrams of the test information transmission method provided by the embodiments of this application;

[0073] Figure 4 The example diagram of the new interface message structure provided by the embodiments of this application;

[0074] Figure 5 The content example diagram of the extended element information part provided by the embodiments of this application;

[0075] Figure 6 The example diagram of the newly added fields in the new interface message provided by the embodiments of this application;

[0076] Figure 7 Another flow diagram of the test information transmission method provided by the embodiments of this application;

[0077] Figure 8 The flow example diagram of the adaptation layer obtaining test information provided by the embodiments of this application;

[0078] Figure 9 One of the structural diagrams of the electronic device provided by the embodiments of this application;

[0079] Figure 10 Another structural diagram of the electronic device provided by the embodiments of this application;

[0080] Figure 11 One of the structural schematic diagrams of the test information transmission device provided by the embodiments of the present application;

[0081] Figure 12 Another structural schematic diagram of the test information transmission device provided by the embodiments of the present application. Detailed implementation manners

[0082] In the embodiments of the present application, the term "and / or" describes the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. The character " / " generally represents an "or" relationship between the associated objects before and after.

[0083] In the embodiments of the present application, the term "a plurality of" means two or more, and other quantifiers are similar thereto.

[0084] In the embodiments of the present application, terms such as "first" and "second" are used to distinguish similar objects, rather than to describe a specific order or sequence. It should be understood that such terms can be interchanged under appropriate circumstances, so that the embodiments of the present application can be implemented in an order other than those illustrated or described herein, and the objects distinguished by "first" and "second" are usually of the same type, and the number of objects is not limited. For example, the first object can be one or multiple.

[0085] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present application.

[0086] To facilitate a clearer understanding of the technical solutions of the embodiments of the present application, some technical contents related to the embodiments of the present application will be introduced first.

[0087] Protocol test cases are test case sets formulated by international standard organizations or major domestic operators for testing various intelligent devices, chips, etc. In specific implementation, the test case set is written through scripts; then, the parameters are configured to the instrument protocol stack system through script operation, thereby simulating various test scenarios in the actual network. Based on this implementation method, a basic communication test system is formed. Figure 1 The communication test system architecture diagram provided by the related technology is as Figure 1 shown. The test system includes a test control end (deployed with scripts) and an instrument (the device to be tested). Since the scripts and the instrument belong to different hardware and have different computer languages, interface adaptation by an adaptation layer is required for their interaction.

[0088] Figure 2 Schematic diagram of the relationship between the script and the instrument provided for the related technology, as Figure 2 shown. Due to different emphases of the scripts, there is a situation where there are multiple sets of scripts while sharing a single protocol stack. This situation requires that all script interfaces must also be consistent. However, in the existing solutions, the element content of the script and the adapter layer interface is fixed. When new fields are added, the entire bitstream will change. If a certain script needs to add new fields due to new feature interface messages, not only the adapter layer needs to modify the interface, but other scripts also need to synchronously modify the interface. In this case, the workload increases, which is not conducive to the progress of the project.

[0089] In addition, theoretically, there are four combination situations for the interface between the script and the adapter layer (see Table 1 below). Since the interface elements are fixed, when the interface changes during the upgrade of the test system, the script and the adapter layer must be upgraded in combination (Situations 1 - 4). In this case, there are 2 variables, and it is impossible to determine whether the problem is with the script or the instrument when a problem occurs.

[0090] Table 1 Interface combinations between the script and the adapter layer

[0091] Adapter Layer Interface X Adapter Layer Interface Y Script Interface X Case 1 Case 2 Script Interface Y Case 3 Case 4

[0092] Therefore, it is necessary to decouple the interface between the script and the instrument adapter layer. By proposing a new interface message structure in this application, it is possible to achieve the decoupling of the interface between the script and the instrument adapter layer, reduce unnecessary script development when adding new fields to the interface, and avoid additional workload; and when problems occur during version upgrade, the script or instrument version can be kept unchanged to quickly lock down the problem scope.

[0093] Figure 3 One of the flow schematic diagrams of the test information transmission method provided for the embodiments of this application. This method is applied to the test control end, as Figure 3 shown. This method includes the following steps:

[0094] Step 300: Generate an interface message according to the test information. The message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the new fields.

[0095] Step 301: Send the interface message to the adapter layer for the adapter layer to parse the interface message to obtain the test information.

[0096] Specifically, the test information is used to control and configure the test behavior on the instrument side to complete the required test tasks. The test information can include various parameters, instructions, configuration information, etc. The test information can be customized according to specific test requirements and system configurations to ensure that the instrument side can perform corresponding test operations as expected and generate accurate test results.

[0097] The message structure of the new interface message proposed in this application includes a basic message structure part and an extended information structure part corresponding to the new fields. The basic message structure can be understood as an existing message structure, or it can be called the original message structure. Based on this basic message structure, an extended information structure is designed. This part of the structure is used to carry the information of the new fields. In this way, the requirements of the new fields can be met without changing the original message structure. In this solution, if a certain script needs to add new fields to the interface message, only the extended information structure part needs to be modified. Since there are no new fields in the original message structure part, the interfaces of other scripts and the instrument adaptation layer do not need to be modified significantly, thus realizing the decoupling of the script and the instrument adaptation layer interface.

[0098] It should be understood that the solution for decoupling the script and the instrument adaptation layer interface proposed in this application can be applied not only to communication test systems, but also to other test systems with similar architectures.

[0099] In some embodiments, in the message structure of the new interface message, the extended information structure part is located after the basic message structure part. For example, keeping the original message structure unchanged, only adding an extended information structure part behind the tail of the original message structure to avoid affecting other interfaces.

[0100] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0101] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0102] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to a new field.

[0103] Figure 4 This is a schematic diagram of the new interface message structure provided by the embodiments of this application. As Figure 4 shown, in this example solution, the original message structure remains unchanged, and only an extended information structure part is added behind the tail of the original message structure. The extended information structure part includes two parts: extended element information and extended elements. The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element. Immediately after the extended element information part are the specific extended elements. Each extended element corresponds to a new field, and the part of each extended element contains the specific information of a new field.

[0104] The extended information structure part including the extended element information part and the extended element part is beneficial for the adaptation layer to quickly obtain the relevant information of the extended elements during parsing and improve the accuracy of parsing.

[0105] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0106] Figure 5 This is a content example diagram of the extended element information part provided by the embodiments of this application. As Figure 5 shown, when new fields need to be added to the message structure due to feature development, multiple scripts need to be considered. Based on this, the design of this application is that the original message structure remains unchanged, and then the new fields are placed in the extended element part. Since there may be more than one extended element, the extended element information part is added. The extended element information part is used to record the number of extended elements and the basic information of the extended elements. The basic information of the extended elements includes:

[0107] (1) The name of the extended element: That is, the name of the new field, which is used to associate with the original message structure.

[0108] (2) The use of the extended element: The new field may be called by different sub-structures, so a use indication needs to be added. The use of the extended element refers to which sub-structures call this extended element (new field). In this application, the sub-structure refers to the subdivided structural unit included in the basic message structure part. For example, Figure 6 the sub-structure A, sub-structure B, sub-structure X, sub-structure Y shown in it are all sub-structures of the original message structure (i.e., the basic message structure part).

[0109] (3) The number of times the extended element is called: The new field may be called by different sub-structures multiple times, so information on the number of times it is called needs to be added. The number of times the extended element is called refers to the number of times this extended element (new field) is called by one or more sub-structures respectively.

[0110] Figure 6 This is an example diagram of the new fields in the new interface message provided by the embodiments of this application. As Figure 6 shown, assume that the sub-structure A in the original message structure needs to add a new field P, the sub-structure B needs to add a new field Q, and the common structure X of A and B needs to add a new field X1. Then the new interface message includes three parts as Figure 6 shown, specifically as follows:

[0111] (1) The original message structure: Remains unchanged.

[0112] (2) Extended element information: The number of extended elements is 3, and the basic information of each extended element is shown in Table 2 below:

[0113] Table 2 Values of the basic information of the extended elements

[0114]

[0115] (3) Expansion element: specific expansion element.

[0116] In the test information transmission method provided by the embodiments of this application, the test control end transmits test information to the adaptation layer through the new interface message structure. On the basis of retaining part of the original message structure, the information of the newly added fields is carried in the extended information structure part, realizing the decoupling of the script and the instrument adaptation layer interface. When new fields are added to the interface, unnecessary script development can be reduced, extra workload can be avoided, and test efficiency can be improved. Moreover, when problems occur during version upgrade, the script or instrument version can remain unchanged, the problem scope can be quickly locked, and the project progress can be accelerated.

[0117] Figure 7 This is the second flow schematic diagram of the test information transmission method provided by the embodiments of this application. This method is applied to the adaptation layer, as Figure 7 shown, and this method includes the following steps:

[0118] Step 700: Receive the interface message sent by the test control end. The message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the newly added fields.

[0119] Step 701: Parse the interface message to obtain the test information.

[0120] Specifically, the message structure of the new interface message proposed in this application includes a basic message structure part and an extended information structure part corresponding to the newly added fields. The basic message structure can be understood as the existing message structure, or can be called the original message structure. On the basis of this basic message structure, an extended information structure is designed. This part of the structure is used to carry the information of the newly added fields. In this way, the requirements of the newly added fields can be met without changing the original message structure. In this solution, if a certain script needs to add new fields to the interface message, only the extended information structure part needs to be modified. Since there are no newly added fields in the original message structure part, the interfaces between other scripts and the adaptation layer do not need to be modified significantly, thus realizing the decoupling of the script and the instrument adaptation layer interface.

[0121] The test control end fills in the interface message according to the new message structure and sends the interface message to the adaptation layer. After receiving the interface message, the adaptation layer parses and processes the interface message to obtain the test information transmitted in the interface message. The adaptation layer can parse the basic message structure part and the extended information structure part respectively, and then combine the two parts of the content to obtain the complete test information.

[0122] It should be understood that the solution for decoupling the script and the instrument adaptation layer interface proposed in this application is not only applicable to communication test systems, but also applicable to other test systems with similar architectures.

[0123] In some embodiments, in the message structure of the new interface message, the extended information structure part is located after the basic message structure part. For example, keeping the original message structure unchanged, only add the extended information structure part behind the tail of the original message structure to avoid affecting other interfaces.

[0124] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0125] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0126] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to a newly added field.

[0127] The extended information structure part including the extended element information part and the extended element part is beneficial for the adaptation layer to quickly obtain the relevant information of the extended elements during parsing and improve the parsing accuracy.

[0128] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0129] The name of the extended element: that is, the name of the newly added field, which is used to be associated with the original message structure.

[0130] The use of the extended element: The newly added field may be called by different sub-structures, so it is necessary to add a use indication. The use of the extended element refers to which sub-structures the extended element (newly added field) is called by.

[0131] The number of times the extended element is called: The newly added field may be called by different sub-structures multiple times, so it is necessary to add the information of the number of times it is called. The number of times the extended element is called refers to the number of times the extended element (newly added field) is called by one or more sub-structures respectively.

[0132] In some embodiments, parsing the interface message to obtain test information includes:

[0133] Parsing the extended element information part of the interface message, and saving the information of each extended element locally according to the content indicated by the extended element information part;

[0134] Parsing the basic message structure part of the interface message, and associating each extended element with the sub-structure in the basic message structure part that calls the corresponding extended element according to the basic information of each extended element, and combining the information of each extended element and the information of the basic message structure part to obtain the complete test information.

[0135] Specifically, in some embodiments, when the adaptation layer performs parsing and processing, it first skips the basic message structure part and parses out the extended element information part. Since the extended element information part indicates the number of extended elements and the basic information of each extended element, the content indicated by the extended element information part can be used to locate each extended element, and the information of these extended elements is saved locally.

[0136] Then, the adaptation layer parses the basic message structure part of the interface message. Since each extended element is called by one or more sub-structures in the basic message structure, there is a certain association relationship between the extended element and the sub-structures in the basic message structure. The adaptation layer associates each extended element with the corresponding sub-structure (i.e., the sub-structure that calls the extended element) respectively. Finally, the complete test information can be obtained by combining the information of each extended element and the information of the basic message structure part.

[0137] Figure 8 This is a flow example diagram of the adaptation layer obtaining test information provided by the embodiments of the present application. As Figure 8 shown, its main process includes:

[0138] 1. Receive and store the content of the new interface message.

[0139] 2. Skip the original message structure part and parse the extended element information structure.

[0140] 3. Store each extended element locally according to the content indicated by the extended element information structure.

[0141] 4. Parse the original message structure and combine it with the above extended elements to obtain the complete information. Since the extended element is an extension of some sub-structures in the original message structure, when parsing these sub-structures, it is possible to check whether the extended element exists. If it exists, these sub-structures are associated with the corresponding extended elements, and then the complete test information is obtained. Since the extended elements used in different scripts are flexible, different scripts can coexist with a protocol stack in this way, solving the problem that all scripts must change the interface during upgrade.

[0142] In the test information transmission method provided by the embodiments of the present application, the test control end transmits the test information to the adaptation layer through the new interface message structure. On the basis of retaining the original message structure part, the information of the newly added fields is carried in the extended information structure part, realizing the decoupling of the script and the instrument adaptation layer interface. When new fields are added to the interface, unnecessary script development can be reduced, avoiding extra workload and improving test efficiency; and when problems occur during version upgrade, the script or instrument version can also remain unchanged, quickly locking the problem scope and accelerating the project progress.

[0143] The methods and apparatuses provided in the embodiments of the present application are based on the same inventive concept. Since the principles for the methods and apparatuses to solve problems are similar, the implementations of the apparatus and the method can be referred to each other, and the repeated parts will not be described again.

[0144] Figure 9 FIG. 4 is one of the schematic structural diagrams of the electronic device provided in the embodiments of the present application. As Figure 9 shown, the electronic device may include: a processor 910, a communications interface 920, a memory 930, and a communication bus 940. Among them, the processor 910, the communications interface 920, and the memory 930 complete the communication with each other through the communication bus 940. The communications interface 920 is used to transmit data under the control of the processor 910. The processor 910 may call the logic instructions in the memory 930 to execute any of the test information transmission methods provided in the above embodiments. For example: generating an interface message according to the test information, where the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the new fields; sending the interface message to the adaptation layer for the adaptation layer to parse the interface message to obtain the test information.

[0145] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0146] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0147] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to a new field.

[0148] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0149] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0150] In addition, when the logical instructions in the above-mentioned memory 930 are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of this application. The aforementioned storage medium includes: various media such as USB flash drives, mobile hard disks, read-only memories (ROMs), random access memories (RAMs), magnetic disks, or optical discs that can store program codes.

[0151] Figure 10 This is the second structural schematic diagram of the electronic device provided by the embodiments of this application. As Figure 10 shown, the electronic device may include: a processor 1010, a communications interface 1020, a memory 1030, and a communication bus 1040. Among them, the processor 1010, the communications interface 1020, and the memory 1030 complete mutual communication through the communication bus 1040. The communications interface 1020 is used to transmit data under the control of the processor 1010. The processor 1010 can call the logical instructions in the memory 1030 to execute any one of the test information transfer methods provided in the above-mentioned various embodiments. For example: receiving an interface message sent by a test control terminal, where the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the added fields; parsing the interface message to obtain test information.

[0152] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0153] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0154] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to an added field.

[0155] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0156] In some embodiments, parsing the interface message to obtain test information includes:

[0157] Parse the extended element information part of the interface message, and save the information of each extended element locally according to the content indicated by the extended element information part;

[0158] Parse the basic message structure part of the interface message, and associate each extended element with the sub-structure that calls the corresponding extended element in the basic message structure part according to the basic information of each extended element, and obtain the complete test information by combining the information of each extended element and the information of the basic message structure part.

[0159] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0160] In addition, when the logical instructions in the above-mentioned memory 1030 are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or a part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present application. The foregoing storage medium includes: various media such as USB flash drives, mobile hard disks, read-only memories (ROM, Read-Only Memory), random access memories (RAM, Random Access Memory), magnetic disks, or optical discs that can store program codes.

[0161] It should be noted here that the above-mentioned electronic device provided by the embodiments of the present application can implement all the method steps implemented by the above-mentioned method embodiments, and can achieve the same technical effects. The same parts and beneficial effects as those in the method embodiments will not be specifically described in this embodiment.

[0162] Figure 11 FIG. is one of the structural schematic diagrams of the test information transmission device provided by the embodiments of the present application. As Figure 11 shown, the device includes:

[0163] A message generation unit 1100, configured to generate an interface message according to test information, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the added fields;

[0164] A sending unit 1110, configured to send the interface message to the adaptation layer for the adaptation layer to parse the interface message to obtain test information.

[0165] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0166] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0167] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to a new field.

[0168] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0169] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0170] Figure 12 This is the second structural schematic diagram of the test information transmission device provided by the embodiments of the present application. As Figure 12 shown, the device includes:

[0171] A receiving unit 1200, configured to receive an interface message sent by a test control end, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the new field;

[0172] A parsing unit 1210, configured to parse the interface message to obtain test information.

[0173] In some embodiments, the extended information structure part includes an extended element information part and an extended element part;

[0174] The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element;

[0175] The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to a new field.

[0176] In some embodiments, the basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

[0177] In some embodiments, parsing the interface message to obtain test information includes:

[0178] Parsing the extended element information part of the interface message, and according to the content indicated by the extended element information part, saving the information of each extended element locally;

[0179] Parse the basic message structure part of the interface message, and according to the basic information of each extension element, associate each extension element with the sub-structure that calls the corresponding extension element in the basic message structure part, and obtain the complete test information by combining the information of each extension element and the information of the basic message structure part.

[0180] In some embodiments, in the message structure, the extended information structure part is located after the basic message structure part.

[0181] It should be noted that the division of units in the embodiments of the present application is illustrative, only a logical function division, and there may be other division methods in actual implementation. In addition, in each embodiment of the present application, each functional unit may be integrated in a processing unit, or each unit may exist physically alone, or two or more units may be integrated in one unit. The above integrated unit may be implemented in the form of hardware or in the form of a software functional unit.

[0182] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a processor-readable storage medium. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) or a processor to execute all or part of the steps of the methods described in the embodiments of the present application. The aforementioned storage medium includes: USB flash drives, mobile hard disks, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks, etc., which can store program codes.

[0183] It should be noted here that the above device provided in the embodiments of the present application can implement all the method steps implemented in the above method embodiments, and can achieve the same technical effects. The same parts and beneficial effects as those in the method embodiments will not be specifically described in this embodiment.

[0184] On the other hand, the embodiments of the present application also provide a non-transitory readable storage medium, and the non-transitory readable storage medium stores a computer program, and the computer program is used to cause a processor to execute the test information transmission method provided in each embodiment of the above test control end.

[0185] It should be noted here that the non-transitory readable storage medium provided by the embodiments of the present application can implement all the method steps implemented by the method embodiments of the above test control end, and can achieve the same technical effects. Therefore, the same parts and beneficial effects as those in the method embodiments will not be specifically described herein.

[0186] On the other hand, the embodiments of the present application also provide a non-transitory readable storage medium, which stores a computer program for causing a processor to execute the test information transmission method provided by the embodiments of the above adaptation layer.

[0187] It should be noted here that the non-transitory readable storage medium provided by the embodiments of the present application can implement all the method steps implemented by the method embodiments of the above adaptation layer, and can achieve the same technical effects. Therefore, the same parts and beneficial effects as those in the method embodiments will not be specifically described herein.

[0188] The non-transitory readable storage medium may be any available medium or data storage device accessible by a computer, including but not limited to magnetic memories (such as floppy disks, hard disks, magnetic tapes, magneto-optical disks (MO), etc.), optical memories (such as CDs, DVDs, BDs, HVDs, etc.), and semiconductor memories (such as ROMs, EPROMs, EEPROMs, non-volatile memories (NANDFLASH), solid state drives (SSD)).

[0189] Those skilled in the art should understand that the embodiments of the present application can be provided as a method, a system, or a computer program product. Therefore, the present application can take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk memories and optical memories, etc.) containing computer-usable program code.

[0190] The present application is described with reference to the flowcharts and / or block diagrams of methods, apparatuses (systems), and computer program products according to the embodiments of the present application. It should be understood that each flow and / or block in the flowcharts and / or block diagrams, and the combination of flows and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer-executable instructions. These computer-executable instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing devices generate means for implementing the functions specified in Figure 1 one process or multiple processes and / or blocks Figure 1 one block or multiple blocks.

[0191] These processor-executable instructions may also be stored in a processor-readable memory that can direct a computer or other programmable data processing apparatus to operate in a particular manner, such that the instructions stored in the processor-readable memory produce a manufacture including instruction means that implement the functions specified in one or more of the processes and / or boxes Figure 1 of the one or more processes and / or boxes Figure 1 specified.

[0192] These processor-executable instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process, whereby the instructions executed on the computer or other programmable apparatus provide steps for implementing the functions specified in one or more of the processes and / or boxes Figure 1 of the one or more processes and / or boxes Figure 1 specified.

[0193] It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the spirit and scope of the application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalent technologies, the present application is also intended to cover these modifications and variations.

Claims

1. A test information transmission method, characterized in that, Applied to the test control end, including: Generate an interface message according to the test information, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the new fields; Send the interface message to the adaptation layer for the adaptation layer to parse the interface message to obtain the test information.

2. The test information transmission method according to claim 1, wherein The extended information structure part includes an extended element information part and an extended element part; The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element; The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to a new field.

3. The test information transmission method according to claim 2, wherein The basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

4. The test information transmission method according to any one of claims 1 to 3, characterized in that In the message structure, the extended information structure part is located after the basic message structure part.

5. A method for transmitting test information, characterized in that, Applied to the adaptation layer, including: Receive the interface message sent by the test control end, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the new fields; Parse the interface message to obtain the test information.

6. The test information transmission method according to claim 5, wherein The extended information structure part includes an extended element information part and an extended element part; The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element; The extended element part includes the specific information of at least one type of extended element, and each type of extended element corresponds to a new field.

7. The test information transmission method according to claim 6, wherein The basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

8. The test information transmission method according to claim 6 or 7, characterized in that The parsing the interface message to obtain the test information includes: Parse the extended element information part of the interface message, and according to the content indicated by the extended element information part, save the information of each extended element locally; Parse the basic message structure part of the interface message, and according to the basic information of each extended element, associate each extended element with the sub-structure that calls the corresponding extended element in the basic message structure part respectively, and combine the information of each extended element and the information of the basic message structure part to obtain the complete test information.

9. The test information transmission method according to any one of claims 5 to 7, characterized in that In the message structure, the extended information structure part is located after the basic message structure part.

10. An electronic device, characterized in that, Including a memory, a communication interface, and a processor; The memory is used to store computer programs; the communication interface is used to transmit data under the control of the processor; the processor is used to read the computer programs in the memory and perform the following operations: Generate an interface message according to the test information, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the new fields; Send the interface message to the adaptation layer for the adaptation layer to parse the interface message to obtain the test information.

11. The electronic device according to claim 10, wherein, The extended information structure part includes an extended element information part and an extended element part; The extended element information part is used to indicate the number of extended elements and the basic information of each type of extended element; The extended element part includes specific information of at least one extended element, and each of the extended elements corresponds to an additional field.

12. The electronic device according to claim 11, wherein The basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

13. The electronic device according to any one of claims 10 to 12, characterized in that, In the message structure, the extended information structure part is located after the basic message structure part.

14. An electronic device, characterized in that, It includes a memory, a communication interface, and a processor; The memory is used to store computer programs; the communication interface is used to transmit data under the control of the processor; the processor is used to read the computer programs in the memory and perform the following operations: Receive an interface message sent by a test control terminal, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the additional fields; Parse the interface message to obtain test information.

15. The electronic device according to claim 14, wherein The extended information structure part includes an extended element information part and an extended element part; The extended element information part is used to indicate the number of extended elements and the basic information of each extended element; The extended element part includes specific information of at least one extended element, and each of the extended elements corresponds to an additional field.

16. The electronic device according to claim 15, characterized in that, The basic information of the extended element includes: the name of the extended element, the use of the extended element, and the number of times the extended element is called.

17. The electronic device according to claim 15 or 16, characterized in that, The parsing the interface message to obtain test information includes: Parse the extended element information part of the interface message, and according to the content indicated by the extended element information part, save the information of each extended element locally; Parse the basic message structure part of the interface message, and according to the basic information of each extended element, associate each extended element with the sub-structure that calls the corresponding extended element in the basic message structure part, and combine the information of each extended element and the information of the basic message structure part to obtain complete test information.

18. The electronic device according to any one of claims 14 to 16, characterized in that, In the message structure, the extended information structure part is located after the basic message structure part.

19. A test information transmission device, characterized in that It includes: A message generation unit, configured to generate an interface message according to test information, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the additional fields; A sending unit, configured to send the interface message to an adaptation layer for the adaptation layer to parse the interface message to obtain the test information.

20. A test information transmission device, characterized in that It includes: A receiving unit, configured to receive an interface message sent by a test control terminal, and the message structure of the interface message includes a basic message structure part and an extended information structure part corresponding to the additional fields; A parsing unit, configured to parse the interface message to obtain test information.

21. A non-transitory readable storage medium, characterized in that, The non-transitory readable storage medium stores a computer program, and the computer program is used to cause the processor to execute the method according to any one of claims 1 to 4.

22. A non-transitory readable storage medium, characterized in that, The non-transitory readable storage medium stores a computer program, and the computer program is used to cause the processor to execute the method according to any one of claims 5 to 9.

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