Well pattern parameter generation method, device and equipment for small-well-spacing horizontal well cluster and medium

Abstract

The invention provides a small-well-spacing horizontal well cluster well pattern parameter generation method and device, equipment and a medium, and relates to the technical field of horizontal well cluster well pattern development. The method comprises the following steps: acquiring well cluster layout demand parameters and ranging tool parameters; determining the trajectory control tolerance of the top well in the vertical direction according to the well cluster layout demand parameters; determining a magnetic ranging error according to the ranging tool parameters; according to a preset ranging error confidence factor, a preset well track control error, a track control tolerance, a magnetic ranging error and a well cluster layout demand parameter, determining the number of wells in a well pattern; according to a preset distance measurement error confidence factor, the magnetic distance measurement error, a preset well track control error, the well number of the well pattern and the well cluster layout demand parameters, determining well pattern lateral deviation; and performing well pattern layout processing according to the well number of the well pattern, the lateral deviation of the well pattern and the well cluster layout demand parameters, and determining well pattern parameters of the horizontal well cluster. When the well pattern of the small well spacing horizontal well cluster is designed, the accuracy of determining the well pattern parameters is effectively improved through the method.

Description

Technical Field

[0001] The present application relates to the technical field of horizontal well cluster network development, and in particular to a method, device, equipment and medium for generating parameters of a horizontal well cluster network with small well spacing. Background Art

[0002] Currently, proven geological reserves of low- to medium-maturity shale oil are approximately 7.199 billion tons. The effective development of low- and medium-maturity shale oil is crucial for ensuring energy security. Low- and medium-maturity shale oil reservoirs are generally characterized by deep burial depths, thin reservoir thickness, and strong heterogeneity. To significantly increase the effective hydrocarbon generation volume of thin low- and medium-maturity shale oil, a horizontal well cluster development strategy with deeper well depths, closer well spacing, and a larger number of wells is urgently needed.

[0003] In existing technologies, the well types tested are relatively simple, the well depths are relatively shallow, the number of wells is relatively small, and the horizontal well spacing is relatively large. This technology has a low accuracy rate in determining well pattern parameters when designing a horizontal well cluster with small well spacing. Summary of the Invention

[0004] The present application provides a method, device, equipment and medium for generating parameters of a small-well-spacing horizontal well cluster pattern, which is used to solve the problem of low accuracy in determining well pattern parameters when designing a small-well-spacing horizontal well cluster pattern in the prior art.

[0005] In a first aspect, the present application provides a method for generating parameters of a small-well-spacing horizontal well cluster pattern, comprising:

[0006] Obtain the required parameters for well cluster layout and ranging tool parameters;

[0007] Determining a trajectory control tolerance of the top well in a vertical direction according to the well cluster layout requirement parameters;

[0008] determining a magnetic ranging error based on the ranging tool parameters;

[0009] Determining the number of wells in the well pattern according to a preset ranging error confidence factor, a preset wellbore trajectory control error, the trajectory control tolerance, the magnetic ranging error, and the well cluster layout requirement parameters;

[0010] Determining a well pattern lateral offset according to the preset ranging error confidence factor, the magnetic ranging error, the preset well trajectory control error, the number of wells in the well pattern, and the well cluster layout requirement parameters;

[0011] The well pattern layout is processed according to the number of wells in the well pattern, the lateral offset of the well pattern and the required parameters of the well cluster layout to determine the well pattern parameters of the horizontal well cluster.

[0012] In one possible design, the required parameters for the well cluster layout include reservoir thickness, safety distance between the top well or bottom well and the reservoir boundary, well spacing, number of well pattern layers, and three-dimensional well pattern form;

[0013] Determining the trajectory control tolerance of the top well in the vertical direction according to the well cluster layout requirement parameters includes:

[0014] Determine the design distance from the top well to the bottom well according to the number of well pattern layers, the well spacing, and the three-dimensional well pattern form;

[0015] The trajectory control tolerance of the top well in the vertical direction is determined according to the reservoir thickness, the designed distance and the safe distance between the top well or the bottom well and the reservoir boundary.

[0016] In one possible design, the preset wellbore trajectory control error includes a wellbore trajectory vertical control error, and the magnetic ranging error includes a well spacing direction ranging error and a well spacing direction normal spacing error;

[0017] The determining of the number of wells in the well pattern according to a preset ranging error confidence factor, a preset wellbore trajectory control error, the trajectory control tolerance, the magnetic ranging error, and the well cluster layout requirement parameters includes:

[0018] Determining the number of bottom wells based on the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the vertical control error of the well trajectory, the number of well pattern layers, the three-dimensional well pattern form, the preset ranging error confidence factor, and the trajectory control tolerance;

[0019] The number of wells in the well pattern is determined according to the number of bottom wells and the number of well pattern layers.

[0020] In one possible design, the number of bottom wells is determined based on the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the vertical control error of the wellbore trajectory, the number of well pattern layers, the three-dimensional well pattern form, the preset ranging error confidence factor, and the trajectory control tolerance. The calculation formula is:

[0021]

[0022] Wherein, n is the number of bottom wells, fix is the rounding function, ΔH is the trajectory control tolerance, m is the number of well network layers, k is the preset ranging error confidence factor, max is the maximum value function, and is the ranging error in the well spacing direction, It is a three-dimensional well network. is the normal spacing error in the well spacing direction, and the p v is the vertical control error of the wellbore trajectory;

[0023] The calculation formula for determining the number of wells in the well pattern according to the number of bottom wells and the number of well pattern layers is:

[0024]

[0025] Wherein, N is the number of wells in the well pattern, m is the number of layers in the well pattern, and n is the number of wells in the bottom layer.

[0026] In a possible design, the preset wellbore trajectory control error also includes a wellbore trajectory horizontal control error, and the number of wells in the well pattern includes the number of bottom wells;

[0027] The determining of the well pattern lateral offset according to the preset ranging error confidence factor, the magnetic ranging error, the preset well trajectory control error, the number of wells in the well pattern, and the well cluster layout requirement parameters includes:

[0028] The lateral offset of the well pattern is determined based on the number of bottom wells, the preset ranging error confidence factor, the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the horizontal control error of the wellbore trajectory, the number of well pattern layers and the three-dimensional well pattern form.

[0029] In one possible design, the calculation formula for determining the lateral offset of the well pattern is as follows:

[0030]

[0031] Among them, the is the lateral offset of the well pattern, n is the number of bottom wells, k is the preset ranging error confidence factor, max is the maximum value function, is the ranging error in the well spacing direction, It is a three-dimensional well network. is the normal spacing error in the well spacing direction, and the p h is the horizontal control error of the wellbore trajectory, and m is the number of well pattern layers.

[0032] In a possible design, the number of wells in the well pattern is distributed in the form of an equilateral triangle well pattern over the thickness of the reservoir.

[0033] In a second aspect, the present application provides a device for generating parameters of a small-well-spacing horizontal well cluster pattern, comprising:

[0034] Parameter acquisition module, used to obtain the required parameters of well cluster layout and ranging tool parameters;

[0035] a trajectory control tolerance acquisition module, configured to determine the trajectory control tolerance of the top well in the vertical direction according to the well cluster layout requirement parameters;

[0036] A magnetic ranging error acquisition module, configured to determine a magnetic ranging error based on the ranging tool parameters;

[0037] A well pattern well number acquisition module is used to determine the well pattern well number based on a preset ranging error confidence factor, a preset wellbore trajectory control error, the trajectory control tolerance, the magnetic ranging error, and the well cluster layout requirement parameters;

[0038] a well pattern lateral offset acquisition module, configured to determine the well pattern lateral offset according to the preset ranging error confidence factor, the magnetic ranging error, the preset wellbore trajectory control error, the number of wells in the well pattern, and the well cluster layout requirement parameters;

[0039] The horizontal well cluster pattern parameter acquisition module is used to perform well pattern layout processing according to the number of wells in the well pattern, the lateral offset of the well pattern and the well cluster layout requirement parameters, and determine the horizontal well cluster pattern parameters.

[0040] In a third aspect, the present application provides an electronic device, comprising: a processor, and a memory communicatively connected to the processor;

[0041] The memory stores computer-executable instructions;

[0042] The processor executes the computer-executable instructions stored in the memory to implement the method for generating parameters of a small-well-spacing horizontal well cluster pattern provided in the first aspect of the present application.

[0043] In a fourth aspect, the present application provides a computer-readable storage medium, which stores computer execution instructions. When the computer execution instructions are executed by a processor, they are used to implement the method for generating parameters of a small-well-spacing horizontal well cluster network provided in the first aspect of the present application.

[0044] In a fifth aspect, the present application provides a computer program product, including a computer program, which, when executed by a processor, is used to implement the method for generating parameters of a small-well-spacing horizontal well cluster pattern provided in the first aspect of the present application.

[0045] The present application provides a method, device, equipment, and medium for generating parameters for a horizontal well cluster with small well spacing. The method comprises: obtaining required well cluster layout parameters and ranging tool parameters; determining the vertical trajectory control tolerance of the top well based on the required well cluster layout parameters; determining the magnetic ranging error based on the ranging tool parameters; determining the number of wells in the well pattern based on a preset ranging error confidence factor, a preset wellbore trajectory control error, the trajectory control tolerance, the magnetic ranging error, and the required well cluster layout parameters; determining the lateral offset of the well pattern based on the preset ranging error confidence factor, the magnetic ranging error, the preset wellbore trajectory control error, the number of wells in the well pattern, and the required well cluster layout parameters; and performing well pattern layout processing based on the number of wells in the well pattern, the lateral offset of the well pattern, and the required well cluster layout parameters to determine the horizontal well cluster pattern parameters. Based on the above method, the following technical effects are achieved: by determining the magnetic ranging error and accurately analyzing the well trajectories, the accuracy of determining well pattern parameters can be effectively improved when designing a horizontal well cluster with small well spacing. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following is a brief introduction to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0047] Figure 1 Schematic diagram of the process of generating parameters of a horizontal well cluster with small well spacing provided in the embodiment of the present application Figure 1 ;

[0048] Figure 2 Schematic diagram of the process of generating parameters of a small-well-spacing horizontal well cluster provided in the embodiment of this application Figure 2 ;

[0049] Figure 3 Schematic diagram of the process of generating parameters of a small-well-spacing horizontal well cluster provided in the embodiment of this application Figure 3 ;

[0050] Figure 4 A schematic diagram showing the relationship between the well spacing direction ranging error and the number of bottom wells provided in the embodiment of the present application;

[0051] Figure 5 A schematic diagram showing the relationship between the well spacing direction ranging error and the number of wells in the well pattern provided in the embodiment of the present application;

[0052] Figure 6 A schematic diagram showing the relationship between the well spacing direction ranging error and the well pattern lateral offset provided in an embodiment of the present application;

[0053] Figure 7A schematic diagram showing the relationship between the normal spacing error in the well spacing direction and the number of bottom wells provided in an embodiment of the present application;

[0054] Figure 8 A schematic diagram showing the relationship between the normal spacing error in the well spacing direction and the number of wells in the well pattern provided in an embodiment of the present application;

[0055] Figure 9 A schematic diagram showing the relationship between the normal spacing error in the well spacing direction and the lateral offset of the well pattern provided in an embodiment of the present application;

[0056] Figure 10 A schematic diagram showing the relationship between the vertical control error of the well trajectory and the number of bottom wells provided in an embodiment of the present application;

[0057] Figure 11 A schematic diagram showing the relationship between the vertical control error of the well trajectory and the number of wells in the well pattern provided in an embodiment of the present application;

[0058] Figure 12 A schematic diagram of the relationship between the vertical control error of the wellbore trajectory and the lateral deviation of the well pattern provided in an embodiment of the present application;

[0059] Figure 13 A schematic diagram showing the relationship between the horizontal control error of the well trajectory and the number of bottom wells provided in an embodiment of the present application;

[0060] Figure 14 A schematic diagram showing the relationship between the horizontal control error of the well trajectory and the number of wells in the well pattern provided in an embodiment of the present application;

[0061] Figure 15 A schematic diagram of the relationship between the horizontal control error of the well trajectory and the lateral deviation of the well pattern provided in an embodiment of the present application;

[0062] Figure 16 A schematic diagram of the structure of a device for generating parameters of a cluster of horizontal wells with small well spacing provided in an embodiment of the present application;

[0063] Figure 17 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application.

[0064] Description of reference numerals:

[0065] 601 - processor; 602 - memory; 603 - communication component; 604 - bus. DETAILED DESCRIPTION

[0066] The exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements, unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the appended claims, rather than all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0067] In the embodiments of the present application, words such as "first" and "second" are used to distinguish between identical or similar items with substantially the same functions and effects. Those skilled in the art will understand that words such as "first" and "second" do not limit the quantity and execution order, and words such as "first" and "second" do not necessarily limit differences. It should be noted that in the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or explanations. Any embodiment or design described in this application as "exemplary" or "for example" should not be interpreted as being more preferred or advantageous than other embodiments or design schemes. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a concrete way. In the embodiments of the present application, "at least one" refers to one or more, and "more" refers to two or more.

[0068] To facilitate a clear description of the technical solutions of the embodiments of the present application, some of the terms and technologies involved in the embodiments of the present application are briefly introduced below:

[0069] Required parameters for well cluster layout: including reservoir thickness, safe distance between top well or bottom well and reservoir boundary, well spacing, number of well pattern layers and three-dimensional well pattern form, which are parameters related to oil well development.

[0070] Ranging tool parameters: ranging error in the well spacing direction and normal spacing error in the well spacing direction are performance parameters of the ranging tool.

[0071] In order to clearly understand the technical solution of the present application, the solution of the prior art is first introduced in detail.

[0072] In existing technologies, the well types tested are relatively simple, the well depths are relatively shallow, the number of wells is relatively small, and the horizontal well spacing is relatively large. This technology has a low accuracy rate in determining the well pattern layout parameters when designing a horizontal well cluster with small well spacing.

[0073] In summary, how to design a method that can solve the problem of low accuracy in determining well network layout parameters when designing a small-well-spacing horizontal well cluster pattern in the existing technology is an urgent problem to be solved in this application.

[0074] Therefore, in response to the above-mentioned technical problems existing in the prior art, the embodiments of the present application provide a method, device, equipment and medium for generating parameters of a small-well-spacing horizontal well cluster network, which can be used in the field of horizontal well cluster network development technology, and aim to effectively improve the accuracy of determining well network parameters when designing a small-well-spacing horizontal well cluster network.

[0075] The following describes the application scenarios of the method for generating parameters for a cluster of closely spaced horizontal wells provided in the embodiments of this application. The following application scenarios are merely examples, intended to help those skilled in the art understand the technical content of this application, but do not imply that the embodiments of this application cannot be applied to other devices, systems, environments, or scenarios.

[0076] In the well network design in shale gas development, the method for generating well network parameters for a small-well-spacing horizontal well cluster provided in the embodiment of the present application can achieve a higher well network density and more accurate well network parameter calculation based on various factors such as geological conditions, reservoir properties, well-to-well distance and horizontal well length, thereby improving shale gas extraction efficiency.

[0077] The embodiments of the present application are introduced below with reference to the accompanying drawings.

[0078] The following specific embodiments describe in detail the technical solution of the present application and how the technical solution of the present application solves the above-mentioned technical problems. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below in conjunction with the accompanying drawings.

[0079] Figure 1 Schematic diagram of the process of generating parameters of a small-well-spacing horizontal well cluster provided in the embodiment of this application Figure 1 This embodiment provides a method for generating parameters of a horizontal well pattern of a small-well-spacing cluster, including the following steps:

[0080] S101. Obtain required parameters for well cluster layout and ranging tool parameters.

[0081] In this embodiment, the required parameters for the well cluster layout include reservoir thickness, the safe distance between the top well or bottom well and the reservoir boundary, the well spacing, the number of well pattern layers, and the three-dimensional well pattern form. The ranging tool parameters include the ranging error in the well spacing direction and the normal spacing error in the well spacing direction.

[0082] Prestack seismic inversion technology is combined with the Gassmann equation to establish the relationship between reservoir physical parameters such as porosity and saturation and elastic parameters such as compressional wave velocity and density, thereby inferring reservoir thickness; based on formation pressure, fluid properties and rock mechanical parameters, the injection-production pressure gradient model is used to calculate the safe distance between the top well or bottom well and the reservoir boundary; based on parameters such as permeability and porosity, the fluid supply radius is calculated, and the reasonable well spacing is determined in combination with the economic limit well spacing; based on the vertical heterogeneity of the reservoir, a three-dimensional well network is used to determine the number of well network layers and the three-dimensional well network form. Reservoir thickness, the safe distance between the top well or bottom well and the reservoir boundary, the well spacing, the number of well network layers and the three-dimensional well network form can also be obtained by other methods, and this embodiment does not impose specific restrictions on this.

[0083] Using the normal plane distance scanning method or the horizontal plane distance scanning method, the shortest distance between the reference well and the adjacent well in a specific direction is calculated. Then, using inclination data such as well depth, well inclination, and azimuth, and an error model, the ranging error in the well spacing direction is determined. The three-dimensional error ellipsoid is projected onto a normal plane perpendicular to the wellbore trajectory to obtain the minor and major axis radii of the normal error ellipse. For example, the normal spacing error in the well spacing direction is determined using error projections on vertical and horizontal planes perpendicular to the wellbore trajectory. The ranging error in the well spacing direction and the normal spacing error in the well spacing direction can also be obtained using other methods, which are not specifically limited in this embodiment.

[0084] In this embodiment, the side well at the bottom layer is taken as the first well and also the reference well; the position error of the standard well relative to the bottom boundary of the reservoir is ignored; and the bottom layer wells are constructed sequentially in the same direction.

[0085] S102: Determine the trajectory control tolerance of the top well in the vertical direction according to the well cluster layout requirement parameters.

[0086] In this example, a tolerance model is constructed, defining the maximum vertical distance a trajectory can deviate from the target horizon. After dynamic error correction is applied to this tolerance model, real-time data inversion is performed. For example, the tolerance can be dynamically adjusted based on changes in production pressure differential and water cut. The final adjusted tolerance model can be used to determine the vertical trajectory control tolerance for the top well.

[0087] S103: Determine the magnetic ranging error according to the ranging tool parameters.

[0088] In this embodiment, the magnetic ranging error refers to the ranging error in the well spacing direction and the normal spacing error in the well spacing direction. The ranging tool parameters may be basic parameters of the magnetic ranging tool.

[0089] The ranging error in the well spacing direction and the normal spacing error in the well spacing direction are calculated by integrating multiple error sources such as trajectory control tolerance, instrument fixed error, and proportional error. The specific calculation process requires the combination of instrument error parameters and error propagation formulas.

[0090] By determining the magnetic ranging error and accurately analyzing the well trajectory, the accuracy of determining the well pattern parameters can be effectively improved when designing a horizontal well cluster with small well spacing.

[0091] S104 , determining the number of wells in the well pattern according to a preset ranging error confidence factor, a preset wellbore trajectory control error, a trajectory control tolerance, a magnetic ranging error, and required parameters for well cluster layout.

[0092] In this embodiment, the number of wells in the well network is determined based on a preset ranging error confidence factor, a preset wellbore trajectory control error, a trajectory control tolerance, a magnetic ranging error, and required parameters for the well cluster layout. This can be achieved through model training or other methods, and this embodiment does not impose any specific restrictions on this.

[0093] S105 , determining the well pattern lateral offset according to a preset ranging error confidence factor, a magnetic ranging error, a preset well trajectory control error, the number of wells in the well pattern, and required parameters for the well cluster layout.

[0094] In this embodiment, the lateral offset of the well network is determined based on the preset ranging error confidence factor, magnetic ranging error, preset wellbore trajectory control error, number of wells in the well network and required parameters of the well cluster layout. This can be achieved through model training or other methods, and this embodiment does not impose any specific restrictions on this.

[0095] S106 , performing well pattern layout processing according to the number of wells in the well pattern, the lateral offset of the well pattern, and the required parameters of the well cluster layout, and determining the well pattern parameters of the horizontal well cluster.

[0096] In this embodiment, the number of wells, lateral offsets, and required well cluster layout parameters are input into existing 3D well pattern modeling software to generate a 3D well pattern model. This 3D well pattern model includes specific distribution parameters from the bottom well to the top well, such as the number of wells and the spacing between wells in the bottom layer, the number of wells and the spacing between wells in the penultimate layer, and the spacing between vertically adjacent layers. Horizontal well cluster pattern parameters can also be derived using tools, software, and methods related to well pattern design in shale oil and gas production, but this embodiment does not limit this.

[0097] The present application provides a method for generating parameters for a horizontal well cluster with small well spacing. The method comprises the following steps: obtaining required well cluster layout parameters and ranging tool parameters; determining the vertical trajectory control tolerance of the top well based on the required well cluster layout parameters; determining the magnetic ranging error based on the ranging tool parameters; determining the number of wells in the well pattern based on a preset ranging error confidence factor, a preset wellbore trajectory control error, the trajectory control tolerance, the magnetic ranging error, and the required well cluster layout parameters; determining the lateral offset of the well pattern based on the preset ranging error confidence factor, the magnetic ranging error, the preset wellbore trajectory control error, the number of wells in the well pattern, and the required well cluster layout parameters; and performing well pattern layout processing based on the number of wells in the well pattern, the lateral offset of the well pattern, and the required well cluster layout parameters to determine the horizontal well cluster pattern parameters. Based on the above method, the following technical effects are achieved: by determining the magnetic ranging error and accurately analyzing the well trajectories, the accuracy of determining well pattern parameters can be effectively improved when designing a horizontal well cluster with small well spacing.

[0098] Figure 2 Schematic diagram of the process of generating parameters of a small-well-spacing horizontal well cluster provided in the embodiment of this application Figure 2 Based on the above embodiment, this embodiment further explains the method for generating parameters for a horizontal well cluster with small well spacing. In this embodiment, the required parameters for the well cluster layout include reservoir thickness, the safe distance between the top well or bottom well and the reservoir boundary, the well spacing, the number of well pattern layers, and the three-dimensional well pattern. S102 includes:

[0099] S201. Determine the design distance from the top well to the bottom well based on the number of well pattern layers, well spacing, and three-dimensional well pattern.

[0100] In this embodiment, the design distance from the top well to the bottom well is determined based on the number of well pattern layers, well spacing, and three-dimensional well pattern form. The calculation formula is:

[0101]

[0102] Among them, D tw is the design distance from the top well to the bottom well, m is the number of well network layers, D w is the well spacing, It is in the form of a three-dimensional well network.

[0103] S202: Determine the trajectory control tolerance of the top well in the vertical direction according to the reservoir thickness, the design distance, and the safe distance between the top well or the bottom well and the reservoir boundary.

[0104] In this embodiment, the trajectory control tolerance of the top well in the vertical direction is determined based on the reservoir thickness, the design distance, and the safe distance between the top well or the bottom well and the reservoir boundary. The calculation formula is:

[0105]

[0106] in, is the trajectory control tolerance of the top well in the vertical direction, T is the reservoir thickness, D tw D is the design distance from the top well to the bottom well, s It is the safe distance between the top well or bottom well and the reservoir boundary.

[0107] The invention provides a specific calculation formula capable of determining the trajectory control tolerance of the top well in the vertical direction, which can improve efficiency and accuracy.

[0108] Figure 3 Schematic diagram of the process of generating parameters of a small-well-spacing horizontal well cluster provided in the embodiment of this application Figure 3 Based on the above embodiment, this embodiment further explains the method for generating parameters for a horizontal well cluster with small well spacing. In this embodiment, the preset well trajectory control error includes the well trajectory vertical control error, and the magnetic ranging error includes the ranging error in the well spacing direction and the normal spacing error in the well spacing direction. S104 includes:

[0109] S301. Determine the number of bottom wells based on the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the vertical control error of the well trajectory, the number of well pattern layers, the three-dimensional well pattern form, the preset ranging error confidence factor, and the trajectory control tolerance.

[0110] In this embodiment, the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, and the vertical control error of the wellbore trajectory are synthesized. The error range is adjusted using a preset ranging error confidence factor to establish a bottom-level well count model. The number of well patterns and the three-dimensional well pattern format are input into this bottom-level well count model, which outputs the bottom-level well count. Determining the bottom-level well count by establishing the bottom-level well count model improves data accuracy. Other methods for determining the bottom-level well count are also possible and are not specifically limited in this embodiment.

[0111] S302. Determine the number of wells in the well pattern according to the number of bottom wells and the number of well pattern layers.

[0112] In this embodiment, after determining the number of wells in the bottom layer and the number of well pattern layers, the total well pattern area and the spacing between wells are first calculated. The number of wells in a single layer of the well pattern is then calculated using the total well pattern area and the spacing between wells. The number of wells in each layer of the well pattern is then summed to obtain the final number of wells in the well pattern. Other methods for determining the number of wells in the well pattern may also be used, and this embodiment does not specifically limit this.

[0113] Based on the above embodiment, this embodiment further explains the method for generating parameters of a horizontal well cluster with small well spacing. In this embodiment, the calculation formula of S301 of the method for generating parameters of a horizontal well cluster with small well spacing is:

[0114]

[0115] Where n is the number of bottom wells, fix is the rounding function, △H is the trajectory control tolerance, m is the number of well network layers, k is the preset ranging error confidence factor, and max is the maximum value function. is the ranging error in the well spacing direction, It is in the form of a three-dimensional well network. is the normal spacing error in the well spacing direction, p v is the vertical control error of the wellbore trajectory;

[0116] The calculation formula for S302 is:

[0117]

[0118] Among them, N is the number of wells in the well pattern, m is the number of well pattern layers, and n is the number of wells in the bottom layer.

[0119] Providing a specific calculation formula for determining the number of bottom wells and the number of wells in the well pattern can improve efficiency and accuracy.

[0120] In an optional embodiment of the present application, the derivation process of the calculation formula for determining the number of bottom wells n is as follows:

[0121] Step a: Based on the preset ranging error confidence factor and the well spacing direction ranging error, calculate the actual well spacing direction ranging error of well 2 relative to well 1 along the magnetic ranging direction from the bottom boundary. The calculation formula is as follows:

[0122]

[0123] Among them, e hr is the actual well spacing error of well 2 relative to well 1 along the magnetic ranging direction from the bottom boundary, k is the preset ranging error confidence factor, is the ranging error in the well spacing direction.

[0124] Step b: Based on the vertical control error of the well trajectory, the preset ranging error confidence factor, and the well spacing direction ranging error, calculate the final actual well spacing direction ranging error of well 2 relative to well 1 along the magnetic ranging direction from the bottom boundary. The calculation formula is as follows:

[0125]

[0126] Among them, e hp is the distance measurement error of the final actual well spacing direction of well 2 relative to well 1 along the magnetic ranging direction from the bottom boundary, k is the preset distance measurement error confidence factor, is the ranging error in the well spacing direction, p v is the vertical control error of the wellbore trajectory.

[0127] Step c: Based on the formula in step b, the final actual well spacing direction ranging error of the nth well relative to the 1st well along the magnetic ranging direction from the bottom boundary can be calculated. Assuming that the number of bottom wells is n, the calculation formula is as follows:

[0128]

[0129] Among them, E np is the distance measurement error of the nth well relative to the 1st well in the direction of magnetic ranging from the bottom boundary, k is the preset distance measurement error confidence factor, is the ranging error in the well spacing direction, p v is the vertical control error of the wellbore trajectory.

[0130] Step d: Based on the preset ranging error confidence factor, the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, and the three-dimensional well pattern form, calculate the actual well spacing direction ranging error of the (n+1)th well relative to the nth well along the magnetic ranging direction from the bottom boundary. The calculation formula is as follows:

[0131]

[0132] in, is the distance measurement error of the (n+1)th well relative to the actual well spacing direction of well n along the magnetic ranging direction from the bottom boundary, k is the preset distance measurement error confidence factor, is the ranging error in the well spacing direction, is the normal spacing error in the well spacing direction, It is in the form of a three-dimensional well network.

[0133] Step e: Based on the vertical control error of the well trajectory, the preset ranging error confidence factor, the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, and the three-dimensional well pattern form, calculate the final actual well spacing direction ranging error of the (n+1)th well relative to the nth well along the magnetic ranging direction from the bottom boundary. The calculation formula is as follows:

[0134]

[0135] Among them, e vp is the distance measurement error of the (n+1)th well relative to the final actual well spacing direction of well n along the magnetic ranging direction from the bottom boundary, k is the preset distance measurement error confidence factor, is the ranging error in the well spacing direction, is the normal spacing error in the well spacing direction, p v is the vertical control error of the wellbore trajectory, It is in the form of a three-dimensional well network.

[0136] Step f: Based on the formula in step e, the distance measurement error of the (n+m-1)th well relative to the final actual well spacing direction of the nth well along the magnetic distance measurement direction from the bottom boundary can be calculated. Assuming that the number of well network layers is m, the calculation formula is as follows:

[0137]

[0138] Among them, E mp is the distance measurement error of the (n+m-1)th well relative to the final actual well spacing direction of well n along the magnetic ranging direction from the bottom boundary, k is the preset distance measurement error confidence factor, is the ranging error in the well spacing direction, is the normal spacing error in the well spacing direction, p v is the vertical control error of the wellbore trajectory, It is in the form of a three-dimensional well network.

[0139] Step g: Based on the vertical control error of the well trajectory, the preset ranging error confidence factor, the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, and the three-dimensional well pattern, the final actual well spacing direction ranging error of the top horizontal well diagonally opposite the reference well along the magnetic ranging direction from the bottom boundary is calculated relative to the reference well. The specific calculation formula is as follows:

[0140]

[0141] Among them, E mn is the distance measurement error of the top horizontal well diagonally opposite to the reference well from the bottom boundary along the magnetic ranging direction relative to the reference well, k is the preset distance measurement error confidence factor, is the ranging error in the well spacing direction, is the normal spacing error in the well spacing direction, p v is the vertical control error of the wellbore trajectory, It is in the form of a three-dimensional well network.

[0142] Assume that the trajectory control tolerance of the top well in the vertical direction is , it can be obtained that the distance measurement error of the top horizontal well diagonally opposite to the reference well in the magnetic ranging direction from the bottom boundary to the reference well in the final actual well spacing direction needs to meet the following conditions:

[0143]

[0144] After formula transformation, the calculation formula for the number of bottom wells n can be obtained as follows:

[0145]

[0146] Where n is the number of bottom wells, fix is the rounding function, △H is the trajectory control tolerance, m is the number of well network layers, k is the preset ranging error confidence factor, and max is the maximum value function. is the ranging error in the well spacing direction, It is in the form of a three-dimensional well network. is the normal spacing error in the well spacing direction, is the vertical control error of the wellbore trajectory.

[0147] Based on the above embodiment, this embodiment further explains the method for generating parameters of a horizontal well pattern of a cluster of closely spaced horizontal wells. In this embodiment, the preset well trajectory control error also includes the well trajectory horizontal control error, and the well pattern number includes the number of bottom wells. S105 includes:

[0148] S401. Determine the lateral offset of the well pattern based on the number of bottom wells, a preset ranging error confidence factor, ranging error in the well spacing direction, normal spacing error in the well spacing direction, horizontal control error of the wellbore trajectory, number of well pattern layers, and three-dimensional well pattern form.

[0149] In this embodiment, the well spacing direction error, the normal spacing error in the well spacing direction, and the wellbore trajectory horizontal control error are synthesized, and the error range is adjusted using a preset ranging error confidence factor to establish an error model for well pattern lateral offset. The number of bottom wells, the number of well pattern layers, and the three-dimensional well pattern form are input into the error model for well pattern lateral offset, and the well pattern lateral offset is output. By establishing an error model for well pattern lateral offset, the accuracy of data determination can be improved. Other methods for determining well pattern lateral offset may also be used, and this embodiment does not impose specific limitations on this.

[0150] Based on the above embodiment, this embodiment further explains the method for generating parameters of a horizontal well cluster with small well spacing. In this embodiment, the calculation formula of S401 is:

[0151]

[0152] in, is the lateral offset of the well pattern, n is the number of bottom wells, k is the preset confidence factor of the ranging error, max is the maximum value function, is the ranging error in the well spacing direction, It is in the form of a three-dimensional well network. is the normal spacing error in the well spacing direction, is the horizontal control error of the wellbore trajectory, and m is the number of well pattern layers.

[0153] Providing a specific calculation formula that can determine the lateral deviation of the well pattern can improve efficiency and accuracy.

[0154] Based on the above embodiment, this embodiment further explains the method for generating parameters of a horizontal well pattern of a small-well-spacing cluster. In this embodiment, the number of wells in the horizontal well pattern of a small-well-spacing cluster is distributed in the form of an equilateral triangle in the reservoir thickness.

[0155] The layout of the equilateral triangle well pattern has become an efficient and economical well pattern design scheme in oilfield development by evenly distributing well locations, reducing interference between wells, improving collection efficiency, optimizing fracturing effects, and reducing production costs.

[0156] A specific embodiment is given below.

[0157] The reservoir thickness is 20 meters, the safety distance between the top well or bottom well and the reservoir boundary is 3 meters or 1.5 meters, or the safety distance between the top well or bottom well and the reservoir boundary is 1.5 meters or 1.5 meters, the well spacing is 5 meters, the number of well network layers is 4, the three-dimensional well network form is 60°, and the well network is a regular triangle.

[0158] The design distance from the top well to the bottom well is calculated as follows:

[0159]

[0160] Assume that the first well on the left side of the bottom well is used as the reference well. Considering the position measurement error of this well, the distance from the bottom well to the reservoir bottom is designed to be 3.5m. Then the distance from the top well to the reservoir top is also 3.5m. Therefore, the trajectory control tolerance of the top well in the vertical direction is It is also assumed that the vertical control error of the wellbore trajectory is 0.2 m and the horizontal control error of the wellbore trajectory is 0.4 m.

[0161] By calculating the ranging error in the well spacing direction and the normal spacing error in the well spacing direction, we can obtain:

[0162] ,

[0163] Taking the preset ranging error confidence factor k=3.5, the number of bottom wells n is calculated as follows:

[0164]

[0165]

[0166] Finally, the number of bottom wells n is calculated to be 29.

[0167] The number of wells N in the well pattern is calculated as follows:

[0168]

[0169] Maximum lateral deviation The calculation is as follows:

[0170]

[0171] Figure 4 This is a schematic diagram of the relationship between the well spacing direction ranging error and the number of bottom wells provided in the embodiment of the present application. Figure 5 This is a schematic diagram of the relationship between the well spacing direction ranging error and the number of wells in the well pattern provided in the embodiment of the present application. Figure 6 A schematic diagram of the relationship between the well spacing direction ranging error and the lateral offset of the well pattern provided in the embodiment of the present application. Figure 4 、 Figure 5 and Figure 6 The horizontal axis represents the well spacing error, while the vertical axis represents the number of bottom wells, the number of wells in the well pattern, and the lateral offset of the well pattern. The well spacing error is measured in meters, the number of bottom wells is measured in wells, the number of wells in the well pattern is measured in wells, and the lateral offset of the well pattern is measured in meters. As the well spacing error increases, the number of bottom wells and the number of wells in the well pattern decrease, while the lateral offset of the well pattern increases.

[0172] Figure 7 This is a schematic diagram of the relationship between the normal spacing error in the well spacing direction and the number of bottom wells provided in the embodiment of the present application. Figure 8 This is a schematic diagram of the relationship between the normal spacing error in the well spacing direction and the number of wells in the well pattern provided in the embodiment of the present application. Figure 9 A schematic diagram of the relationship between the normal spacing error in the well spacing direction and the lateral offset of the well pattern provided in an embodiment of the present application. Figure 7 、 Figure 8 and Figure 9 The horizontal axis represents the normal spacing error in the well spacing direction, while the vertical axis represents the number of bottom wells, the number of wells in the well pattern, and the lateral offset of the well pattern. The normal spacing error in the well spacing direction is measured in meters, the number of bottom wells is measured in wells, the number of wells in the well pattern is measured in wells, and the lateral offset of the well pattern is measured in meters. As the normal spacing error in the well spacing direction increases, the number of bottom wells, the number of wells in the well pattern, and the lateral offset of the well pattern decrease.

[0173] Figure 10 A schematic diagram showing the relationship between the vertical control error of the wellbore trajectory and the number of bottom wells provided in the embodiment of the present application. Figure 11 This is a schematic diagram of the relationship between the vertical control error of the well trajectory and the number of wells in the well pattern provided in the embodiment of the present application. Figure 12 A schematic diagram of the relationship between the vertical control error of the wellbore trajectory and the lateral deviation of the well pattern provided in an embodiment of the present application. Figure 10 、 Figure 11 and Figure 12The horizontal axis represents the vertical control error of the wellbore trajectory, while the vertical axis represents the number of bottom wells, the number of wells in the well pattern, and the lateral deviation of the well pattern. The vertical control error of the wellbore trajectory is measured in meters, the number of bottom wells is measured in wells, the number of wells in the well pattern is measured in wells, and the lateral deviation of the well pattern is measured in meters. As the vertical control error of the wellbore trajectory increases, the number of bottom wells, the number of wells in the well pattern, and the lateral deviation of the well pattern decrease.

[0174] Figure 13 A schematic diagram showing the relationship between the horizontal control error of the wellbore trajectory and the number of bottom wells provided in the embodiment of the present application. Figure 14 A schematic diagram showing the relationship between the horizontal control error of the well trajectory and the number of wells in the well pattern provided in the embodiment of the present application. Figure 15 Schematic diagram of the relationship between the horizontal control error of the wellbore trajectory and the lateral deviation of the well pattern provided in the embodiment of the present application. Figure 13 、 Figure 14 and Figure 15 The horizontal axis represents the horizontal control error of the wellbore trajectory, while the vertical axis represents the number of bottom-layer wells, the number of wells in the well pattern, and the lateral deviation of the well pattern. The horizontal control error of the wellbore trajectory is measured in meters, the number of bottom-layer wells is measured in wells, the number of wells in the well pattern is measured in wells, and the lateral deviation of the well pattern is measured in meters. As the horizontal control error of the wellbore trajectory increases, the number of bottom-layer wells and the number of wells in the well pattern change little, while the lateral deviation of the well pattern increases.

[0175] Figure 16 This is a schematic diagram of the structure of the device for generating parameters of a horizontal well cluster with small well spacing provided in an embodiment of the present application. Figure 16 As shown, in this embodiment, the device for generating parameters of a horizontal well cluster with small well spacing can be located in an electronic device. The device for generating parameters of a horizontal well cluster with small well spacing includes:

[0176] Parameter acquisition module 501, used to obtain well cluster layout requirement parameters and ranging tool parameters;

[0177] The trajectory control tolerance acquisition module 502 is used to determine the trajectory control tolerance of the top well in the vertical direction according to the well cluster layout requirement parameters;

[0178] A magnetic ranging error acquisition module 503 is used to determine the magnetic ranging error according to the ranging tool parameters;

[0179] The well pattern well number acquisition module 504 is used to determine the well pattern well number based on a preset ranging error confidence factor, a preset wellbore trajectory control error, a trajectory control tolerance, a magnetic ranging error, and a well cluster layout requirement parameter;

[0180] The well pattern lateral offset acquisition module 505 is used to determine the well pattern lateral offset based on a preset ranging error confidence factor, a magnetic ranging error, a preset wellbore trajectory control error, the number of wells in the well pattern, and the required parameters of the well cluster layout;

[0181] The horizontal well cluster pattern parameter acquisition module 506 is used to perform well pattern layout processing according to the number of wells in the well pattern, the lateral offset of the well pattern and the well cluster layout requirement parameters, and determine the horizontal well cluster pattern parameters.

[0182] The apparatus for generating parameters of a cluster of horizontal wells with small well spacing provided in this embodiment can be executed Figure 1 The technical solution of the embodiment of the method for generating parameters of a cluster of horizontal wells with small well spacing is shown in FIG. Figure 1 The embodiment of the method for generating parameters of a cluster of closely spaced horizontal wells is similar and will not be described in detail here.

[0183] Meanwhile, the device for generating parameters of a cluster of small-well-spacing horizontal wells provided by the present invention is based on the device for generating parameters of a cluster of small-well-spacing horizontal wells provided in the previous embodiment, and further refines the device for generating parameters of a cluster of small-well-spacing horizontal wells.

[0184] Optionally, in this embodiment, the required parameters for the well cluster layout include reservoir thickness, a safe distance between the top well or bottom well and the reservoir boundary, well spacing, number of well pattern layers, and three-dimensional well pattern form. The trajectory control tolerance acquisition module 502 is used to:

[0185] Determine the design distance from the top well to the bottom well based on the number of well patterns, well spacing, and three-dimensional well pattern;

[0186] The trajectory control tolerance of the top well in the vertical direction is determined based on the reservoir thickness, the design distance and the safe distance between the top well or the bottom well and the reservoir boundary.

[0187] Optionally, in this embodiment, the preset wellbore trajectory control error includes a wellbore trajectory vertical control error, and the magnetic ranging error includes a well spacing direction ranging error and a well spacing normal error. The well pattern well number acquisition module 504 is used to:

[0188] Determine the number of bottom wells based on the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the vertical control error of the well trajectory, the number of well pattern layers, the three-dimensional well pattern form, the preset ranging error confidence factor and the trajectory control tolerance;

[0189] Determine the number of wells in the well network based on the number of bottom wells and the number of well network layers.

[0190] Optionally, in this embodiment, the well pattern and well number acquisition module 504 is further configured to:

[0191] The number of bottom wells is determined based on the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the vertical control error of the well trajectory, the number of well patterns, the three-dimensional well pattern form, the preset ranging error confidence factor, and the trajectory control tolerance. The calculation formula is:

[0192]

[0193] Where n is the number of bottom wells, fix is the rounding function, is the trajectory control tolerance, m is the number of well patterns, k is the preset ranging error confidence factor, max is the maximum value function, is the ranging error in the well spacing direction, It is in the form of a three-dimensional well network. is the normal spacing error in the well spacing direction, p v is the vertical control error of the wellbore trajectory;

[0194] According to the number of bottom wells and the number of well pattern layers, the number of wells in the well pattern is determined. The calculation formula is:

[0195]

[0196] Among them, N is the number of wells in the well pattern, m is the number of well pattern layers, and n is the number of wells in the bottom layer.

[0197] Optionally, in this embodiment, the preset wellbore trajectory control error also includes a wellbore trajectory horizontal control error, the well pattern number includes the number of bottom wells, and the well pattern lateral offset acquisition module 505 is used to:

[0198] The lateral offset of the well pattern is determined based on the number of bottom wells, the preset ranging error confidence factor, the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the horizontal control error of the well trajectory, the number of well pattern layers and the three-dimensional well pattern form.

[0199] Optionally, in this embodiment, the well pattern lateral offset acquisition module 505 is further configured to:

[0200] The lateral offset of the well pattern is determined based on the number of bottom wells, the preset ranging error confidence factor, the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the horizontal control error of the well trajectory, the number of well pattern layers, and the three-dimensional well pattern form. The calculation formula is:

[0201]

[0202] in, is the lateral offset of the well pattern, n is the number of bottom wells, k is the preset confidence factor of the ranging error, max is the maximum value function, is the ranging error in the well spacing direction, It is in the form of a three-dimensional well network. is the normal spacing error in the well spacing direction, p h is the horizontal control error of the wellbore trajectory, and m is the number of well pattern layers.

[0203] Optionally, in this embodiment, the number of wells in the well pattern is distributed in the form of an equilateral triangle well pattern over the reservoir thickness.

[0204] The device for generating parameters of a cluster of small-well-spacing horizontal wells provided in this embodiment can execute the technical solution of the embodiment of the method for generating parameters of a cluster of small-well-spacing horizontal wells. Its implementation principle and technical effects are similar to those of the embodiment of the method for generating parameters of a cluster of small-well-spacing horizontal wells, and will not be described in detail here.

[0205] Figure 17 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. This electronic device is intended for use with various electronic devices capable of executing the method for generating parameters for a cluster of closely spaced horizontal well patterns, such as microcomputers, single-chip microcomputers, and other suitable computers. The components shown herein, their connections and relationships, and their functions are provided for illustrative purposes only and are not intended to limit the implementation of the present invention described and / or claimed herein.

[0206] like Figure 17 As shown, the electronic device includes: at least one processor 601 and a memory 602. The electronic device also includes a communication component 603. The processor 601, the memory 602 and the communication component 603 are connected via a bus 604.

[0207] In a specific implementation process, at least one processor 601 executes the computer-executable instructions stored in the memory 602, so that the at least one processor 601 executes the method for generating well pattern parameters of a cluster of closely spaced horizontal wells as executed by the electronic device side.

[0208] The specific implementation process of the processor 601 can refer to the above-mentioned embodiment of the method for generating parameters of a cluster of closely spaced horizontal wells. The implementation principle and technical effects are similar and will not be described in detail in this embodiment.

[0209] In the above embodiment, it should be understood that processor 601 can be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), etc. General-purpose processor 601 can be a microprocessor or any conventional processor. The steps of the method disclosed in the present invention can be directly implemented by a hardware processor or implemented by a combination of hardware and software modules in the processor.

[0210] The memory 602 may include a high-speed RAM memory, and may also include a non-volatile storage NVM, such as at least one disk storage.

[0211] Bus 604 can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus. Bus 604 can be divided into an address bus, a data bus, and a control bus. For ease of illustration, bus 604 in the drawings of this application is not limited to a single bus or a single type of bus.

[0212] The above functions implemented by the electronic device and the main control device have been used to introduce the solutions provided in the embodiments of the present application. It is understandable that, in order to implement the above functions, the electronic device or the main control device includes hardware structures and / or software modules corresponding to the execution of each function. In combination with the units and algorithm steps of the various examples described in the embodiments disclosed in the embodiments of the present application, the embodiments of the present application can be implemented in the form of hardware or a combination of hardware and computer software. Whether a function is executed in a hardware or computer software driven hardware manner depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the technical solution of the embodiments of the present application.

[0213] The present application also provides a computer-readable storage medium having computer-executable instructions stored therein. When a processor executes the computer-executable instructions, the above method for generating parameters of a cluster of closely spaced horizontal wells is implemented.

[0214] The above-mentioned computer-readable storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0215] An exemplary readable storage medium is coupled to a processor, enabling the processor to read information from and write information to the readable storage medium. The readable storage medium may also be an integral part of the processor. The processor and the readable storage medium may reside in an application-specific integrated circuit (ASIC). The processor and the readable storage medium may also reside as discrete components in an electronic device or a host control device.

[0216] The memory 602 is a non-transitory computer-readable storage medium provided by the present invention. The non-transitory computer-readable storage medium of the present invention stores computer instructions for enabling the computer to execute the method for generating parameters of a small-well-spacing horizontal well cluster pattern provided by the present invention.

[0217] The memory 602 is a non-transitory computer-readable storage medium that can be used to store non-transitory software programs, non-transitory computer executable programs and modules, such as the program instructions / modules corresponding to the method for generating parameters of a small-well-spacing horizontal well cluster pattern in the embodiment of the present application (for example, Figure 16 Parameter acquisition module 501, trajectory control tolerance acquisition module 502, magnetic ranging error acquisition module 503, well pattern number acquisition module 504, well pattern lateral offset acquisition module 505, and horizontal well cluster pattern parameter acquisition module 506 are shown. The processor 601 executes the non-transient software programs, instructions, and modules stored in the memory 602 to perform various functional applications and data processing, thereby implementing the method for generating parameters of a horizontal well cluster with a small well spacing in the above-mentioned method embodiment.

[0218] At the same time, this embodiment also provides a computer program product, including a computer program, which is used to implement the method for generating well pattern parameters of a small-well-spacing horizontal well cluster according to the above embodiment when executed by a processor.

[0219] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in one or more embodiments of this specification are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant laws, regulations and standards, and corresponding operation entrances must be provided for users to choose to authorize or refuse.

[0220] It should be noted that for the aforementioned method embodiments, for simplicity of description, they are all expressed as a series of action combinations, but those skilled in the art should be aware that this application is not limited by the order of the actions described, because according to this application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in this specification are all optional embodiments, and the actions and modules involved are not necessarily required for this application.

[0221] It should be further noted that, although the various steps in the flowchart are shown in sequence as indicated by the arrows, these steps are not necessarily performed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps may be performed in other orders. Moreover, at least a portion of the steps in the flowchart may include multiple sub-steps or multiple stages, and these sub-steps or stages are not necessarily performed at the same time, but may be performed at different times. The execution order of these sub-steps or stages is not necessarily to be performed in sequence, but may be performed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.

[0222] It should be understood that the above-described device embodiments are merely illustrative, and the device of the present application may also be implemented in other ways. For example, the division of units / modules in the above-described embodiments is merely a logical functional division, and actual implementations may employ other division methods. For example, multiple units, modules, or components may be combined or integrated into another system, or some features may be omitted or not implemented.

[0223] In addition, unless otherwise specified, the functional units / modules in the various embodiments of the present application may be integrated into a single unit / module, each unit / module may exist physically separately, or two or more units / modules may be integrated together. The aforementioned integrated units / modules may be implemented in the form of hardware or software program modules.

[0224] In the above embodiments, the description of each embodiment has its own emphasis. For parts not described in detail in a particular embodiment, please refer to the relevant description of other embodiments. The technical features of the above embodiments can be combined in any way. To keep the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0225] Those skilled in the art will readily appreciate other embodiments of the present application after considering the specification and practicing the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the present application that follow the general principles of the present application and include common knowledge or customary techniques in the art not disclosed herein. The description and examples are to be considered as exemplary only, and the true scope and spirit of the present application are indicated by the following claims.

[0226] It should be understood that the present application is not limited to the exact structure described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.

Claims

1. A method for generating parameters of a horizontal well cluster with small well spacing, characterized in that: include: Obtain the required parameters for well cluster layout and ranging tool parameters; Determining a trajectory control tolerance of the top well in a vertical direction according to the well cluster layout requirement parameters; determining a magnetic ranging error based on the ranging tool parameters; Determining the number of wells in the well pattern according to a preset ranging error confidence factor, a preset wellbore trajectory control error, the trajectory control tolerance, the magnetic ranging error, and the well cluster layout requirement parameters; Determining a well pattern lateral offset according to the preset ranging error confidence factor, the magnetic ranging error, the preset well trajectory control error, the number of wells in the well pattern, and the well cluster layout requirement parameters; The well pattern layout is processed according to the number of wells in the well pattern, the lateral offset of the well pattern and the required parameters of the well cluster layout to determine the well pattern parameters of the horizontal well cluster.

2. The method for generating parameters of a small-well-spacing horizontal well cluster pattern according to claim 1, characterized in that: The required parameters for the well cluster layout include reservoir thickness, safety distance between the top well or bottom well and the reservoir boundary, well spacing, number of well pattern layers and three-dimensional well pattern form; Determining the trajectory control tolerance of the top well in the vertical direction according to the well cluster layout requirement parameters includes: Determine the design distance from the top well to the bottom well according to the number of well pattern layers, the well spacing, and the three-dimensional well pattern form; The trajectory control tolerance of the top well in the vertical direction is determined according to the reservoir thickness, the designed distance and the safe distance between the top well or the bottom well and the reservoir boundary.

3. The method for generating parameters of a small-well-spacing horizontal well cluster pattern according to claim 2, characterized in that: The preset wellbore trajectory control error includes a wellbore trajectory vertical control error, and the magnetic ranging error includes a well spacing direction ranging error and a well spacing direction normal spacing error; The determining of the number of wells in the well pattern according to a preset ranging error confidence factor, a preset wellbore trajectory control error, the trajectory control tolerance, the magnetic ranging error, and the well cluster layout requirement parameters includes: Determining the number of bottom wells based on the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the vertical control error of the well trajectory, the number of well pattern layers, the three-dimensional well pattern form, the preset ranging error confidence factor, and the trajectory control tolerance; The number of wells in the well pattern is determined according to the number of bottom wells and the number of well pattern layers.

4. The method for generating parameters of a small-well-spacing horizontal well cluster pattern according to claim 3, characterized in that: The calculation formula for determining the number of bottom wells based on the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the vertical control error of the wellbore trajectory, the number of well pattern layers, the three-dimensional well pattern form, the preset ranging error confidence factor and the trajectory control tolerance is: Wherein, n is the number of bottom wells, fix is the rounding function, ΔH is the trajectory control tolerance, m is the number of well network layers, k is the preset ranging error confidence factor, max is the maximum value function, and is the ranging error in the well spacing direction, It is a three-dimensional well network. is the normal spacing error in the well spacing direction, and the p v is the vertical control error of the wellbore trajectory; The calculation formula for determining the number of wells in the well pattern according to the number of bottom wells and the number of well pattern layers is: Wherein, N is the number of wells in the well pattern, m is the number of layers in the well pattern, and n is the number of wells in the bottom layer.

5. The method for generating parameters of a small-well-spacing horizontal well cluster pattern according to claim 3, characterized in that: The preset wellbore trajectory control error also includes a wellbore trajectory horizontal control error, and the number of wells in the well pattern includes the number of bottom wells; The determining of the well pattern lateral offset according to the preset ranging error confidence factor, the magnetic ranging error, the preset well trajectory control error, the number of wells in the well pattern, and the well cluster layout requirement parameters includes: The lateral offset of the well pattern is determined based on the number of bottom wells, the preset ranging error confidence factor, the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the horizontal control error of the wellbore trajectory, the number of well pattern layers and the three-dimensional well pattern form.

6. The method for generating parameters of a small-well-spacing horizontal well cluster pattern according to claim 5, characterized in that: The calculation formula for determining the lateral offset of the well pattern according to the number of bottom wells, the preset ranging error confidence factor, the ranging error in the well spacing direction, the normal spacing error in the well spacing direction, the horizontal control error of the well trajectory, the number of well pattern layers and the three-dimensional well pattern form is: Among them, the is the lateral offset of the well pattern, n is the number of bottom wells, k is the preset ranging error confidence factor, max is the maximum value function, is the ranging error in the well spacing direction, It is a three-dimensional well network. is the normal spacing error in the well spacing direction, and the p h is the horizontal control error of the wellbore trajectory, and m is the number of well pattern layers.

7. The method for generating parameters of a cluster of closely spaced horizontal wells according to any one of claims 2 to 6, characterized in that: The number of wells in the well pattern is distributed in the form of an equilateral triangle well pattern over the thickness of the reservoir.

8. A device for generating parameters of a horizontal well pattern of a small-well-spacing cluster, characterized in that: include: Parameter acquisition module, used to obtain the required parameters of well cluster layout and ranging tool parameters; a trajectory control tolerance acquisition module, configured to determine the trajectory control tolerance of the top well in the vertical direction according to the well cluster layout requirement parameters; A magnetic ranging error acquisition module, configured to determine a magnetic ranging error based on the ranging tool parameters; A well pattern well number acquisition module is used to determine the well pattern well number based on a preset ranging error confidence factor, a preset wellbore trajectory control error, the trajectory control tolerance, the magnetic ranging error, and the well cluster layout requirement parameters; a well pattern lateral offset acquisition module, configured to determine the well pattern lateral offset according to the preset ranging error confidence factor, the magnetic ranging error, the preset wellbore trajectory control error, the number of wells in the well pattern, and the well cluster layout requirement parameters; The horizontal well cluster pattern parameter acquisition module is used to perform well pattern layout processing according to the number of wells in the well pattern, the lateral offset of the well pattern and the well cluster layout requirement parameters, and determine the horizontal well cluster pattern parameters.

9. An electronic device, characterized in that: include: a processor, and a memory communicatively connected to the processor; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory to implement the method for generating well pattern parameters of a small-well-spacing horizontal well cluster according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer-executable instructions, which, when executed by a processor, are used to implement the method for generating parameters of a small-well-spacing horizontal well cluster pattern according to any one of claims 1 to 7.

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