Equipment working current acquisition method and related equipment

Abstract

The invention relates to an equipment working current acquisition method and related equipment. The method comprises the following steps: acquiring a working current initial value corresponding to equipment based on a sampling result of a current sampling unit corresponding to the equipment; acquiring a working temperature based on a sampling result of a temperature sampling unit corresponding to the equipment, and acquiring a corresponding current compensation value based on a reference temperature corresponding to the equipment and the working temperature; wherein the reference temperature corresponding to the equipment is the corresponding temperature when the equipment executes the current calibration process; and obtaining a working current final value corresponding to the equipment according to the working current initial value and the current compensation value. According to the invention, the accuracy of obtaining the working current of the equipment in the working process of the equipment can be ensured, so that the working current obtaining precision of the whole equipment is improved.

Description

Technical Field

[0001] The present invention relates to the field of circuit electronic technology, and more particularly to a method for obtaining device operating current and related equipment. Background Art

[0002] The explosive growth of new energy vehicles has driven the large-scale development of BMS energy storage systems. In BMS energy storage system applications, considering battery safety requirements, accurate current monitoring during battery operation can prevent overcharging, over-discharging, and short circuits, thereby avoiding safety accidents. Therefore, the accuracy of current acquisition directly affects the operation of the BMS energy storage system, such as affecting the SOC (battery state of charge) estimation error in the BMS energy storage system. However, in actual operation, the temperature of the BMS energy storage system fluctuates significantly during the actual use of the battery. This temperature change will directly affect the current acquisition results. In other words, the current acquisition results cannot truly reflect the actual current state of the battery during operation, thereby increasing the error in the SOC of the BMS energy storage system and affecting the user experience. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a method for obtaining the working current of a device and related equipment in response to some of the above technical defects in the prior art.

[0004] The technical solution adopted by the present invention to solve the technical problem is to construct a method for obtaining the working current of a device, the method comprising:

[0005] Acquire an initial working current value corresponding to the device based on a sampling result of a current sampling unit corresponding to the device;

[0006] Obtaining an operating temperature based on a sampling result of a temperature sampling unit corresponding to the device, and obtaining a corresponding current compensation value based on a reference temperature corresponding to the device and the operating temperature; wherein the reference temperature corresponding to the device is a temperature corresponding to when the device performs a current calibration process;

[0007] A final working current value corresponding to the device is obtained according to the initial working current value and the current compensation value.

[0008] Preferably, in an embodiment of the device operating current acquisition method of the present invention, the acquiring of the corresponding current compensation value based on the reference temperature corresponding to the device and the operating temperature includes:

[0009] Obtaining a difference between the operating temperature and the reference temperature as a temperature compensation value corresponding to the operating temperature, and obtaining a product of the temperature compensation value and a temperature calibration coefficient corresponding to the device as the current compensation value;

[0010] The obtaining of the final working current value according to the initial working current value and the current compensation value includes:

[0011] The product of the current calibration parameter corresponding to the device, the initial value of the working current and the sum of the current compensation value are obtained as the final value of the working current.

[0012] Preferably, in an embodiment of the method for obtaining the device operating current of the present invention, the method further includes:

[0013] The temperature calibration coefficient is obtained according to the initial value of the operating current and the current calibration parameter.

[0014] Preferably, in an embodiment of the device operating current acquisition method of the present invention, acquiring the temperature calibration coefficient according to the initial value of the operating current and the current calibration parameter includes:

[0015] The product of the initial value of the operating current, the current temperature adjustment coefficient corresponding to the device, and the current calibration parameter is obtained as the temperature calibration coefficient.

[0016] Preferably, in an embodiment of the method for obtaining the device operating current of the present invention, the method further comprises: obtaining the current calibration parameter according to a current calibration process of the device.

[0017] Preferably, in an embodiment of the method for obtaining the device operating current of the present invention, the method further includes:

[0018] Obtain a corresponding relationship between an initial value of the operating current corresponding to the device and the operating temperature, so as to obtain a current temperature adjustment coefficient corresponding to the device based on the corresponding relationship.

[0019] Preferably, in an embodiment of the device operating current acquisition method of the present invention, the step of acquiring a correspondence between an initial operating current value corresponding to the device and the operating temperature, and acquiring a current temperature adjustment coefficient corresponding to the device based on the correspondence, comprises:

[0020] Performing a function fit based on a plurality of operating temperatures and a plurality of initial operating current values ​​to obtain a curve of a change of the initial operating current value relative to the operating temperature;

[0021] The ratio of the slope of the change curve to the maximum operating current value of the device is obtained as the current temperature adjustment coefficient.

[0022] Preferably, in an embodiment of the method for obtaining the device operating current of the present invention, the device includes a BMS-based energy storage device;

[0023] The operating temperature corresponding to the device includes the BMS temperature of the BMS energy storage device;

[0024] The initial value of the operating current corresponding to the device includes the operating current obtained based on AFE data in the BMS energy storage device.

[0025] The present invention also provides an electronic device, comprising: a module for executing the method described above.

[0026] The present invention also provides an electronic device, comprising a memory and a processor;

[0027] The memory is used to store computer programs;

[0028] The processor is configured to execute the computer program to implement the method described above.

[0029] The device operating current acquisition method and related devices implemented in the present invention have the following beneficial effects: they can ensure the accuracy of obtaining the device operating current during the device operation process, thereby improving the accuracy of obtaining the entire device operating current. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The present invention will be further described below with reference to the accompanying drawings and embodiments, in which:

[0031] Figure 1 This is a flowchart of an embodiment of a method for obtaining a device's operating current according to the present invention;

[0032] Figure 2 This is a flowchart of another embodiment of a method for obtaining working current of a device according to the present invention;

[0033] Figure 3 This is a flowchart of another embodiment of a method for obtaining working current of a device according to the present invention;

[0034] Figure 4 It is a schematic diagram of a current temperature adjustment coefficient acquisition curve in a method for acquiring working current of a device according to the present invention. DETAILED DESCRIPTION

[0035] In order to have a clearer understanding of the technical features, purposes and effects of the present invention, specific embodiments of the present invention are now described in detail with reference to the accompanying drawings.

[0036] like Figure 1 FIG. 1 shows an embodiment of a method for obtaining a device operating current according to the present invention. Figure 1In an embodiment of a method for obtaining the working current of a device of the present invention, the following steps are included: S1. Obtaining an initial working current value corresponding to the device based on the sampling result of a current sampling unit corresponding to the device; S2. Obtaining the working temperature based on the sampling result of a temperature sampling unit corresponding to the device, and obtaining a corresponding current compensation value based on the reference temperature and the working temperature corresponding to the device; wherein the reference temperature corresponding to the device is the temperature corresponding to when the device performs a current calibration process; S3. Obtaining a final working current value corresponding to the device based on the initial working current value and the current compensation value.

[0037] Based on step S1, during normal operation of the device, a current sampling unit is usually set up inside the device to monitor the device's operating current. That is, based on the process of this embodiment, the current sampling unit can be understood as an existing setting of the device, and no additional setting is required. When the device is operating, the device obtains the corresponding operating current of the device based on the sampling result corresponding to the current sampling unit. The operating current can be understood as a sampling result obtained by the current sampling unit. Due to errors in the sampling result, the operating current obtained based on the sampling result may not be the actual operating current of the device during operation. Here, the process of obtaining the operating current based on the sampling result can be understood as a process of obtaining the initial value of the operating current. In some devices, the current sampling unit can be a current sampling resistor, so that the device obtains the corresponding sampling result through the current sampling resistor and monitors the device's operating current. The device processes the sampling result of the current sampling resistor through the corresponding data processing unit to obtain the initial value of the operating current corresponding to the device.

[0038] Based on step S2, during normal operation of the device, a temperature sampling unit is typically provided within the device to monitor the device's operating temperature. Specifically, based on the process of this embodiment, the temperature sampling unit can be understood as an existing device within the device and does not require additional provision. During operation, the device will obtain the device's corresponding operating temperature based on the sampling results corresponding to the temperature sampling unit. In some devices, the temperature sampling unit may include a temperature sampling resistor, allowing the device to obtain the corresponding sampling results through the temperature sampling resistor and monitor the device's operating temperature. The device then processes the sampling results of the temperature sampling resistor through a corresponding data processing unit to obtain the device's corresponding operating temperature.

[0039] At the same time, based on step S2, after obtaining the operating temperature corresponding to the device, the current compensation value corresponding to the device at this time can be obtained based on the operating temperature and the reference temperature of the device, wherein the reference temperature of the device is the temperature corresponding to the device performing the current calibration process. It is further understood that before the device works, it can first perform a current calibration process, wherein the operating temperature corresponding to the device when performing the current calibration process is the reference temperature. At this temperature, it can be understood that the current compensation value corresponding to the operating current of the device is set to zero, and the final value of the working current is directly obtained based on the obtained initial value of the working current. Among them, the reference temperature is set to a fixed value after the device completes the current calibration process, and can be stored in a preset position through a software processing process, so that it can be read as needed during the calculation process of the final value of the working current. In a specific embodiment, the reference temperature can take values ​​within the room temperature range, that is, the device performs the current calibration process under room temperature conditions.

[0040] After obtaining the current compensation value in step S3, the initial operating current value can be compensated with the current compensation value to obtain the final operating current value of the device. It is understood that the obtained final operating current value is correlated with the operating temperature. That is, during the device operating current acquisition process, the impact of the current operating temperature on the sampling result of the current sampling unit is comprehensively considered and corresponding compensation is performed, resulting in a higher accuracy of the entire operating current acquisition process.

[0041] In one embodiment, if Figure 2 As shown, in step S2, a corresponding current compensation value is obtained based on the device's corresponding reference temperature and operating temperature. This includes obtaining the difference between the operating temperature and the reference temperature as the temperature compensation value corresponding to the operating temperature, and obtaining the product of the temperature compensation value and the device's corresponding temperature calibration coefficient as the current compensation value. Specifically, the current compensation value can be obtained according to the formula α*T, where α is the device's corresponding temperature calibration coefficient and T is the temperature compensation value corresponding to the operating temperature, which is the difference between the device's current operating temperature and the reference temperature.

[0042] In step S3, the final value of the working current is obtained according to the initial value of the working current and the current compensation value, including: obtaining the product of the current calibration parameter corresponding to the device and the initial value of the working current and the sum of the current compensation value as the final value of the working current. That is, the formula I=I ac *C+α*T to obtain the final value of the working current; where I is the final value of the working current, I ac is the initial value of the working current, C is the current calibration parameter corresponding to the device, which can be understood as a constant, and α*T is the current compensation value.

[0043] That is, the final value of the device's operating current can be calculated using the above formula. In this formula, I acis the initial value of the working current, which can be obtained through the sampling result corresponding to the current sampling unit. C is the current calibration parameter corresponding to the device, and the current calibration parameter of the device can be understood as a constant related to the device. For a certain device, the current calibration parameter C of the device can be set to a fixed value. In the formula calculation, C can be understood as a known parameter. α*T is used to represent the current compensation value at the current operating temperature, where α is the temperature calibration coefficient and T is the temperature compensation value, which can be obtained by subtracting the reference temperature from the operating temperature. The current compensation value corresponding to the current operating temperature can be obtained by multiplying the temperature calibration coefficient and the temperature compensation value.

[0044] In one embodiment, if Figure 3 As shown, the device operating current acquisition method of the present invention further includes: obtaining a temperature calibration coefficient based on the initial operating current value and the current calibration parameter. Specifically, in the specific temperature calibration coefficient acquisition process, it is necessary to consider the calibration process of the current calibration parameter against the initial operating current value, so as to obtain a corresponding temperature calibration coefficient based on this calibration process. Then, compensation calculation is performed based on the temperature compensation value using the temperature calibration coefficient to obtain the current compensation value of the device based on the current operating temperature.

[0045] In step S21, the temperature calibration coefficient is obtained according to the initial value of the working current and the current calibration parameter, including: obtaining the product of the initial value of the working current, the current temperature adjustment coefficient corresponding to the device and the current calibration parameter as the temperature calibration coefficient. Specifically, it can be calculated according to the formula α=k*I ac *C obtains the temperature calibration coefficient; where k is the current temperature adjustment coefficient for the device, a constant. The device's current temperature adjustment coefficient, k, can be understood as a constant that is specific to the device. For a particular device, the current temperature adjustment coefficient, k, can be set to a fixed value. In other words, in the calculation formula, k can be understood as a known parameter. It should be understood that since the current calibration parameter is also a fixed value, the resulting temperature calibration parameter is only related to the device's initial operating current value.

[0046] Based on the above process, in one embodiment, the formula for obtaining the final value of the working current can be obtained as follows: I = I ac *C+k*I ac *C*(T ac ―T cali ); where T ac is the operating temperature of the device, T cali is the reference temperature of the device. Because the current calibration parameter C, the current temperature adjustment coefficient k and the reference temperature T cali are all known values, that is, the sampling results of the current sampling unit (corresponding to the initial value of the working current I ac) and the sampling results of the temperature sampling unit (corresponding to the working temperature T ac ) obtains the final value of the operating current of the device, so that the device performs corresponding operations according to the final value of the operating current, such as determining whether the device has overcurrent.

[0047] In one embodiment, the device operating current acquisition method of the present invention further includes: obtaining a current calibration parameter based on the device's current calibration process. That is, the current calibration parameter can be obtained during the device's current calibration process. Considering that the impact of the device's operating temperature on the operating circuit is not considered during the device calibration process, the device can be set to have different actual operating currents, and the initial operating current value can be obtained based on the sampling results of the current sampling unit. The actual operating current of the device can be detected with the aid of an auxiliary device. It can be understood that the actual operating current of the device and the initial operating current value have a one-to-one correspondence. The device can be set to correspond to multiple actual operating currents, obtaining multiple initial operating current values, and performing a linear function fit on the actual operating current and the initial operating current value to obtain a correspondence between the actual operating current and the initial operating current value. Based on this correspondence, the current calibration coefficient of the device can be obtained. For example, in a specific embodiment, the proportional relationship between the actual operating current and the initial operating current value can be obtained, that is, based on the ratio of the actual operating current to the initial operating current value. Alternatively, it can be understood that the slope of the obtained fitting function is the current calibration parameter corresponding to the device. The current calibration parameter is set to a fixed value after the device completes the current calibration process, and can be stored in a preset position through the software processing process so that it can be read as needed during the calculation of the final value of the working current.

[0048] In the above process, it should be understood that the device's current calibration process must be performed at the same temperature until it is finally completed. That is, the multiple actual operating currents and initial operating current values ​​obtained correspond to the same operating temperature of the device. Furthermore, when the device performs the current calibration process at different temperatures, the corresponding current calibration parameters may differ. Therefore, it is understood that there is also a one-to-one correspondence between the current calibration parameters and the device's reference temperature. In one embodiment, the device may perform the current calibration process at multiple different temperatures. When the device obtains the current calibration parameters, the reference temperature is simultaneously set. When a reference temperature is selected when obtaining the device's operating current, the current calibration parameters corresponding to that reference temperature are selected for calculation. It is understood that when the current calibration parameters are stored, the relationship between the current calibration parameters and the reference temperature can also be stored so that the corresponding reference temperature is obtained simultaneously when the current calibration parameters are obtained. In one specific embodiment, multiple current calibration parameters and multiple reference temperatures can be grouped and written into a table, with each group containing the current calibration parameters and the corresponding reference temperature. During the table reading process, the current calibration parameters and reference temperature of the same group are read to calculate the final operating current value.

[0049] In one embodiment, the device working current acquisition method of the present invention further includes: obtaining the corresponding relationship between the initial working current value corresponding to the device and the working temperature, so as to obtain the current temperature adjustment coefficient corresponding to the device based on the corresponding relationship. Specifically, the current temperature adjustment coefficient of the device is used to reflect the corresponding relationship between the working state of the current sampling unit of the device and the working temperature of the device. It can also be understood as being used to reflect the influence of the working temperature of the device on the process of sampling the working current of the device, and ultimately reflecting the influence on the obtained initial working current value. It is generally understood that when the device is fixed, the current sampling unit of the device will also remain unchanged, and the corresponding temperature characteristics will also be relatively fixed. Then, a corresponding relationship between the initial working current value of a stable device and the working temperature of the device can be obtained, and the corresponding relationship can be further reflected by setting a fixed current temperature adjustment coefficient. Conversely, it can also be understood that the current temperature adjustment coefficient is set based on the corresponding relationship.

[0050] In one embodiment, the correspondence between the initial working current value and the working temperature corresponding to the device is obtained to obtain the current temperature adjustment coefficient corresponding to the device based on the correspondence; including: performing a function fitting based on several working temperatures and several initial working current values ​​to obtain a change curve of the initial working current value relative to the working temperature; obtaining the ratio of the slope of the change curve and the maximum working current value of the device as the current temperature adjustment coefficient.

[0051] Specifically, the process of obtaining the current temperature adjustment coefficient corresponding to each device can be to obtain the initial working current values ​​at multiple different working temperatures for each device. It can be understood that in the process of obtaining the initial working current value, the working state of the device is kept unchanged, for example, the device is set to output power to the same load. The ambient temperature is set to change so that the working temperature of the device also changes accordingly. In the process of ambient temperature change, the working temperature of the device and the initial working current value corresponding to the working temperature are obtained based on different ambient temperatures. It can be understood that the working temperature of the device and the initial working current value are in a one-to-one correspondence, and multiple working temperatures and multiple initial working current values ​​can be obtained in the end.

[0052] A function fitting is performed on the obtained multiple device operating temperatures and multiple initial working current values ​​to obtain a corresponding fitting curve (a curve corresponding to the change of the initial working current value relative to the working temperature). It can be understood that the obtained fitting curve is a straight line, and the slope of the straight line is obtained, and the ratio of the slope to the maximum working current value of the device is the current temperature adjustment coefficient of the device. In one embodiment, during the operation of a BMS energy storage device, the initial working current value and the working temperature are fitted to obtain a fitting relationship y=82.062x-199373, corresponding to the following Figure 4 The fitting curve is shown in Figure 1, where the x-axis represents the device's operating temperature and the y-axis represents the device's initial operating current. Furthermore, based on the formula 82.062 / 200000 ≈ 0.041%, the current temperature adjustment coefficient for this device is calculated to be 0.041%. Here, 200000 represents the device's maximum operating current. For example, the device's maximum discharge current can be obtained based on its design parameters and is considered a known parameter for the device.

[0053] In one embodiment, in the device operating current acquisition method of the present invention, the device includes a BMS-based energy storage device, the operating temperature corresponding to the device includes the BMS temperature of the energy storage device; the initial value of the operating current corresponding to the device includes the operating current obtained based on the AFE data in the BMS energy storage device. That is, in the BMS energy storage device, the BMS temperature obtained by the energy storage device is the operating temperature corresponding to the device. In the BMS energy storage device, one or more temperature sampling resistors can be set to perform temperature sampling to obtain the BMS temperature. When multiple temperature sampling resistors are set, they can be set at different positions to perform temperature sampling at different positions to obtain multiple temperature samples, and the sampling results of the multiple temperature samples can be mathematically processed, such as averaging, to obtain the BMS temperature. In a specific BMS energy storage device, one temperature sampling resistor can be set near the current sampling unit, and the other temperature sampling resistor can be set near the power switch in the energy storage device, such as the discharge switch or the charging switch.

[0054] At the same time, it can be understood that in the BMS energy storage device, the AFE module will be used to monitor the working parameters of the energy storage device. For example, the voltage value of the current sampling resistor in the BMS energy storage device is collected by the AFE module, and the corresponding current sampling value is calculated based on the voltage value. Therefore, in a specific embodiment, the initial working current value corresponding to the BMS energy storage device can be obtained based on the AFE data generated when the AFE module is working. Then, finally, according to I bms =I FAE *(1+0.041%*(T bms ―T cali ))*C obtains the final working current value I corresponding to the BMS device bms , where 0.041% is the current temperature adjustment coefficient obtained based on the above process, I FAE The BMS operating current reported by the AFE module in the BMS energy storage device, T bms is the BMS temperature of the BMS energy storage device.

[0055] In the above process, the current is compensated by the BMS temperature obtained by the BMS system in the BMS energy storage device, so that during the operation of the BMS energy storage device, the collected current value is compensated and corrected according to the temperature change of the energy storage device, such as the battery during use, so as to improve the current acquisition accuracy of the BMS energy storage system.

[0056] In addition, an electronic device of the present invention has the function of implementing the corresponding steps performed in the above-mentioned method. Each function can be implemented by hardware, or by hardware executing corresponding software implementations. The corresponding hardware or software includes one or more modules corresponding to the above-mentioned functions. That is, the steps of the above-mentioned method are respectively performed by one or more modules. The specific coordination operations between the various modules can be referred to the specific process of the above-mentioned method and will not be repeated here.

[0057] In addition, an electronic device of the present invention may further include a memory and a processor; the memory is used to store a computer program; the processor is used to execute the computer program to implement the above method. Specifically, according to an embodiment of the present invention, the process described above with reference to the flowchart can be implemented as a computer software program. For example, an embodiment of the present invention includes a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program contains program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed by an electronic device and, when executed, performs the above functions defined in the method of the embodiment of the present invention. The electronic device in the present invention may be a terminal such as a notebook, desktop, tablet computer, smart phone, or a server.

[0058] It is understandable that the above embodiments only express the preferred implementation modes of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the patent scope of the present invention. It should be pointed out that for ordinary technicians in this field, without departing from the concept of the present invention, the above technical features can be freely combined, and several deformations and improvements can be made, all of which fall within the scope of protection of the present invention. Therefore, all equivalent changes and modifications made to the scope of the claims of the present invention should fall within the scope of coverage of the claims of the present invention.

Claims

1. A method for obtaining a device's operating current, characterized in that: The method comprises: Acquire an initial working current value corresponding to the device based on a sampling result of a current sampling unit corresponding to the device; Obtaining an operating temperature based on a sampling result of a temperature sampling unit corresponding to the device, and obtaining a corresponding current compensation value based on a reference temperature corresponding to the device and the operating temperature; wherein the reference temperature corresponding to the device is a temperature corresponding to when the device performs a current calibration process; A final working current value corresponding to the device is obtained according to the initial working current value and the current compensation value.

2. The method for obtaining the device operating current according to claim 1, characterized in that: The obtaining a corresponding current compensation value based on a reference temperature corresponding to the device and the operating temperature includes: Obtaining a difference between the operating temperature and the reference temperature as a temperature compensation value corresponding to the operating temperature, and obtaining a product of the temperature compensation value and a temperature calibration coefficient corresponding to the device as the current compensation value; The obtaining of the final working current value according to the initial working current value and the current compensation value includes: The product of the current calibration parameter corresponding to the device, the initial value of the working current and the sum of the current compensation value are obtained as the final value of the working current.

3. The method for obtaining the device operating current according to claim 2, characterized in that: The method further comprises: The temperature calibration coefficient is obtained according to the initial value of the operating current and the current calibration parameter.

4. The method for obtaining the device operating current according to claim 3, characterized in that: The obtaining of the temperature calibration coefficient according to the initial value of the operating current and the current calibration parameter includes: The product of the initial value of the operating current, the current temperature adjustment coefficient corresponding to the device, and the current calibration parameter is obtained as the temperature calibration coefficient.

5. The method for obtaining the device operating current according to claim 3, characterized in that: The method further includes: obtaining the current calibration parameter according to a current calibration process of the device.

6. The method for obtaining the device operating current according to claim 4, characterized in that: The method further comprises: Obtain a corresponding relationship between an initial value of the operating current corresponding to the device and the operating temperature, so as to obtain a current temperature adjustment coefficient corresponding to the device based on the corresponding relationship.

7. The method for obtaining the device operating current according to claim 6, characterized in that: The step of obtaining a correspondence between an initial value of the operating current corresponding to the device and the operating temperature, and obtaining a current temperature adjustment coefficient corresponding to the device based on the correspondence, includes: Performing a function fit based on a plurality of operating temperatures and a plurality of initial operating current values ​​to obtain a curve of a change of the initial operating current value relative to the operating temperature; The ratio of the slope of the change curve to the maximum operating current value of the device is obtained as the current temperature adjustment coefficient.

8. The method for obtaining device operating current according to claim 1, characterized in that: The device includes a BMS-based energy storage device, The operating temperature corresponding to the device includes the BMS temperature of the BMS energy storage device; The initial value of the operating current corresponding to the device includes the operating current obtained based on AFE data in the BMS energy storage device.

9. An electronic device, characterized in that: The electronic device comprises: a module for executing the method according to any one of claims 1 to 8.

10. An electronic device, characterized in that: including memory and processor; The memory is used to store computer programs; The processor is configured to execute the computer program to implement the method according to any one of claims 1 to 8.

Images