Method for monitoring working state of power supply in high-temperature environment and high-temperature power supply

Abstract

The invention relates to the technical field of power supply fault monitoring, in particular to a method for monitoring the working state of a power supply in a high-temperature environment and a high-temperature power supply, and the method comprises the steps: integrating the difference between a voltage deviation value and a difference value of temperature data in all time periods within a preset duration before each moment; determining a first fault factor according to the voltage deviation values of all time periods and a fusion result of the voltage deviation values of all time periods; and analyzing the average distribution of the high-frequency ripple energy in all the time periods and the similarity between the vibration characteristic value and the ripple coefficient in all the time periods, determining a second fault factor, and determining a comprehensive fault factor of the high-temperature power supply at each moment in combination with the first fault factor so as to monitor the working state of the high-temperature power supply. The problem that the abnormal working state of the high-temperature power supply is difficult to accurately capture because the stability of the power supply system is monitored only through the ripple signal integral value is solved, and the sensitivity of early fault monitoring of the high-temperature power supply is improved.

Description

Technical Field

[0001] The present application relates to the technical field of power supply fault monitoring, and in particular to a method for monitoring the working status of a power supply in a high-temperature environment and a high-temperature power supply. Background Art

[0002] With the continuous advancement of industrial technology, the demand for power supplies in high-temperature environments is increasing. In oil and gas drilling platforms, downhole tools, logging-while-drilling equipment, and electronic components for fracturing operations all require stable DC power supplies. Temperatures in deep and ultra-deep wells can reach over 150°C, and due to drilling operations, equipment is often subject to strong vibrations. Compared to conventional switching power supplies, high-temperature power supplies are less robust in these extreme environments, and faults can develop more quickly. Shutdown operations must be performed at the earliest stages of a fault to prevent further damage. Therefore, high-sensitivity monitoring of the operating status of high-temperature power supplies is required.

[0003] Existing technologies utilize the high-temperature power supply's integration circuit to detect the integral value of the ripple signal over a long period of time, thus avoiding the impact of short-term noise on high-temperature power supply data measurement. This reduces the probability of false alarms and improves system reliability. However, in oil and gas drilling platforms, the early signs of a high-temperature power supply failure are relatively subtle in the ripple. Monitoring the power supply system's stability solely through the integral value of the ripple signal is difficult to accurately detect abnormal power supply operating conditions, resulting in poor sensitivity in early-stage high-temperature power supply failure detection. Summary of the Invention

[0004] In order to solve the above technical problems, the purpose of this application is to provide a method for monitoring the working status of a power supply in a high-temperature environment and a high-temperature power supply. The technical solutions adopted are as follows:

[0005] In a first aspect, an embodiment of the present application provides a method for monitoring the working status of a power supply in a high temperature environment, the method comprising the following steps:

[0006] Intelligent sensors are used to collect the voltage data and vibration acceleration of the high-temperature power supply in real time, and the temperature data at the start of each period is obtained as the temperature data of each period;

[0007] Comparing the difference between the average distribution of all voltage data in each time period and the preset rated output voltage of the high-temperature power supply to determine the voltage offset value of each time period; combining the difference between the voltage offset value and the differential value of the temperature data in all time periods within a preset time period before each moment, and the fusion result of the voltage offset value of all time periods, to determine the first fault factor of the high-temperature power supply at each moment;

[0008] Obtain a spectrum sequence of all voltage data in each time period above a preset switching frequency in the frequency domain, and determine the high-frequency ripple energy of the high-temperature power supply in each time period by combining the modulus lengths of all elements in the spectrum sequence; determine the vibration characteristic value of the high-temperature power supply in each time period based on the distribution of all vibration accelerations in each time period; obtain the ripple coefficient of each time period based on all voltage data in each time period, analyze the average distribution of high-frequency ripple energy in all time periods within a preset time period before each moment, determine the energy distribution value of the high-temperature power supply at each moment, and determine the second fault factor of the high-temperature power supply at each moment by combining the similarity between the vibration characteristic value and the ripple coefficient in all time periods;

[0009] The discrete degree of temperature data of all time periods within the preset time period before each moment and the cumulative sum of vibration characteristic values ​​of all time periods are used as the weights of the first fault factor and the second fault factor respectively to determine the comprehensive fault factor of the high-temperature power supply at each moment to monitor the working status of the high-temperature power supply.

[0010] Preferably, the voltage offset value of each time period is the difference between the average value of all voltage data in each time period and the preset rated output voltage of the high temperature power supply.

[0011] Preferably, the expression of the first failure factor of the high temperature power supply at each moment is: F i =D i ×ΔU i Where, F i represents the first failure factor of the high-temperature power supply at time i; D i Indicates the DTW distance between the normalized value of the voltage offset value and the normalized value of the temperature data difference value in all time periods within the preset time period before time i; ΔU i Represents the cumulative sum of voltage deviation values ​​in all time periods within a preset time period before time i.

[0012] Preferably, the high-frequency ripple energy of the high-temperature power supply in each time period is the cumulative sum of the module lengths of all elements in the frequency spectrum sequence of each time period.

[0013] Preferably, the vibration characteristic value of the high-temperature power supply in each time period is the mean square value of all vibration accelerations in each time period.

[0014] Preferably, the energy distribution value of the high-temperature power supply at each moment is the average value of the high-frequency ripple energy in all time periods within a preset time period before each moment.

[0015] Preferably, the expression of the second failure factor of the high temperature power supply at each moment is: S i =(sim i +δ)×E i Where S i represents the second failure factor of the high temperature power supply at time i; simi Indicates the similarity between the ripple coefficient and the vibration characteristic value in all time periods within the preset time period before time i; E i represents the energy distribution value of the high-temperature power supply at time i; δ represents a constant preset to be greater than 1.

[0016] Preferably, the expression of the comprehensive failure factor of the high temperature power supply at each moment is: T i =w1 i ×F i +w2 i ×S i Where, T i represents the comprehensive failure factor of the high-temperature power supply at time i; w1 i 、w2 i They represent the discrete degree of temperature data in all periods within the preset time period before time i and the cumulative sum of vibration characteristic values ​​in all periods; F i 、S i They represent the first fault factor and the second fault factor of the high-temperature power supply at time i respectively.

[0017] Preferably, the controlling of the working state of the high-temperature power supply includes:

[0018] The preset time length before each moment is used to form a monitoring window, and the voltage data, vibration acceleration and temperature data within a preset number of monitoring windows when the high-temperature power supply is working normally under oil and gas drilling are obtained. For each monitoring window, the comprehensive fault factor within the preset number of monitoring windows is obtained according to the method for obtaining the comprehensive fault factor, and the maximum comprehensive fault factor is used as the fault threshold. If the comprehensive fault factor of the high-temperature power supply at the current moment is greater than the fault threshold, the working state of the high-temperature power supply at the current moment is abnormal; otherwise, the working state of the high-temperature power supply is normal.

[0019] In a second aspect, an embodiment of the present application also provides a high-temperature power supply, comprising a memory, a processor, and a computer program stored in the memory and running on the processor. When the processor executes the computer program, the steps of a method for monitoring the working status of a power supply in a high-temperature environment as described above are implemented.

[0020] This application has at least the following beneficial effects:

[0021] First, the substrate material of the high-temperature power supply in this application is lithium oxide, which replaces the PCB board in the prior art, and the material of the shell is pure copper plated with gold. At the same time, a heat dissipation structure is provided inside the package shell to improve the heat dissipation efficiency of the high-temperature power supply, so that it can maintain efficient and stable power output in a high-temperature environment, and provide strong protection for the operation of other electrical equipment; further, this application installs a variety of intelligent sensors to collect the voltage data of the high-temperature power supply, the vibration acceleration and temperature data of its working environment, and constructs the first fault factor by integrating the difference between the voltage offset value and the temperature data in all time periods within a preset time period before each moment, as well as the fusion result of the voltage offset value of all time periods, to more accurately identify the voltage instability caused by the feedback circuit failure, thereby achieving early warning and improving Sensitivity of early working status monitoring of high-temperature power supplies; further, the present application constructs a second fault factor by analyzing the high-frequency ripple energy, environmental vibration characteristics and their correlation with the ripple coefficient of the high-temperature power supply output voltage, which can effectively monitor the power supply status and can sensitively reflect the risk of contact failure of the filter circuit due to factors such as vibration, thereby realizing early warning of the high-temperature power supply and improving the sensitivity of early working status monitoring of the high-temperature power supply; this embodiment analyzes voltage offset, high-frequency ripple, environmental vibration and temperature changes through the fusion of multiple intelligent sensors, and constructs a comprehensive fault factor that can reflect potential faults of the feedback circuit and the filter circuit, which helps to evaluate the overall failure risk of the power supply, and can achieve early warning in harsh environments such as oil and gas drilling, thereby improving the sensitivity of early working status monitoring of the high-temperature power supply. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions and advantages of the embodiments of the present application or the prior art, the following is a brief introduction to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0023] Figure 1 A flowchart of a method for monitoring the working status of a power supply in a high-temperature environment provided by one embodiment of the present application;

[0024] Figure 2 A schematic diagram of a comprehensive fault factor extraction process provided in one embodiment of the present application. DETAILED DESCRIPTION

[0025] To further illustrate the technical means and effects employed by this application to achieve the intended invention objectives, the following, in conjunction with the accompanying drawings and preferred embodiments, details the specific implementation, structure, features, and effects of a method for monitoring the operating status of a power supply in a high-temperature environment and a high-temperature power supply proposed in this application. In the following description, different references to "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. Furthermore, specific features, structures, or characteristics of one or more embodiments may be combined in any suitable manner.

[0026] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0027] The following describes in detail a method for monitoring the working status of a power supply in a high-temperature environment and a specific solution for a high-temperature power supply provided by the present application in conjunction with the accompanying drawings.

[0028] See also Figure 1 , which shows a flowchart of a method for monitoring the working status of a power supply in a high-temperature environment provided by an embodiment of the present application, the method comprising the following steps:

[0029] Step S1: using an intelligent sensor to collect the voltage data and vibration acceleration of the high-temperature power supply in real time, and obtaining the temperature data at the start time of each preset time period as the temperature data of each time period.

[0030] The high-temperature power supply proposed in this embodiment includes the following functions:

[0031] The soft start circuit can slowly increase the input current after the high temperature power supply starts and the fault is eliminated, making it easy to connect a large-capacity output filter capacitor and reduce the startup impact.

[0032] The power supply feedback circuit can isolate the input and output of the high-temperature power supply, and can achieve high-precision and high-efficiency control of the output voltage to ensure the stability of the high-temperature power supply output voltage.

[0033] The undervoltage and overvoltage shutdown circuits protect the high-temperature power supply by stopping it when the input voltage exceeds the specified range. In this embodiment, the undervoltage and overvoltage shutdown voltages are within 5V of the rated voltage. For example, for a rated input range of 24-72V, the undervoltage shutdown voltage is 21-23.9V, and the overvoltage shutdown voltage is 72.1-77V.

[0034] Output short circuit and overload automatic shutdown circuit. In this embodiment, when the output exceeds 150% of the rated output power for 0.1s, the high-temperature power supply cuts off all outputs. When the overcurrent fault is eliminated, it automatically enters soft start mode and restores the output voltage. If the output overload lasts less than 0.1s, the high-temperature power supply does not take action.

[0035] The shutdown terminal controls the operating state of the high-temperature power supply. If a fault is detected, the high-temperature power supply switches to a sleep state, protecting the power supply and other devices. In this embodiment, the shutdown terminal is active high. When the voltage is between 3.2 and 5.3V, the high-temperature power supply enters a sleep state, cutting off all outputs and reducing the input current to less than 1mA. When the voltage is between 0 and 2.5V or left floating, the high-temperature power supply operates normally. The input voltage of the shutdown terminal must not exceed 12.0V.

[0036] Taking into account the heat dissipation requirements of the high-temperature power supply, the substrate material of the high-temperature power supply in this embodiment is lithium oxide, and the shell material is pure copper plated with gold. At the same time, a heat dissipation structure is provided inside the packaging shell to improve the heat dissipation efficiency of the high-temperature power supply, so that it can maintain efficient and stable power output in a high-temperature environment, providing strong protection for the operation of other electrical equipment.

[0037] The high temperatures and strong earthquakes experienced in oil and gas drilling environments increase the probability of output voltage deviation and excessive ripple voltage in high-temperature power supplies. To protect the high-temperature power supply and the electrical equipment used in oil and gas drilling, when the high-temperature power supply is detected in these operating states, the shutdown terminal of the high-temperature power supply must be set to a high level, causing it to enter a dormant state.

[0038] In the high-temperature and strong-seismic operating environments of oil and gas drilling, temperature fluctuations can easily degrade the operating stability of high-temperature power supply electronic components, causing output voltage deviations. Furthermore, strong earthquakes can disrupt the stability of internal component connections, causing filter circuit connections to loosen or break, increasing output voltage ripple. High-temperature power supplies exhibit poor robustness in these extreme operating environments, requiring prompt shutdown in abnormal operating conditions to prevent further failures from developing into more serious problems.

[0039] Therefore, this embodiment installs multiple intelligent sensors to comprehensively monitor the working status of the high-temperature power supply and changes in the working environment. By utilizing the correlation characteristics between working environment data and working status data at the early stage of a high-temperature power supply failure, multi-sensor data fusion is used to improve the sensitivity of monitoring the working status of the high-temperature power supply. Specifically:

[0040] An intelligent voltage sensor is used to collect the voltage data output by the high-temperature power supply in real time. In this embodiment, the sampling frequency of the voltage data is set to 500kHz to capture the high-frequency ripple voltage characteristics; an intelligent acceleration sensor is used to collect the vibration acceleration of the high-temperature power supply in real time. In this embodiment, the sampling frequency of the vibration acceleration is set to 5kHz. In actual application, as other implementation methods, the implementer can also set the sampling frequency of the voltage data and vibration acceleration according to the specific situation. This embodiment does not impose any special restrictions.

[0041] The collected voltage and acceleration data are segmented. This embodiment uses 500ms as the preset length of each time period, that is, the length of each time period is 500ms. In actual application, as other implementation methods, implementers can also set their own settings based on specific circumstances. This embodiment does not impose any special restrictions. Furthermore, considering the impact of random noise on data acquisition in the high-temperature power supply working environment, this embodiment applies the 3σ principle to eliminate voltage data and vibration acceleration data that exceed the mean ±3 times the standard deviation range for each time period, completing outlier screening. Furthermore, linear interpolation is used to fill in the data at the screened-out locations to ensure that the amount of data in each time period is equal, avoiding the impact of missing data on subsequent analysis. Ultimately, the voltage data and vibration acceleration of the high-temperature power supply in each time period are obtained.

[0042] Furthermore, this embodiment uses an intelligent temperature sensor to collect the working environment temperature of the high-temperature power supply once at the beginning of each time period as the temperature data of each time period.

[0043] Furthermore, in order to eliminate the influence of data dimension, the collected voltage data, vibration acceleration and temperature data are normalized respectively. In this embodiment, the maximum and minimum value normalization method is used to normalize the data. In actual application, as other implementation methods, the implementer can also use the z-score normalization method to normalize the data according to the specific situation. Regarding the selection of normalization method, this embodiment does not impose any special restrictions.

[0044] In this embodiment, all contents involving normalization processing adopt the maximum and minimum value normalization method.

[0045] Step S2: Compare the difference between the average distribution of all voltage data in each time period and the preset rated output voltage of the high-temperature power supply to determine the voltage offset value of each time period; comprehensively analyze the difference between the voltage offset value and the differential value of the temperature data in all time periods within the preset time period before each moment, as well as the fusion result of the voltage offset value of all time periods, to determine the first fault factor of the high-temperature power supply at each moment.

[0046] When monitoring early-stage faults in high-temperature power supplies, data from a single time period only reflects the power supply's status at a specific point in time, lacking information on dynamic trends. Furthermore, during normal operation, voltage data will fluctuate within a certain range. These fluctuations are numerically similar to the early-stage fault characteristics of high-temperature power supplies, making it difficult to effectively distinguish between the two within a single time period, resulting in reduced monitoring sensitivity.

[0047] The core function of the power supply feedback circuit in a high-temperature power supply is to maintain the stability of the output voltage. It monitors the output voltage in real time and compares the monitored voltage signal with the rated output voltage of the high-temperature power supply, thereby adjusting the control circuit to keep the output voltage within the target range. This closed-loop control mechanism is crucial to the performance of the high-temperature power supply, especially in the harsh working environment of oil and gas drilling.

[0048] When the electronic devices inside a high-temperature power supply are operating, temperature has a significant impact on the devices. For example, resistors experience resistance deviations due to temperature changes, which in turn affects the output voltage. The input bias current or offset voltage of an op amp also changes due to temperature, causing the output voltage to deviate from the rated voltage. Therefore, when the temperature changes, a failure in the power supply feedback circuit can cause the high-temperature power supply to be unable to accurately regulate the output voltage.

[0049] Therefore, this embodiment determines the voltage offset value of each time period by comparing the difference between the average distribution of all voltage data in each time period and the preset rated output voltage of the high-temperature power supply; comprehensively combines the difference between the voltage offset value and the differential value of the temperature data in all time periods within the preset time period before each moment, and the fusion result of the voltage offset values ​​of all time periods to determine the first fault factor of the high-temperature power supply at each moment, thereby eliminating the interference of the temperature change of the high-temperature power supply on the high-temperature power supply fault monitoring, specifically:

[0050] First, this embodiment determines the voltage offset value of each time period by comparing the average distribution of all voltage data in each time period with the preset rated output voltage of the high-temperature power supply, specifically:

[0051] In this embodiment, the difference between the average value of all voltage data in each time period and the preset rated output voltage of the high temperature power supply is used as the voltage offset value of each time period, wherein the difference is the absolute value of the difference.

[0052] It should be noted that the value of the preset rated output voltage of the high-temperature power supply is set artificially. The value of the preset rated voltage is generally determined by the properties of the high-temperature power supply. In this embodiment, the value of the preset rated output voltage is 12V. In actual application, as other implementation methods, the implementer can also set it by himself based on the specific situation. This embodiment does not impose any special restrictions.

[0053] According to the voltage offset value in each time period, it can be understood that if the voltage offset value is larger, it indicates that the output voltage of the high-temperature power supply deviates more seriously from its rated output voltage, indicating that the stability performance of the high-temperature power supply is reduced; conversely, if the voltage offset value is larger, it indicates that the output voltage of the high-temperature power supply is closer to its rated output voltage, indicating that the stability of the high-temperature power supply is better.

[0054] Furthermore, this embodiment determines the first fault factor of the high-temperature power supply at each moment by integrating the difference between the voltage offset value and the temperature data in all time periods within a preset time period before each moment, and the fusion result of the voltage offset values ​​in all time periods, specifically:

[0055] As an implementation method, in this embodiment, the first fault factor F of the high temperature power supply at time i is i The expression is: F i =D i ×ΔU i Where, D i Indicates the DTW distance between the normalized value of the voltage offset value and the normalized value of the temperature data difference value in all time periods within the preset time period before time i; ΔU i Represents the cumulative sum of voltage deviation values ​​in all time periods within a preset time period before time i.

[0056] The calculation method of the DTW distance is a well-known technology, and its specific calculation process is not repeated here.

[0057] It should be noted that the value of the preset time length is set manually. In this embodiment, the value of the preset time length is 10s. In actual application, as other implementation methods, the implementer can also set it by himself based on the specific situation. This embodiment does not impose any special restrictions.

[0058] According to the first fault factor of the high-temperature power supply at each moment, it can be understood that the DTW distance between the normalized value of the voltage offset value and the normalized value of the differential value of the temperature data in all time periods reflects the correlation between temperature change and voltage offset, and reflects the ability of the high-temperature power supply feedback circuit to adjust the output voltage when responding to temperature change. If the DTW distance is larger, the corresponding first fault factor is also larger, which means that when the temperature changes, the voltage offset pattern of the output of the high-temperature power supply feedback circuit is not strongly correlated with the temperature change pattern, the adjustment behavior may be relatively chaotic or lagging, the adjustment performance is poor, and the possibility of failure is greater; at the same time, if the cumulative sum of the voltage offset values ​​is larger, it indicates that the voltage regulation performance of the high-temperature power supply is poor and the output voltage is unstable. At this time, the possibility of failure of the high-temperature power supply is greater, and therefore, the corresponding first fault factor is larger;

[0059] On the contrary, if the DTW distance is smaller, the corresponding first fault factor is also smaller, which means that when the temperature changes, the voltage offset pattern of the output of the high-temperature power supply feedback circuit is more closely correlated with the temperature change pattern. At the same time, if the cumulative sum of the voltage offset values ​​is smaller, it indicates that the voltage regulation performance of the high-temperature power supply is good and the output voltage is relatively stable. At this time, the possibility of a fault in the high-temperature power supply is smaller, and therefore, the corresponding first fault factor is smaller.

[0060] Thus, this embodiment effectively monitors the health of the high-temperature power supply feedback circuit by analyzing the voltage offset value and its correlation with temperature changes. It not only takes into account the degree of voltage deviation, but also combines the matching degree of voltage offset and temperature fluctuation pattern. It can eliminate temperature interference and more accurately identify voltage instability caused by feedback circuit failure, thereby achieving early warning and improving the sensitivity of early working status monitoring of the high-temperature power supply.

[0061] Step S3: Obtain a spectrum sequence of all voltage data in each time period above a preset switching frequency in the frequency domain, and determine the high-frequency ripple energy of the high-temperature power supply in each time period by integrating the modulus lengths of all elements in the spectrum sequence; determine the vibration characteristic value of the high-temperature power supply in each time period based on the distribution of all vibration accelerations in each time period; obtain the ripple coefficient of each time period based on all voltage data in each time period, analyze the average distribution of high-frequency ripple energy in all time periods within a preset time length before each moment, determine the energy distribution value of the high-temperature power supply at each moment, and determine the second fault factor of the high-temperature power supply at each moment by combining the similarity between the vibration characteristic value and the ripple coefficient in all time periods.

[0062] Since ripple is unavoidable in the output voltage of a high-temperature power supply, when the filter circuit fails, the high-frequency components in the ripple will increase. Therefore, this embodiment obtains a frequency spectrum sequence of all voltage data in each time period above a preset switching frequency in the frequency domain, and integrates the modulus lengths of all elements in the frequency spectrum sequence to determine the high-frequency ripple energy of the high-temperature power supply in each time period. Specifically,

[0063] In this embodiment, a fast Fourier transform algorithm is used to obtain a frequency spectrum sequence of all voltage data in each time period above a preset switching frequency in the frequency domain, wherein the preset switching frequency is 200 kHz. The implementer may also set the switching frequency according to the specific situation, and this embodiment does not impose any special restrictions.

[0064] The fast Fourier transform algorithm is a well-known technology, and the specific process of obtaining the spectrum sequence using it will not be described in detail.

[0065] Furthermore, in this embodiment, the accumulated sum of the modulus lengths of all elements in the spectrum sequence of each time period is used as the high-frequency ripple energy of the high-temperature power supply in each time period.

[0066] According to the high-frequency ripple energy of the high-temperature power supply in each time period, it can be understood that the high-frequency ripple energy is used to measure the voltage energy contained in the frequency band above the switching frequency in the output voltage of the high-temperature power supply, reflecting the intensity of the high-frequency ripple in the output voltage of the high-temperature power supply. If the high-frequency ripple energy is larger, it indicates that the high-temperature power supply may have a fault such as poor contact, resulting in its ability to suppress high-frequency ripple weakened; conversely, if the high-frequency ripple energy is smaller, it indicates that the power supply's filter circuit is working properly, can effectively suppress high-frequency ripple, and the output voltage has a high purity. In addition, if the difference between the vibration acceleration and the voltage data is too large, the acceleration data needs to be pre-processed in advance. Therefore, this embodiment determines the vibration characteristic value of the high-temperature power supply in each time period based on the distribution of all vibration accelerations in each time period, specifically:

[0067] In this embodiment, the mean square value of all vibration accelerations in each time period is used as the vibration characteristic value of the high-temperature power supply in each time period.

[0068] The calculation method of the mean square value is a well-known technology, and its specific calculation process will not be repeated here.

[0069] According to the vibration characteristic values ​​of the high-temperature power supply in each period, it can be understood that the vibration characteristic values ​​quantify the vibration intensity of the high-temperature power supply and its surrounding environment. If the vibration characteristic value is larger, it means that the vibration of the high-temperature power supply is more intense. Conversely, if the vibration characteristic value is smaller, it means that the high-temperature power supply is relatively stable.

[0070] Furthermore, the ripple coefficient of each time period is calculated based on all voltage data in each time period. The size of the ripple coefficient reflects the proportion of residual components in the DC voltage. The smaller the ripple coefficient, the higher the stability of the high-temperature power supply in the corresponding time period. Among them, the calculation method of the ripple coefficient is a well-known technology, and its specific calculation process will not be repeated.

[0071] Furthermore, this embodiment determines the energy distribution value of the high-temperature power supply at each moment by analyzing the average distribution of high-frequency ripple energy in all time periods within a preset time period before each moment. The second fault factor of the high-temperature power supply at each moment is determined by combining the similarity between the vibration characteristic value and the ripple coefficient in all time periods. Specifically, it is:

[0072] As an implementation manner, in this embodiment, the average value of the high-frequency ripple energy in all time periods within a preset time period before each moment is used as the energy distribution value of the high-temperature power supply at each moment.

[0073] In this embodiment, the second fault factor S of the high temperature power supply at time i is i The expression is: S i =(sim i +δ)×E i Where, sim iIndicates the similarity between the ripple coefficient and the vibration characteristic value in all time periods within the preset time period before time i; E i Indicates the energy distribution value of the high temperature power supply at time i; δ indicates a constant greater than 1, which is used to prevent sim i +δ is a negative number. The value of δ is set artificially. In this embodiment, the value of δ is 2. i Under the premise that +δ is not a negative number and does not excessively affect the calculation results, the implementer can also set it according to the specific situation. This embodiment does not impose any special restrictions.

[0074] It should be noted that there are many methods for measuring the similarity between data groups. In this embodiment, the cosine similarity between the ripple coefficient and the vibration characteristic value in all time periods within the preset time length before moment i is used as the similarity between the ripple coefficient and the vibration characteristic value in all time periods within the preset time length before moment i. In actual application, as other implementation methods, the implementer may also adopt other methods for measuring the similarity between data groups, such as the reciprocal of the Euclidean distance, based on specific circumstances. This embodiment does not impose any special restrictions on the selection of methods for measuring the similarity between data.

[0075] The calculation method of cosine similarity is a well-known technology, and its specific calculation process will not be described in detail.

[0076] According to the second fault factor of the high-temperature power supply at each moment, it can be understood that if the similarity between the ripple coefficient and the vibration characteristic value in all time periods within the preset time length before moment i is greater, it means that the change pattern of the ripple coefficient and the vibration characteristic value is more similar, indicating that the change pattern of the high-temperature power supply voltage ripple size and the environmental vibration intensity is closer, which means that the possibility of vibration-induced filter circuit failure is greater, and therefore, the corresponding second fault factor is larger; at the same time, if the mean value of the high-frequency ripple energy is greater, that is, the energy distribution value is greater, it further indicates that the possibility of contact failure in the filter circuit is greater, and therefore, the second fault factor is also larger;

[0077] On the contrary, if the similarity between the ripple coefficient and the vibration characteristic value in all time periods within the preset time length before moment i is smaller, it means that the change pattern of the ripple coefficient and the vibration characteristic value is less similar, indicating that the change pattern of the high-temperature power supply voltage ripple size and the environmental vibration intensity is weakly correlated, which means that the possibility of vibration-induced filter circuit failure is relatively small, and therefore, the corresponding second fault factor is relatively small; at the same time, if the mean value of the high-frequency ripple energy is smaller, that is, the energy distribution value is smaller, it further indicates that the possibility of contact failure in the filter circuit is relatively small, and therefore, the second fault factor is also relatively small.

[0078] Thus, this embodiment constructs a second fault factor by analyzing the high-frequency ripple energy of the high-temperature power supply output voltage, the environmental vibration characteristics, and their correlation with the ripple coefficient. This can effectively monitor the power supply status and sensitively reflect the contact failure risk that may occur in the filter circuit due to factors such as vibration, thereby achieving early warning of the high-temperature power supply.

[0079] Step S4: The discrete degree of temperature data of all time periods within the preset time period before each moment and the cumulative sum of the vibration characteristic values ​​of all time periods are used as the weights of the first fault factor and the second fault factor respectively, and the comprehensive fault factor of the high-temperature power supply at each moment is determined to monitor the working status of the high-temperature power supply.

[0080] Considering the variability of the working environment of the high-temperature power supply in oil and gas drilling, it is necessary to set different weights for the first fault factor and the second fault factor to further improve the sensitivity of monitoring the working status of the high-temperature power supply. Therefore, this embodiment uses the discrete degree of temperature data of all time periods within a preset time period before each moment and the cumulative sum of vibration characteristic values ​​of all time periods as the weights of the first fault factor and the second fault factor, respectively, to determine the comprehensive fault factor of the high-temperature power supply at each moment to control the working status of the high-temperature power supply. Specifically,

[0081] As an implementation method, in this embodiment, the comprehensive failure factor T of the high temperature power supply at time i is i The expression is: T i =w1 i ×F i +w2 i ×S i Where w1 i 、w2 i They represent the discrete degree of temperature data in all periods within the preset time period before time i and the cumulative sum of vibration characteristic values ​​in all periods; F i 、S i They represent the first fault factor and the second fault factor of the high-temperature power supply at time i respectively.

[0082] Preferably, the schematic diagram of the comprehensive fault factor extraction process provided in this embodiment is as follows: Figure 2 shown.

[0083] It should be noted that there are many methods for measuring the degree of discreteness of a set of data. In this embodiment, the coefficient of discreteness of the temperature data of all time periods within the preset time period before moment i is used as the degree of discreteness of the temperature data of all time periods within the preset time period before moment i. In actual application, as other implementation methods, the implementer may also adopt other methods for measuring the degree of discreteness of data, such as variance or standard deviation, in combination with specific circumstances. This embodiment does not impose any special restrictions on the selection of methods for measuring the degree of discreteness of data.

[0084] The calculation method of the dispersion coefficient is a well-known technology, and its specific calculation process will not be repeated here.

[0085] According to the comprehensive fault factor of the high-temperature power supply at each moment, it can be understood that the comprehensive fault factor quantifies the possibility of the overall failure of the high-temperature power supply after comprehensively considering the voltage stability, temperature influence, vibration influence and ripple conditions of the power supply; if the first fault factor at moment i is larger, and the discreteness of the temperature data of all time periods within the preset time period before moment i is larger, it means that the possibility of failure of the feedback circuit of the high-temperature power supply is greater, and the current ambient temperature fluctuation is more severe. Therefore, the corresponding comprehensive fault factor is larger, indicating that the risk of failure of the high-temperature power supply due to feedback circuit problems or drastic temperature changes is significantly increased; at the same time, if the second fault factor at moment i is larger, and the cumulative sum of the vibration characteristic values ​​of all time periods within the preset time period before moment i is larger, it means that the possibility of failure of the filter circuit contact of the high-temperature power supply is greater, and the current vibration level of the high-temperature power supply is more severe. Therefore, the corresponding comprehensive fault factor is larger, indicating that the risk of failure of the high-temperature power supply due to filter circuit contact problems is significantly increased;

[0086] On the contrary, if the first fault factor at moment i is smaller, and the discreteness of the temperature data of all time periods within the preset time period before moment i is smaller, it means that the possibility of failure in the feedback circuit of the high-temperature power supply is smaller, and the current ambient temperature fluctuation is more stable. Therefore, the corresponding comprehensive fault factor is smaller, indicating that the risk of failure of the high-temperature power supply due to feedback circuit problems or drastic temperature changes is lower; at the same time, if the second fault factor at moment i is smaller, and the cumulative sum of the vibration characteristic values ​​of all time periods within the preset time period before moment i is smaller, it means that the possibility of failure in the filter circuit contact of the high-temperature power supply is smaller, and the current vibration level of the high-temperature power supply is more stable. Therefore, the corresponding comprehensive fault factor is smaller, indicating that the risk of failure of the high-temperature power supply due to filter circuit contact problems is lower.

[0087] Furthermore, a monitoring window is formed by a preset time length before each moment, and voltage data, vibration acceleration and temperature data within a preset number of monitoring windows when the high-temperature power supply is working normally under oil and gas drilling are obtained. For each monitoring window, the comprehensive fault factor within a preset number of monitoring windows is obtained according to the comprehensive fault factor acquisition method, and the maximum comprehensive fault factor is used as the fault threshold. If the comprehensive fault factor of the high-temperature power supply at the current moment is greater than the fault threshold, the working state of the high-temperature power supply at the current moment is abnormal, and the shutdown terminal of the high-temperature power supply at the current moment is set to a high level, so that the high-temperature power supply enters a dormant state to avoid further development of the abnormal working state and cause more serious faults; conversely, if the comprehensive fault factor of the high-temperature power supply at the current moment is less than or equal to the fault threshold, it indicates that the working state of the high-temperature power supply is normal.

[0088] It should be noted that the value of the preset number is set manually. In this embodiment, the value of the preset number is 5000. In actual application, as other implementation methods, the implementer can also set it by himself based on the specific situation. This embodiment does not impose any special restrictions.

[0089] Thus, this embodiment uses multi-intelligent sensor fusion to analyze voltage offset, high-frequency ripple, environmental vibration, and temperature changes, and constructs a comprehensive fault factor that can reflect potential faults in the feedback circuit and filter circuit. This helps to assess the overall power supply failure risk, and can provide early warning in harsh environments such as oil and gas drilling, and promptly shut down the power supply to ensure equipment safety.

[0090] Based on the same inventive concept as the above method, an embodiment of the present application also provides a high-temperature power supply, including a memory, a processor, and a computer program stored in the memory and running on the processor. When the processor executes the computer program, the steps of any one of the above-mentioned methods for monitoring the working status of a power supply in a high-temperature environment are implemented.

[0091] It should be noted that the order in which the embodiments of the present application are presented is for illustrative purposes only and does not necessarily represent the superiority or inferiority of the embodiments. Furthermore, the foregoing descriptions of specific embodiments of this specification are provided. Furthermore, the processes depicted in the accompanying drawings do not necessarily require the specific order or sequential sequence shown to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0092] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments.

[0093] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the principles of the present application shall be included in the scope of protection of the present application.

Claims

1. A method for monitoring the working status of a power supply in a high temperature environment, characterized in that: The method comprises the following steps: Intelligent sensors are used to collect the voltage data and vibration acceleration of the high-temperature power supply in real time, and the temperature data at the start of each period is obtained as the temperature data of each period; Comparing the difference between the average distribution of all voltage data in each time period and the preset rated output voltage of the high-temperature power supply to determine the voltage offset value of each time period; combining the difference between the voltage offset value and the differential value of the temperature data in all time periods within a preset time period before each moment, and the fusion result of the voltage offset value of all time periods, to determine the first fault factor of the high-temperature power supply at each moment; Obtain a spectrum sequence of all voltage data in each time period above a preset switching frequency in the frequency domain, and determine the high-frequency ripple energy of the high-temperature power supply in each time period by combining the modulus lengths of all elements in the spectrum sequence; determine the vibration characteristic value of the high-temperature power supply in each time period based on the distribution of all vibration accelerations in each time period; obtain the ripple coefficient of each time period based on all voltage data in each time period, analyze the average distribution of high-frequency ripple energy in all time periods within a preset time period before each moment, determine the energy distribution value of the high-temperature power supply at each moment, and determine the second fault factor of the high-temperature power supply at each moment by combining the similarity between the vibration characteristic value and the ripple coefficient in all time periods; The discrete degree of temperature data of all time periods within the preset time period before each moment and the cumulative sum of vibration characteristic values ​​of all time periods are used as the weights of the first fault factor and the second fault factor respectively to determine the comprehensive fault factor of the high-temperature power supply at each moment to monitor the working status of the high-temperature power supply.

2. The method for monitoring the working status of a power supply in a high temperature environment according to claim 1, wherein: The voltage offset value of each time period is the difference between the average value of all voltage data in each time period and the preset rated output voltage of the high temperature power supply.

3. The method for monitoring the working status of a power supply in a high temperature environment according to claim 1, wherein: The expression of the first failure factor of the high temperature power supply at each moment is: F i =D i ×ΔU i Where, F i represents the first failure factor of the high-temperature power supply at time i; D i Represents the DTW distance between the normalized value of the voltage offset value and the normalized value of the difference value of the temperature data in all time periods within a preset time period before time i; ΔU i Represents the cumulative sum of voltage deviation values ​​in all time periods within a preset time period before time i.

4. The method for monitoring the working status of a power supply in a high temperature environment according to claim 1, wherein: The high-frequency ripple energy of the high-temperature power supply in each time period is the cumulative sum of the module lengths of all elements in the frequency spectrum sequence of each time period.

5. The method for monitoring the working status of a power supply in a high temperature environment according to claim 1, wherein: The vibration characteristic value of the high-temperature power supply in each time period is the mean square value of all vibration accelerations in each time period.

6. The method for monitoring the working status of a power supply in a high temperature environment according to claim 1, wherein: The energy distribution value of the high-temperature power supply at each moment is the average value of the high-frequency ripple energy in all time periods within a preset time period before each moment.

7. The method for monitoring the working status of a power supply in a high temperature environment according to claim 1, wherein: The expression of the second failure factor of the high temperature power supply at each moment is: S i =(sim i +δ)×E i Where S i represents the second failure factor of the high-temperature power supply at time i; sim i Indicates the similarity between the ripple coefficient and the vibration characteristic value in all time periods within the preset time period before time i; E i represents the energy distribution value of the high-temperature power supply at time i; δ represents a constant preset to be greater than 1.

8. The method for monitoring the working status of a power supply in a high temperature environment according to claim 1, wherein: The expression of the comprehensive failure factor of the high temperature power supply at each moment is: T i =w1 i ×F i +w2 i ×S i Where, T i represents the comprehensive failure factor of the high-temperature power supply at time i; w1 i 、w2 i They represent the discrete degree of temperature data in all time periods within the preset time period before time i and the cumulative sum of vibration characteristic values ​​in all time periods; F i 、S i They represent the first fault factor and the second fault factor of the high-temperature power supply at time i respectively.

9. The method for monitoring the working status of a power supply in a high temperature environment according to claim 1, wherein: The controlling of the working state of the high temperature power supply includes: The preset time length before each moment is used to form a monitoring window, and the voltage data, vibration acceleration and temperature data within a preset number of monitoring windows when the high-temperature power supply is working normally under oil and gas drilling are obtained. For each monitoring window, the comprehensive fault factor within the preset number of monitoring windows is obtained according to the method for obtaining the comprehensive fault factor, and the maximum comprehensive fault factor is used as the fault threshold. If the comprehensive fault factor of the high-temperature power supply at the current moment is greater than the fault threshold, the working state of the high-temperature power supply at the current moment is abnormal; otherwise, the working state of the high-temperature power supply is normal.

10. A high-temperature power supply comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the computer program, the steps of the method for monitoring the working status of a power supply in a high-temperature environment as described in any one of claims 1 to 9 are implemented.

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