Nonlinear parameter measurement method and device of photoelectric device, electronic equipment and medium

Abstract

The invention provides a nonlinear parameter measurement method and device of a photoelectric device, electronic equipment and a medium, and relates to the technical field of metering of photoelectric devices. At least one group of a first light source and a second light source is obtained; obtaining mixed emergent light; controlling the tested photoelectric device to capture the mixed emergent light, and converting the mixed emergent light into an electric signal; collecting a characteristic signal point set; and on the basis of the characteristic signal point set, obtaining a nonlinear parameter of the tested photoelectric device. According to the invention, automatic and rapid measurement of nonlinear parameters of the photoelectric device is realized. By regulating and controlling the peak wavelength, the bandwidth, the optical power, the pulse frequency, the duty ratio and the amplitude of the first incident light and the second incident light, the influence of factors such as light source mismatching and power drift of the light source on nonlinear parameter measurement is reduced, and the efficiency and the accuracy of nonlinear parameter measurement of the photoelectric device are improved. Meanwhile, non-linear spectrum dependence characterization and wide dynamic range characterization spanning multiple orders of magnitude are also realized.

Description

Technical Field

[0001] The present invention relates to the technical field of measurement of photoelectric devices, and in particular to a method, device, electronic equipment and medium for measuring nonlinear parameters of photoelectric devices. Background Art

[0002] The core function of photodetectors is to convert optical signals into electrical signals (current or voltage). They are widely used in optical communications, lidar, imaging systems, and scientific instrumentation. Due to factors such as material properties, device structure, operating conditions, noise, and saturation, the response of a photodetector is not always strictly linear with the incident light. For example, a photodetector exhibits excellent linearity at low light intensities, but the response saturates or becomes distorted above a certain threshold. Accurately measuring the nonlinear parameters of a photodetector is essential to determine its linear operating range and avoid measurement errors caused by nonlinearity (such as in optical power measurement).

[0003] During the production process, the measurement of nonlinear parameters can be used as a key indicator to screen out devices with consistent performance. In optical communications or imaging systems, by compensating for nonlinear characteristics, pre-distortion algorithms or calibration curves can be designed to improve signal integrity. In lidar, understanding the nonlinear response of the detector can optimize the dynamic range and avoid saturation of strong reflected signals that lead to loss of weak signals. The measurement of nonlinear parameters can also determine the safe bias voltage and optical power range of the photodetector, define the safe operating range, and avoid breakdown or damage. Accurately measuring nonlinear characteristics helps to understand the performance of photodetectors under different operating conditions, thereby providing an important basis for their design, optimization, and application, and thus improving the system performance and reliability in optical communications, lidar, quantum communications, microwave photonics, fiber optic sensing, and other fields.

[0004] Common methods for measuring nonlinear parameters include adjusting the incident light power, measuring the photodetector's photocurrent or voltage response to optical power, and analyzing its linearity (e.g., fitting slope changes and calculating nonlinear coefficients). Conventional nonlinear parameter measurements place high demands on light source stability and noise interference from optical path components. The photodetector's own temperature coefficient can also significantly affect the measurement results. Furthermore, conventional nonlinear parameter measurements struggle to achieve wide dynamic range, fast-response device measurements, and evaluate the spectral dependence of nonlinearity, leading to inaccurate results. Summary of the Invention

[0005] The present invention provides a method, device, electronic equipment and medium for measuring nonlinear parameters of a photoelectric device, which are used to solve the defects of inaccurate and low efficiency in measuring nonlinear parameters of photoelectric devices in the prior art and realize accurate and efficient measurement of nonlinear parameters of photoelectric devices.

[0006] The present invention provides a method for measuring nonlinear parameters of a photoelectric device, comprising: obtaining at least one light source group, each light source group including a matched pulsed first light source and a second light source; the first light source having a fixed time delay relative to the second light source; obtaining mixed output light of first incident light emitted by the at least one light source group, the mixed output light being obtained based on diffuse reflection of the first incident light and the second incident light; matching the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light; controlling the photoelectric device under test to capture the mixed output light and converting the mixed output light into an electrical signal; collecting, in the electrical signal, a set of characteristic signal points of the first light source and the second light source in different combinations of on and off states; and performing nonlinear calculation on the characteristic signal points in the set of characteristic signal points to obtain the nonlinear parameters of the photoelectric device under test.

[0007] According to the method for measuring nonlinear parameters of a photoelectric device provided by the present invention, the electrical signal includes a first signal curve and a second signal curve, the first signal curve is an electrical signal curve generated based on the sequence of turning on the first light source first and turning on the second light source later, and the second signal curve is an electrical signal curve generated based on the sequence of turning on the first light source later and turning on the second light source first, a characteristic signal point set includes a first signal point where the first light source is on and the second light source is off, a second signal point where the first light source is off and the second light source is on, a third signal point where both the first light source and the second light source are on, and a fourth signal point where both the first light source and the second light source are off, a nonlinear calculation is performed on the characteristic signal points in the characteristic signal point set to obtain the nonlinear parameters of the photoelectric device under test, including: calculating the first nonlinear parameter based on the first signal point, the second signal point, the third signal point, and the fourth signal point in the first signal curve; calculating the second nonlinear parameter based on the first signal point, the second signal point, the third signal point, and the fourth signal point in the second signal curve; and taking the average of the first nonlinear parameter and the second nonlinear parameter as the nonlinear parameter of the photoelectric device under test.

[0008] According to the nonlinear parameter measurement method of the optoelectronic device provided by the present invention, the calculation formulas of the first nonlinear parameter and the second nonlinear parameter are as follows: ; in, is the third signal point, is the fourth signal point, is the first signal point, is the second signal point, is the first nonlinear parameter or the second nonlinear parameter.

[0009] The present invention also provides a device for measuring the nonlinear parameters of a photoelectric device, comprising: a light source module, comprising at least one light source group, each light source group comprising a matched pulsed first light source and a second light source; the first light source having a fixed delay relative to the second light source; an integrating sphere, for obtaining a mixed output light of a first incident light and a second incident light emitted by at least one light source group, the mixed output light being obtained based on diffuse reflection of the first incident light and the second incident light; the peak wavelength, broadband, optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light being matched; a photoelectric device to be measured, for capturing the mixed output light and converting the mixed output light into an electrical signal; an electrical signal acquisition module, for collecting, in the electrical signal, a set of characteristic signal points of the first light source and the second light source in different combinations of on and off states; and a calculation module, for performing nonlinear calculation on the characteristic signal points in the characteristic signal point set to obtain the nonlinear parameters of the photoelectric device to be measured.

[0010] According to a device for measuring the nonlinear parameters of a photoelectric device provided by the present invention, an integrating sphere includes a hollow sphere whose inner surface is coated with a diffuse reflection material, the integrating sphere includes an entrance hole and an exit hole, the photoelectric device to be measured is installed at the rear end of the exit hole, a first light source and a second light source enter the integrating sphere through the entrance hole, and the mixed exit light is emitted from the integrating sphere through the exit hole.

[0011] According to a device for measuring nonlinear parameters of a photoelectric device provided by the present invention, the integrating sphere includes a built-in baffle: the baffle is used to prevent the first incident light and the second incident light from directly hitting the exit hole in the integrating sphere, and the size and angle of the baffle are determined based on the number of incident holes and their relative position to the exit hole.

[0012] According to a device for measuring the nonlinear parameters of a photoelectric device provided by the present invention, each light source group includes a first power supply and a second power supply: the first power supply is used to regulate the first light source, and the second power supply is used to regulate the second light source, so that the optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light match, while ensuring that there is a fixed delay between the first light source and the second light source.

[0013] According to a device for measuring nonlinear parameters of a photoelectric device provided by the present invention, the first light source and the second light source each include at least one monochromatic LED lamp, and one monochromatic LED lamp generates light with a peak wavelength and bandwidth. The first light source and the second light source turn on the same at least one monochromatic LED lamp so that the peak wavelength and bandwidth of the first incident light and the second incident light are the same.

[0014] The present invention also provides an electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the nonlinear parameter measurement method of any of the above-mentioned photoelectric devices is implemented.

[0015] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the nonlinear parameter measurement method of any of the above-mentioned optoelectronic devices is implemented.

[0016] The present invention provides a method, device, electronic device, and medium for measuring nonlinear parameters of a photoelectric device. The method comprises obtaining at least one light source group, each light source group including a matched pulsed first light source and a second light source; the first light source having a fixed delay relative to the second light source; obtaining a mixed output light of a first incident light and a second incident light emitted by the at least one light source group, the mixed output light being obtained based on diffuse reflection of the first incident light and the second incident light; matching the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first incident light and the second incident light; controlling the photoelectric device under test to capture the mixed output light and converting the mixed output light into an electrical signal; collecting a set of characteristic signal points of the first light source and the second light source in different combinations of on and off states in the electrical signal; and performing nonlinear calculation on the characteristic signal points in the set of characteristic signal points to obtain the nonlinear parameters of the photoelectric device under test. The present invention achieves automatic and rapid measurement of the nonlinear parameters of a photoelectric device by using a pulsed first light source and a second light source having a fixed delay. By aligning the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident lights, the effects of light source mismatch and power drift on nonlinear parameter measurement are reduced, improving the efficiency and accuracy of nonlinear parameter measurements of optoelectronic devices. This also enables characterization of the spectral dependence of nonlinearity and characterization over a wide dynamic range spanning multiple orders of magnitude. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the present invention or the prior art, a brief introduction will be given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0018] Figure 1 It is a flow chart of the nonlinear parameter measurement method of the photoelectric device provided by the present invention.

[0019] Figure 2 It is a schematic structural diagram of the device for measuring nonlinear parameters of a photoelectric device provided by the present invention.

[0020] Figure 3 It is a schematic diagram of collecting characteristic signal point sets provided by the present invention.

[0021] Figure 4 It is a structural schematic diagram of the electronic device provided by the present invention.

[0022] Reference numerals: 10: first light source; 11: second light source. DETAILED DESCRIPTION

[0023] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0024] The following combination Figures 1-4 The present invention describes a method, device and electronic equipment for measuring nonlinear parameters of a photoelectric device.

[0025] Figure 1 FIG. 1 is a flow chart of a method for measuring nonlinear parameters of a photoelectric device provided by the present invention, such as Figure 1 As shown, the method for measuring nonlinear parameters of a photoelectric device includes steps S100 to S500 , and each step is described in detail as follows.

[0026] S100: Acquire at least one light source group, each light source group including a matching pulsed first light source and a second light source.

[0027] There is a fixed delay between the first light source and the second light source.

[0028] The first and second light sources 10 and 11 comprise light sources with adjustable optical power, pulsed operation, and adjustable frequency, and have the same peak wavelength and bandwidth. For example, the first and second light sources can be composite light sources composed of monochromatic LEDs, each of which includes at least one monochromatic LED lamp. Each monochromatic LED lamp produces light with a peak wavelength (color) and bandwidth. By switching each LED lamp in the composite LED light source on and off, the first and second light sources can produce light with the same peak wavelength and bandwidth. For example, the composite LED light source can operate in a wavelength range of 200 nm to 1300 nm and a bandwidth of 5 nm to 60 nm. Each composite light source includes one or more monochromatic LED lamps of the same wavelength or different wavelengths, with lamps of the same peak wavelength and bandwidth being grouped together. By switching monochromatic LED lamps of different wavelengths, nonlinearities can be observed at different wavelengths, allowing the spectral selectivity (spectral dependence) of the nonlinearity to be studied. The narrower the bandwidth, the better, and the bandwidth requirement is consistent within the same group. By adjusting the optical power of the monochromatic LED lamps via a power supply, nonlinearities with a wide dynamic range spanning multiple orders of magnitude can be studied.

[0029] A first power supply supplies power to a first light source, and the pulse frequency of the first light source is regulated by turning the first light source on or off. A second power supply supplies power to a second light source, and the pulse frequency of the second light source is regulated by turning the second light source on or off. The duty cycle and amplitude of the first and second light sources are equal. Furthermore, a fixed delay exists between the first light source and the second light source.

[0030] S200: Acquire mixed output light of first incident light and second incident light emitted by at least one light source group.

[0031] The mixed output light is obtained based on diffuse reflection of the first incident light and the second incident light; the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light are matched.

[0032] A first light source generates a first incident light. A second light source generates a second incident light. The first incident light and the second incident light have matching peak wavelengths and bandwidths, optical power, pulse frequency, duty cycle, and amplitude. For example, the first incident light and the second incident light have the same or approximately the same optical power, pulse frequency, duty cycle, and amplitude.

[0033] The first and second incident lights enter the integrating sphere through the entrance aperture. Diffuse reflection from the diffuse reflection coating on the inner wall of the sphere thoroughly mixes the first and second lights within the sphere, resulting in uniform light irradiation at all locations within the sphere. The mixed light is then emitted through the exit aperture of the integrating sphere. For each light source group, the first and second light sources mix to form a sub-mixed light beam. All of these sub-mixed light beams combine to form the final mixed light beam.

[0034] S300: Controlling the photoelectric device under test to capture the mixed output light and converting the mixed output light into an electrical signal.

[0035] The present invention relates to nonlinear measurement of optoelectronic devices, including photodetectors, photomultiplier tubes, charge-coupled devices (CCDs), photosensors, photovoltaic cells, and modules. The present invention is described using a photodetector as an example.

[0036] The photoelectric device under test is installed at the rear end of the exit hole of the integrating sphere to capture all mixed exit lights. The photodetector converts each captured mixed exit light into an electrical signal. For example, the photodetector converts the optical signal of each captured mixed exit light into a voltage signal or a current signal at different time points. The mapping of the switching state of the first light source and the second light source to the electrical signal is as follows: Figure 3 shown.

[0037] S400: Collecting characteristic signal point sets of the first light source and the second light source in different combinations of on and off states in the electrical signal.

[0038] The first light source is controlled by the first power supply, and the second light source is controlled by the second power supply to generate the first incident light and the second incident light with the same optical power, pulse frequency, duty cycle and amplitude. Figure 3 As shown, the first light source and the second light source have a fixed delay (time difference) The acquisition of electrical signals matches the pulse frequency of the first incident light and the second incident light, with a fixed acquisition time period. The characteristic signal points of each electrical signal are collected to obtain a characteristic signal point set. The characteristic signal points include electrical signal characteristics generated by the first light source and the second light source in different combinations of on and off states.

[0039] S500: performing nonlinear calculation on the characteristic signal points in the characteristic signal point set to obtain nonlinear parameters of the measured optoelectronic device.

[0040] Based on all the collected characteristic signal points, nonlinear calculation is performed to obtain the nonlinear parameters of the photodetector.

[0041] The present invention provides a method for measuring nonlinear parameters of a photoelectric device, comprising obtaining at least one light source group, each light source group including a matched pulsed first light source and a second light source; the first light source having a fixed time delay relative to the second light source; obtaining a mixed output light of a first incident light and a second incident light emitted by the at least one light source group, the mixed output light being obtained based on diffuse reflection of the first incident light and the second incident light; matching the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first incident light and the second incident light; controlling the photoelectric device under test to capture the mixed output light and converting the mixed output light into an electrical signal; collecting a set of characteristic signal points of the first light source and the second light source in different combinations of on and off states in the electrical signal; and performing nonlinear calculation on the characteristic signal points in the set of characteristic signal points to obtain the nonlinear parameters of the photoelectric device under test. The present invention achieves automatic and rapid measurement of the nonlinear parameters of a photoelectric device by using the pulsed first and second light sources having a fixed time delay. By aligning the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident lights, the effects of light source mismatch and power drift on nonlinear parameter measurement are reduced, improving the efficiency and accuracy of nonlinear parameter measurement for optoelectronic devices. This also enables characterization of the spectral dependence of nonlinearity and characterization over a wide dynamic range spanning multiple orders of magnitude.

[0042] Based on the above embodiment, the electrical signal includes a first signal curve and a second signal curve, the first signal curve is an electrical signal curve generated based on the sequence of turning on the first light source first and turning on the second light source later, the second signal curve is an electrical signal curve generated based on the sequence of turning on the first light source later and turning on the second light source first, the characteristic signal point set includes a first signal point where the first light source is in an on state and the second light source is in an off state, a second signal point where the first light source is in an off state and the second light source is in an on state, a third signal point where both the first light source and the second light source are in an on state, and a fourth signal point where both the first light source and the second light source are in an off state, performing nonlinear calculation on the characteristic signal points in the characteristic signal point set to obtain nonlinear parameters of the photoelectric device under test includes the following steps: In the first signal curve, calculating a first nonlinear parameter based on the first signal point, the second signal point, the third signal point, and the fourth signal point; In the second signal curve, calculating a second nonlinear parameter based on the first signal point, the second signal point, the third signal point, and the fourth signal point; The average value of the first nonlinear parameter and the second nonlinear parameter is used as the nonlinear parameter of the optoelectronic device.

[0043] like Figure 3 As shown, for each electrical signal curve, at a time point when the first light source is in the on state and the second light source is in the off state (for example, Figure 3 t in A1 and t A2 ) collects the first signal point, and collects the third signal point during a period in which both the first light source and the second light source are turned on (for example, Figure 3 t in AB1 and t AB2 ), at a time point when the first light source is in the off state and the second light source is in the on state (for example, Figure 3 t in B1 and t B2 ) collects the second signal point, and collects the fourth signal point during a period in which both the first light source and the second light source are in the off state (for example, Figure 3 t in 01 and t 02 ). t A1 , t B1 , t AB1 and t 01 is the characteristic signal point set of a collection time period. A2 , t B2 , t AB2 and t 02 is a set of characteristic signal points for another acquisition time period.

[0044] In the first signal curve, a first nonlinear parameter is calculated based on the first signal point, the second signal point, the third signal point, and the fourth signal point within an acquisition time period. In the second signal curve, a second nonlinear parameter is calculated based on the first signal point, the second signal point, the third signal point, and the fourth signal point within an acquisition time period.

[0045] The calculation formulas for the first nonlinear parameter and the second nonlinear parameter are as follows: (1); in, is the third signal point, is the fourth signal point, is the first signal point, is the second signal point, is the first nonlinear parameter or the second nonlinear parameter.

[0046] The present invention calculates the first nonlinear parameter and the second nonlinear parameter to eliminate system deviation. The calculation formula of the nonlinear parameter of the photoelectric detector of the present invention is simple, without complex algorithms, and is suitable for popularization and use in practical applications.

[0047] Optionally, the first signal point, the second signal point, the third signal point, and the fourth signal point include corresponding photocurrents or corresponding photovoltages output by the photodetector.

[0048] For the dual light source superposition, two light sources (the first light source and the second light source) with similar optical power and independent controllability are used, and the light radiation power irradiated to the photosensitive surface of the photodetector is respectively P A and P B , the corresponding photocurrent (or photovoltage) output by the photodetector are I A and I B When the two beams of light (the first incident light and the second incident light) are superimposed, the light radiation power irradiated onto the photosensitive surface of the photodetector is P A + P B , the photocurrent (or photovoltage) output by the photodetector is I AB .if I AB = I A + I B , then the photodetector is P A (or P B )andP A + P B The response is linear over the power range. I AB ≠ I A + I B , then the response of the photodetector in this power range is nonlinear (NL, Non-linearity).

[0049] The calculation formula for the nonlinear parameters of the photodetector is shown in Formula (1). By regulating the optical power of the first and second incident lights, the nonlinear parameters of the photodetector at different optical power levels can be obtained, thereby enabling the nonlinear evaluation of the photodetector at different orders of magnitude of optical power levels (electrical signals). By switching the wavelengths of the two incident lights, the nonlinearity of the photodetector at different wavelengths can be obtained, thereby enabling the evaluation of the spectral dependence of the nonlinearity of the photodetector.

[0050] The device for measuring the nonlinear parameters of a photoelectric device provided by the present invention is described below. The device for measuring the nonlinear parameters of a photoelectric device described below and the method for measuring the nonlinear parameters of a photoelectric device described above can be referred to in correspondence with each other.

[0051] like Figure 2 As shown, a device for measuring nonlinear parameters of a photoelectric device includes a light source module, an integrating sphere, a photoelectric device to be measured, an electrical signal acquisition module and a calculation module.

[0052] The light source module includes at least one light source group, each light source group includes a matching pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source.

[0053] An integrating sphere is used to obtain mixed output light of a first incident light and a second incident light emitted by at least one group of light sources, where the mixed output light is obtained based on diffuse reflection of the first incident light and the second incident light; the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first incident light and the second incident light are matched.

[0054] The photoelectric device under test is used to capture the mixed output light and convert the mixed output light into an electrical signal.

[0055] The electric signal acquisition module is used to collect characteristic signal point sets of the first light source and the second light source in different combinations of on and off states in the electric signal.

[0056] The calculation module is used to perform nonlinear calculation on the characteristic signal points in the characteristic signal point set to obtain the nonlinear parameters of the photoelectric device under test.

[0057] The present invention provides a device for measuring the nonlinear parameters of a photoelectric device. The device obtains at least one light source group, each light source group including a matched pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source; obtains mixed output light of the first incident light and the second incident light emitted by the at least one light source group, the mixed output light being obtained based on diffuse reflection of the first incident light and the second incident light; the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first incident light and the second incident light are matched; controls the photoelectric device under test to capture the mixed output light and converts the mixed output light into an electrical signal; collects a set of characteristic signal points of the first light source and the second light source in different combinations of on and off states in the electrical signal; and performs nonlinear calculation on the characteristic signal points in the set of characteristic signal points to obtain the nonlinear parameters of the photoelectric device under test. The present invention achieves automatic and rapid measurement of the nonlinear parameters of the photoelectric device by using the pulsed first and second light sources with a fixed delay. By aligning the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident lights, the effects of light source mismatch and power drift on nonlinear parameter measurement are reduced, improving the efficiency and accuracy of nonlinear parameter measurement for optoelectronic devices. This also enables characterization of the spectral dependence of nonlinearity and characterization over a wide dynamic range spanning multiple orders of magnitude.

[0058] Based on the above embodiment, the integrating sphere includes a hollow sphere whose inner surface is coated with a diffuse reflection material. The integrating sphere includes an entrance hole and an exit hole. The photoelectric device is installed at the rear end of the exit hole. The first light source and the second light source enter the integrating sphere through the entrance hole, and the mixed exit light is emitted from the integrating sphere through the exit hole.

[0059] The photodetector is installed at the rear end of the exit hole. The integrating sphere is used to diffusely reflect the incident first incident light and the second incident light, thereby fully mixing the first incident light and the second incident light in the integrating sphere, so that the light irradiation at each position in the integrating sphere tends to be uniform, thereby uniformly superimposing the first incident light and the second incident light on the photosensitive surface of the photoelectric device under test, avoiding saturation of some areas. The first light source and the second light source enter the integrating sphere through the entrance hole, and the mixed exit light exits the integrating sphere through the exit hole. The number of entrance holes of the integrating sphere is greater than or equal to 1. The number of exit holes of the integrating sphere is greater than or equal to 1. The diffuse reflection material includes a white reflective material, such as barium sulfate or polytetrafluoroethylene.

[0060] The present invention achieves full mixing of the first incident light and the second incident light through the integrating sphere, thereby improving the uniformity of the mixed emergent light.

[0061] Based on the above embodiment, the integrating sphere includes a built-in baffle: the baffle is used to prevent the first incident light and the second incident light from directly hitting the exit hole in the integrating sphere, and the size and angle of the baffle are determined based on the number of the incident holes and their relative position to the exit hole.

[0062] The baffle prevents the first and second incident lights from hitting the exit aperture in the integrating sphere. The size and angle of the baffle are determined by the number of entrance apertures and their relative positions to the exit aperture, ensuring that the first and second incident lights are thoroughly mixed within the integrating sphere.

[0063] Based on the above embodiment, each light source group includes a first power supply and a second power supply: the first power supply is used to control the first light source, and the second power supply is used to control the second light source, so that the optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light match, while ensuring that there is a fixed delay between the first light source and the second light source.

[0064] Specifically, the first light source and the second light source each include at least one monochromatic LED lamp, and a monochromatic LED lamp generates light with a peak wavelength and bandwidth. The first light source and the second light source turn on the same at least one monochromatic LED lamp to make the peak wavelength and bandwidth of the first incident light and the second incident light the same.

[0065] The first power supply is used to independently power the first light source. The second power supply is used to independently power the second light source. The reason for independently powering the first and second light sources is to control the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude of the first and second incident lights, while ensuring a fixed delay between the first and second light sources.

[0066] Furthermore, by regulating the optical power of the first incident light and the optical power of the second incident light through independent first power supply and second power supply, automatic measurement of nonlinear parameters of the photodetector across multiple orders of magnitude and a wide dynamic range can be achieved, and measurement results of nonlinear parameters under different optical powers can be automatically obtained.

[0067] At the same time, the first light source and the second light source each include at least one single-color LED lamp. Figure 2 As shown, the first light source includes a red LED, a yellow LED, a green LED, and an orange LED. The second light source includes the same model, quantity, and color of the monochromatic LEDs as the first light source. By powering the LEDs of the same color, first and second incident lights with the same peak wavelength are generated. For example, if only the green LED is powered simultaneously, the first and second incident lights with the same peak wavelength are generated.

[0068] Optionally, the first light source and the second light source both include monochromatic LED lamps with different peak wavelengths and bandwidths. For example, the first light source and the second light source both include monochromatic LED lamps with a peak wavelength of 500 nm and a bandwidth of 10 nm.

[0069] Furthermore, the present invention can change the wavelengths of the first incident light and the second incident light to calculate the nonlinear parameters of the optoelectronic device at different wavelengths, thereby achieving the evaluation of the nonlinear spectral dependence.

[0070] The present invention adopts a frequency-adjustable pulsed dual-LED light source, simplifies the optical path and the configuration of the measurement device for the nonlinear parameters of the photoelectric device, and significantly reduces the cost compared with traditional complex light sources and mechanical switches.

[0071] In one embodiment, the electrical signal includes a first signal curve and a second signal curve, the first signal curve is an electrical signal curve generated based on the order that the first light source is turned on first and the second light source is turned on later, and the second signal curve is an electrical signal curve generated based on the order that the first light source is turned on later and the second light source is turned on first, the characteristic signal point set includes a first signal point where the first light source is on and the second light source is off, a second signal point where the first light source is off and the second light source is on, a third signal point where both the first light source and the second light source are on, and a fourth signal point where both the first light source and the second light source are off, and the calculation module is used to: in the first signal curve, calculate a first nonlinear parameter based on the first signal point, the second signal point, the third signal point and the fourth signal point; in the second signal curve, calculate a second nonlinear parameter based on the first signal point, the second signal point, the third signal point and the fourth signal point; and take the average value of the first nonlinear parameter and the second nonlinear parameter as the nonlinear parameter of the photoelectric device.

[0072] In one embodiment, the calculation formulas of the first nonlinear parameter and the second nonlinear parameter are as follows: ; in, is the third signal point, is the fourth signal point, is the first signal point, is the second signal point, is the first nonlinear parameter or the second nonlinear parameter.

[0073] Figure 4 An example of a physical structure diagram of an electronic device is shown below. Figure 4As shown, the electronic device may include: a processor (processor) 410 , a communication interface (Communications Interface) 420 , a memory (memory) 430 and a communication bus 440 , wherein the processor 410 , the communication interface 420 , and the memory 430 communicate with each other via the communication bus 440 . The processor 410 can call the logic instructions in the memory 430 to execute the nonlinear parameter measurement method of the optoelectronic device, which includes: obtaining at least one group of light source groups, each light source group includes a matching pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source; obtaining a mixed output light of the first incident light and the second incident light emitted by at least one group of light source groups, the mixed output light is obtained based on the diffuse reflection of the first incident light and the second incident light; the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light are matched; controlling the optoelectronic device under test to capture the mixed output light and convert the mixed output light into an electrical signal; in the electrical signal, collecting a set of characteristic signal points of the first light source and the second light source under different combinations of on and off states; performing nonlinear calculation on the characteristic signal points in the characteristic signal point set to obtain the nonlinear parameters of the optoelectronic device under test.

[0074] Furthermore, the logic instructions in the aforementioned memory 430 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the portion that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product, stored in a storage medium, includes instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the methods described in various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as a USB flash drive, a mobile hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0075] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the nonlinear parameter measurement method of the optoelectronic device provided by the above-mentioned methods, the method comprising: obtaining at least one group of light source groups, each light source group comprising a matching pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source; obtaining a mixed output light of a first incident light and a second incident light emitted by at least one group of light source groups, the mixed output light being obtained based on the diffuse reflection of the first incident light and the second incident light; the peak wavelength, bandwidth, optical power, pulse frequency, duty cycle and amplitude of the first incident light and the second incident light being matched; controlling the optoelectronic device under test to capture the mixed output light and converting the mixed output light into an electrical signal; in the electrical signal, collecting a set of characteristic signal points of the first light source and the second light source in different combinations of on and off states; performing nonlinear calculation on the characteristic signal points in the characteristic signal point set to obtain the nonlinear parameters of the optoelectronic device under test.

[0076] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one location or distributed across multiple network units. Some or all of the modules may be selected based on actual needs to achieve the objectives of the present embodiment. Persons of ordinary skill in the art will be able to understand and implement the present invention without inventive effort.

[0077] Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented using software plus a necessary general-purpose hardware platform, or of course, hardware. Based on this understanding, the essence of the above technical solution, or the portion that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, or an optical disk, and includes a number of instructions for causing a computer device (such as a personal computer, server, or network device) to execute the methods described in each embodiment or certain portions of the embodiments.

[0078] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A method for measuring nonlinear parameters of a photoelectric device, characterized in that: include: Acquire at least one light source group, each light source group including a matched pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source; Obtaining mixed output light of a first incident light and a second incident light emitted by at least one light source group, where the mixed output light is obtained based on diffuse reflection of the first incident light and the second incident light; wherein the first incident light and the second incident light have matching peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude; controlling the photoelectric device under test to capture the mixed output light and convert the mixed output light into an electrical signal; In the electrical signal, characteristic signal point sets of the first light source and the second light source in different combinations of on and off states are collected; Nonlinear calculation is performed on the characteristic signal points in the characteristic signal point set to obtain nonlinear parameters of the photoelectric device under test.

2. The method for measuring nonlinear parameters of a photoelectric device according to claim 1, wherein: The electrical signal includes a first signal curve and a second signal curve, the first signal curve is an electrical signal curve generated based on the sequence of turning on the first light source first and turning on the second light source later, the second signal curve is an electrical signal curve generated based on the sequence of turning on the first light source later and turning on the second light source first, the characteristic signal point set includes a first signal point where the first light source is in an on state and the second light source is in an off state, a second signal point where the first light source is in an off state and the second light source is in an on state, a third signal point where both the first light source and the second light source are in an on state, and a fourth signal point where both the first light source and the second light source are in an off state, and performing nonlinear calculation on the characteristic signal points in the characteristic signal point set to obtain the nonlinear parameters of the photoelectric device under test includes: In the first signal curve, calculating a first nonlinear parameter based on the first signal point, the second signal point, the third signal point, and the fourth signal point; In the second signal curve, calculating a second nonlinear parameter based on the first signal point, the second signal point, the third signal point, and the fourth signal point; An average value of the first nonlinear parameter and the second nonlinear parameter is used as the nonlinear parameter of the photoelectric device under test.

3. The method for measuring nonlinear parameters of a photoelectric device according to claim 2, wherein: The calculation formulas of the first nonlinear parameter and the second nonlinear parameter are as follows: ； in, is the third signal point, is the fourth signal point, is the first signal point, is the second signal point, is the first nonlinear parameter or the second nonlinear parameter.

4. A device for measuring nonlinear parameters of a photoelectric device, characterized in that: include: The light source module includes at least one light source group, each light source group includes a matched pulsed first light source and a second light source; the first light source has a fixed delay relative to the second light source; an integrating sphere for obtaining mixed output light of first incident light and second incident light emitted by at least one light source group, wherein the mixed output light is obtained based on diffuse reflection of the first incident light and the second incident light; and the first incident light and the second incident light have matching peak wavelength, bandwidth, optical power, pulse frequency, duty cycle, and amplitude; a photoelectric device under test, configured to capture the mixed output light and convert the mixed output light into an electrical signal; an electrical signal acquisition module, configured to acquire, from the electrical signal, characteristic signal point sets of the first light source and the second light source in different combinations of on and off states; The calculation module is used to perform nonlinear calculation on the characteristic signal points in the characteristic signal point set to obtain nonlinear parameters of the photoelectric device under test.

5. The device for measuring nonlinear parameters of a photoelectric device according to claim 4, characterized in that: The integrating sphere includes a hollow sphere whose inner surface is coated with a diffuse reflection material. The integrating sphere includes an entrance hole and an exit hole. The photoelectric device under test is installed at the rear end of the exit hole. The first light source and the second light source enter the integrating sphere through the entrance hole, and the mixed exit light is emitted from the integrating sphere through the exit hole.

6. The device for measuring nonlinear parameters of a photoelectric device according to claim 5, characterized in that: The integrating sphere includes a built-in baffle: The baffle is used to prevent the first incident light and the second incident light from directly hitting the exit hole in the integrating sphere. The size and angle of the baffle are determined based on the number of the incident holes and their relative positions to the exit hole.

7. The device for measuring nonlinear parameters of a photoelectric device according to claim 4, characterized in that: Each light source group includes a first power source and a second power source: The first power supply is used to regulate the first light source, and the second power supply is used to regulate the second light source so that the optical power, the pulse frequency, the duty cycle and the amplitude of the first incident light and the second incident light match, while ensuring that there is a fixed delay between the first light source and the second light source.

8. The device for measuring nonlinear parameters of a photoelectric device according to claim 4, characterized in that: The first light source and the second light source each include at least one monochromatic LED lamp, and the monochromatic LED lamp generates light with a peak wavelength and bandwidth. The first light source and the second light source turn on the same at least one monochromatic LED lamp to make the peak wavelength and bandwidth of the first incident light and the second incident light the same.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the computer program, the nonlinear parameter measurement method for an optoelectronic device according to any one of claims 1 to 3 is implemented.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the nonlinear parameter measurement method of an optoelectronic device according to any one of claims 1 to 3 is implemented.

Images