A test fixture and a test system

Abstract

This application discloses a test fixture and a test system, relating to the field of circuit design technology. By pre-setting probes on the fixture body that correspond one-to-one with the functional test points of the panel structure, and electrically connecting them to external test equipment via wires, the panel structure can directly complete the interface connection and signal acquisition of functions in the undivided state. This avoids the tedious steps of cutting the board first and then testing it piece by piece in related technologies, and also eliminates the tedious operation of manually plugging in external devices one by one, avoiding the problems of incorrect or missing connections. Moreover, the probes can simultaneously contact multiple functional points on the dual-panel motherboard, thereby supporting synchronous testing of the dual-panel motherboard and significantly improving testing efficiency and reliability. It solves the technical problems of manually connecting test interfaces one by one in related technologies, which is complex and prone to errors, and achieves the technical effect of parallel testing of dual-panel motherboards in the undivided state, significantly improving testing efficiency and accuracy.

Description

Technical Field

[0001] This application relates to the field of circuit design technology, and more particularly to a test fixture and test system. Background Technology

[0002] To ensure the quality and reliability of PCB (Printed Circuit Board) motherboards, functional testing is required after the surface mount technology (SMT) process. Since the functional interfaces of a dual-panel PCB motherboard are often obscured by the PCB frame before being cut into individual panels, making direct connection to testing equipment impossible, related technologies typically require first using a panel cutting machine to divide the dual-panel motherboard into two single-panel motherboards, which are then tested individually. A common method involves using fixtures in conjunction with manual operation. Operators place the single-panel motherboards on the fixture and perform the test procedures one by one to verify the functions of interfaces, switches, and indicator lights.

[0003] However, the tooling fixtures in these technologies only provide support and fixation, lacking automation capabilities. Before testing, manual connection of the motherboard to external devices is still required, a cumbersome process prone to errors or omissions, increasing testing risks. During functional verification, operators must trigger each test step and manually observe and judge the results, which is not only time-consuming and labor-intensive but also susceptible to subjective factors, leading to insufficient test accuracy. Furthermore, due to limitations in fixture structure and operating procedures, these technologies often only allow testing of single motherboards, preventing simultaneous testing of dual-board units, further reducing production efficiency. Therefore, PCB motherboard functional testing in these technologies suffers from complex operation, low efficiency, and insufficient automation, necessitating improved solutions to enhance testing efficiency and reliability. Summary of the Invention

[0004] This application provides a test fixture and a test system to at least solve the technical problems of manual connection of test interfaces one by one in related technologies, which are complex and prone to errors. It achieves the technical effect of parallel testing of dual-panel motherboards in an undivided state, and significantly improves test efficiency and accuracy.

[0005] This application provides a test fixture, comprising: a fixture body configured to support an undivided printed circuit board panel structure, the panel structure including at least two motherboards; a plurality of probes mounted on the fixture body, the positions of the probes corresponding one-to-one with the positions of a plurality of functional test points on the panel structure; when the panel structure is fixed on the fixture body, the probes are electrically connected to the corresponding functional test points; a plurality of wires and a test device, the plurality of wires corresponding one-to-one with the plurality of probes, and the probes being connected to the functional interface of the test device through the corresponding wires.

[0006] This application also provides a testing system, including the test fixture described above, and further including an undivided panel structure and a conveying device; the conveying device is configured to transport the panel structure to the test fixture and fix it on the test fixture after the surface mount technology (SMT) process is completed on the undivided panel structure, so that the test fixture can perform functional tests on multiple motherboards on the panel structure.

[0007] This application achieves a breakthrough by pre-setting probes on the fixture body that correspond one-to-one with the functional test points of the panel structure. These probes are electrically connected to external testing equipment via wires, allowing the panel structure to directly interface with functional devices and acquire signals even when it is not divided. This avoids the tedious steps of cutting panels before testing each piece in related technologies, and also eliminates the manual process of connecting external devices one by one, preventing incorrect or missed connections. Simultaneously, the probes can contact multiple functional points on the dual-panel motherboard, supporting synchronous testing and significantly improving testing efficiency and reliability. This solves the technical problems of manual connection of test interfaces, which is complex and error-prone, in related technologies, achieving the technical effect of parallel testing of dual-panel motherboards in an undivided state, significantly improving testing efficiency and accuracy. Attached Figure Description

[0008] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0009] Figure 1 This is a schematic diagram of a test fixture provided in an embodiment of this application.

[0010] Figure 2 This is a schematic diagram of a battery adapter circuit provided in an embodiment of this application.

[0011] Figure 3 This is a schematic diagram of a touchpad test circuit provided in an embodiment of this application.

[0012] Figure 4 This is a schematic diagram of a switch test circuit provided in an embodiment of this application.

[0013] Figure 5 This is a schematic diagram of a switch test circuit provided in an embodiment of this application.

[0014] Figure 6 This is a schematic diagram of a keyboard key testing circuit provided in an embodiment of this application.

[0015] Figure 7This is a schematic diagram of a keyboard key testing circuit provided in an embodiment of this application.

[0016] Figure 8 This is a schematic diagram of a first indicator light test circuit provided in an embodiment of this application.

[0017] Figure 9 This is a schematic diagram of a second indicator light test circuit provided in an embodiment of this application.

[0018] Figure 10 This is a schematic diagram of a third indicator light test circuit provided in an embodiment of this application.

[0019] Figure 11 This is a schematic diagram of a panel structure for a dual-panel motherboard provided in an embodiment of this application. Detailed Implementation

[0020] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.

[0021] It should be noted that, in the description of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. The terms "first," "second," etc., in this application are used to distinguish similar objects and are not used to describe a specific order or sequence.

[0022] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0023] like Figure 1 This application provides a test fixture, comprising: a fixture body 11 configured to support an undivided printed circuit board panel structure, the panel structure including at least two motherboards; a plurality of probes 12 mounted on the fixture body 11, the positions of the probes 12 corresponding one-to-one with the positions of a plurality of functional test points on the panel structure; when the panel structure is fixed on the fixture body 11, the probes 12 are electrically connected to the corresponding functional test points; a plurality of wires 13 and a test device, the plurality of wires 13 corresponding one-to-one with the plurality of probes 12, and the probes 12 being connected to the functional interface of the test device through the corresponding wires 13.

[0024] Specifically, the test fixture, through the link of fixture body 11, probe 12, wire 13, and test equipment, electrically connects the undivided panel structure (such as... Figure 11 The diagram illustrates a panel structure with two motherboards, establishing a one-to-one connection with the testing equipment. The fixture body 11 supports and secures the panel structure containing at least two motherboards. Multiple probes 12 pre-installed on the fixture body 11 correspond spatially to multiple functional test points distributed on the panel structure. When the panel structure is fixed in place, the probes 12 form reliable electrical contact with the corresponding functional test points, effectively bringing the signal from each test point to the outside of the fixture for excitation and acquisition by the testing equipment.

[0025] Secondly, this application bypasses the problem of the frame obstructing the interface in the panelized state, eliminating the need to rely on the motherboard edge connector for insertion, and instead establishing electrical connections directly at the functional test points. The array distribution of probes 12 allows multiple motherboards on the panelized structure to be contacted simultaneously in the same clamping; the corresponding multiple wires 13 lead these contact points to the functional interfaces of the test equipment, enabling parallel or sequential electrical testing of multiple test points. Thus, the test fixture can complete signal connection and measurement before the panel is cut, significantly reducing the time and errors caused by cutting, disassembly, and repeated insertion and removal.

[0026] Furthermore, in the electrical connection path, each probe 12 is independently connected to the test equipment via a corresponding wire 13, forming a dedicated channel for the probe 12, the individual wire 13, and the equipment interface, ensuring electrical isolation and clear mapping between test points. This one-to-one wiring method facilitates defining clear channel numbers and test item associations on the test equipment side, reducing the impact of cross-coupling on measurement results. It also facilitates targeted excitation and response acquisition for any functional test point, thereby improving the traceability and consistency of test data.

[0027] Furthermore, the direct contact between probe 12 and the functional test point is fast and repeatable. Each time the panel structure is placed onto the fixture body 11, all corresponding probes 12 can simultaneously reach their contact points in a single operation, avoiding mechanical wear and human error caused by point-by-point insertion and removal. Since the connection between the lead wire 13 and the testing equipment is relatively fixed, a single test cycle can be completed by simply performing the placement, contact, testing, and removal actions during production, significantly improving the testing cycle time and production line throughput.

[0028] Furthermore, the architecture of this application exhibits excellent scalability and adaptability. When the position or number of functional test points in the panel structure under test changes, only the corresponding position and number of probes 12 need to be adjusted on the fixture body 11, and the mapping relationship to the test equipment interface needs to be updated at the lead wire 13 end; the basic combination relationship between the fixture body 11, probes 12, lead wire 13, and test equipment remains unchanged. This modular matching method enables the test fixture to adapt to panel structures with different layouts and test point sets of different sizes, facilitating rapid changeover and maintenance in mass production scenarios.

[0029] It is important to understand that, typically, panel structures consisting of at least two motherboards produced on assembly lines in related technologies have borders. The interfaces of these panels are obstructed by the borders, and in these technologies, testing of corresponding functional test points can only be achieved by cutting the panel structure apart. This cutting process is not only complex but can also introduce additional mechanical wear and testing errors. In this embodiment, the undivided panel structure is supported by a fixture body, probes are placed at multiple functional test points on the panel structure, and connected to the testing equipment via wires. This eliminates the need to cut the panel structure and overcomes the limitations imposed by the borders, making the testing process simpler and more efficient.

[0030] In summary, the test fixture provided in this application forms a universal electrical connection framework that can complete signal excitation and acquisition in an unsplit state through the one-to-one contact of the probes 12 with the functional test points, the point-to-point lead-out of the wires 13 with the test equipment, and the support and fixation of the fixture body 11 for the panel structure. This directly solves the technical problems of interface obstruction and the complexity and error-proneness of manual insertion during the panelization stage, resulting in the technical effects of performing functional tests on multiple motherboards in parallel during the same clamping, reducing mechanical wear and human error, and improving test efficiency and consistency.

[0031] In one exemplary embodiment, the test equipment includes: an interface adapter module with an adapter port that is physically defined the same as the target functional test point on the panel structure; the target functional test point is connected to the corresponding adapter port via a probe 12 and a wire 13; a functional device associated with the target functional test point is connected to the adapter port; the functional device includes at least one of a battery body, a power supply body, a fan body, and a speaker body; and a first control device connected to the adapter port and the functional device, configured to send test drive commands to the functional device to cause the functional device to perform a test process, and to collect feedback signals corresponding to the target functional test point through the adapter port.

[0032] In this embodiment, the test equipment achieves electrical mapping between target functional test points and functional devices through an interface adapter module. The interface adapter module has pre-defined adapter ports that are physically identical to the target functional test points on the panel structure. For example, when the target functional test point is a battery interface, its adapter port on the interface adapter module also includes multiple pin definitions consistent with the battery interface. Probes 12 and wires 13 lead out these target functional test points one by one and connect them to the corresponding adapter ports, thereby allowing the electrical functions on the panel structure to be presented through standardized port formats. Since the definition of the adapter port is completely consistent with the actual device interface, functional devices can be directly and seamlessly connected to this port, avoiding additional adaptation or conversion steps.

[0033] Furthermore, the interface adapter module not only serves as an output of electrical signals but also acts as a bridge between functional components and the panel structure during testing. For example, after the battery interface test point on the panel structure is led to the adapter port via probe 12 and wire 13, the battery body is directly plugged into the port, thus forming a connection consistent with the real working environment. In this way, the panel structure can complete the functional docking of components such as batteries, power supplies, cooling fans, or speakers in an undivided state, maintaining a high degree of consistency between the testing environment and actual applications, thereby ensuring the authenticity and verifiability of the test results.

[0034] At the control level, the first control device is connected to the interface adapter module's adapter port and functional devices. Its function is to issue test drive commands to the functional devices and collect feedback signals. For example, when testing the battery interface, the first control device can send charging and discharging drive commands to the battery through the adapter port. While the battery is performing the corresponding action, the feedback signal generated at the target functional test point will return to the first control device through probe 12, wire 13, and the adapter port path. In this way, the working state of the functional devices and the circuit characteristics of the panel structure can be observed simultaneously, thereby realizing the true verification of the function corresponding to the target functional test point.

[0035] Finally, through the cooperation of the interface adapter module and the first control device, the testing equipment achieved a standardized automatic testing path. The interface adapter module transforms the target functional test points on the panel structure into ports that can be directly connected to functional devices, while the first control device triggers each functional device sequentially according to the test program and collects feedback. The entire process requires no manual plugging or unplugging or the intervention of additional equipment. For example, the independent power supply capability of the battery, the stability of the power supply, the speed response of the fan, and the sound effect of the speaker can all be automatically triggered and collected through this system. This design allows the panel structure to complete the docking and testing with multiple functional devices in an undivided state, greatly simplifying the testing operation and improving accuracy and efficiency.

[0036] Furthermore, through the interface adapter module, the test fixture can extract signals from each functional test point via probes and connect them to the functional interface of external testing equipment while the panel structure is still uncut. This design, through the combination of adapter ports and probes, establishes a reliable electrical connection between the functional test points and external testing equipment, eliminating reliance on traditional connectors at the motherboard edge or board cutting operations. Simultaneously, since the signals from the functional test points are extracted through the interface adapter module, mechanical wear and human error caused by plugging and unplugging connectors are reduced, improving the stability and reliability of the test. The use of the interface adapter module also allows the testing equipment to adapt to different functional test point layouts and numbers in a modular manner, offering good scalability and adaptability. This facilitates rapid adjustment and switching between different product batches, resulting in better production line flexibility and responsiveness.

[0037] like Figure 2 For example, the battery interface JBATT1 has a total of 7 pins: BAT, VBAT, EC_SMCA, EC_SMDA, BATT_TEMP_IN, NC, and GND, corresponding to 7 test points. After probing the test points with probe 12, connect probe 12 and the battery interface via wire 13 using the same adapter. The power supply unit, fan unit, and speaker unit are all connected in this way. Before testing, connect the battery unit, power supply unit, fan unit, and speaker unit to this adapter. These interfaces can be directly tested by triggering their functions through the test program, such as software-controlled battery charging and discharging, independent battery power supply, etc., without the need for intervention of other devices or actions. Figure 2 The battery adapter circuit uses probe 12 to poke the battery's test point and connect it to the connector, thus connecting the battery to the connector. Figure 11 In the diagram, the adapter circuit corresponding to the battery body is JBATT1, the adapter circuit corresponding to the power supply body is JBCIN1, the adapter circuit corresponding to the fan body is JFAN1, and the adapter circuit corresponding to the speaker body is JSPK1. Their operating principles are similar to... Figure 2 The principle of the illustrated battery adapter circuit is the same, and will not be described again in this application.

[0038] In one exemplary embodiment, the test equipment includes a test circuit and a function control device. The test circuit includes a signal input terminal, a signal test terminal, and a ground terminal. The signal test terminal is connected to a target signal test point on the motherboard via a corresponding wire 13 and a probe 12. The ground terminal is grounded. The signal input terminal is connected to the output terminal of the function control device, and the input terminal of the function control device is connected to the motherboard. The function control device is configured to output a preset level to the corresponding signal input terminal according to the test function command issued by the motherboard, so that the signal test terminal is short-circuited with the corresponding ground terminal, and to determine the test result according to the connection status between the signal test terminal and the corresponding ground terminal.

[0039] In this embodiment, the test circuit achieves electrical connection to the target signal test points on the motherboard through probe 12 and wire 13. The signal input terminal, signal test terminal, and ground terminal together constitute the basic detection path. When the motherboard is fixed on the test fixture, probe 12 accurately contacts the corresponding signal test point, and the signal test terminal of the test circuit establishes a stable electrical connection with the test point; at the same time, the ground terminal is directly grounded to form a complete test loop. The signal input terminal is connected to the motherboard through a function control device, thereby enabling it to receive and execute test function commands issued by the motherboard during the test.

[0040] At the control level, the function control device applies a preset level signal to the signal input terminal according to the test function commands issued by the motherboard. This level signal allows the test circuit to short-circuit a specific signal test terminal with the ground terminal, thereby simulating actions triggered by a person in actual operation. For example, when the motherboard needs to detect the response of a switch, button, or touch signal, the function control device automatically triggers the function by short-circuiting it. Simultaneously, the function control device also collects and judges the connection status after short-circuiting in real time to determine whether the target signal test point responds correctly, thereby generating the corresponding test result.

[0041] The test circuit and function control device in this embodiment can precisely drive each test port according to the test commands issued by the motherboard and judge the test results of the function points, realizing parallel or sequential testing of multiple function test points on the panel structure. Furthermore, this embodiment can complete the interface establishment between the motherboard and the external test system in one go, avoiding manual plugging and repetitive operations. Functions requiring human-computer interaction, such as keyboards, touchpads, various switches, and indicator lights, can all be transferred to the integrated multi-functional test circuit board for simulated triggering and feedback acquisition using this test circuit. Since the transfer only needs to be connected once before testing, the triggering and result judgment of all functions during the test can be automatically executed by the function control device, realizing the automation and standardization of test actions, improving efficiency, and reducing the uncertainty caused by manual intervention.

[0042] In one exemplary embodiment, the test circuit is a touchpad test circuit, which includes two signal input terminals, two signal test terminals, and two ground terminals that correspond one-to-one with the two buttons on the touchpad. The function control device is specifically configured to output a first signal to the corresponding signal test terminal according to the touchpad test command issued by the motherboard, so as to short-circuit the signal test terminal with the corresponding ground terminal to simulate the triggering action of the touchpad button, and determine the test result of the touchpad according to the connection state between the signal test terminal and the corresponding ground terminal.

[0043] In this embodiment, the touchpad test circuit is configured with two signal input terminals, two signal test terminals, and two ground terminals, each corresponding to one of the two button functions on the touchpad. When the mainboard is fixed on the fixture, probe 12 establishes an electrical connection with the target signal test points of the touchpad buttons. The signal test terminals are connected to these probes 12 via wires 13, while the ground terminals are directly grounded, thus forming an independent test circuit for each button. The function control device, through its connection with the signal input terminals, can control the corresponding button circuits on the touchpad according to the test requirements.

[0044] During testing, the function control device outputs a first signal to the corresponding signal test terminal based on the touchpad test command issued by the motherboard, creating a short circuit between the signal test terminal and its corresponding ground terminal. This short circuit is equivalent to manually pressing a touchpad button, thus simulating an actual triggering action. Simultaneously, the function control device monitors the connection status between the signal test terminal and the ground terminal in real time and uses this as a criterion to confirm whether the touchpad button responds normally when triggered. In this way, accurate touchpad test results can be obtained, achieving automated testing of touchpad functionality.

[0045] In one specific embodiment, such as Figure 3 The touchpad test circuit is used to test the left and right button functions of the touchpad. In this circuit, TP_DATA and TP_CLK correspond to the left and right buttons of the touchpad, respectively. When TP_DATA# and TP_CLK# are shorted to GND, the signal is considered valid, equivalent to a touchpad button being pressed. To achieve this function, TP_DATA# and TP_CLK# are connected to the D1 and D2 pins of component U11, respectively, while the IN1 and IN2 pins of component U11 are connected to P1.0 and P1.1 of the MCU, and S1, S2, and GND, respectively. The MCU's I / O ports serve as control terminals. During the touchpad function test, the host computer (motherboard) sends a trigger command to the slave computer (MCU), and the corresponding I / O port of the slave computer is set to a high level, causing component U11 to start working. Specifically, component U11 shorts D1 to S1 and D2 to S2, thereby achieving the shorting of TP_DATA# and TP_CLK# to GND. At this point, the TP_DATA and TP_CLK signals are pulled low, which is equivalent to pressing the left and right buttons on the touchpad, thus completing the touchpad's functional test. This method allows for automated testing of the touchpad's left and right buttons without manual intervention.

[0046] As can be seen, the touchpad test circuit uses the TP_DATA# and TP_CLK# signals to connect to the D1 and D2 pins of the U11 component, and controls the signal to be pulled low through the MCU IO port to simulate the trigger action of the touchpad button, thereby reducing the tedious steps of manual operation. By automatically controlling the signal to be pulled low, the touchpad function is automatically tested. Figure 11 In this circuit, the touchpad test module is a touchpad test circuit, and the function control device is a microcontroller. Specifically, the touchpad test circuit and the microcontroller can be set on the same circuit board.

[0047] In one exemplary embodiment, the test circuit is a switch test circuit, which includes multiple signal test terminals corresponding to at least one target switch, at least one signal input terminal, and a ground terminal; the function control device is configured to output a corresponding second signal to the corresponding signal input terminal according to the switch test command issued by the motherboard, so as to short-circuit between the signal test terminal and the corresponding ground terminal, thereby simulating the triggering action of the switch and determining the test result of the switch. Figure 11 In this circuit, the switch test module is a switch test circuit, and the function control device is a microcontroller.

[0048] In this embodiment, the switch test circuit is used to perform functional testing on a target switch on the motherboard. The test circuit includes multiple signal test terminals, at least one signal input terminal, and a ground terminal. By controlling different signal input terminals to output preset level signals, a short circuit can be formed between the signal test terminals and the ground terminal, thereby simulating the action of the switch being pressed or triggered.

[0049] The function control device controls the operation of the test circuit according to the switch test command issued by the motherboard. When the second signal is output to the signal input terminal, the corresponding signal test terminal is short-circuited with the ground terminal to simulate the switch action. By detecting the state change between the signal test terminal and the ground terminal, it can be determined whether the target switch is functioning normally, thereby completing the switch test and generating test results.

[0050] In one specific embodiment, such as Figure 4 and Figure 5 The switch test circuit is used to test the switch function on the motherboard. In the circuit, the three signal terminals corresponding to ON / OFFBTN# (power on / off button), NOVO_BTN# (reset button), and LID_SW# (sleep switch) are respectively connected to… Figure 5The D1, D2, and D4 pins of component U22 are connected together, while the S1, S2, and S4 pins are connected to ground (GND). The IN1, IN2, and IN3 pins of component U22 are connected to the P1.2, P1.3, and P1.4 I / O ports of the MCU, respectively, which serve as control terminals. When a switch function test is required, the host computer sends a test command to the slave computer, setting the corresponding I / O port in the slave computer to a high level. At this time, component U22 is activated, shorting D1 and S1, D2 and S2, and D4 and S4. This shorts ON / OFFBTN#, NOVO_BTN#, and LID_SW# to GND, pulling these three signal terminals low, equivalent to simulating a switch being pressed, thus achieving automated testing of the switch function.

[0051] As can be seen, the switch test circuit automates the testing of multiple switches by using a multi-channel control method. Specifically, the switch test circuit controls the triggering action of a simulated switch by shorting multiple signal test terminals to the ground terminal. During the test, according to the switch test commands issued by the host computer, the circuit drives the corresponding signal input terminal of each switch to output a preset level, automatically completing the switch closure test. This optimizes the hardware configuration for switch testing, reduces manual operation through automated control processes, and improves testing efficiency and accuracy.

[0052] In one exemplary embodiment, the test equipment includes a keyboard test circuit and a keyboard test control device. The keyboard test circuit includes M drive signal pins and N sensing signal pins corresponding to multiple keys on the keyboard. Each pin is connected to a functional test point on the motherboard via a wire 13 and a probe 12. M and N are both positive integers. The keyboard test control device has its output terminal connected to the signal input terminal of the keyboard test circuit and its input terminal connected to the motherboard. It is configured to drive the drive signal pins and sensing signal pins to short-circuit in a preset order according to the key positioning command issued by the motherboard, and to position the target keyboard key corresponding to the short-circuiting of the drive signal pins and sensing signal pins until all keyboard keys are positioned. Figure 11 The keyboard test module in the diagram is a keyboard test circuit.

[0053] In this embodiment, the keyboard test circuit is used to detect the functionality of the keyboard keys on the motherboard. The test circuit includes multiple drive signal pins and multiple sensing signal pins. By applying an electrical level signal, the action of pressing a key can be simulated. The drive signal pins are activated in a preset order, while the corresponding sensing signal pins are shorted, thereby realizing the testing of the function of a single key.

[0054] The keyboard testing and control device, based on the key positioning commands issued by the motherboard, controls the sequential shorting of drive signal pins and sensing signal pins, and determines the keyboard key position corresponding to the current operation based on the shorting status. This process is repeated until the function testing of all keyboard keys is completed, achieving automated testing and key positioning of the keyboard.

[0055] In one specific embodiment, such as Figure 6 and Figure 7 The keyboard test circuit includes multiple DRV signal pins (DRV0-DRV15) and SENSE signal pins (SENSE0-SENSE7). As shown in the keyboard matrix diagram, when a key is pressed, the corresponding DRV and SENSE signals are shorted, thus determining that the key is valid. Each combination of DRV and SENSE signals corresponds to a unique keyboard key, thereby enabling the location and testing of key functions. Figure 7 Taking the U33 as an example, when performing keyboard testing, the DRVx signal pin (DRVx is one of DRV0-DRV15) is connected to the D1 port of the U33, and the SENSEx signal pin (SENSEx is one of SENSE0-SENSE7) is connected to the S1 port of the U33. The shorting of each DRV signal and SENSE signal is controlled by the MCU's I / O port. By sequentially shorting each pair of DRV and SENSE signals, the functional testing of all 128 keys on the keyboard can be completed, achieving automated and accurate key detection.

[0056] As can be seen, the keyboard test circuit achieves the positioning and testing of multiple keyboard keys through dynamic control of the drive signal pin (DRVx) and the sensing signal pin (SENSEx). By controlling the shorting of the DRV pin and SENSE pin one by one, the pressed state of different keys is simulated, and the function of each key can be identified and verified without manual triggering of each key. It not only supports large-scale key testing but also improves the efficiency of testing the function of each key through drive and sensing signal control.

[0057] In one exemplary embodiment, the test fixture further includes at least one indicator light testing device and at least one optical fiber; the first input terminal of the indicator light testing device is connected to the motherboard, and the second input terminal of the indicator light testing device is connected to the corresponding indicator light on the motherboard via the optical fiber; the indicator light testing device is configured to operate according to the indicator light test instructions of the motherboard, acquire the optical signal of the indicator light through the optical fiber, determine whether the brightness and color of the indicator light meet the preset requirements based on the optical signal, and generate the test result of the indicator light of the motherboard. Figure 11 The indicator light test module includes an indicator light test device and optical fiber.

[0058] In this embodiment, the indicator light testing device acquires the optical signals of the indicator lights on the motherboard via optical fiber, thereby detecting the status of the indicator lights. When the motherboard issues an indicator light test command, the indicator light testing device starts working, receiving the optical signals emitted by the indicator lights via optical fiber. Optical fiber can accurately transmit the optical signals to the indicator light testing device, thus avoiding the influence of ambient light interference on the measurement results.

[0059] The indicator light testing device processes and analyzes the received optical signals, determining whether the brightness and color of the indicator light meet preset test requirements by judging the intensity and color changes of the light signal. This processing can provide real-time feedback on the working status of the motherboard indicator lights and generate corresponding test results.

[0060] This testing method enables simultaneous detection of multiple indicator lights without requiring manual observation of their status, thus improving the automation and accuracy of the test. Furthermore, utilizing fiber optics to acquire optical signals allows for remote physical measurement, making the testing environment more flexible and reducing human error.

[0061] Furthermore, the method in this embodiment can cover the testing requirements of indicator lights with different colors and brightness levels, support the detection of multi-functional indicator lights on complex motherboards, and achieve rapid and high-precision test result generation, providing a reliable basis for motherboard function verification.

[0062] In one exemplary embodiment, the indicator light testing device includes an indicator light control device, a driving device, and a photosensitive device. The input terminal of the indicator light control device is connected to the motherboard, and the output terminal of the indicator light control device is connected to the driving terminal of the photosensitive device through the driving device. The input terminal of the photosensitive device is connected to an optical fiber, and the output terminal of the photosensitive device is connected to the feedback terminal of the indicator light control device. The indicator light control device is configured to output a driving signal to the driving device according to the indicator light test command of the motherboard, determine whether the brightness and color of the indicator light meet the preset requirements based on the optical signal, and generate the test result of the indicator light of the motherboard. The driving device is configured to output an enable signal to the photosensitive device according to the driving signal. The photosensitive device is configured to collect the optical signal of the indicator light through the optical fiber when it receives the enable signal, and feed the optical signal back to the indicator light control device.

[0063] In this embodiment, the indicator light testing device achieves automated testing of motherboard indicator lights through the coordinated operation of an indicator light control device, a driving device, and a photosensitive device. The indicator light control device receives indicator light test commands from the motherboard and generates corresponding driving signals based on the commands. These driving signals are then transmitted to the driving device to control the operating state of the photosensitive device. Upon receiving the driving signal, the driving device outputs an enable signal to the photosensitive device, causing it to begin acquiring optical signals at a predetermined time, thereby achieving real-time control and monitoring of the indicator light status.

[0064] Upon receiving the enable signal, the photosensitive device acquires the optical signals emitted by the motherboard indicator lights via optical fiber. The optical fiber accurately transmits the brightness and color information of the indicator lights to the photosensitive device, avoiding external light interference and ensuring the reliability of the test signals. The photosensitive device then feeds back the acquired optical signals to the indicator light control device for further analysis and judgment.

[0065] The indicator light control device processes the received optical signals, analyzes the intensity and color characteristics of the light signals to determine whether the brightness and color of the indicator lights meet the preset test requirements, and generates the test results for the motherboard indicator lights. This process automates the detection of indicator lights, eliminating the need for manual observation and thus improving testing efficiency and accuracy.

[0066] The method provided in this embodiment supports indicator light testing with multiple colors and brightness levels, and is suitable for complex indicator light combinations on different motherboards. Through the coordinated work of the driving device, photosensitive device, and control device, rapid and accurate optical signal acquisition and analysis can be achieved, providing reliable test data for motherboard functional verification.

[0067] In one exemplary embodiment, the driving device includes a first resistor, a second resistor, and a controllable switch; the first end of the first resistor is connected to the output end of the indicator light control device, the second end of the first resistor is connected to the control end of the controllable switch, the first end of the controllable switch is connected to the first end of the second resistor and the driving end of the photosensitive device, the second end of the second resistor is connected to the power supply, and the second end of the controllable switch is grounded.

[0068] In this embodiment, the driving device controls the electrical signals of the photosensitive device through a first resistor, a second resistor, and a controllable switch. The driving signal output by the indicator light control device passes through the first resistor and acts on the control terminal of the controllable switch, thereby controlling the on or off state of the controllable switch. By adjusting the state of the controllable switch, current can be selectively guided to the second resistor and the driving terminal of the photosensitive device, thereby providing the necessary operating voltage and trigger signal for the photosensitive device, enabling the photosensitive device to start optical signal acquisition at a predetermined time. This design allows the driving device to flexibly control the operation of the photosensitive device according to the driving signal issued by the indicator light control device, achieving high-precision indicator light testing and optical signal acquisition.

[0069] In a specific embodiment, such as Figure 8 , Figure 9 and Figure 10In the three diagrams, the first resistors correspond to R11, R12, and R13, respectively, and the photosensitive devices correspond to U3, U4, and U5, respectively. The second resistors correspond to R7, R8, and R9, respectively. Specifically, the surfaces of LED2, LED3, and LED4 (not shown in the diagram) on the motherboard are connected to the photosensitive devices U3, U4, and U5 on the test fixture via optical fibers. The MCU (indicator control device) controls the corresponding transistors Q1, Q2, and Q3 through I / O interfaces P2.2, P2.3, and P2.4, enabling the enable ports of the corresponding photosensitive devices U3, U4, and U5 (i.e., the ports corresponding to OE1, OE2, and OE3) to work, thereby testing the brightness and color of LED2, LED3, and LED4. During the test, the host computer (motherboard) communicates with the slave computer (MCU) to automatically trigger the test program to complete the color switching and brightness judgment of each LED.

[0070] Taking LED2 as an example, when the MCU assigns a high level to the P2.2 interface, the transistor conducts, enabling the OE1 pin, and U3 starts working. The test program acquires the optical signal of LED2 according to the preset R, G, B values ​​and compares it with the R, G, B values ​​acquired by U2. First, it determines whether LED2 is lit normally and whether its color is white, then it switches LED2 to red for further determination. After the test is completed, the MCU assigns a low level to the P2.2 interface, causing U3 to stop working. Subsequently, the P2.3 and P2.4 interfaces are controlled in a similar manner, allowing U4 and U5 to perform brightness and color tests on LED3 and LED4 respectively.

[0071] Throughout the testing process, the MCU determines whether each LED meets the preset brightness and color requirements based on the R, G, and B values ​​fed back from the photosensitive device, and sends the results back to the host computer. If LED2, LED3, and LED4 all meet the requirements, the host computer displays a "pass" result; if any LED fails to meet the preset requirements, the test result is displayed as "fail." This embodiment achieves automated and accurate LED brightness and color testing, improving testing efficiency and ensuring testing reliability.

[0072] As can be seen, this embodiment monitors the brightness and color of the LED in real time to determine whether it meets preset requirements. Unlike manual inspection or single brightness measurement methods in related technologies, this embodiment acquires the optical signals of the LED through optical fiber and uses a photosensitive device for real-time feedback, ensuring multi-dimensional (brightness, color) testing of the LED. This multi-level testing method not only improves the accuracy of detection but also covers the functions of different types of LEDs, ensuring that the operating status of each LED meets product standards.

[0073] In one exemplary embodiment, the aforementioned functional control devices can be independent modules or integrated into the same MCU. The MCU sequentially controls and tests each component, including the battery, power supply, fan, speaker, touchpad, switch, keyboard, and indicator lights. Through unified scheduling by the MCU, corresponding control signals can be output according to a preset test sequence, enabling sequential activation and status acquisition of each functional module, thereby completing the fully automated testing process. This configuration ensures the flexibility of independent control for each module while also improving system integration and overall testing efficiency through centralized management of the testing process by a single MCU, while reducing the occupation and cost of control hardware resources.

[0074] In one specific embodiment, the test architecture is as follows: Figure 11 The testing process is as follows: The panel structure of the dual-panel motherboard is placed on the automated testing fixture for dual-panel PCB motherboards; the fixture is closed, allowing probe 12 to pierce various functional test points on the panel structure; the system is powered on; the host computer loads the test program to perform automated functional tests on interfaces such as the battery, power supply, fan, and speaker; subsequently, the touchpad and various switch test interfaces are displayed, with the host computer controlling the slave computer to drive U11 and U22, pulling the corresponding functional signals low to achieve the test of the touchpad and various switches; then, the keyboard test interface is displayed, with the host computer controlling the slave computer to drive U33 to perform keyboard key function tests via communication between the host and slave computers; subsequently, the indicator light test interface is displayed, controlling the LEDs and dual-color lights to illuminate, and collecting optical signals through a photosensitive device to determine whether the brightness and color of the LED light source meet the preset requirements, thus testing the indicator light array; after all tests are completed, the panel structure is cut.

[0075] As can be seen, this embodiment realizes fully automated testing from interface function testing to touchpad, switch, keyboard and LED indicator, making full use of the probe 12 of the test fixture and various functional control devices to achieve efficient and accurate functional verification of the panel structure in the undivided state.

[0076] In one exemplary embodiment, a data processing module can be integrated to receive test result data collected by each functional test module in real time. Through algorithms, the test data is statistically analyzed, trends are analyzed, and anomalies are detected. During testing, it can automatically identify potential abnormal states of the battery, power supply, fan, keyboard, touchpad, switches, or indicator light arrays, and generate warnings or suggested repair measures, thereby identifying potential problems in advance without relying on manual observation. This not only achieves fully automated functional testing of dual-panel motherboards but also proactively analyzes and predicts anomalies during testing, improving test reliability, reducing subsequent rework and loss risks, and further enhancing production efficiency and product quality control.

[0077] In one exemplary embodiment, a test strategy optimization module can be configured. This module dynamically generates the optimal test sequence and test parameter configuration based on historical test data, response time, failure probability, and thermal load of each functional test module. During testing, the module can adjust the test sequence in real time, for example, testing the functional points most prone to failure first, or adjusting the test power of LEDs, fans, and power supplies according to the thermal state of the equipment, thereby reducing equipment stress and shortening the overall test time. This achieves intelligent and adaptive testing processes, not only saving test time but also reducing the risk of device thermal loss caused by continuous high-load testing. Furthermore, dynamically adjusting the sequence and parameters improves the accuracy of fault detection for critical functional points.

[0078] This application also provides a testing system, including the aforementioned test fixture, and further including an undivided panel structure and a conveying device; the conveying device is configured to transport the panel structure to the test fixture and fix it on the test fixture after the surface mount technology (SMT) is completed on the undivided panel structure, so that the test fixture can perform functional tests on multiple motherboards on the panel structure.

[0079] In this embodiment, the testing system uses a conveyor to transport the undivided panel structure from the surface mount technology (SMT) location to the testing fixture, achieving automated handling and positioning of the panel structure. This conveying method allows the panel structure to directly enter the testing phase in its undivided state, avoiding the tedious manual handling and piece-by-piece positioning, thus improving the automation level and overall efficiency of the production line. The conveyor design ensures the panel structure is stably fixed on the testing fixture, guaranteeing that multiple motherboards can be tested synchronously within the same timeframe. Utilizing a pre-set functional testing mechanism on the testing fixture, the system automatically tests the interfaces, switches, keyboards, touchpads, and indicator lights of each motherboard on the panel structure, enabling parallel testing of multiple motherboards and significantly improving testing efficiency and reliability.

[0080] For a description of the features in the embodiment corresponding to the test system, please refer to the relevant description of the embodiment corresponding to the test fixture, which will not be repeated here.

[0081] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0082] The above provides a detailed description of the test fixture and test system provided in this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the embodiments above are only intended to help understand the method and core ideas of this application. It should be noted that those skilled in the art can make various improvements and modifications to this application without departing from its principles, and these improvements and modifications also fall within the protection scope of the claims of this application.

Claims

1. A test fixture, characterized in that, include: The fixture body is configured to support an undivided printed circuit board panel structure, the panel structure including at least two motherboards; Multiple probes are mounted on the fixture body, and the positions of the probes correspond one-to-one with the positions of multiple functional test points on the panel structure; when the panel structure is fixed on the fixture body, the probes are electrically connected to the corresponding functional test points. Multiple wires and testing equipment, wherein each of the multiple wires corresponds one-to-one with a multiple of the probes, and the probes are connected to the functional interface of the testing equipment through the corresponding wires; The testing equipment includes a testing circuit and a functional control device; The test circuit includes a signal input terminal, a signal test terminal, and a ground terminal; the signal test terminal is connected to the target signal test point on the motherboard through corresponding wires and probes, the ground terminal is grounded, the signal input terminal is connected to the output terminal of the function control device, and the input terminal of the function control device is connected to the motherboard; The function control device is configured to output a preset level to the corresponding signal input terminal according to the test function command issued by the motherboard, so as to short-circuit the signal test terminal with the corresponding ground terminal, and determine the test result according to the connection status between the signal test terminal and the corresponding ground terminal.

2. The test fixture according to claim 1, characterized in that, The testing equipment also includes: An interface adapter module is provided with an adapter port that is physically defined the same as the target functional test point on the panel structure. The target functional test point is connected to the corresponding adapter port through the probe and the wire. The functional device associated with the target functional test point is connected to the adapter port. The functional device includes at least one of a battery body, a power supply body, a fan body, and a speaker body. A first control device is connected to the adapter port and the functional device respectively, and is configured to send test drive commands to the functional device so that the functional device executes the test process, and collect feedback signals corresponding to the target functional test points through the adapter port.

3. The test fixture according to claim 1, characterized in that, The test circuit is a touchpad test circuit, which includes two signal input terminals, two signal test terminals, and two ground terminals that correspond one-to-one with the two buttons on the touchpad. The function control device is specifically configured to output a first signal to the corresponding signal test terminal according to the touch panel test command issued by the motherboard, so as to short-circuit the signal test terminal with the corresponding ground terminal to simulate the triggering action of the touch panel button, and determine the test result of the touch panel according to the connection state between the signal test terminal and the corresponding ground terminal.

4. The test fixture according to claim 1, characterized in that, The test circuit is a switch test circuit, which includes multiple signal test terminals corresponding to at least one target switch, at least one signal input terminal, and a ground terminal. The function control device is configured to output a corresponding second signal to the corresponding signal input terminal according to the switch test command issued by the motherboard, so as to short-circuit the signal test terminal with the corresponding ground terminal to simulate the triggering action of the switch and determine the test result of the switch.

5. The test fixture according to claim 1, characterized in that, The testing equipment includes a keyboard testing circuit and a keyboard testing control device; The keyboard test circuit includes M drive signal pins and N sensing signal pins corresponding to multiple keys on the keyboard. Each pin is connected to a functional test point on the motherboard through the wire and the probe. Both M and N are positive integers; The keyboard test control device has its output terminal connected to the signal input terminal of the keyboard test circuit and its input terminal connected to the motherboard. It is configured to drive the drive signal pin and the sensing signal pin to short-circuit in a preset order according to the key positioning command issued by the motherboard, and to locate the target keyboard key corresponding to the short-circuiting of the drive signal pin and the sensing signal pin, until all keyboard keys are located.

6. The test fixture according to any one of claims 1-5, characterized in that, The test fixture also includes at least one indicator light test device and at least one optical fiber; The first input terminal of the indicator light testing device is connected to the motherboard, and the second input terminal of the indicator light testing device is connected to the corresponding indicator light on the motherboard via an optical fiber; The indicator light testing device is configured to operate according to the indicator light testing instructions of the motherboard, collect the optical signals of the indicator lights through the optical fiber, determine whether the brightness and color of the indicator lights meet the preset requirements based on the optical signals, and generate the test results of the indicator lights of the motherboard.

7. The test fixture according to claim 6, characterized in that, The indicator light testing device includes an indicator light control device, a driving device, and a photosensitive device; The input terminal of the indicator light control device is connected to the motherboard, the output terminal of the indicator light control device is connected to the driving terminal of the photosensitive device through the driving device, the input terminal of the photosensitive device is connected to the optical fiber, and the output terminal of the photosensitive device is connected to the feedback terminal of the indicator light control device. The indicator light control device is configured to output a drive signal to the drive device according to the indicator light test command of the motherboard, determine whether the brightness and color of the indicator light meet the preset requirements according to the optical signal, and generate the test result of the indicator light of the motherboard; The driving device is configured to output an enable signal to the photosensitive device according to the driving signal; The photosensitive device is configured to acquire the optical signal of the indicator light through the optical fiber when it receives an enable signal, and to feed the optical signal back to the indicator light control device.

8. The test fixture according to claim 7, characterized in that, The driving device includes a first resistor, a second resistor, and a controllable switch; The first end of the first resistor is connected to the output end of the indicator light control device, the second end of the first resistor is connected to the control end of the controllable switch, the first end of the controllable switch is connected to the first end of the second resistor and the driving end of the photosensitive device, the second end of the second resistor is connected to the power supply, and the second end of the controllable switch is grounded.

9. A testing system, characterized in that, It includes the test fixture as described in any one of claims 1-8, and further includes an undivided panel structure and a conveying device; The conveying device is configured to transport the panel structure to the test fixture and fix it on the test fixture after the surface mount process is completed on the undivided panel structure, so that the test fixture can perform functional tests on multiple motherboards on the panel structure.

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