COTS device total dose irradiation assurance grading method based on in-orbit application scene classification

Abstract

The invention discloses a COTS device total dose irradiation assurance grading method based on in-orbit application scene classification, and the method comprises the steps: firstly carrying out the key grade division of single machines, including I-grade single machines, II-grade single machines and III-grade single machines, then carrying out the COTS device total dose irradiation assurance grade division, and finally carrying out the classification based on application scenes. And enabling different stand-alone grades to correspond to different irradiation assurance grades, and carrying out a total dose irradiation evaluation test. The application-based COTS device total dose irradiation guarantee method is formed according to the characteristics of different COTS devices, the purposes of agility, high efficiency and scientific reduction of test cost are achieved, the use cost of components is reduced, meanwhile, the reliability of on-orbit application is ensured, the problem that the COTS device total dose irradiation evaluation test is expensive is solved, and the method is suitable for popularization and application. The defect that an existing irradiation test method is scientific in process and cost reduction and has no specific implementation path is overcome.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of ground simulation test evaluation of low-cost commercial device anti-ionizing total dose capability for commercial space, and particularly relates to a COTS device total dose irradiation guarantee grading method based on on-orbit application scenario classification. BACKGROUND

[0002] With the advent of the marketization era of the aerospace industry, in recent years, along with the national vigorous promotion of the industrial upgrading and reform of "Internet + aerospace", under the background of a new round of global industrial revolution, China has made progress in commercial satellites. The investors of commercial satellites pay more attention to the cost of satellite development. Space-grade devices generally pursue stable performance, long-term reliable operation and require anti-radiation capability, and are slow to update and replace, which is difficult to meet the demand of users for high performance. It is difficult to adapt to the market development requirements to continue to use "high price and long development cycle" space-grade devices for the development of low-cost satellites and commercial satellites. COTS (commercial of the shelf) device technology is advanced and superior in performance. Its performance is generally 1-2 generations of space-grade devices, and it has a faster development speed, low cost, small package size, short procurement cycle, high availability and other characteristics. Selecting COTS devices can reduce the development cost of commercial satellites and microsatellites to a certain extent. However, the design and manufacture of COTS devices are aimed at civil fields that are easy to maintain and replace equipment and are used in well-controlled environments, and are not aimed at military applications, especially aerospace high-reliability applications in harsh working environments. COTS devices will inevitably encounter many problems and risks when directly applied in space. Satellites will encounter various severe space radiation environments during on-orbit operation, including galactic cosmic rays, solar cosmic rays, and earth radiation belts. The space radiation environment seriously threatens the on-orbit reliable operation and life of satellites and other spacecraft. All electronic components are affected by ionizing total dose effects. At present, in the radiation evaluation of space-grade electronic components, according to method 1019.3 ionizing radiation (total dose) in GJB548C-2021 microelectronic device test methods and procedures, device-level evaluation tests are carried out. However, the existing method has long test cost and test cycle, and needs to be further adapted to the development of commercial aerospace. Under the premise of ensuring the quality reliability of satellite space radiation effects, the existing irradiation guarantee system needs to be optimized to reduce the test cost scientifically.

[0003] The paper of Zheng Xiaoyan of the Small Satellite Innovation Research Institute of the Chinese Academy of Sciences, "Research on Component Selection Based on AHP", proposes a component selection method for low-cost satellites and commercial satellites based on AHP, establishes a component selection process based on component application level, and gives a comprehensive evaluation method for component selection scheme based on AHP. The disadvantage of this method is that there is no total dose radiation quality assurance method for COTS devices in space environment. The paper of JIMING of Shenzhen Aerospace Dongfanghong Haitian Satellite Co., Ltd. "A board-level total dose test method for COTS products", proposes to perform total dose radiation test on the entire circuit board or device at one time. This method fails to combine mission profile and application risk classification, such as not considering the use of COTS devices for core important single machines, and there is a certain risk in using board-level radiation test. The above patents or papers fail to provide effective implementation paths and methods, and cannot be accurately implemented in actual operation, which is not strong in operability and cannot effectively reduce the cost of ionizing total dose effect evaluation test. The present application provides a COTS device total dose irradiation guarantee grading method based on on-orbit application scenario classification, which first performs comprehensive evaluation on the basis of mission nature, orbit height, mission period and other information, divides the single machine into key levels, and uses different anti-radiation guarantee methods for COTS devices selected by different key level single machines, realizes agile, efficient and scientific reduction of test cost, and establishes a COTS device total dose irradiation guarantee grading method with obvious cost advantage. SUMMARY

[0004] To solve the above problems, the present application provides a COTS device total dose irradiation guarantee grading method based on on-orbit application scenario classification, which is based on the on-orbit environment of the whole satellite, combined with the working characteristics of the single machine, and forms a COTS device total dose irradiation guarantee method based on application according to the characteristics of different COTS devices, establishes a low-cost COTS device total dose irradiation guarantee system, and the specific technical scheme is as follows:

[0005] A COTS device total dose irradiation guarantee grading method based on on-orbit application scenario classification, comprising the following steps:

[0006] S1, key level division of single machine

[0007] Comprehensive evaluation is performed in combination with mission profile such as mission nature, orbit height, mission period and application, and risk control measures such as component, single machine, subsystem and whole satellite angle anti-radiation reinforcement, the single machine is divided into key levels, including class I single machine, class II single machine and class III single machine;

[0008] The class I single machine has the lowest inherent risk and is suitable for key mission application, mainly including single machines for realizing basic functions of satellite mission; the risk level requirement is the lowest when selecting components according to this requirement;

[0009] The risk level of the second single machine is higher than that of the first single machine and lower than that of the third single machine, and is suitable for general aerospace applications; when selecting components and elements according to the requirement, the cost limit and the requirements of the task target need to be considered; in addition to single-point design, all main target functions or redundant designs of the whole machine are allowed;

[0010] The risk level of the third single machine is higher than that of the second single machine, and when selecting components and elements according to the requirement, a medium-risk task can be accepted under the condition that the cost limit allows.

[0011] S2, total dose irradiation assurance level division of COTS devices

[0012] The irradiation assurance level is divided into irradiation assurance level I, irradiation assurance level II and irradiation assurance level III.

[0013] S3, based on application scenario classification, corresponding different single machine levels and different irradiation assurance levels and carrying out irradiation test

[0014] When the COTS device is of irradiation assurance level I, the existing standard is used for device-level total dose irradiation evaluation test;

[0015] When the COTS device is of irradiation assurance level II, historical data is used for device-level total dose irradiation evaluation test;

[0016] When the COTS device is of irradiation assurance level III, the COTS device is subjected to PCB board-level or system-level total dose irradiation evaluation test with the single machine.

[0017] Specifically, when the single machine is a first single machine, a COTS device of irradiation assurance level I is selected, and COTS device total dose irradiation evaluation test is carried out according to GJB548C or QJ10004-2018 batch by batch.

[0018] Specifically, when the single machine is a second single machine, the COTS device of irradiation assurance level II is selected, including the following steps:

[0019] First, confirm whether the selected COTS device has historical batch irradiation data;

[0020] When the selected COTS device has no historical batch irradiation data, device-level total dose irradiation test is carried out according to GJB548C-2021 to obtain irradiation test data, and then structure analysis is carried out, and the irradiation test data is retained in the layout; when the batch of devices is selected again later, irradiation test does not need to be carried out again, and only total dose irradiation evaluation test needs to be carried out by comparing with historical data and layout;

[0021] When the selected COTS device has historical batch irradiation data, structural analysis is performed on the selected batch of COTS devices to obtain an irradiation test data map, and then the obtained map is compared with the device map of the existing historical batch irradiation data; if the map comparison result is consistent, the existing historical irradiation data result is directly used, and if the map comparison result is inconsistent, a total dose irradiation evaluation test needs to be performed again.

[0022] Specifically, when the single machine is a III-grade single machine, a COTS device with a radiation assurance level III is selected, a PCB board-level or system-level total dose test is carried out, and it is verified whether the COTS product can meet the anti-total dose requirements of the satellite, including the following steps:

[0023] Firstly, combined with the characteristics of the space radiation environment, the total dose damage weak link analysis of the COTS device is carried out, the list of irradiation sensitive devices of the product is quickly obtained, and the total dose irradiation sensitive characteristic analysis of the COTS device is carried out;

[0024] Secondly, the COTS device total dose irradiation evaluation circuit is designed according to the COTS device total dose irradiation sensitive characteristic analysis result;

[0025] Preferably, the circuit design should minimize the irradiation circuit area as much as possible; the conditions during the circuit design should be consistent with the final application conditions; the design of the system-level irradiation circuit is constrained, and the socket connection is adopted for the key devices; the circuit design should consider the coverage of the COTS device board card level test, and ensure that each COTS device board level or system level function that needs to be evaluated can be tested; if the anti-irradiation capability of the device is obviously lower than the system requirement index, the circuit needs to be protected during the irradiation process; the key parameters that can represent the function and performance of the system-level irradiation circuit need to be detected, mainly including power supply, voltage, telemetry signal, output signal of key nodes and digital waveform;

[0026] Then, the system-level total dose evaluation test of the COTS device is carried out, a suitable radiation source and dose rate are selected to ensure the consistency of the doses of the devices at different positions of the circuit;

[0027] Finally, the irradiation evaluation circuit is tested, if the irradiation evaluation circuit functions normally, it is considered that the COTS device verified by the irradiation circuit reaches the total dose irradiation assurance level III; if the irradiation evaluation circuit function is abnormal, the system function decomposition and modeling are established, the failure device is located, it is considered that the failure device cannot meet the total dose irradiation assurance level III of the COTS device, and the total dose irradiation evaluation test needs to be carried out again until the COTS product passes the board-level total dose test and the overall total dose radiation data of the system is obtained.

[0028] Compared with the prior art, the beneficial effects obtained by the present application are as follows:

[0029] The application realizes the purposes of agility, high efficiency and scientific reduction of test cost, reduces the use cost of components, ensures the reliability of on-orbit application, solves the problem of expensive COTS device total dose irradiation evaluation test, and makes up for the deficiency of no specific implementation path of the current irradiation test method process scientific cost reduction. BRIEF DESCRIPTION OF DRAWINGS

[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed to be used in the embodiments or the prior art description will be briefly introduced. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0031] Figure 1 A COTS device total dose irradiation guarantee grading method based on on-orbit application scenario classification of the present application is shown in the following flow chart.

[0032] Figure 2 A COTS device PCB board level test or system level total dose irradiation test flow chart of the present application is shown in the following flow chart.

[0033] Figure 3 An anti-irradiation application guarantee level reliability and cost schematic diagram of the present application is shown in the following schematic diagram.

[0034] Figure 4 A system level total dose damage fault propagation modeling flow of the present application is shown in the following flow chart.

[0035] Figure 5 A COTS device board level total dose irradiation test test composition block diagram of the present application is shown in the following block diagram. DETAILED DESCRIPTION

[0036] The present application will be described in detail below in combination with specific embodiments. The following embodiments are helpful for those skilled in the art to further understand the present application, but do not limit the present application in any form. It should be pointed out that those skilled in the art can make several changes and improvements without departing from the concept of the present application. These all belong to the protection scope of the present application.

[0037] A COTS device total dose irradiation guarantee grading method based on on-orbit application scenario classification is shown in the following flow chart. Figure 1 The method comprises the following steps:

[0038] S1, single key level division

[0039] The key grade of the single machine is divided, including the first grade single machine, the second grade single machine and the third grade single machine, based on the full range evaluation of the task profile such as the task nature, the orbit height, the task cycle, the application, and the risk control measures such as the radiation hardening of the components, the single machine, the subsystem, the whole satellite, and the angle;

[0040] The first grade single machine has the lowest inherent risk, is suitable for the application of the key task, and mainly includes the single machine for realizing the basic function of the satellite task; the risk level acceptable when the component is selected according to the requirement is the lowest;

[0041] The risk level of the second grade single machine is higher than that of the first grade single machine and lower than that of the third grade single machine, and is suitable for the general aerospace application; when the component is selected according to the requirement, the cost limit and the requirement of the task target need to be considered; in addition to the single point design, the main target function or the redundant design of all the whole machines is allowed;

[0042] The risk level of the third grade single machine is higher than that of the second grade single machine; when the component is selected according to the requirement, the medium risk task is acceptable under the condition that the cost limit is allowed.

[0043] S2, total dose irradiation assurance grade division of COTS device

[0044] The irradiation assurance grade is divided, including the irradiation assurance grade I, the irradiation assurance grade II and the irradiation assurance grade III;

[0045] As shown in Figure 3 the different anti-irradiation assurance grades adopt different test methods, and the risk release costs generated are also different.

[0046] S3, based on the application scene classification, the different single machine grades are corresponded to the different irradiation assurance grades and the irradiation test is carried out

[0047] As shown in Table 1, when the COTS device is the irradiation assurance grade I, the device level total dose irradiation evaluation test is carried out by using the existing standard;

[0048] When the COTS device is the irradiation assurance grade II, the device level total dose irradiation evaluation test is carried out by using the historical data;

[0049] When the COTS device is the irradiation assurance grade III, the COTS device is carried out with the PCB board level or the system level total dose irradiation evaluation test with the single machine;

[0050] Table 1 irradiation assurance grade and single machine key grade classification corresponding relationship table and total dose irradiation test method

[0051]

[0052] Specifically, when the single unit is a Class I single unit, COTS devices with irradiation assurance level I are selected, and total dose radiation tests of COTS devices are carried out batch by batch in accordance with GJB548C or QJ10004-2018.

[0053] Among them, GJB548C "Test Methods and Procedures for Microelectronic Devices" specifies the climatic environment test, mechanical environment test, electrical test and inspection procedures for military microelectronic devices, as well as the control measures and limiting conditions necessary to ensure that microelectronic devices meet the quality and reliability requirements for their intended use; Method 1019.3 in GJB548C specifies the cobalt 60 ( 60 Test procedures and requirements for ionizing radiation (total dose) effects of Co-γ-ray sources, including room temperature radiation test, high temperature / low temperature radiation test, accelerated annealing test and dose rate enhancement effect (ELDRS);

[0054] QJ10004-2018 specifies the use of cobalt 60 ( 60 General requirements and test procedures and methods for total ionizing dose irradiation tests of Co (gamma rays) on aerospace semiconductor devices;

[0055] Specifically, when the single unit is a Class II single unit, selecting a COTS device with irradiation protection level II includes the following steps:

[0056] First, confirm whether the selected COTS device has historical batch irradiation data;

[0057] When there is no historical batch irradiation data for the selected COTS device, a device-level total dose irradiation test is carried out according to GJB548C to obtain irradiation test data. Then, structural analysis is carried out, and the irradiation test data is stored in the layout. When the same batch of devices is selected again in the future, there is no need to carry out irradiation test again. It is only necessary to conduct a total dose irradiation assessment by comparing with historical data and layout.

[0058] When there is historical batch irradiation data for the selected COTS device, structural analysis is performed on the selected batch of COTS device to obtain the irradiation test data layout. Then, the obtained layout is compared with the device layout of the existing historical batch irradiation data. If the layout comparison results are consistent, the existing historical irradiation data results are used directly. If the layout comparison results are inconsistent, the irradiation test needs to be carried out again.

[0059] Specifically, when the single unit is a Class III single unit, COTS devices with irradiation assurance level III are selected, and total dose tests are conducted at the PCB board level or system level, such as... Figure 2 As shown, it includes the following steps:

[0060] A1, according to the characteristics of the space radiation environment, the total dose damage weak link of COTS devices is analyzed, the radiation sensitive device list of the product is quickly obtained, and the total dose radiation sensitive characteristics of COTS devices are analyzed;

[0061] The radiation sensitive device generally includes power MOS tube, small and medium scale CMOS digital circuit, SRAM, EEPROM, PROM, FLASH, FPGA, DSP, CPU, AD / DA converter, DC / DC power module, bipolar transistor, optoelectronic coupler, LED, CMOS image sensor, which will produce performance degradation or failure under the ionizing effect of space charged particles; In order to improve the comprehensiveness, accuracy and efficiency of system level irradiation test, the radiation sensitive device list of specific task is quickly obtained, and the device process characteristics and available anti-radiation index are given in detail;

[0062] Firstly, combined with the composition of COTS devices and the characteristics of space radiation environment, the device process, structure analysis, device damage law, failure mode analysis and the influence of device failure on system are analyzed by using existing experience and previous research results, which provides theoretical support for determining radiation sensitive devices. Then, through qualitative analysis, the radiation sensitive device list in the product is quickly and preliminarily identified, and the basic characteristics of the radiation sensitive device are given, mainly including model, production plant, batch, process and anti-ionizing total dose; Secondly, a universal evaluation model containing occurrence probability and impact consequence elements is established, taking the total dose failure related data of the device as input, and through the normalization processing of the cumulative hazard time of total dose failure influence, quantitative evaluation and comparison are realized, and the total dose weak point of spacecraft system is identified.

[0063] A2, according to the total dose radiation sensitive characteristics analysis results of COTS devices, the total dose radiation evaluation circuit of COTS devices is designed

[0064] The rationality of circuit design determines the effectiveness of test results and test cycle and cost, which follows the following principles:

[0065] The circuit design should minimize the irradiation circuit area as much as possible;

[0066] Although system level irradiation simplifies irradiation bias, reduces the type and quantity of post-irradiation test items, reduces test, irradiation time and sample quantity, and optimizes the development process of irradiation board, there is a strong correlation between irradiation test results and device working state. In the process of device level irradiation test, the most severe bias is generally used according to the standard test method, which cannot be realized on the test board. Therefore, the application conditions in design should be consistent with the final application conditions;

[0067] While ensuring system-level functionality and performance, it is also necessary to consider the detection of key node indicators and degradation characterization, which makes the design and debugging of irradiation circuit boards more complex. If the irradiation test fails, it will seriously affect subsequent planning. Therefore, it is necessary to constrain and plan the design of system-level irradiation boards, and to use socket connections for key components as much as possible to facilitate plugging, unplugging and replacement.

[0068] Circuit design should consider the coverage of board-level testing for COTS devices to ensure that the board-level or system-level functions of each COTS device that needs to be evaluated can be tested.

[0069] If the radiation resistance of the device is significantly lower than the system requirements, the circuit needs to be specifically protected during the irradiation process;

[0070] It is necessary to test the key parameters that characterize the function and performance of the system-level irradiation circuit, mainly including power supply, voltage, telemetry signals, and output signals and digital waveforms of key nodes;

[0071] A3. Conduct system-level total dose assessment tests on COTS devices.

[0072] The main reason for the difference in dose rate and total dose experienced by various components within the system is that the spatial distribution of dose rate of a point radiation source is spherical and the dose rate is proportional to distance (1 / r). 2 Due to the relationship, it is difficult to guarantee the consistency of dose rate at various locations on the irradiation plate; if the list of radiation-sensitive devices contains bipolar process devices, the low dose rate enhancement effect needs to be considered, and accelerated testing should be carried out in accordance with the "Accelerated Test Method for Low Dose Rate Enhancement Effect of Military Electronic Components".

[0073] Example 3 uses 60 Co-γ rays are used as the radiation source for system-level irradiation tests. The test system is placed on a rotating unit in the irradiation room. The test system is rotated at regular intervals to ensure the consistency of the total dose index of each device on the irradiation plate as much as possible.

[0074] A4. Total Dose Damage Fault Analysis and Location

[0075] If the irradiation assessment circuit functions normally, the COTS device verified by the irradiation circuit is considered to have reached the total dose irradiation guarantee level III; if the irradiation assessment circuit functions abnormally, a fault tree is established, the fault point is located, and it is considered that the failed device cannot meet the requirement of the COTS device to reach the total dose irradiation guarantee level III, and the relevant COTS device needs to be reselected.

[0076] The fault tree is a method for decomposing and modeling the functions of complex systems. It clearly displays the numerous functional elements that make up the system and also provides the relationships between these elements. Figure 4As shown, the relationship is represented by a directed link, which represents the dependency between functions, constituting a system function tree.

[0077] Embodiment One

[0078] The power system of a low-orbit remote sensing satellite is a core and key system of the satellite platform, and a failure of the power system will directly lead to the failure of part or even all functions of the whole satellite. The power system of the low-orbit remote sensing satellite is a class I single machine, corresponding to a COTS device irradiation assurance level I, and the COTS device is evaluated at the device level according to the method 1019.3 of GJB548C-2021 or QJ10004-2018.

[0079] Embodiment Two

[0080] The satellite computer single machine is a core and key platform single machine of the satellite, mainly responsible for the control of the whole satellite, and adopts a main backup design. When working, the main device and the backup device are powered, the backup device is in standby mode, and the main unit updates the memory regularly. When the main unit is abnormal, the backup unit reads the running data into the special memory, and completes the replacement of the main unit. The satellite computer single machine is a class II single machine, corresponding to a COTS device irradiation assurance level II.

[0081] Table 2 gives the comparison results of the layout of the selected COTS device of the satellite computer single machine and the irradiation data of the existing historical batches, and it is found that the comparison results of the selected batch and the test batch layout are consistent, and it is considered that the total dose resistance ability is the same, and it meets the COTS device total dose irradiation assurance level II.

[0082] Table 2 Different batches of COTS device information

[0083]

[0084] Embodiment Case Three

[0085] The remote sensing camera load of a low-orbit remote sensing satellite is a core task single machine of the remote sensing satellite, and its functions include image acquisition, image preprocessing, high-definition dynamic image compression, static image compression LVDS sending, RS422 transmission and control, which are used to take relevant target images in real time and clearly. The remote sensing camera load single machine is classified as a class III single machine, corresponding to a COTS device irradiation assurance level III.

[0086] When the remote sensing camera load single machine is detected to be abnormal, it enters the safety mode. First, the characteristics of the space radiation environment are combined to analyze the total dose damage weak link of the COTS device, and the irradiation sensitive device list of the remote sensing camera load is quickly obtained, as shown in Table 3, and the total dose irradiation sensitive characteristics of the COTS device are analyzed.

[0087] Secondly, based on the list of sensitive devices, design a board-level irradiation evaluation circuit for COTS devices in the remote sensing camera payload;

[0088] Then, a system-level total dose irradiation assessment experiment was conducted, such as... Figure 5 As shown, using 60 Co-γ rays are used as the radiation source for system-level irradiation tests. A displacement measurement method is used to power up the entire machine for testing and to measure the electrical parameters of the circuit. That is, when the irradiation dose reaches the specified dose point, the source is lowered and the device under test is removed for electrical parameter measurement. After the measurement is completed, the device under test is put back into the irradiation chamber for continued irradiation.

[0089] Table 3. List of Total Dose-Sensitive Devices

[0090]

[0091]

[0092] It should be noted that the order of the above embodiments of the present invention is merely for descriptive purposes and does not represent the superiority or inferiority of the embodiments. Furthermore, specific embodiments have been described above. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps described in the claims can be performed in a different order than that shown in the embodiments and still achieve the desired result. Additionally, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0093] The various embodiments in this specification are described in a progressive manner. Similar or identical parts between embodiments can be referred to interchangeably. Each embodiment focuses on its differences from other embodiments. The above descriptions are merely preferred embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention. Contents not described in detail in this specification are common knowledge to those skilled in the art.

Claims

1. A method for total dose irradiation qualification of COTS devices based on in-orbit application scenario classification, characterized in that, The method comprises the following steps: S1, performing single machine key level division; S2, performing COTS device total dose irradiation assurance level division; S3, based on application scenario classification, corresponding different single machine levels with different irradiation assurance levels and carrying out irradiation test.

2. The method of claim 1, wherein the method is based on the classification of COTS devices for on-orbit application scenarios. In step S1, the single machine key level division is divided into class I single machine, class II single machine and class III single machine by comprehensively evaluating the task nature, orbit height and task cycle.

3. The COTS device total dose irradiation assurance grading method based on on-orbit application scenario classification according to claim 2, characterized in that: The class I single machine has the lowest inherent risk and is suitable for critical task applications, mainly including single machines for realizing basic functions of satellite tasks; the risk level requirement for selecting components according to this requirement is the lowest; The risk level of the class II single machine is higher than that of the class I single machine and lower than that of the class III single machine, and is suitable for general aerospace applications; when selecting components according to this requirement, the cost limit and task target requirements need to be considered; except for single-point design, all main target functions or redundant designs of the whole machine are allowed; The risk level of the class III single machine is higher than that of the class II single machine, and the components selected according to this requirement can accept medium risk tasks under the condition that the cost limit allows.

4. The method of claim 1, wherein the total dose irradiation assurance grading of COTS devices based on on-orbit application scenario classification is characterized by, In step S2, the irradiation assurance level is divided into irradiation assurance level I, irradiation assurance level II and irradiation assurance level III.

5. The method of claim 1, wherein the total dose irradiation assurance grading of COTS devices based on on-orbit application scenario classification is characterized by, In step S3, when the single machine is a class I single machine, a COTS device with irradiation assurance level I is selected, and a COTS device total dose irradiation evaluation test is carried out according to GJB548C or QJ10004-2018.

6. The method of claim 1, wherein the method is based on in-orbit application scenario classification. In step S3, when the single machine is a class II single machine, a COTS device with irradiation assurance level II is selected, and a device-level total dose irradiation evaluation test is carried out.

7. The method of claim 6, wherein the total dose irradiation assurance grading of COTS devices based on application scenario classification in orbit is characterized by, When the single machine is a class II single machine, the total dose irradiation evaluation test comprises the following steps: First, confirm whether the selected COTS device has historical batch irradiation data; When the selected COTS device has no historical batch irradiation data, a device-level total dose irradiation test is carried out according to GJB548C-2021 to obtain irradiation test data, and then a structure analysis is carried out to retain the layout of the irradiation test data; when the batch device is selected again, no irradiation test needs to be carried out, and only total dose irradiation evaluation test needs to be carried out by comparing with historical data and layout; When the selected COTS device has historical batch irradiation data, structure analysis is performed on the selected batch COTS device to obtain irradiation test data layout, and then the obtained layout is compared with the layout of the device with existing historical batch irradiation data; if the layout comparison result is consistent, the existing historical irradiation data result is directly used, and if the layout comparison result is inconsistent, a total dose irradiation evaluation test needs to be carried out again.

8. The method of claim 1, wherein the method is based on a classification of on-orbit application scenarios. When the single machine is a class III single machine, a COTS device with irradiation assurance level III is selected, and a PCB board-level or system-level total dose irradiation evaluation test is carried out.

9. The method of claim 8, wherein the total dose irradiation assurance grading of COTS devices based on application scenario classification in orbit is characterized by, When the single machine is a class III single machine, the total dose irradiation evaluation test comprises the following steps: Firstly, according to the characteristics of space radiation environment, the total dose damage weak link of COTS devices is analyzed, the list of radiation sensitive devices is obtained quickly, and the total dose radiation sensitive characteristics of COTS devices are analyzed. Secondly, according to the results of total dose radiation sensitive characteristics analysis of COTS devices, the total dose radiation evaluation circuit of COTS devices is designed. Then, the system level total dose radiation evaluation test of COTS devices is carried out, the appropriate radiation source and dose rate are selected to ensure the consistency of the dose of devices at different positions in the circuit. Finally, the irradiation evaluation circuit is tested. If the irradiation evaluation circuit functions normally, it is considered that the COTS devices verified by the irradiation circuit meet the total dose radiation assurance level III. If the irradiation evaluation circuit functions abnormally, the system function decomposition and modeling are established to locate the failed devices. If the failed devices cannot meet the total dose radiation assurance level III of COTS devices, the total dose test verification needs to be carried out again until the COTS products pass the total dose test and the overall total dose radiation data of the system is obtained.

10. The method of claim 8, wherein the total dose irradiation assurance grading of COTS devices based on application scenario classification in orbit is characterized by, The radiation source of the PCB board level or system level total dose irradiation evaluation test adopts 60 Co-γ rays.

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