Test system and method of converter valve thyristor voltage detection board card

Abstract

The invention belongs to the technical field of ultra-high voltage direct current power transmission, and discloses a test system and method of a converter valve thyristor voltage detection board card, and the test system comprises a test cabinet and a test tool. An industrial control system is integrated in the test cabinet to set test parameters and criteria, an electric control unit loads an excitation source, an acquisition display unit acquires test data and presents the test data in an oscillogram, and a test tool fixes a tested board card. The industrial control system outputs a control instruction to drive the electric control unit to apply system test excitation, the actual working condition of the thyristor is simulated, and meanwhile, the acquisition and display unit automatically captures multichannel signal data; data are transmitted to the industrial control system through the electric control unit, and the board card performance is automatically analyzed and a test report is generated in combination with a preset criterion. By adopting the system, the problems of insufficient function verification, low test efficiency, vulnerable equipment, poor data accuracy and large manpower occupation are solved, efficient and lossless automatic test is realized, the test reliability is improved, and the operation process is simplified.

Description

Technical Field

[0001] This invention belongs to the field of ultra-high voltage direct current transmission technology, specifically relating to a testing system and method for a converter valve thyristor voltage detection board. Background Technology

[0002] Currently, high-voltage direct current (HVDC) transmission, with its advantages of economy, interconnectivity, and good controllability, has become an important technical means for long-distance, inter-regional power transmission. As a key component of HVDC transmission projects, the converter valve's operational stability directly affects the entire transmission system. The thyristor stage, due to its excellent voltage withstand and current carrying capacity, is widely used in converter valve equipment and is the smallest structural unit of the converter valve. Each stage consists of a thyristor, a thyristor control unit, and an RC damping voltage equalization circuit. Among these, the thyristor voltage detection board is the core component of the thyristor stage. It does not require a separate power supply; its operating power is obtained from the voltage coupling across the thyristor terminals. Its main function is to perform photoelectric conversion on the signals from the valve-controlled equipment, achieving optical isolation between high and low voltage circuits, thereby triggering, detecting, and protecting the thyristor. It is a crucial component ensuring the normal operation of the thyristor stage.

[0003] Currently, there are significant shortcomings in the performance testing of thyristor voltage detection boards: initially, there were no dedicated testing methods, and testing could only be carried out along with the overall system during routine testing of the converter valve assembly, which could not accurately ensure the functionality of the thyristor voltage detection unit itself; subsequently, functional testing was carried out using ordinary probe point testing devices, which not only resulted in low efficiency due to numerous test points, but also damaged the protective coating of the thyristor control unit, affecting the equipment's protective performance; later, although intelligent testing fixtures for thyristor control units were used, the test data still needed to be observed and recorded manually, making it difficult to guarantee accuracy and precision, and requiring two people to work together to complete the test, resulting in additional human resource consumption.

[0004] It is evident that existing thyristor voltage detection board performance testing methods suffer from technical problems such as insufficient functional verification, low testing efficiency, easy equipment damage, poor data accuracy, and high manpower consumption. Summary of the Invention

[0005] This invention provides a testing system and method for a converter valve thyristor voltage detection board. This system can solve the problems of insufficient functional verification, low testing efficiency, easy equipment damage, poor data accuracy, and high manpower consumption in existing thyristor voltage detection board performance testing methods.

[0006] To achieve the above objectives, the present invention employs the following technical content: A test system for a converter valve thyristor voltage detection board includes a test cabinet and test fixtures; The test cabinet is equipped with an industrial control system, an electrical control unit, and a data acquisition and display unit. The industrial control system, the data acquisition and display unit, and the test fixture are respectively connected to the electrical control unit; The industrial control system is used to set test items, test parameters and test criteria, and to output control commands; The test fixture is used to fix multiple boards under test; The acquisition and display unit is used to acquire test data of the board under test and to present the test data as waveforms. The electronic control unit is used to load the test excitation source of the thyristor system according to the received control command to test the board under test, and to transmit the test data and multi-channel analog signals output by the acquisition and display unit to the industrial control system so that the industrial control system can analyze the board under test and generate a test report in combination with the test criteria.

[0007] Furthermore, the industrial control system adopts an industrial control computer, which is connected to the electrical control unit via a 422 interface.

[0008] Furthermore, the acquisition and display unit includes an oscilloscope and a high-voltage measurement device; the oscilloscope includes multiple analog channels for presenting test data as waveforms based on the oscilloscope trigger signal; the high-voltage measurement device is connected to the test fixture and is used to acquire test data of the board under test.

[0009] Furthermore, the electronic control unit includes a connected DSP and an FPGA; The DSP is connected to the industrial control system and is used to convert the control commands output by the industrial control system into control data, transmit the control data to the FPGA, and perform self-verification of communication data. The FPGA is connected to the test fixture via a board test timing circuit and an interface signal extraction circuit; the FPGA is also connected to the acquisition and display unit. The FPGA is used to obtain the reference beat of timing control based on the mains synchronization signal, and to control the test timing circuit of the board to send drive control signals to the board under test according to the reference beat of timing control, so as to perform the test of the board under test. The FPGA is also used to extract test data from the board under test through the interface signal extraction circuit, and transmit the extracted test data to the acquisition and display unit so that the acquisition and display unit can present the test data as a waveform. The FPGA is also used to transmit the test data and multi-channel analog signals output by the acquisition and display unit to the industrial control system, so that the industrial control system can analyze the board under test and generate a test report in combination with the test criteria.

[0010] Furthermore, the electronic control unit also includes a power control box; The FPGA is connected to the power control box via a high-voltage switch array drive circuit, and the power control box is connected to the board under test. The FPGA can control the power control box to load the test excitation source of the thyristor system via the high-voltage switch array drive circuit.

[0011] Furthermore, the system test excitation source includes a power frequency or a high voltage excitation source; wherein, the system test excitation source is applied to the anode of the thyristor; the board under test obtains voltage through the system test excitation source.

[0012] Furthermore, the high-voltage excitation source is provided by a high-voltage DC power supply, and the high-voltage excitation source is divided into three types: The first type is a pulse power supply with a voltage of 8000V or higher; The second type is a 10KV high-voltage DC power supply with an average power of 1000W; The third type is a high-voltage DC power supply with an adjustable voltage from 0 to 12000V and a maximum average output current of 50mA.

[0013] Furthermore, the DSP and FPGA are integrated into the control box; the control box is equipped with multiple optical signal interfaces for optical signal transmission and reception, and each optical signal interface is isolated from the others by an isolation power supply and an optocoupler.

[0014] Furthermore, the test fixture is configured as an operation box structure, and the interface signals of the test fixture are uniformly received by the electronic control unit, and after being separated by high and low voltage, they are uniformly transmitted to the switch array of the electronic control unit.

[0015] A testing method for a converter valve thyristor voltage detection board, based on the aforementioned converter valve thyristor voltage detection board, includes: Multiple boards under test are fixed in place using a test fixture; The test items, test parameters, and test criteria are set through the industrial control system to output control commands; The test data of the board under test is acquired using the acquisition and display unit, and the test data is presented as a waveform graph. The electronic control unit loads the test excitation source of the thyristor system according to the received control command to test the board under test. The test data and multi-channel analog signals output by the acquisition and display unit are transmitted to the industrial control system, so that the industrial control system can analyze the board under test and generate a test report in combination with the test criteria.

[0016] Compared with the prior art, the present invention has the following beneficial effects: This invention provides a testing system for a converter valve thyristor voltage detection board. The system includes a test cabinet and a test fixture. The test cabinet integrates an industrial control system for setting test parameters and criteria, an electronic control unit for loading the excitation source, and a data acquisition and display unit for acquiring test data and presenting it as waveforms. The test fixture holds the board under test. The industrial control system outputs control commands to drive the electronic control unit to apply system test excitation, simulating the actual operating conditions of the thyristor. Simultaneously, the data acquisition and display unit automatically captures multi-channel signal data. The data is transmitted from the electronic control unit to the industrial control system, where it is automatically analyzed for board performance based on preset criteria and a test report is generated. This system solves the problems of insufficient functional verification, low testing efficiency, equipment fragility, poor data accuracy, and high manpower requirements, achieving efficient and non-destructive automated testing, improving test reliability, and simplifying the operation process.

[0017] Preferably, in this invention, by using an industrial control computer and a specific interface to connect with the electronic control unit, the stability and anti-interference capability of the system communication are enhanced, the accurate transmission of control commands is ensured, the reliability and data consistency of the testing process are further improved, and errors introduced by manual operation are avoided.

[0018] Preferably, in this invention, by integrating an oscilloscope and high-voltage measurement equipment into the acquisition and display unit, real-time acquisition of multi-channel data and waveform visualization are supported, realizing comprehensive capture and intuitive analysis of test data, improving the accuracy of data processing and testing efficiency, while reducing reliance on manual observation.

[0019] Preferably, in this invention, by introducing DSP and FPGA to work together, the precise conversion of control commands, intelligent control of timing management, and automatic extraction and transmission of test data are achieved, which enhances the system's processing power and automation level, ensures the accuracy of test timing and the reliability of data analysis, and effectively reduces the risk of human error.

[0020] Preferably, in this invention, by adding a power control box and having its drive circuit controlled by an FPGA, the precise loading and flexible adjustment of the system test excitation source are achieved, which improves the adaptability and safety of the test, avoids accidental damage to the equipment, and simplifies the excitation source management process.

[0021] Preferably, in this invention, by defining the loading method and path of the power frequency or high voltage excitation source, the actual working environment of the thyristor is simulated, ensuring that the test covers the voltage detection requirements under real working conditions, enhancing the comprehensiveness of functional verification and the effectiveness of test results, and solving the problem of insufficient verification.

[0022] Preferably, in this invention, by providing a variety of high-voltage excitation source types, including high-voltage pulse power supplies, high-power DC power supplies, and adjustable high-voltage DC power supplies, the testing range and applicability of the system are expanded, supporting diverse testing scenarios, improving the flexibility and coverage of testing, and meeting different performance verification needs.

[0023] Preferably, in this invention, by integrating the DSP and FPGA into the control box and using an optical signal interface in conjunction with isolation measures, the electrical isolation and anti-interference performance of the system are enhanced, preventing signal crosstalk and external interference, and ensuring the safe transmission of test data and overall stability.

[0024] Preferably, in this invention, by optimizing the test fixture into an operation box structure and unifying the processing of interface signals to achieve high and low voltage separation, the connection process and operation steps are simplified, the convenience and safety of testing are improved, the risk of equipment damage is reduced, and the overall testing efficiency is improved.

[0025] This invention also provides a testing method for a converter valve thyristor voltage detection board. Based on the aforementioned testing system for the converter valve thyristor voltage detection board, this method first fixes multiple boards under test using testing fixtures; the industrial control system presets test parameters and criteria and outputs instructions; the electronic control unit applies a system test excitation source to the thyristor according to the instructions, accurately simulating actual working conditions; the acquisition and display unit simultaneously captures multi-channel test data of the boards under test and converts it into waveforms; all data is transmitted to the industrial control system via the electronic control unit, which automatically compares the data with preset criteria to complete performance analysis and generate a test report. This method constructs a fully closed-loop testing process of "parameter preset - excitation loading - data acquisition - intelligent analysis," simulating a real electrical environment through systematic excitation and replacing manual intervention with automated acquisition and analysis. This method completely solves the five major defects of the background technology: achieving accurate verification of board functions, significantly improving testing efficiency, avoiding damage to equipment surfaces, ensuring data objectivity and accuracy, and significantly reducing reliance on human resources. Attached Figure Description

[0026] Figure 1 This is a schematic diagram of the structure of a test system for a converter valve thyristor voltage detection board provided in an embodiment of the present invention; Figure 2 This is a control principle diagram of a test system for a converter valve thyristor voltage detection board provided in an embodiment of the present invention. Detailed Implementation

[0027] To make the technical problems solved by the present invention, the technical solutions, and the beneficial effects clearer, the following specific embodiments provide a further detailed description of the present invention. It should be understood that the specific embodiments described herein are merely illustrative and are not intended to limit the scope of the invention.

[0028] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0029] Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the invention.

[0030] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0031] As mentioned in the background technology, currently, each ultra-high voltage direct current (UHVDC) transmission project typically requires approximately 3,000 thyristor voltage detection boards. Each thyristor voltage detection board needs to undergo routine testing. Initially, there were no effective testing methods for the thyristor voltage detection units, and testing was only conducted as a whole during routine testing of the converter valve assembly, which could not ensure the functionality of the thyristor voltage detection units. Later, ordinary probes were used to test the thyristor voltage detection unit devices at specific points for functional testing. However, this involved numerous test points, low testing efficiency, and damage to the protective paint on the thyristor control unit. Subsequently, intelligent testing fixtures for the thyristor control unit were adopted. However, the data still required manual observation and recording, which could not guarantee accuracy and precision, and required two people to conduct the tests, thus consuming manpower.

[0032] To address the aforementioned issues, this embodiment provides a testing system for a converter valve thyristor voltage detection board. This testing system significantly improves testing efficiency, reduces human error in data interpretation and recording, and saves labor costs.

[0033] This embodiment provides a testing system for a converter valve thyristor voltage detection board, including a test cabinet and a test fixture. The test cabinet integrates an industrial control system, an electrical control unit, and a data acquisition and display unit. The industrial control system, the data acquisition and display unit, and the test fixture are all connected to the electrical control unit. The industrial control system is used to set test items, test parameters, and test criteria to output control commands. The test fixture is used for multiple boards under test. The data acquisition and display unit is used to acquire test data from the boards under test and present the test data as waveforms. The electrical control unit is used to load a test excitation source onto the thyristor system according to the received control commands to test the boards under test. It transmits the test data and multi-channel analog signals output by the data acquisition and display unit to the industrial control system, so that the industrial control system can analyze the boards under test and generate a test report based on the test criteria.

[0034] The testing system provided in this embodiment will be further described below with reference to the accompanying drawings: like Figure 1 As shown, in this embodiment, the industrial control system uses an industrial control computer, specifically an Advantech IPC-610MB. This computer comprises a motherboard AIMB-701VG, an I5-2500 processor, 4GB of memory, a 120GB SSD + 1TB hard drive, and a 500W power supply. It is also equipped with an industrial high-definition monitor and a keyboard and mouse. The industrial control computer is connected to the electrical control unit via a 422 interface. The industrial control system is used to set test parameters and criteria for test items and output control commands. It can also control the acquisition loop to complete test data acquisition and storage, generate test reports, and complete the setting of test parameters and criteria and the selection of test items. Figure 1 In this context, TVM refers to Thyristor Voltage Monitoring, whose core function is to monitor the voltage status of the thyristors in the converter valve in real time to ensure the safe and stable operation of the DC transmission system. In this embodiment, it refers to the thyristor voltage detection board.

[0035] The acquisition and display unit includes an oscilloscope and a high-voltage measurement device. The oscilloscope is a four-channel DSOX3024G, with parameters including a frequency of 200MHz, four analog channels, a capture rate of up to 1,000,000 waveforms / second for more detailed signal information, and up to 4Mpts of memory for capturing more data. The oscilloscope is paired with a Tektronix P6015A high-voltage probe, which features 20kVDC / 40kV peak voltage, high bandwidth DC to 75MHz, silicone dielectric, optional 1000X meter encoding, a large compensation range of 7~49pF, and is equipped with a high-capacity multi-functional ground wire and alligator clips. The oscilloscope is used to display the test data as waveforms based on the oscilloscope's trigger signal. The high-voltage measurement device is connected to the test fixture to acquire test data from the board under test.

[0036] For example, in this embodiment, the electronic control unit includes a connected DSP and FPGA, as well as a power control box. The DSP and FPGA are integrated into the control box, which has multiple optical signal interfaces for optical signal transmission and reception. These interfaces are isolated from each other by isolation power supplies and optocouplers. The DSP is connected to the industrial control system to convert the control commands output by the industrial control system into control data, transmit the control data to the FPGA, perform communication data self-verification, send back the hardware status of the underlying control system, and decompose control commands. The FPGA is connected to the test fixture through the board test timing circuit and interface signal extraction circuit. The FPGA is also connected to the acquisition and display unit. The FPGA is used to obtain the reference beat for timing control based on the mains synchronization signal and to perform timing control accordingly. The reference beat control board test timing circuit sends drive control signals to the board under test (DUT) for testing. The FPGA is also used to extract test data from the DUT through the interface signal extraction circuit and transmit the extracted test data to the acquisition and display unit for waveform display. The FPGA is also used to transmit the test data and multi-channel analog signals output by the acquisition and display unit to the industrial control system for analysis of the DUT and generation of test reports based on test criteria. The FPGA is connected to the power control box through the high-voltage switch array drive circuit, and the power control box is connected to the DUT. The FPGA can control the power control box to provide the test excitation source for the thyristor loading system through the high-voltage switch array drive circuit.

[0037] Specifically, such as Figure 2 As shown, the core control circuit of the system control box is jointly completed by DSP and FPGA. The DSP is mainly responsible for communication and interaction with the host computer, command parsing, self-verification of communication data, sending back the hardware status of the underlying control system, decomposing control commands, and sending specific control data to the FPGA. FPGA has strict timing synchronization control capabilities. FPGA samples the external mains synchronization signal as the reference beat for FPGA timing control. At the same time, it can trigger the oscilloscope channel and control the power control box to apply the power frequency or high voltage excitation source to the test thyristor. The loading timing of the high-voltage excitation source can be precisely controlled by the FPGA. The FPGA can send eight-sequence clock pulses to the TFM board to control the board to different working states. The FPGA can strictly send drive control signals to the board at zero crossing or voltage peak according to the mains synchronization signal. The control box has optical signal transmission and reception functions. All interface signals are isolated through isolated power supplies and optocouplers to ensure the safety and reliability of the control box. As another preferred embodiment, during the time measurement process, the use of FPGA plus high-speed electromagnetic isolation device can ensure time control accuracy down to tens of nanoseconds, thereby ensuring the measurement of the oscilloscope; Add a current test during the thyristor's turn-on process, and determine the thyristor's operation and the effectiveness of the protection function by analyzing the signal voltage and current waveforms.

[0038] The system test excitation source includes a power frequency or a high-voltage excitation source. The system test excitation source is applied to the anode of the thyristor, and the board under test obtains voltage through the system test excitation source. The power frequency excitation source is a medium-voltage power supply with a peak-to-peak value of 2000V, which can meet the maximum power frequency voltage excitation requirement of 1500V. Based on the influence of the voltage divider resistors on the actual test platform, it can ensure that the thyristor anode voltage is between 220V and 1500V, the reliable conduction current of the thyristor is between 2A and 5A, the sustaining current is around 0.5A, and the forward build-up voltage is around 120V. The actual transformer... A 2000W transformer power supply ensures that the thyristor can conduct after being loaded with power frequency excitation. The high-voltage excitation source is provided by a high-voltage DC power supply. There are three types of high-voltage excitation sources: the first is a pulse power supply with a voltage of 8000V or higher, which has no requirement for voltage rise time, as long as the loading power can ensure that the anode voltage of the thyristor reaches 8000V; the second is a 10KV high-voltage DC power supply with an average power of 1000W; and the third is a high-voltage DC power supply with an adjustable voltage from 0 to 12000V and a maximum average output current of 50mA. The output voltage of the high-voltage power supply can be set by the control system.

[0039] In this embodiment, the test fixture is configured as an operating box structure. The test fixture is used to fix the thyristor test capacitor and multiple boards under test, while also enabling quick connection and disconnection of test leads. The interface signals of the test fixture are uniformly received by the electronic control unit (ECU), separated into high and low voltage signals, and then uniformly transmitted to the ECU's switch array. Ten boards will be placed in this test fixture simultaneously for sequential testing. This assembly-line board installation method reduces installation time for testers and improves testing efficiency. Given the fixture's fragility, placing it separately facilitates later maintenance and upgrades. Simultaneously, testing a large number of boards with multiple relays can significantly extend the overall service life of the fixture, reduce maintenance costs, and improve test reliability. Furthermore, in tests where the fixture and cabinet are separated, testers must operate the power-off protection button on the fixture before opening the top cover. This design allows operators to stay away from high-voltage sources, greatly increasing test safety.

[0040] When conducting tests based on the aforementioned test system using the converter valve thyristor voltage detection board, this embodiment also provides a test method, specifically including: First, the test capacitor and multiple boards under test are fixed using a test fixture. Then, the test parameters and test criteria are set through the industrial control system to output control commands. Next, the test data of the boards under test are collected by the acquisition and display unit and the test data is presented as waveforms. Finally, the electronic control unit loads the test excitation source of the thyristor system according to the received control commands to test the boards under test. The test data and multi-channel analog signals output by the acquisition and display unit are transmitted to the industrial control system so that the industrial control system can analyze the boards under test and generate test reports in combination with the test criteria.

[0041] Therefore, the testing system and method for a converter valve thyristor voltage detection board provided by this invention have the following advantages compared with existing testing methods: First, using this testing system requires only one person to operate. After installing the thyristor voltage detection unit in the test chamber, the host computer of the main control unit selects all test items, and the testing device can automatically complete all tests in sequence, collect and extract data, generate and save test reports, greatly improving test efficiency and accuracy, reducing errors caused by human error, saving labor costs, and improving automated and digital testing capabilities.

[0042] Secondly, this system and method can be modified with parameters and criteria to be applicable to the testing of thyristor voltage detection units in multiple series. It is highly automated and digitalized, safe and reliable, convenient and efficient, and provides accurate data. It can be used for routine tests of thyristor voltage detection units in different ultra-high voltage DC transmission thyristor converter valve projects.

[0043] The above embodiments are merely one of the implementation methods for achieving the technical solution of the present invention. The scope of protection claimed by the present invention is not limited to this embodiment, but also includes any variations, substitutions and other implementation methods that can be easily conceived by those skilled in the art within the scope of the technology disclosed in the present invention.

Claims

1. A test system for a converter valve thyristor voltage detection board, characterized in that, Includes test cabinets and test fixtures; The test cabinet is equipped with an industrial control system, an electrical control unit, and a data acquisition and display unit. The industrial control system, the data acquisition and display unit, and the test fixture are respectively connected to the electrical control unit; The industrial control system is used to set test items, test parameters and test criteria, and to output control commands; The test fixture is used to fix multiple boards under test; The acquisition and display unit is used to acquire test data of the board under test and to present the test data as waveforms. The electronic control unit is used to load the test excitation source of the thyristor system according to the received control command to test the board under test, and to transmit the test data and multi-channel analog signals output by the acquisition and display unit to the industrial control system so that the industrial control system can analyze the board under test and generate a test report in combination with the test criteria.

2. The testing system for a converter valve thyristor voltage detection board according to claim 1, characterized in that, The industrial control system uses an industrial control computer, which is connected to the electrical control unit via a 422 interface.

3. The test system for a converter valve thyristor voltage detection board according to claim 1, characterized in that, The acquisition and display unit includes an oscilloscope and a high-voltage measurement device; the oscilloscope includes multiple analog channels, used to present test data as waveforms based on the oscilloscope trigger signal; the high-voltage measurement device is connected to the test fixture and is used to acquire test data of the board under test.

4. The testing system for a converter valve thyristor voltage detection board according to claim 1, characterized in that, The electronic control unit includes a connected DSP and an FPGA; The DSP is connected to the industrial control system and is used to convert the control commands output by the industrial control system into control data, transmit the control data to the FPGA, and perform self-verification of communication data. The FPGA is connected to the test fixture via a board test timing circuit and an interface signal extraction circuit; the FPGA is also connected to the acquisition and display unit. The FPGA is used to obtain the reference beat of timing control based on the mains synchronization signal, and to control the test timing circuit of the board to send drive control signals to the board under test according to the reference beat of timing control, so as to perform the test of the board under test. The FPGA is also used to extract test data from the board under test through the interface signal extraction circuit, and transmit the extracted test data to the acquisition and display unit so that the acquisition and display unit can present the test data as a waveform. The FPGA is also used to transmit the test data and multi-channel analog signals output by the acquisition and display unit to the industrial control system, so that the industrial control system can analyze the board under test and generate a test report in combination with the test criteria.

5. The test system for a converter valve thyristor voltage detection board according to claim 4, characterized in that, The electronic control unit also includes a power control box; The FPGA is connected to the power control box via a high-voltage switch array drive circuit, and the power control box is connected to the board under test. The FPGA can control the power control box to load the test excitation source of the thyristor system via the high-voltage switch array drive circuit.

6. The test system for a converter valve thyristor voltage detection board according to claim 5, characterized in that, The system test excitation source includes a power frequency or a high voltage excitation source; wherein, the system test excitation source is applied to the anode of the thyristor; the board under test obtains voltage through the system test excitation source.

7. The test system for a converter valve thyristor voltage detection board according to claim 6, characterized in that, The high-voltage excitation source is provided by a high-voltage DC power supply, and there are three types of high-voltage excitation sources: The first type is a pulse power supply with a voltage of 8000V or higher; The second type is a 10KV high-voltage DC power supply with an average power of 1000W; The third type is a high-voltage DC power supply with an adjustable voltage from 0 to 12000V and a maximum average output current of 50mA.

8. The test system for a converter valve thyristor voltage detection board according to claim 4, characterized in that, The DSP and FPGA are integrated in the control box; the control box is equipped with multiple optical signal interfaces for optical signal transmission and reception, and each optical signal interface is isolated from the others by an isolation power supply and an optocoupler.

9. The testing system for a converter valve thyristor voltage detection board according to claim 1, characterized in that, The test fixture is configured as an operation box structure. The interface signals of the test fixture are received uniformly by the electronic control unit, and after being separated into high and low voltage, they are uniformly transmitted to the switch array of the electronic control unit.

10. A testing method for a converter valve thyristor voltage detection board, characterized in that, The test system based on the converter valve thyristor voltage detection board according to any one of claims 1-9 includes: Multiple boards under test are fixed in place using a test fixture; The test items, test parameters, and test criteria are set through the industrial control system to output control commands; The test data of the board under test is acquired using the acquisition and display unit, and the test data is presented as a waveform graph. The electronic control unit loads the test excitation source of the thyristor system according to the received control command to test the board under test. The test data and multi-channel analog signals output by the acquisition and display unit are transmitted to the industrial control system, so that the industrial control system can analyze the board under test and generate a test report in combination with the test criteria.

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