Infrared automatic test system

The infrared automatic testing system solves the problem of inaccurate control of the interval between the flash and the thermal imager in manual operation, realizes automated synchronous control, improves detection efficiency and image quality, and has temperature alarm and remote monitoring functions.

CN121364013APending Publication Date: 2026-01-20NANTONG QINRUN AUTOMATION TECH CO LTD
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Patent Information

Application Number
CN202411902062.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-23
Publication Date
2026-01-20

AI Technical Summary

Technical Problem

In existing infrared thermal imaging inspections, manual operation cannot precisely control the operating interval between the flash and the thermal imager, resulting in inconsistent image quality and low testing efficiency.

Method used

Design an automatic infrared testing system that uses a triggering device, a flash lamp, and an infrared thermal imager. The system achieves automated control through a microcontroller control center, relays, current limiting circuits, and a communication module, ensuring synchronous triggering and image acquisition of the flash lamp and the infrared thermal imager.

Benefits of technology

It improves testing efficiency and image quality, achieves automated control, is easy to operate, meets standardization and modular requirements, is easy to maintain, and has temperature alarm function and remote monitoring capability.

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Abstract

The invention relates to the technical field of infrared test systems, and discloses an infrared automatic test system which comprises a trigger device, a flash lamp and a thermal infrared imager, the trigger device is composed of a single-chip microcomputer control center, a relay, a current limiting circuit and a communication module, and the trigger device is a system lower computer and is responsible for receiving instructions of an upper computer control PC and sending the instructions to the flash lamp and the thermal infrared imager. A trigger signal generated according to the instruction is output to the trigger device; control software of the system is installed on the control PC, and the control PC is provided with a control and display interface and is responsible for realizing a man-machine interaction function; the single-chip microcomputer is an STM32 single-chip microcomputer and is used for system integration development of embedded application. The voltage of the relay is 5V, and the relay is used for generating short-circuit signals; the current limiting circuit is composed of a resistor, and the current in the circuit is limited to be 5 mA. According to the invention, an automatic thermal infrared imager automatic control system is adopted, manual control in the experiment process is converted into automatic control, and the test efficiency and quality are improved.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of infrared test system, in particular to an infrared automatic test system. BACKGROUND

[0002] Infrared thermal imaging detection is a non-destructive testing method based on infrared radiation principle, which realizes the detection of surface and internal defects or analysis of internal structure by scanning, recording or observing the changes of surface temperature field caused by the differences in heat transfer to the deep layer due to defects or internal structure discontinuity. Compared with traditional detection technologies such as ultrasonic, ray and eddy current, this technology is a new non-destructive testing technology developed relatively late, which has many advantages such as fast detection speed, non-contact, wide range, high precision, easy automation, real-time observation and sensitivity to near-surface defects and features. In China, this technology has been applied to product detection in the fields of aviation, aerospace, wind power and civil fields such as petrochemical industry, power industry and construction.

[0003] When using the infrared thermal imager for testing, the operator needs to use the flash to provide a heat source for the product, and then use the infrared thermal imager to collect images. In the actual operation process, the manual operation cannot accurately control the operation interval of the flash and the thermal imager, so that the quality of the collected images is uneven, resulting in low testing efficiency.

[0004] Therefore, it is necessary to design a corresponding technical solution to solve the problem. SUMMARY

[0005] (I) Technical problems to be solved In view of the shortcomings of the prior art, the present application provides an infrared automatic test system, which solves the technical problem that manual operation cannot accurately control the operation interval of the flash and the thermal imager, resulting in uneven quality of the collected images and low testing efficiency.

[0006] (II) Technical scheme In order to achieve the above purpose, the present application is realized by the following technical scheme: an infrared automatic test system, comprising a trigger device, a flash and an infrared thermal imager, the trigger device is composed of four parts of a single-chip microcomputer control hub, a relay, a current limiting circuit and a communication module, the trigger device is a lower computer of the system, responsible for receiving the instructions of the upper computer control PC, and outputting the trigger signal generated according to the instructions to the trigger device; The control software of the PC installed with the system has a control and display interface, and is responsible for the realization of human-computer interaction function; The single-chip microcomputer control hub is an STM32 single-chip microcomputer, which is used for embedded application system integrated development; The voltage of the relay is 5V, which is used to generate a short-circuit signal; The current limiting circuit is composed of a resistor, which limits the current in the circuit to 5mA through a certain resistance value, to ensure the normal operation of the instrument without being damaged by the pulse signal. The output signal of the upper computer adopts RS232 serial communication, the single-chip microcomputer uses TTL pin level input, and the trigger device adopts RS232 to TTL module to realize protocol conversion, so as to establish communication module connection between the upper and lower computers and perform normal transmission and reception of instructions.

[0007] Preferably, the control of the flash lamp is realized by an excitation module, the flash lamp has an external excitation interface, and the excitation module outputs a signal with the above-mentioned timing characteristics after receiving the excitation instruction of the upper computer, that is, sends a short-circuit signal to the flash lamp to realize the working excitation of the flash lamp, and the flash lamp provides light source for the tested product after receiving the excitation signal of the excitation module.

[0008] Preferably, the test method comprises the following steps: S1, the test system controls the flash lamp and the infrared thermal imager to work simultaneously through computer software, the flash lamp provides light source for the tested product, and the infrared thermal imager collects infrared images and data and returns them to the control computer for display and saving; S2, the infrared thermal imager collects the infrared image information of the tested product after receiving the collection instruction of the control PC and feeds back to the control PC, so as to realize automatic control of the infrared thermal imager.

[0009] Preferably, the infrared thermal imager can accurately capture the temperature distribution of the surface of the tested product and display and record the temperature data in real time through the upper computer software, which is used for the application scenario of accurate temperature measurement and analysis, has a temperature alarm function, and automatically triggers an alarm when the infrared thermal imager detects that the surface temperature of the tested product exceeds the preset safety threshold, reminding the operator to handle in time and ensuring the safety of the test process.

[0010] Preferably, the system supports software triggering and timing triggering modes; The software triggering mode allows users to control the start and stop of the flash lamp and the infrared thermal imager through the upper computer software, which is used for the application scenario of flexible control of the test process; The timing triggering mode allows users to set a fixed test period, and the system automatically starts the flash lamp and the infrared thermal imager to test in each period, which is used for the application scenario of periodic repeated testing.

[0011] Preferably, the system supports multiple data output formats, including pictures, tables and reports, which are used for data processing and display according to actual user needs; The system provides interfaces and APIs for secondary development and system integration to meet the individual needs of users.

[0012] Preferably, the system adopts a data transmission protocol to ensure the communication speed and stability between the host computer and the lower computer. The system adopts remote control and monitoring, which is used for connecting to the system through a network to realize remote control and monitoring of the test process.

[0013] (Three) beneficial effects Compared with the prior art, the beneficial effects of the present application: the automatic control system of the infrared thermal imager is adopted to convert the manual control in the experiment process into automatic control, improve the test efficiency and quality; the requirements of standardization, generalization, serialization and modularization are fully implemented, the man-machine relationship is coordinated, the relevant standards are met, the operator is convenient, comfortable and accurate, the equipment has good maintainability, the frequently repaired unit has good detachability, the structure design meets the requirements of the equipment on strength and rigidity, the weight is small, the volume is small; the operator can realize the working control of the infrared thermal imager and the flash lamp through the software interface of the host computer, send a short-circuit signal to the flash lamp after receiving the excitation instruction of the host computer, realize the working excitation of the flash lamp; according to the instruction of the host computer, the flash lamp and the infrared thermal imager are triggered to work in turn, the trigger interval is adjustable, and the trigger frequency of the infrared thermal imager is adjustable. BRIEF DESCRIPTION OF DRAWINGS

[0014] Figure 1 The system schematic diagram of the present application. DETAILED DESCRIPTION

[0015] The technical solutions in the embodiments of the present application will be described clearly and completely in combination with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the protection scope of the present application.

[0016] Please refer to Figure 1 The embodiment of the present application provides a technical solution: an infrared automatic test system, comprising a trigger device, a flash lamp and an infrared thermal imager, the trigger device is composed of a single-chip microcomputer control hub, a relay, a current limiting circuit and a communication module, the trigger device is a lower computer of the system, responsible for receiving the instruction of the control PC of the upper computer, and outputting the trigger signal generated according to the instruction to the trigger device; The control software of the system is installed on the control PC, has a control and display interface, and is responsible for the realization of man-machine interaction function; The single-chip microcomputer control hub is an STM32 single-chip microcomputer, and is used for system integration development for embedded applications. Since the trigger device needs to receive and process instructions, an embedded system is needed to develop the trigger device. The trigger device is developed using an STM32 single-chip microcomputer. The STM32 single-chip microcomputer integrates high performance, real-time performance, digital signal processing, low power consumption, and low voltage, while maintaining high integration and easy development characteristics, and is suitable for system integration development for embedded applications. The voltage of the relay is 5V, which is used to generate a short-circuit signal. Since the external trigger signal of the flash lamp is a short-circuit signal, a device for generating a short-circuit signal is needed. The trigger device selects a 5V relay module as the short-circuit signal generating device. The relay module has the characteristics of high stability and long service life. The current-limiting circuit is composed of a resistor, which limits the current in the circuit to 5mA through a certain resistance, to ensure that the instrument works normally without being damaged by the pulse signal. The external trigger signal of the thermal imager is a 5V pulse signal, but the current of the pulse is limited to 5mA. Therefore, the device needs to be protected by the current-limiting circuit during the transmission of the pulse signal generated by the single-chip microcomputer to the trigger port of the thermal imager. The output signal of the host computer uses RS232 serial communication, and the single-chip microcomputer uses TTL pin level input. Therefore, in order to realize the communication between the host computer and the single-chip microcomputer, the signal protocol needs to be converted. The trigger device uses an RS232 to TTL module to realize protocol conversion, so that the communication module between the host computer and the single-chip microcomputer is connected, and the normal transmission and reception of instructions is realized.

[0017] Further improvement, the control of the flash lamp uses an excitation module to realize, the flash lamp has an external excitation interface, the excitation module receives the excitation instruction of the host computer, and outputs the signal with the above timing characteristics, that is, sends a short-circuit signal to the flash lamp, realizes the working excitation of the flash lamp, and the flash lamp receives the excitation signal of the excitation module, and provides light source for the tested product.

[0018] Further improvement, the test method steps include the following: S1, the test system controls the flash lamp and the infrared thermal imager to work at the same time through computer software, the flash lamp is responsible for providing light source for the tested product, and the infrared thermal imager collects infrared image and data at the same time and returns to the control computer for display and saving; S2, the infrared thermal imager is responsible for receiving the control PC acquisition instruction, collecting the infrared image information of the tested product, and feeding back to the control PC, so as to realize the automatic control of the infrared thermal imager.

[0019] Further improvement, the infrared thermal imager has high-precision temperature measurement capability, can accurately capture the temperature distribution of the measured product surface, and display and record the temperature data in real time through the host computer software, for the application scenario of accurate temperature measurement and analysis, with temperature alarm function, when the infrared thermal imager detects that the surface temperature of the measured product exceeds the preset safety threshold, automatically trigger the alarm, remind the operator to handle in time, ensure the safety of the test process.

[0020] Further improvement, the system supports software triggering and timing triggering mode; Software triggering mode allows users to control the start and stop of the flash and infrared thermal imager through the host computer software, for flexible control of the test process application scenario; Timing triggering mode allows users to set a fixed test period, the system automatically starts the flash and infrared thermal imager for testing at each period, for periodic repeated testing application scenario.

[0021] Further improvement, the system supports multiple data output formats, including pictures, tables and reports, for data processing and display according to user's actual needs; The system provides interfaces and APIs for secondary development and system integration, to meet the user's individual needs, adapt to the application needs of different industries and scenarios.

[0022] Specific improvement, the system uses data transmission protocol to ensure the communication speed and stability between the host computer and the slave computer, improve the test efficiency and stability; The system uses remote control and monitoring, for connecting to the system through the network, realizing remote control and monitoring of the test process, improving the convenience and efficiency of the test.

[0023] In the development process of the device module, all kinds of components are designed with derating, to improve the reliability of the product, under the premise of meeting the reliability requirements of the device, the derating method and degree of the components are appropriately determined; Change the circuit design to allow the components to have a larger tolerance, use low-tolerance high-stability components, and treat different components differently, use low-tolerance high-stability components for those that affect system parameters; The core device index adopts large redundancy design, the unit should have a certain power margin, generally 20% to 30%, the main parts can be greater than 50%, the working point of the components should be selected correctly to avoid being selected near the critical region, the input voltage uses wide voltage input to ensure that the instrument and equipment will not be damaged due to power fluctuations; The excitation module needs to send specific excitation instructions to the flash and infrared thermal imager according to the host computer instructions, which requires accurate time processing and timely response; Loosening connection, fastener that can occur in use and transportation should have effective anti-loosening measures, adopt spring washer, self-locking nut or thread locking agent, etc., to ensure that there is enough strength, rigidity and stability under possible extreme working conditions.

[0024] Summary: The automatic control system of the infrared thermal imager is used to convert the manual control in the experiment process into automatic control, improve the test efficiency and quality, fully implement the standardization, generalization, serialization and modularization requirements, coordinate the man-machine relationship, meet the relevant standards, make the operator operate conveniently, comfortably and accurately, the equipment has good maintainability, the units that are frequently maintained have good detachability, the structure design meets the requirements of the equipment on strength and rigidity, the weight is small, the volume is small; The operator can realize the working control of the infrared thermal imager and the flash lamp through the software interface of the upper computer, send a short-circuit signal to the flash lamp after receiving the excitation instruction of the upper computer, realize the working excitation of the flash lamp; According to the instruction of the upper computer, the flash lamp and the infrared thermal imager are triggered to work in turn, the trigger interval can be adjusted, and the trigger frequency of the infrared thermal imager can be adjusted.

[0025] The above shows and describes the basic principles and main features of the present application and the advantages of the present application, for those skilled in the art, it is obvious that the present application is not limited to the details of the above exemplary embodiments, and the present application can be realized in other specific forms without departing from the spirit or essential characteristics of the present application. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-limiting, the scope of the present application is defined by the appended claims rather than the above description, therefore all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be included in the present application. Any reference signs in the claims should not be regarded as limiting the claims involved.

[0026] In addition, it should be understood that although the present specification is described in terms of embodiments, not every embodiment contains only one independent technical solution, and the description manner of the specification is only for the sake of clarity, those skilled in the art should regard the specification as a whole, and the technical solutions in each embodiment can also be combined to form other embodiments that those skilled in the art can understand.

Claims

1. An infrared automatic test system, characterized by, The trigger device, the flash and the infrared thermal imager, the trigger device is composed of four parts of single-chip microcomputer control center, relay, current limiting circuit and communication module, the trigger device is the lower computer of the system, is responsible for receiving the instruction of the upper computer control PC, the trigger signal output to the trigger device according to the instruction, the trigger device uses RS232 to TTL module to realize protocol conversion, makes the lower computer and the upper computer establish communication module connection, carries out the normal transceiver of instruction; The control software of the system installed on the control PC has control and display interface and is responsible for the realization of man-machine interaction function; The single-chip microcomputer control center is STM32 single-chip microcomputer, which is used for embedded application system integration development; The voltage of the relay is 5V, which is used for generating short circuit signal; The current limiting circuit is composed of resistance, which limits the current in the circuit to 5mA through certain resistance, so as to ensure that the instrument works normally and will not be damaged by pulse signal; The output signal of the upper computer uses RS232 serial communication, and the single-chip microcomputer uses TTL pin level input; The test method steps include the following: S1, the test system controls the flash and the infrared thermal imager to work at the same time through the computer software, the flash is responsible for providing light source for the measured product, the infrared thermal imager collects infrared image and data at the same time and returns to the control computer for display and saving; S2, the infrared thermal imager is responsible for collecting the infrared image information of the measured product after receiving the collection instruction of the control PC, and feeding back to the control PC, so as to realize the automatic control of the infrared thermal imager.

2. An automatic infrared test system according to claim 1, wherein: The control of the flash uses the excitation module to realize, the flash has external excitation interface, the excitation module receives the excitation instruction of the upper computer, and outputs the signal with time sequence characteristics, that is, sends a short circuit signal to the flash, realizes the work excitation of the flash, and the flash is responsible for receiving the excitation signal of the excitation module, and providing light source for the test product.

3. An automatic infrared test system according to claim 1, wherein The infrared thermal imager can accurately capture the temperature distribution of the surface of the measured product, and display and record the temperature data in real time through the upper computer software, which is used for the application scene of accurate temperature measurement and analysis, has temperature alarm function, when the infrared thermal imager detects that the surface temperature of the measured product exceeds the preset safety threshold, automatically triggers the alarm, reminds the operator to handle in time, ensures the safety of the test process.

4. An automatic infrared test system according to claim 1, wherein: The system supports software triggering and timing triggering mode; The software triggering mode allows users to control the start and stop of the flash and the infrared thermal imager through the upper computer software, which is used for the application scene of flexible control of test process; The timing triggering mode allows users to set fixed test period, and the system automatically starts the flash and the infrared thermal imager to test in each period, which is used for the application scene of periodic repeated test.

5. The automatic infrared test system of claim 1, wherein: The system supports multiple data output formats, including pictures, tables and reports, which are used for data processing and display according to actual user demand; The system provides interface and API for secondary development and system integration, which meets the individual needs of users.

6. An automatic infrared test system according to claim 1, wherein: The system uses data transmission protocol to ensure the communication speed and stability between the upper computer and the lower computer; The system uses remote control and monitoring, which is used for connecting to the system through network to realize remote control and monitoring of test process.