Method of inspecting a curved object and inspection system

CN122270778APending Publication Date: 2026-06-233M INNOVATIVE PROPERTIES CO
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-01
Publication Date
2026-06-23

AI Technical Summary

Technical Problem

Existing technologies struggle to inspect the surface uniformity of curved objects accurately and in real time, especially on large painted automotive panels, where traditional methods are time-consuming and costly.

Method used

By employing wavefront guidance and distortion correction techniques, the reflection images of curved objects are acquired, and distortion correction parameters are used to adjust the images to identify small-scale local texture changes, or to adjust the mesh algorithm for rating.

Benefits of technology

It enables efficient and accurate detection of small-scale local texture changes on the surface of curved objects, reducing inspection time and cost.

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Abstract

A method for inspecting curved objects is provided. The method includes: guiding a wavefront onto the surface of a curved object having at least one large-scale curvature; acquiring at least one reflection image, the at least one reflection image including distorted reflections from the wavefront of the curved object; and determining distortion correction parameters based on the large-scale curvature of the object. The method further includes at least one of: i) adjusting the reflection image by correcting distortion caused by the large-scale curvature of the object to create an adjusted image; and analyzing the adjusted image to look for small-scale local texture variations that may exist on the surface of the curved object; or ii) analyzing the reflection image using the distortion correction parameters; and adjusting a mesh algorithm to rate the small-scale local texture variations that may exist on the surface of the curved object. A system for inspecting curved objects is also provided.
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Citation Information

Patent Citations

  • Method and system for characterizing surface uniformity

    US20220011238A1

  • Multiscale uniformity analysis of a material

    US9841383B2