A waveguide transmission line structure-based nonlinear characterization method for wave-absorbing sheet material and related device

By using a nonlinear characterization method for absorbing sheet materials based on waveguide transmission line structures, the problem of accuracy in characterizing passive intermodulation of absorbing sheet materials is solved, achieving efficient and accurate test results. This method is suitable for large-size or sheet-like materials and reduces experimental costs and complexity.

CN122592041APending Publication Date: 2026-08-18SHAANXI WEISHANG ZHIXIN SEMICONDUCTOR TECHNOLOGY CO LTD
0 Cites 0 Cited by

Patent Information

Application Number
CN202610641967.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-05-11
Publication Date
2026-08-18

AI Technical Summary

Technical Problem

Existing technologies suffer from low accuracy in characterizing passive intermodulation of absorbing sheet materials, making it difficult to balance the simplicity of experimental conditions, the accuracy of test results, and the relevance to application scenarios.

Method used

A nonlinear characterization method for absorbing sheet materials based on waveguide transmission line structure is adopted, including calibration, assembly, testing and inspection steps. The stability and accuracy of the test system are ensured by electrical parameter calibration and noise calibration, and the contact state is ensured by filling rate and torque wrench. Combined with the joint testing of forward transmission PIM and reverse reflection PIM, the stability and reliability of the test results are improved.

Benefits of technology

It significantly improves the accuracy of nonlinear characterization of absorbing sheet materials, eliminates systematic errors caused by assembly differences, enhances the stability and reliability of test results, realizes quantitative description of the nonlinear characteristics of absorbing sheet materials, and facilitates cross-sectional comparison between different materials and database establishment.

✦ Generated by Eureka AI based on patent content.
Patent Text Reader

Abstract

The application provides a waveguide transmission line structure-based nonlinear characterization method for wave-absorbing sheet materials and a related device, and belongs to the technical field of radio frequency passive intermodulation testing. The application repeatedly performs an assembling step and a testing step until testing of all to-be-tested wave-absorbing sheets is completed; whether the reflection PIM of more than a set number of wave-absorbing sheets is lower than the sensitivity of a receiving system is judged; if yes, the input power is increased by a step in a set range until the PIM amplitude of the wave-absorbing sheet is located in a PIM testing system testing threshold value; the wave-absorbing sheets without testing results are retested, the assembling step and the testing step are repeatedly performed, and all to-be-tested wave-absorbing sheets are distinguished until the intermodulation level is obtained. The application solves the problem that the accuracy of nonlinear characterization of wave-absorbing sheet materials is not high.
Need to check novelty before this filing date? Find Prior Art