A transistor electrical performance testing device

Abstract

This application discloses a transistor electrical performance testing device, relating to the field of electronic component testing technology. It includes a base with a test track vertically arranged on it. A feeding mechanism is located at the top of the test track on the base, transporting the transistor into the test track. A testing mechanism is located on the side of the test track on the base. A sorting and receiving mechanism is also located on the base. A first image detection component for image detection of the first surface of the transistor is located at the bottom of the test track on the base. A detection turret mechanism is located on the base, connecting the outlet end of the test track and the inlet end of the sorting and receiving mechanism. The detection turret mechanism is used for image detection of the remaining five surfaces of the transistor. This application utilizes the first image detection component and the detection turret mechanism in conjunction to perform image detection on all six surfaces of the transistor, thereby enabling comprehensive image detection of the transistor surface.

Description

Technical Field

[0001] This application relates to the field of electronic component testing technology, and in particular to a transistor electrical performance testing device. Background Technology

[0002] A transistor is a semiconductor device with three electrodes. It can control the collector current through the base current, achieving current amplification or switching functions. Classified by structure as NPN and PNP, transistors are widely used in amplifier circuits, oscillator circuits, power supply control, and other electronic devices, and are one of the core components of electronic technology.

[0003] Currently, transistors need to be tested after production. During the testing process, the transistors are moved and transported within a track. Cylinders are installed on both sides of the track, and the cylinders drive the test pins to move. The test pins then contact the transistor pins to perform the test. After the test is completed, the transistors are sorted.

[0004] Due to the unique structural issues of the testing device, the transistors are obstructed by the track during the movement and transportation process, which limits the detection angle and position of the image detection, thus making it impossible to complete a comprehensive surface image detection. Summary of the Invention

[0005] To facilitate comprehensive imaging inspection of the transistor surface, this application provides a transistor electrical performance testing device.

[0006] The transistor electrical performance testing device provided in this application adopts the following technical solution: A transistor electrical performance testing device includes a base, a test track vertically arranged on the base, a feeding mechanism at the top of the test track on the base for conveying transistors into the test track, a testing mechanism on the side of the test track on the base, a sorting and receiving mechanism on the base, a first image detection component at the bottom of the test track on the base for image detection of the first facet of the transistor, and a detection turret mechanism on the base connecting the output end of the test track and the infeed end of the sorting and receiving mechanism for image detection of the remaining five facests of the transistor.

[0007] By adopting the above technical solution, the feeding mechanism transports the transistor to the test track. The transistor slides downwards within the test track, and the testing mechanism performs electrical performance tests on the transistor within the test track. After the test is completed, the first image detection component performs image detection on the first surface of the transistor from outside the test track. Subsequently, the transistor enters the detection turret mechanism, which performs image detection on the remaining five surfaces of the transistor. Finally, the tested transistor is transported to the sorting and receiving mechanism. With this setup, during the electrical performance testing of the transistor, the first image detection component and the detection turret mechanism work together to perform image detection on all six surfaces of the transistor, thus enabling comprehensive image detection of the transistor's surface.

[0008] Preferably, the detection turret mechanism includes a feeding component, a turntable, a second image detection component, a third image detection component, a discharging component, and multiple suction components. The feeding component is mounted on a base and connected to the discharge end of the test track. The discharging component is mounted on a base and connected to the inlet end of the sorting and receiving mechanism. The turntable is rotatably mounted on the base and located above the feeding and discharging components. The multiple suction components are spaced apart on the turntable circumferentially. The second and third image detection components are both mounted on the base and located between the feeding and discharging components. The second image detection component is used to perform image detection on three surfaces of the transistor, and the third image detection component is used to perform image detection on two surfaces of the transistor.

[0009] By adopting the above technical solution, the transistor in the test track is transported to the feeding component. The turntable drives the suction component to move above the feeding component. The suction component picks up the transistor. The turntable drives the transistor to move sequentially to the second image detection component and the third image detection component for image detection. Then the turntable drives the transistor to the top of the unloading component. The suction component releases the transistor, allowing it to enter the unloading component. Finally, the transistor is transported from the unloading component to the sorting and receiving mechanism.

[0010] Preferably, the feeding component includes a first mounting frame, a feeding track, a lifting component, a pressure block, a first rotating component, a lever, a translation plate, and a first positioning carrier. The first mounting frame is mounted on a base, the feeding track is mounted on the first mounting frame, and the first end of the feeding track is connected to a test track. The lifting component is mounted on the tail end of the feeding track, the pressure block is mounted on the lifting end of the lifting component, the first rotating component is mounted on the first mounting frame, the lever is mounted on the rotating end of the first rotating component, the translation plate is slidably mounted on the first mounting frame, the translation plate has a slot, the lever is slidably mounted in the slot, and the first positioning carrier is mounted on the translation plate.

[0011] By adopting the above technical solution, the transistors in the test track are transported to the feeding track. The lifting component drives the pressure block to move up and down. The pressure block moves down and presses down the transistors at the end of the feeding track. The first rotating component drives the translation plate to move closer to the feeding track through the lever and the groove. The translation plate drives the first positioning carrier to move to the end of the feeding track. The lifting component drives the pressure block to move up. After the transistors at the end of the feeding track move to the first positioning carrier, the lifting component drives the pressure block to press down the next transistor. The first rotating component then drives the first positioning carrier to move away from the feeding track through the translation plate. The first positioning carrier drives the transistors to move below the suction component, so that the suction component can easily pick up the transistors.

[0012] Preferably, the unloading component includes a second mounting frame, an unloading track, a translation component, and a push block. The second mounting frame is mounted on a base, the unloading track is mounted on the second mounting frame, the tail end of the unloading track is connected to a sorting and receiving mechanism, the translation component is mounted on the second mounting frame, and the push block is mounted at the translation end of the translation component and located at the head end of the unloading track.

[0013] By adopting the above technical solution, the turntable drives the suction component to place the transistor that has completed image detection into the first end of the feeding track. The translation component drives the pusher block to move, and the pusher block pushes the transistor to move within the feeding track, so that the transistor moves from the feeding track to the sorting and receiving mechanism.

[0014] Preferably, a reversing component is provided on the base between the feeding component and the second image detection component, and between the unloading component and the third image detection component. The reversing component includes a third mounting bracket, a second rotating component, and a second positioning carrier. The third mounting bracket is disposed on the base, the second rotating component is disposed on the third mounting bracket, and the second positioning carrier is disposed at the rotating end of the second rotating component.

[0015] By adopting the above technical solution, the transistor needs to be reversed in the reversing component before entering the second image detection component and after leaving the third image detection component. The suction component first puts the transistor into the second positioning carrier, and the second rotating component drives the transistor to rotate through the second positioning carrier. The suction component then picks up the transistor again, thereby reversing the transistor and facilitating image detection and unloading of the transistor.

[0016] Preferably, a fixed plate is fixedly installed on the base above the turntable. The fixed plate is equipped with a pressure rod that is slidably installed above the feeding component, the unloading component, the second image detection component, and the two reversing components. The pressure rod is located directly above the suction component. The suction component is slidably installed in the turntable in a vertical direction. The turntable is provided with an elastic reset component for driving the suction component to move upward and reset.

[0017] By adopting the above technical solution, the pressure rod on the fixed plate moves downward, and the pressure rod drives the suction component to move downward, thereby facilitating the suction component to pick up and put down the transistor, and at the same time facilitating the transistor to enter the second image detection component for image detection.

[0018] Preferably, the first positioning carrier has an air intake hole, the translation plate has an air intake channel, one end of the air intake channel is connected to the air intake hole, and the other end of the air intake channel is connected to the air intake device through a pipeline.

[0019] By adopting the above technical solution, after the transistor moves to the first positioning carrier, the air intake device draws air through the air intake channel to the air intake hole. The air intake hole adsorbs and fixes the transistor on the first positioning carrier, so that the transistor will not move during the movement of the first positioning carrier.

[0020] Preferably, the first positioning carrier has grooves on both sides of the air intake hole that communicate with the air intake hole. Slide plates are slidably mounted on both grooves of the first positioning carrier. An elastic element is provided within the first positioning carrier to push the slide plates away from the air intake hole. Clamping plates are provided at the ends of the two slide plates that are away from each other. The diameter of the top of the air intake hole gradually decreases. A conical plug is slidably mounted on the top of the air intake hole on the first positioning carrier. A transmission component is provided within the first positioning carrier. The transmission component is connected to the slide plates and the conical plug. When the slide plates move away from the air intake hole, the slide plates drive the conical plug to move and seal the top of the air intake hole via the transmission component. When the slide plates move closer to the air intake hole, the slide plates drive the conical plug to release the seal on the air intake hole via the transmission component.

[0021] By adopting the above technical solution, when the suction port is not drawing air, the elastic element pushes the sliding plate away from the suction port. The sliding plate, through the transmission component, drives the conical plug to move and block the suction port. After the transistor moves to the first positioning carrier, the suction port draws air. Since the conical plug blocks the top of the suction port, the suction port draws air into the slide groove, causing the sliding plate to move the clamping plate closer to the suction port. After the two clamping plates move, they clamp and position the transistor on the first positioning carrier, making the transistor more accurately placed on the first positioning carrier. When the sliding plate and clamping plate clamp the transistor, the sliding plate moves to the side closer to the suction port. The sliding plate, through the transmission component, drives the conical plug to release the blockage of the suction port, allowing the suction port to adsorb and fix the transistor.

[0022] Preferably, the transmission component includes a drive rack, a gear, and a driven rack. The drive rack is fixedly mounted on the slide plate, the gear is rotatably mounted in the first positioning carrier, and the driven rack is slidably mounted in the first positioning carrier. The gear meshes with the drive rack and the driven rack. The top of the driven rack near the conical plug has a first chamfer. A slot is provided on the side wall of the conical plug. The end of the driven rack is slidably inserted into the slot. The side of the conical plug near the driven rack in the slot has a second chamfer.

[0023] By adopting the above technical solution, when the slide plate moves away from the air intake, the slide plate drives the gear to rotate through the drive rack. The gear drives the driven rack to move and insert into the cone plug. Under the action of the first chamfer and the second chamfer, the driven rack drives the cone plug to move upward to block the air intake. When the slide plate moves closer to the air intake, the slide plate drives the gear to rotate through the drive rack. The gear drives the driven rack to move away from the cone plug. Under the action of the first chamfer and the second chamfer, the cone plug moves downward under the action of gravity, thereby releasing the blockage of the air intake.

[0024] In summary, this application includes at least one of the following beneficial technical effects: 1. Using a first image detection component and a detection turret mechanism, the feeding mechanism transports the transistor into the test track. The transistor slides downwards within the test track, and the testing mechanism performs electrical performance tests on the transistor within the test track. After the test is completed, the first image detection component performs image detection on the first surface of the transistor from outside the test track. Subsequently, the transistor enters the detection turret mechanism, which then performs image detection on the remaining five surfaces of the transistor, thereby enabling comprehensive image detection of the transistor surface. 2. With the help of the pressure bar, the pressure bar on the fixed plate moves downward, and the pressure bar drives the suction component to move downward, so that the suction component can complete the suction of the transistor and put the transistor down, and at the same time facilitate the transistor to enter the second image detection component for image detection; 3. After the transistor moves to the first positioning carrier through the suction port, the suction device sucks air through the suction channel into the suction port. The suction port adsorbs and fixes the transistor on the first positioning carrier, so that the transistor will not move during the movement of the first positioning carrier. Attached Figure Description

[0025] Figure 1 This is a schematic diagram of the overall structure of the transistor electrical performance testing device in Embodiment 1 of this application; Figure 2 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, to highlight the test track; Figure 3This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, to highlight the feeding mechanism; Figure 4 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, to highlight the first and second stop levers; Figure 5 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, to highlight the testing turret mechanism; Figure 6 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, with emphasis placed on the fixed plate; Figure 7 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, to highlight the commutation component; Figure 8 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, to highlight the feeding component; Figure 9 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, to highlight the first positioning carrier; Figure 10 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, to highlight the material feeding component; Figure 11 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 1 of this application, to highlight the sorting and collecting mechanism; Figure 12 This is a partial structural schematic diagram of the transistor electrical performance testing device in Embodiment 2 of this application, to highlight the first positioning carrier; Figure 13 This is a partial structural cross-sectional view of the transistor electrical performance testing device in Embodiment 2 of this application, to highlight the state of the conical plug blocking the air intake hole; Figure 14 This is a partial structural cross-sectional view of the transistor electrical performance testing device in Embodiment 2 of this application, to highlight the state where the conical plug is not blocked from the intake port; Figure 15 This is a partial structural cross-sectional view of the transistor electrical performance testing device in Embodiment 2 of this application, with the block shown in the background. Figure 16 This is a partial structural cross-sectional view of the transistor electrical performance testing device in Embodiment 2 of this application, highlighting the cone plug.

[0026] Reference numerals: 1. Base; 2. Testing mechanism; 21. Moving frame; 22. First stop bar; 23. Second stop bar; 24. Driving component; 25. Testing pin; 3. Feeding mechanism; 31. Hopper; 32. Clamping component; 33. Conveying track; 34. Limiting component; 35. Feeding plate; 36. First material tube; 4. Sorting and receiving mechanism; 41. Sorting track; 42. Receiving track; 43. Second material tube; 5. First image detection component; 6. Detection turret mechanism; 61. Feeding component; 611. First mounting frame; 612. Feeding track; 613. Lifting component; 614. Pressure block; 615. First rotating component; 616. Lever; 617. Translation plate; 618. First positioning carrier; 62. Turntable; 63. Second image detection component; 64. Third image detection component; 65. Unloading section Components; 651, Second mounting bracket; 652, Feeding track; 653, Translation component; 654, Push block; 66, Suction component; 7, Slot; 8, Reversing component; 81, Third mounting bracket; 82, Second rotating component; 83, Second positioning carrier; 9, Fixed plate; 10, Pressure rod; 11, Elastic reset component; 12, Suction hole; 13, Suction channel; 14, Slide groove; 15, Slide plate; 16, Elastic component; 17, Clamping plate; 18, Conical plug; 19, Transmission component; 191, Drive rack; 192, Gear; 193, Driven rack; 20, Slot; 26, First chamfer; 27, Second chamfer; 28, Column; 29, Chassis; 30, Linkage structure; 37, Bracket; 38, Test track; 39, Marking mechanism; 40, Cleaning mechanism; 44, Waste box; 45, Stop block; 46, Moving slot. Detailed Implementation

[0027] The following is in conjunction with the appendix Figures 1-16 This application will be described in further detail.

[0028] This application discloses a transistor electrical performance testing device.

[0029] Example 1: Reference Figure 1 and Figure 2 A transistor electrical performance testing device includes a base 1, on which a chassis 29 is fixedly mounted. A test track 38 is fixedly mounted on the side wall of the chassis 29 and is installed vertically, allowing the transistor to be transported within the test track 38. A loading mechanism 3 is mounted on the base 1, located at the top of the test track 38, and loads the transistor from the top of the test track 38 into the test track 38. A testing mechanism 2 is mounted on the chassis 29, located to the side of the middle of the test track 38. As the transistor moves downward within the test track 38, the testing mechanism 2 can test the transistor's electrical performance.

[0030] A marking mechanism 39 is installed on the base 1. After the transistor completes its electrical performance test, the marking mechanism 39 performs laser marking on the top surface of the transistor. A cleaning mechanism 40 is installed on the chassis 29 below the marking mechanism 39. The cleaning mechanism 40 consists of a motor, a cleaning wheel, and a vacuum hood. The motor drives the cleaning wheel to rotate, cleaning the markings on the top surface of the transistor, and the vacuum hood collects the waste. A first image detection component 5 is installed on the base 1 below the cleaning mechanism 40. The first image detection component 5 can perform image detection on the top surface of the transistor.

[0031] A detection turret mechanism 6 is installed on the base 1. The feed end of the detection turret mechanism 6 is connected to the discharge end at the bottom of the test track 38. The transistors that have completed top surface image detection enter the detection turret mechanism 6, and the detection turret mechanism 6 performs image detection on the other five surfaces of the transistors. A sorting and receiving mechanism 4 is installed on the base 1, and the discharge end of the detection turret mechanism 6 is connected to the feed end of the sorting and receiving mechanism 4. The transistors that have completed image detection enter the sorting and receiving mechanism 4 for sorting and receiving.

[0032] The feeding mechanism 3 precisely delivers the transistors to be tested into the test track 38. Once in the test track 38, the transistors slide down the track under their own weight, smoothly entering the testing phase. During this process, the testing mechanism 2 performs electrical performance tests on the transistors within the test track 38. After the electrical performance test is completed, the first image detection component 5 immediately starts working and accurately captures the image information of the first surface of the transistor. Next, the transistor is conveyed to the testing turret mechanism 6. The testing turret mechanism 6 acquires and analyzes images of the remaining five surfaces of the transistor, achieving comprehensive inspection of the transistor's appearance. After all the above testing steps, the qualified transistors are orderly conveyed to the sorting and collecting mechanism 4 for classification and storage. Reference Figure 3 Specifically, the feeding mechanism 3 includes a hopper 31, a clamping component 32, a conveying track 33, a limiting component 34, a feeding plate 35, and multiple first material pipes 36. The hopper 31 is mounted on the base 1 via a column 28. The clamping component 32 is rotatably mounted on the hopper 31 via a connecting rod structure 30. The conveying track 33 is fixedly mounted on the clamping component 32. The limiting component 34 is mounted at the tail end of the conveying track 33. The feeding plate 35 is rotatably mounted on the base 1 via a rotary cylinder, and the feeding plate 35 is rotatably connected to the conveying track 33 or the test track 38.

[0033] The transistors are stored in the first feed tube 36, which is housed in the hopper 31. A clamping component 32 clamps one of the first feed tubes 36 and rotates it, causing it to tilt. The transistors inside the first feed tube 36 slide into the conveyor track 33, where a limiting component 34 presses down to limit the transistors at the end of the conveyor track 33. When the feeding plate 35 rotates and connects to the conveyor track 33, the limiting component 34 releases its limit, and the transistors slide into the feeding plate 35. The limiting component 34 then again limits the transistors in the conveyor track 33. Subsequently, the feeding plate 35 rotates and connects to the test track 38, and the transistors inside the feeding plate 35 slide into the test track 38, thus continuously feeding transistors into the test track 38.

[0034] Reference Figure 2 and Figure 4 Specifically, the testing mechanism 2 includes a movable frame 21, multiple first stop levers 22, second stop levers 23, a driving component 24, and test pins 25. The movable frame 21 is driven by a cylinder and slides horizontally within a housing 29, with part of the movable frame 21 located inside the housing 29 and the other part located outside. Multiple first stop levers 22 are fixedly installed vertically at intervals at the ends of the movable frame 21 located outside the housing 29, and multiple second stop levers 23 are fixedly installed vertically at intervals at the ends of the movable frame 21 located inside the housing 29. The multiple first stop levers 22 and second stop levers 23 are arranged alternately vertically. The movable frame 21 drives the first stop levers 22 and second stop levers 23 to insert into and slide out of the test track 38 along its opposite sides. Multiple driving components 24 are installed vertically at intervals on the side walls of the housing 29, and the test pins 25 are fixedly installed on the driving ends of the driving components 24. In this application, the driving component 24 can be a finger cylinder.

[0035] The moving frame 21 moves horizontally back and forth. When the moving frame 21 moves into the chassis 29, it causes the first stop lever 22 to insert into the test rail 38, and the second stop lever 23 to slide out of the test rail 38. At this time, the first stop lever 22 blocks the transistor, keeping it stationary within the test rail 38. Then, the clamping component moves the test pin 25 to contact the transistor's pin, thus performing an electrical performance test on the transistor. When the moving frame 21 moves out of the chassis 29, it causes the second stop lever 23 to insert into the test rail 38, and the first stop lever 22 to slide out of the test rail 38. The transistor slides down, and the second stop lever 23 blocks the transistor again. The clamping component moves the test pin 25 to continue the test. Repeating the above steps allows for a comprehensive electrical performance test of the transistor.

[0036] Reference Figure 5 and Figure 6Specifically, the detection turret mechanism 6 includes a feeding component 61, a turntable 62, a second image detection component 63, a third image detection component 64, a discharging component 65, and multiple suction components 66. A fixed plate 9 is fixedly mounted on the base 1 via a bracket 37. The turntable 62 is rotatably mounted on the base 1, and the turntable 62 is coaxially mounted with the fixed plate 9. The turntable 62 is located directly below the fixed plate 9. Multiple suction components 66 are installed on the turntable 62 at equal intervals along its circumference. The suction components 66 are slidably mounted on the turntable 62 in the vertical direction. Each suction component 66 is equipped with an elastic reset component 11 on the turntable 62. In this application, the elastic reset component 11 can be a spring, and the elastic reset component 11 drives the suction component 66 to slide upward. A waste box 44 is installed on the base 1 outside the turntable 62.

[0037] The feeding component 61 is mounted on the base 1 and connected to the end of the test track 38. The unloading component 65 is mounted on the base 1 and connected to the sorting and receiving mechanism 4. Both the feeding component 61 and the unloading component 65 are mounted below the turntable 62. The second image detection component 63 and the third image detection component 64 are both mounted on the base 1 and located below the turntable 62. The second image detection component 63 is closer to the feeding component 61, and the third image detection component 64 is closer to the unloading component 65. Reversing components 8 are installed on the base 1 between the feeding component 61 and the second image detection component 63, and between the unloading component 65 and the third image detection component 64.

[0038] A pressure rod 10 is mounted on the platen 9 above the feeding component 61, the unloading component 65, the second image detection component 63, and the two reversing components 8. The pressure rod 10 is located directly above the suction component 66, and the pressure rod 10 is driven by a drive motor to move downward and pushed by a spring to move upward.

[0039] The transistor in test track 38 slides down into the feeding component 61. The pressure rod 10 drives the suction component 66 to move downwards. The suction component 66 picks up the transistor at the tail end of the feeding component 61. The turntable 62 moves the transistor to the first commutation component 8 via the suction component 66. The pressure rod 10 drives the suction component 66 to move downwards. The suction component 66 places the transistor on the commutation component 8. After the commutation component 8 drives the transistor to rotate and change direction, the suction component 66 picks up the transistor again.

[0040] Subsequently, the turntable 62 moves the suction member 66 to the second image detection unit 63, and the pressure rod 10 moves the suction member 66 downward. The suction member 66 moves the transistor into the second image detection unit 63, where the second image detection unit 63 performs image detection on the bottom surface and two surfaces along the width direction of the transistor. After the suction member 66 moves the transistor upward out of the second image detection unit 63, the turntable 62 moves the transistor into the third image detection unit 64, where the third image detection unit 64 performs image detection on two surfaces along the length direction of the transistor.

[0041] Finally, the turntable 62 drives the transistor to move to the second reversing component 8. After the transistor completes the loop, it moves to the unloading component 65. The pressure rod 10 drives the suction component 66 to move down. The suction component 66 puts the transistor into the unloading component 65. The unloading component 65 then transports the image-detected qualified transistors to the sorting and collecting mechanism 4 for sorting and collecting, and transports the image-detected unqualified transistors to the waste box 44.

[0042] Reference Figure 7 Specifically, the commutation component 8 includes a third mounting bracket 81, a second rotating member 82, and a second positioning carrier 83. The third mounting bracket 81 is fixedly mounted on the base 1, the second rotating member 82 is fixedly mounted on the third mounting bracket 81, and the second positioning carrier 83 is fixedly mounted on the rotating end of the second rotating member 82. In this application, the second rotating member 82 can be a rotary cylinder. The transistor is placed inside the second positioning carrier 83, and the second rotating member 82 drives the transistor to rotate through the second positioning carrier 83, thereby enabling the commutation of the transistor.

[0043] Reference Figure 8 indivual Figure 9 Specifically, the feeding component 61 includes a first mounting frame 611, a feeding track 612, a lifting component 613, a pressure block 614, a first rotating component 615, a lever 616, a translation plate 617, and a first positioning carrier 618. The first mounting frame 611 is fixedly mounted on the base 1, and the feeding track 612 is fixedly mounted on the first mounting frame 611. The first end of the feeding track 612 is bent at 90° and connected to the tail end of the test track 38. The tail end of the feeding track 612 extends to one side near the turntable 62. The lifting component 613 is fixedly mounted on the tail end of the feeding track 612, and the pressure block 614 is fixedly mounted on the lifting end of the lifting component 613. In this application, the lifting component 613 can be selected as a cylinder.

[0044] The first rotating component 615 is fixedly mounted on the first mounting bracket 611, and the lever 616 is fixedly mounted on the rotating end of the first rotating component 615. In this application, the first rotating component 615 can be a rotary cylinder. The translation plate 617 is slidably mounted on the first mounting bracket 611 along the length direction of the feeding track 612 via a slider and a guide rail. The first positioning carrier 618 is fixedly mounted on the translation plate 617. The translation plate 617 has a lever groove 7, and the lever 616 is slidably mounted in the lever groove 7. The first positioning carrier 618 has a suction hole 12, and the translation plate 617 has a suction channel 13. One end of the suction channel 13 is connected to the suction hole 12, and the other end is connected to the suction equipment through a pipe.

[0045] The transistor in test track 38 slides down into the loading track 612. The lifting component 613, carrying a lifting block, moves downwards, extending into the loading track 612 and pressing down to fix the transistor at the end of the track. When the first rotating component 615 drives the lever 616 to slide forward within the slot 7, the lever 616 drives the translation plate 617 to move towards the loading track 612 on the first mounting bracket 611. The translation plate 617 then moves the first positioning carrier 618 to abut against the loading track 612. The lifting component 613 drives the lifting block to rise, and the transistor at the end of the loading track 612 slides into the first positioning carrier 618. The lifting component 613 then drives the pressure block 614 to press down on the transistor.

[0046] After the transistor enters the first positioning carrier 618, the suction device adsorbs the transistor through the suction channel 13 and suction hole 12, thus fixing the transistor on the first positioning carrier 618. The first rotating component 615 drives the lever 616 to slide in the opposite direction in the slot 7. The lever 616 moves the transistor to below the suction component 66 of the turntable 62 through the translation plate 617 and the first positioning carrier 618. The suction device then stops suction, making it easier for the suction component 66 to pick up the transistor.

[0047] Reference Figure 10 Specifically, the unloading component 65 includes a second mounting bracket 651, an unloading track 652, a translation component 653, and a pusher block 654. The second mounting bracket 651 is fixedly mounted on the base 1, and the unloading track 652 is fixedly mounted on the second mounting bracket 651, with its tail end inclined downwards towards the sorting and receiving mechanism 4. The translation component 653 is fixedly mounted on the second mounting bracket 651 and located at the head end of the unloading track 652, and the pusher block 654 is fixedly mounted on the translation end of the translation component 653. In this application, the translation component 653 can be a cylinder.

[0048] The suction unit 66 places the transistor into the first end of the feeding track 652. The translation unit 653 drives the pusher block 654 to move back and forth. The pusher block 654 pushes the transistor into the feeding track 652. When the transistor moves to the inclined part of the feeding track 652, the transistor slides down into the sorting and receiving mechanism 4 under the action of gravity.

[0049] Reference Figure 11 Specifically, the sorting and receiving mechanism 4 includes a sorting track 41, multiple receiving tracks 42, and multiple second material tubes 43. The sorting track 41 is slidably mounted on the base 1 in the horizontal direction via a slider and a guide rail, and is driven by a motor, a wheel, and a belt. The multiple receiving tracks 42 are fixedly mounted on the base 1 in the horizontal direction, and the multiple second material tubes 43 are placed on the base 1 and connected to the multiple receiving tracks 42 respectively.

[0050] The sorting track 41 moves to connect with the unloading track 652. The transistors in the unloading track 652 slide down into the sorting track 41. Then, the sorting track 41 moves to connect with different receiving tracks 42. The transistors slide from the sorting track 41 into the receiving track 42, and finally slide from the receiving track 42 into the second material pipe 43, thus realizing the sorting and receiving of the transistors.

[0051] The implementation principle of the transistor electrical performance testing device in this application embodiment is as follows: The feeding mechanism 3 accurately feeds the transistor to be tested into the test track 38. After entering the test track 38, the transistor slides down the track under its own gravity and smoothly enters the testing stage. During this process, the testing mechanism 2 performs electrical performance testing on the transistor in the test track 38. After the electrical performance test is completed, the first image detection component 5 starts working and accurately captures the image information of the first surface of the transistor.

[0052] The transistor is fed into the feeding component 61. The pressure rod 10 drives the suction member 66 to move downwards. The suction member 66 picks up the transistor at the tail end of the feeding component 61. The turntable 62 moves the transistor to the first commutation component 8 via the suction member 66. The pressure rod 10 drives the suction member 66 to move downwards. The suction member 66 places the transistor on the commutation component 8. After the commutation component 8 drives the transistor to rotate and change direction, the suction member 66 picks up the transistor again.

[0053] Subsequently, the turntable 62 moves the suction member 66 to the second image detection unit 63. The pressure rod 10 moves the suction member 66 downward, and the suction member 66 moves the transistor into the second image detection unit 63. The second image detection unit 63 performs image detection on the bottom surface and two surfaces along the width direction of the transistor. After the suction member 66 moves the transistor upward out of the second image detection unit 63, the turntable 62 moves the transistor into the third image detection unit 64. The third image detection unit 64 performs image detection on two surfaces along the length direction of the transistor, achieving omnidirectional coverage detection of the transistor's appearance.

[0054] Finally, the turntable 62 drives the transistor to move to the second reversing component 8. After the transistor completes the loop, it moves to the unloading component 65. The pressure rod 10 drives the suction component 66 to descend and move. The suction component 66 puts the transistor into the unloading component 65. The unloading component 65 then transports the transistor to the sorting and collecting mechanism 4 for sorting and collecting.

[0055] Example 2: Reference Figure 12 and Figure 13 The difference between this embodiment and Embodiment 1 is that two sliding grooves 14 are provided inside the first positioning carrier 618. The two sliding grooves 14 are located on both sides of the air intake 12, and both sliding grooves 14 are connected to the air intake 12. Slide plates 15 are slidably installed in the two sliding grooves 14 of the first positioning carrier 618. The ends of the two slide plates 15 away from the air intake 12 extend out of the first positioning carrier 618, and clamping plates 17 are fixedly installed at the ends of the two slide plates 15 that are far apart from each other.

[0056] Reference Figure 15 Each slide plate 15 has a stop block 45 fixedly installed on both sides of its width direction. The first positioning carrier 618 has a moving groove 46 on both sides of each slide plate 15 in its width direction, and the stop block 45 is slidably installed in the moving groove 46. An elastic element 16 is installed in each moving groove 46 of the first positioning carrier 618. The elastic element 16 is located on the side of the stop block 45 near the air intake 12. In this application, the elastic element 16 can be a spring.

[0057] Reference Figure 13 and Figure 16 The top of the air intake 12 is tapered with a gradually decreasing diameter. A conical plug 18 is installed in the tapered area at the top of the air intake 12. Two transmission components 19 are installed in the first positioning carrier 618, which drive the slide plate 15 and the conical plug 18. When the slide plate 15 moves away from the air intake 12, the transmission component 19 drives the conical plug 18 to move upward, sealing the top of the air intake 12. When the slide plate 15 moves closer to the air intake 12, the transmission component 19 drives the conical plug 18 to move downward, releasing the sealing of the air intake 12.

[0058] Specifically, the transmission component 19 includes a drive rack 191, a gear 192, and a driven rack 193. The drive rack 191 is fixedly mounted on the top wall of the slide plate 15. The gear 192 is rotatably mounted in the first positioning carrier 618 and meshes with the drive rack 191. The driven rack 193 is slidably mounted in the first positioning carrier 618 along the radial direction of the cone plug 18 and meshes with the gear 192.

[0059] A slot 20 is formed on the bottom wall of the cone plug 18 along its diameter direction, and the ends of the two driven racks 193 that are close to each other are slidably inserted into the slot 20. The top of the ends of the two driven racks 193 that are close to each other are formed with a first chamfer 26, and the two ends of the cone plug 18 located in the slot 20 are formed with a second chamfer 27.

[0060] The implementation principle of Embodiment 2 of this application is as follows: When the air intake hole 12 is not performing an air intake operation, the elastic element 16 will push the slide plate 15 to move away from the air intake hole 12 through the stop block 45. The slide plate 15 drives the gear 192 to rotate through the drive rack 191. The gear 192 then drives the driven rack 193 to move and insert into the conical plug 18. Under the combined action of the first chamfer 26 and the second chamfer 27, the driven rack 193 drives the conical plug 18 to move upward, thereby sealing the air intake hole 12 (see reference). Figure 13 ).

[0061] When the transistor is transferred to the first positioning carrier 618, the suction port 12 starts to suction. Since the cone plug 18 is blocking the top of the suction port 12 at this time, the suction force of the suction port 12 acts on the slide groove 14, causing the slide plate 15 to move the clamping plate 17 towards the first positioning carrier 618. After the two clamping plates 17 move, they clamp and position the transistor on the first positioning carrier 618 to ensure the accuracy of the transistor's placement on the carrier.

[0062] When the slide plate 15 drives the clamping plate 17 to complete the clamping of the transistor, the slide plate 15 moves to the side closer to the air intake 12. The slide plate 15 drives the gear 192 to rotate through the drive rack 191. The gear 192 then drives the driven rack 193 to move away from the conical plug 18. Similarly, under the action of the first chamfer 26 and the second chamfer 27, the conical plug 18 moves downward under the action of gravity, thereby releasing the blockage of the air intake 12 (see reference). Figure 14 This allows the air intake 12 to adsorb and fix the transistor.

[0063] The above are merely optional embodiments of this disclosure and are not intended to limit this disclosure. Various modifications and variations can be made to this disclosure by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this disclosure should be included within the scope of protection of this disclosure.

Claims

1. A transistor electrical performance testing device, characterized in that: The device includes a base (1), on which a test track (38) is arranged vertically. A feeding mechanism (3) is arranged at the top of the test track (38) on the base (1) to transport the transistor into the test track (38). A test mechanism (2) is arranged on the side of the test track (38) on the base (1). A sorting and receiving mechanism (4) is arranged on the base (1). A first image detection component (5) for image detection of the first surface of the transistor is arranged at the bottom of the test track (38) on the base (1). A detection turret mechanism (6) connecting the discharge end of the test track (38) and the feed end of the sorting and receiving mechanism (4) is arranged on the base (1). The detection turret mechanism (6) is used for image detection of the other five surfaces of the transistor.

2. The transistor electrical performance testing device according to claim 1, characterized in that: The detection turret mechanism (6) includes a feeding component (61), a turntable (62), a second image detection component (63), a third image detection component (64), a discharging component (65), and multiple suction components (66). The feeding component (61) is mounted on the base (1) and connected to the discharge end of the test track (38). The discharging component (65) is mounted on the base (1) and connected to the inlet end of the sorting and receiving mechanism (4). The turntable (62) is rotatably mounted on the base (1) and located between the feeding component (61) and the discharging component (65). Above, multiple suction components (66) are arranged at intervals along the circumference of the turntable (62) on the turntable (62). The second image detection component (63) and the third image detection component (64) are both arranged on the base (1). The second image detection component (63) and the third image detection component (64) are located between the loading component (61) and the unloading component (65). The second image detection component (63) is used to perform image detection on three surfaces of the transistor, and the third image detection component (64) is used to perform image detection on two surfaces of the transistor.

3. The transistor electrical performance testing device according to claim 2, characterized in that: The feeding component (61) includes a first mounting frame (611), a feeding track (612), a lifting component (613), a pressure block (614), a first rotating component (615), a lever (616), a translation plate (617), and a first positioning carrier (618). The first mounting frame (611) is mounted on the base (1), the feeding track (612) is mounted on the first mounting frame (611), and the first end of the feeding track (612) is connected to the test track (38). The lifting component (613) is mounted on the feeding track. At the tail end of (612), the pressure block (614) is set at the lifting end of the lifting member (613), the first rotating member (615) is set on the first mounting frame (611), the lever (616) is set at the rotating end of the first rotating member (615), the translation plate (617) is slidably set on the first mounting frame (611), the translation plate (617) is provided with a groove (7), the lever (616) is slidably set in the groove (7), and the first positioning carrier (618) is set on the translation plate (617).

4. The transistor electrical performance testing device according to claim 2, characterized in that: The unloading component (65) includes a second mounting frame (651), an unloading track (652), a translation component (653), and a pusher (654). The second mounting frame (651) is mounted on the base (1). The unloading track (652) is mounted on the second mounting frame (651). The tail end of the unloading track (652) is connected to the sorting and receiving mechanism (4). The translation component (653) is mounted on the second mounting frame (651). The pusher (654) is mounted at the translation end of the translation component (653) and located at the head end of the unloading track (652).

5. The transistor electrical performance testing device according to claim 2, characterized in that: A reversing component (8) is provided on the base (1) between the loading component (61) and the second image detection component (63), and between the unloading component (65) and the third image detection component (64). The reversing component (8) includes a third mounting bracket (81), a second rotating component (82), and a second positioning carrier (83). The third mounting bracket (81) is mounted on the base (1), the second rotating component (82) is mounted on the third mounting bracket (81), and the second positioning carrier (83) is mounted on the rotating end of the second rotating component (82).

6. The transistor electrical performance testing device according to claim 5, characterized in that: A fixed plate (9) is fixedly installed on the base (1) above the turntable (62). The fixed plate (9) is located above the feeding component (61), the unloading component (65), the second image detection component (63) and the two reversing components (8), and a pressure rod (10) is slidably installed. The pressure rod (10) is located directly above the suction component (66). The suction component (66) is slidably installed in the turntable (62) in the vertical direction. The turntable (62) is provided with an elastic reset component (11) for driving the suction component (66) to move upward and reset.

7. The transistor electrical performance testing device according to claim 3, characterized in that: The first positioning carrier (618) has an air intake hole (12) and the translation plate (617) has an air intake channel (13). One end of the air intake channel (13) is connected to the air intake hole (12), and the other end of the air intake channel (13) is connected to the air intake device through a pipeline.

8. The transistor electrical performance testing device according to claim 7, characterized in that: The first positioning carrier (618) has sliding grooves (14) on both sides of the air intake (12) that communicate with the air intake (12). Sliding plates (15) are slidably mounted in both sliding grooves (14) of the first positioning carrier (618). An elastic element (16) is provided in the first positioning carrier (618) to push the sliding plates (15) away from the air intake (12). Clamping plates (17) are provided at opposite ends of the two sliding plates (15). The diameter of the top of the air intake (12) gradually decreases. The first positioning carrier (618) is located at the air intake (12)... A cone plug (18) is slidably provided on the top of 12). A transmission component (19) is provided inside the first positioning carrier (618). The transmission component (19) is connected to the slide plate (15) and the cone plug (18). When the slide plate (15) moves away from the air intake hole (12), the slide plate (15) drives the cone plug (18) to move and block the top of the air intake hole (12) through the transmission component (19). When the slide plate (15) moves closer to the air intake hole (12), the slide plate (15) drives the cone plug (18) to release the blockage of the air intake hole (12) through the transmission component (19).

9. A transistor electrical performance testing device according to claim 8, characterized in that: The transmission component (19) includes a drive rack (191), a gear (192), and a driven rack (193). The drive rack (191) is fixedly mounted on the slide plate (15). The gear (192) is rotatably mounted in the first positioning carrier (618). The driven rack (193) is slidably mounted in the first positioning carrier (618). The gear (192) meshes with the drive rack (191) and the driven rack (193). The top of the driven rack (193) near the cone plug (18) has a first chamfer (26). The side wall of the cone plug (18) has a slot (20). The end of the driven rack (193) is slidably inserted into the slot (20). The cone plug (18) in the slot (20) near the driven rack (193) has a second chamfer (27).

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