Double-pulse automatic testing device

Abstract

The utility model relates to the technical field of automobile testing, in particular to a double-pulse automatic testing device which comprises a shell provided with a containing cavity, an opening is formed in the shell, and a cover plate capable of being opened and closed is arranged at the opening; a signal generator, a tested device and an oscilloscope which are electrically connected in sequence are arranged in the accommodating chamber; the door lock module is used for locking the cover plate when the cover plate is closed; the high-voltage control module is electrically connected with the high-voltage power supply, the high-voltage power supply end of the tested device, the door lock module and the output end of the signal generator, and is used for connecting the high-voltage power supply and the tested device when the door lock module is locked and disconnecting the high-voltage power supply and the tested device after a double-pulse signal is output; the discharging module is electrically connected with the high-voltage control module and the high-voltage power supply end of the tested device and is used for releasing the high-voltage power supply after the high-voltage power supply is disconnected; and the door lock module is electrically connected with the high-voltage power supply end of the tested device and is used for unlocking the cover plate after the high-voltage power supply is released. By adopting the device, the test safety can be improved.

Description

Technical Field

[0001] This application relates to the technical field of automotive testing, and particularly to a dual-pulse automatic testing device. Background Art

[0002] In a motor controller or an inverter system, in order to ensure the switching stability, switching loss, operating boundary of power devices in the system, and the matching degree between power devices and other components of the system, it is usually necessary to perform a dual-pulse test before bench testing. In the dual-pulse test, it is necessary to extract the voltage characteristics and current characteristics of the power device when the dual-pulse signal is turned on and off respectively, for evaluating whether the power device meets the system design objectives.

[0003] Currently, existing dual-pulse testing devices generally include a signal generator, a high-voltage power supply, a low-voltage power supply, etc. The high-voltage power supply can reach even exceed 800V, which requires high operation standardization for testers. If the tester does not operate strictly in accordance with the specifications due to reasons such as work experience, work habits, or work status, an electric shock accident may occur. Utility Model Content

[0004] Based on this, a dual-pulse automatic testing device is provided to reduce the possibility of electric shock accidents in the prior art.

[0005] In a first aspect, a dual-pulse automatic testing device is provided. The device includes:

[0006] A housing having an accommodation chamber, the housing is provided with an opening for feeding a device under test into the accommodation chamber, and a lid that can be opened and closed is provided at the opening;

[0007] In the accommodation chamber, there is provided:

[0008] A signal generator, the device under test, and an oscilloscope that are electrically connected in sequence through an input end and an output end. The signal generator is used to generate a dual-pulse signal according to the received test parameters and send the dual-pulse signal to the device under test; the oscilloscope is used to generate a test result according to the response of the device under test to the dual-pulse signal;

[0009] A door lock module for locking the lid when the lid is closed;

[0010] A high-voltage control module is electrically connected to the high-voltage power supply, the high-voltage power supply terminal of the device under test, the door lock module, and the output end of the signal generator. It is used to connect the high-voltage power supply and the high-voltage power supply terminal of the device under test when the door lock module locks, and to disconnect the high-voltage power supply and the high-voltage power supply terminal of the device under test after the signal generator outputs the dual-pulse signal;

[0011] The discharge module is electrically connected to the high-voltage control module and the high-voltage power supply terminal of the device under test, and is used to release the high-voltage power supply after the high-voltage power supply and the high-voltage power supply terminal of the device under test are disconnected.

[0012] The door lock module is electrically connected to the high-voltage power supply terminal of the device under test, and is further used to unlock the cover plate after the discharge module releases the high-voltage power supply.

[0013] Combined with the first aspect, in the first possible implementation manner of the first aspect, the door lock module includes:

[0014] A door and window sensor, the detection end of the door and window sensor is used to detect whether the cover plate is closed;

[0015] An electronic lock, the input end of the electronic lock is electrically connected to the output end of the door and window sensor, and the electronic lock is used to lock the cover plate when the door and window sensor detects that the cover plate is closed.

[0016] Combined with the first possible implementation manner of the first aspect, in the second possible implementation manner of the first aspect, the door lock module further includes:

[0017] A voltage tester, the detection end of the voltage tester is electrically connected to the high-voltage power supply terminal of the device under test, and is used to detect the voltage of the high-voltage power supply terminal of the device under test;

[0018] A first comparator, the input end of the first comparator is electrically connected to the output end of the voltage tester, the output end of the first comparator is electrically connected to the input end of the electronic lock, and the first comparator is used to compare the voltage of the high-voltage power supply terminal of the device under test with a preset minimum voltage threshold to obtain a first comparison result, and send the first comparison result to the electronic lock;

[0019] The electronic lock is further used to unlock the cover plate when the first comparison result is that the voltage of the high-voltage power supply terminal of the device under test is less than or equal to the minimum voltage threshold, and keep the cover plate locked when the first comparison result is that the voltage of the high-voltage power supply terminal of the device under test is greater than the minimum voltage threshold.

[0020] Combined with the first aspect, in the third possible implementation manner of the first aspect, the high-voltage control module includes:

[0021] A logic analyzer, the detection end of the logic analyzer is electrically connected to the output end of the signal generator, and is used to detect whether the double-pulse signal is output at the output end of the signal generator;

[0022] A microcontroller, the input end of the microcontroller is electrically connected to the output end of the door lock module and the output end of the logic analyzer. The output end of the door lock module is used to output a locking signal or an unlocking signal. The microcontroller is used to generate a first excitation signal when the door lock module outputs the locking signal, and output a second excitation signal when the logic analyzer detects that the output end of the signal generator generates the double-pulse signal;

[0023] A first switch, the common end of the first switch is used to connect to the high-voltage power supply, the normally open end of the first switch is electrically connected to the high-voltage power supply end of the device under test, and the control end of the first switch is electrically connected to the first output end of the microcontroller, and is used to conduct when the microcontroller outputs the first excitation signal and disconnect when the microcontroller outputs the second excitation signal.

[0024] Combined with the third implementable manner of the first aspect, in the fourth implementable manner of the first aspect, the discharge module includes:

[0025] A second switch, the common end of the second switch is electrically connected to the high-voltage power supply end of the device under test, the second switch is electrically connected to the input end of the discharger, and the control end of the second switch is electrically connected to the second output end of the microcontroller. The second switch is used to disconnect when the microcontroller outputs the first excitation signal and conduct when the microcontroller outputs the second excitation signal;

[0026] A discharger, which is used to release the high-voltage power supply when the second switch conducts.

[0027] Combined with the first aspect, in the fifth implementable manner of the first aspect, the device further includes a host computer module, and the host computer module includes:

[0028] A host computer, which is installed in a computer device and is used for a tester to remotely input the test parameters;

[0029] A host computer communication unit disposed in the accommodation chamber, the input end of the host computer communication unit communicates remotely with the output end of the host computer, the output end of the host computer is electrically connected to the input end of the signal generator, and the host computer is used to receive the test parameters from the host computer and send the test parameters to the signal generator.

[0030] Combined with the fifth implementable manner of the first aspect, in the sixth implementable manner of the first aspect, an interaction interface is further provided on the housing, the input end of the interaction interface is used for a tester to input the test parameters on site, and the output end of the interaction interface is electrically connected to the input end of the signal generator and is used to send the test parameters to the signal generator.

[0031] Combined with the second implementable manner of the first aspect, in the seventh implementable manner of the first aspect, the device further includes a status indication module disposed in the accommodation chamber, and the status indication module includes:

[0032] A second comparator, the input end of the second comparator is electrically connected to the output end of the voltage tester, and the second comparator is configured to compare the voltage of the high-voltage power supply terminal of the device under test detected by the voltage tester with a preset first voltage threshold and a second voltage threshold to obtain a second comparison result;

[0033] An audible and visual alarm, the input end of the audible and visual alarm is electrically connected to the output end of the door and window sensor and the output end of the second comparator, and the audible and visual alarm is configured to emit an alarm sound and alarm light when the door and window sensor detects that the cover plate is not closed, and / or emit an alarm sound and alarm light when the second comparison result indicates that the voltage of the high-voltage power supply terminal of the device under test is not between the first voltage threshold and the second voltage threshold.

[0034] Combined with the sixth implementable manner of the first aspect, in the eighth implementable manner of the first aspect, the device further includes a configurable low-voltage power supply module disposed in the accommodation chamber, the input end of the configurable low-voltage power supply module is electrically connected to the output end of the upper computer communication unit and the output end of the interaction interface, the output end of the configurable low-voltage power supply module is electrically connected to the low-voltage power supply terminal of the device under test, and the configurable low-voltage power supply module is configured to provide a corresponding low-voltage power supply for the device under test according to the low-voltage configuration parameters sent by the upper computer module or the interaction interface.

[0035] Combined with the first aspect, in the ninth implementable manner of the first aspect, a high-voltage power supply interface for connecting the high-voltage power supply to the device under test and a low-voltage power supply interface for connecting the low-voltage power supply to the signal generator are further provided on the housing.

[0036] The above-mentioned dual-pulse automatic test device includes a housing with a receiving chamber and a signal generator, an oscilloscope, a door lock module, a high-voltage control module, and a discharge module disposed in the receiving chamber. Among them, an opening for the device under test to be sent into the receiving chamber is provided on the housing, and a cover plate that can be opened and closed is also provided at the opening. Open the cover plate, send the device under test into the receiving chamber through the opening on the housing, electrically connect the signal generator, the device under test, and the oscilloscope in sequence, and electrically connect the high-voltage power supply terminal of the device under test to the high-voltage power supply and the discharge module. After the installation of the device under test is completed, close the cover plate, and the door lock module is used to automatically lock the cover plate after detecting that the cover plate is closed. The high-voltage control module is electrically connected to the high-voltage power supply, the high-voltage power supply terminal of the device under test, the door lock module, and the output terminal of the signal generator, and is used to connect the high-voltage power supply and the high-voltage power supply terminal of the device under test when the door lock module locks. By sending test parameters, the signal generator is used to generate a dual-pulse signal according to the received test parameters and send the dual-pulse signal to the device under test, and the oscilloscope is used to generate a test result according to the response of the device under test to the dual-pulse signal. The high-voltage control module is also used to disconnect the high-voltage power supply and the high-voltage power supply terminal of the device under test after the signal generator outputs the dual-pulse signal. The discharge module is electrically connected to the high-voltage control module and the high-voltage power supply terminal of the device under test, and is used to release the high voltage at the high-voltage power supply terminal of the device under test after the high-voltage power supply and the high-voltage power supply terminal of the device under test are disconnected, so that the voltage at the high-voltage power supply terminal of the device under test drops to a safe range. The door lock module is also electrically connected to the high-voltage power supply terminal of the device under test, and is used to automatically unlock the cover plate when the voltage at the high-voltage power supply terminal of the device under test is released. At this time, the tester can open the device to touch the device in the receiving chamber. It can be seen that through the dual-pulse automatic test device of the present application, when the high-voltage power supply is connected, the cover plate is automatically locked, and the tester cannot open the cover plate to touch any device until the high voltage drops to a safe range and then it is automatically unlocked, reducing the possibility of electric shock accidents caused by the tester not operating strictly in accordance with the specifications due to work experience, work habits, work status, etc., and improving the operation safety. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 is a structural block diagram of a dual-pulse automatic test device in an embodiment;

[0038] Figure 2 is a structural block diagram of a dual-pulse automatic test device in an embodiment.

[0039] The reference numerals are as follows: 1, housing; 11, receiving chamber; 12, high-voltage power supply interface; 13, low-voltage power supply interface; 2, door lock module; 3, high-voltage control module; 4, discharge module; 5, host computer module; 6, status indication module. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0040] In order to make the objectives, technical solutions and advantages of the present application more clear and understandable, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0041] It should be noted that the diagrams provided in this embodiment only illustrate the basic concept of the present utility model in a schematic manner. Therefore, only the components related to the present utility model are shown in the diagrams, rather than being drawn according to the number, shape and size of the components in actual implementation. The type, quantity and proportion of each component in actual implementation can be arbitrarily changed, and the layout type of its components may also be more complex.

[0042] The structures, proportions, sizes, etc. shown in the drawings of this specification are only used to cooperate with the content disclosed in the specification for those familiar with this technology to understand and read, and are not used to limit the conditions under which the present utility model can be implemented. Therefore, they do not have technical substantial significance. Any modification of the structure, change of the proportional relationship or adjustment of the size, without affecting the effects that the present utility model can produce and the objectives that can be achieved, should still fall within the scope that can be covered by the technical content disclosed by the present utility model.

[0043] The orientation or positional relationship indicated by terms such as "upper", "lower", "left", "right", "middle", "longitudinal", "transverse", "horizontal", "inner", "outer", "radial", "circumferential", etc. cited in this specification is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of simplified description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it cannot be understood as a limitation of the present utility model. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0044] Existing dual-pulse test devices generally include a signal generator, a high-voltage power supply, a low-voltage power supply, etc. The high-voltage power supply can reach even exceed 800V. When the tester fails to operate strictly in accordance with the specifications due to reasons such as work experience, work habits or work status, an electric shock accident may occur.

[0045] To this end, the present application provides a dual-pulse automatic test device, which includes a housing having a receiving chamber, a signal generator, an oscilloscope, a door lock module, a high-voltage control module, and a discharge module disposed in the receiving chamber. An opening for the device under test to be fed into the receiving chamber is provided on the housing, and a cover plate that can be opened and closed is provided at the opening. After the device under test is fed into the receiving chamber, the signal generator, the device under test, and the oscilloscope are electrically connected in sequence, and the high-voltage power supply terminal of the device under test is electrically connected to the high-voltage control module, the door lock module, and the discharge module. After the installation of the device under test is completed, the cover plate is closed. The door lock module is used to automatically lock the cover plate after detecting that the cover plate is closed and trigger the high-voltage control module to connect the high-voltage power supply to the device under test. After that, the tester cannot open the cover plate to touch any device until the dual-pulse signal output is completed. The high-voltage control module is used to disconnect the high-voltage power supply from the device under test, and the discharge module is used to release the high-voltage power supply after disconnecting the high-voltage power supply. The door lock module is used to automatically unlock after the discharge module completes the discharge. It can be seen that the present application can reduce the possibility of electric shock accidents caused by the tester not operating strictly in accordance with the specifications for various reasons and improve the operation safety.

[0046] Next, the dual-pulse automatic test device of the present application will be described in detail through the following embodiments.

[0047] Combined with Figure 1 The structural block diagram of the dual-pulse automatic test device shown, in one embodiment, provides a dual-pulse automatic test device, including:

[0048] A housing 1 having a receiving chamber 11, an opening for the device under test to be fed into the receiving chamber 11 is provided on the housing 1, and a cover plate that can be opened and closed is provided at the opening;

[0049] Disposed in the receiving chamber 11 are:

[0050] A signal generator, the device under test, and an oscilloscope electrically connected in sequence through an input end and an output end. The signal generator is used to generate a dual-pulse signal according to the received test parameters and send the dual-pulse signal to the device under test; the oscilloscope is used to generate a test result according to the response of the device under test to the dual-pulse signal;

[0051] A door lock module 2, used to lock the cover plate when the cover plate is closed;

[0052] A high-voltage control module 3, electrically connected to a high-voltage power supply, the high-voltage power supply terminal of the device under test, the door lock module 2, and the output end of the signal generator, used to connect the high-voltage power supply and the high-voltage power supply terminal of the device under test when the door lock module 2 is locked, and disconnect the high-voltage power supply and the high-voltage power supply terminal of the device under test after the signal generator outputs the dual-pulse signal;

[0053] The discharge module 4 is electrically connected to the high-voltage control module 3 and the high-voltage power supply terminal of the device under test, and is used to release the high-voltage power supply after the high-voltage power supply and the high-voltage power supply terminal of the device under test are disconnected.

[0054] The door lock module 2 is electrically connected to the high-voltage power supply terminal of the device under test, and is further used to unlock the cover plate after the discharge module 4 releases the high-voltage power supply.

[0055] Exemplarily, the device under test is a power device in a motor controller or an inverter system.

[0056] Optionally, the housing 1 can be made of insulating material to further avoid the occurrence of electric shock accidents; the opening and closing mode of the cover plate can be set to slide to save space, or set to push-pull for simple installation.

[0057] It should be noted that the opening of the housing 1 can be set at any position of the housing except the bottom surface, and the position of the cover plate corresponds to the position of the opening. Figure 1 and Figure 2 are the structural block diagrams of the double-pulse automatic test device. Therefore, the opening of the housing and the cover plate are not shown in Figure 1 and Figure 2 is shown.

[0058] Specifically, as shown in Figure 2 The door lock module 2 includes a door and window sensor and an electronic lock, where: the detection end of the door and window sensor is used to detect whether the cover plate is closed; the input end of the electronic lock is electrically connected to the output end of the door and window sensor, and the electronic lock is used to lock the cover plate when the output end of the door and window sensor detects that the cover plate is closed.

[0059] Among them, the door and window sensor includes a fixed sensor and a magnet. The fixed sensor is installed on the inner wall of the opening of the housing 1 using screws or adhesive tapes, and the magnet is installed on the cover plate. When the cover plate is closed, the fixed sensor and the magnet should be aligned to ensure that the fixed sensor can accurately detect the opening and closing of the cover plate and ensure that the communication line between the output end of the fixed sensor and the input end of the electronic lock is connected. During use, after the device under test is installed, the cover plate is closed, and the door and window sensor detects that the cover plate is closed, triggering the electronic lock to automatically lock.

[0060] Further, as shown in Figure 2The description is made as shown. The door lock module 2 further includes a voltage tester and a first comparator, where: the detection end of the voltage tester is electrically connected to the high-voltage power supply end of the device under test for detecting the voltage of the high-voltage power supply end of the device under test; the input end of the first comparator is electrically connected to the output end of the voltage tester, the output end of the first comparator is electrically connected to the input end of the electronic lock, and the first comparator is used to compare the voltage of the high-voltage power supply end of the device under test with a preset minimum voltage threshold to obtain a first comparison result and send the first comparison result to the electronic lock; the electronic lock is further used to unlock the cover plate when the first comparison result is that the voltage of the high-voltage power supply end of the device under test is less than or equal to the minimum voltage threshold, and keep the cover plate locked when the first comparison result is that the voltage of the high-voltage power supply end of the device under test is greater than the minimum voltage threshold.

[0061] After the device under test is installed through the door lock module 2, the cover plate is closed. The door and window sensor detects that the cover plate is closed and triggers the electronic lock to lock automatically. During the test, the tester cannot open the cover plate to touch any device. It is not until after the test that when the high voltage at the high-voltage power supply end of the device under test drops to a safe value, it is automatically unlocked. After that, the tester can open the cover plate, reducing the possibility of safety accidents caused by the tester not operating strictly in accordance with the specifications for various reasons and improving the safety of the test.

[0062] Combined Figure 2 The description is made as shown. The high-voltage control module 3 includes a logic analyzer, a microcontroller and a first switch, where: the detection end of the logic analyzer is electrically connected to the output end of the signal generator for detecting whether the output end of the signal generator outputs the double-pulse signal; the input end of the microcontroller is electrically connected to the output end of the door lock module 2 and the output end of the logic analyzer. The output end of the door lock module 2 is used to output a locking signal or an unlocking signal. The microcontroller is used to output a first excitation signal when the door lock module 2 outputs the locking signal and output a second excitation signal when the logic analyzer detects that the output end of the signal generator outputs the double-pulse signal; the common end of the first switch is used to connect to the high-voltage power supply, the normally open end of the first switch is electrically connected to the high-voltage power supply end of the device under test, and the control end of the first switch is electrically connected to the first output end of the microcontroller. The first switch is used to conduct when the microcontroller outputs the first excitation signal and disconnect when the microcontroller outputs the second excitation signal, realizing the automatic connection and disconnection between the high-voltage power supply and the high-voltage power supply end of the device under test.

[0063] Optionally, a timer can be set between the output terminal of the logic analyzer and the input terminal of the microcontroller, and a preset duration is set for the timer. The timer is used to start timing after the logic analyzer detects that the output terminal of the signal generator outputs a double-pulse signal. When the timing duration reaches the preset duration, the microcontroller is triggered to generate a second pulse signal, so that the first switch disconnects the high-voltage power supply at least after a delay of the preset duration after the signal generator outputs the double-pulse signal, avoiding test interruption.

[0064] Specifically, with reference to Figure 2 shown in the figure, a high-voltage power supply interface 12 is further provided on the housing 1. The input end of the high-voltage power supply interface 12 is connected to the high-voltage power supply, and the output end of the high-voltage power supply interface 12 is electrically connected to the common terminal of the first switch. The normally open end of the first switch is electrically connected to the high-voltage power supply terminal of the device under test, and the control end of the first switch is electrically connected to the first output end of the microcontroller. The control end of the first switch makes the common terminal and the normally open end conduct or disconnect according to the excitation signal output by the microcontroller.

[0065] Exemplarily, the first switch is a relay. The common terminal of the relay is electrically connected to the output end of the high-voltage power supply interface 12, the normally open end of the relay is electrically connected to the high-voltage power supply terminal of the device under test, and the control end of the relay is electrically connected to the first output end of the microcontroller; the input end of the microcontroller is electrically connected to the output end of the electronic lock of the locking module, and the output end of the electronic lock is used to output a locking signal or an unlocking signal. When the electronic lock sends a locking signal to the microcontroller through its output end, the microcontroller generates a first excitation signal and sends the first excitation signal to the control end of the relay. At this time, the common terminal and the normally open end of the relay conduct, so as to realize the power supply of the high-voltage power supply to the device under test; when the logic analyzer detects that the output terminal of the signal generator outputs a double-pulse signal, the microcontroller generates a second excitation signal and sends the second excitation signal to the control end of the relay. At this time, the common terminal and the normally open end of the relay disconnect, so as to stop the high-voltage power supply from supplying power to the device under test.

[0066] Specifically, with reference to Figure 2 shown in the figure, the discharge module 4 includes a second switch and a discharger, where: the common terminal of the second switch is electrically connected to the high-voltage power supply terminal of the device under test, the second switch is electrically connected to the input end of the discharger, the control end of the second switch is electrically connected to the second output end of the microcontroller, and the second switch is used to disconnect when the microcontroller outputs the first excitation signal and conduct when the microcontroller outputs the second excitation signal; the discharger is used to release the high-voltage power supply when the second switch conducts.

[0067] Exemplary illustration: The second switch uses a relay. The common terminal of the relay is electrically connected to the high-voltage power supply terminal of the device under test. The normally open terminal of the relay is electrically connected to the input terminal of the discharger. The control terminal of the relay is electrically connected to the second output terminal of the microcontroller. When the microcontroller generates a first excitation signal and sends the first excitation signal to the control terminal of the relay, the connection between the common terminal and the normally open terminal of the relay is disconnected, and no discharge is required. When the microcontroller generates a second excitation signal and sends the second excitation signal to the control terminal of the relay, the connection between the common terminal and the normally open terminal of the relay is conducted, and at this time, the discharger starts to discharge. At the same time, the voltage tester continuously detects the voltage value of the high-voltage power supply terminal of the device under test and sends the detected voltage value to the first comparator. The first comparator compares the detected voltage value with a preset minimum voltage threshold to obtain a first comparison result and sends the first comparison result to the input terminal of the electronic lock. When the first comparison result indicates that the detected voltage value is lower than the minimum voltage threshold, the electronic lock is automatically unlocked; otherwise, the electronic lock remains locked, effectively preventing testers from accidentally touching it and causing electric shock accidents due to various reasons not following the specifications during operation.

[0068] In combination with Figure 2 As shown in the figure, for the convenience of sending test parameters to the signal generator, the device further includes a host computer module 5. The host computer module 5 includes a host computer and a host computer communication unit, where: The host computer is installed in the user's computer device and is used for testers to remotely input the test parameters. The host computer communication unit is arranged in the accommodation chamber 11. The input terminal of the host computer communication unit communicates remotely with the output terminal of the host computer. The output terminal of the host computer is electrically connected to the input terminal of the signal generator and is used for receiving the test parameters and sending the test parameters to the signal generator. Exemplarily, the host computer communication unit is a switch.

[0069] Optionally, the output terminal of the oscilloscope is electrically connected to the input terminal of the host computer communication unit, and is used for transmitting the test result to the host computer through the host computer communication unit for testers to remotely view the test result of the device under test.

[0070] Furthermore, an interaction interface is further provided on the housing 1. The interaction interface is electrically connected to the input terminal of the signal generator. The input terminal of the interaction interface is used for testers to input the test parameters on-site. The output terminal of the interaction interface is electrically connected to the input terminal of the signal generator and is used for sending the test parameters to the signal generator. The input terminal of the interaction interface can be set as a button or a touch screen required for inputting test parameters for testers to input the test parameters on-site.

[0071] In use, testers can remotely send test parameters through the host computer to remotely start the test, or input test parameters on-site through the interaction interface. Among them, the test parameters include the pulse width and period of a single pulse signal, as well as the interval duration or relative position between double pulse signals. The signal generator can adopt a double pulse signal generator. When the input end of the signal generator receives the test parameters, corresponding double pulse signals are generated according to the test parameters.

[0072] As shown in combination with Figure 2 For illustration, a low-voltage power supply interface 13 for connecting a low-voltage power supply to the signal generator is further provided on the housing 1. The input end of the low-voltage power supply interface 13 is connected to the low-voltage power supply, and the output end of the low-voltage power supply interface 13 is electrically connected to the power supply end of the signal generator, so as to realize the power supply of the low-voltage power supply to the signal generator; the device further includes a configurable low-voltage power supply module disposed in the accommodation chamber 11. The input end of the configurable low-voltage power supply module is electrically connected to the output end of the host computer communication unit and the output end of the interaction interface. The output end of the configurable low-voltage power supply module is electrically connected to the low-voltage power supply end of the device under test. The configurable low-voltage power supply module is used to provide a corresponding low voltage for the device under test according to the low-voltage configuration parameters sent by the host computer module 5 or the interaction interface.

[0073] Optionally, as shown in combination with Figure 2 For illustration, the device further includes a status indication module 6 disposed in the accommodation chamber 11. The status indication module 6 includes a second comparator and an audible and visual alarm. Among them: the input end of the second comparator is electrically connected to the output end of the voltage tester. The second comparator is used to compare the voltage of the high-voltage power supply end of the device under test detected by the voltage tester with a preset first voltage threshold and a second voltage threshold to obtain a second comparison result; the input end of the audible and visual alarm is electrically connected to the output end of the door and window sensor and the output end of the second comparator. The audible and visual alarm is used to emit an alarm sound and alarm light when the door and window sensor detects that the cover plate is not closed, and / or emit an alarm sound and alarm light when the second comparison result is that the voltage of the high-voltage power supply end of the device under test is not between the first voltage threshold and the second voltage threshold.

[0074] Optionally, a third switch and a microcontroller are provided between the output end of the signal generator and the input end of the device under test. The third switch is a relay. The input end of the microcontroller is electrically connected to the output end of the second comparator, and the output end of the microcontroller is electrically connected to the control end of the third switch. The common end of the third switch is electrically connected to the output end of the signal generator, and the normally closed end of the third switch is electrically connected to the input end of the device under test. The microcontroller is configured to generate a third excitation signal when the second comparison result output by the second comparator indicates that the voltage of the high-voltage power supply terminal of the device under test is not between the first voltage threshold and the second voltage threshold, and send the third excitation signal to the control end of the third switch. At this time, the connection between the common end and the normally closed end of the third switch is disconnected, and the double-pulse test is aborted. After adjusting the high-voltage power supply, the test is restarted. The microcontroller is further configured to generate a fourth excitation signal when the second comparison result output by the second comparator indicates that the voltage of the high-voltage power supply terminal is between the first voltage threshold and the second voltage threshold, and send the fourth excitation signal to the control end of the third switch. At this time, the common end and the normally closed end of the third switch are electrically connected, and the signal generator sends the double-pulse signal to the device under test.

[0075] Optionally, the status indication module 6 may further include a display screen for displaying the test status. The display screen is mounted on the housing 1, and the input end of the display screen is electrically connected to the output end of the electronic lock. When the electronic lock outputs a locking signal, it indicates that the double-pulse automatic test device is performing a test, and words such as "testing" or "in test" are displayed on the display screen. When the electronic lock outputs an unlocking signal, it indicates that the double-pulse automatic test device has completed the test, and words such as "test ended" or "test completed" are displayed on the display screen. When the double-pulse automatic test device is not running, the display screen is in the off state to inform the tester of the operating state of the test device.

[0076] The method for performing a double-pulse test on a device under test using the above double-pulse automatic test device includes the following steps:

[0077] Install the device under test: Open the cover plate and insert the device under test into the accommodation chamber 11 through the opening. Electrically connect the high-voltage power supply terminal of the device under test to the normally open end of the first switch, the common end of the second switch, and the detection end of the voltage tester. Electrically connect the low-voltage power supply terminal of the device under test to the output end of the configurable low-voltage power supply module. Electrically connect the input end of the device under test to the output end of the signal generator. Electrically connect the output end of the device under test to the detection end of the oscilloscope.

[0078] Close the cover plate and lock it: After installing the device under test, close the cover plate. The door and window sensor detects whether the cover plate is closed. If the cover plate is closed, the electronic lock is automatically locked, and "testing" is displayed on the display screen. If the cover plate is not closed, the sound and light alarm is triggered.

[0079] Power on: Connect the high-voltage power supply to the high-voltage power supply interface 12. The microcontroller generates a first excitation signal according to the locking signal of the electronic lock. At this time, the first switch is turned on and the second switch is turned off, connecting the high-voltage power supply to the device under test. At the same time, the voltage tester measures the high voltage, and the second comparator determines whether the high voltage is within the preset range. If it is not within the preset range, the microcontroller generates a third excitation signal, triggering the third switch to turn off, disconnecting the signal generator and the device under test, and triggering the audible and visual alarm. If it is within the preset range, the third switch is triggered to turn on, connecting the signal generator and the device under test. The tester sends low-voltage configuration parameters to the configurable low-voltage power supply module through the interaction interface or switch. The configurable low-voltage power supply module provides the corresponding low voltage to the device under test according to the low-voltage configuration parameters. Connect the low-voltage power supply to the low-voltage power supply interface 13 to provide low voltage to the signal generator.

[0080] Start testing: The tester sends test parameters to the signal generator through the interaction interface or switch, such as the pulse width and period of a single pulse signal, and the interval duration or relative position between double pulse signals. The signal generator configures the corresponding double pulse signal according to the received test parameters and sends the double pulse signal to the device under test. After receiving the double pulse signal, the device under test will respond, and the oscilloscope generates corresponding test results for the response of the device under test to the double pulse signal, such as characteristic parameters such as the current and voltage of the device under test.

[0081] End testing: When the logic analyzer detects the double pulse signal output by the signal generator, the timer starts timing. When the timing duration reaches the preset duration, the microcontroller outputs a second excitation signal. At this time, the first switch is turned off and the second switch is turned on, disconnecting the high-voltage power supply and the device under test, and releasing the high-voltage power supply through the discharger. At the same time, the voltage tester detects the voltage in real time. When the voltage drops below the preset minimum voltage threshold, the electronic lock is triggered to unlock automatically, and the display screen shows "Test Ended".

[0082] In summary, the double-pulse automatic testing device of the present application is automatically locked after the device under test is installed and the cover is closed. During the testing process, the tester cannot open the cover to touch any device until the high voltage drops to a safe range and then it is automatically unlocked, reducing the possibility of electric shock accidents caused by the tester not operating strictly in accordance with the specifications due to work experience, work habits, work status, etc., and improving the operation safety.

[0083] The dual-pulse automatic test device described in the above embodiments serves as the execution carrier of the circuit structure. Each module is configured as a component of the product, and the connections between the modules are configured as the determined connection relationships between the components of the product. The signal is collected, processed, and output through the components of the product to achieve the purpose of improving test safety. Exemplarily, whether the cover plate is closed is detected by a door and window sensor; the microprocessor can use various components that can implement adjustable signals, such as various single-chip microcomputers, FPGAs (Field-Programmable Gate Arrays), upper computers, or central processing units (CPUs, Central Processing Units). In this embodiment, the microcontroller can use single-chip microcomputers such as Arduino or STM32. The single-chip microcomputer has the advantages of high integration, strong control function, low power consumption, low voltage, high reliability, easy expansion, and fast operation speed. Various control functions can be realized by programming the single-chip microcomputer. For example, in this embodiment, the acquisition of the locking signal / unlocking signal of the electronic lock is realized, the first excitation signal is generated according to the locking signal, and the first switch is triggered to conduct and the second switch is disconnected through the first excitation signal, etc.

[0084] The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0085] The above-described embodiments only represent several implementation manners of the present application. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the utility model patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present application, several modifications and improvements can still be made, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the appended claims.

Claims

1. A dual-pulse automatic test device, characterized in that The device includes: A housing having an accommodation chamber, an opening for feeding a device under test into the accommodation chamber is provided on the housing, and a cover plate that can be opened and closed is provided at the opening; In the accommodation chamber, there is provided: A signal generator, the device under test, and an oscilloscope that are electrically connected in sequence through an input end and an output end. The signal generator is configured to generate a double-pulse signal according to received test parameters and send the double-pulse signal to the device under test; the oscilloscope is configured to generate a test result according to the response of the device under test to the double-pulse signal; A door lock module for locking the cover plate when the cover plate is closed; A high-voltage control module is electrically connected to a high-voltage power supply, a high-voltage power supply terminal of the device under test, the door lock module, and an output end of the signal generator. It is configured to connect the high-voltage power supply and the high-voltage power supply terminal of the device under test when the door lock module is locked, and to disconnect the high-voltage power supply and the high-voltage power supply terminal of the device under test after the signal generator outputs the double-pulse signal; A discharge module is electrically connected to the high-voltage control module and the high-voltage power supply terminal of the device under test, and is configured to release the high-voltage power supply after the high-voltage power supply and the high-voltage power supply terminal of the device under test are disconnected; The door lock module is electrically connected to the high-voltage power supply terminal of the device under test, and is further configured to unlock the cover plate after the discharge module releases the high-voltage power supply.

2. The dual-pulse automatic test device according to claim 1, wherein The door lock module includes: A door and window sensor, and a detection end of the door and window sensor is configured to detect whether the cover plate is closed; An electronic lock, an input end of the electronic lock is electrically connected to an output end of the door and window sensor, and the electronic lock is configured to lock the cover plate when the door and window sensor detects that the cover plate is closed.

3. The dual-pulse automatic test device according to claim 2, wherein The door lock module further includes: A voltage tester, a detection end of the voltage tester is electrically connected to the high-voltage power supply terminal of the device under test, and is configured to detect the voltage of the high-voltage power supply terminal of the device under test; A first comparator, an input end of the first comparator is electrically connected to an output end of the voltage tester, an output end of the first comparator is electrically connected to an input end of the electronic lock, and the first comparator is configured to compare the voltage of the high-voltage power supply terminal of the device under test with a preset minimum voltage threshold to obtain a first comparison result and send the first comparison result to the electronic lock; The electronic lock is further configured to unlock the cover plate when the first comparison result is that the voltage of the high-voltage power supply terminal of the device under test is less than or equal to the minimum voltage threshold, and to keep the cover plate locked when the first comparison result is that the voltage of the high-voltage power supply terminal of the device under test is greater than the minimum voltage threshold.

4. The dual-pulse automatic test device according to claim 1, wherein The high-voltage control module includes: A logic analyzer, a detection end of the logic analyzer is electrically connected to an output end of the signal generator, and is configured to detect whether the output end of the signal generator outputs the double-pulse signal; A microcontroller, the input end of the microcontroller is electrically connected to the output end of the door lock module and the output end of the logic analyzer. The output end of the door lock module is used to output a locking signal or an unlocking signal. The microcontroller is used to generate a first excitation signal when the door lock module outputs the locking signal, and output a second excitation signal when the logic analyzer detects that the output end of the signal generator generates the double-pulse signal; A first switch, the common end of the first switch is used to connect to the high-voltage power supply, the normally open end of the first switch is electrically connected to the high-voltage power supply end of the device under test, and the control end of the first switch is electrically connected to the first output end of the microcontroller, and is used to conduct when the microcontroller outputs the first excitation signal and disconnect when the microcontroller outputs the second excitation signal.

5. The dual-pulse automatic test device according to claim 4, characterized in that, The discharge module includes: A second switch, the common end of the second switch is electrically connected to the high-voltage power supply end of the device under test, the control end of the second switch is electrically connected to the second output end of the microcontroller, and the second switch is used to disconnect when the microcontroller outputs the first excitation signal and conduct when the microcontroller outputs the second excitation signal; A discharger, the input end of the discharger is electrically connected to the normally open end of the second switch, and the discharger is used to release the high-voltage power supply when the second switch conducts.

6. The dual-pulse automatic test device according to claim 1, characterized in that, The device further includes a host computer module, and the host computer module includes: A host computer, the host computer is installed in a computer device and is used for a tester to remotely input the test parameters; A host computer communication unit arranged in the accommodation chamber, the input end of the host computer communication unit communicates remotely with the output end of the host computer, the output end of the host computer is electrically connected to the input end of the signal generator, and the host computer is used to receive the test parameters from the host computer and send the test parameters to the signal generator.

7. The dual-pulse automatic test device according to claim 6, wherein, An interaction interface is further arranged on the outer shell, the input end of the interaction interface is used for a tester to input the test parameters on site, and the output end of the interaction interface is electrically connected to the input end of the signal generator and is used to send the test parameters to the signal generator.

8. The dual-pulse automatic test device according to claim 3, wherein, The device further includes a status indication module arranged in the accommodation chamber, and the status indication module includes: A second comparator, the input end of the second comparator is electrically connected to the output end of the voltage tester, and the second comparator is used to compare the voltage of the high-voltage power supply end of the device under test detected by the voltage tester with a preset first voltage threshold and a second voltage threshold to obtain a second comparison result; An audible and visual alarm, the input end of the audible and visual alarm is electrically connected to the output end of the door and window sensor and the output end of the second comparator, and the audible and visual alarm is used to emit an alarm sound and alarm light when the door and window sensor detects that the cover plate is not closed, and / or emit an alarm sound and alarm light when the second comparison result is that the voltage of the high-voltage power supply end of the device under test is not between the first voltage threshold and the second voltage threshold.

9. The dual-pulse automatic test device according to claim 7, characterized in that, The device further includes a configurable low-voltage power supply module disposed in the accommodation chamber. The input end of the configurable low-voltage power supply module is electrically connected to the output end of the host computer communication unit and the output end of the interaction interface. The output end of the configurable low-voltage power supply module is electrically connected to the low-voltage power supply end of the device under test. The configurable low-voltage power supply module is used to provide a corresponding low-voltage power supply for the device under test according to the low-voltage configuration parameters sent by the host computer module or the interaction interface.

10. The dual-pulse automatic test device according to claim 1, characterized in that, The housing is further provided with a high-voltage power supply interface for connecting the high-voltage power supply to the device under test and a low-voltage power supply interface for connecting the low-voltage power supply to the signal generator.

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