Multi-port microwave test tool

Abstract

The utility model relates to a multi-port microwave test tool, which comprises a support seat, a continuous feeding turntable supported on the support seat through a first lifting column, and a tester module suspended above the continuous feeding turntable supported on the support seat through a second lifting mechanism, the second lifting mechanism can be used for adjusting the working height of the tester module; detection clamping assemblies capable of adjustably positioning and clamping a plurality of microwave chips are annularly embedded in the top surface of the continuous feeding turntable at intervals. And a plurality of single testers of the tester module are arranged on a working surface limited by the second lifting mechanism in a manner that the single testers and the detection chips which are annularly positioned at intervals by the detection clamping assembly are arranged at the same interval. According to the utility model, various parameter tests can be continuously carried out on the microwave chip, so that the comprehensive detection effect is improved, and meanwhile, the labor cost and time cost for manually switching test instruments are reduced through cyclic continuous conveying.

Description

Technical Field

[0001] The utility model relates to the technical field of microwave measurement equipment, in particular to a multi-port microwave testing tool. Background Art

[0002] Microwave chips, components of microwave radio frequency integrated circuits (RFICs), are core technologies in wireless communications. After production, microwave chips require testing to ensure they function properly. Driven by the demand for next-generation communication technologies like 5G and low-orbit satellite communications, and accompanied by the rapid development and advancement of semiconductor manufacturing processes, the operating frequencies of related microwave components are gradually increasing, their functional integration continues to grow, and the number of test ports is increasing, leading to increasing test complexity.

[0003] When testing multi-port microwave chips, they must undergo multiple inspection processes and utilize a large number of staff and measuring instruments to test their eligibility. Multi-port microwave chips have many ports, requiring the use of multiple instruments to connect to different pins on the multi-port RF microwave chip to complete different parameter tests. Existing test switching operations typically require manual intervention, and multiple measuring instruments cannot simultaneously test microwave chips. After completing a single parameter test, the microwave chip must be manually transferred or the measuring instrument must be switched. The test connection terminal of the measuring instrument must then be manually connected to a different pin on the microwave chip to perform the next parameter test. This requires a significant amount of time to switch between connected microwave chips or testing instruments, resulting in significant time waste and low test efficiency, increasing the labor intensity and time costs of staff. Utility Model Content

[0004] The purpose of the utility model is to provide a multi-port microwave test tool that can continuously perform multiple parameter tests on microwave chips to improve the comprehensive detection effect, while reducing the labor cost and time cost of manually switching test instruments through continuous circulation transmission, so as to solve the problem that existing multi-port microwave chips require frequent manual replacement of detection instruments to complete different parameter tests, there are many switching operations and high labor costs, and independent switching operations will also increase the interval time, extend the total test time and reduce test efficiency.

[0005] The technical solution adopted by the present invention is: a multi-port microwave testing tool, comprising a support base capable of providing a supporting plane, a continuous feeding turntable supported on the support base by a first lifting column, and a tester module suspended above the continuous feeding turntable supported on the support base by a second lifting mechanism, wherein the second lifting mechanism is capable of adjusting the working height of the tester module; detection clamping assemblies for adjustably positioning and clamping multiple microwave chips are embedded in annularly spaced relation within the top surface of the continuous feeding turntable, and multiple single-item testers of the tester module are installed on the working surface defined by the second lifting mechanism in a manner that they are arranged at the same spacing as the detection chips positioned annularly spaced relation by the detection clamping assemblies.

[0006] According to a preferred embodiment, the detection clamping assembly includes a placement groove body, an elastic limiting mechanism and an auxiliary limiting plate, wherein a plurality of the placement groove bodies are circumferentially spaced and embedded in the continuous feeding turntable, and the elastic limiting mechanism that can adjustably position the microwave chip in the placement groove body is provided on the side of the placement groove body close to the axis of the continuous feeding turntable; the auxiliary limiting plate is coaxially embedded in the continuous feeding turntable in a manner capable of adjusting the working position of the elastic limiting mechanism.

[0007] According to a preferred embodiment, the strip trough body for accommodating the trough body is embedded on the top surface of the continuous feeding turntable in such a manner that its grooving direction coincides with the radial direction of the continuous feeding turntable; a supporting strip plate for supporting the microwave chip is arranged in the strip trough body in a manner parallel to its trough cavity; a wear-resistant pressure plate is also arranged on the radial outer side of the strip trough body away from the elastic limiting mechanism.

[0008] According to a preferred embodiment, the elastic limiting mechanism includes an embedded block, a limiting plug shaft, a limiting end plate, a limiting spring and a baffle, wherein:

[0009] The embedded block is embedded in the top surface of the continuous feeding turntable in a manner that its axial direction is parallel to the slotting direction of the strip trough body. The embedding block is provided with the limiting plug shaft that can be inserted into the strip trough body along the radial direction of the continuous feeding turntable, and the end of the limiting plug shaft inserted into the strip trough body is provided with a limiting end plate that can be adjusted to abut against the detection position of the microwave chip; the limiting spring and the blocking plate that cooperates with the embedding block to limit the sleeve position of the limiting spring are sleeved on the shaft of the limiting plug shaft.

[0010] According to a preferred embodiment, one end of the limiting plug shaft away from the limiting end plate is further connected to a sliding ball head capable of resting on the side ring surface of the auxiliary limiting plate.

[0011] According to a preferred embodiment, a notch arc groove for limiting the lateral displacement of the limiting plug shaft is opened on the side surface of the disc-shaped plate body of the auxiliary limiting plate; and a positioning blind hole is also opened on the bottom surface of the auxiliary limiting plate.

[0012] According to a preferred embodiment, the continuous feeding turntable includes a central plug shaft, an outer disk body, a rotating sleeve, a helical gear ring, a rotary drive motor and a helical gear, wherein the outer disk body is rotatably mounted on the central plug shaft, and the rotating sleeve is provided on the bottom surface of the outer disk body, and the helical gear ring is provided on the annular surface of the lower end of the tube body of the rotating sleeve; the rotary drive motor is also provided on the side surface of the central plug shaft, and the rotary output end of the rotary drive motor is also connected to the helical gear meshing with the helical gear ring.

[0013] According to a preferred embodiment, the central plug shaft is supported on the first lifting column, and a positioning plug block matching the positioning blind hole is provided at the axial upper end of the central plug shaft; a circular groove is provided at the center of the top surface of the outer disk body for coaxially mounting the auxiliary limit plate so that it can rotate around the auxiliary limit plate.

[0014] According to a preferred embodiment, the second lifting mechanism includes second lifting rods arranged at multiple points around the continuous feeding turntable and a fan ring plate supported by multiple second lifting rods.

[0015] According to a preferred embodiment, a plurality of the single-item testers are installed at intervals on the lower surface of the fan ring plate in a manner corresponding to the plurality of microwave chips clamped by the detection clamping assembly.

[0016] The beneficial effects of the utility model are:

[0017] The continuous feeding turntable provided in the present application can continuously convey the microwave chip that is adjustably clamped by the clamping assembly being tested, so that the multiple single-item testers provided by the tester module that is driven by the second lifting mechanism to reciprocate and rise and fall can respectively contact and connect with different pins of the microwave chips at different stations in a certain fan-shaped ring area and test different parameters of multiple microwave chips at the same time. After the microwave chip passes through the test stations of different single-item testers in turn, multiple parameter tests are completed in an orderly manner, thereby realizing continuous and synchronous multiple parameter tests of several microwave chips, greatly improving the efficiency and speed of microwave testing, realizing synchronous switching of multiple test chips, reducing the total time consumed in station switching or test instrument switching during parameter testing, reducing the labor intensity and time cost of staff, and improving comprehensive detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1This is a schematic structural diagram of an optimal multi-port microwave test fixture proposed by the present invention;

[0019] Figure 2 This is a schematic planar structural diagram of a detection clamping assembly of a preferred multi-port microwave test fixture proposed by the present invention;

[0020] Figure 3 It is a planar schematic diagram of a second lifting mechanism and a tester module of an optimal multi-port microwave test fixture proposed by the present invention.

[0021] Reference Signs List

[0022] 1: Support seat; 2: First lifting column; 3: Continuous feeding turntable; 4: Second lifting mechanism; 5: Tester module; 6: Detection clamping assembly; 31: Center plug shaft; 32: Outer disk; 33: Rotating sleeve; 34: Bevel gear ring; 35: Rotary drive motor; 36: Bevel gear; 41: Second lifting rod; 42: Fan ring plate; 51: Single tester; 52: Power supply; 61: Placement trough; 62: Elastic limiting mechanism; 63: Auxiliary limiting plate; 311: Positioning plug block; 321: Circular groove; 611: Strip trough; 612: Support strip plate; 613: Wear-resistant pressure plate; 621: Embedded block; 622: Limiting plug shaft; 623: Limiting end plate; 624: Limiting spring; 625: Baffle; 626: Sliding ball head; 631: Notched arc groove; 632: Positioning blind hole. DETAILED DESCRIPTION

[0023] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be briefly introduced below in combination with the drawings and the descriptions of the embodiments or the prior art. Obviously, the following descriptions of the structures of the drawings are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0024] The following will describe in detail the technical solutions provided by the present invention by way of examples with reference to the accompanying drawings. It should be noted that the description of these examples is intended to facilitate understanding of the present invention and does not constitute a limitation of the present invention. In some cases, some implementations are not described or are not described in detail because they belong to existing or conventional technologies.

[0025] In addition, the technical features described herein, or the steps of all methods or processes disclosed herein, except for mutually exclusive features and / or steps, can also be combined in any suitable manner in one or more embodiments. For those skilled in the art, it is easy to understand that the order of steps or operations of the methods related to the embodiments provided herein can also be changed. Any order in the drawings and embodiments is for illustrative purposes only and does not imply a requirement to follow a certain order unless it is explicitly stated that a certain order is required.

[0026] The serial numbers assigned to components herein, such as "first" and "second," are used solely to distinguish the objects being described and do not convey any sequential or technical meaning. References to "connection" and "coupling" in this application, where reasonable (and not self-contradictory), include both direct and indirect connections (couplings).

[0027] The following is a detailed description with reference to the accompanying drawings.

[0028] Example 1

[0029] The present application provides a multi-port microwave testing tool, which includes a support base 1, a first lifting column 2, a continuous feeding turntable 3, a second lifting mechanism 4, a tester module 5 and a detection clamping assembly 6.

[0030] according to Figure 1-3In a specific embodiment shown, the support base 1 is placed on the ground of the working area in a manner that provides a stable support platform for each component. A continuous feeding turntable 3 is supported on the support base 1 by a first lifting column 2. A tester module 5 suspended above the continuous feeding turntable 3 is also supported on the support base 1 by a second lifting mechanism 4. The second lifting mechanism 4 is capable of adjusting the working height of the tester module 5. Detection clamping assemblies 6 for adjusting the positioning and clamping of multiple microwave chips are embedded in the top surface of the continuous feeding turntable 3 at circumferential intervals. Multiple single-item testers 51 of the tester module 5 are installed on the working surface defined by the second lifting mechanism 4 along an arc at intervals in a manner that the same spacing is arranged as the detection chips circumferentially positioned by the detection clamping assembly 6. The continuous feeding turntable 3 provided in the present application can continuously convey the microwave chip that is adjustably clamped by the detection clamping component 6, so that the multiple single testers 51 provided by the tester module 5 that is driven by the second lifting mechanism 4 to perform reciprocating lifting can respectively contact and connect with different pins of the microwave chips at different stations in a certain fan-shaped ring area and test different parameters of multiple microwave chips at the same time, so that after the microwave chip passes through the test stations of different single testers 51 in turn, multiple parameter tests are completed in an orderly manner, thereby realizing continuous and synchronous multiple parameter tests of several microwave chips, greatly improving the efficiency and speed of microwave testing, realizing synchronous switching of multiple test chips, reducing the total time consumed in station switching or test instrument switching during parameter testing, reducing the labor intensity and time cost of staff, and improving comprehensive detection efficiency.

[0031] Preferably, the continuous feed turntable 3 includes a central insert shaft 31, an outer disc 32, a rotating sleeve 33, a helical gear ring 34, a rotary drive motor 35, and a helical gear 36. Preferably, the outer disc 32 is rotatably mounted on the central insert shaft 31. Preferably, the rotating sleeve 33 is rotatably mounted on the bottom surface of the outer disc 32. Preferably, the helical gear ring 34 is disposed on the annular surface of the lower end of the rotating sleeve 33. Preferably, a rotary drive motor 35 is also disposed on the side of the central insert shaft 31 below the rotating sleeve 33. More preferably, the rotary output end of the rotary drive motor 35 is connected to a helical gear 36 that meshes with the helical gear ring 34. Preferably, the central insert shaft 31 is supported on the first lifting column 2. More preferably, a positioning block 311 is disposed at the upper axial end of the central insert shaft 31, which mates with the positioning blind hole 632. Preferably, a circular groove 321 is provided at the center of the top surface of the outer disk body 32 for coaxially mounting the auxiliary limiting plate 63 so that it can rotate around the auxiliary limiting plate 63. Preferably, the rotary drive motor 35 is an intermittent deflection motor with an adjustable intermittent period, so that the placement slot body 61, the elastic limiting mechanism 62 and the microwave chip are continuously driven to deflect in a manner with a certain detection stagnation time interval so that multiple microwave chips can complete the station conversion at the same time, so that multiple microwave chips can complete the test of different parameters in sequence and synchronously. The central plug shaft 31 provided in the present application can locate the working position and working state of the auxiliary limiting plate 63, so that when the placement slot body 61 and the elastic limiting mechanism 62 rotate with the outer disk body 32, the auxiliary limiting plate 63 can adjust the working position of the elastic limiting mechanism 62 according to the change in relative position, so that it can clamp and position the microwave chip only within a certain range. The rotary drive motor 35 arranged on the side wall of the central plug shaft 31 of the present application can drive the rotating sleeve 33 and the outer disk body 32 fixedly connected together to rotate synchronously through the meshing transmission of the bevel gear 36 and the bevel gear ring 34, thereby adjusting the test position of the microwave chip clamped and positioned by different groups of placement slots 61 and elastic limit mechanisms 62, and then continuously and synchronously complete the multi-parameter test of multiple microwave chips, thereby improving the detection efficiency.

[0032] Preferably, the second lifting mechanism 4 includes second lifting rods 41 arranged at multiple points around the continuous feeding turntable 3 and a fan ring plate 42 supported by the multiple second lifting rods 41 . The arc defined by the fan ring plate 42 provided in the present application is capable of coinciding with the mounting annular surface defined by the placement slot 61. Thus, the fan ring plate 42 can be axially lifted and lowered under the drive of the second lifting rod 41 to adjustably position the individual testers 51 relative to the vertical projections of the microwave chips in the multiple spaced placement slots 6 so that they coincide. Consequently, different individual testers 51 simultaneously contact and connect with different pins of different microwave chips, thereby synchronously completing tests of different parameters of different microwave chips. As the placement slot 61 drives the microwave chips to rotate, the second lifting rod 41 periodically reciprocates, causing the microwave chips to move sequentially to different test stations and continuously complete multi-parameter tests using the different individual testers 51 that descend again. The reciprocating lifting of the second lifting rod 41 drives several individual testers 51 to cooperate with the intermittently rotating continuous feeding turntable 3 to complete different parameter tests of different microwave chips at a time, while also continuously completing different parameter tests of a single microwave chip within a time period. The synchronous displacement of multiple microwave chips simultaneously achieves synchronous multi-parameter testing of multiple microwave chips within a certain time period.

[0033] Preferably, a plurality of single-item testers 51 are installed on the lower surface of the fan ring plate 42 at intervals in a manner corresponding to the plurality of microwave chips clamped by the detection clamping assembly 6. Further preferably, the plurality of single-item testers 51 are connected in parallel to a power supply 52 installed on the fan ring plate 42. Preferably, the plurality of single-item testers 51 at least test the DC parameters, scattering parameters, power parameters, noise parameters and other data of the microwave chip. Specifically, the single-item testers 51 may include a vector network analyzer, a power tester, a lightning protection tester, a feed tester and a spectrum analyzer. Multiple modular instruments can share a power supply, a chassis and a controller to reduce costs and size. Since different instruments implement different communication standards, a customized method can be adopted to ensure that each instrument meets the PXIe standard. By combining a dedicated continuous feeding turntable 3, a detection clamping assembly 6, and the different pins of the multi-port microwave chip, the connection reliability can be greatly improved. By simultaneously contacting and connecting with different pins of different microwave chips, multiple different parameter measurements of multiple microwave chips can be completed simultaneously. The microwave chips are driven to pass through the test stations defined by different single testers 51 in sequence through the rotation of the feeding turntable 3, thereby continuously completing effective tests of different parameters and improving test stability. Preferably, different single testers 51 are all provided with connection contacts that contact and dock with the pins, and the contacts are fixed on the lower surface of the single tester 51. When the single tester 51 descends and approaches the microwave chip, the connection contacts of the different single testers 51 can achieve contact connection with the microwave chip by pressing contact, thereby forming a test circuit. Preferably, the single-item tester 51 is limited by the second lifting mechanism 4 and the microwave chip is supported and limited by the first lifting column 2 and the continuous feeding turntable 3 to achieve precise contact and docking between the single-item tester 51 and the microwave chip, thereby eliminating the need for additional manual switching and effective connection of the transmission wires, thereby ensuring the effectiveness of the test connection.

[0034] Preferably, the detection clamping assembly 6 includes a placement groove body 61, an elastic limiting mechanism 62 and an auxiliary limiting plate 63. Preferably, a plurality of placement groove bodies 61 are circumferentially spaced and embedded on the continuous feeding turntable 3. Further preferably, an elastic limiting mechanism 62 that can adjustably position the microwave chip in the placement groove body 61 is provided on the side of the placement groove body 61 close to the axis of the continuous feeding turntable 3. Preferably, the auxiliary limiting plate 63 is coaxially embedded on the continuous feeding turntable 3 in a manner that can adjust the working position of the elastic limiting mechanism 62. The multiple elastic limiting mechanisms 62 provided in the present application can rotate around the auxiliary limiting plate 63 to change their working position, so that the elastic limiting mechanism 62 can cooperate with the placement groove body 61 to position and clamp the microwave chip in the fixed fan ring area, thereby facilitating effective testing of the microwave chip. In another fan ring area of ​​the annular surface excluding the above-mentioned fan ring area, the elastic limiting mechanism 62 releases the limitation on the microwave chip, thereby facilitating the disassembly, assembly and replacement of the microwave chip, so that the equipment can continuously perform batch measurement of microwave chips.

[0035] Preferably, the strip trough body 611 of the placement trough body 61 is embedded on the top surface of the continuous feeding turntable 3 in such a manner that its slotting direction coincides with the radial direction of the continuous feeding turntable 3. Preferably, a support strip plate 612 for supporting the microwave chip is provided in the strip trough body 611 in a manner parallel to its groove cavity, thereby forming a microwave chip leg accommodation space on both sides of the support strip plate 612. Further preferably, a wear-resistant pressure plate 613 is further provided on the radially outer side of the strip trough body 611 away from the elastic limiting mechanism 62. Preferably, the wear-resistant pressure plate 613 is a vertical plate body sprayed with a non-slip and wear-resistant material such as Teflon, thereby cooperating with the elastic limiting mechanism 62 to limit the position of the microwave chip on the support strip plate 612, so that the wear-resistant pressure plate 613 and the elastic limiting mechanism 62 define the detection position of the microwave chip in the placement trough body 61 in a counter-positioned clamping manner.

[0036] Preferably, the elastic limiting mechanism 62 includes an embedded block 621, a limiting plug-in shaft 622, a limiting end plate 623, a limiting spring 624, a baffle 625 and a sliding ball head 626. Preferably, the embedded block 621 is embedded on the top surface of the continuous feeding turntable 3 in such a way that its axial direction is parallel to the slotting direction of the strip trough body 611. Preferably, a limiting plug-in shaft 622 capable of being inserted into the strip trough body 611 along the radial direction of the continuous feeding turntable 3 is provided on the embedded block 621. Further preferably, one end of the limiting plug-in shaft 622 inserted into the strip trough body 611 is provided with a limiting end plate 623 that can be adjusted to abut against the detection position of the microwave chip. Preferably, a limiting spring 624 and a baffle 625 that cooperates with the embedded block 621 to limit the sleeve position of the limiting spring 624 are sleeved on the shaft of the limiting plug-in shaft 622. Preferably, one end of the limiting plug shaft 622 away from the limiting end plate 623 is further connected to a sliding ball head 626 that can abut against the side ring surface of the auxiliary limiting plate 63 .

[0037] Preferably, a notched arc groove 631 is provided on the side surface of the disc-shaped plate body of the auxiliary limiting plate 63 to limit the lateral movement distance of the limiting plug shaft 622. Thus, the sliding ball head 626, which is always abutted against the side annular surface of the disc-shaped plate body defined by the auxiliary limiting plate 63, can radially translate along the arc-shaped concave contour of the notched arc groove 631, thereby increasing the distance between the limiting end plate 623 and the wear-resistant pressure plate 613 and releasing the restriction on the microwave chip. Furthermore, when the sliding ball head 626 moves out of the notched arc groove 631, it pushes the limiting plug shaft 622 and the limiting end plate 623 to translate back, so that the limiting end plate 623 and the wear-resistant pressure plate 613 align and clamp the microwave chip mounted on the support strip 612. Preferably, a positioning blind hole 632 is also provided on the bottom surface of the auxiliary limiting plate 63.

[0038] The working principle of this application is:

[0039] When the rotary drive motor 35 rotates the outer disk 32, causing the elastic limiting mechanism 62 and the auxiliary limiting plate 63 to be aligned, the limiting plug shaft 622 is driven by the compressed limiting spring 624, causing it and the sliding ball head 626 to move into the notched arc groove 631. The microwave chip is then placed on the support strip 612, with its pins located in the microwave chip pin receiving spaces on both sides of the support strip 612. The rotary drive motor 35 rotates further, causing the sliding ball head 626 to gradually move out of the notched arc groove 631, causing the limiting plug shaft 622 to push the limiting end plate 623 laterally into the strip groove body 611, thereby cooperating with the wear-resistant pressure plate 613 to clamp the microwave chip placed on the support strip 612.

[0040] The rotary drive motor 35 further drives the placement trough 61, the elastic limiter 62, and the microwave chips constrained by them to synchronously and intermittently deflect, sequentially passing through different measurement stations and pausing at different measurement stations. The second lifting mechanism 4 then reciprocates to lift and lower the multiple individual testers 51 spaced apart within the fan-shaped surface, descending to their lowest position during this pausing period. This allows the multiple individual testers 51 spaced apart within the fan-shaped surface to simultaneously establish contact with the microwave chips spaced apart within the same fan-shaped surface, thereby synchronously completing different parameter tests on different microwave chips. Then, during the ascent and descent of the second lifting mechanism 4, the rotary drive motor 35 further drives the placement trough 61, the elastic limiter 62, and the microwave chips constrained by them to synchronously deflect, allowing the microwave chips to change test stations and undergo other parameter tests again. Thus, through the continuous intermittent deflection of the rotary drive motor 35 and the reciprocating lifting and lowering of the second lifting mechanism 4, synchronous single-item measurements of different parameters of multiple microwave chips are completed, achieving multiple parameter measurements on multiple microwave chips in a continuous and synchronous testing manner.

[0041] When the microwave chip completes multiple parameter tests, during the further deflection process, the sliding ball head 626 gradually moves from the annular surface of the auxiliary limiting plate 63 to the position of the notched arc groove 631, so that the limiting plug shaft 622 and the sliding ball head 626 are driven by the limiting spring 624 to translate into the notched arc groove 631, so that the limiting end plate 623 connected to the limiting plug shaft 622 releases the abutment limit on the microwave chip, thereby making it convenient for the staff to grab the microwave chip placed on the support strip 612, and after removing the microwave chip that has completed the test, put in a new microwave chip to be tested, thereby realizing the continuous transportation of microwave chips and continuous multiple parameter tests by the equipment.

[0042] The present utility model is not limited to the above-mentioned optional implementation methods. Anyone can derive other forms of products under the inspiration of the present utility model. However, no matter what changes are made in its shape or structure, any technical solution that falls within the scope defined by the claims of the present utility model falls within the protection scope of the present utility model. Those skilled in the art should understand that the present utility model specification and its drawings are illustrative and do not constitute a limitation on the claims. The scope of protection of the present utility model is defined by the claims and their equivalents. Throughout the text, the features guided by "preferably" are only an optional method and should not be understood as having to be set. Therefore, the applicant reserves the right to abandon or delete the relevant preferred features at any time.

Claims

1. A multi-port microwave test fixture, comprising a support base (1) capable of providing a support plane, characterized in that: A continuous feeding turntable (3) is supported on the support base (1) via a first lifting column (2), and a tester module (5) suspended above the continuous feeding turntable (3) is also supported on the support base (1) via a second lifting mechanism (4), wherein the second lifting mechanism (4) is capable of adjusting the working height of the tester module (5); Detection clamping components (6) for adjusting the positioning and clamping of a plurality of microwave chips are embedded in the top surface of the continuous feeding turntable (3) at intervals in an annular direction. The plurality of single-item testers (51) of the tester module (5) are mounted on the working surface defined by the second lifting mechanism (4) in a manner that they are arranged at the same spacing as the detection chips positioned circumferentially spaced by the detection clamping assembly (6).

2. The multi-port microwave test fixture according to claim 1, characterized in that: The detection clamping assembly (6) comprises a placement slot (61), an elastic limiting mechanism (62) and an auxiliary limiting plate (63), wherein: A plurality of the placement troughs (61) are circumferentially spaced and embedded on the continuous feeding turntable (3), and an elastic limiting mechanism (62) for adjustably positioning the microwave chip in the placement trough (61) is provided on one side of the placement trough (61) close to the axis of the continuous feeding turntable (3); The auxiliary limiting plate (63) is coaxially embedded on the continuous feeding turntable (3) in a manner capable of adjusting the working position of the elastic limiting mechanism (62).

3. The multi-port microwave test fixture according to claim 2, characterized in that: The strip-shaped trough body (611) for accommodating the trough body (61) is embedded on the top surface of the continuous feeding turntable (3) in such a manner that its slotting direction coincides with the radial direction of the continuous feeding turntable (3); A supporting strip plate (612) for supporting a microwave chip is arranged in the strip-shaped slot body (611) in parallel with the slot cavity thereof; A wear-resistant pressure plate (613) is further provided on the radially outer side of the strip-shaped groove body (611) away from the elastic limiting mechanism (62).

4. The multi-port microwave test fixture according to claim 3, characterized in that: The elastic limiting mechanism (62) comprises an embedded block (621), a limiting plug shaft (622), a limiting end plate (623), a limiting spring (624) and a blocking plate (625), wherein: The embedding block (621) is embedded on the top surface of the continuous feeding turntable (3) in such a manner that its axial direction is parallel to the slotting direction of the strip-shaped slot body (611). The insert block (621) is provided with a limiting plug shaft (622) capable of being inserted into the strip trough body (611) along the radial direction of the continuous feeding turntable (3), and one end of the limiting plug shaft (622) inserted into the strip trough body (611) is provided with a limiting end plate (623) that can be adjusted to abut against a detection position of a microwave chip. The limiting spring (624) and the blocking plate (625) which cooperates with the embedded block (621) to limit the sleeve position of the limiting spring (624) are sleeved on the shaft of the limiting plug shaft (622).

5. The multi-port microwave test fixture according to claim 4, characterized in that: One end of the limiting plug shaft (622) away from the limiting end plate (623) is also connected to a sliding ball head (626) capable of resting on the side ring surface of the auxiliary limiting plate (63).

6. The multi-port microwave test fixture according to claim 5, characterized in that: A notched arc groove (631) for limiting the lateral displacement distance of the limiting insertion shaft (622) is provided on the side surface of the disc-shaped plate body of the auxiliary limiting plate (63); A positioning blind hole (632) is also provided on the bottom surface of the auxiliary limiting plate (63).

7. The multi-port microwave test fixture according to claim 6, characterized in that: The continuous feeding turntable (3) comprises a central plug shaft (31), an outer disk body (32), a rotating sleeve (33), a helical gear ring (34), a rotary drive motor (35) and a helical gear (36), wherein: The outer disc (32) is rotatably sleeved on the central insertion shaft (31), and the rotating sleeve (33) is provided on the bottom surface of the outer disc (32), and the helical gear ring (34) is provided on the annular surface of the lower end of the rotating sleeve (33); The rotary drive motor (35) is also provided on the side surface of the central plug shaft (31), and the rotary output end of the rotary drive motor (35) is also connected to the helical gear (36) meshing with the helical gear ring (34).

8. The multi-port microwave test fixture according to claim 7, characterized in that: The central plug shaft (31) is supported on the first lifting column (2), and a positioning plug block (311) matching the positioning blind hole (632) is provided at the axial upper end of the central plug shaft (31); A circular groove (321) is provided at the center of the top surface of the outer disk (32) for coaxially mounting the auxiliary limiting plate (63) so that the outer disk (32) can rotate around the auxiliary limiting plate (63).

9. The multi-port microwave test fixture according to claim 8, characterized in that: The second lifting mechanism (4) comprises second lifting rods (41) arranged at multiple points around the continuous feeding turntable (3) and a fan ring plate (42) supported by the plurality of second lifting rods (41).

10. The multi-port microwave test fixture according to claim 9, characterized in that: A plurality of the single-item testers (51) are installed at intervals on the lower surface of the fan ring plate (42) in a manner corresponding to a plurality of microwave chips clamped by the detection clamping assembly (6).

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