A solar cell, a cell assembly, and a photovoltaic system
By widening the test section locally on the main grid of the solar cell to serve as the contact point for current and voltage test probes, the problems of complex printing process and poor carrier collection effect are solved, thereby improving cell efficiency and reducing cost.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- ZHEJIANG AIKO SOLAR ENERGY TECH CO LTD
- Filing Date
- 2025-06-13
- Publication Date
- 2026-06-26
AI Technical Summary
The printing process for existing solar cells is complex, resulting in poor carrier collection and affecting cell efficiency.
A solar cell is designed by locally widening the first and second main grids to form a test section, which serves as the contact point for current and voltage test probes, simplifying the printing process and improving carrier collection efficiency.
It simplifies the printing process, improves battery efficiency, reduces production costs, and saves printing paste.
Smart Images
Figure CN224419194U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of solar cell technology, and in particular to a solar cell, a battery module and a photovoltaic system. Background Technology
[0002] Solar cells, also known as photovoltaic cells, are devices that directly convert light energy into direct current using the photovoltaic effect. Back-contact solar cells, with both positive and negative electrodes located on the back of the cell, completely avoid the shading caused by metal grid lines on the front surface, unlike bifacial solar cells. This eliminates optical losses due to metal grid line obstruction and significantly improves cell conversion efficiency.
[0003] In related technologies, solar cells typically have connecting pads on the back for soldering ribbons to achieve series connection between cells. Meanwhile, since solar cells require current and voltage testing before leaving the factory, the current and voltage test probes of the testing equipment must simultaneously contact the test pads during performance testing. Therefore, solar cells require dedicated test pads, complicating the printing process. Furthermore, the width of the test pads and connecting pads at the connection point with the main grid is usually the same, which is not conducive to carrier collection, resulting in poor carrier collection performance and thus affecting cell efficiency. Utility Model Content
[0004] This invention provides a solar cell that aims to solve the problems of complex printing processes and poor carrier collection in existing solar cells.
[0005] This invention is implemented by providing a solar cell, comprising:
[0006] Silicon substrate;
[0007] A plurality of first fine gates and a plurality of second fine gates are disposed on the back side of the silicon substrate. The plurality of first fine gates and the plurality of second fine gates are arranged alternately along a first direction. The first fine gates and the second fine gates both extend along a second direction, and the second direction intersects with the first direction.
[0008] A plurality of first main gates are disposed on the back side of the silicon substrate, the first main gates extending along the first direction, and the first fine gates are connected to the first main gates; at least one of the first main gates is provided with first pads and second pads spaced apart along the first direction, the first main gate includes two first test portions respectively connected to opposite sides of the second pads along the first direction, the width of the first test portions being greater than the width of the first main gate at the connection position with the first pads; and
[0009] A plurality of second main gates are disposed on the back side of the silicon substrate, the second main gates extending along the first direction, the second main gates and the first main gates being alternately spaced along the second direction, and the second fine gates being connected to the second main gates; at least one of the second main gates is provided with a third pad and a fourth pad spaced along the first direction, the second main gate including two second test portions respectively connected to the fourth pad on opposite sides along the first direction, the width of the second test portion being greater than the width of the second main gate at the connection position with the third pad.
[0010] Preferably, the width of the first pad is the same as the width of the second pad, and the length of the first pad is the same as the length of the second pad; and / or, the width of the third pad is the same as the width of the fourth pad, and the length of the third pad is the same as the length of the fourth pad.
[0011] Preferably, the ratio of the width of the first test section to the width of the first main gate at the connection position with the first pad is 1.5 to 3; and / or, the ratio of the width of the second test section to the width of the second main gate at the connection position with the third pad is 1.5 to 3.
[0012] Preferably, the width of the first test section gradually increases from the end of the first test section away from the second pad to the end of the first test section closer to the second pad; and / or, the width of the second test section gradually increases from the end of the second test section away from the fourth pad to the end of the second test section closer to the fourth pad.
[0013] Preferably, the width of the first test portion is smaller than the width of the second pad; and / or, the width of the second test portion is smaller than the width of the fourth pad.
[0014] Preferably, the first main gate further includes a first main body portion connected between the first pad and the first test portion, the width of the first main body portion gradually decreasing from the middle position of the first main body portion to both ends of the first main body portion; and / or, the second main gate includes a second main body portion connected between the third pad and the second test portion, the width of the second main body portion gradually decreasing from the middle position of the second main body portion to both ends of the second main body portion.
[0015] Preferably, the spacing between adjacent first and second fine gates is D, and the length of the first test section and / or the second test section is greater than D and less than 4D.
[0016] Preferably, the width of the first test portion is smaller than the width of the second pad; and / or, the width of the second test portion is smaller than the width of the fourth pad.
[0017] Preferably, the width ratio of the first test portion to the width of the second pad is 0.6 to 0.9; and / or, the width ratio of the second test portion to the width of the fourth pad is 0.6 to 0.9.
[0018] Preferably, the second fine grid forms a first interruption at the position of the first test section, and the second fine grid is spaced apart from the first test section through the first interruption;
[0019] The second fine gate forms a second break at the location of the second pad. The second fine gate is spaced from the second pad through the second break, and the width of the first break is smaller than the width of the second break.
[0020] Preferably, the first fine grid forms a third discontinuity at the location of the second test section, and the first fine grid is spaced apart from the second test section through the third discontinuity;
[0021] The first fine gate forms a fourth break at the fourth pad position, the first fine gate is spaced apart from the fourth pad through the fourth break, and the width of the third break is smaller than the width of the fourth break.
[0022] This invention also provides a battery assembly, including the aforementioned solar cell.
[0023] This utility model also provides a photovoltaic system, including the above-mentioned battery components.
[0024] This utility model provides a solar cell by widening the first main grid connecting to the second pad along a first direction to form two first test sections. These two first test sections on the first main grid serve as contact points for current and voltage test probes. Simultaneously, the second main grid connecting to the fourth pad is widened along the first direction to form two second test sections. These two second test sections on the second main grid serve as contact points for current and voltage test probes. By utilizing these two first and two second test sections to form the solar cell's test structure, current and voltage testing of the cell can be achieved. No additional test pads need to be printed on either the first or second main grid; only a partial widening of the first main grid is required. By forming two first test sections and widening the second main grid to form two second test sections, the printing process can be simplified, thereby improving production efficiency. Furthermore, the width of the first test section is greater than the width of the connection between the first main grid and the first pad, and the width of the second test section is greater than the width of the connection between the second main grid and the third pad. This increases the width of both the connection points, improving carrier collection and thus increasing cell efficiency. Moreover, since only the first and second main grids need to be widened locally, and no additional test pads are required, printing paste can be saved while improving carrier collection, reducing the production cost of solar cells. Attached Figure Description
[0025] Figure 1 A plan view of a solar cell provided for an embodiment of this utility model;
[0026] Figure 2 for Figure 1 A magnified schematic diagram of part A in the middle;
[0027] Figure 3 A schematic diagram of a partial structure of a solar cell provided in an embodiment of this utility model;
[0028] Figure 4 This is a schematic diagram of another part of the structure of a solar cell provided in an embodiment of the present invention. Detailed Implementation
[0029] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. Examples of embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present utility model, and should not be construed as limiting the present utility model. Furthermore, it should be understood that the specific embodiments described herein are merely for explaining the present utility model and are not intended to limit the present utility model.
[0030] In the description of this utility model, it should be understood that the terms "upper", "lower", "back", "front", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.
[0031] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0032] The following disclosure provides numerous different embodiments or examples for implementing various structures of the present invention. To simplify the disclosure, specific examples of components and arrangements are described below. These are merely examples and are not intended to limit the scope of the invention. Furthermore, reference numerals and / or letters may be repeated in different examples; such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. In addition, examples of various specific processes and materials are provided in this invention; however, those skilled in the art will recognize the application of other processes and / or the use of other materials.
[0033] Please refer to Figures 1-4 This utility model provides a solar cell, comprising:
[0034] Silicon substrate 1;
[0035] A plurality of first fine gates 2 and a plurality of second fine gates 3 are disposed on the back side 11 of the silicon substrate 1. The plurality of first fine gates 2 and the plurality of second fine gates 3 are arranged alternately along the first direction Y. The first fine gates 2 and the second fine gates 3 both extend along the second direction X, and the second direction X intersects the first direction Y.
[0036] A plurality of first main gates 4 are disposed on the back side 11 of the silicon substrate 1, the first main gates 4 extending along a first direction Y, and the first fine gates 2 are connected to the first main gates 4; at least one first main gate 4 is provided with first pads 5 and second pads 6 spaced apart along the first direction Y, the first main gate 4 includes two first test portions 41 respectively connected to opposite sides of the second pads 6 along the first direction Y, the width W1 of the first test portion 41 is greater than the width W2 of the first main gate 4 at the connection position with the first pads 5; and
[0037] A plurality of second main gates 7 are disposed on the back side 11 of the silicon substrate 1. The second main gates 7 extend along the first direction Y. The second main gates 7 and the first main gate 4 are alternately spaced along the second direction X. The second fine gate 3 is connected to the second main gate 7. At least one second main gate 7 is provided with a third pad 8 and a fourth pad 9 spaced along the first direction Y. The second main gate 7 includes two second test sections 71 respectively connected to the opposite sides of the fourth pad 9 along the first direction Y. The width W3 of the second test section 71 is greater than the width W4 of the second main gate 7 at the connection position with the third pad 8.
[0038] In this embodiment of the invention, the solar cell is specifically a back-contact solar cell. Multiple first fine grids 2 and multiple second fine grids 3 are disposed on the back side 11 of the silicon substrate 1 for collecting and transmitting photogenerated carriers, thereby realizing the power conversion of the back-contact cell. The first fine grid 2 serves as either the positive or negative electrode, and the second fine grid 3 serves as the other. The first fine grid 2 is connected to the first main grid 4, and the first fine grid 2 is spaced apart from the second main grid 7; the second fine grid 3 is connected to the second main grid 7, and the second fine grid 3 is spaced apart from the first main grid 4. Furthermore, the first fine grid 2 is connected to the first pad 5 and the second pad 6, and the first fine grid 2 is spaced apart from the third pad 8 and the fourth pad 9; the second fine grid 3 is connected to the third pad 8 and the fourth pad 9, and the second fine grid 3 is spaced apart from the first pad 5 and the second pad 6.
[0039] The number of first test sections 41 and second test sections 71 is the same. One first test section 41 and one second test section 71 form a pair of current test structures, and another first test section 41 and another second test section 71 form a pair of voltage test structures, used for testing the electrical performance of solar cells. The two first test sections 41 and the two second test sections 71 are arranged adjacent to each other.
[0040] In this embodiment of the invention, the width is always referred to along the second direction X, and the length is always referred to along the first direction Y. The width W1 of the first test section 41 is greater than the width W2 of the connection position between the first main gate 4 and the first pad 5. This can be understood as the first test section 41 being located at the position where the first main gate 4 connects to the second pad 6, and the width of the connection position of the first main gate 4 to the second pad 6 being greater than the width of the connection position of the first main gate 4 to the first pad 5. The width W3 of the second test section 71 is greater than the width W4 of the connection position between the second main gate 7 and the third pad 8. This can be understood as the second test section 71 being located at the position where the second main gate 7 connects to the fourth pad 9, and the width of the connection position of the second main gate 7 to the fourth pad 9 being greater than the width of the connection position of the second main gate 7 to the third pad 8.
[0041] In this design, the width W1 of the first test section 41 is greater than the width W2 of the connection position between the first main gate 4 and the first pad 5. The width W1 of the first test section 41 can be uniformly or non-uniformly set. When the width W1 of the first test section 41 is non-uniformly set, it refers to the maximum width of the first test section 41. Similarly, the width W3 of the second test section 71 is greater than the width W4 of the connection position between the second main gate 7 and the third pad 8. The width W3 of the second test section 71 can be uniformly or non-uniformly set. When the width W3 of the second test section 71 is non-uniformly set, it refers to the maximum width W3 of the second test section 71.
[0042] In this embodiment of the invention, each first main gate 4 is provided with a plurality of first pads 5 arranged at intervals along the first direction Y, wherein at least one first main gate 4 is provided with a first pad 6, and the width of the two first test portions 41 of the first main gate 4 located on opposite sides of the second pad 6 along the first direction Y is greater than the width of the connection position between any one first main gate 4 and the first pad 5. Similarly, each second main gate 7 is provided with a plurality of third pads 8 arranged at intervals along the first direction Y, wherein at least one second main gate 7 is provided with a third pad 8, and the width of the two second test portions 71 of the second main gate 7 located on opposite sides of the third pad 8 along the first direction Y is greater than the width of the connection position between any one second main gate 7 and the third pad 8.
[0043] This utility model provides a solar cell by providing first pads 5 and second pads 6 spaced apart along a first direction Y on at least one first main grid 4. The first main grid 4 is provided with two first test sections 41 respectively connected to opposite sides of the second pads 6 along the first direction Y. The width W1 of the first test section 41 is greater than the width W2 of the first main grid 4 at the connection point with the first pad 5. At least one second main grid 7 is provided with third pads 8 and fourth pads 9 spaced apart along the first direction Y. The second main grid 7 includes two second test sections 71 respectively connected to opposite sides of the fourth pad 9 along the first direction Y. The width W3 of the second test section 71 is greater than the width W4 of the second main grid 7 at the connection point with the third pad 8. This can be understood as widening the first main grid 4 at the connection point with the second pads 6 along the first direction Y to form two first test sections 41. As the contact points for the current and voltage test probes of the first main grid 4, the second pad 6 and the first pad 5 between the two first test sections 41 are used for soldering. At the same time, the second main grid 7 is connected to the fourth pad 9 and widened on both sides along the first direction Y to form two second test sections 71. The two second test sections 71 on the second main grid 7 serve as the contact points for the current and voltage test probes of the second main grid 7. The fourth pad 9 and the third pad 8 between the two second test sections 71 are used for soldering. The current and voltage of the battery can be tested by using the two first test sections 41 and the two second test sections 71. Only the first main grid 4 needs to be widened locally to form two first test sections 41, and the second main grid 7 needs to be widened locally to form two second test sections 71. There is no need to print test pads on the first main grid 4 and the second main grid 7, thus simplifying the printing process and improving production efficiency. Furthermore, the width of the first test section 41 is greater than the width of the connection position between the first main gate 4 and the first pad 5, and the width of the second test section 41 is greater than the width of the connection position between the second main gate 4 and the third pad 8. That is, increasing the width of the connection position between the first main gate 4 and the first pad 5 and the connection position between the second main gate 7 and the third pad 8 is beneficial to improving the carrier collection effect, thereby improving the cell efficiency. Moreover, since only the first main gate 4 and the second main gate 7 need to be locally widened, the first pad 5, the second pad 6, the third pad 8, and the fourth pad 9 can all be set as conventional size pads, without the need for additional printing of test pads. While improving the carrier collection effect, it can also save printing paste and reduce the production cost of solar cells.
[0044] In this embodiment of the present invention, when the solar cell is subjected to current and voltage tests, the current test probe of the test equipment contacts a first test part 41 of the first main grid 4 and a second test part 71 of the second main grid 7, respectively, and the voltage test probe of the test equipment contacts another first test part 41 of the first main grid 4 and another second test part 71 of the second main grid 7, thereby forming a corresponding current test circuit and voltage test circuit.
[0045] In one embodiment of this utility model, the width W5 of the first pad 5 is the same as the width W6 of the second pad 6, and the length L1 of the first pad 5 is the same as the length L2 of the second pad 6.
[0046] In this embodiment, the width direction of both the first pad 5 and the second pad 6 is along the second direction X, and the length direction of both the first pad 5 and the second pad 6 is along the first direction Y. By setting the width and length of the first pad 5 and the second pad 6 to be the same, and by setting both the first pad 5 and the second pad 6 to be the pad size of conventional solar cells, the processing of the first pad 5 and the second pad 6 is convenient, and there is no need to print special test pads, which helps to save paste. Preferably, the shape and size of the first pad 5 and the second pad 6 are the same. Of course, in some possible embodiments, the shapes of the first pad 5 and the second pad 6 may also be different.
[0047] In one embodiment of this utility model, the width W7 of the third pad 8 is the same as the width W8 of the fourth pad 9, and the length L3 of the third pad 8 is the same as the length L4 of the fourth pad 9.
[0048] In this embodiment, the width direction of both the third pad 8 and the fourth pad 9 is along the second direction X, and the length direction of both the third pad 8 and the fourth pad 9 is along the first direction Y. By setting the width and length of the third pad 8 and the fourth pad 9 to be the same, it is convenient to process the third pad 8 and the fourth pad 9. Preferably, the shape and size of the third pad 8 and the fourth pad 9 are the same. Of course, in some possible embodiments, the shapes of the third pad 8 and the fourth pad 9 can also be different. More preferably, the shape and size of the first pad 5, the second pad 6, the third pad 8, and the fourth pad 9 are all the same, so that there are only pads of a single shape and specification on the entire battery cell, eliminating the need to set up special test pads, which facilitates the design and printing of pads.
[0049] As an embodiment of the present invention, the ratio of the width W1 of the first test section 41 to the width W2 of the first main gate 4 at the connection position with the first pad 5 is 1.5 to 3; and / or, the ratio of the width W3 of the second test section 71 to the width W4 of the second main gate 7 at the connection position with the third pad 8 is 1.5 to 3.
[0050] In this embodiment, the ratio of the width W1 of the first test section 41 to the width W2 of the connection position between the first main gate 4 and the first pad 5 is controlled to be 1.5 to 3. This ensures that the first test section 41 can effectively perform electrical performance testing while avoiding excessively widening the first test section 41, thus reducing the amount of printing paste. It also prevents the width of the discontinuity of the second fine gate 3 at the first test section 41 from being too large, ensuring good carrier collection performance of the second fine gate 3. Similarly, the ratio of the width W3 of the second test section 71 to the width W4 of the connection position between the second main gate 7 and the third pad 8 is controlled to be 1.5 to 3. This ensures that the second test section 71 can effectively perform electrical performance testing while avoiding excessively widening the second test section 71, thus reducing the amount of printing paste. It also prevents the width of the discontinuity of the first fine gate 2 at the second test section 71 from being too large, ensuring good carrier collection performance of the first fine gate 2.
[0051] As an embodiment of the present invention, the width W1 of the first test section 41 gradually increases from the end of the first test section 41 away from the second pad 6 toward the end of the first test section 41 closer to the second pad 6; and / or, the width W3 of the second test section 71 gradually increases from the end of the second test section 71 away from the fourth pad 9 toward the end of the second test section 71 closer to the fourth pad 9.
[0052] In this embodiment, the width of the first test section 41 is larger when it is closer to the second pad 6, and smaller when it is farther away from the second pad 6. This is beneficial for improving the carrier collection effect of the first test section 41. Furthermore, the larger width of the first test section 41 when it is closer to the second pad 6 facilitates contact testing with the probes of the testing equipment. Additionally, the gradually increasing width design of the first test section 41, compared to a uniformly arranged first test section 41, saves paste on the first main gate 4. Similarly, the gradually increasing width W3 of the second test section 71 from the end farther from the fourth pad 9 to the end closer to the fourth pad 9 is beneficial for improving the carrier collection effect of the second test section 71 and facilitates contact testing with the probes of the testing equipment. Furthermore, the gradually increasing width design of the second test section 71, compared to a uniformly arranged second test section 71, saves paste on the second main gate 7.
[0053] As an embodiment of the present invention, the width W1 of the first test part 41 is smaller than the width W6 of the second pad 6; and / or, the width W3 of the second test part 71 is smaller than the width W8 of the fourth pad 9.
[0054] In this embodiment, the width W1 of the first test section 41 is controlled to be smaller than the width of the second pad 6, which is beneficial to increase the distance between the first test section 41 and the second fine gate 3 corresponding to the position of the first test section 41, thereby reducing the risk of short circuit between the first test section 41 and the second fine gate 3. Moreover, since the width W1 of the first test section 41 is smaller than the width of the second pad 6, the amount of paste used in the first test section 41 can be further reduced while reducing the risk of short circuit, which is beneficial to further reduce costs.
[0055] As an embodiment of the present invention, the first main gate 4 includes a first main body 42 connected between the first pad 5 and the first test part 41, and the width of the first main body 42 gradually decreases from the middle position of the first main body 42 to both ends of the first main body 42.
[0056] In this embodiment, the first main body portion 42 can be understood as the portion of the first main gate 4 excluding the first test portion 41. Adjacent first pads 5 and the first pad 5 and the first test portion 41 are connected via the first main body portion 42. The width of the first main body portion 42 is its dimension along the second direction X. The width of the first main body portion 42 gradually decreases from its middle position towards both ends, making the width of the first main body portion 42 larger closer to the first pad 5 or the second pad 6. This improves carrier collection efficiency and further reduces the paste usage of the first main gate 4, thus further reducing costs.
[0057] As an embodiment of the present invention, the second main gate 7 includes a second main body portion 72 connected between the third pad 8 and the second test portion 71, and the width of the second main body portion 72 gradually decreases from the middle position of the second main body portion 72 to both ends of the second main body portion 72.
[0058] In this embodiment, the second main body portion 72 can be understood as the portion of the second main gate 7 excluding the second test portion 71. Adjacent third pads 8 and the third pad 8 and the second test portion 71 are connected via the second main body portion 72. The width of the second main body portion 72 is its dimension along the second direction X. The width of the second main body portion 72 gradually decreases from its middle position towards both ends, making the width of the second main body portion 72 larger closer to the third pad 8 or the fourth pad 9. This improves carrier collection efficiency and further reduces the paste usage of the second main gate 7, thus further reducing costs.
[0059] In one embodiment of the present invention, the distance between adjacent first fine grid 2 and second fine grid 3 is D, and the length of the first test part 41 and / or the second test part 71 is greater than D and less than 4D.
[0060] In this embodiment, adjacent first fine grids 2 and second fine grids 3 are arranged at equal intervals, and the distance between adjacent first fine grids 2 and second fine grids 3 is D. The length of the first test section 41 is L5, which is greater than D and less than 4D. The length of the second test section 71 is L6, which is greater than D and less than 4D. The lengths of the first test sections 41 can be the same or different; the lengths of the second test sections 71 can be the same or different; and the lengths of the first test sections 41 and the second test sections 71 can be the same or different.
[0061] In this embodiment, by controlling the lengths of the first test section 41 and the second test section 71 to be greater than D and less than 4D, the lengths of the first test section 41 and the second test section 71 are controlled within a suitable range. This avoids excessively large slurry costs caused by excessively large lengths of the first test section 41 and the second test section 71, and also avoids excessively large gaps in the width of the second grid 3 at the position of the first test section 41, which is beneficial to improving the carrier collection effect of the second grid 3 and thus improving the cell efficiency. Moreover, it avoids the first test section 41 and the second test section 71 being too short, which is beneficial to the electrical performance testing of the solar cell.
[0062] As an embodiment of the present invention, the width W1 of the first test part 41 is smaller than the width W6 of the second pad 6; and / or, the width W3 of the second test part 71 is smaller than the width W8 of the fourth pad 9.
[0063] In this embodiment, controlling the width W1 of the first test section 41 to be smaller than the width W6 of the second pad 6 is beneficial for reducing the width of the discontinuity of the second fine gate 3 at the position of the first test section 41, thereby improving the carrier collection effect of the second fine gate 3, thus improving battery efficiency, and also reducing the amount of paste used in the first test section 41. Controlling the width W3 of the second test section 71 to be smaller than the width W8 of the fourth pad 9 is beneficial for reducing the width of the discontinuity of the first fine gate 2 at the position of the second test section 71, thereby improving the carrier collection effect of the first fine gate 2, thus improving battery efficiency, and also reducing the amount of paste used in the second test section 71.
[0064] As an embodiment of the present invention, the width W1 of the first test part 41 is 0.6 to 0.9 to the width of the second pad 6; and / or, the width W3 of the second test part 71 is 0.6 to 0.9 to the width of the fourth pad 9.
[0065] In this embodiment, by controlling the width ratio of the first test section 41 and the second test section 71 to be 0.6 to 0.9, the widths of the first test section 41 and the second test section 71 are controlled within a suitable range. This avoids excessively large widths of the first test section 41 and the second test section 71, which would result in excessively high paste costs, and also ensures good carrier collection performance of the first test section 41 and the second test section 71, thereby improving battery efficiency and facilitating the electrical performance testing of the solar cell.
[0066] As an embodiment of the present invention, the second fine grid 3 forms a first interruption 31 at the position of the first test section 41, and the second fine grid 3 is spaced apart from the first test section 41 through the first interruption 31;
[0067] The second fine gate 3 forms a second break 32 at the position of the second pad 6. The second fine gate 3 is separated from the second pad 6 by the second break 32, and the width of the first break 31 is smaller than the width of the second break 32.
[0068] In this embodiment, since the width of the first interruption 31 is smaller than the width of the second interruption 32, that is, the width of the interruption of the second fine gate 3 located at the first test section 41 is smaller than the width of the interruption located at the second pad 6, the width of the interruption of the second fine gate 3 corresponding to the first test section 41 can be reduced, the total length of the second fine gate 3 corresponding to the first test section 41 can be increased, the carrier collection effect of the second fine gate 3 can be improved, and thus the battery efficiency can be improved.
[0069] As an embodiment of the present invention, the first fine grid 2 forms a third break 21 at the position of the second test section 71, and the first fine grid 2 is spaced apart from the second test section 71 through the third break 21;
[0070] The first fine gate 2 forms a fourth break 22 at the position of the fourth pad 9. The first fine gate 2 is separated from the fourth pad 9 by the fourth break 22, and the width of the third break 21 is smaller than the width of the fourth break 22.
[0071] In this embodiment, since the width of the third interruption 21 is smaller than the width of the fourth interruption 22, that is, the width of the interruption of the second fine gate 3 located at the second test section 71 is smaller than the width of the interruption located at the fourth pad 9, increasing the length of the first fine gate 2 located at the second test section 71 is beneficial to improving the carrier collection effect of the first fine gate 2, thereby improving the battery efficiency.
[0072] This utility model embodiment also provides a battery assembly, which includes the solar cell described in the above embodiment. It should be noted that this battery assembly has the same or similar beneficial effects as the solar cell described above, and the related aspects between the two can be referred to each other; to avoid repetition, they will not be repeated here.
[0073] This utility model embodiment also provides a photovoltaic system, which includes the battery module described in the above embodiment. It should be noted that this photovoltaic system has the same or similar beneficial effects as the battery module described above, and the related aspects between the two can be referred to each other; to avoid repetition, they will not be repeated here.
[0074] In this embodiment, the photovoltaic system can be applied in photovoltaic power plants, such as ground-mounted power plants, rooftop power plants, and floating power plants. It can also be applied to equipment or devices that utilize solar energy to generate electricity, such as user solar power supplies, solar streetlights, solar cars, and solar buildings. Of course, it is understood that the application scenarios of the photovoltaic system are not limited to these; that is, the photovoltaic system can be applied in all fields that require solar energy to generate electricity. Taking a photovoltaic power generation system network as an example, the photovoltaic system may include a photovoltaic array, a combiner box, and an inverter. The photovoltaic array may be an array combination of multiple battery modules; for example, multiple battery modules can form multiple photovoltaic arrays. The photovoltaic array is connected to the combiner box, which can collect the current generated by the photovoltaic array. The collected current flows through the inverter and is converted into AC power required by the mains power grid before being connected to the mains power grid to achieve solar power supply.
[0075] In the description of this specification, references to terms such as "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with an embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.
[0076] The above are merely preferred embodiments of the present utility model and are not intended to limit the present utility model. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. A solar cell, characterized in that, include: Silicon substrate; A plurality of first fine gates and a plurality of second fine gates are disposed on the back side of the silicon substrate. The plurality of first fine gates and the plurality of second fine gates are arranged alternately along a first direction. The first fine gates and the second fine gates both extend along a second direction, and the second direction intersects with the first direction. A plurality of first main gates are disposed on the back side of the silicon substrate, the first main gates extending along the first direction, and the first fine gates are connected to the first main gates; at least one of the first main gates is provided with a first pad and a second pad spaced apart along the first direction, the first main gate includes two first test portions respectively connected to the second pads on opposite sides along the first direction, the width of the first test portions being greater than the width of the first main gate at the connection position with the first pad; and A plurality of second main gates are disposed on the back side of the silicon substrate, the second main gates extending along the first direction, the second main gates and the first main gates being alternately spaced along the second direction, and the second fine gates being connected to the second main gates; at least one of the second main gates is provided with a third pad and a fourth pad spaced along the first direction, the second main gate including two second test portions respectively connected to the fourth pad on opposite sides along the first direction, the width of the second test portion being greater than the width of the second main gate at the connection position with the third pad.
2. The solar cell according to claim 1, characterized in that, The width of the first pad is the same as the width of the second pad, and the length of the first pad is the same as the length of the second pad; and / or, the width of the third pad is the same as the width of the fourth pad, and the length of the third pad is the same as the length of the fourth pad.
3. The solar cell according to claim 1, characterized in that, The ratio of the width of the first test section to the width of the first main gate at the connection position with the first pad is 1.5 to 3; and / or, the ratio of the width of the second test section to the width of the second main gate at the connection position with the third pad is 1.5 to 3.
4. The solar cell according to claim 1, characterized in that, The width of the first test section gradually increases from the end of the first test section away from the second pad to the end of the first test section closer to the second pad; and / or, the width of the second test section gradually increases from the end of the second test section away from the fourth pad to the end of the second test section closer to the fourth pad.
5. The solar cell according to claim 1, characterized in that, The width of the first test section is smaller than the width of the second pad; and / or, the width of the second test section is smaller than the width of the fourth pad.
6. The solar cell according to claim 1, characterized in that, The first main gate further includes a first main body portion connected between the first pad and the first test portion, the width of the first main body portion gradually decreasing from the middle position of the first main body portion to both ends of the first main body portion; and / or, the second main gate includes a second main body portion connected between the third pad and the second test portion, the width of the second main body portion gradually decreasing from the middle position of the second main body portion to both ends of the second main body portion.
7. The solar cell according to claim 1, characterized in that, The spacing between adjacent first and second fine gates is D, and the length of the first test section and / or the second test section is greater than D and less than 4D.
8. The solar cell according to claim 1, characterized in that, The width of the first test section is smaller than the width of the second pad; and / or, the width of the second test section is smaller than the width of the fourth pad.
9. The solar cell according to claim 1 or 8, characterized in that, The width ratio of the first test section to the width of the second pad is 0.6 to 0.9; and / or the width ratio of the second test section to the width of the fourth pad is 0.6 to 0.
9.
10. The solar cell according to claim 1, characterized in that, The second fine grid forms a first interruption at the position of the first test section, and the second fine grid is spaced apart from the first test section through the first interruption; The second fine gate forms a second break at the location of the second pad. The second fine gate is spaced from the second pad through the second break, and the width of the first break is smaller than the width of the second break.
11. The solar cell according to claim 1 or 10, characterized in that, The first fine grid forms a third discontinuity at the position of the second test section, and the first fine grid is spaced apart from the second test section through the third discontinuity; The first fine gate forms a fourth break at the fourth pad position, the first fine gate is spaced apart from the fourth pad through the fourth break, and the width of the third break is smaller than the width of the fourth break.
12. A battery assembly, characterized in that, Includes the solar cell described in any one of claims 1 to 11.
13. A photovoltaic system, characterized in that, Includes the battery assembly as described in claim 12.