Multi-cavity circuit board burn-in test box
By designing a multi-cavity circuit board aging test chamber, the problem of single-condition testing in existing technologies is solved, enabling comprehensive testing of circuit boards under different conditions, obtaining more comprehensive data, and improving the accuracy and reliability of test results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- DONGGUAN HANGWEI VIDEO TECH CO LTD
- Filing Date
- 2025-07-04
- Publication Date
- 2026-07-24
AI Technical Summary
Existing circuit board aging test chambers can usually only perform tests under single conditions, making it difficult to meet the comparative testing needs under multiple factors and to comprehensively obtain performance change data of circuit boards under various conditions.
The multi-chamber circuit board aging test chamber is designed, which includes a main test chamber and several sets of test comparison chambers. It is equipped with a circuit board fixing mechanism, a temperature control heater, a temperature display screen and a geared motor. It can conduct comparative tests under different conditions and maintain temperature stability through an insulated outer shell to ensure the accuracy and reliability of test results.
This technology enables comprehensive testing of circuit boards under different conditions, obtains more comprehensive test data, improves the accuracy and reliability of test results, and enhances the versatility and ease of operation of the device.
Smart Images

Figure CN224553318U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of testing equipment technology, specifically a multi-cavity circuit board aging test chamber. Background Technology
[0002] In today's booming electronics industry, circuit boards, as core components of electronic devices, directly affect the performance and lifespan of the entire electronic product through their quality and reliability. Circuit board aging testing, a crucial step in ensuring product quality, aims to simulate the harsh environmental conditions circuit boards experience during long-term use, thereby exposing potential defects in advance, screening out substandard products, and improving overall product quality.
[0003] Existing circuit board aging test chambers have relatively limited testing functions, typically only capable of performing aging tests under fixed conditions. For example, patent publication (announcement) number CN219891366U discloses a circuit board high-temperature aging test chamber with only one test chamber, which is insufficient to meet the comparative testing needs under different combinations of factors such as temperature and environment. It cannot comprehensively obtain performance change data of the circuit board under various conditions, which is not conducive to in-depth analysis of the reliability of the circuit board. Utility Model Content
[0004] The purpose of this invention is to provide a multi-cavity circuit board aging test chamber to solve the problem mentioned in the background art of the lack of comparative testing in existing circuit board aging test chambers.
[0005] To achieve the above objectives, this utility model provides the following technical solution:
[0006] A multi-cavity circuit board aging test chamber includes a test chamber base. The top surface of the test chamber base is equipped with a main test chamber for circuit board testing and several sets of test comparison chambers. The main test chamber and several sets of test comparison chambers are each equipped with a circuit board fixing mechanism for fixing the circuit board.
[0007] The outer walls of the main test chamber and several sets of test comparison chambers are equipped with temperature display screens for displaying the internal test temperature, and temperature control heaters are installed at the bottom of the main test chamber and several sets of test comparison chambers.
[0008] The circuit board fixing mechanism includes a base and a top seat arranged parallel to each other. Both ends of the top seat are vertically mounted with hollow support columns. A movable column with an inverted T-shaped cross-section is installed inside the support column. A return spring is wound around the outer wall of the movable column. The top of the movable column is connected to both ends of the top seat.
[0009] Preferably, both the main test chamber and the several sets of test comparison chambers include an insulated outer shell. By insulating the main test chamber and the several sets of test comparison chambers, heat loss during the test can be effectively reduced. In circuit board aging tests, a stable temperature environment is crucial. The insulated outer shell can maintain the stability of the temperature inside the chamber, avoiding excessive temperature fluctuations due to rapid heat loss, thereby providing a more accurate aging test environment for the circuit board and improving the accuracy and reliability of the test results.
[0010] Preferably, the outer walls of the main test chamber and several sets of test comparison chambers are equipped with geared motors to drive the circuit board fixing mechanism to rotate at a uniform speed. This uniform rotation of the circuit board fixing mechanism by the geared motors ensures that the circuit board is heated evenly during the test. During aging tests, uneven heating of the circuit board in certain areas can lead to deviations in the test results, failing to accurately reflect the circuit board's performance. The geared motors prevent this from happening, ensuring that the test data accurately reflects the actual condition of the circuit board during the aging process.
[0011] Preferably, the main test chamber and several sets of test comparison chambers have an opening on one side, and the edge of the opening is connected to a door via a hinge, facilitating the operator's handling of the circuit board. When testing is required, the circuit board can be easily placed inside the chamber and secured by opening the door; after testing, the circuit board can also be quickly removed by opening the door, improving the convenience and efficiency of the testing operation.
[0012] Preferably, the chamber door is equipped with a heat-insulating glass window, which allows the operator to observe the testing status of the circuit board inside the chamber at any time during the testing process, keep track of the testing progress and the status of the circuit board, and effectively reduce heat transfer, maintain the stability of the temperature inside the chamber, and avoid heat loss due to frequent opening of the chamber door for observation, which would affect the test results.
[0013] Preferably, the top surface of the base and the bottom surface of the top seat are provided with several sets of corresponding clamping platforms with U-shaped cross sections for holding the circuit board. This can better fit the edge of the circuit board, increase the stability of clamping, prevent the circuit board from shaking during the test and affecting the test results, and ensure that the test process is carried out smoothly.
[0014] Preferably, a locking bolt for locking is installed on the outer wall of one side of the clamping platform on the base, which makes the circuit board fixing mechanism more versatile and can adapt to circuit boards of various specifications. This reduces the trouble of changing the fixing device when testing circuit boards of different sizes, and reduces testing costs and time costs.
[0015] Compared with existing technologies, the advantages of this utility model are as follows: This multi-cavity circuit board aging test chamber, through its test chamber base, main test chamber, and several sets of comparison test chambers, allows for simultaneous normal circuit board aging testing in the main test chamber and comparative testing under different conditions in the comparison test chambers, facilitating the acquisition of more comprehensive test data. The circuit board fixing mechanisms installed in both the main test chamber and the comparison test chambers enable convenient and quick circuit board fixing. Furthermore, the movable column and return spring allow the top seat to move relative to the support column, adapting to circuit boards of different sizes and improving the device's versatility. The temperature display screen installed on the outer wall can display the internal test temperature in real time, facilitating operator monitoring. The temperature-controlled heater installed at the bottom of the chamber precisely controls the test environment temperature, ensuring the accuracy and reliability of the test results. Attached Figure Description
[0016] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are explained in detail together with the embodiments of the present invention, but do not constitute a limitation thereof.
[0017] Figure 1 This is a schematic diagram of the structure of this utility model;
[0018] Figure 2 This is a schematic diagram of the cross-sectional structure of the present invention;
[0019] Figure 3 This is a schematic diagram of the circuit board fixing mechanism of this utility model;
[0020] 10. Test box holder;
[0021] 20. Test chamber; 21. Temperature display screen; 22. Insulated outer shell; 23. Temperature-controlled heater; 24. Gear motor;
[0022] 30. Box door; 31. Insulated glass window;
[0023] 40. Test comparison box;
[0024] 50. Circuit board fixing mechanism; 51. Base; 52. Top seat; 53. Support column; 54. Movable column; 55. Clamping platform; 56. Locking bolt; 57. Return spring;
[0025] 60. Circuit board. Detailed Implementation
[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the embodiments and accompanying drawings. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0027] In the description of this utility model, it should be understood that the terms "center", "vertical", "horizontal", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only used to facilitate the description of this utility model and to simplify the description, and do not indicate or imply that the device or component referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.
[0028] Multi-cavity circuit board aging test chamber, such as Figures 1-3 As shown, the test chamber includes a test chamber base 10. The top surface of the test chamber base 10 is equipped with a main test chamber 20 for testing the circuit board 60 and several sets of test comparison chambers 40. Each of the main test chamber 20 and the several sets of test comparison chambers 40 has a circuit board fixing mechanism 50 for fixing the circuit board 60. A temperature display screen 21 for displaying the internal test temperature is installed on the outer wall of the main test chamber 20 and the several sets of test comparison chambers 40. A temperature-controlled heater 23 is installed at the bottom of the main test chamber 20 and the several sets of test comparison chambers 40. The circuit board fixing mechanism 50 includes a base 51 and a top seat 52 arranged parallel to each other. Hollow support columns 53 are vertically installed at both ends of the top seat 52. A movable column 54 with an inverted T-shaped cross-section is installed inside the support column 53. A return spring 57 is wound around the outer wall of the movable column 54. The top of the movable column 54 is connected to the top seat 52. At both ends, through the set test chamber base 10, test main chamber 20 and several sets of test comparison chambers 40, normal circuit board aging tests can be performed in the test main chamber 20, while comparative tests under different conditions can be performed in the several sets of test comparison chambers 40, which is convenient for obtaining more comprehensive test data. The circuit board fixing mechanism 50 installed in the test main chamber 20 and several sets of test comparison chambers 40 can conveniently and quickly fix the circuit board 60, and the setting of the movable column 54 and the return spring 57 allows the top seat 52 to move relative to the support column 53, which can easily adapt to circuit boards 60 of different sizes and improve the versatility of the device. The temperature display screen 21 installed on the outer wall can display the internal test temperature in real time, which is convenient for operators to monitor. The temperature control heater 23 installed at the bottom of the interior can accurately control the test environment temperature and ensure the accuracy and reliability of the test results.
[0029] Furthermore, the main test chamber 20 and several sets of test comparison chambers 40 all include an insulated outer shell 22, which can effectively reduce heat loss during the test, maintain the stability of the test environment temperature, and ensure that the circuit board 60 is in a relatively stable temperature environment during the aging test, thereby improving the accuracy of the test results.
[0030] Specifically, a geared motor 24 is installed on the outer wall of the main test chamber 20 and several sets of test comparison chambers 40 to drive the circuit board fixing mechanism 50 to rotate at a constant speed. The geared motor 24 can drive the circuit board fixing mechanism 50 to rotate at a constant speed, so that the circuit board 60 can be heated evenly during the test, avoiding the influence of local temperature differences on the test results and further ensuring the accuracy of the test.
[0031] The main test chamber 20 and several sets of test comparison chambers 40 have openings on one side, and the edges of the openings are connected to chamber doors 31 by hinges. The chamber doors 31 are equipped with heat-insulating glass windows 31, which allows operators to observe the testing status of the internal circuit boards 60 without opening the chamber doors 31. At the same time, the heat-insulating glass windows 31 can reduce heat transfer and maintain a stable temperature inside the chamber. The chamber doors 31 can also be opened when needed to take out and put in the circuit boards 60, which improves the convenience of use.
[0032] In addition, the top surface of the base 51 and the bottom surface of the top seat 52 are provided with several sets of corresponding clamping platforms 55, each with a U-shaped cross section, for clamping the circuit board 60. A locking bolt 56 for locking is installed on one outer wall of the clamping platform 55 on the base 51, which can firmly clamp the circuit board 60. The position of the clamping platform 55 can be adjusted according to the actual size of the circuit board 60, and then locked with the locking bolt 56 to ensure that the circuit board 60 is fixed and stable during the test and will not shake, thus ensuring the smooth progress of the test.
[0033] Working principle of this multi-cavity circuit board aging test chamber:
[0034] First, open the door 31 of the test main box 20 and the test comparison box 40, place the circuit board 60 between the clamp 55 of the base 51 and the top seat 52, and tighten the locking bolt 56 to fix the circuit board 60.
[0035] Next, close the chamber door 31, set the required test temperature through the temperature control heater 23, and the heat-insulating outer shell 22 can reduce heat loss; at the same time, start the geared motor 24 to drive the circuit board fixing mechanism 50 to rotate at a constant speed, so that the circuit board 60 is heated evenly.
[0036] During the test, the condition of the circuit board 60 can be observed through the heat-insulating glass window 31 on the door 31, and the internal test temperature can be monitored in real time through the temperature display screen 21 on the outer wall.
[0037] After the test is completed, wait for the temperature inside the chamber to drop to a safe range, open the chamber door 31, loosen the locking screw 56, and take out the circuit board 60 to complete the test.
[0038] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely preferred examples and are not intended to limit the utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claimed utility model. The scope of protection of this utility model is defined by the appended claims and their equivalents.
Claims
1. A multi-cavity circuit board aging test chamber, including a test chamber base (10), characterized in that: The test box base (10) is equipped with a test main box (20) for testing the circuit board (60) and several sets of test comparison boxes (40) on its top surface. The test main box (20) and several sets of test comparison boxes (40) are each equipped with a circuit board fixing mechanism (50) for fixing the circuit board (60). Temperature display screens (21) for displaying internal test temperatures are installed on the outer walls of the main test chamber (20) and several sets of test comparison chambers (40), and temperature control heaters (23) are installed at the bottom of the main test chamber (20) and several sets of test comparison chambers (40). The circuit board fixing mechanism (50) includes a base (51) and a top seat (52) arranged in parallel. Both ends of the top seat (52) are vertically installed with hollow support columns (53). The support columns (53) are equipped with movable columns (54) with an inverted T-shaped cross section. The outer wall of the movable column (54) is wound with a return spring (57). The top of the movable column (54) is connected to both ends of the top seat (52).
2. The multi-cavity circuit board aging test chamber according to claim 1, characterized in that: The main test chamber (20) and several sets of test comparison chambers (40) all include an insulated outer shell (22).
3. The multi-cavity circuit board aging test chamber according to claim 1, characterized in that: The outer walls of the main test box (20) and several sets of test comparison boxes (40) are equipped with a geared motor (24) for driving the circuit board fixing mechanism (50) to rotate at a constant speed.
4. The multi-cavity circuit board aging test chamber according to claim 1, characterized in that: The test main box (20) and several sets of test comparison boxes (40) have openings on one side, and the edges of the openings are connected to the box doors (30) by hinges.
5. The multi-cavity circuit board aging test chamber according to claim 4, characterized in that: The box door (30) is equipped with an insulated glass window (31).
6. The multi-cavity circuit board aging test chamber according to claim 1, characterized in that: The top surface of the base (51) and the bottom surface of the top seat (52) are provided with several sets of clamps (55) that are corresponding in position, have U-shaped cross sections and are used to clamp the circuit board (60).
7. The multi-cavity circuit board aging test chamber according to claim 6, characterized in that: Locking bolts (56) for locking are installed on the outer wall of one side of the clamp (55) on the base (51).