Test and measurement instrument and automatic configuration method

Abstract

To automatically set a test measuring instrument.SOLUTION: The test and measurement instrument 10 includes a channel 16 for connecting devices under test (DUTs) 26 and 28 via a bus, and a user interface 18 for providing user input to the test and measurement instrument 10 by a user. There is a user interface 18 that enables viewing of information about the DUT26 and 28, and one or more processors 24 that receive and convert a signal from a DUT in one of the one or more DUT26 and 28 into a waveform, receive user input indicating a bus type and use the bus type to identify parameters for auto-configuring detection, auto-configure one or more parameter values for the bus, and use the parameter values to decode the waveform to generate a decoding result. And execute a program that causes the one or more processors 24 to perform a process of displaying a decoding result on the user interface 18.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present disclosure relates to the field of digital signal processing in test and measurement instruments, and more particularly to automatically configuring test and measurement instruments to decode traffic signals on a communication bus. [Background technology]

[0002] Various test and measurement instruments, such as mixed signal oscilloscopes (MSOs), offer protocol decode solutions for debugging and verifying various serial bus standards. These buses require several parameters for the oscilloscope to decode the input waveform received. These parameters include threshold, data rate, input source, and polarity. The threshold is required to digitize the waveform as a 1 or 0 depending on the set level. Non-clocked serial buses, such as CXPI (Clock Extension Peripheral Interface) and NRZ (Non-Return to Zero), require the data rate parameter to digitize the waveform. The input source identifies the channel to which the signal is connected. The polarity is required to determine whether the signal is positive logic (Active High or Normal) or negative logic (Active Low or Invert). [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Laid-Open No. 2001-289880 [Patent Document 2] Japanese Patent Application Laid-Open No. 2009-236765 [Non-patent literature]

[0004] [Non-Patent Document 1] "Tektronix oscilloscope" introduction site, Tektronix, [online], [searched June 26, 2025], Internet<https: / / www.tek.com / ja / products / oscilloscopes> [Non-patent document 2] "Mixed Signal Oscilloscope" introduction site, Tektronix, [online], [Retrieved June 26, 2025], Internet<https: / / www.tek.com / ja / oscilloscope-mixed-signal-oscilloscope> Summary of the Invention [Problem to be solved by the invention]

[0005] Currently, users set all these configuration parameters by examining the signal from the device under test (DUT). Some parameters, such as threshold and data rate, are very difficult to set when the signal is noisy. If these parameters are not set correctly, decoding will not be performed correctly. Users must repeatedly try different values ​​for these parameters until they find the right value to decode. This is a tedious problem for users. [Means for solving the problem]

[0006] The disclosed embodiments provide a test and measurement instrument capable of automatically setting specific bus parameters. These embodiments automatically detect specific parameters, such as voltage thresholds, data rates, and skew, from signals on the bus. The test and measurement instrument then displays these values ​​on a user interface, allowing a user to record the values ​​and decode the data on the bus. As used herein, the terms "autoset" and "autosetting" refer to the process by which specific parameter values ​​are automatically detected and set by the test and measurement instrument or other device that can determine the values ​​from traffic on the bus. When the term "Autoset" appears alphabetically, it refers to a device or function or setting of the test and measurement instrument.

[0007] The Autoset feature in test and measurement equipment uses sophisticated algorithms and a series of measurements to analyze the input waveform. The oscilloscope is configured to provide the best possible display based on the waveform's characteristics. Similarly, the Autoset feature for configuring a bus uses algorithms to determine configuration options such as threshold, rate, and skew, making it easy to determine input options. Threshold, data rate, and skew are just a few examples of parameters determined and configured by Autoset. However, these specific examples are not intended or should be inferred as limiting. [Brief explanation of the drawings]

[0008] [Figure 1] FIG. 1 shows an embodiment of a test and measurement device. [Figure 2] Figure 2 shows an embodiment of the current user interface. [Figure 3] Figure 3 shows the user interface with the Autoset feature. [Figure 4] FIG. 4 shows a flow chart of one embodiment for automatically detecting and setting thresholds. [Figure 5]FIG. 5 shows a flow chart of an embodiment for automatically detecting and setting the data rate. [Figure 6] Figure 6 shows the waveforms decoded using the auto-detected parameters. DETAILED DESCRIPTION OF THE INVENTION

[0009] FIG. 1 illustrates an embodiment of a test and measurement instrument. The test and measurement instrument 10 is connected to a test fixture 14, which is in turn connected to one or more DUTs 26 and 28. In one embodiment, the DUT 26 may comprise a storage device, and the DUT 28 may comprise a computing device or personal computer (PC). The connections may include one or more probes on the test fixture. Although both are referred to as DUTs, the decoding operation applies to either the computing device 28 or the storage device 26 that is transmitting the data. The test fixture 14 transmits data through one or more channels 16 on the test and measurement instrument 10. In some embodiments, the test fixture 14 may include the probes. As noted above, the present embodiments typically use only one probe and one channel on the test and measurement instrument, although many more may be used.

[0010] Data from test fixture 14, if analog, is converted to digital by one or more analog-to-digital converters (ADCs), such as ADC 20. ADC 20 converts the analog data to digital data so that one or more processors, such as processor 24, can operate on the digital data. If the received data consists of digital data, the digital data bypasses ADC 20. Test and measurement instrument 10 may include memory 22, which allows one or more processors 24 to store digital and analog data and to contain programs (code) executed by one or more processors 24. User interface 18 allows test and measurement instrument 10 to display information to a user, such as waveforms of received data, measurements of those waveforms, and decoded data, and may include controls, such as buttons, knobs, sliders, and trackballs, to allow a user to manipulate input signals.

[0011] The test fixture 14 may provide a communications bus using serial bus standards such as Controller Area Network (CAN), Universal Serial Bus (USB), Peripheral Component Interconnect Express (PCIe), and DisplayPort. Devices 26 and 28 connected to the test fixture may send and receive data over the bus to and from the test and measurement equipment 10 or other devices connected to the test fixture 14. The configuration may include the test fixture 14, although the test fixture 14 may be replaced by a probe. In some embodiments, the test fixture 14 may take the form of a USB hub, as described below. Other variations of the setup may be used for different protocols.

[0012] Figure 2 shows a current example of a user interface on a test and measurement instrument. In the user interface, buttons with bold text indicate that the display is selected as "On," the bit order is selected as "MS first," the polarity is selected as "Normal," and so on. In this example, the bus format is selected as NRZ at 32. This is a user selection; the down arrow allows the user to select from a list of bus formats. In this user interface, the user must enter a threshold at 34 and a bit rate (data rate) at 36.

[0013] As mentioned above, when using traditional test and measurement equipment, users determine these values ​​by examining and measuring the signal. This can lead to inaccurate inputs if the signal is noisy or if the peak-to-peak measurement amplitude is small. Setting the data rate and threshold can be difficult, leading to inaccurate decoding results. Furthermore, some protocols, such as near-field communication (NFC), require different settings for each acquisition. Users who perform continuous testing must manually set these parameters after one acquisition and then repeat them for each acquisition.

[0014] FIG. 3 shows a user interface 40 that provides the user with the option to automatically set values ​​at 48. The user specifies the bus type at 42. One or more processors on the test and measurement instrument of FIG. 1 then execute a program (code) that analyzes the data signals on the bus to determine threshold values ​​and displays those values ​​to the user at 44. The one or more processors also determine the data rate and display that value to the user on the user interface at 46. The one or more processors use these values ​​to decode the data on the bus (described in more detail with respect to FIG. 6).

[0015] Figure 4 shows a flowchart of an embodiment for determining voltage thresholds from signal analysis. The process begins at 50, where the test and measurement instrument checks user input to determine whether Autoset is on at 52. If Autoset is not on, the process ends and the user proceeds to manually run the test. As shown in Figure 6, the test and measurement instrument may display the user interface 40 of Figure 3 simultaneously with the decoded results, allowing the user to change settings as needed.

[0016] If Autoset is on at 52, the process checks the user-selected bus type at 56. The process then uses the bus type to identify and determine parameters at 58. In this case, the determined parameters include thresholds. The process then determines at 60 whether the required threshold has two levels. A NO answer indicates the signal has more than two levels, and the process continues at 62 with calculating a mid-threshold based on the peak-to-peak values. The process then calculates a low and high threshold at 64. In one embodiment, the high level results from taking the average of all peaks above the mid-threshold, and the low level results from taking the average of all peaks below the mid-level. These two levels are displayed on the user interface and used to decode the traffic signal. If the answer to the question at 60 is that there are two levels, the average value between the high and low values ​​is taken as a threshold at 68.

[0017] FIG. 5 shows a flowchart of an embodiment of determining a data rate. The process begins at 80. As with the previous example, the process checks whether Autoset is on at 82; if not, the process returns at 84 and terminates. If Autoset is on at 82, the bus format input is read at 86. A data rate measurement process then occurs at 88 to determine the data rate of the data traffic on the bus. In one embodiment, the process calculates the unit interval (UI) by using multiple edges of the waveform to calculate the number of bits between edges. The unit interval gives the data rate as 1 / UI. The process then displays the data rate on the user interface and uses this to decode the data on the bus at 92.

[0018] In both Figures 4 and 5, the returns at 70 and 92, respectively, allow the user to go back and repeat the above process if necessary. As noted above, some protocols require parameters to be entered for each acquisition (waveform data acquisition). This repetition allows the user to avoid the manual process and have the device determine the parameters required for each acquisition.

[0019] Figure 6 shows an embodiment of a portion of a user interface of a test and measurement instrument. The user interface 40 shown in Figure 3 is replicated on the screen of the user interface, showing the threshold value at 44 as 2.12 mV and the data rate at 46 as 6.25 Gbps. This is shown in boxes 94 and 96. The decoded signal is displayed at 98.

[0020] In this way, users can perform more accurate decoding of bus data traffic without having to manually determine and enter values, which improves decoding accuracy and eliminates the need for users to manually calculate threshold values.

[0021] Aspects of the disclosed technology may operate on specially created hardware, firmware, digital signal processors, or specially programmed general-purpose computers, including processors that operate according to programmed instructions. The terms "controller" or "processor" herein contemplate microprocessors, microcomputers, ASICs, and dedicated hardware controllers, among others. Aspects of the disclosed technology may be implemented with computer-usable data and computer-executable instructions, such as one or more program modules, executed by one or more computers (including a monitoring module) or other devices. Generally, program modules include routines, programs, objects, components, data structures, etc., which, when executed by a processor in a computer or other device, perform particular tasks or implement particular abstract data types. Computer-executable instructions may be stored in computer-readable storage media, such as hard disks, optical disks, removable storage media, solid-state memory, RAM, etc. Those skilled in the art will appreciate that the functionality of the program modules may be combined or distributed as desired in various embodiments. Furthermore, such functionality may be embodied in whole or in part in firmware or hardware equivalents, such as integrated circuits, field programmable gate arrays (FPGAs), etc. Certain data structures may be used to more effectively implement one or more aspects of the disclosed technology, and such data structures are considered within the scope of the computer-executable instructions and computer-usable data described herein.

[0022] The disclosed aspects may, in some cases, be implemented in hardware, firmware, software, or any combination thereof. The disclosed aspects may also be implemented as instructions carried by or stored on one or more computer-readable media, which may be read and executed by one or more processors. Such instructions may be referred to as a computer program product. As used herein, computer-readable media refers to any medium that can be accessed by a computing device. By way of example, and not limitation, computer-readable media may include computer storage media and communication media.

[0023] "Computer storage media" means any medium that can be used to store computer-readable information. By way of example and not limitation, computer storage media may include random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory and other memory technologies, compact disc read-only memory (CD-ROM), digital video disc (DVD) and other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage and other magnetic storage devices, and any other volatile or nonvolatile, removable or non-removable medium implemented in any technology. "Computer storage media" excludes signals themselves and transitory forms of signal transmission.

[0024] A communication medium means any medium usable for communicating computer-readable information. By way of example, and not limitation, communication media may include coaxial cable, fiber optic cable, air, or any other medium suitable for communicating electrical, optical, radio frequency (RF), infrared, acoustic, or other types of signals. Example

[0025] The following examples are provided to aid in understanding the technology disclosed in this application. Embodiments of the technology may include one or more of the examples described below, and any combination thereof.

[0026] Example 1 is a test and measurement instrument comprising one or more ports for connecting one or more devices under test (DUTs) to one or more channels of the test and measurement instrument via a bus, a user interface for enabling a user to provide user input to the test and measurement instrument, a display for enabling the user to view information about the one or more DUTs, and one or more processors configured to execute a program that causes the one or more processors to perform the following processes: receive a signal from one of the one or more DUTs and convert it into a waveform; receive user input indicating a bus type; use the bus type to identify parameters to be detected by automatic configuration; automatically configure one or more parameter values ​​of the bus; decode the waveform using the parameter values ​​to generate a decoded result; and display the decoded result on the user interface.

[0027] Example 2 is the test and measurement instrument of Example 1, wherein the program that causes the one or more processors to automatically set one or more parameter values ​​includes a program that causes the one or more processors to measure the data rate of the bus and automatically set the data rate.

[0028] Example 3 is the test and measurement instrument of Example 2, wherein the program that causes the one or more processors to perform the process of measuring the data rate includes a program that causes the one or more processors to perform a process of determining a unit interval using multiple edges in the waveform, and a process of determining the data rate using the reciprocal of the unit interval.

[0029] Example 4 is the test and measurement instrument of Example 2, wherein the program that causes the one or more processors to automatically set the data rate includes a program that causes the one or more processors to set the data rate in a data rate value field on the user interface and decode the waveform using the data rate.

[0030] Example 5 is a test and measurement device according to any one of Examples 1 to 4, wherein the program causing the one or more processors to automatically set one or more parameter values ​​includes a program causing the one or more processors to automatically set a threshold value.

[0031] Example 6 is the test and measurement device of Example 5, wherein the program that causes the one or more processors to perform the process of automatically setting the threshold includes a program that causes the one or more processors to perform, when the bus format has one threshold, a process of calculating an average value of the peak-to-peak voltage by sequentially processing all edges in the waveform, and a process of determining the threshold value by using the average value of the peak-to-peak voltage.

[0032] Example 7 is the test and measurement instrument of Example 5, wherein the program that causes the one or more processors to automatically set the thresholds includes a program that causes the one or more processors to, when the bus format has two thresholds, calculate a middle threshold using measured peak-to-peak voltage values ​​of the waveform, calculate an average value of peaks above the middle threshold to determine a high threshold, and calculate an average value of peaks below the middle threshold to determine a low threshold.

[0033] Example 8 is the test and measurement instrument of any of Examples 1 to 7, wherein the one or more processors are further configured to continuously update the parameter values.

[0034] Example 9 is the test and measurement instrument of any of Examples 1 to 8, wherein the one or more processors are configured to, for a plurality of waveforms, repeat the following processes after acquiring each of the waveforms (acquiring waveform data): automatically setting one or more parameter values ​​of the bus; decoding the waveform using the parameter values ​​to generate a decoded result; and displaying the decoded result on the user interface.

[0035] Example 10 is a method including: receiving a signal from one DUT among one or more DUTs and converting the signal into a waveform; receiving user input indicating a bus type; identifying parameters to be detected by auto-configuration using the bus type; auto-configuring one or more parameter values ​​for the bus; decoding the waveform using the one or more parameter values ​​to generate a decoded result; and displaying the decoded result on a user interface.

[0036] Example 11 is the method of example 10, wherein determining the parameter using the bus type includes measuring a data rate of the bus.

[0037] Example 12 is the method of either example 11 or 12, wherein the process of measuring the data rate of the bus includes a process of determining a unit interval using a plurality of edges in the waveform, and a process of determining the data rate using the reciprocal of the unit interval.

[0038] Example 13 is a method of any of Examples 10 to 12, wherein the process of automatically setting one or more parameter values ​​includes a process of setting the data rate in a data rate value field on the user interface.

[0039] A fourteenth embodiment is the method according to any one of the tenth to thirteenth embodiments, in which the process of automatically setting one or more parameter values ​​includes a process of automatically setting a threshold value.

[0040] Example 15 is the method of Example 14, wherein the process of automatically setting the threshold includes, when the bus format has one threshold, a process of calculating an average value of peak-to-peak voltage by sequentially processing all edges in the waveform, and a process of determining the threshold value by employing the average value of peak-to-peak voltage.

[0041] Example 16 is the method of Example 14, wherein the process of automatically setting the thresholds includes, when the bus format has two thresholds, calculating a middle threshold using a measured peak-to-peak voltage of the waveform, calculating an average value of peaks above the middle threshold to determine a high threshold, and calculating an average value of peaks below the middle threshold to determine a low threshold.

[0042] Example 17 is the method of any of Examples 10 to 16, further comprising continuously updating the one or more parameter values.

[0043] Example 18 is the method of any of Examples 10 to 17, further including a process of repeating the processes of automatically setting, decoding, and displaying a plurality of waveforms after acquiring each of the waveforms (obtaining waveform data).

[0044] All features disclosed in the specification, claims, abstract and drawings, and all steps in any disclosed method or process, may be combined in any combination, except where at least some of such features or steps are mutually exclusive combinations. Each feature disclosed in the specification, abstract, claims and drawings may be replaced by an alternative feature serving the same, equivalent or similar purpose, unless expressly stated otherwise.

[0045] Additionally, the description of this application refers to specific features. It should be understood that the disclosure herein includes all possible combinations of these specific features. When a specific feature is disclosed in connection with a particular aspect or example, that feature can also be used in connection with other aspects and examples, to the extent possible.

[0046] Furthermore, when this application refers to a method having two or more defined steps or processes, these defined steps or processes may be performed in any order or simultaneously, unless the circumstances do not preclude this possibility.

[0047] Although specific embodiments of the invention have been illustrated and described for purposes of illustration, it will be appreciated that various modifications can be made therein without departing from the spirit and scope of the invention. Accordingly, the invention should not be limited except as by the appended claims. [Explanation of symbols]

[0048] 10 Test and measurement equipment 14 Test Fixture 16 One or more channels 18 User Interface 20 One or more analog-to-digital converters 22 Memory 24 One or more processors 26 Device under test (storage device) 28 Device Under Test (Computing Device or PC)

Claims

1. 1. A test and measurement device comprising: one or more ports for connecting one or more devices under test (DUTs) to one or more channels of the test and measurement instrument via a bus; a user interface for enabling a user to provide user input to the test and measurement instrument; a display that allows the user to view information about the one or more DUTs; one or more processors Equipped with The one or more processors receiving a signal from one of the one or more DUTs and converting it into a waveform; receiving user input indicating a bus type; Identifying parameters to be detected by automatic configuration using the bus format; automatically setting one or more parameter values ​​of the bus; decoding the waveform using the parameter values ​​to generate a decoded result; A process of displaying the decoded result on the user interface. a test and measurement instrument configured to execute a program that causes the one or more processors to:

2. The program for causing the one or more processors to perform a process of automatically setting one or more parameter values ​​comprises: determining a unit interval using multiple edges in the waveform; determining a data rate using the reciprocal of the unit interval; 2. The test and measurement instrument of claim 1, further comprising a program for causing said one or more processors to measure the data rate of said bus and automatically set said data rate by:

3. The program for causing the one or more processors to perform a process of automatically setting one or more parameter values ​​comprises: measuring the data rate of said bus; automatically setting the data rate by setting the data rate in a data rate value field on the user interface; Decoding the waveform using the data rate.

2. The test and measurement instrument of claim 1, further comprising a program that causes said one or more processors to:

4. The program that causes the one or more processors to perform a process of automatically setting one or more parameter values ​​includes, when the bus format has one threshold, calculating the average peak-to-peak voltage by sequentially processing all edges in the waveform; employing the average value of the peak-to-peak voltage to determine the threshold value; 2. The test and measurement instrument of claim 1, further comprising a program that causes the one or more processors to automatically set the threshold value by:

5. The program that causes the one or more processors to automatically set one or more parameter values ​​includes, when the bus format has two thresholds, calculating an intermediate threshold value using a peak-to-peak voltage measurement of said waveform; calculating an average value of peaks above the intermediate threshold to determine a high threshold; A process of calculating the average value of the peaks below the intermediate threshold to determine the low threshold; 2. The test and measurement instrument of claim 1, further comprising a program that causes the one or more processors to automatically set the threshold value by:

6. 2. The test and measurement instrument of claim 1, wherein the one or more processors are configured to repeat, for a plurality of waveforms after acquiring each of the waveforms, the processes of automatically setting one or more parameter values ​​of the bus, decoding the waveform using the parameter values ​​to generate a decoded result, and displaying the decoded result on the user interface.

7. receiving a signal from one of the one or more DUTs and converting it into a waveform; receiving user input indicating a bus type; Identifying parameters to be detected by automatic configuration using the bus format; automatically setting one or more parameter values ​​of the bus; decoding the waveform using the one or more parameter values ​​to generate a decoded result; The process of displaying the above decoded results on the user interface. An automatic setting method comprising:

8. The process of identifying parameters using the above bus format is as follows: determining a unit interval using multiple edges in the waveform; The reciprocal of the unit interval is used to calculate the data rate.

8. The automatic setting method according to claim 7, further comprising the step of measuring the data rate of said bus by:

9. The process of automatically setting one or more parameter values ​​includes, when the bus format has one threshold, calculating the average peak-to-peak voltage by sequentially processing all edges in the waveform; determining the threshold value by taking an average value of the peak-to-peak voltage; 8. The automatic setting method according to claim 7, further comprising the step of automatically setting the threshold value by:

10. The process of automatically setting the threshold is as follows: calculating an intermediate threshold value using a peak-to-peak voltage measurement of said waveform; calculating an average value of peaks above the intermediate threshold to determine a high threshold; A process of calculating the average value of the peaks below the intermediate threshold to determine the low threshold; 8. The automatic setting method according to claim 7, further comprising the step of automatically setting the threshold value by:

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