Double loop two dimension shearing interference detector
An interference detection, double-loop technology, applied in measurement devices, optical devices, measurement optics, etc., can solve the problems of not clear fringes, complicated operations, errors, etc., and achieve the effect of saving resources and mesa
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Publication Date
- 2008-03-05
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1
Abstract
Description
technical field
[0001] The invention is a double-loop two-dimensional shearing interference detection device, which can realize the simultaneous detection, collection and computer automatic data processing of the broadband strong laser beam wavefront in the orthogonal direction (two-dimensional). The device can effectively realize the dynamic detection of the wavefront distortion of the broadband laser beam and the deformation process of the cavity mirror of the strong laser system. Background technique
[0002] In the prior art, Fu Lei et al. (see: Fu Lei, Xin Jianguo et al., Acta Optics Sinica, Vol. 20, No. 12, pp. 1667-1674, 2000) proposed a two-dimensional shear interference detection system with split optical paths. However, this system has several obvious disadvantages:
[0003] 1. Since the front and rear planes of the shearing mirror are uncoated, the energy of the beam is not fully utilized.
[0004] 2. The optical paths of the light reflected by the two planes of...
Examples
Embodiment Construction
[0020] Please refer to FIG. 1 first. FIG. 1 is a structural diagram of the optical path of the double-loop two-dimensional wavefront interferometer of the present invention, which is also the best embodiment of the present invention. As can be seen from the figure, the double-loop two-dimensional shearing interference detection device of the present invention is characterized in that it is composed of the beam expander 1 and the first beam splitter 2, 135 placed at 45° in the advancing direction of the laser beam to be measured. The second spectroscopic mirror 3 of ° placement and the second total reflection mirror 5 of 90 ° placement, the first reflection mirror 4 is set on the reflection optical path of the second reflection mirror 5, and the reflected light of this first reflection mirror 4 just Incident the second beam splitter 3 at 45°, the first CCD6 is arranged in the light transmission direction, and the third beam splitter 11 is placed at 45° in the reflected light dir...