Display panel inspection equipment

The inspection apparatus and method address the issue of contact noise in display panel inspections by using dual probes and varying voltages to capture and compensate for noise, enabling accurate defect detection.

CN111105738BActive Publication Date: 2024-12-24SAMSUNG DISPLAY CO LTD
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Patent Information

Application Number
CN201911023292.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Priority Date
2018-10-26
Filing Date
2019-10-25
Publication Date
2024-12-24
Estimated Expiration
2039-10-25

AI Technical Summary

Technical Problem

Existing display panel inspection methods fail to accurately detect defects due to contact noise generated by probe contact failures, leading to inaccurate defect detection.

Method used

An inspection apparatus and method that utilize a first and second probe to contact data and common voltage pads, generating varying data and common voltages to capture multiple images, compensating for contact noise by adjusting common voltage levels, and generating compensation data to remove noise from defect detection.

Benefits of technology

Accurately detects defects in display panels by compensating for contact noise, ensuring precise identification of line, pixel, and stain defects.

✦ Generated by Eureka AI based on patent content.

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Abstract

An inspection device for a display panel is disclosed, the inspection device comprising: a contact member including a first probe contacting a data pad of the display panel and a second probe contacting a common voltage pad of the display panel; a signal generator connected to the first probe, the signal generator configured to generate a first data voltage corresponding to a first gray level and a second data voltage corresponding to a second gray level; a power generator connected to the second probe, the power generator configured to generate a first common voltage and a second common voltage, the voltage level of the second common voltage being different from the voltage level of the first common voltage; and a defect detector configured to detect a defect of the display panel by removing contact noise generated due to a contact failure of the first probe and the second probe.
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Description

Technical Field

[0001] Example embodiments generally relate to an inspection apparatus for a display panel and an inspection method for a display panel using the inspection apparatus. Background Art

[0002] When manufacturing a display device, various inspections are performed to detect defects in the product. Defects can be detected by applying a test signal to the display panel using a probe and checking a short circuit or open circuit state between a gate line, a data line, and a pixel of the display panel. Here, contact noise may be generated due to contact (e.g., contact failure) of the probe or the like, so that the defect of the display panel may not be accurately detected. Summary of the invention

[0003] Aspects according to some example embodiments relate to an inspection apparatus for a display panel (eg, a display panel inspection apparatus) capable of accurately detecting defects of the display panel.

[0004] Another aspect according to some example embodiments relates to an inspection method for a display panel (eg, a display panel inspection method) capable of accurately detecting defects of the display panel.

[0005] According to an exemplary embodiment, an inspection device for a display panel may include: a contact member including a first probe and a second probe, the first probe being configured to contact a data pad of the display panel, the second probe being configured to contact a common voltage pad of the display panel; a signal generator coupled to the first probe, the signal generator being configured to generate a first data voltage corresponding to a first gray level and a second data voltage corresponding to a second gray level; a power generator coupled to the second probe, the power generator being configured to generate a first common voltage and a second common voltage, a voltage level of the second common voltage being different from a voltage level of the first common voltage; and a defect detector configured to detect a defect of the display panel by removing (e.g., compensating for) contact noise generated due to a contact failure of the first probe and the second probe.

[0006] In an exemplary embodiment, the defect detector may be configured to detect defects of the display panel based on a first inspection image detected when a first data voltage and a first common voltage are provided to the display panel through a contact member, a second inspection image detected when a first data voltage and a second common voltage are provided to the display panel through a contact member, and a third inspection image detected when a second data voltage and a first common voltage are provided to the display panel through a contact member.

[0007] In an exemplary embodiment, the first inspection image may include the defect of the display panel and the contact noise, and the second inspection image may include the defect of the display panel without the contact noise.

[0008] In an exemplary embodiment, the defect detector may be configured to detect the contact noise and the position and brightness of the defect of the display panel based on the first inspection image, and detect the position of the defect of the display panel based on the second inspection image.

[0009] In an exemplary embodiment, the defect detector may be configured to detect a position and brightness of contact noise included in the first inspection image based on the first inspection image and the second inspection image, and generate compensation data configured to compensate for the contact noise.

[0010] In an exemplary embodiment, the defect detector may be configured to provide the compensation data to the signal generator, and the signal generator may be configured to generate the second data voltage corresponding to the second gray level based on the compensation data.

[0011] In an exemplary embodiment, the defect detector may be configured to detect a defect of the display panel based on the third inspection image.

[0012] In an exemplary embodiment, the defect detector may include: a visual camera configured to image the display panel and acquire a first inspection image, a second inspection image, and a third inspection image; a first defect detector configured to detect a position and brightness of contact noise based on the first inspection image and the second inspection image, generate compensation data configured to compensate for the contact noise, and output the compensation data to a signal generator; and a second defect detector configured to detect defects of the display panel based on the third inspection image.

[0013] In some exemplary embodiments, the first data voltage may be configured to swing between a first voltage level and a second voltage level lower than the first voltage level, the first common voltage may have a voltage level between the first voltage level and the second voltage level, and the second common voltage may have a voltage level higher than the first voltage level.

[0014] In some exemplary embodiments, a difference between a voltage level of the second common voltage and a first voltage level of the first data voltage may be greater than or equal to a difference between the first voltage level of the first data voltage and a voltage level of the first common voltage.

[0015] In some example embodiments, when the display panel is a standard black panel, the first gray level is a maximum gray level value, and the second gray level may have a gray level value lower than that of the first gray level.

[0016] In some exemplary embodiments, when the display panel is a standard white panel, the first grayscale is a minimum grayscale value, and the second grayscale may have a grayscale value higher than that of the first grayscale.

[0017] According to an exemplary embodiment, an inspection method for a display panel may include: supplying a first data voltage corresponding to a first grayscale to a data pad of the display panel through a first probe and supplying a first common voltage to a common voltage pad of the display panel through a second probe; acquiring a first inspection image by imaging the display panel; supplying the first data voltage to the data pad through the first probe and supplying a second common voltage to the common voltage pad through the second probe, wherein a voltage level of the second common voltage is different from a voltage level of the first common voltage; acquiring a second inspection image by imaging the display panel; detecting a position and brightness of contact noise generated due to a contact failure of the first probe and the second probe based on the first inspection image and the second inspection image; generating compensation data configured to compensate for the brightness of the contact noise; supplying a second data voltage corresponding to a second grayscale to the data pad through the first probe and supplying the first common voltage to the common voltage pad through the second probe, wherein the second data voltage is generated based on the compensation data; acquiring a third inspection image by imaging the display panel; and detecting a defect of the display panel based on the third inspection image.

[0018] In an exemplary embodiment, the first data voltage may be configured to swing between a first voltage level and a second voltage level lower than the first voltage level.

[0019] In an exemplary embodiment, the first common voltage may have a voltage level between the first voltage level and the second voltage level.

[0020] In an exemplary embodiment, the second common voltage may have a higher voltage level than the first voltage level.

[0021] In an exemplary embodiment, a difference between a voltage level of the second common voltage and a first voltage level of the first data voltage may be greater than or equal to a difference between the first voltage level of the first data voltage and a voltage level of the first common voltage.

[0022] In an exemplary embodiment, when the display panel is a normal black panel, the first gray level may be a maximum gray level value, and the second gray level may have a gray level value lower than that of the first gray level.

[0023] In an exemplary embodiment, when the display panel is a normal white panel, the first gray level may be a minimum gray level value, and the second gray level may have a gray level value higher than that of the first gray level.

[0024] In an exemplary embodiment, the first inspection image may include the defect of the display panel and the contact noise, and the second inspection image may include the defect of the display panel without the contact noise.

[0025] According to an embodiment of the present disclosure, an inspection device for a display panel and an inspection method for a display panel can detect contact noise by changing the voltage level of a common voltage provided to a common voltage pad in a display panel (e.g., from a first common voltage to a second common voltage), and compensate for the contact noise by generating compensation data. Therefore, the inspection device for a display panel and the inspection method for a display panel can accurately detect defects of a display panel. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] The illustrative, non-limiting exemplary embodiments will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings.

[0027] Figure 1 is a block diagram illustrating an inspection apparatus for a display panel according to an exemplary embodiment.

[0028] Figure 2 It shows the use of Figure 1 A diagram of a process in which an inspection device detects defects of a display panel.

[0029] Figure 3 It is shown Figure 1 The test equipment includes the contact parts and Figure 2 Figure 4 shows a display panel of the .

[0030] FIG. 4A to FIG. 4C It is shown Figure 1 A diagram of the operation of a signal generator and a power generator included in the inspection device.

[0031] FIG. 5A to FIG. 5C is shown according to the description Figure 1 The operation of the defect detector included in the inspection equipment FIG. 4A to FIG. 4C The signal generator and power generator operate while Figure 1 Figure 2 shows a first inspection image to a third inspection image detected in a defect detector.

[0032] Figure 6 It is shown Figure 1 Block diagram of a defect detector included in an inspection device.

[0033] Figure 7 is a flowchart illustrating an inspection method for a display panel according to an exemplary embodiment. DETAILED DESCRIPTION

[0034] Hereinafter, the inventive concept will be described in more detail with reference to the accompanying drawings.

[0035] Figure 1 is a block diagram illustrating an inspection apparatus for a display panel according to an exemplary embodiment. Figure 2 It shows the use of Figure 1 A diagram of a process in which an inspection device detects defects of a display panel. Figure 3 It is shown Figure 1 The test equipment includes the contact parts and Figure 2 Figure 4 shows a display panel of the .

[0036] refer to Figure 1 and Figure 2 , the inspection apparatus 100 of the display panel may include a contact member (eg, a contact portion or a contact unit) 110, a signal generator 120, a power generator 130, and a defect detector 140. Figure 2 In the manufacturing process (e.g., visual inspection process) of the display panel 200 shown in FIG. 1 , the display panel 200 may be disposed on the stage 150. The inspection device 100 may contact the display panel 200 disposed on the stage 150 through the contact member 110. The inspection device 100 may provide a driving signal (e.g., a gate signal, a data signal, etc.) and a driving voltage (e.g., a power supply voltage, a common voltage, etc.) to the display panel 200 through the contact member 110 and detect defects of the display panel 200 by analyzing an image displayed on the display panel 200.

[0037] The display panel 200 may include data lines, gate lines, and a plurality of pixels. The pixels may be formed in the intersection region or the cross region of the data lines and the gate lines. In some exemplary embodiments, each of the pixels may include a thin film transistor electrically coupled to the gate lines and the data lines, and a liquid crystal capacitor and a storage capacitor coupled to the thin film transistor. In some embodiments, the display panel 200 may be a liquid crystal display panel.

[0038] refer to Figure 3 , the display panel 200 may include a display area DA and a non-display area NDA. Data lines, gate lines and pixels may be formed in the display area DA. Pads (e.g., data pads 210) coupled to data lines, gate pads coupled to gate lines, power pads coupled to power lines, common voltage pads 215 coupled to common voltage lines, etc. may be formed in the non-display area NDA. The power line and the common voltage line may include at least one line. Alternatively, the power line and the common voltage line may include at least one surface (e.g., a planar shape). Alternatively, the power line and the common voltage line may be formed in a grid shape. After the inspection process, the pads may be coupled to the gate integrated circuit (IC) and the data integrated circuit. For example, the gate integrated circuit and the data integrated circuit may be formed in a driver chip and may be mounted on the pads in the non-display area NDA as a chip on glass (COG). Alternatively, the gate integrated circuit and the data integrated circuit may be formed in a driver chip, mounted on a flexible printed circuit board (FPCB) as a chip on film (COF) and coupled to the pads in the non-display area NDA through the flexible printed circuit board.

[0039] refer to Figure 3 The contact member 110 may include a first probe 112 and a second probe 114. During the inspection of the display panel 200, the first probe 112 of the contact member 110 may contact the data pad 210 of the display panel 200, and the second probe 114 of the contact member 110 may contact the common voltage pad 215.

[0040] The signal generator 120 may be coupled to the first probe 112 of the contact 110. The signal generator 120 may generate a first data voltage Vdata1 corresponding to a first gray level (e.g., a first gray value) and a second data voltage Vdata2 corresponding to a second gray level (e.g., a second gray value). For example, when the first data voltage Vdata1 corresponding to the first gray level is provided to the display panel 200, a line defect is easily detected, and when the second data voltage Vdata2 corresponding to the second gray level is provided to the display panel 200, a line defect, a pixel defect, a stain defect, etc. are easily detected.

[0041] According to the method of adjusting the arrangement of the liquid crystal layer, the liquid crystal display device can be classified into a twisted nematic (TN) mode, a vertical alignment (VA) mode, an in-plane switching (IPS) mode, a fringe field switching (FFS) mode, etc. The display panel 200 can be classified as a standard black panel or a standard white panel according to the color of the display panel 200 when the driving signal and the driving voltage are not provided to the display panel 200. For example, a twisted nematic mode liquid crystal display device can be a standard white device because the color of the display panel 200 is white (transparent) when the driving signal and the driving voltage are not provided. The vertical alignment mode liquid crystal display device can be a standard black device because the color of the display panel 200 is black (opaque) when the driving signal and the driving voltage are not provided.

[0042] In some exemplary embodiments, when the display panel 200 is a standard black panel, the first gray level may be a maximum gray level value. For example, when the liquid crystal display device is driven with 8 bits, the first gray level may correspond to a gray level of 255 (for example, may have a gray level value of 255). That is, when the display panel 200 is a standard black panel, the signal generator 120 may provide a first data voltage Vdata1 corresponding to a gray level of 255 to the display panel 200. The display panel 200 may display a white image based on the first data voltage Vdata1. The second gray level may have a gray level value lower than the gray level value of the first gray level (that is, the maximum gray level value). For example, the signal generator 120 may provide a second data voltage Vdata2 corresponding to a gray level of 125 (for example, may have a gray level value of 125) to the display panel 200. The display panel 200 may display a gray image based on the second data voltage Vdata2.

[0043] In other exemplary embodiments, when the display panel 200 is a standard white panel, the first gray level may be a minimum gray level value. For example, when the liquid crystal display device is driven with 8 bits, the first gray level may correspond to a gray level of 0 (for example, may have a gray level value of 0). That is, when the display panel 200 is a standard white panel, the signal generator 120 may provide a first data voltage Vdata1 corresponding to a gray level of 0 to the display panel 200. The display panel 200 may display a black image based on the first data voltage Vdata1. The second gray level may have a gray level value higher than the gray level value of the first gray level (that is, the minimum gray level value). For example, the signal generator 120 may provide a second data voltage Vdata2 corresponding to a gray level of 125 (for example, may have a gray level value of 125) to the display panel 200. The display panel 200 may display a gray image based on the second data voltage Vdata2.

[0044] The power generator 130 may be coupled to the second probe 114 and generate a first common voltage Vcom1 and a second common voltage Vcom2. When the first data voltage Vdata1 generated in the signal generator 120 swings (e.g., periodically switches) between a first voltage level and a second voltage level lower than the first voltage level, the first common voltage Vcom1 may have a voltage level between the first voltage level and the second voltage level. In addition, when the first data voltage Vdata1 swings between the first voltage level and the second voltage level lower than the first voltage level, the second common voltage Vcom2 may have a voltage level higher than the first voltage level. Here, the difference between the voltage level of the second common voltage Vcom2 and the first voltage level of the first data voltage Vdata1 may be greater than or equal to the difference between the first voltage level of the first data voltage Vdata1 and the voltage level of the first common voltage Vcom1.

[0045] The defect detector 140 may detect a defect of the display panel 200 by removing contact noise generated due to contact failure of the first probe 112 and the second probe 114. The defect detector 140 may detect a first inspection image when the first data voltage Vdata1 and the first common voltage Vcom1 are provided to the display panel 200 through the contact 110. The defect detector 140 may detect a second inspection image when the first data voltage Vdata1 and the second common voltage Vcom2 are provided to the display panel 200 through the contact 110. The defect detector 140 may detect a third inspection image when the second data voltage Vdata2 and the first common voltage Vcom1 are provided to the display panel 200 through the contact 110. The defect detector 140 may detect a defect of the display panel 200 based on the first inspection image, the second inspection image, and the third inspection image.

[0046] When the first data voltage Vdata1 and the first common voltage Vcom1 are provided to the display panel 200, the defect detector 140 may detect a first inspection image including a defect of the display panel 200 and contact noise. The first data voltage Vdata1 may swing between a first voltage level and a second voltage level. The first common voltage Vcom1 may have a voltage level between the first voltage level and the second voltage level. When a short circuit occurs between the common voltage line and the data line due to a contact failure of the first probe 112 and the second probe 114 (i.e., when a potential difference does not occur between the common voltage line and the data line), contact noise having the same shape (signal) as a line defect of the display panel 200 may occur. The defect detector 140 may detect the position and brightness of the defect of the contact noise and the display panel 200 based on the first inspection image.

[0047] When the first data voltage Vdata1 and the second common voltage Vcom2 are provided to the display panel 200, the defect detector 140 may detect a second inspection image including a defect of the display panel 200. The second common voltage Vcom2 may have a voltage level higher than the first voltage level. For example, the difference between the voltage level of the second common voltage Vcom2 and the first voltage level of the first data voltage Vdata1 is greater than or equal to the difference between the first voltage level of the first data voltage Vdata1 and the voltage level of the first common voltage Vcom1. When the first data voltage Vdata1 and the second common voltage Vcom2 are provided to the display panel 200 through the first probe 112 and the second probe 114, even if a contact failure of the first probe 112 and the second probe 114 may occur, contact noise may not occur because there is a potential difference between the second common voltage Vcom2 provided to the common voltage line and the first data voltage Vdata1 provided to the data line. Therefore, the second inspection image may include a defect of the display panel 200 without including (e.g., without) contact noise.

[0048] The defect detector 140 may detect the position and brightness of the contact noise included in the first inspection image based on the first inspection image and the second inspection image, and generate compensation data Cdata for compensating the brightness of the contact noise. That is, the defect detector 140 may regard (e.g., identify) a defect that appears in the first inspection image but does not appear in the second inspection image as contact noise, and may detect the position and brightness of the contact noise in the first inspection image. The defect detector 140 may generate compensation data Cdata for compensating the brightness of the position where the contact noise appears. For example, when the brightness of the position where the contact noise appears in the first inspection image is higher than the surrounding brightness, the defect detector 140 may generate compensation data Cdata so as to reduce the brightness of the position where the contact noise is generated. The defect detector 140 may provide the compensation data Cdata to the signal generator 120. The signal generator 120 may generate a second data voltage Vdata2 corresponding to the second grayscale based on the compensation data Cdata.

[0049] When the second data voltage Vdata2 and the first common voltage Vcom1 are provided to the display panel 200, the defect detector 140 may detect a third inspection image including defects of the display panel 200. The third inspection image may be an image compensated so that the brightness of the contact noise is equal to the surrounding brightness. Defects of the display panel such as line defects, pixel defects, stain defects, etc. may be detected through the third inspection image.

[0050] As described above, the inspection apparatus 100 of the display panel according to the exemplary embodiment can accurately detect defects of the display panel by detecting contact noise, generating compensation data Cdata, and compensating for the contact noise, wherein the contact noise is detected by changing the voltage level of the common voltage supplied to the common voltage pad 215 in the display panel.

[0051] FIG. 4A to FIG. 4C It is shown Figure 1 A diagram of the operation of a signal generator and a power generator included in the inspection device. FIG. 5A to FIG. 5C is shown according to the description Figure 1 The operation of the defect detector included in the inspection equipment FIG. 4A to FIG. 4C The signal generator and power generator operate while Figure 1 Figure 2 shows a first inspection image to a third inspection image detected in a defect detector.

[0052] refer to Figure 4A, the signal generator may generate a first data voltage Vdata1 corresponding to the first gray level. In some exemplary embodiments, when the display panel is a standard black panel, the first gray level may be a maximum gray level value. In other exemplary embodiments, when the display panel is a standard white panel, the first gray level may be a minimum gray level value. The first data voltage Vdata1 may swing between a first voltage level LV1 and a second voltage level LV2. Here, the second voltage level LV2 may be lower than the first voltage level LV1.

[0053] The power generator may generate a first common voltage Vcom1. The first common voltage Vcom1 may have a voltage level between a first voltage level LV1 and a second voltage level LV2.

[0054] The first data voltage Vdata1 generated from the signal generator may be provided to the data pad in the display panel through the first probe of the contact. The first common voltage Vcom1 generated from the power generator may be provided to the common voltage pad in the display panel through the second probe of the contact.

[0055] When the first data voltage Vdata1 and the first common voltage Vcom1 are supplied to the display panel, the defect detector may detect the first inspection image IMG_T1. Figure 5A As shown in , the first inspection image IMG_T1 may include a defect (e.g., a line defect) of the display panel and contact noise. When the first and second probes of the contact member are in unstable contact with the data pad and the common voltage pad in the display panel, contact noise may occur due to the absence of a potential difference between the first data voltage Vdata1 provided to the data line in the display panel and the first common voltage Vcom1 provided to the common voltage line in the display panel. Here, the shape of the contact noise may be similar to the defect of the display panel.

[0056] refer to Figure 4B , the signal generator may generate a first data voltage Vdata1 corresponding to the first gray level. In some exemplary embodiments, when the display panel is a standard black panel, the first gray level may be a maximum gray level value. In other exemplary embodiments, when the display panel is a standard white panel, the first gray level may be a minimum gray level value. The first data voltage Vdata1 may swing between a first voltage level LV1 and a second voltage level LV2. Here, the second voltage level LV2 may be lower than the first voltage level LV1.

[0057] The power generator may generate a second common voltage Vcom2. A voltage level of the second common voltage Vcom2 may be higher than the first voltage level LV1. Here, a difference D2 between a voltage level of the second common voltage Vcom2 and a first voltage level LV1 of the first data voltage Vdata1 may be greater than or equal to a difference D1 between a voltage level LV1 of the first data voltage Vdata1 and the first common voltage Vcom1.

[0058] The first data voltage Vdata1 generated from the signal generator may be provided to the data pad in the display panel through the first probe of the contact. The second common voltage Vcom2 generated from the power generator may be provided to the common voltage pad in the display panel through the second probe of the contact.

[0059] When the first data voltage Vdata1 and the second common voltage Vcom2 are provided to the display panel, the defect detector may detect the second inspection image IMG_T2. Figure 5B As shown in , the second inspection image IMG_T2 may include defects (e.g., line defects) of the display panel. When the first data voltage Vdata1 and the second common voltage Vcom2 are supplied to the display panel, although the contact of the first probe and the second probe of the contact member with the data pad and the common voltage pad in the display panel may be unstable, a potential difference may still occur between the first data voltage Vdata1 supplied to the data line in the display panel and the second common voltage Vcom2 supplied to the common voltage line in the display panel. Therefore, contact noise can be removed.

[0060] refer to Figure 4C , the signal generator may generate a second data voltage Vdata2 corresponding to the second gray level based on the compensation data provided from the defect detector. In some exemplary embodiments, when the display panel is a standard black panel, the second gray level may have a gray level value lower than the first gray level. In other exemplary embodiments, when the display panel is a standard white panel, the second gray level may have a gray level value higher than the first gray level. The second data voltage Vdata2 may swing between a third voltage level LV3 and a fourth voltage level LV4. Here, the third voltage level LV3 may be lower than the first voltage level LV1, and the fourth voltage level LV4 may be higher than the second voltage level LV2.

[0061] The power generator may generate a first common voltage Vcom1. The first common voltage Vcom1 may be the same as the first common voltage Vcom1 provided to the display panel to detect the first inspection image IMG_T1. The first common voltage Vcom1 may have a voltage level between the third voltage level LV3 and the fourth voltage level LV4.

[0062] The second data voltage Vdata2 generated from the signal generator may be provided to the data pad in the display panel through the first probe of the contact. The first common voltage Vcom1 generated from the power generator may be provided to the common voltage pad in the display panel through the second probe of the contact.

[0063] When the second data voltage Vdata2 and the first common voltage Vcom1 are provided to the display panel, the defect detector may detect the third inspection image IMG_T3. Figure 5C As shown in , the third inspection image IMG_T3 may include defects of the display panel. Although the contact between the first and second probes of the contact member and the data pad and the common voltage pad in the display panel may be unstable, the third inspection image IMG_T3 may still only include defects of the display panel because the compensation data compensates for the brightness of the contact noise. Here, since the second data voltage Vdata2 corresponding to the second grayscale is provided to the display panel, defects of the display panel such as line defects, pixel defects, stain defects, etc. can be detected through the third inspection image IMG_T3.

[0064] Figure 6 It is shown Figure 1 Block diagram of a defect detector included in an inspection device.

[0065] refer to Figure 6 , the defect detector 140 may include a vision camera 142 , a first defect detector 144 , and a second defect detector 146 .

[0066] The visual camera 142 may image the display panel (e.g., photograph the display panel). When the first data voltage and the first common voltage are provided to the display panel through the contact of the inspection device, the visual camera 142 may image the display panel and detect (e.g., obtain) the first inspection image IMG_T1. When the first data voltage and the second common voltage are provided to the display panel through the contact of the inspection device, the visual camera 142 may image the display panel and detect (e.g., obtain) the second inspection image IMG_T2. When the second data voltage and the first common voltage are provided to the display panel through the contact of the inspection device, the visual camera 142 may image the display panel and detect (e.g., obtain) the third inspection image IMG_T3.

[0067] The first defect detector 144 may detect the position and brightness of the contact noise based on the first inspection image IMG_T1 and the second inspection image IMG_T2, generate compensation data Cdata for compensating the contact noise of the first inspection image IMG_T1, and output the compensation data Cdata to the signal generator. The first inspection image IMG_T1 may include a defect (e.g., a line defect) of the display panel and the contact noise. The first defect detector 144 may store the position and brightness of the contact noise and the defect of the display panel in the first inspection image IMG_T1. The second inspection image IMG_T2 may include a defect of the display panel. The first defect detector 144 may store the position and brightness of the contact noise in the first inspection image IMG_T1 by comparing the second inspection image IMG_T2 with the first inspection image IMG_T1. The first defect detector 144 may generate compensation data Cdata for compensating the brightness of the contact noise in the first inspection image IMG_T1. For example, when the brightness of the position where the contact noise is generated in the first inspection image IMG_T1 is higher than the surrounding brightness, the first defect detector 144 may generate compensation data Cdata for reducing the brightness at the position where the contact noise occurs. The first defect detector 144 may provide the compensation data Cdata to the signal generator.

[0068] The second defect detector 146 may detect defects of the display panel based on the third inspection image IMG_T3. The third inspection image IMG_T3 may be an image from which contact noise is removed. That is, the third inspection image IMG_T3 may include defects (e.g., line defects, pixel defects, stain defects, etc.) of the display panel except (e.g., without) contact noise generated by a contact failure of a contact member of the inspection device. The second defect detector 146 may detect defects of the display panel based on the third inspection image IMG_T3.

[0069] As described above, the defect detector 140 of the inspection apparatus for a display panel can image the first inspection image IMG_T1, the second inspection image IMG_T2, and the third inspection image IMG_T3, generate compensation data Cdata for compensating for contact noise based on the first inspection image IMG_T1 and the second inspection image IMG_T2, and detect defects of the display panel based on the third inspection image IMG_T3. Therefore, defects of the display panel can be accurately detected.

[0070] Figure 7 is a flowchart illustrating an inspection method for a display panel according to an exemplary embodiment.

[0071] refer to Figure 7, the inspection method of the display panel may include: operation S100 of providing a first data voltage and a first common voltage to the display panel; operation S200 of detecting a first inspection image; operation S300 of providing the first data voltage and the second common voltage to the display panel; operation S400 of detecting a second inspection image; operation S500 of detecting a position and brightness of contact noise; operation S600 of generating compensation data; operation S700 of providing the second data voltage and the first common voltage to the display panel; operation S800 of detecting a third inspection image; and operation S900 of detecting a defect of the display panel.

[0072] The inspection method for a display panel may provide a first data voltage and a first common voltage to the display panel in operation S100. A data pad coupled to a data line and a common voltage pad coupled to a common voltage line may be formed in a non-display area of ​​the display panel. The inspection method for a display panel may provide a first data voltage corresponding to a first grayscale to the data pad by a first probe, and provide a first common voltage to the common voltage pad by a second probe. In some exemplary embodiments, when the display panel is a standard black panel, the first grayscale may be a maximum grayscale value. In other exemplary embodiments, when the display panel is a standard white panel, the first grayscale may be a minimum grayscale value. The first data voltage may swing between a first voltage level and a second voltage level lower than the first voltage level. The first common voltage may have a voltage level between the first voltage level and the second voltage level.

[0073] The inspection method for a display panel may image the display panel and detect (e.g., acquire) a first inspection image in operation S200. When a short circuit occurs between a common voltage line and a data line due to a contact failure of a first probe and a second probe (i.e., when no potential difference occurs between the common voltage line and the data line), contact noise having the same shape as a line defect of the display panel may occur. The first inspection image may include a defect of the display panel and the contact noise.

[0074] The inspection method for a display panel may provide a first data voltage and a second common voltage to the display panel in operation S300. The inspection method for a display panel may provide a first data voltage corresponding to a first grayscale to a data pad through a first probe, and provide a second common voltage to a common voltage pad through a second probe. The first data voltage may swing between a first voltage level and a second voltage level lower than the first voltage level. The second common voltage may have a voltage level higher than the first voltage level.

[0075] The inspection method for a display panel may image the display panel and detect (e.g., acquire) a second inspection image in operation S400. Here, even if a contact failure of the first probe and the second probe occurs, contact noise may not occur because there is a potential difference between the second common voltage provided to the common voltage line and the first data voltage provided to the data line. Therefore, the second inspection image may include defects of the display panel without (e.g., without) contact noise.

[0076] The inspection method for a display panel may detect the position and brightness of the contact noise based on the first inspection image and the second inspection image in operation S500. The inspection method for a display panel may detect the position and brightness of the contact noise in the first inspection image by comparing the first inspection image with the second inspection image, because the first inspection image may include a defect of the display panel and the contact noise, and the second inspection image may include (e.g., only include) the defect of the display panel.

[0077] The inspection method for display panels may generate compensation data compensating for brightness of contact noise in operation S600. When brightness of contact noise in the first inspection image is higher or lower than ambient brightness, the inspection method for display panels may generate compensation data compensating for brightness of contact noise.

[0078] The inspection method for a display panel may provide a second data voltage and a first common voltage to the display panel in operation S700. The inspection method for a display panel may generate a second data voltage corresponding to a second grayscale based on compensation data. The inspection method for a display panel may provide a second data voltage corresponding to a second grayscale to a data pad through a first probe, and provide a first common voltage to a common voltage pad through a second probe. In some exemplary embodiments, when the display panel is a standard black panel, the first grayscale may be a maximum grayscale value, and the second grayscale may have a grayscale value lower than the grayscale value of the first grayscale. In other exemplary embodiments, when the display panel is a standard white panel, the first grayscale may be a minimum grayscale value, and the second grayscale may have a grayscale value higher than the grayscale value of the first grayscale. When a second data voltage corresponding to the second grayscale is provided to the display panel, a gray image may be displayed on the display panel. The second data voltage may swing between a third voltage level lower than the first voltage level and a fourth voltage level higher than the second voltage level.

[0079] The inspection method for a display panel may image the display panel and detect (e.g., acquire) a third inspection image in operation S800. Although a short circuit between the common voltage line and the data line may occur due to a contact failure of the first probe and the second probe, the third inspection image may still include only defects of the display panel because the second data voltage is generated based on compensation data that compensates for contact noise.

[0080] The inspection method for a display panel may detect defects of the display panel based on the third inspection image in operation S900. The inspection method for a display panel may detect defects (e.g., line defects, pixel defects, stain defects, etc.) of the display panel based on the third inspection image from which contact noise is removed.

[0081] As described above, the inspection method for a display panel can generate compensation data for compensating for contact noise based on a first inspection image and a second inspection image by changing the voltage level of a common voltage, and detect defects of the display panel based on a third inspection image for which the contact noise is compensated. Therefore, defects of the display panel can be accurately detected.

[0082] The inventive concept can be applied to a display device and / or an electronic device having (e.g., including) a display device. For example, the inventive concept can be applied to a computer monitor, a laptop computer, a digital camera, a cellular phone, a smart phone, a smart tablet, a television, a personal digital assistant (PDA), a portable multimedia player (PMP), an MP3 player, a navigation system, a game console, a video phone, etc.

[0083] When expressions such as "at least one of" or "at least one selected from" are located after an element of a list, the elements of the entire list are modified rather than the individual elements in the list. In addition, when describing embodiments of the present invention, the use of "may" refers to "one or more embodiments of the present invention". In addition, the term "exemplary" is intended to refer to an example or illustration. It will be understood that when an element or layer is referred to as being "on", "connected to", "coupled to" or "adjacent to" another element or layer, it can be directly on, directly connected to, coupled to or adjacent to the other element or layer, or there can be one or more intervening elements or layers. In contrast, when an element or layer is referred to as being "directly on" another element or layer, "directly connected to", "directly coupled to" or "immediately adjacent to" another element or layer, there are no intervening elements or layers.

[0084] According to the inspection equipment for display panel and / or any other related equipment or components of the embodiment of the present invention described herein, any appropriate hardware, firmware (e.g., application specific integrated circuit), software or a combination of software, firmware and hardware can be used for implementation. For example, various components of the inspection equipment for display panel can be formed on an integrated circuit (IC) chip or formed on a separate IC chip. In addition, various components of the inspection equipment for display panel can be implemented on a flexible printed circuit film, a tape carrier package (TCP), a printed circuit board (PCB), or formed on a substrate. In addition, various components of the inspection equipment for display panel can be processes or threads that execute computer program instructions and interact with other system components for performing various functions described herein, running on one or more processors in one or more computing devices. Computer program instructions are stored in a memory that can be implemented in a computing device using a standard storage device (such as, for example, a random access memory (RAM)). Computer program instructions can also be stored in other non-temporary computer-readable media (such as, for example, CD-ROM, flash drive, etc.). Additionally, persons skilled in the art will recognize that the functionality of various computing devices may be combined or integrated into a single computing device or that the functionality of a particular computing device may be distributed across one or more other computing devices without departing from the scope of the exemplary embodiments of the present invention.

[0085] The foregoing is an illustration of exemplary embodiments and should not be construed as limiting the exemplary embodiments. Although exemplary embodiments have been described, it will be readily appreciated by those skilled in the art that many appropriate modifications in the exemplary embodiments are possible without substantially departing from the novel teachings and beneficial effects of the inventive concept. Therefore, all of these modifications are intended to be included within the scope of the inventive concept as defined in the claims and their equivalents. Therefore, it should be understood that the foregoing is an illustration of various exemplary embodiments and should not be construed as being limited to the specific exemplary embodiments disclosed, and modifications to the disclosed exemplary embodiments and other exemplary embodiments are intended to be included within the scope of the appended claims and their equivalents.

Claims

1. Inspection equipment for display panels, including: A contact member, comprising a first probe and a second probe, wherein the first probe is configured to contact a data pad of the display panel, and the second probe is configured to contact a common voltage pad of the display panel; a signal generator coupled to the first probe, the signal generator configured to generate a first data voltage corresponding to a first gray level and a second data voltage corresponding to a second gray level; a power generator coupled to the second probe, the power generator configured to generate a first common voltage and a second common voltage, the second common voltage having a voltage level different from that of the first common voltage; as well as a defect detector configured to detect a defect of the display panel by removing contact noise generated due to a contact failure of the first probe and the second probe, Wherein, the defect detector is configured to detect the defect of the display panel based on a first inspection image detected when the first data voltage and the first common voltage are provided to the display panel through the contact member, a second inspection image detected when the first data voltage and the second common voltage are provided to the display panel through the contact member, and a third inspection image detected when the second data voltage and the first common voltage are provided to the display panel through the contact member.

2. The testing device according to claim 1, wherein: The first inspection image includes the contact noise and the defect of the display panel, and the second inspection image includes the defect of the display panel without the contact noise.

3. The testing device according to claim 1, wherein: The defect detector is configured to detect the contact noise and a position and brightness of the defect of the display panel based on the first inspection image, and to detect the position of the defect of the display panel based on the second inspection image.

4. The testing device according to claim 1, wherein: The defect detector is configured to detect a position and brightness of the contact noise included in the first inspection image based on the first inspection image and the second inspection image, and to generate compensation data configured to compensate for the contact noise.

5. The testing device according to claim 4, wherein: The defect detector is configured to provide the compensation data to the signal generator, and Wherein, the signal generator is configured to generate the second data voltage corresponding to the second gray level based on the compensation data.

6. The testing device according to claim 1, wherein: The defect detector is configured to detect the defect of the display panel based on the third inspection image.

7. The testing device according to claim 1, wherein: The defect detector comprises: a visual camera configured to image the display panel and acquire the first inspection image, the second inspection image, and the third inspection image; a first defect detector configured to detect a position and brightness of the contact noise based on the first inspection image and the second inspection image, generate compensation data configured to compensate for the contact noise, and output the compensation data to the signal generator; and The second defect detector is configured to detect the defect of the display panel based on the third inspection image.

8. The testing device according to claim 1, wherein: The first data voltage is configured to swing between a first voltage level and a second voltage level lower than the first voltage level, The first common voltage has a voltage level between the first voltage level and the second voltage level, and A voltage level of the second common voltage is higher than the first voltage level.

9. The testing device according to claim 8, wherein: A difference between the voltage level of the second common voltage and the first voltage level of the first data voltage is greater than or equal to a difference between the first voltage level of the first data voltage and the voltage level of the first common voltage.

10. The testing device according to claim 1, wherein: The display panel is a standard black panel, and the first gray level is a maximum gray level value, and the second gray level has a gray level value lower than the maximum gray level value of the first gray level.

11. The testing device according to claim 1, wherein: The display panel is a standard white panel, and the first gray level is a minimum gray level value, and the second gray level has a gray level value higher than the minimum gray level value of the first gray level.

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