Method and system for predictive maintenance of amplifier modules

Abstract

The invention discloses a method for performing predictive maintenance of amplifier modules (12). At least one parameter of at least one amplifier module (12) is acquired via a measurement data acquisition unit (18). The acquired at least one parameter is analyzed via a measurement data analysis unit in order to predict a probability and / or time of failure of at least one amplifier module (12). Furthermore, a system (10) is described.

Description

Technical Field

[0001] The invention relates to a method for performing predictive maintenance of an amplifier module. Furthermore, the invention relates to a system for predictive maintenance of an amplifier module. Background Art

[0002] An amplifier module is usually used to amplify a received signal, such as a power, a time-varying voltage or, more precisely, a current of a received signal. For this purpose, the respective amplifier module usually comprises a transistor, which is a component of the amplifier module. The amplifier module itself can be part of a superior amplifier system, which comprises a plurality of amplifier modules or, more precisely, an amplifier device accommodating a plurality of amplifier modules. Each amplifier module or, more precisely, an amplifier device comprises a circuit having components for amplifying the respective signal being processed.

[0003] Thus, each component of one or more amplifier modules may degrade over time until the respective component, and thus the amplifier module including the respective component, fails. A default or failure may result in a shutdown of the amplifier module.

[0004] Typically, the user of the amplifier module or, more precisely, of the upstream amplifier system, reacts to a detected failure by ordering a corresponding spare part which is to replace the defective amplifier module. However, this results in relatively long downtimes of the amplifier module or, more precisely, of the upstream amplifier system, since a new component, i.e., a spare part which replaces the defective component, must be shipped to the user of the amplifier module or, more precisely, of the upstream amplifier system.

[0005] Therefore, there is a need for the possibility of reducing the downtime of amplifier modules or rather of the upstream amplifier system in a cost-effective and simple manner. Summary of the invention

[0006] The present invention provides a method for performing predictive maintenance of an amplifier module, comprising the following steps:

[0007] - acquiring at least one parameter of at least one amplifier module via a measurement data acquisition unit, and

[0008] - analyzing the at least one acquired parameter via a measurement data analysis unit in order to predict a probability and / or time of failure of at least one amplifier module.

[0009] In addition, the present invention provides a system for predictive maintenance of amplifier modules, comprising at least one measurement data acquisition unit, at least one measurement data analysis unit and at least one amplifier module, wherein the at least one measurement data acquisition unit and the at least one measurement data analysis unit are configured to communicate with each other, wherein the at least one measurement data acquisition unit is configured to acquire at least one parameter of the at least one amplifier module, and the at least one measurement data analysis unit is configured to receive and analyze the acquired at least one parameter so as to predict the failure probability and / or time of the at least one amplifier module.

[0010] Thus, downtimes of amplifier modules or, more precisely, downtimes of a superordinate amplifier system comprising the at least one amplifier module can be minimized, since the user of the respective amplifier module can take proactive action instead of reacting to a fault that has already occurred. The invention ensures that the probability and / or time of failure of at least one amplifier module can be predicted by taking into account at least one parameter of the amplifier module that has been previously acquired, thereby providing predictive maintenance of the amplifier module.

[0011] For example, at least one amplifier module may be configured to communicate with at least one measurement data acquisition unit in order to send at least one parameter. Thus, the measurement data acquisition unit receives at least one parameter that may be actively sent by the amplifier module to the measurement data acquisition unit. For example, communication according to the Message Queuing Telemetry Transport (MQTT) protocol is used.

[0012] Furthermore, the corresponding parameters can only be sent by the amplifier module if their values ​​have changed. This significantly reduces the power consumption as well as the required computing power.

[0013] In practice, components of the amplifier module or the amplifier module are observed before a failure occurs.

[0014] According to one aspect, at least one parameter is specified as operating hours of the amplifier module. Thus, the operating hours of the amplifier module can be taken into account in order to predict the probability and / or time of failure of at least one amplifier module. For example, a model can be used that predicts the probability and / or time of failure by taking into account the actual operating hours of the amplifier module. Alternatively or additionally, a lookup table based on stored empirical data can be used to predict the probability and / or time of failure based on operating hours.

[0015] According to another aspect, at least one parameter is specified as the temperature of the amplifier module in combination with another parameter of at least one amplifier module. The other parameter may correspond to the operating hours of the amplifier module, so that the temperature of the amplifier module is taken into account in combination with the operating hours of the amplifier module. Thus, since the temperature behavior is characteristic for the actual operating hours of the amplifier module, the failure probability and / or time can be predicted.

[0016] Furthermore, the further parameter may correspond to a specific operating mode of the amplifier module or another parameter of the amplifier module which has been acquired. Thus, the temperature rise in a specific operating mode may be analyzed in order to predict the probability and / or time of failure.

[0017] Furthermore, at least one parameter can be specified as a transistor parameter, i.e. a parameter of a transistor as a component of the amplifier module. The transistor parameter can be an input level, a drain current and / or a gate current, in particular, wherein the gate current is a common gate current of the amplifier module. The respective transistor parameter corresponds to a parameter of a transistor directly assigned to the amplifier module. The behavior of the respective transistor parameter can be appropriately acquired and analyzed to predict the probability and / or time of failure.

[0018] Typically, multiple parameters of at least one amplifier module can be considered simultaneously to improve the accuracy of the prediction. In fact, the prediction is based on more information if multiple parameters are acquired and analyzed simultaneously.

[0019] According to one aspect, the time-dependent behavior of at least one parameter is analyzed. Thus, an increase or rather a decrease of the corresponding parameter over time can be identified, which can indicate an imminent failure of at least one amplifier module within the next few months.

[0020] For example, an increasing gate current (over time) indicates that the associated transistor of the amplifier module is about to fail or more precisely fail within the next two to three months. In fact, in the delivery state of the amplifier module, the gate current is essentially zero, so the value of the gate current can be used as an indication of an impending failure or failure.

[0021] Furthermore, an increased drain current of a transistor or an increased drain current of an amplifier module may indicate a degradation or malfunction of corresponding components located downstream of the transistor or, more precisely, of the amplifier module, such as a (high frequency or, more precisely, radio frequency) connection, a cable or a combiner.

[0022] In particular, in the case of amplifier modules processing high powers, for example high frequency signals with a power of more than 2 kW, the brazing solder disappears over time.

[0023] Furthermore, high input levels (ie, between the nominal input level and the maximum input level) combined with short-term gate currents may indicate a high degree of transistor degradation, leading to failure within the next two to six months.

[0024] Furthermore, at least one parameter can be compared with a comparison parameter of the same type, in particular, wherein the comparison parameter is acquired from another amplifier module and / or wherein the comparison parameter is a previously acquired parameter. Thus, the actually acquired parameter is compared with the previously acquired parameter, so that the historical behavior or rather the trend can be appropriately analyzed. In the case of high deviations, there may be a critical behavior of the corresponding component.

[0025] Furthermore, the actually acquired parameter can be compared with a comparison parameter obtained from another amplifier module located in a comparable position, whereby substantially identical values ​​are expected due to the similar position. Deviations occurring during the comparison can give the result of an impending failure.

[0026] For example, the drain currents of amplifier modules or more precisely transistors (i.e., components of one or more amplifier modules) are obtained and compared with each other. Deviations above 20% obtained by comparison may indicate that the component or more precisely the amplifier module with the higher drain current may fail within the next four to five months.

[0027] According to another aspect, a notification is output when the analysis results in an imminent failure, in particular, wherein the notification is displayed on a display. Thus, once the analysis has detected that a failure may be imminent, a user of the corresponding system is proactively notified. Thus, the user can proactively take action and already order a corresponding component (i.e. a spare part) for replacing the component prone to failure.

[0028] Furthermore, orders may be placed automatically by the system, wherein the user is informed of the order, for example via a display.

[0029] For example, the notification is output by the amplifier module itself, the measurement data acquisition unit, the measurement data analysis unit and / or the external device. Therefore, the amplifier module, the measurement data acquisition unit and / or the measurement data analysis unit can include a display. In addition, the information can be accessed by the external device or more precisely sent to the external device.

[0030] In other words, at least one of the measurement data analysis unit, the amplifier module, the measurement data acquisition unit and / or the external device may be configured to output a notification indicating a predicted probability and / or time of failure of the amplifier module when the analysis results in an impending failure. If the notification is outputted graphically via a display, the corresponding component of the system may include a display.

[0031] In practice, the measurement data analysis unit can communicate with the measurement data acquisition unit and / or the amplifier module itself in order to transmit information about an impending failure to the corresponding component of the system so that the component can display or rather output a notification.

[0032] According to a further aspect, the at least one parameter acquired and / or the analysis result is sent via telemetry and / or the at least one parameter acquired and / or the analysis result is accessed via a network interface. The at least one parameter acquired can be sent to the measurement data acquisition unit, for example, by using a communication according to the MQTT protocol. Thus, telemetry data can be transmitted between the amplifier module or more precisely the superordinate amplifier system and the measurement data acquisition unit in an automatic manner without any manual input. The transmission via telemetry can correspond to a communication via a short message service (SMS) or an electronic mail (email). In a similar manner, the analysis result acquired by the at least one measurement data analysis unit can be sent via telemetry.

[0033] The analysis result corresponds to a predicted probability and / or time of failure of at least one amplifier module.

[0034] Thus, if the information is accessed via a network interface or more precisely the information is sent by telemetry, the information can be output by the external device. Additionally or alternatively, the information is output at the amplifier module itself, the measurement data acquisition unit and / or the measurement data analysis unit.

[0035] Furthermore, the acquired at least one parameter and / or the analysis result can be accessed via a web interface, so that corresponding information can be collected via a smartphone, a mobile device, a tablet or a laptop.

[0036] Typically, the corresponding information can be submitted via the Internet. Thus, the information can be forwarded to the manufacturer of the amplifier module via the Internet.

[0037] Communications via the Internet may be accomplished via satellite communications using telecommunication standards such as Long Term Evolution (LTE) or other telecommunication standards such as Global System for Mobile Communications (GSM).

[0038] A corresponding Universal Serial Bus (USB) stick may be used for communication purposes. Thus, the system may comprise a Universal Serial Bus (USB) stick assigned to at least one of the amplifier module, the measurement data acquisition unit and the measurement data analysis unit.

[0039] In addition, the measurement data acquisition unit and the measurement data analysis unit may be integrated in a common device. The common device may involve a single chassis, which may include a single board computer, an uninterruptible power supply (UPS), wherein the single board computer may include at least one communication interface, so that the common device is configured to communicate with the amplifier module.

[0040] Alternatively or additionally, a network interface is provided, via which the at least one acquired parameter and / or the analysis result can be accessed, in particular remotely.

[0041] Alternatively or additionally, a telemetry system is provided so that the at least one acquired parameter and / or the analysis result can be (automatically) transmitted, in particular to a remote component of the system.

[0042] Generally, amplifier modules can be assigned to measuring amplifiers, power amplifiers, broadband amplifiers, low-noise amplifiers, pulse amplifiers and / or amplifier devices.

[0043] Typically, corresponding communications may be wireless and / or wired. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Other aspects and advantages of the claimed subject matter will become more readily understood by reference to the following description when considered in conjunction with the accompanying drawings, in which:

[0045] Figure 1 Schematically shows an overview of the system according to the present invention,

[0046] Figure 2 A common device is schematically shown, comprising at least one measurement data acquisition unit and at least one measurement data analysis unit, and

[0047] Figure 3 An overview of the method according to the invention is schematically shown. DETAILED DESCRIPTION

[0048] exist Figure 1 , a system 10 for predictive maintenance of an amplifier module 12 is shown. The amplifier module 12 is part of a superordinate amplifier system 14, which comprises a plurality of amplifier devices 16, each having a plurality of amplifier modules 12.

[0049] The amplifier module 12 or more precisely the amplifier device 16 can be installed in Figure 1 In the schematically shown rack or more precisely in the cabinet.

[0050] In addition, the system 10 comprises a measurement data acquisition unit 18, which is configured to communicate with at least one amplifier module 12 so that at least one parameter of the amplifier module 12 can be acquired. For example, the amplifier module 12 and the at least one measurement data acquisition unit 18 can communicate with each other by means of a communication according to the Message Queue Telemetry Transport (MQTT) protocol, so that in an automatic manner the telemetry data of the amplifier module 12 are sent to the measurement data acquisition unit 18. In practice, the parameters are sent only if the parameter values ​​change, so as to minimize the data exchange.

[0051] Furthermore, the system 10 comprises at least one measurement data analysis unit 20 which communicates with the measurement data acquisition unit 18 in order to receive the acquired parameters.

[0052] The at least one measurement data analysis unit 20 is configured to receive the acquired parameters and analyze the at least one acquired parameter in order to predict a failure probability and / or time of the at least one amplifier module 12 based on the acquired parameters.

[0053] Thus, the expected downtime of the amplifier module 12 can be predicted, thereby enabling predictive maintenance of the amplifier module 12. This ensures that the user of the amplifier module 12 can take proactive action rather than reacting to a failure that has already occurred.

[0054] As a result, downtimes of amplifier module 12 or, more precisely, of upstream amplifier system 14 can be significantly reduced.

[0055] like Figure 2 As shown, the measurement data acquisition unit 18 and the measurement data analysis unit 20 can be built in a common device 22. Furthermore, the measurement data acquisition unit 18 and the measurement data analysis unit 20 can be built in a common manner.

[0056] like Figure 2 As shown, the common device 22 comprises a single board computer 24 which can be configured to simultaneously establish the measurement data acquisition unit 18 and the measurement data analysis unit 20. In addition, an uninterruptible power supply 25 such as a battery is provided which is connected to the single board computer 24.

[0057] The single board computer 24 may also include a communication interface 26 to enable the common device 22 to communicate with at least one amplifier module 12 or more precisely a superordinate amplifier system 14 and an external device 28 such as a computer, laptop, mobile device, tablet or more precisely a smartphone.

[0058] The common device 22 may have a housing 27 for accommodating the above-mentioned components. The housing 27 ensures the required electromagnetic compatibility (EMC). In the illustrated embodiment, the housing 27 includes a base and a cover (not shown), which may be fixedly connected to the base to enclose the space for accommodating the single board computer 24 and the uninterruptible power supply 25.

[0059] Furthermore, the system 10 may include a network interface 30 or a telemetry system 32 for establishing communication, data exchange or data access between the respective components of the system 10 .

[0060] For example, a Universal Serial Bus (USB) stick 34 may be provided as part of the system 10, wherein the Universal Serial Bus stick 34 is assigned to one of the components of the system 10 (e.g., the common device 22) in order to establish communications according to a telecommunication standard such as Long Term Evolution (LTE) or Global System for Mobile Communications (GSM).

[0061] The network interface 30 ensures that a user of the system 10 can access certain components of the system 10 in order to retrieve desired information, for example analysis results of the measurement data analysis unit 20 or more precisely parameters acquired by direct access to the measurement data acquisition unit 18 , the amplifier module 12 or the superordinate amplifier system 14 .

[0062] Furthermore, the corresponding information may be sent by means of a communication established using the telemetry system 32 or more precisely via the USB stick 34 .

[0063] This information can thus be sent to the manufacturer of the amplifier module 12 so that components or more precisely amplifier modules 12 that are expected to fail in the near future are ordered directly and automatically. This ensures that spare parts are available as soon as an amplifier module 12 fails, so that downtimes can be significantly reduced.

[0064] The system 10 also includes a display 36 for displaying a notification indicating a predicted probability and / or time of failure of the amplifier module 12 when the analysis results in an impending failure.

[0065] The display 36 can be assigned to at least one of the measurement data analysis units 20 , the amplifier module 12 itself, the superordinate amplifier system 14 and / or the external device 28 .

[0066] Instead of being displayed, a corresponding notification may be output in another manner (eg acoustically).

[0067] Typically, the external device 28 may include the measurement data analysis unit 20 to perform remote analysis on the acquired data. The external device 28 may be a computer configured to communicate with the measurement data acquisition unit 18.

[0068] Alternatively or additionally, the corresponding data are sent via the Internet or more precisely a telecommunication network (eg LTE / GSM network) to the manufacturer, service provider or another authorized party of the amplifier module 12. For communication via the telecommunication network, a corresponding stick 34 can be used.

[0069] The system 10 is generally configured to perform a method for performing predictive maintenance of the amplifier module 12, as will be described below with reference to Figure 3 Described.

[0070] In a first step S1 , at least one parameter of at least one amplifier module 12 is acquired via the measurement data acquisition unit 18 .

[0071] The parameter can be obtained by measuring at least one parameter or, more precisely, by receiving the parameter sent by the amplifier module 12 in the event of a change in the value of the corresponding parameter. In practice, the parameter can be transmitted automatically without any manual input.

[0072] In a second step S2 , the acquired at least one parameter is analyzed by the measurement data analysis unit 20 in order to predict a probability and / or time of failure of the at least one amplifier module 12 based on the information specified as the acquired at least one parameter.

[0073] As soon as the analysis results in an impending failure, a notification is output in a third step S3 in order to inform the user of system 10 about the impending failure of amplifier module 12 and the remaining time and / or probability of the failure.

[0074] In a fourth step S4, the fault can be localized. This means that a certain component of the composite amplifier module 12 that may fail in the near future is indicated. The corresponding location can be output, in particular displayed, so that the user is appropriately informed.

[0075] For this purpose, a model of the corresponding amplifier module 12 can be provided, in which the corresponding components are shown. The components can be indicated in different colors depending on their status.

[0076] Thus, a component that is likely to fail in the next few months might be painted red so that the user knows which component must be replaced in the near future.

[0077] In a fifth step S5, the system 10 can automatically order corresponding spare parts for the amplifier module 12 or more precisely its components which may fail in the near future. This ensures that the corresponding spare parts are on site as soon as a failure of the amplifier module 12 or more precisely its corresponding components occurs. The downtime of the amplifier module 12 can be significantly reduced.

[0078] As described above, at least one parameter used for predictive maintenance may ensure that an impending malfunction or failure of the amplifier module 12 is located.

[0079] For example, the parameter may be specified as at least one of: operating hours of amplifier module 12 , a temperature of amplifier module 12 combined with another parameter of amplifier module 12 (eg operating hours of amplifier module 12 ), or more precisely a transistor parameter of amplifier module 12 .

[0080] The transistor parameters may correspond to an input level, a drain current and / or a gate current, wherein in particular the gate current is a common gate current of the amplifier module.

[0081] Therefore, the amplifier module 12 itself is configured to automatically send the corresponding data related to the parameter.Alternatively or additionally, the measurement data acquisition unit 18 is configured to measure the corresponding parameter.

[0082] Therefore, the measurement data acquisition unit 18 may include sensors for sensing parameters, ie a temperature sensor, a current sensor and / or a power sensor.

[0083] Furthermore, the measurement data analysis unit 20 receiving the acquired parameters may compare the acquired parameters with comparison parameters to find deviations that may indicate an impending failure.

[0084] The comparison parameter may be a previously acquired value of the same parameter.

[0085] Alternatively or additionally, the comparison parameter may correspond to a parameter derived from another amplifier module, which may be located at a similar location.

[0086] Regardless of the comparison parameter used, the time-dependent behavior of at least one parameter may be taken into account in order to predict the probability and / or time of failure of at least one amplifier module 12 .

[0087] For example, an increasing gate current (over time) may indicate that an associated transistor of amplifier module 12 is likely to malfunction or, more specifically, fail within the next two to three months.

[0088] Furthermore, an increased drain current of a transistor of amplifier module 12 or an increased drain current of amplifier module 12 may indicate a degradation or failure of the transistor or, more precisely, of a corresponding component located downstream of amplifier module 12, such as a (high frequency or, more precisely, radio frequency) connection, a cable or a combiner. For example, in the case of high powers handled by amplifier module 12, the brazing solder used for the connection may disappear over time.

[0089] Furthermore, high input levels (ie, between the nominal input level and the maximum input level) combined with short-term gate currents may indicate a high degree of transistor degradation, leading to failure within the next two to six months.

Claims

1. A method for performing predictive maintenance of an amplifier module (12), comprising the following steps: - acquiring at least one parameter of at least one amplifier module (12) via a measurement data acquisition unit (18), and - analyzing the at least one parameter acquired via a measurement data analysis unit (20) in order to predict a failure time of the at least one amplifier module (12), wherein the at least one parameter is a transistor parameter directly assigned to a transistor of the amplifier module (12), wherein the transistor parameters are input level, drain current and gate current, wherein the time-dependent behavior of the at least one parameter is analyzed, wherein the measurement data analysis unit (20) performs at least one of the following: an analysis identifying an increased gate current of the transistor indicating that the transistor is about to fail or fail within the next two to three months; an analysis identifying an increased drain current of the transistor or an increased drain current of the amplifier module indicating degradation or failure of a component downstream of the transistor or the amplifier module; or an analysis of high input levels between a nominal input level and a maximum input level combined with a short-term gate current indicating a high degree of degradation of the transistor resulting in failure within the next two to six months, Wherein a notification is output when the analysis results in an imminent failure, so that once the analysis has detected that a possible imminent failure may occur, the user is proactively notified.

2. The method of claim 1, wherein the gate current is a common gate current of the amplifier modules (12). The method of claim 1 , wherein the at least one parameter is compared with a comparison parameter of the same type.

4. The method of claim 1, wherein the notification is displayed on a display (36).

5. The method according to claim 1, wherein the notification is output by the amplifier module (12) itself, the measurement data acquisition unit (18), the measurement data analysis unit (20) and / or an external device (28).

6. The method according to claim 1, wherein the at least one acquired parameter and / or the analysis result is transmitted by telemetry and / or wherein the at least one acquired parameter and / or the analysis result is accessed via a network interface (30).

7. A system (10) for predictive maintenance of an amplifier module (12), comprising at least one measurement data acquisition unit (18), at least one measurement data analysis unit (20) and at least one amplifier module (12), wherein the at least one measurement data acquisition unit (18) and the at least one measurement data analysis unit (20) are configured to communicate with each other, wherein the at least one measurement data acquisition unit (18) is configured to acquire at least one parameter of the at least one amplifier module (12), wherein the at least one measurement data analysis unit (20) is configured to receive and analyze the acquired at least one parameter in order to predict a failure time of the at least one amplifier module (12), wherein the at least one parameter is a transistor parameter directly assigned to a transistor of the amplifier module (12), wherein the transistor parameters are input level, drain current and gate current, wherein the at least one measurement data analysis unit (20) is configured to analyze the time-dependent behavior of the at least one parameter, wherein the at least one measurement data analysis unit (20) is configured to perform at least one of the following: an analysis identifying an increased gate current of the transistor indicating that the transistor is about to fail or fail within the next two to three months; an analysis identifying an increased drain current of the transistor or an increased drain current of the amplifier module indicating degradation or failure of a component downstream of the transistor or the amplifier module; or an analysis of a high input level between a nominal input level and a maximum input level combined with a short-term gate current indicating a high degree of degradation of the transistor resulting in failure within the next two to three months, The at least one measurement data analysis unit (20), the measurement data acquisition unit (18), the amplifier module (12) and / or the external device (28) are configured to output a notification indicating a predicted failure time of the amplifier module (12) when the analysis results in an impending failure.

8. The system (10) of claim 7, wherein the gate current is a common gate current of the amplifier modules (12).

9. The system (10) according to claim 7, wherein: The at least one measurement data analysis unit (20) is configured to compare the at least one parameter with another parameter of the same type acquired from another amplifier module (12) and / or with a previously acquired parameter.

10. The system (10) according to claim 7, wherein the measurement data acquisition unit (18) and the measurement data analysis unit (20) are integrated in a common device (22).

11. The system (10) according to claim 7, wherein a network interface (30) and / or a telemetry system (32) are provided, via which the at least one parameter and / or the analysis result obtained is sent and / or accessed.

Images