A size measuring mechanism

Abstract

The present invention proposes a dimension measuring mechanism, which breaks through the structural form of traditional thickness and other dimension measuring devices, and the calibration thickness is d0; 1. Insert the calibration piece between the first probe and the second probe, detect the distance A11 of the first surface of the calibration piece by the first probe, detect the distance A12 of the second surface of the calibration piece by the second probe, and calculate the thickness d1 of the calibration piece; 2. Calculate the difference P1=d1-d0 between d1 and d0: 3. Detect the distance B11 of the first surface of the first board by the first probe, detect the distance B12 of the second surface of the first board by the second probe, calculate the thickness D1 of the first board, and subtract the difference P1 to obtain the true thickness Z1=D1-d1+d0 of the first board. Transport the artificial board between the first probe and the second probe, and withdraw the calibration piece from between the first probe and the second probe before measuring the thickness of the artificial board. The artificial board can be continuously and accurately measured, and the measurement errors caused by factors such as vibration and temperature changes can be overcome.

Description

Technical Field

[0001] The invention relates to the field of product measurement, and in particular to a dimension measuring mechanism. Background Art

[0002] The dimension measurement of products, such as the thickness measurement of panels such as artificial boards, is a common operation process in industrial production. Existing thickness measurement methods include physical contact measurement, ultrasonic measurement, X-ray measurement and laser measurement, among which laser measurement is becoming more and more popular due to certain efficiency advantages. The structure of the laser thickness gauge is well known. It is generally composed of two laser sensors shooting up and down. The two upper and lower laser sensors measure the position of the upper surface and the position of the lower surface of the object to be measured respectively, and the thickness of the object to be measured is obtained by calculation. The advantage of the laser thickness gauge is that it uses non-contact measurement, which is more accurate than the contact thickness gauge and will not lose accuracy due to wear. It is more accurate than the ultrasonic thickness gauge. There is no radiation pollution compared to the X-ray thickness gauge. However, whether it is a laser thickness gauge or other dimension measuring devices, the two probes are easily offset due to vibration and temperature changes, causing the originally set reference value to change, resulting in zero drift, and then causing measurement errors, making it difficult to achieve high-precision measurement, especially continuous high-precision measurement.

[0003] In view of this, the inventor of this case conducted in-depth research on the above-mentioned issues, which led to the emergence of this case. Summary of the invention

[0004] The object of the present invention is to provide an efficient and practical dimension measuring mechanism which can accurately measure the dimensions of products, especially the dimensions of continuously conveyed products.

[0005] In order to achieve the above object, the present invention adopts such technical solution:

[0006] A dimension measuring mechanism comprises a first probe and a second probe, and also comprises a calibration piece intermittently disposed between the first probe and the second probe.

[0007] It also includes a driving member for driving the calibration member to move, the calibration member has two states: a calibration position and a non-calibration position, and the driving member drives the calibration member to switch between the calibration position and the non-calibration position.

[0008] The calibration piece is a plate-like structure with uniform thickness.

[0009] The driving member drives the calibration member to move within the plane where the calibration member is located.

[0010] The calibration piece is perpendicular to the transmission direction of the detection signals emitted by the first probe and the second probe.

[0011] The first probe and the second probe are laser probes.

[0012] The laser detection lines emitted by the first probe and the second probe are parallel or overlapped.

[0013] When in the calibration position, the calibration component blocks the detection lines emitted by the first probe and the second probe; when in the non-calibration position, the calibration component does not block the detection lines emitted by the first probe and the second probe.

[0014] The first probe is located above the second probe.

[0015] The calibration piece is arranged horizontally.

[0016] The driving member comprises a horizontally arranged fluid pressure cylinder, and the calibration member is mounted on a movable end of the fluid pressure cylinder.

[0017] The calibration piece is equipped with a guiding device.

[0018] The guiding device comprises a horizontally arranged guide rail and a sliding block arranged on the calibration piece and matched with the guide rail.

[0019] The guide rail includes an upper rail located above the calibration member, and a lower rail located below the calibration member and parallel to the upper rail; the slider includes an upper block matched with the upper rail, and a lower block matched with the lower rail.

[0020] More than two upper blocks are arranged along the upper rail, and more than two lower blocks are arranged along the lower rail.

[0021] The upper rail comprises two parallel upper rail monomers, and the lower rail comprises two parallel lower rail monomers.

[0022] A spacing limiting component is arranged between the upper rail and the lower rail.

[0023] The upper rail and the lower rail are connected together through the spacing limiting component.

[0024] The first probe is equipped with an upper protective shell, and the second probe is equipped with a lower protective shell.

[0025] The lower protective shell includes a substrate located above the second probe, and a window is formed on the substrate for the detection signals of the first probe and the second probe to pass through.

[0026] The guide rail is installed on the lower surface of the base plate.

[0027] The calibration piece and the movable end of the fluid pressure cylinder are connected together through a connecting piece.

[0028] The connecting piece is located between the two lower rail monomers.

[0029] The fluid pressure cylinder is located below the calibration member, and a fixed end of the fluid pressure cylinder is connected to the lower protective shell.

[0030] Also included is a conveying device for conveying the board to be tested.

[0031] The conveying device includes a downstream conveying member located downstream of the first probe and the second probe, and an upstream conveying member located upstream of the first probe and the second probe.

[0032] A gap is defined between the downstream conveying member and the upstream conveying member for the detection signals of the first probe and the second probe to pass through.

[0033] The calibration piece is a stainless steel plate.

[0034] After adopting the above technical solution, the dimension measuring mechanism of the present invention breaks through the structural form of the traditional thickness and other dimension measuring devices. In the actual working process, the calibration piece can be intermittently extended between the first probe and the second probe, and the reference values ​​of the first probe and the second probe are corrected using the calibration size of the calibration piece. For example, when continuously measuring the thickness of the artificial board, the calibration thickness of the calibration piece is defined as d0; Step 1: Extend the calibration piece between the first probe and the second probe, and detect the distance A11 of the first surface of the calibration piece by the first probe, and detect the distance A12 of the second surface of the calibration piece by the second probe, and calculate the thickness d1 of the calibration piece; Step 2: Calculate the difference P1=d1-d0 between d1 and d0: Step 3: Detect the distance B11 of the first surface of the first board by the first probe, and detect the distance B12 of the second surface of the calibration piece by the second probe. Measure the distance B12 to the second surface of the first plate, calculate the thickness D1 of the first plate, and subtract the difference P1 to obtain the true thickness Z1 of the first plate = D1-d1+d0; Step 4: Insert the calibration piece between the first probe and the second probe, detect the distance A21 of the first surface of the calibration piece by the first probe, and detect the distance A22 of the second surface of the calibration piece by the second probe, and calculate the thickness d2 of the calibration piece; Step 5: Calculate the difference P2 = d2-d0 between d2 and d0: Step 6 : The first probe detects the distance B21 of the first surface of the second plate, and the second probe detects the distance B22 of the second surface of the second plate, calculates the thickness D2 of the second plate, and subtracts the difference P2 to obtain the true thickness Z2=D2-d2+d0 of the second plate; and so on, step n: insert the calibration piece between the first probe and the second probe, detect the distance AN1 of the first surface of the calibration piece by the first probe, and detect the distance AN2 of the second surface of the calibration piece by the second probe , calculate the thickness dN of the calibration piece; N = (n + 2) / 3; Step n + 1: calculate the difference PN between dN and d0 = dN-d0: Step n + 2: detect the distance BN1 of the first surface of the (n + 2) / 3th board by the first probe, detect the distance BN2 of the second surface of the (n + 2) / 3th board by the second probe, calculate the thickness DN of the (n + 2) / 3th board, and subtract the difference PN to obtain the true thickness ZN = DN-dN + d0 of the (n + 2) / 3th board. Transport the artificial board between the first probe and the second probe, and withdraw the calibration piece from between the first probe and the second probe before measuring the thickness of the artificial board. In this way, the thickness of the artificial board can be accurately measured, and continuous and accurate measurement can be performed, which can overcome the measurement errors caused by factors such as vibration and temperature changes. Compared with the prior art, the size measuring mechanism of the present invention can accurately measure the size of the product, especially the continuously transported product, which is efficient and practical. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1It is a simplified partial cross-sectional schematic diagram of the present invention.

[0036] In the figure:

[0037] 1-first probe 11-upper protective shell 2-second probe 21-lower protective shell 211-substrate 2111-window 3-calibration part 31-guide device 311-guide rail 3111-spacing limiting component 312-slider 4-driving part 51-downstream conveying part 52-upstream conveying part 53-gap 6-plate to be tested. DETAILED DESCRIPTION

[0038] In order to further explain the technical solution of the present invention, it is described in detail below through specific embodiments.

[0039] A size measuring mechanism of the present invention, such as Figure 1As shown, it includes a first probe 1 and a second probe 2, and also includes a calibration piece 3 intermittently located between the first probe 1 and the second probe 2. In the actual working process of the present invention, the calibration piece 3 can be intermittently extended between the first probe 1 and the second probe 2, and the reference values ​​of the first probe 1 and the second probe 2 are corrected by using the calibration size of the calibration piece 3. For example, when continuously measuring the thickness of the artificial board, the calibration thickness of the calibration piece 3 is defined as d0; Step 1: Extend the calibration piece 3 between the first probe 1 and the second probe 2, detect the distance A11 of the first surface of the calibration piece 3 by the first probe 1, detect the distance A12 of the second surface of the calibration piece 3 by the second probe 2, and calculate the thickness d1 of the calibration piece 3; Step 2: Calculate the difference P1=d1-d0 between d1 and d0: Step 3: Detect the distance B11 of the first surface of the first board by the first probe 1, and detect the distance A12 of the second surface of the calibration piece 3 by the second probe 2. Head 2 detects the distance B12 to the second surface of the first plate, calculates the thickness D1 of the first plate, and subtracts the difference P1 to obtain the true thickness Z1=D1-d1+d0 of the first plate; Step 4: Insert the calibration piece 3 between the first probe 1 and the second probe 2, detect the distance A21 to the first surface of the calibration piece 3 by the first probe 1, and detect the distance A22 to the second surface of the calibration piece 3 by the second probe 2, and calculate the thickness d2 of the calibration piece 3; Step 5: Calculate the difference P2=d2-d0 between d2 and d0: Step 6: Detect the distance B21 of the first surface of the second plate by the first probe 1, detect the distance B22 of the second surface of the second plate by the second probe 2, calculate the thickness D2 of the second plate, and subtract the difference P2 to obtain the true thickness Z2=D2-d2+d0 of the second plate; and so on, step n: insert the calibration piece 3 between the first probe 1 and the second probe 2, detect the distance AN1 of the first surface of the calibration piece 3 by the first probe 1, and detect the distance AN2 of the second surface of the calibration piece 3 by the second probe 2. From AN2, calculate the thickness dN of the calibration piece 3; N = (n+2) / 3; Step n+1: calculate the difference PN between dN and d0 = dN-d0: Step n+2: detect the distance BN1 of the first surface of the (n+2) / 3th board by the first probe 1, detect the distance BN2 of the second surface of the (n+2) / 3th board by the second probe 2, calculate the thickness DN of the (n+2) / 3th board, and subtract the difference PN to obtain the true thickness ZN = DN-dN+d0 of the (n+2) / 3th board. Transport the artificial board between the first probe 1 and the second probe 2, and remove the calibration piece 3 from between the first probe 1 and the second probe 2 before measuring the thickness of the artificial board. In this way, the thickness of the artificial board can be accurately measured, and continuous and accurate measurement can be performed, which can overcome the measurement errors caused by factors such as vibration and temperature changes.

[0040] Preferably, a driving member 4 is further included for driving the calibration member 3 to move. The calibration member 3 has two states, namely, a calibration position and a non-calibration position. The driving member 4 drives the calibration member 3 to switch between the calibration position and the non-calibration position. In the actual working process, the driving member 4 drives the calibration member 3 to switch between the calibration position and the non-calibration position as required. For example, before measuring the next artificial board to be tested 6, the driving member 4 drives the calibration member 3 to enter the calibration position for calibration.

[0041] Preferably, the calibration piece 3 is a plate-like structure with uniform thickness. The plate-like structure with uniform thickness is more conducive to the calibration piece 3 to calibrate the thickness of the plate-like plate to be tested 6 using the calibrated thickness.

[0042] Preferably, the driving member 4 drives the calibration member 3 to move in the plane where the calibration member 3 is located. This structure can realize the precise parallel movement of the plate-shaped calibration member 3, and is not prone to displacement or angle deviation, thereby ensuring the calibration accuracy.

[0043] Preferably, the calibration piece 3 is perpendicular to the transmission direction of the detection signal emitted by the first probe 1 and the second probe 2. This structure is more conducive to the first probe 1 and the second probe 2 to accurately measure the thickness of the calibration piece 3, and it is not easy to cause thickness error due to the angle deviation of the calibration piece 3.

[0044] In order to further enhance detection accuracy and practicability, preferably, the first probe 1 and the second probe 2 are laser probes.

[0045] Preferably, the laser detection lines emitted by the first probe 1 and the second probe 2 are parallel or overlapped. This structure helps ensure that the first probe 1 and the second probe 2 measure the calibration piece 3 and the plate to be measured 6 vertically or at the same angle, and measurement errors caused by angle deviations of the laser detection lines of the first probe 1 and the second probe 2 are not likely to occur.

[0046] Preferably, when in the calibration position, the calibration member 3 blocks the detection lines emitted by the first probe 1 and the second probe 2; when in the non-calibration position, the calibration member 3 does not block the detection lines emitted by the first probe 1 and the second probe 2. This structure facilitates the first probe 1 and the second probe 2 to perform accurate calibration measurements when the calibration member 3 is calibrated, and facilitates the first probe 1 and the second probe 2 to perform accurate measurements on the test plate 6 when the non-calibration position is reached.

[0047] Preferably, the first probe 1 is located above the second probe 2. This structure is more convenient to use, and the calibration piece 3 and the board to be measured 6 can be horizontally passed between the first probe 1 and the second probe 2 for measurement.

[0048] Preferably, the calibration member 3 is arranged horizontally. This structure can cooperate with the first probe 1 and the second probe 2 arranged vertically to perform precise calibration measurement.

[0049] Preferably, the driving member 4 comprises a horizontally arranged fluid pressure cylinder, and the calibration member 3 is mounted on the movable end of the fluid pressure cylinder. The driving member 4 can drive the calibration member 3 to move horizontally in the horizontal plane, and move into or out of the calibration area between the first probe 1 and the second probe 2. The fluid pressure cylinder can be specifically an air cylinder, an oil cylinder, etc.

[0050] Preferably, the calibration piece 3 is provided with a guide device 31. The guide device 31 can guide the movement of the calibration piece 3, so that the movement of the calibration piece 3 is more accurate and stable, and is not prone to deviation.

[0051] Preferably, the guide device 31 comprises a horizontally arranged guide rail 311, and a slider 312 arranged on the calibration member 3 and matched with the guide rail 311. The slider 312 and the guide rail 311 cooperate to guide the movement of the calibration member 3.

[0052] Preferably, the guide rail 311 includes an upper rail located above the calibration member 3, and a lower rail located below the calibration member 3 and parallel to the upper rail; the slider 312 includes an upper block matched with the upper rail, and a lower block matched with the lower rail. The upper block matches with the upper rail, and the lower block matches with the lower rail to guide and limit the calibration member 3 in the up and down directions at the same time, so as to avoid the calibration member 3 from deviating up and down, and ensure that the calibration member 3 moves in the same plane.

[0053] Preferably, more than two upper blocks are arranged along the upper rail, and more than two lower blocks are arranged along the lower rail. More than two upper blocks and more than two lower blocks can limit and guide the calibration member 3 in the length direction of the rail, so as to prevent the calibration member 3 from shifting up and down in the front-back direction of the rail, and ensure that the calibration member 3 moves in the same plane. In addition, the specific structure can be arranged so that the upper blocks and lower blocks closer to the extended end of the calibration member 3 are more dense, so as to further ensure the displacement accuracy of the extended end of the calibration member 3 being measured.

[0054] Preferably, the upper rail includes two parallel upper rail monomers, and the lower rail includes two parallel lower rail monomers. The two upper rail monomers and the two lower rail monomers can limit and guide the calibration member 3 in the left and right directions of the rail, so as to prevent the calibration member 3 from shifting up and down in the left and right directions of the rail, and ensure that the calibration member 3 moves in the same plane.

[0055] Preferably, a spacing limiting component 3111 is provided between the upper rail and the lower rail. The spacing limiting component 3111 can limit the spacing between the upper rail and the lower rail to ensure that the spacing between the two remains unchanged, thereby further ensuring that the calibration component 3 moves in the same plane.

[0056] Preferably, the upper rail and the lower rail are connected together by a spacing limiting component 3111. This structure can ensure the overall structural strength and state stability of the upper rail, the lower rail and the spacing limiting component 3111, and ensure the guidance of the calibration member 3.

[0057] In order to protect the first probe 1 and the second probe 2 and improve the practical installation performance, preferably, the first probe 1 is equipped with an upper protective shell 11 and the second probe 2 is equipped with a lower protective shell 21 .

[0058] Preferably, the lower protective shell 21 includes a substrate 211 located above the second probe 2, and the substrate 211 is formed with a window 2111 for the detection signals of the first probe 1 and the second probe 2 to pass through. When the calibration piece 3 is in the lower protective shell 21 and the board to be tested 6 passes over the substrate 211, the detection signal of the first probe 1 can be emitted downward from the window 2111 to the upper surface of the calibration piece 3, and the detection signal of the second probe 2 can be emitted upward from the window 2111 to the lower surface of the board to be tested 6.

[0059] Preferably, the guide rail 311 is installed on the lower surface of the base plate 211 , so that the calibration piece 3 can be installed in the lower protective shell 21 so that the calibration piece 3 is also protected by the lower protective shell 21 to ensure the accuracy of the calibration piece 3 .

[0060] In order to realize the connection structure between the calibration member 3 and the fluid pressure cylinder, preferably, the calibration member 3 and the movable end of the fluid pressure cylinder are connected together via a connecting member.

[0061] Preferably, the connecting member is located between the two lower rail units, so that the fluid pressure cylinder can be arranged in parallel between the two lower rail units, so that the fluid pressure cylinder drives the calibration member 3 horizontally and in a balanced manner, further ensuring the accuracy of the movement of the calibration member 3.

[0062] Preferably, the fluid pressure cylinder is located below the calibration member 3, and the fixed end of the fluid pressure cylinder is connected to the lower protective shell 21. This structure not only facilitates the parallel arrangement of the fluid pressure cylinder and the calibration member 3, but also reduces the overall length of the fluid pressure cylinder and the calibration member 3, thereby reducing the occupied space.

[0063] Preferably, a conveying device is also included for conveying the board to be measured 6. The conveying device can convey the board to be measured 6 to between the first probe 1 and the second probe 2 for measurement, thereby reducing labor and avoiding human interference.

[0064] Preferably, the conveying device includes a downstream conveying member 51 located downstream of the first probe 1 and the second probe 2, and an upstream conveying member 52 located upstream of the first probe 1 and the second probe 2. The upstream conveying member 52 and the downstream conveying member 51 can be in the form of horizontally arranged conveyor belts or conveyor rollers, and can continuously convey the plate to be tested 6.

[0065] Preferably, there is a gap 53 between the downstream conveying member 51 and the upstream conveying member 52 for the detection signals of the first probe 1 and the second probe 2 to pass through. When the board 6 to be tested is transported on the upper surfaces of the downstream conveying member 51 and the upstream conveying member 52, the gap 53 enables the first probe 1 and the second probe 2 to measure the board 6 to be tested unimpeded.

[0066] Preferably, the calibration piece 3 is a stainless steel plate, which has high strength, is not prone to rust, has strong durability and stable accuracy.

[0067] Preferably, the guide device 31 includes an upper plate at the top and a lower plate at the bottom; the calibration member 3 is located between the upper plate and the lower plate, and the lower surface of the upper plate is provided with a plurality of upper limit members that abut against the upper surface of the calibration member 3, and the upper surface of the lower plate is provided with a plurality of lower limit members that abut against the lower surface of the calibration plate. This ensures that the calibration member 3 slides accurately between the upper limit members and the lower limit members. The specific structure may be that a connecting member is provided between the upper plate and the lower plate.

[0068] Preferably, it also includes a controller for controlling the operation of the entire dimension measuring mechanism, so that automation can be achieved.

[0069] The product form of the present invention is not limited to the illustrations and embodiments of this case. Any appropriate changes or modifications made by anyone with similar ideas should be deemed to be within the patent scope of the present invention.

Claims

1. A dimension measuring mechanism, comprising a first probe and a second probe, Features: It also includes a calibration piece intermittently located between the first probe and the second probe; it also includes a driving piece for driving the calibration piece to move, the calibration piece has two states, a calibration position and a non-calibration position, and the driving piece drives the calibration piece to switch between the calibration position and the non-calibration position; the calibration piece is equipped with a guiding device; the guiding device includes a horizontally arranged guide rail, and a slider provided on the calibration piece and cooperating with the guide rail; the guide rail includes an upper rail located above the calibration piece, and a lower rail located below the calibration piece and parallel to the upper rail; the slider includes an upper block cooperating with the upper rail, and a lower block cooperating with the lower rail.

2. A dimension measuring mechanism according to claim 1, Features: The calibration piece is a plate-shaped structure with uniform thickness.

3. A dimension measuring mechanism according to claim 2, Features: The driving member drives the calibration member to move within the plane where the calibration member is located.

4. A dimension measuring mechanism according to claim 3, Features: The calibration piece is perpendicular to the transmission direction of the detection signals emitted by the first probe and the second probe.

5. A dimension measuring mechanism according to claim 4, Features: The first probe and the second probe are laser probes.

6. A dimension measuring mechanism according to claim 5, Features: The laser detection lines emitted by the first probe and the second probe are parallel or overlapped.

7. A dimension measuring mechanism according to claim 6, Features: When in the calibration position, the calibration component blocks the detection lines emitted by the first probe and the second probe; when in the non-calibration position, the calibration component does not block the detection lines emitted by the first probe and the second probe.

8. A dimension measuring mechanism according to any one of claims 2 to 7, Features: The first probe is located above the second probe.

9. A dimension measuring mechanism according to claim 8, Features: The calibration piece is arranged horizontally.

10. A dimension measuring mechanism according to claim 9, Features: The driving member comprises a horizontally arranged fluid pressure cylinder, and the calibration member is mounted on a movable end of the fluid pressure cylinder.

11. A dimension measuring mechanism according to claim 10, Features: More than two upper blocks are arranged along the upper rail, and more than two lower blocks are arranged along the lower rail.

12. A dimension measuring mechanism according to claim 11, Features: The upper rail comprises two parallel upper rail monomers, and the lower rail comprises two parallel lower rail monomers.

13. A dimension measuring mechanism according to claim 11, Features: A spacing limiting component is arranged between the upper rail and the lower rail.

14. A dimension measuring mechanism according to claim 13, Features: The upper rail and the lower rail are connected together through the spacing limiting component.

15. A dimension measuring mechanism according to claim 14, Features: The first probe is equipped with an upper protective shell, and the second probe is equipped with a lower protective shell.

16. A dimension measuring mechanism according to claim 15, Features: The lower protective shell includes a substrate located above the second probe, and a window is formed on the substrate for the detection signals of the first probe and the second probe to pass through.

17. A dimension measuring mechanism according to claim 16, Features: The guide rail is installed on the lower surface of the base plate.

18. A dimension measuring mechanism according to claim 12, Features: The calibration piece and the movable end of the fluid pressure cylinder are connected together through a connecting piece.

19. A dimension measuring mechanism according to claim 18, Features: The connecting piece is located between the two lower rail monomers.

20. A dimension measuring mechanism according to claim 19, Features: The fluid pressure cylinder is located below the calibration member, and a fixed end of the fluid pressure cylinder is connected to the lower protective shell.

21. A dimension measuring mechanism according to any one of claims 1 to 7, Features: Also included is a conveying device for conveying the board to be tested.

22. A dimension measuring mechanism according to claim 21, Features: The conveying device includes a downstream conveying member located downstream of the first probe and the second probe, and an upstream conveying member located upstream of the first probe and the second probe.

23. A dimension measuring mechanism according to claim 22, Features: A gap is defined between the downstream conveying member and the upstream conveying member for the detection signals of the first probe and the second probe to pass through.

24. A dimension measuring mechanism according to any one of claims 1 to 7, Features: The calibration piece is a stainless steel plate.

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