Self-clamping probe carrier assembly

Abstract

The present invention discloses a self-clamping probe carrier assembly, which includes a mounting base, a clamping assembly, a probe testing assembly, a pushing member, an elastic abutting member and a mounting shell. First through holes are provided on both sides of the mounting base; the clamping assembly includes side mounting plates, first connecting rods, a middle mounting plate, second connecting rods and a pushing plate. The mounting base is provided with a placement groove. The pushing plate is fixedly connected to the pushing member. The mounting shell is located in the placement groove. The side mounting plates are fixed to the mounting base. The middle mounting plate is opposite to the first through holes. The elastic abutting member is fixed to the middle of the pushing plate. A push rod passes through the first through holes to push the middle mounting plate, so that the pushing member approaches or moves away from the mounting shell. By inserting the push rod along the first through holes on both sides, the position of the pushing member is controlled. The first connecting rod and the second connecting rod are clamped at the dead point through the elastic abutting member, which facilitates subsequent testing. The testing is simple, the opening and closing are convenient, and the compatibility is strong, which is suitable for medium and small-sized tests.

Description

Technical Field

[0001] The present invention relates to the field of testing, and in particular to a self-clamping probe carrier assembly. Background Art

[0002] At present, in the electrical testing industry, most factories are introducing or planning to introduce automated testing production lines. To facilitate the maintenance of test fixtures used in conjunction with automated production lines, the modular design of fixtures has been gradually promoted. The fixture is divided into multiple modules and then assembled into the entire fixture. Most test fixtures use a carrier module. Although each carrier has obvious differences in size and shape, they are all for loading and fixing test products. This requires that the carrier must have good positioning and fixing effects.

[0003] The existing fixing methods are as follows: 1. Fixed to the fixture using screws; 2. Fixed to the fixture through a guide pin and can freely pick up and place the probe with a clamping device; 3. Fixed to the fixture through a guide pin and can freely pick up and place with a self-clamping device without a probe module. The first method cannot be freely picked up and placed on the fixture and is not compatible with various types of test fixtures on the production line. The second and third methods are either with a self-clamping structure or a self-probe module. Moreover, for the carrier with a self-probe module, the probe module is fixed and cannot move, and the probe is easily damaged. Both of these have the problem of poor compatibility and are not convenient for maintenance. The above solutions of the existing technology explain the disadvantages of the existing technology: inconvenient testing, weak compatibility, and not conducive to small-scale testing. Summary of the Invention

[0004] In order to overcome the deficiencies of the prior art, one of the purposes of the present invention is to provide a self-clamping probe carrier assembly, which can solve the problems of weak compatibility and being not conducive to small-scale testing.

[0005] One of the purposes of the present invention is achieved by adopting the following technical solutions:

[0006] A self-clamping probe carrier assembly includes a mounting base, a clamping assembly, a probe testing assembly, a pushing member, an elastic abutting member, and a mounting shell. First through holes are provided on both sides of the mounting base; the clamping assembly includes side mounting plates, a first connecting rod, a middle mounting plate, a second connecting rod, and a pushing plate. The two ends of the first connecting rod are respectively hinged to the side mounting plate and the middle mounting plate, and the two ends of the second connecting rod are respectively hinged to the middle mounting plate and the pushing plate; a placement groove is provided on the mounting base, the pushing plate is fixedly connected to the pushing member, the mounting shell is located in the placement groove, the side mounting plates are fixed to the mounting base, the middle mounting plate faces the first through hole, the elastic abutting member is fixed to the middle of the pushing plate, and a push pin passes through the first through hole to push the middle mounting plate, so that the pushing member approaches or moves away from the mounting shell.

[0007] Further, when in the jammed state, the first link and the second link are parallel, and the elastic abutting member abuts against the inner side wall of the mounting seat, so that the first link and the second link are in the jammed state, and the pushing member abuts against the mounting shell to fix the mounting shell to the mounting seat.

[0008] Further, the first through hole is strip-shaped.

[0009] Further, the number of the first links and the second links is two each.

[0010] Further, the probe test assembly includes a bottom seat body, a top connecting plate, a plurality of probe bodies, a probe fixing plate, a rotating structure and side connectors. The plurality of probe bodies are fixed to the probe fixing plate. Two ends of the rotating structure are respectively hinged to the top connecting plate and the bottom seat body, and the probe fixing plate is fixed to the top connecting plate.

[0011] Further, the rotating structure includes a first connector and a second connector. The first connector and the second connector are respectively hinged to the side connector through a rotating shaft. One end of the first connector is hinged to the top connecting plate, and the lower part of the second connector is hinged to the bottom seat body.

[0012] Further, second through holes are provided on both sides of the mounting seat, and the second through holes are opposite to the side connectors.

[0013] Further, the number of the side connectors is two, and the two side connectors are distributed on both sides of the probe fixing plate.

[0014] Further, two second through holes are provided on each side of the mounting seat, and the two second through holes are respectively opposite to the two side connectors.

[0015] Further, the self-clamping probe carrier plate assembly further includes a cover plate, the cover plate covers the pushing member, and the cover plate is fixed to the mounting seat.

[0016] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0017] Both ends of the first link are respectively hinged to the side mounting plate and the middle mounting plate, and both ends of the second link are respectively hinged to the middle mounting plate and the pushing plate; the mounting seat is provided with a placing groove, the pushing plate is fixedly connected to the pushing member, the mounting shell is located in the placing groove, the side mounting plate is fixed to the mounting seat, the middle mounting plate is opposite to the first through hole, the elastic abutting member is fixed to the middle of the pushing plate, and a push pin pushes the middle mounting plate through the first through hole, so that the pushing member approaches or moves away from the mounting shell. By inserting the push pin along the first through holes on both sides, the position of the pushing member is controlled, and the first link and the second link are clamped at the dead point through the elastic abutting member, which is convenient for subsequent testing. The testing is simple, the opening and closing are convenient, and the compatibility is strong, which is suitable for medium and small specifications of testing.

[0018] The above description is only an overview of the technical solution of the present invention. In order to be able to understand the technical means of the present invention more clearly, it can be implemented according to the content of the specification. And in order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the following specifically gives preferred embodiments and, in conjunction with the drawings, details are described as follows. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 is a perspective view of a preferred embodiment of the self-clamping probe carrier assembly of the present invention;

[0020] Figure 2 is Figure 1 a cross-sectional view of the self-clamping probe carrier assembly shown;

[0021] Figure 3 is Figure 1 a perspective view of the self-clamping probe carrier assembly shown;

[0022] Figure 4 is Figure 1 another perspective view of the self-clamping probe carrier assembly shown;

[0023] Figure 5 is Figure 1 yet another perspective view of the self-clamping probe carrier assembly shown;

[0024] Figure 6 is Figure 1 still another perspective view of the self-clamping probe carrier assembly shown;

[0025] Figure 7 is Figure 1 a partial perspective view of the self-clamping probe carrier assembly shown;

[0026] Figure 8 is Figure 1 another partial perspective view of the self-clamping probe carrier assembly shown.

[0027] In the figure: 10, mounting base; 11, first through hole; 12, second through hole; 20, clamping assembly; 21, side mounting plate; 22, first connecting rod; 23, middle mounting plate; 24, second connecting rod; 25, pushing plate; 30, probe testing assembly; 31, bottom seat body; 32, top connecting plate; 33, probe body; 34, probe fixing plate; 35, rotating structure; 351, first connecting piece; 352, second connecting piece; 36, side connecting piece; 40, pushing piece; 50, cover plate; 60, elastic abutting piece; 70, mounting shell. Detailed implementation manners

[0028] Next, in combination with the accompanying drawings and specific implementation manners, the present invention will be further described. It should be noted that, on the premise of no conflict, any combination can be formed between the following described embodiments or technical features.

[0029] It should be noted that when a component is referred to as being "fixed to" another component, it can be directly on the other component or there may also be an intermediate component. When a component is considered to be "connected to" another component, it can be directly connected to the other component or there may be an intermediate component at the same time. When a component is considered to be "disposed on" another component, it can be directly disposed on the other component or there may be an intermediate component at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are only for the purpose of illustration.

[0030] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which the present invention belongs. The terms used in the description of the present invention herein are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0031] Please refer to Figure 1-8, a self-clamping probe carrier assembly, comprising a mounting base 10, a clamping assembly 20, a probe testing assembly 30, a pushing member 40, an elastic abutting member 60 and a mounting shell 70. First through holes 11 are provided on both sides of the mounting base 10; the clamping assembly 20 includes side mounting plates 21, first connecting rods 22, a middle mounting plate 23, second connecting rods 24 and a pushing plate 25. Two ends of each first connecting rod 22 are respectively hinged to the side mounting plate 21 and the middle mounting plate 23, and two ends of each second connecting rod 24 are respectively hinged to the middle mounting plate 23 and the pushing plate 25; the mounting base 10 is provided with a placement groove, the pushing plate 25 is fixedly connected to the pushing member 40, the mounting shell 70 is located in the placement groove, the side mounting plates 21 are fixed to the mounting base 10, the middle mounting plate 23 faces the first through holes 11, the elastic abutting member 60 is fixed to the middle of the pushing plate 25, and a push rod pushes the middle mounting plate 23 through the first through holes 11, so that the pushing member 40 approaches or moves away from the mounting shell 70. By inserting the push rod along the first through holes 11 on both sides, the position of the pushing member 40 is controlled. Through the elastic abutting member 60, the first connecting rod 22 and the second connecting rod 24 are clamped at the dead center, which is convenient for subsequent testing. The testing is simple, the opening and closing are convenient, and the compatibility is strong, which is suitable for medium and small-sized tests.

[0032] Preferably, when in the clamped state, the first connecting rod 22 is parallel to the second connecting rod 24, and the elastic abutting member 60 abuts against the inner side wall of the mounting base 10, so that the first connecting rod 22 and the second connecting rod 24 are in the clamped state, and the pushing member 40 abuts against the mounting shell 70 to fix the mounting shell 70 to the mounting base 10. The first through holes 11 are strip-shaped, so as to satisfy that the push rod abuts against and pushes the middle mounting plate 23 along the extending direction of the first through holes 11.

[0033] Preferably, the number of both the first connecting rods 22 and the second connecting rods 24 is two. In the specific application process, when in the clamped state, the probe testing assembly 30 operates for testing. When it is necessary to replace the test piece after the test is completed, it is necessary to insert the push rod into the first through holes 11 to push the middle mounting plate 23, so as to release the clamped state. The operation is simple and the clamping is easy.

[0034] Preferably, the probe test assembly 30 includes a bottom seat body 31, a top connecting plate 32, a plurality of probe bodies 33, a probe fixing plate 34, a rotating structure 35 and a side connecting member 36. The plurality of probe bodies 33 are fixed to the probe fixing plate 34. Two ends of the rotating structure 35 are respectively hinged to the top connecting plate 32 and the bottom seat body 31, and the probe fixing plate 34 is fixed to the top connecting plate 32. The rotating structure 35 includes a first connecting member 351 and a second connecting member 352. The first connecting member 351 and the second connecting member 352 are respectively hinged to the side connecting member 36 through a rotating shaft. An end of the first connecting member 351 is hinged to the top connecting plate 32, and a lower portion of the second connecting member 352 is hinged to the bottom seat body 31. Second through holes 12 are provided on both sides of the mounting seat 10, and the second through holes 12 are opposite to the side connecting members 36. A push rod is inserted into the second through holes 12 to push the side connecting members 36, thereby adjusting the position of the top connecting plate 32.

[0035] Preferably, the number of the side connecting members 36 is two, and the two side connecting members 36 are distributed on both sides of the probe fixing plate 34. Two second through holes 12 are provided on each side of the mounting seat 10, and the two second through holes 12 are respectively opposite to the two side connecting members 36. The self-clamping probe carrier assembly further includes a cover plate 50. The cover plate 50 covers the pushing member 40, and the cover plate 50 is fixed to the mounting seat 10. The structure is novel, the design is ingenious, the applicability is strong, and it is convenient to promote. In this application, it can ensure that the side mounting plate 21, the middle mounting plate 23 and the pushing plate 25 are pushed forward in parallel, ensuring the smoothness of the pushing and avoiding deviation.

[0036] The above embodiments are only the preferred embodiments of the present invention, and cannot be used to limit the scope of protection of the present invention. Any non-substantial changes and substitutions made by those skilled in the art based on the present invention belong to the scope of protection required by the present invention.

Claims

1. A self-clamping probe carrier assembly, comprising a mounting base, a clamping assembly, a probe testing assembly, a pushing member, an elastic abutting member and a mounting shell, Characterized in that: First through holes are provided on both sides of the mounting base; The clamping assembly includes side mounting plates, first connecting rods, a middle mounting plate, second connecting rods and a pushing plate. Two ends of each first connecting rod are respectively hinged to the side mounting plate and the middle mounting plate, and two ends of each second connecting rod are respectively hinged to the middle mounting plate and the pushing plate; The mounting base is provided with a placement groove. The pushing plate is fixedly connected to the pushing member. The mounting shell is located in the placement groove. The side mounting plates are fixed to the mounting base. The middle mounting plate faces the first through hole. The elastic abutting member is fixed to the middle of the pushing plate. A push pin passes through the first through hole to push the middle mounting plate, so that the pushing member approaches or moves away from the mounting shell. When in a stuck state, the first connecting rod and the second connecting rod are parallel, and the elastic abutting member abuts against the inner side wall of the mounting base, so that the first connecting rod and the second connecting rod are in a stuck state. The pushing member abuts against the mounting shell to fix the mounting shell to the mounting base. The first through hole is in a long strip shape.

2. The self-clamping probe carrier assembly according to claim 1, Characterized in that: The number of both the first connecting rod and the second connecting rod is two.

3. The self-clamping probe carrier assembly according to claim 1, Characterized in that: The probe testing assembly includes a bottom seat body, a top connecting plate, a plurality of probe bodies, a probe fixing plate, a rotating structure and side connecting members. The plurality of probe bodies are fixed to the probe fixing plate. Two ends of the rotating structure are respectively hinged to the top connecting plate and the bottom seat body. The probe fixing plate is fixed to the top connecting plate.

4. The self-clamping probe carrier assembly according to claim 3, Characterized in that: The rotating structure includes a first connecting member and a second connecting member. The first connecting member and the second connecting member are respectively hinged to the side connecting members through rotating shafts. One end of the first connecting member is hinged to the top connecting plate, and the lower part of the second connecting member is hinged to the bottom seat body.

5. The self-clamping probe carrier assembly according to claim 4, Characterized in that: Second through holes are provided on both sides of the mounting base, and the second through holes face the side connecting members.

6. The self-clamping probe carrier assembly according to claim 4, Characterized in that: The number of the side connecting members is two, and the two side connecting members are distributed on both sides of the probe fixing plate.

7. The self-clamping probe carrier assembly according to claim 6, Characterized in that: Two second through holes are provided on each side of the mounting base, and the two second through holes respectively face the two side connecting members.

8. The self-clamping probe carrier assembly according to claim 1, Characterized in that: The self-clamping probe carrier assembly further includes a cover plate, the cover plate covers the pushing member, and the cover plate is fixed to the mounting base.

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