A T / R array automatic test system calibration kit, test system and test method

Abstract

The present invention discloses a calibration kit, a test system and a test method for a T / R array automatic test system. The calibration kit for the T / R automatic test system comprises a kit box and one and / or more calibration modules arranged in the box. The calibration modules comprise a straight-through standard part T arranged on a printed circuit board, a delay line standard part L, a first reflection standard part R, a second reflection standard part R' and a radio frequency connector arranged on the kit box to connect the two ends of each standard part. The standard module is tested by connecting the radio frequency connectors at the two ends of each standard part through the T / R test system. The present invention can greatly improve the calibration accuracy and calibration efficiency of the T / R array automatic test system, and can meet the calibration requirements in a large-scale T / R array automatic test system. In addition, unlike the high-precision calibration toolbox currently provided by vector network analyzer manufacturers, which has great requirements for processing technology, the processing technology of the standard parts required by the present invention can meet general engineering implementation.

Description

Technical Field

[0001] The present invention relates to the field of automatic testing technology, and in particular to a T / R array automatic testing system calibration kit, a testing system and a testing method. Background Art

[0002] T / R components are the basis of phased array radar and are the core components of phased array radar. With the development of radar technology, T / R components have shown the characteristics of multi-channel, high frequency band and high performance. In order to meet the corresponding testing requirements, the development of multi-channel, multi-component, high-precision T / R array automatic test system has become increasingly important. In the multi-channel, multi-component T / R array test system, SOLT calibration needs to be performed on each channel. A large number of repetitive calibration processes lead to low calibration efficiency. At the same time, it is easy to introduce repeatability errors and cause serious wear of the calibration parts, resulting in a decrease in the calibration accuracy of the system. Therefore, how to improve the accuracy and efficiency of T / R array calibration is a technical problem that needs to be solved urgently. Summary of the invention

[0003] In order to solve the above problems, the first aspect of the present invention provides a T / R array automatic test system calibration kit, the T / R automatic test system calibration kit comprises a kit box and one and / or more calibration modules arranged in the box, the calibration module comprises a straight-through standard component T, a delay line standard component L, a first reflection standard component R, a second reflection standard component R' arranged on a printed circuit board, and a radio frequency connector arranged on the kit box to connect both ends of each standard component, and the standard module is tested by connecting the radio frequency connectors at both ends of each standard component through a T / R test system.

[0004] Adjacent calibration modules among the plurality of calibration modules are physically connected via a bracket;

[0005] The RF connectors at both ends of the calibration piece adopt 2.92mm SMP connectors, which are convenient for testing and plugging;

[0006] The printed circuit board in the standard module adopts Rogress4350 board;

[0007] The standard parts in the calibration module are separated by metal strips to prevent coupling and crosstalk of calibration signals;

[0008] A second aspect of the present invention provides a T / R array automatic test system, the T / R array automatic test system comprising an embedded network A, an embedded network B, a vector network analyzer and a processing terminal, wherein:

[0009] The radio frequency connector of the T / R array automatic test system calibration kit is connected to one end of the embedded network A and one end of the embedded network B respectively;

[0010] The vector network analyzer is connected to the other end of the embedded network A and the embedded network B;

[0011] The processing terminal is connected to the vector network, and realizes error extraction of the embedded network A and the embedded network B by controlling the input and output of the radio frequency signal.

[0012] A third aspect of the present invention provides a T / R array automatic testing method, the T / R array automatic testing method comprising the following steps:

[0013] Self-calibration: Before calibrating the tool kit, perform a SOLT self-calibration on the vector network analyzer in the T / R array automatic test system;

[0014] Calibration mode selection: Select offline calibration mode or online calibration mode according to whether the vector network analyzer in the T / R array automatic test system is remotely controlled;

[0015] Embedded network error extraction: Extract errors embedded in microwave test networks by controlling RF signal input and output;

[0016] Calculate the true index of the DUT: obtain the true index of the DUT by deducting the embedded component from the test result.

[0017] The beneficial effects of the present invention are as follows: by adopting the designed calibration kit, the calibration amplitude error of the T / R array automatic test system is less than 0.2dB, the standing wave ratio error is less than 0.1, the phase error is less than 3°, and the calibration time is shortened to one-fourth of the currently used SOLT calibration method. The calibration accuracy and calibration efficiency of the T / R array automatic test system are greatly improved, and the calibration efficiency increases linearly with the increase of the array scale. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 is a schematic diagram of a calibration kit for a T / R array automatic test system;

[0019] Figure 2 It is the 8-item error model of the T / R array automatic test system;

[0020] Figure 3 is a HFSS simulation model of the through standard component T of the present invention;

[0021] Figure 4 is a HFSS simulation model of the reflection standard component R of the present invention;

[0022] Figure 5 is a HFSS simulation model of the reflection standard component L of the present invention;

[0023] Figure 6 It is a front view and a top view of the calibration kit of the present invention;

[0024] Figure 7 It is the calibration algorithm software implementation interface corresponding to the present invention. DETAILED DESCRIPTION

[0025] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0026] The main purpose of the present invention is to provide a T / R array automatic test system calibration kit, aiming to solve the technical problems of calibration efficiency, calibration rate and production cost existing in the prior art.

[0027] To achieve the above-mentioned purpose, the present invention proposes a T / R array automatic test system calibration kit, wherein each calibration module of the calibration kit comprises one through standard component T, one delay line standard component L, and two reflection standard components R, and the four standard components are integrated on a printed circuit board to form a calibration module; the calibration kit implements a calibration algorithm in Matlab.

[0028] The characteristic impedance of the through standard T is consistent with the device under test and the system impedance, the insertion loss is less than 0.2dB in 14-18GHz, the standing wave ratio VSWR is less than 1.08, and S11<-35dB;

[0029] The characteristic impedance of the delay line standard component L is consistent with the impedance of the device under test and the system, the insertion loss is less than 0.225 dB within 14-18GHz, the standing wave ratio VSWR is less than 1.1, S11<-35dB, and the phase difference with the straight-through standard component is between 20°-160°;

[0030] The characteristic impedance of the reflection standard R is consistent with the impedance of the device under test and the system. The phase of the reflection coefficient is within plus or minus 89° within 14-18GHz, and the reflection coefficient is>0.98;

[0031] The calibration module is designed for the DUT with SMP interface mode, and adopts SMP radio frequency interface to facilitate the connection of the calibration toolbox;

[0032] The calibration module adopts the method of standard parts integration, integrating 4 standard parts on a printed circuit board;

[0033] The standard parts of the standard parts module are isolated by metal spacers to avoid signal coupling and crosstalk during the calibration process, which may affect the calibration accuracy;

[0034] The modules of the calibration kit are connected by brackets, which facilitates the extension and cutting of the modules, making the calibration kit more adaptable and flexible;

[0035] The positional deployment of the standard parts in the calibration parts module is determined by the structure and scale of the T / R array components;

[0036] The calibration algorithm corresponding to the calibration kit can realize online and offline calibration;

[0037] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0038] The present invention proposes an embodiment, referring to Figure 1 , Figure 1 The present invention proposes a T / R array automatic test system calibration kit, wherein each calibration module of the calibration kit comprises a through standard component T, a delay line standard component L, and two reflection standard components R, and the four standard components are integrated on a printed circuit board to form a calibration module.

[0039] like Figure 2 As shown, the purpose of the present invention is to realize the calibration of the T / R array automatic test system, specifically, Figure 2 The embedded network shown has 8 errors to be solved. To solve all the error terms, the present invention designs a calibration module. Through the test of the calibration module by the test system, the error terms of the embedded network are inverted. When the system performs the test, the error terms are deducted from the test results to obtain the true indicators of the tested part.

[0040] Preferably, Figure 3 As shown, the through standard component design in the present invention is first subjected to electromagnetic simulation in HFSS. According to the solution of system impedance and the principle of material selection, the plate material is Rogress4530, the metal layer thickness is 35 microns, the dielectric layer thickness is 0.508 mm, and the physical length is 20.07 mm.

[0041] Preferably, Figure 4 As shown, the design of the reflection standard component in the present invention is first subjected to electromagnetic simulation in HFSS. According to the solution of the system impedance and the principle of material selection, the plate material is Rogress4530, the metal layer thickness is 35 microns, the dielectric layer thickness is 0.508 mm, and the physical length is 10.04 mm.

[0042] Preferably, Figure 5As shown, the delay standard component design in the present invention is first subjected to electromagnetic simulation in HFSS. According to the solution of system impedance and the principle of material selection, the plate material is Rogress4530, the metal layer thickness is 35 microns, the dielectric layer thickness is 0.508 mm, and the physical length is 22.14 mm.

[0043] Preferably, Figure 6 As shown, the present invention realizes a complete calibration kit by connecting the calibration modules through a bracket.

[0044] Preferably, Figure 7 As shown, the present invention uses Matlab programming language to implement the calibration algorithm corresponding to the calibration kit, and can realize both offline and online calibration modes.

[0045] It should be noted that, for the above-mentioned various method embodiments, for the sake of simplicity of description, they are all expressed as a series of action combinations, but those skilled in the art should be aware that this application is not limited by the order of the actions described, because according to this application, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and units involved are not necessarily required by this application.

[0046] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0047] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be implemented by instructing related hardware through a computer program, and the program can be stored in a computer-readable storage medium, and when the program is executed, it can include the processes of the embodiments of the above-mentioned methods. The storage medium can be a disk, an optical disk, a ROM, a RAM, etc.

[0048] The above description is only a preferred embodiment of the present invention, which cannot be used to limit the scope of rights of the present invention. Modifications and changes made by those skilled in the art do not deviate from the spirit and scope of the present invention, and should be within the protection scope of the appended claims of the present invention.

Claims

1. A T / R array automatic test system calibration kit, characterized in that: The calibration kit of the T / R automatic test system comprises a kit box and one and / or more calibration modules arranged in the box, wherein the calibration module comprises a through standard component T, a delay line standard component L, a first reflection standard component R, a second reflection standard component R' arranged on a printed circuit board, and a radio frequency connector arranged on the kit box to connect both ends of each standard component, and the standard module is tested by connecting the radio frequency connectors at both ends of each standard component through the T / R test system; each standard component in the calibration module is separated by a metal spacer to prevent coupling and crosstalk of the calibration signal; The plate material of the through standard part T is Rogress4530, the metal layer thickness is 35 microns, the dielectric layer thickness is 0.508 mm, and the physical length is 20.07 mm; The plate material of the delay line standard part L is Rogress4530, the metal layer thickness is 35 microns, the dielectric layer thickness is 0.508 mm, and the physical length is 22.14 mm; The plate material of the first reflection standard component R is Rogress4530, the thickness of the metal layer is 35 microns, the thickness of the dielectric layer is 0.508 mm, and the physical length is 10.04 mm; The characteristic parameters of the second reflection standard component R′ and the first reflection standard component R are consistent.

2. A T / R array automatic test system calibration kit as claimed in claim 1, characterized in that: Adjacent calibration modules among the plurality of calibration modules are physically connected via a bracket.

3. A T / R array automatic test system calibration kit as claimed in claim 1, characterized in that: The RF connectors at both ends of the calibration piece use 2.92mm SMP connectors to facilitate testing and plugging.

4. A T / R array automatic test system calibration kit as claimed in claim 1, characterized in that: The printed circuit board in the standard module adopts Rogress4350 board.

5. A T / R array automatic test system, comprising a T / R array automatic test system calibration kit according to any one of claims 1 to 4, characterized in that: It also includes embedded network A, embedded network B, vector network analyzer and processing terminal, wherein the radio frequency connector of the T / R array automatic test system calibration kit is respectively connected to one end of embedded network A and embedded network B, the vector network analyzer is connected to the other end of embedded network A and embedded network B, the processing terminal is connected to the vector network, and error extraction of embedded network A and embedded network B is achieved by controlling the input and output of radio frequency signals.

6. A T / R array automatic testing method, using a T / R array automatic testing system as claimed in claim 5, characterized in that: The steps include: Self-calibration: Before calibrating the tool kit, perform a SOLT self-calibration on the vector network analyzer in the T / R array automatic test system; Calibration mode selection: Select offline calibration mode or online calibration mode according to whether the vector network analyzer in the T / R array automatic test system is remotely controlled; Embedded network error extraction: Extract the errors embedded in the microwave test network by controlling the RF signal input and output; Calculate the true index of the DUT: obtain the true index of the DUT by deducting the embedded component from the test result.

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