A high-precision temperature model calibration method and system

Abstract

The present invention discloses a high-precision temperature model calibration method and system, the method comprising the following steps: step S1, selecting a plurality of temperature points in a predetermined temperature range, and constructing a model of the corrected parameters of the temperature range formed by the different temperature points using the test results of the plurality of different temperature points; step S2, substituting the constructed model of the corrected parameters of the temperature range formed by the different temperature points into a designed bandgap reference circuit for simulation, and fitting it with the actual situation of the test value, thereby obtaining the model of the corrected parameters of each temperature range after calibration, so as to achieve the purpose of consistency between the simulation and the test value.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit design, and in particular to a high-precision temperature model calibration method and system. Background Art

[0002] In circuit design, designers are often troubled by the deviation between simulation values ​​and test results. Taking the bipolar transistor model (BJT model) as an example, the temperature parameter xti=3 of the original model of the simulator is the default unique single value, but this value cannot satisfy the temperature drift at each temperature point of -40°~125° with the process fluctuation. For the base-emitter voltage VBE of the bipolar transistor BJT transistor, the error between the original model and the measured value fluctuates between -0.29% and +0.72% (as shown in the 4th column of Table 1 below) in the temperature range of -40°~+125°, and the temperature coefficient of the original model is significantly different from the temperature coefficient of the measured value (as shown in the 5th row of Table 2); the average temperature coefficient tested in the temperature range of -40°~+25° is 46ppm, and the average temperature coefficient tested in the temperature range of -40°~+125° is 16ppm, and the corresponding test screening averages are 44ppm and -22ppm, while the original model values ​​are 10ppm and -10ppm respectively, and the difference between the two is significant.

[0003] Table 1 Comparison between original model and test value

[0004]

[0005]

[0006] Table 2 Comparison of temperature coefficients of original model and test value

[0007] -40～25℃ 25～125℃ Temperature coefficient comparison: ppm / ℃ ppm / ℃ Test mean 46 -16 Test Screening Mean 44 -22 Original model simulation 10 -11 Summary of the invention

[0008] In order to overcome the deficiencies of the above-mentioned prior art, the purpose of the present invention is to provide a high-precision temperature model calibration method and system, which can correct the simulation results by modifying the model when there is a large difference between the test data and the simulation data, and use the model method to repair the circuit to achieve a smaller error with the test value, and further reduce the error of circuit simulation and testing. Combined with the test results, and using the circuit to verify the accuracy of the model, it can play a certain guiding role in high-precision design.

[0009] To achieve the above object, the present invention proposes a high-precision temperature model calibration method, comprising the following steps:

[0010] Step S1, selecting a number of temperature points in a predetermined temperature range, and constructing a model of the corrected parameters of the temperature range formed by the different temperature points using the test results of the different temperature points;

[0011] Step S2, substitute the model of the corrected parameters of the temperature interval formed by the constructed different temperature points into the designed bandgap reference circuit for simulation, and fit it with the actual situation of the test value, so as to obtain the calibrated model of the corrected parameters of each temperature interval, so as to achieve the purpose of consistency between the simulation and the test value.

[0012] Preferably, the method is applied to calibrate a temperature parameter xti of a BJT device.

[0013] Preferably, the predetermined temperature range is -40 degrees to 125 degrees.

[0014] Preferably, in step S1, 13 different temperature points, namely -40°, -30°, -15°, 0°, 15°, 25°, 35°, 50°, 70°, 85°, 100°, 115°, and 125°, are selected in the temperature range of -40° to 125°.

[0015] Preferably, in step S1 , for each temperature interval, the temperature coefficient xti is constructed as an equation that varies with temperature.

[0016] Preferably, in the temperature range of temp<-40, the model of the calibrated correction parameter is:

[0017] xti_fitting0=0*(temp<-40).

[0018] In the temperature range of -40 ≤ temp ≤ -30, the model of the calibrated correction parameters is

[0019] xti_fitting1 = (1.93 × 10 -3 ×temp+5.59×10 -2 )×(temp≥-40)×(temp≤-30),

[0020] In the temperature range of -30<temp≤-15, the model of the calibrated correction parameters is

[0021] xti_fitting2 = (2.449 × 10 -3 ×temp+7.147×10 -2 )×(temp>-30)×(temp≤-15),

[0022] In the temperature range of -15<temp≤0, the model of the calibrated correction parameters is

[0023] xti_fitting3 = (6.0763333 × 10 -3 ×temp+1.2588×10-1 )×(temp>-15)×(temp≤0),

[0024] In the temperature range of 0<temp≤15, the model of the calibrated correction parameters is

[0025] xti_fitting4 = (2.5541333 × 10 -3 ×temp+1.2588×10 -1 )×(temp>0)×(temp≤15),

[0026] In the temperature range of 15<temp≤25, the model of the calibrated correction parameters is

[0027] xti_fitting5=(-0.0509×temp+1.2725)×(temp>15)×(temp≤25),

[0028] In the temperature range of 25<temp≤35, the model of the calibrated correction parameters is

[0029] xti_fitting6=(0.05831×temp-1.45775)×(temp>25)×(temp≤35),

[0030] In the temperature range of 35<temp≤50, the model of the calibrated correction parameters is

[0031] xti_fitting7=(-0.01694×temp+1.176)×(temp>35)×(temp≤50),

[0032] In the temperature range of 50<temp≤70, the model of the calibrated correction parameters is

[0033] xti_fitting8 = (3.53775 × 10 -3 ×temp+0.1521125)×(temp>50)×(temp≤70),

[0034] In the temperature range of 70<temp≤85, the model of the calibrated correction parameters is

[0035] xti_fitting9=(5.8096666667×10 -3 ×temp-6.9216666667)×(temp>70)×(temp≤85),

[0036] In the temperature range of 85<temp≤100, the model of the calibrated correction parameters is

[0037] xti_fitting10=(3.0566667×10 -3 ×temp+0.22708333)×(temp>85)×(temp≤100),

[0038] In the temperature range of 100<temp≤115, the model of the calibrated correction parameters is

[0039] xti_fitting11=(1.9308667×10 -3 ×temp+0.33966333)×(temp>100)×(temp≤115),

[0040] In the temperature range of 115<temp≤125, the model of the calibrated correction parameters is

[0041] xti_fitting12 = (1.9637 × 10 -3 ×temp+0.3358875)×(temp>115)×(temp≤125),

[0042] In the temperature range of temp>125, the model of the calibrated correction parameters is

[0043] xti_fitting13=0×(temp>125).

[0044] Preferably, the total temperature coefficient is calculated as:

[0045]

[0046] To achieve the above object, the present invention also provides a high-precision temperature model calibration system, comprising:

[0047] A model construction module is used to select a number of temperature points in a predetermined temperature range, and construct a model of the parameters corrected by the temperature range formed by the different temperature points using the test results of the different temperature points;

[0048] The simulation fitting module is used to substitute the model of the corrected parameters of the temperature interval formed by the constructed different temperature points into the designed bandgap reference circuit for simulation, and fit it with the actual situation of the test value, so as to obtain the calibrated model of the corrected parameters of each temperature interval, so as to achieve the purpose of consistency between the simulation and the test value.

[0049] Preferably, the method is applied to the calibration of the temperature parameter xti of the BJT device, the predetermined temperature range is -40 degrees to 125 degrees, and 13 different temperature points of -40°, -30°, -15°, 0, 15°, 25°, 35°, 50°, 70°, 85°, 100°, 115°, and 125° are selected in the temperature range of -40° to 125°.

[0050] Preferably, the model construction module constructs the temperature coefficient xti into an equation that varies with temperature for each temperature interval.

[0051] Compared with the prior art, the high-precision temperature model correction method and system of the present invention corrects the simulation results by modifying the model when there is a large difference between the test data and the simulation data, and uses the model method to repair the circuit to achieve the purpose of smaller error with the test value, and further reduce the error of circuit simulation and testing. Finally, combined with the test results, the accuracy of the model is verified through the circuit, thereby playing a certain guiding role in high-precision design. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] Figure 1 A flow chart of the steps of a high-precision temperature model calibration method of the present invention;

[0053] Figure 2 A system architecture diagram of a high-precision temperature model calibration system of the present invention;

[0054] Figure 3 It is a comparison diagram of the temperature coefficient curve and the test value in the embodiment of the present invention. DETAILED DESCRIPTION

[0055] The following describes the implementation of the present invention through specific examples and in conjunction with the accompanying drawings. Those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and the details in this specification can also be modified and changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention.

[0056] Figure 1 FIG. 1 is a flow chart of the steps of a high-precision temperature model calibration method of the present invention. Figure 1 As shown, the present invention provides a high-precision temperature model calibration method, comprising the following steps:

[0057] Step S1, selecting a plurality of temperature points in a predetermined temperature interval, and constructing a model of the parameters corrected by the temperature interval formed by the different temperature points using the test results of the plurality of different temperature points.

[0058] In a specific embodiment of the present invention, a BJT device is taken as an example, and its temperature range of -40 degrees to 125 degrees is used. Several different temperature points are selected in the temperature range, and the test results of different temperature points in the temperature range of -40 degrees to 125 degrees are used to construct a model of the parameters corrected by the temperature range formed by the several different temperature points. Specifically, taking the temperature parameter xti of the calibration BJT device as an example, xti is constructed into an equation that changes with temperature (i.e., it is no longer the only default value xti=3), that is, in each temperature range, the temperature parameter xti is constructed into an equation that changes with temperature.

[0059] Step S2, substitute the model of the corrected parameters of the temperature interval formed by the constructed different temperature points into the designed bandgap reference circuit for simulation, and fit it with the actual situation of the test value, so as to obtain the final model of the corrected parameters of each temperature interval, so as to achieve the purpose of consistency between the simulation and the test value.

[0060] In a specific embodiment of the present invention, taking the temperature parameter xti of the BJT device for calibration as an example, 13 different temperature points are selected in the temperature range of -40° to 125°. In the prior art, the temperature parameter xti=3 is a default value, but this value cannot satisfy the situation that the temperature drift fluctuates with the process at each temperature point of -40° to 125°. The present invention selects 13 different temperature points (-40°, -30°, -15°, 0, 15°, 25°, 35°, 50°, 70°, 85°, 100°, 115°, 125°) in the temperature range of -40° to 125° and uses the test results of these several different temperature points to construct a model of the parameters corrected by the temperature intervals formed by different temperature points, that is, to construct 14 interval equations, and substitute them into the designed bandgap reference circuit for simulation, so as to fit the actual situation of the test value and achieve the purpose of consistency between the simulation and the test value.

[0061] Figure 2 FIG. 1 is a system architecture diagram of a high-precision temperature model calibration system of the present invention. Figure 2 As shown, the present invention provides a high-precision temperature model calibration system, comprising:

[0062] The model construction module 201 is used to select a number of temperature points in a predetermined temperature range, and construct a model of the parameters corrected by the temperature range formed by the different temperature points using the test results of the different temperature points.

[0063] In a specific embodiment of the present invention, a BJT device is taken as an example, and its temperature range of -40 degrees to 125 degrees is used. Several different temperature points are selected in the temperature range, and the test results of different temperature points in the temperature range of -40 degrees to 125 degrees are used to construct a model of the parameters corrected by the temperature range formed by the several different temperature points. Specifically, taking the temperature parameter xti of the calibration BJT device as an example, xti is constructed into an equation that changes with temperature (i.e., it is no longer the only default value xti=3), that is, in each temperature range, the temperature parameter xti is constructed into an equation that changes with temperature.

[0064] The simulation fitting module 202 is used to substitute the model of the corrected parameters of the temperature interval formed by the constructed different temperature points into the designed bandgap reference circuit for simulation, and fit it with the actual situation of the test value, so as to obtain the final model of the corrected parameters of each temperature interval, so as to achieve the purpose of consistency between the simulation and the test value.

[0065] In a specific embodiment of the present invention, taking the temperature parameter xti of the BJT device for calibration as an example, 13 different temperature points are selected in the temperature range of -40° to 125°. In the prior art, the temperature parameter xti=3 is the default value, but this value cannot satisfy the situation that the temperature drift fluctuates with the process at each temperature point of -40° to 125°. The present invention selects 13 different temperature points (-40°, -30°, -15°, 0, 15°, 25°, 35°, 50°, 70°, 85°, 100°, 115°, 125°) in the temperature range of -40° to 125° and uses the test results of these several different temperature points to construct a model of the parameters corrected by the temperature intervals formed by different temperature points, that is, to construct 14 interval equations, and substitute them into the designed bandgap reference circuit for simulation, so as to fit the actual situation of the test value and achieve the purpose of consistency between the simulation and the test value.

[0066] This embodiment only takes 13 temperature points as an example, but is not limited to this; at the same time, this embodiment only takes the temperature parameter xti as an example. In fact, any temperature parameter can be corrected in sections with reference to the present invention. The difference is that for different temperature parameters, the coefficient terms of each correction formula are different, and each needs to be simulated and tested separately.

[0067] In a specific embodiment of the present invention, different correction parameters xti_fittingj are set for the temperature coefficient in different temperature ranges, where j = 0, 1, ..., 13, and temp is the ambient temperature value, that is,

[0068] When the temperature is temp<-40, the correction parameter is

[0069] xti_fitting0=0*(temp<-40),

[0070] When the temperature is -40 ≤ temp ≤ -30, the correction parameter is

[0071] xti_fitting1 = (1.93 × 10 -3 ×temp+5.59×10 -2 )×(temp≥-40)×(temp≤-30),

[0072] When the temperature is -30<temp≤-15, the correction parameter is

[0073] xti_fitting2 = (2.449 × 10 -3 ×temp+7.147×10 -2 )×(temp>-30)×(temp≤-15),

[0074] When the temperature is -15<temp≤0, the correction parameter is

[0075] xti_fitting3 = (6.0763333 × 10 -3 ×temp+1.2588×10 -1 )×(temp>-15)×(temp≤0),

[0076] When the temperature is 0<temp≤15, the correction parameter is

[0077] xti_fitting4 = (2.5541333 × 10 -3 ×temp+1.2588×10 -1 )×(temp>0)×(temp≤15),

[0078] When the temperature is 15<temp≤25, the correction parameter is

[0079] xti_fitting5=(-0.0509×temp+1.2725)×(temp>15)×(temp≤25),

[0080] When the temperature is 25<temp≤35, the correction parameter is

[0081] xti_fitting6=(0.05831×temp-1.45775)×(temp>25)×(temp≤35),

[0082] When the temperature is 35<temp≤50, the correction parameter is

[0083] xti_fitting7=(-0.01694×temp+1.176)×(temp>35)×(temp≤50),

[0084] When the temperature is 50<temp≤70, the correction parameter is

[0085] xti_fitting8 = (3.53775 × 10 -3 ×temp+0.1521125)×(temp>50)×(temp≤70),

[0086] When the temperature is 70<temp≤85, the correction parameter is

[0087] xti_fitting9=(5.8096666667×10 -3 ×temp-6.9216666667)×(temp>70)×(temp≤85),

[0088] When the temperature is 85<temp≤100, the correction parameter is

[0089] xti_fitting10=(3.0566667×10 -3 ×temp+0.22708333)×(temp>85)×(temp≤100),

[0090] When the temperature is 100<temp≤115, the correction parameter is

[0091] xti_fitting11=(1.9308667×10 -3 ×temp+0.33966333)×(temp>100)×(temp≤115),

[0092] When the temperature is 115<temp≤125, the correction parameter is

[0093] xti_fitting12 = (1.9637 × 10 -3 ×temp+0.3358875)×(temp>115)×(temp≤125),

[0094] When the temperature is temp>125, the correction parameter is

[0095] xti_fitting13=0×(temp>125),

[0096] Among them, (temp<-40), (temp>125) and so on in the above formulas are Boolean operations. When the temperature temp satisfies, it is true, that is, the Boolean value "1", otherwise it is false, that is, the Boolean value "0"

[0097] When calculating the total temperature coefficient, set the temperature coefficient to

[0098]

[0099] It should be noted here that in the present invention, the number of modified model parameters and parameter equations are not limited, and other types of parameters can also be used. The present invention is not limited to a certain type of device. Field effect transistors, diodes, varactors, resistors, etc. are all applicable to the present invention.

[0100] Example

[0101] Take the BJT model as an example. Figure 1 As shown: the temperature parameter xti=3 is the default value, but this value cannot satisfy the situation that the temperature drift fluctuates with the process at each temperature point of -40°~125°. Therefore, in this environment, the actual situation of the test value is used for fitting. In this embodiment, 13 temperature points are selected at different temperature points, and 14 interval equations are constructed to achieve the purpose of consistency between simulation and test values.

[0102] Table 3 is a comparison of the original model, the present invention and the test value (for the base-emitter voltage VBE of the bipolar transistor BJT triode):

[0103] Table 1 Comparison of original model, present invention and test value

[0104]

[0105]

[0106] As shown in Table 3, the original model and the test value have an error of about a few thousandths, while the model constructed by the present invention can be consistent with the test value. The modified model is applied to the bandgap reference circuit, and the temperature coefficient curve is compared with the test value and the original model. Figure 3 As shown, the vertical axis is the output voltage of the circuit at different temperatures, in V.

[0107] It can be seen that the change trend of the temperature coefficient (X) of the present invention is close to the test mean (triangle) and has high consistency, while the original model is sometimes higher than the test mean (at higher and lower temperatures) and sometimes lower than the test mean (at intermediate temperatures of 0-70 degrees), as shown in Table 4 below:

[0108] Table 4 Comparison of the present invention & original model and test values

[0109] -40～25℃ 25～125℃ Temperature coefficient comparison: ppm / ℃ ppm / ℃ Test mean 46 -16 Test Screening Mean 44 -22 Original model simulation 10 -11 Repair model simulation 47 -18

[0110] Depend on Figure 3 The results in Table 4 show that the characteristics characterized by the model constructed by the present invention are more consistent with the test values.

[0111] In summary, the high-precision temperature model correction method and system of the present invention corrects the simulation results by modifying the model when there is a large difference between the test data and the simulation data, and uses the model method to repair the circuit to achieve the purpose of smaller errors with the test value, and further reduce the errors of circuit simulation and testing. Finally, combined with the test results, the accuracy of the model is verified through the circuit, thereby playing a certain guiding role in high-precision design.

[0112] The above embodiments are merely illustrative of the principles and effects of the present invention, and are not intended to limit the present invention. Any person skilled in the art may modify and alter the above embodiments without violating the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be as set forth in the claims.

Claims

1. A high-precision temperature model calibration method, comprising the following steps: Step S1, selecting a number of different temperature points in a predetermined temperature range, and constructing a model of the corrected parameters of the temperature range formed by the different temperature points using the test results of the different temperature points; Step S2, substitute the model of the corrected parameters of the temperature interval formed by the constructed different temperature points into the designed bandgap reference circuit for simulation, and fit it with the actual situation of the test value, so as to obtain the model of the corrected parameters of each temperature interval after calibration, so as to achieve the purpose of consistency between the simulation and the test value; in, The method is applied to the calibration of the temperature parameter xti of the BJT device. When the temperature range is temp<-40, the model of the correction parameter after calibration is: xti_fitting0=0*(temp<-40), In the temperature range of -40 ≤ temp ≤ -30, the model of the calibrated correction parameters is xti_fitting1=(1.93×10 -3 ×temp+5.59×10 -2 )×(temp≥-40)×(temp≤-30), In the temperature range of -30<temp≤-15, the model of the calibrated correction parameters is xti_fitting2=(2.449×10 -3 ×temp+7.147×10 -2 )×(temp>-30)×(temp≤-15), In the temperature range of -15<temp≤0, the model of the calibrated correction parameters is xti_fitting3=(6.0763333×10 -3 ×temp+1.2588×10 -1 )×(temp>-15)×(temp≤0), In the temperature range of 0<temp≤15, the model of the calibrated correction parameters is xti_fitting4=(2.5541333×10 -3 ×temp+1.2588×10 -1 )×(temp>0)×(temp≤15), In the temperature range of 15<temp≤25, the model of the calibrated correction parameters is xti_fitting5=(-0.0509×temp+1.2725)×(temp>15)×(temp≤25), In the temperature range of 25<temp≤35, the model of the calibrated correction parameters is xti_fitting6=(0.05831×temp-1.45775)×(temp>25)×(temp≤35), In the temperature range of 35<temp≤50, the model of the calibrated correction parameters is xti_fitting7=(-0.01694×temp+1.176)×(temp>35)×(temp≤50), In the temperature range of 50<temp≤70, the model of the calibrated correction parameters is xti_fitting8=(3.53775×10 -3 ×temp+0.1521125)×(temp>50)×(temp≤70), In the temperature range of 70<temp≤85, the model of the calibrated correction parameters is xti_fitting9=(5.8096666667×10 -3 ×temp-6.9216666667)×(temp>70)×(temp≤85), In the temperature range of 85<temp≤100, the model of the calibrated correction parameters is xti_fitting10=(3.0566667×10 -3 ×temp+0.22708333)×(temp>85)×(temp≤100), In the temperature range of 100<temp≤115, the model of the calibrated correction parameters is xti_fitting11=(1.9308667×10 -3 ×temp+0.33966333)×(temp>100)×(temp≤115), In the temperature range of 115<temp≤125, the model of the calibrated correction parameters is xti_fitting12=(1.9637×10 -3 ×temp+0.3358875)×(temp>115)×(temp≤125), In the temperature range of temp>125, the model of the calibrated correction parameters is xti_fitting13=0×(temp>125).

2. A high-precision temperature model calibration method as claimed in claim 1, characterized in that: The predetermined temperature range is -40 degrees to 125 degrees.

3. A high-precision temperature model calibration method as claimed in claim 2, characterized in that: In step S1, 13 different temperature points, namely -40°, -30°, -15°, 0, 15°, 25°, 35°, 50°, 70°, 85°, 100°, 115°, and 125°, are selected in the temperature range of -40° to 125°.

4. A high-precision temperature model calibration method as claimed in claim 3, characterized in that: In step S1 , for each temperature interval, the temperature coefficient xti is constructed into an equation that varies with temperature.

5. A high-precision temperature model calibration method as claimed in claim 1, characterized in that: The total temperature coefficient is calculated as:

6. A high-precision temperature model calibration system, comprising: A model construction module is used to select a number of different temperature points in a predetermined temperature range, and construct a model of the parameters corrected by the temperature range formed by the different temperature points using the test results of the different temperature points; The simulation fitting module is used to substitute the model of the corrected parameters of the temperature interval formed by the constructed different temperature points into the designed bandgap reference circuit for simulation, and fit it with the actual situation of the test value, so as to obtain the model of the corrected parameters of each temperature interval after calibration, so as to achieve the purpose of consistency between the simulation and the test value; The system is applied to the calibration of the temperature parameter xti of the BJT device. When the temperature range is temp<-40, the model of the correction parameter after calibration is: xti_fitting0=0*(temp<-40), In the temperature range of -40 ≤ temp ≤ -30, the model of the calibrated correction parameters is xti_fitting1=(1.93×10 -3 ×temp+5.59×10 -2 )×(temp≥-40)×(temp≤-30), In the temperature range of -30<temp≤-15, the model of the calibrated correction parameters is xti_fitting2=(2.449×10 -3 ×temp+7.147×10 -2 )×(temp>-30)×(temp≤-15), In the temperature range of -15<temp≤0, the model of the calibrated correction parameters is xti_fitting3=(6.0763333×10 -3 ×temp+1.2588×10 -1 )×(temp>-15)×(temp≤0), In the temperature range of 0<temp≤15, the model of the calibrated correction parameters is xti_fitting4=(2.5541333×10 -3 ×temp+1.2588×10 -1 )×(temp>0)×(temp≤15), In the temperature range of 15<temp≤25, the model of the calibrated correction parameters is xti_fitting5=(-0.0509×temp+1.2725)×(temp>15)×(temp≤25), In the temperature range of 25<temp≤35, the model of the calibrated correction parameters is xti_fitting6=(0.05831×temp-1.45775)×(temp>25)×(temp≤35), In the temperature range of 35<temp≤50, the model of the calibrated correction parameters is xti_fitting7=(-0.01694×temp+1.176)×(temp>35)×(temp≤50), In the temperature range of 50<temp≤70, the model of the calibrated correction parameters is xti_fitting8=(3.53775×10 -3 ×temp+0.1521125)×(temp>50)×(temp≤70), In the temperature range of 70<temp≤85, the model of the calibrated correction parameters is xti_fitting9=(5.8096666667×10 -3 ×temp-6.9216666667)×(temp>70)×(temp≤85), In the temperature range of 85<temp≤100, the model of the calibrated correction parameters is xti_fitting10=(3.0566667×10 -3 ×temp+0.22708333)×(temp>85)×(temp≤100), In the temperature range of 100<temp≤115, the model of the calibrated correction parameters is xti_fitting11=(1.9308667×10 -3 ×temp+0.33966333)×(temp>100)×(temp≤115), In the temperature range of 115<temp≤125, the model of the calibrated correction parameters is xti_fitting12=(1.9637×10 -3 ×temp+0.3358875)×(temp>115)×(temp≤125), In the temperature range of temp>125, the model of the calibrated correction parameters is xti_fitting13=0×(temp>125).

7. A high-precision temperature model calibration system as claimed in claim 6, characterized in that: The system is used to calibrate the temperature parameter xti of the BJT device. The predetermined temperature range is -40 degrees to 125 degrees. 13 different temperature points, namely -40°, -30°, -15°, 0, 15°, 25°, 35°, 50°, 70°, 85°, 100°, 115°, and 125°, are selected in the temperature range of -40° to 125°.

8. A high-precision temperature model calibration system as claimed in claim 7, characterized in that: For each temperature interval, the model construction module constructs the temperature coefficient xti into an equation that varies with temperature.

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