Multi-probe non-destructive inspection system

Abstract

The invention is entitled Multi-probe non-destructive inspection system. A non-destructive inspection system is disclosed. The non-destructive inspection system includes a motion platform and a tool assembly. The tool assembly is connected to the motion platform such that the tool assembly is movable relative to the motion platform. The tool assembly includes an inspection tool assembly that includes a base structure connected to the tool assembly and a plurality of probe assemblies connected to the base structure. Each probe assembly includes a first linear actuator and a probe that is different from the probe of any other one of the plurality of probe assemblies for inspecting a different structural feature of the structure. Each probe is movable along a first axis relative to the other one of the probes and substantially perpendicular to the base structure using the first linear actuator of the respective one of the plurality of probe assemblies.

Description

TECHNICAL FIELD

[0001] The present disclosure relates generally to inspection systems for inspecting a part, and more particularly to a multi-probe non-destructive inspection system. BACKGROUND

[0002] Inspection or scanning of a structure in a non-destructive manner uses different probes to scan over the surface of the structure. The different probes can be configured to scan different surface topologies. In conventional systems, different probes of different sizes are mounted, used, and removed from a motion platform one at a time based on structural features and / or surface topologies of the structure being inspected. Continually mounting and removing probes to and from the motion platform can be time consuming. SUMMARY

[0003] The subject matter of the present application has been developed in response to the present state of the art, and in particular, in response to the problems and disadvantages of conventional inspection systems. Thus, the subject matter of the present application has been developed to address at least the problems and disadvantages of the prior art.

[0004] A non-destructive inspection system is disclosed. The non-destructive inspection system includes a motion platform and a tool assembly. The tool assembly is connected to the motion platform such that the tool assembly is movable relative to the motion platform. The tool assembly includes an inspection tool assembly that includes a base structure connected to the tool assembly and a plurality of probe assemblies connected to the base structure. Each probe assembly includes a first linear actuator and a probe that is different from the probe of any other one of the plurality of probe assemblies for inspecting a different structural feature of the structure. Each probe is movable relative to the other one of the probes along a first axis and substantially perpendicular to the base structure using the first linear actuator of a respective one of the plurality of probe assemblies. The foregoing subject matter of this paragraph characterizes Example 1 of the present disclosure.

[0005] The inspection tool assembly further includes a second linear actuator connected to the base structure and each of the plurality of probe assemblies. The second linear actuator is configured to move the plurality of probe assemblies along a second axis substantially perpendicular to the first axis. The foregoing subject matter of this paragraph characterizes Example 2 of the present disclosure, where Example 2 further includes the subject matter of Example 1 above.

[0006] The non-destructive inspection system further includes a controller configured to actuate the first linear actuator to position one of the plurality of probes to a scanning position and one or more other probes to a non-scanning position. The foregoing subject matter of this paragraph characterizes Example 3 of the present disclosure, where Example 3 further includes the subject matter of Example 2 above.

[0007] A first axis passes through a reference point of the tool assembly. One of the plurality of probe assemblies in the scan position is aligned with the reference point such that the first axis passes through the one of the plurality of probe assemblies. The other probe assemblies in the non-scan position are not aligned with the reference point such that the first axis does not pass through the other probe assemblies. The foregoing subject matter of this paragraph characterizes Example 4 of the present disclosure, wherein Example 4 further comprises the subject matter of Example 3 above.

[0008] A first axis passes through a reference point of the tool assembly. An offset of a position of one of the plurality of probe assemblies in the scan position relative to the reference point is determined for scanning. The foregoing subject matter of this paragraph characterizes Example 5 of the present disclosure, wherein Example 5 further comprises the subject matter of any of Examples 3-4 above.

[0009] Each probe of the plurality of probe assemblies is rotatable about a first radial axis parallel to the first axis, and is rotatable about a second radial axis substantially perpendicular to the first axis and the first radial axis. The foregoing subject matter of this paragraph characterizes Example 6 of the present disclosure, wherein Example 6 further comprises the subject matter of any of Examples 1-5 above.

[0010] One of the plurality of probe assemblies includes a plurality of probes. The plurality of probes is configured to scan the structure when the probe assembly is in the scan position when at least another of the plurality of probe assemblies is in the non-scan position. The foregoing subject matter of this paragraph characterizes Example 7 of the present disclosure, wherein Example 7 further comprises the subject matter of any of Examples 1-6 above.

[0011] The non-destructive inspection system further comprises one or more sensors. Based on data about the structure captured using the one or more sensors, one of the plurality of probe assemblies is selected to be in the scan position and another of the plurality of probe assemblies is selected to be in the non-scan position. The foregoing subject matter of this paragraph characterizes Example 8 of the present disclosure, wherein Example 8 further comprises the subject matter of any of Examples 1-7 above.

[0012] The plurality of probe assemblies includes a first probe assembly and a second probe assembly, the first probe assembly including a first probe to scan a substantially flat region of the structure, the second probe assembly including a second probe to scan a non-flat region of the structure. The foregoing subject matter of this paragraph characterizes Example 9 of the present disclosure, wherein Example 9 further comprises the subject matter of any of Examples 1-8 above.

[0013] Further disclosed herein are methods of scanning a structure using a non-destructive inspection system. The method includes moving a first probe assembly of an inspection tool assembly out of a scan position of the inspection tool assembly. The first probe assembly includes one or more probes for inspecting a first structural feature of the structure. The method also includes moving a second probe assembly of the inspection tool assembly into the scan position. The second probe assembly includes one or more probes for inspecting a second structural feature of the structure. The second structural feature is of a different type than the first structural feature. The method of scanning a structure using a non-destructive inspection system further includes scanning the structure using the one or more probes of the second probe assembly. The foregoing subject matter of this paragraph characterizes Example 10 of the present disclosure.

[0014] The step of moving the first probe assembly out of the scan position includes actuating a linear actuator connected to the first probe assembly along a first axis in a first direction. The step of moving the second probe assembly into the scan position includes actuating a linear actuator connected to the second probe assembly along the first axis in a second direction opposite the first direction. The foregoing subject matter of this paragraph characterizes Example 11 of the present disclosure, where Example 11 further includes the subject matter of Example 10 above.

[0015] The method further includes actuating a second linear actuator connected to the first probe assembly and the second probe assembly along a second axis substantially perpendicular to the first axis to further move the first probe assembly out of the scan position and to move the second probe assembly into the scan position. The foregoing subject matter of this paragraph characterizes Example 12 of the present disclosure, where Example 12 further includes the subject matter of Example 11 above.

[0016] The first axis passes through a reference point of the inspection tool assembly. When in the scan position, the first axis passes through the second probe assembly. The foregoing subject matter of this paragraph characterizes Example 13 of the present disclosure, where Example 13 further includes the subject matter of Example 12 above.

[0017] The method further includes determining an offset of the scan position of the second probe assembly relative to the reference point of the inspection tool assembly along the second axis. The foregoing subject matter of this paragraph characterizes Example 14 of the present disclosure, where Example 14 further includes the subject matter of any of Examples 12-13 above.

[0018] The moving of the first probe assembly out of the scan position and the moving of the second probe assembly into the scan position includes actuating a radial actuator connected to the inspection tool assembly about a radial axis, where the first probe assembly and the second probe assembly are immovably fixed to the inspection tool assembly and are offset from each other. The foregoing subject matter of this paragraph characterizes Example 15 of the present disclosure, where Example 15 further includes the subject matter of any of Examples 10-11 above.

[0019] Moving the first probe assembly out of the scanning position and moving the second probe assembly into the scanning position includes actuating a first radial actuator connected to the first probe assembly and actuating a second radial actuator connected to the second probe assembly. The foregoing subject matter of this paragraph characterizes Example 16 of the present disclosure, where Example 16 further includes the subject matter of any of Examples 10-11 above.

[0020] The method further includes dynamically selecting one of the first probe assembly or the second probe assembly to move into the scanning position based on one of a structural feature of the structure to be inspected and one of the one or more probes of the first probe assembly or the one or more probes of the second probe assembly. The foregoing subject matter of this paragraph characterizes Example 17 of the present disclosure, where Example 17 further includes the subject matter of any of Examples 10-16 above.

[0021] The method further includes receiving, at the computing device, a plurality of data sets captured by the one or more probes of the first probe assembly and the one or more probes of the second probe assembly, the plurality of data sets describing a plurality of structural features of the structure. The method further includes generating a single scan of the structure based on the plurality of data sets. The foregoing subject matter of this paragraph characterizes Example 18 of the present disclosure, where Example 18 further includes the subject matter of any of Examples 10-17 above.

[0022] Additionally, disclosed herein is a non-destructive inspection system. The non-destructive inspection system includes a motion platform and a tool assembly. The tool assembly is connected to the motion platform such that the tool assembly is movable relative to the motion platform. The tool assembly includes an inspection tool assembly that includes a plurality of probe assemblies. Each probe assembly includes a different probe for inspecting a different structural feature of a structure. The plurality of probe assemblies is rotatable about an axis using a radial actuator to move at least one of the plurality of probe assemblies into a scanning position. The foregoing subject matter of this paragraph characterizes Example 19 of the present disclosure.

[0023] The radial actuator is connected to the inspection tool assembly to move the inspection tool assembly in a radial direction, or each of the plurality of radial actuators is connected to a respective one of the plurality of probe assemblies to individually move each of the plurality of probe assemblies in the radial direction. The foregoing subject matter of this paragraph characterizes Example 20 of the present disclosure, where Example 20 further includes the subject matter of Example 19 above.

[0024] The described features, structures, benefits and / or characteristics of the subject matter of this disclosure can be combined in any suitable manner in one or more embodiments and / or implementations. In the following description, numerous specific details are provided to provide a thorough understanding of embodiments of the subject matter of the disclosure. One skilled in the relevant art will recognize, however, that the subject matter of the disclosure can be practiced without one or more of the specific details, or with other methods, components, materials, and / or apparatuses. In other instances, well-known structures, materials, or operations are not shown or described in detail in order to avoid obscuring aspects of the subject matter of the disclosure. The features and advantages of the subject matter of this disclosure will become more fully apparent in the following description and appended claims, or can be learned by practice of the subject matter as set forth hereinafter. BRIEF DESCRIPTION OF DRAWINGS

[0025] To more readily understand the advantages of the subject matter, a more particular description of the subject matter briefly described above will be rendered by reference to specific embodiments that are illustrated in the drawings. It should be noted that these drawings are not to be viewed as limiting the scope of the subject matter, as the subject matter will be described and explained with additional specificity and detail by the use of the accompanying drawings in which:

[0026] Figure 1 is a schematic block diagram of a multi-probe non-destructive inspection system in accordance with one or more examples of the present disclosure;

[0027] Figure 2 is a schematic block diagram of another multi-probe non-destructive inspection system in accordance with one or more examples of the present disclosure;

[0028] Figure 3 is a schematic side view of an implementation of a multi-probe non-destructive inspection system in accordance with one or more examples of the present disclosure;

[0029] FIG. 4a is a schematic perspective view of an implementation of an inspection tool assembly of a multi-probe non-destructive inspection system in accordance with one or more examples of the present disclosure;

[0030] FIG. 4b is a schematic perspective view of an implementation of an inspection tool assembly of a multi-probe non-destructive inspection system in accordance with one or more examples of the present disclosure;

[0031] FIG. 5a is a schematic perspective view of an implementation of another inspection tool assembly of a multi-probe non-destructive inspection system in a first position in accordance with one or more examples of the present disclosure;

[0032] FIG. 5b is a schematic perspective view of the inspection tool assembly of FIG. 5a in a second position, in accordance with one or more examples of the present disclosure;

[0033] FIG. 6a is a schematic perspective view of an implementation of another inspection tool assembly of a multi-probe non-destructive inspection system in a first position, in accordance with one or more examples of the present disclosure;

[0034] FIG. 6b is a schematic perspective view of the inspection tool assembly of FIG. 6a in a second position, in accordance with one or more examples of the present disclosure; and

[0035] Figure 7 is a schematic flowchart of a method of scanning a structure using a multi-probe non-destructive inspection system, in accordance with one or more examples of the present disclosure. DETAILED DESCRIPTION

[0036] Throughout this specification, reference can be made to "an embodiment", "one embodiment", or "an implementation" meaning that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the disclosure. The appearance of the phrases "in one embodiment", "in an embodiment", and similar language throughout this specification may, but do not necessarily, all refer to the same embodiment. Similarly, the use of the term "implementation" to refer to an implementation with a particular feature, structure, or characteristic, that is described in connection with one or more embodiments of the disclosure, but an implementation can be associated with one or more embodiments, unless expressly specified otherwise.

[0037] Referring to Figure 1 In accordance with some examples, disclosed herein is a multi-probe non-destructive inspection system 100 for inspecting internal and external surfaces of a structure 140 (e.g., a part or object). In the illustrated example, the system 100 includes a motion platform 102, such as a robot, a vertical or horizontal gantry, or the like; and a tool assembly 110, such as an end effector, connected to the motion platform 102. An inspection tool assembly 130 is connected to the tool assembly 110. The tool assembly 110 is movable by the motion platform 102 relative to the motion platform 102 to move the inspection tool assembly 130.

[0038] The inspection tool assembly 130 is connected to the tool assembly 110. The inspection tool assembly 130 includes a plurality of probe assemblies 134a-n. In some instances, the probe assemblies 134a-n include first linear actuators 133a-n for moving the probes 135a-n along a linear axis (e.g., a linear axis parallel to the vertical axis A (see, e.g., FIG. 4a)). The probes 135a-n are configured to scan the outer surface of the structure 140, internal components of the structure 140, etc. using a variety of scanning devices such as sensors. The structure 140 can be, for example, a wing of an airplane, a door of a car, a structure of a machine or robot, etc. Examples of structures 140 of an airplane to be inspected include a ventral spar, a blade spar, etc. The probes 135a-n can have different sizes, types, configurations, etc. that can be determined based on the type of structure 140 being inspected.

[0039] In some instances, the inspection tool assembly 130 further includes a second linear actuator 132 configured to move the probe assemblies 134a-n in a direction substantially perpendicular to the direction in which the first linear actuators 133a-n move the probes 135a-n (e.g., a direction parallel to axis B as shown in FIG. 4a). The second linear actuator 132 is connected to a base structure 131 that is connected to the tool assembly 110. Each of the first linear actuators 133a-n and the second linear actuator 132 can be an electric actuator, a pneumatic actuator, a hydraulic actuator, etc.

[0040] The inspection tool assembly 130 further includes sensors 136 for capturing data about the structure 140 that can be used to assist in maneuvering the probes 135a-n around the structure, for example, to determine which probes 135a-n to use, etc. In some implementations, the sensors 136 can be part of the tool assembly 110 and / or the motion platform 102 in addition to or instead of the sensors 136 of the inspection tool assembly 130. The sensors 136 can also be located in the base structure 131, the probe assemblies 134a-n, and / or the probes 135a-n.

[0041] In some examples, the sensors 136 include proximity sensors, accelerometers, gyroscopes, motion sensors, capacitive sensors, touch sensors, light sensors, sonar sensors, laser sensors, potentiometers, and the like. In some examples, the sensor data is used to select one of the probes 135a-n, and a corresponding one of the probe assemblies 134a-n, to be used to scan the structure 140. For example, each of the probes 135a-n can be configured to scan or otherwise inspect a different type of surface, structure, component, and the like. Depending on the structure 140 being inspected, different probes 135a-n may be more suitable for inspecting the structure 140 or a portion of the structure 140.

[0042] Thus, during inspection, the probes 135a-n may be dynamically selected and moved into and out of scanning positions relative to the inspection tool assembly 130 based on different features or features 145-146 of the structure 140 to be scanned. Figure 1 4B , probe assembly 134a includes two probes 135a-b. The two probes 135a-b in a single probe assembly 134a can be positioned and configured to scan a given structural feature of structure 140.

[0043] Furthermore, even in Figure 1 While two probe assemblies 134a-n are depicted in FIG, the inspection tool assembly 130 may include any number of probe assemblies 134a-n. For example, in one example, the inspection tool assembly 130 includes three probe assemblies 134a-n. In another example, the inspection tool assembly 130 includes four probe assemblies 134a-n, and so on.

[0044] In some examples, the probe 135a-n is automatically selected based on input from the sensor 136 as described above. In other examples, the probe 135a-n can be selected based on input from the machine (e.g., the computing system 138) or a user. For example, the computing device 138 connected to the multi-probe non-destructive inspection system 100 can have a diagram, map, schematic, illustration, model, etc. (e.g., a computer aided design ("CAD") model, etc.) of the structure 140 being inspected, and based on the position of the inspection tool assembly 130 relative to the structure 140 and the current probe of the probes 135a-n being used to scan the structure 140, the computing device 138 can command the inspection tool assembly 130 to select a different probe of the probe assemblies 134a-n that is configured to scan or inspect a portion of the structure 140 being inspected. Similarly, a user can provide a manual command to the tool assembly 110 to select a different probe of the probes 135a-n.

[0045] In further examples, the multi-probe non-destructive inspection system 100 can be configured to dynamically switch or interchange the probe assemblies 134a-n from probe assembly 134a-n receptacles (not shown) that include different probe assemblies 134a-n that include different probes 135a-n, each of which is configured to scan or inspect a different feature, structural feature 145-146, etc. of the structure 140 based on the position of the inspection tool assembly 130 relative to the structure 140. The structural features or features 145-146 of the structure can include joggles, recesses, uneven surfaces, bumps, corners (internal and external), pad-ups, and / or the like. The structural features or features 145-146 can also include I-beams, blade-shaped, z-shaped, hat-shaped, etc. structural reinforcements.

[0046] In some examples, the tool assembly 110 is operatively connected with the controller 108 to receive operational commands from the controller 108 and operate in accordance with the operational commands. The operational commands can include directional commands, directional amount commands, and / or speed commands. The operational commands can also include commands to change the current probe of the probes 135a-n to another one of the probes 135a-n, commands to change the position of the probes 135a-n, commands to disconnect a probe of the probes 135a-n to a different probe of the probes 135a-n, commands to rotate the probes 135a-n, etc.

[0047] The controller 108 and / or the computing device 138 receives one or more data sets that include data captured and describing the structural features of the structure 140 using the probes 135a-n. For example, each of the probes 135a-n can capture and generate its own data set that one of the probes 135a-n inspects, scans, etc. the structural features of the structure 140. The data sets can be combined, aggregated, etc. at the computing device 138 to generate a single scan, image, model, etc. of the structure 140 based on the different data sets.

[0048] In certain embodiments, motion simulation software can be used to simulate the positions and paths of the probes 135a-n based on different parameters, including the positions of the motion platform 102 and the tool assembly 110, that can be provided based on previous scans, inputs from the sensors 136, user-provided inputs, etc. In this way, the physical motions of the motion platform 102, the tool assembly 110, the inspection tool assembly 130, the probe assemblies 134a-n, and the probes 135a-n can be simulated, and the results can be used to guide and refine the motions of the motion platform 102 while scanning the structure 140.

[0049] Referring to Figure 2 According to some examples, disclosed herein is a multi-probe non-destructive inspection system 160 for inspecting internal and external surfaces of a structure 140. Figure 2 The example embodiments shown can be substantially similar to the example embodiments described above with reference to Figure 1 In further examples, Figure 2 The multi-probe non-destructive inspection system 160 shown in includes a radial actuator 142 connected to the tool assembly 110 and an inspection tool assembly 130. The radial actuator 142 is configured to move the inspection tool assembly 130 radially to move the probes 135a-n along a radial axis in a radial direction into and out of a scan position while scanning the structure 140.

[0050] In some embodiments, the multi-probe non-destructive inspection system 160 includes radial actuators 143a-n connected to the base structure 131, and each of the probe assemblies 134a-n is moved individually along a radial axis in a radial direction into and out of a scan position by each of the probe assemblies 134a-n while scanning the structure 140. The radial actuators 142, 143a-n can include mechanical actuators, pneumatic actuators, etc. In some example embodiments, the probe assemblies 134a-n include first linear actuators 133a-n for moving the probes 135a-n along a linear axis while scanning the structure 140.

[0051] Referring to Figure 3According to some examples, disclosed herein is a multi-probe non-destructive inspection system 300. The motion platform 102 of the multi-probe non-destructive inspection system 300 includes a plurality of articulating members. In the illustrated example, the motion platform 102 is a robot that includes a footing 150 and a base 152 that is rotatable about a vertical axis relative to the footing 150. The motion platform 102 further includes a connecting arm 154 that is rotatable about a horizontal axis relative to the base 152. The motion platform 102 additionally includes a support arm 156 or supplemental arm that is rotatable about a horizontal axis relative to the connecting arm 154. The support arm 156 defines a support axis 146 that extends along the length of the support arm 156.

[0052] The motion platform 102 further includes an extension arm 157 that is rotatable about the support axis 146 relative to the support arm 156. The motion platform 102 also includes a coupling arm 158 that is rotatable about an axis that is perpendicular to the support axis 146 of the support arm 156 relative to the extension arm 157. The motion platform 102 further includes an interface arm 106 that is rotatable about an axis that is perpendicular to the axis about which the coupling arm 158 rotates. The tool assembly 110 is directly connected to the interface arm 106 and is collectively movably fixed relative to the interface arm 106. Thus, in some examples, the motion platform 102 is a six-axis robot that facilitates movement of the tool assembly 110 with 6 degrees of freedom. However, in other examples, the motion platform 102 can have fewer or more than 6 degrees of freedom.

[0053] In Figure 3 the motion platform 102 is presented as a robot; however, in other examples, the motion platform 102 includes a gantry, such as a horizontal or vertical gantry, or other similar structure. In certain examples, the tool assembly 110 can include an end effector for interacting with an inspection tool assembly 130. The inspection tool assembly 130 includes a plurality of probes 135a-n for scanning a variety of structural features 145-146 of a structure 140 for non-destructive inspection. In some examples, the structural features include bumps / slopes 145, recesses 146, and the like, that can require the use of different types of probes 135a-n, probes 135a-n having different shapes or sizes, probes 135a-n having different sensors or sensor configurations, and the like.

[0054] The tool assembly 110 can be moved by the motion platform 102 relative to the motion platform 102 to move the inspection tool assembly 130 to a position for scanning a structure 140. For example, various components of the motion platform 102, such as the support arm 156, the extension arm 157, the coupling arm 158, and the interface arm 106, can be moved to position the inspection tool assembly 130 in different scanning positions while the base 150 remains fixed to scan different structural features 145-146 of the structure 140 based on the topography of the structure 140.

[0055] The motion platform 102, the tool assembly 110, the inspection tool assembly 130, and / or the probes 135a-n can be controlled by operational commands received from the controller 108. As described above, the controller 108, based on feedback from one or more sensors 136, can automatically send, trigger, signal, etc. operational commands for controlling the motion platform 102, the tool assembly 110, the inspection tool assembly 130, and / or the probes 135a-n while any one of the probes 135a-n is scanning the structure 140. In other example implementations, the controller 108 sends operational commands based on input from the computing device 138, input from a user, etc.

[0056] Referring to FIG. 4a, according to some examples, an inspection tool assembly 130 connected to the tool assembly 110 is disclosed herein, as described above with reference to FIG. 3a. Figure 3 The inspection tool assembly 130 includes a base structure 131, which can be a substantially rigid plate or other structure for supporting the first linear actuators 133a-n, the probe assemblies 134a-n, and the probes 135a-n.

[0057] In certain examples, the inspection tool assembly 130 includes a second linear actuator 132 for moving the plurality of probe assemblies 134a-n along a linear axis B. As shown in FIG. 4a, the second linear actuator 132 is configured to move in a substantially horizontal direction, from left to right, for moving one of the probes 135a-n, when in a scanning position, relative to a reference point 145, such as a center point of the motion platform 102, the tool assembly 110, and / or the inspection tool assembly 130.

[0058] Each of the probe assemblies 134a-n is aligned with the reference point 145 when in a scanning position, such that a vertical axis A passes through one of the probe assemblies 134a-n at the scanning position, while the vertical axis A does not pass through other probe assemblies 134a-n that are not aligned with the reference point 145. In some example implementations, the vertical axis A passes through the reference point 145 and determines a position of one of the plurality of probe assemblies 134a-n positioned in the scanning position is offset relative to the reference point 145 (e.g., the controller 108 can track or determine the offset during use).

[0059] In this manner, an offset in the scan position of one of the probe assemblies 134a-n and the probe 135a-n relative to the scan position of the tool assembly 110 and the structure 140 can be determined and used, e.g., in a software program, e.g., a motion simulation software, to indicate the position of the probe 135a-n and / or probe path parameters that allow the software to determine how to articulate the degrees of freedom of the robot to scan the structure 140. The offset can be a measurement relative to a reference point 145 (e.g., a center point of the inspection tool assembly 130, the tool assembly 110, etc.), e.g., inches, centimeters, etc.

[0060] In further examples, the inspection tool assembly 130 includes a plurality of probe assemblies 134a-n. The probe assemblies 134a-n are connected to the second linear actuator 132 and / or the base structure 131 and include first linear actuators 133a-n. The first linear actuators 133a-n are configured to move in a direction substantially perpendicular to the horizontal linear axis B (e.g., the first linear actuators 133a-n of the probe assemblies 134a-n can not be exactly perpendicular to the horizontal axis B and can have some degrees of freedom deviation) along a vertical linear axis A such that each of the probes 135a-n are movable relative to each other along the linear axis A. As used herein, substantially horizontal, substantially vertical, substantially parallel, and substantially perpendicular mean any orientation within three degrees of horizontal, vertical, parallel, and perpendicular, respectively, unless otherwise indicated.

[0061] The probe assemblies 134a-n can each include one or more probes 135a-n configured to scan and / or inspect the structure 140, e.g., an interior and / or an exterior surface of the structure 140. In examples, each of the probes 135a-n is configured to inspect a different structural feature of the structure 140. For example, one of the probes 135a-n (e.g., probe 135n) can be configured to inspect a portion of the structure 140 that includes a depression, and a different one of the probes 135a-n (e.g., probe 135a) can be configured to inspect a substantially flat surface of the structure 140. The probes 135a-n can rotate along a radial axis C (e.g., rotatable about a z-axis) and / or along a radial axis D (e.g., rotatable about an x-axis) with a passive spring or with an actuator to account for variations in the structure surface as the probes 135a-n scan the structure 140.

[0062] Referring to FIG. 4b, according to some examples, an inspection tool assembly 130 connected to the tool assembly 110 is disclosed herein, as described above with reference to FIG. 4a. Figure 3 The inspection tool assembly 130 depicted in FIG. 4b can be substantially similar to the inspection tool assembly 130 described above and depicted in FIG. 4a.

[0063] According to some examples, the inspection tool assembly 130 depicted in FIG. 4b includes a probe assembly 134a that includes a plurality of probes 135a-b. In one example, the plurality of probes 135a-b are configured to scan the structure 140 simultaneously, substantially simultaneously, etc. while the probe assembly 134a is in the scanning position.

[0064] In further examples, the plurality of probes 135a-b are arranged in a linear position or even positioned with respect to each other (e.g., along the x, y, and / or z axes). In other examples, the plurality of probes 135a-b are offset with respect to each other (e.g., along the x, y, and / or z axes). In such example implementations, at least one of the plurality of probes 135a-b overlaps a different one of the plurality of probes 135a-b such that an area 135a-b of the surface of the structure 140 beneath the overlapping portion of the plurality of probes is scanned more than once.

[0065] Further, even though two probes 135a-b are depicted in FIG. 4b as being connected to a single probe assembly 134a, the probe assembly 134a can include any number of probes 135a-b. For example, in one example, the probe assembly 134a includes three probes 135. In another example, the probe assembly 134a includes four probes 135, and so on.

[0066] According to some examples, with reference to FIGS. 5a and 5b, an inspection tool assembly 130 connected to the tool assembly 110 is disclosed herein, as described above with reference to Figure 3 In certain implementations, the inspection tool assembly 130 includes various components or features of the inspection tool assembly 130 described above with reference to FIGS. 4a and 4b.

[0067] In the example implementation shown, the inspection tool assembly 130 includes a radial actuator 142 configured to rotate about a radial axis E (e.g., about the z-axis). In certain implementations, the radial actuator 142 is shaped as a sphere and is configured to rotate in three dimensions (e.g., about each of the x, y, and z axes). In some implementations, the motion platform 102 can be a six-axis robot such that positioning the probes 135a-n in the scanning position includes a combination of the robot’s six axes. The probe assemblies 134a-n can be immovably fixed to the inspection tool assembly 130 (e.g., to either one of the second linear actuator 132 or the base structure 131) and offset or spaced apart from each other by an angle, degree, distance, etc. such that when one of the probe assemblies 134a-n is in the scanning position, one or more other probe assemblies 134a-n are not in the scanning position.

[0068] As shown in FIG. 5a, radial actuator 142 is rotated about radial axis E to position probe assembly 134n in a scan position along vertical axis A through probe assembly 134n and to position another probe assembly 134a in a non-scan position. Also, as shown in FIG. 5b, radial actuator 142 is rotated about radial axis E to position probe assembly 134a in a scan position along vertical axis A through probe assembly 134a and to position another probe assembly 134n in a non-scan position. In some example embodiments, inspection tool assembly 130 includes a second linear actuator 132 to further adjust or move probe assemblies 134a-n along linear axis B into a scan position. In other example embodiments, each of probe assemblies 134a-n includes a linear actuator 133a-n to adjust or move probe 135a-n along linear axis A into or out of a scan position.

[0069] According to some examples, with reference to FIGS. 6a and 6b, disclosed herein is an inspection tool assembly 130 connected to tool assembly 110, as described above with reference to FIGS. 4a and 4b, for example. In certain embodiments, inspection tool assembly 130 includes various components or features of inspection tool assembly 130 described above with reference to FIGS. 4a and 4b. Figure 3 In certain embodiments, inspection tool assembly 130 includes various components or features of inspection tool assembly 130 described above with reference to FIGS. 4a and 4b.

[0070] In the example embodiment shown, inspection tool assembly 130 includes radial actuators 143a-n, each connected to a respective one of probe assemblies 134a-n and each configured to rotate about a radial axis F (e.g., about the z-axis). In certain embodiments, radial actuators 143a-n are shaped as spheres and configured to rotate in three dimensions (e.g., about each of the x, y, and z-axes). Probe assemblies 134a-n can be immovably fixed to radial actuators 143a-n, which can be used to position probe assemblies 134a-n in and out of a scan position.

[0071] As shown in FIG. 6a, radial actuator 143n connected to one of probe assemblies 134n is rotated about radial axis F to position probe assembly 134n in a scan position along vertical axis A through probe assembly 134n. Another radial actuator 143a connected to another probe assembly 134a is rotated about radial axis F to position probe assembly 134a out of a scan position. Also, as shown in FIG. 6b, radial actuator 143n connected to one of probe assemblies 134n is rotated about radial axis F to position probe assembly 134n out of a scan position, while another radial actuator 143a connected to another probe assembly 134a is rotated about radial axis F to position probe assembly 134a in a scan position along vertical axis A through probe assembly 134a.

[0072] In some example implementations, the inspection tool assembly 130 includes a second linear actuator 132 to further adjust or move the probe assemblies 134a-n along the linear axis B to the scan position. In other example implementations, each probe assembly 134a-n includes at least one linear actuator 133a-n to adjust or move the probe 135a-n along the linear axis A to or from the scan position. In one example implementation, the inspection tool assembly 130 further includes a radial actuator 142, as described above with reference to FIGS. 5a and 5b, to further adjust or move the probes 135a-n to or from the scan position.

[0073] Referring to Figure 7 According to some examples, disclosed herein is a method 700 for operating a multi-probe non-destructive inspection system. The method 700 begins and moves 702 a first probe assembly 134a of an inspection tool assembly 130 of a tool assembly 110 out of a scan position. The first probe assembly 134a includes one or more probes 135a for inspecting a first structural feature of a structure 140.

[0074] The method 700 moves 704 a second probe assembly 134n of the inspection tool assembly 130 to the scan position. The second probe assembly 134n includes one or more probes 135n for inspecting a second structural feature of the structure 140. The second structural feature is of a different type than the first structural feature. The method 700 scans 706 the structure using the one or more probes 135n of the second probe assembly 135n, and the method 700 ends.

[0075] In an example, moving the second probe assembly 134n of the inspection tool assembly 130 to the scan position involves moving the second probe assembly 134n relative to the first probe assembly 134a. In another example, moving the second probe assembly 134n to the scan position includes actuating a radial actuator connected to the inspection tool assembly about a radial axis, where the first probe assembly 134a and the second probe assembly 134n are immovably fixed to the inspection tool assembly and offset from each other.

[0076] According to an aspect of the disclosure, there is provided an inspection tool assembly. The inspection tool assembly includes (i) a base structure configured to be connected to a tool assembly, and (ii) a plurality of probe assemblies connected to the base structure. Each probe assembly includes a first linear actuator and a probe different from any other one of the plurality of probe assemblies for inspecting a different structural feature of a structure, where each probe is movable along a first axis relative to the other probe and substantially perpendicular to the base structure using the first linear actuator of a respective one of the plurality of probe assemblies. In an example, the inspection tool assembly corresponds to the inspection tool assembly 130, and the tool assembly corresponds to the tool assembly 110.

[0077] According to aspects of the present disclosure, a tool assembly is provided. The tool assembly is configured to be connected to a motion platform such that the tool assembly is movable relative to the motion platform. The tool assembly includes an inspection tool assembly including (i) a base structure connected to the tool assembly and (ii) a plurality of probe assemblies connected to the base structure. Each probe assembly includes a first linear actuator and a probe different from any other one of the plurality of probe assemblies for inspecting a different structural feature of a structure, wherein each probe is movable along a first axis relative to the other probe and substantially perpendicular to the base structure using the first linear actuator of the respective one of the plurality of probe assemblies. In an example, the tool assembly corresponds to the tool assembly 110, the motion platform corresponds to the motion platform 102, and the inspection tool assembly corresponds to the inspection tool assembly 130.

[0078] In the above description, certain terms can be used, such as "upper," "lower," "over," "under," "horizontal," "vertical," "left," "right," "top," "bottom," and the like. These terms are used for some clarity in addressing relative relationships when processing. However, these terms are not intended to imply absolute relationships, positions, and / or directions. For example, for an object, an "over" surface can become an "under" surface simply by flipping the object over. Nonetheless, it is still the same object. Further, unless explicitly stated otherwise, the terms "comprise," "comprises," "comprising," "contain," "contains," "containing," and the like mean "including, but not limited to." Unless explicitly stated otherwise, an enumerated list of items does not imply any or all items are mutually exclusive and / or collectively exhaustive. Unless explicitly stated otherwise, the terms "a," "an," and "the" also refer to "one or more." Further, the term "plurality" can be defined as "at least two."

[0079] Additionally, instances in the present specification where one element is "connected" to another element can include both direct and indirect connections. Direct connections can be defined as one element connected to another element and in contact with the other element. Indirect connections can be defined as a connection between two elements that are not in direct contact with each other, but have one or more additional elements between the connected elements. Further, as used herein, securing one element to another element can include both direct and indirect securing. Additionally, as used herein, "adjacent" does not necessarily mean in contact. For example, one element can be adjacent to another element without being in contact with the element.

[0080] As used herein, the phrase “at least one of,” when used with a list of items, means that different combinations of one or more of the listed items can be used and only one of an item from the list can be needed. An item can be a specific object, thing, or category. In other words, “at least one of’ means that any combination of items from the list can be used or the number of items can be used, but not necessarily all of the items in the list. For example, “at least one of item A, item B, and item C” can mean item A; item A and item B; item B; item A, item B, and item C; or item B and item C. In some cases, “at least one of item A, item B, and item C” can mean, for example, but not limited to, two of item A, one of item B, and ten of item C; four of item B and seven of item C; or other suitable combinations.

[0081] Unless otherwise stated, the terms “first,” “second,” etc. are used herein as labels, and do not necessarily imply an order, position, or hierarchy of the items to which these terms refer. In addition, reference to, for example, “the second” item does not require or preclude the presence of, for example, “the first” or lower-numbered item and / or the presence of, for example, “the third” or higher-numbered item.

[0082] As used herein, a system, apparatus, structure, article, element, component, or hardware that is “configured to” perform a particular function is indeed capable of performing that function without any alteration, rather than simply having the potential to perform the function after a modification, for example, an adaptation, an upgrade, a programming, and / or a design. In other words, a system, apparatus, structure, article, element, component, or hardware that is “configured to” perform a particular function is specifically selected, created, implemented, utilized, programmed, and / or designed in order to perform the specified function. As used herein, “configured to” denotes an existing characteristic that a system, apparatus, structure, article, element, component, or hardware has that makes the system, apparatus, structure, article, element, component, or hardware capable of performing a specified function without further modification. For purposes of this disclosure, a system, apparatus, structure, article, element, component, or hardware described as being “configured to” perform a particular function can additionally or alternatively be described as “adapted to” and / or “operative to” perform that function.

[0083] The schematic flow charts included herein are generally described as logical flow charts. Thus, the depicted order and labeled steps indicate one embodiment of the proposed method. Other steps and methods that are equivalent in function, logic, or effect to one or more steps of the illustrated method or portions thereof can be envisioned. In addition, the format and symbols employed are provided to explain the logical steps of the method and should be understood not to limit the scope of the method. Although a variety of arrow types and line types can be employed in the flow charts, they should be understood not to limit the scope of the corresponding method. In fact, some arrows or other connectors can be used to indicate only the logical flow of the method. For example, an arrow can indicate a waiting or monitoring period of unspecified duration between the enumerated steps of the depicted method. In addition, the order in which a particular method occurs may or may not strictly follow the order of the corresponding steps shown.

[0084] Implementations of the various modules may take the form of a fully hardware implementation, a fully software implementation (including firmware, resident software, microcode, etc.), or an implementation that combines software and hardware aspects, all of which are generally referred to herein as "circuits," "modules," or "systems." Furthermore, implementations may take the form of a program product embodied in one or more computer-readable storage devices storing machine-readable code, computer-readable code, and / or program code (hereinafter referred to as code). The storage device may be tangible, non-transitory, and / or non-transmissive. The storage device may not embody signals. In some embodiments, the storage device utilizes only signals to access the code.

[0085] A module may be implemented as a hardware circuit comprising custom very large scale integration (VLSI) circuits or gate arrays, off-the-shelf semiconductors such as logic chips, transistors, or other discrete components. A module may also be implemented in programmable hardware devices such as field programmable gate arrays, programmable array logic, programmable logic devices, and the like.

[0086] Modules can also be implemented in code and / or software to be executed by various types of processors. For example, an identified code module can include one or more physical or logical blocks of executable code, which can be organized into objects, procedures, or functions, for example. However, the executable files of the identified modules need not be physically located together, but can include different instructions stored in different locations, which, when logically combined together, comprise the module and achieve the stated purpose of the module.

[0087] Indeed, a module of code can be a single instruction, or many instructions, and can even be distributed over several different code segments, among different programs, and across several memory devices. Similarly, operational data can be identified and illustrated herein within modules, and can be embodied in any suitable form and organized within any suitable type of data structure. The operational data can be collected as a single data set, or can be distributed over different locations including over different computer readable storage devices. Where a module or portions of a module are implemented in software, the software portion is stored in one or more computer readable storage devices.

[0088] A module can utilize any combination of one or more computer readable media. The computer readable media can be a computer readable storage medium. The computer readable storage medium can be a storage device storing the code. A storage device can be, for example, and without limitation, an electronic, magnetic, optical, electromagnetic, infrared, holographic, micromechanical, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing.

[0089] More specific examples (a non-exhaustive list) of the storage device would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the context of this document, a computer readable storage medium can be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.

[0090] Code for carrying out operations for embodiments can be written in any combination of one or more programming languages, including an object oriented programming language such as Python, Ruby, Java, Smalltalk, C++, or the like, and conventional procedural programming languages, such as the "C" programming language, or the like, and / or machine languages such as assembly languages. The code can execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the latter scenario, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or the connection can be made to an external computer (for example, through the Internet using an Internet Service Provider).

[0091] Further, the present disclosure includes embodiments in accordance with the following clauses:

[0092] Clause 1. A non-destructive inspection system, comprising:

[0093] a motion platform; and

[0094] a tool assembly coupled to the motion platform such that the tool assembly is movable relative to the motion platform, wherein the tool assembly comprises an inspection tool assembly, the inspection tool assembly comprising:

[0095] a base structure coupled to the tool assembly; and

[0096] a plurality of probe assemblies coupled to the base structure, each probe assembly comprising a first linear actuator and a probe, the probe being different from the probe of any other one of the plurality of probe assemblies for inspecting a different structural feature of the structure, wherein each probe is movable along a first axis relative to another one of the probes and substantially perpendicular to the base structure using the first linear actuator of a respective one of the plurality of probe assemblies.

[0097] Clause 2. The non-destructive inspection system of Clause 1, wherein:

[0098] the inspection tool assembly further comprises a second linear actuator coupled to the base structure and each of the plurality of probe assemblies; and

[0099] the second linear actuator is configured to move the plurality of probe assemblies along a second axis substantially perpendicular to the first axis.

[0100] Clause 3. The non-destructive inspection system of Clause 2, further comprising a controller configured to actuate the first linear actuator to position one of the plurality of probes to a scanning position and to position the other one or more probes to a non-scanning position.

[0101] Clause 4. The non-destructive inspection system of Clause 3, wherein:

[0102] the first axis passes through a reference point of the tool assembly;

[0103] the one of the plurality of probe assemblies in the scanning position is aligned with the reference point such that the first axis passes through the one of the plurality of probe assemblies; and

[0104] the other probe assembly in the non-scanning position is not aligned with the reference point such that the first axis does not pass through the other probe assembly.

[0105] Clause 5. The non-destructive inspection system of any one of Clauses 3-4, wherein:

[0106] the first axis passes through a reference point of the tool assembly; and

[0107] an offset of a position of the one of the plurality of probe assemblies positioned in the scanning position relative to the reference point is determined for scanning.

[0108] Clause 6. The non-destructive inspection system of any of clauses 1-5, wherein each probe of the plurality of probe assemblies is rotatable about a first radial axis parallel to the first axis and is rotatable about a second radial axis substantially perpendicular to the first axis and the first radial axis.

[0109] Clause 7. The non-destructive inspection system of any of clauses 1-6, wherein:

[0110] the probe assembly of the plurality of probe assemblies comprises a plurality of probes; and

[0111] the plurality of probes are configured to simultaneously scan the structure when the probe assembly is in the scanning position when at least another probe assembly of the plurality of probe assemblies is in the non-scanning position.

[0112] Clause 8. The non-destructive inspection system of any of clauses 1-7, further comprising one or more sensors, wherein the probe assembly of the plurality of probe assemblies is selected to be in the scanning position and another probe assembly of the plurality of probe assemblies is selected to be in the non-scanning position based on data about the structure captured using the one or more sensors.

[0113] Clause 9. The non-destructive inspection system of any of clauses 1-8, wherein the plurality of probe assemblies comprises a first probe assembly comprising a first probe for scanning a substantially planar region of the structure and a second probe assembly comprising a second probe for scanning a non-planar region of the structure.

[0114] Clause 10. A method of scanning a structure using a non-destructive inspection system, the method comprising:

[0115] moving a first probe assembly of the inspection tool assembly out of a scanning position, the first probe assembly comprising one or more probes for inspecting a first structural feature of the structure;

[0116] moving a second probe assembly of the inspection tool assembly into a scanning position, the second probe assembly comprising one or more probes for inspecting a second structural feature of the structure, the second structural feature being different in type from the first structural feature; and

[0117] scanning the structure using the one or more probes of the second probe assembly.

[0118] Clause 11. The method of clause 10, wherein:

[0119] the step of moving the first probe assembly out of the scanning position comprises actuating a linear actuator connected to the first probe assembly in a first direction along a first axis; and

[0120] The step of moving the second probe assembly to the scan position includes actuating a linear actuator connected to the second probe assembly in a second direction opposite the first direction along the first axis.

[0121] Clause 12. The method of clause 11, further comprising actuating a second linear actuator connected to the first probe assembly and the second probe assembly along a second axis substantially perpendicular to the first axis to further move the first probe assembly out of the scan position and to move the second probe assembly into the scan position.

[0122] Clause 13. The method of clause 12, wherein:

[0123] the first axis passes through a reference point of the tool assembly; and

[0124] the first axis passes through the second probe assembly when in the scan position.

[0125] Clause 14. The method of any of clauses 12-13, further comprising determining an offset of the scan position of the second probe assembly relative to the reference point of the tool assembly along the second axis.

[0126] Clause 15. The method of any of clauses 10-11, wherein moving the first probe assembly out of the scan position and moving the second probe assembly into the scan position comprises actuating a radial actuator connected to the inspection tool assembly about a radial axis, wherein the first probe assembly and the second probe assembly are immovably fixed to the inspection tool assembly and offset from one another.

[0127] Clause 16. The method of any of clauses 10-11, wherein moving the first probe assembly out of the scan position and moving the second probe assembly into the scan position comprises actuating a first radial actuator connected to the first probe assembly and a second radial actuator connected to the second probe assembly.

[0128] Clause 17. The method of any of clauses 10-16, further comprising dynamically selecting one of the first probe assembly or the second probe assembly to move to the scan position based on a structural feature of the structure to be inspected and one of the one or more probes of the first probe assembly or the one or more probes of the second probe assembly.

[0129] Clause 18. The method of any of clauses 10-17, further comprising:

[0130] receiving, at a computing device, a plurality of data sets captured by the one or more probes of the first probe assembly and the one or more probes of the second probe assembly, the plurality of data sets describing a plurality of structural features of the structure; and

[0131] generating a single scan of the structure based on the plurality of data sets.

[0132] Clause 19. A non-destructive inspection system, comprising:

[0133] a motion platform; and

[0134] a tool assembly connected to the motion platform such that the tool assembly is movable relative to the motion platform, wherein the tool assembly comprises an inspection tool assembly comprising a plurality of probe assemblies, each probe assembly comprising a different probe for inspecting a different structural feature of a structure;

[0135] wherein the plurality of probe assemblies are rotatable about the axis using a radial actuator to move at least one of the plurality of probe assemblies to a scanning position.

[0136] Clause 20. The non-destructive inspection system of clause 19, wherein the radial actuator is one of:

[0137] connected to the inspection tool assembly to move the inspection tool assembly in a radial direction; or

[0138] a plurality of radial actuators, each radial actuator connected to a respective one of the plurality of probe assemblies to move each of the plurality of probe assemblies individually in a radial direction.

[0139] The subject matter can be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The described implementations are to be considered in all respects only as illustrative and not restrictive. All changes coming within the meaning and equivalency range of the claims are intended to be embraced therein.

Claims

1. A nondestructive inspection system (100), comprising: A motion platform (102) having three or more degrees of freedom; and A tool assembly (110) connected to the motion platform (102) such that the tool assembly (110) is movable relative to the motion platform (102), wherein the tool assembly (110) includes an inspection tool assembly (130), and the inspection tool assembly (130) includes: a base structure (131) connected to the tool assembly (110); and A plurality of probe assemblies (134a, 134n) connected to the base structure, each probe assembly (134a, 134n) including a first linear actuator (133a, 133n) and a probe (135a, 135n), the probe (135a, 135n) being different from the probe (135a, 135n) of any other one of the plurality of probe assemblies (134a, 134n) for inspecting a different structural feature (145, 146) of a structure (140), wherein each probe (135a, 135n) is movable along a first axis (A) relative to another probe of the probes (135a, 135n) and perpendicular to the base structure (131) using the first linear actuator (133a, 133n) of a respective one of the plurality of probe assemblies (134a, 134n).

2. The nondestructive inspection system (100) according to claim 1, wherein: The inspection tool assembly (130) further includes a second linear actuator (132) connected to the base structure (131) and each of the plurality of probe assemblies (134a, 134n); and The second linear actuator (132) is configured to move the plurality of probe assemblies (134a, 134n) along a second axis (B) perpendicular to the first axis (A).

3. The nondestructive inspection system (100) of claim 2, further comprising a controller (108) configured to actuate the first linear actuator (133a, 133n) to position one of the plurality of probes to a scanning position and to position the other one or more probes to a non-scanning position.

4. The nondestructive inspection system (100) according to claim 3, wherein: A first axis (A) passes through a reference point of the tool assembly (110); one of the plurality of probe assemblies (134a, 134n) in the scanning position is aligned with the reference point such that the first axis (A) passes through the one of the plurality of probe assemblies (134a, 134n); and The other probe assemblies (134a, 134n) in the non-scanning position are not aligned with the reference point, so that the first axis (A) does not pass through the other probe assemblies (134a, 134n).

5. The nondestructive inspection system (100) according to claim 3, wherein: The first axis (A) passes through a reference point of the tool assembly (110); and An offset of a position of one of the plurality of probe assemblies (134a, 134n) positioned at the scanning location relative to the reference point is determined for scanning.

6. The nondestructive inspection system (100) according to any one of claims 1 to 5, wherein each probe (135a, 135n) in the plurality of probe assemblies (134a, 134n) is rotatable about a first radial axis (C) parallel to the first axis (A), and is rotatable about a second radial axis (D) perpendicular to the first axis (A) and the first radial axis (C).

7. The non-destructive inspection system (100) according to any one of claims 1 to 5, wherein: A probe assembly (134a, 134n) of the plurality of probe assemblies (134a, 134n) includes a plurality of probes (135a, 135n); and When at least another one of the plurality of probe assemblies (134a, 134n) is in a non-scanning position, the plurality of probes (135a, 135n) are configured to simultaneously scan the structure (140) when the probe assemblies (134a, 134n) are in a scanning position.

8. The nondestructive examination system (100) of any one of claims 1-5, further comprising one or more sensors (136), wherein based on data about the structure (140) captured using the one or more sensors (136), a probe assembly (134a, 134n) of the plurality of probe assemblies (134a, 134n) is selected to be in a scanning position and another probe assembly (134a, 134n) of the plurality of probe assemblies (134a, 134n) is selected to be in a non-scanning position.

9. The nondestructive inspection system (100) according to any one of claims 1 to 5, wherein the plurality of probe assemblies (134a, 134n) include a first probe assembly (134a) and a second probe assembly (134n), the first probe assembly (134a) including a first probe (135a) for scanning a flat area of ​​the structure (140), and the second probe assembly (134n) including a second probe (135n) for scanning a non-flat area of ​​the structure (140).

10. A method (700) of scanning a structure (140) using a non-destructive inspection system (100) according to any one of claims 1 to 9, the method (700) comprising: moving a first probe assembly (134a) of an inspection tool assembly (130) of the tool assembly (110) out of a scanning position, the first probe assembly (134a) including one or more probes for inspecting a first structural feature (145) of a structure (140); moving a second probe assembly (134n) of the inspection tool assembly (130) to the scanning position, the second probe assembly (134n) including one or more probes for inspecting a second structural feature (146) of the structure (140), the second structural feature (146) being a different type than the first structural feature (145); and The structure (140) is scanned using the one or more probes of the second probe assembly (134n).

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