IGBT drive board test system

Abstract

The present application relates to a kind of IGBT drive board test system, belong to the test field of IGBT drive board.System includes controller and analog IGBT system, wherein analog IGBT system includes at least one bridge arm simulation module, the bridge arm simulation module includes controllable switch tube, controllable switch tube both ends form the CE interface of analog IGBT, the G interface of the analog IGBT is also included in the analog IGBT system;The C, E, G interface of the analog IGBT is also used to connect the IGBT drive board to be measured;The controller is used to be connected with the IGBT drive board to be measured, and the controller is also used to sample the G, E interface of connection the analog IGBT, and also be used to control the controllable switch tube connected with the controller.This test system of the present application has simple circuit, by setting analog IGBT system, for simulating real IGBT power module, just can realize the drive test and fault protection test of the IGBT drive board to be measured.

Description

Technical Field

[0001] This application relates to an IGBT driver board testing system, belonging to the field of IGBT driver board testing. Background Technology

[0002] IGBT power modules possess excellent characteristics such as high voltage resistance, high current capacity, high switching speed, and low saturation voltage drop, and are widely used in power electronics fields such as traction electric drives, power transmission and conversion, and active filtering. The protection of IGBT power modules is primarily handled by the IGBT driver board. The driver board serves as the interface between the power module's main circuit and the control circuit, playing a crucial role in fully utilizing the IGBT's performance and improving system reliability.

[0003] A high-performance IGBT driver board enables IGBT power modules to operate in a more ideal switching state. For plug-and-play IGBT power modules, the IGBT driver board needs to be soldered or screwed onto it to function in the circuit. Therefore, it is essential to ensure the IGBT driver board is functioning correctly and reliably before installation. Testing the driver board's reliability before installation avoids discovering its inadequacy only after installation, which would not only delay work progress but also potentially damage the IGBT power module during removal, wasting manpower and resources.

[0004] Furthermore, IGBT power modules are highly sensitive devices and are not suitable for frequent movement or operation. Therefore, selecting a reliable driver board during soldering is crucial for smooth operation. Traditional IGBT driver board testing methods involve technicians using oscilloscopes and other equipment to test each board individually. This process is time-consuming, inefficient, and places high demands on the testing personnel. Summary of the Invention

[0005] The purpose of this application is to provide an IGBT driver board testing system to solve the problems of low testing efficiency and long testing time in existing IGBT driver board testing methods.

[0006] The IGBT driver board testing system of this application adopts the following technical solution:

[0007] Includes controllers and analog IGBT systems, wherein:

[0008] The simulated IGBT system includes at least one bridge arm simulation module, which includes a controllable switching transistor. The two ends of the controllable switching transistor form the C and E interfaces of the simulated IGBT. The simulated IGBT system also includes a G interface of the simulated IGBT. The C, E, and G interfaces of the simulated IGBT are also used to connect to the driver board of the IGBT under test.

[0009] The controller is used to communicate with the IGBT driver board under test. The controller is also used to sample the G and E interfaces of the analog IGBT and to control the connection of the controllable switching transistor.

[0010] The beneficial effects of the above technical solution are:

[0011] The testing system of this invention features a simple circuit. By using a simulated IGBT system to mimic a real IGBT power module, it can perform drive testing and fault protection testing on the IGBT driver board under test. At the start of the test, the controller sends a drive control signal to the IGBT driver board under test. Upon receiving the drive control signal, if the drive function is normal, the IGBT driver board will output a drive signal. The controller, upon receiving the drive signal through the simulated IGBT system, controls the conduction of a controllable switch, thereby controlling the conduction of the series branch of the simulated IGBT system. The controller determines whether the IGBT driver board under test can output a drive signal normally based on the received drive signal, thus achieving the drive test. When the controller controls the controllable switch to turn off, it determines whether the IGBT driver board under test should stop outputting the drive signal, thus achieving the fault protection test. The entire testing process is automated, requiring no manual testing, reducing human input, and offering short testing time and high efficiency, meeting testing requirements. Furthermore, compared with existing driver board testing systems, the testing system of this invention has a simpler circuit structure, lower cost, and can guarantee the required testing accuracy.

[0012] To ensure rapid connection between the G and E interfaces of the simulated IGBT system and the driver board under test (DUT), the G and E interfaces of the simulated IGBT are connected to the DUT driver board via a pin-and-socket connector. Compared to the screw-on connection method in existing technologies, the pin-and-socket connector enables rapid insertion and removal of the DUT driver board.

[0013] Furthermore, the sockets used to connect the G and E interfaces are sockets with external springs. The middle of the spring bulges outward, while the two ends of the spring are tapered inward, thus making the insertion and removal process of the connector smoother.

[0014] To further enable quick insertion and removal of the connector, the head of the insertion post is elliptical.

[0015] To enable on / off control of the series branch, the controllable switch is a transistor.

[0016] To achieve communication between the controller and the IGBT driver board under test, a ribbon cable connection is used, that is, the controller is connected to the IGBT driver board under test via a ribbon cable.

[0017] To further enable the display of test results, the controller is connected to a display screen, which allows for convenient and intuitive display of the test results. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the IGBT driver board testing system of the present invention;

[0019] Figure 2 This is a schematic diagram of the interface connection between the simulated IGBT system of the present invention and the IGBT driver board under test;

[0020] In the diagram: 1 - the socket of the IGBT driver board under test, 2 - the socket-type connector. Detailed Implementation

[0021] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of this application and are not intended to limit this application; that is, the described embodiments are only a part of the embodiments of this application, and not all of them. The components of the embodiments of this application described and shown in the accompanying drawings can typically be arranged and designed in various different configurations.

[0022] Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0023] It should be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0024] The features and performance of this application will be further described in detail below with reference to the embodiments.

[0025] like Figure 1The IGBT driver board test system shown includes a controller and a simulated IGBT system. The simulated IGBT system includes a bridge arm simulation module, which includes a transistor whose two ends form the CE interface (i.e., C interface and E interface) of the simulated IGBT. The simulated IGBT system also includes a simulated IGBT G interface. During testing, the simulated IGBT CE interface and G interface are used to connect to the IGBT driver board under test. Specifically, the simulated IGBT C interface is connected to the C acquisition port of the IGBT driver board under test, the simulated IGBT E interface is connected to the E acquisition port of the IGBT driver board under test, and the simulated IGBT G interface is connected to the G drive port of the IGBT driver board under test.

[0026] Figure 1 In this system, the controller samples the G and E interfaces of the analog IGBT. The controller is also connected to the driver board of the IGBT under test via a ribbon cable. The controller is also used to control the transistors connected to the analog IGBT system.

[0027] Based on the above IGBT driver board test system, the IGBT driver board under test is tested. The test includes two aspects: first, the drive test, that is, whether the IGBT driver board can send drive signals normally; second, the fault protection test, that is, whether the IGBT driver board can quickly (e.g., within 200ms) stop the drive signal output according to the fault feedback.

[0028] The testing principle of the driver test is as follows:

[0029] At the start of the test, the controller sends a drive control signal to the IGBT driver board. Upon receiving the drive control signal, if the drive function is normal, the IGBT driver board will output a drive signal. The controller, receiving this drive signal through the G and E interfaces of the simulated IGBT system, sends a high-level signal to the transistor, controlling the transistor to conduct, thereby controlling the simulated IGBT system to conduct, simulating IGBT conduction. Then, the controller compares the waveform of the received drive signal with a preset drive signal waveform range. When the comparison results match, it is determined that the IGBT driver board can output a drive signal normally. When the comparison results do not match, or no drive signal is received, it is determined that the IGBT driver board cannot drive normally or cannot drive at all, indicating an IGBT driver board fault, thus completing the drive test.

[0030] The test principle of fault protection testing is as follows:

[0031] After the above drive test of the IGBT driver board passes, the series branch of the simulated IGBT system is in a conducting state. The controller sends a low-level signal to the transistor to control the switch in the series branch to turn off, thus disconnecting the CE interface to simulate the fault state where the IGBT cannot conduct normally. If the fault protection function of the IGBT driver board is normal, it can receive the fault signal fed back from the C interface of the simulated IGBT through the C acquisition interface. When the C acquisition interface receives the fault signal, the terminal voltage of the C interface of the simulated IGBT becomes high, causing the diode of the IGBT driver board to conduct in reverse. The comparator outputs a high-level signal, i.e., the fault signal. The IGBT driver board feeds back the detected fault signal to the controller, and the IGBT driver board stops outputting the drive signal. The blocking time displayed in the controller is ≤200ms, which is considered normal; if the displayed blocking time is greater than 200ms, the fault protection function of the IGBT driver board is determined to be abnormal.

[0032] If the IBGT driver board continues to send drive signals, the controller can continue to detect the drive signals from the IBGT driver board and will not receive any fault signals sent by the IBGT driver board, thus determining that the IBGT driver board is faulty, thereby achieving fault protection testing.

[0033] After the drive test and fault protection test of an IGBT driver board are completed, the test results are displayed on the monitor connected to the controller. The tested IGBT driver boards are then categorized and marked by the staff for testing the next IGBT driver board. In this embodiment, the controller has a built-in data acquisition card that can acquire external signals. Through a signal processing and analysis system combining Matlab and LabVIEW, the drive signals emitted by the IGBT driver board can be analyzed and compared with a set standard range (i.e., a set range of drive signal waveforms), and the results are displayed on the interface.

[0034] The testing system of this invention features a simple circuit. By using a simulated IGBT system to mimic a real IGBT power module, it can perform drive testing and fault protection testing on the IGBT driver board under test. The entire testing process is automated, requiring no manual intervention, thus reducing human input. The testing is time-efficient and highly effective, meeting testing requirements. Furthermore, compared to existing driver board testing systems, the testing system of this invention has a simpler circuit structure, lower cost, and can guarantee the required testing accuracy.

[0035] In the simulated IGBT system of this embodiment, the G and E interfaces of the simulated IGBT are connected to the IGBT driver board under test via socket-type connectors 2, such as... Figure 2As shown, one end of the socket-type connector 2 is a socket with an external spring, used for the socket 1 of the IGBT driver board under test (i.e., the G or E drive port of the IGBT driver board under test, also called the test hole). The spring on the socket bulges outward in the middle, and the two ends of the spring taper inward. The head of the socket is elliptical to facilitate quick insertion and removal from the socket 1. The other end of the socket-type connector 2 is used to lead out a wire, which is connected to the G or E interface of the analog IGBT system.

[0036] In this embodiment, the socket-type connector 2 is a quick-plug interface. Its spring is a spring-type crimping piece made of conductive material, i.e., a fixed-size conductive signal plug with an inner diameter 0.5mm smaller than the test hole. The spring clip deforms when squeezed by external force. The top has a smooth arc shape to ensure that the test board (IGBT driver board and analog IGBT system) is not subject to friction during installation. When placed at the bottom of the quick-plug interface, it instantly recovers its elastic deformation, making the test board tightly connected and ensuring the transmission of the drive signal to the analog IGBT system. It can achieve convenient and quick plugging and unplugging of the IGBT driver board while ensuring a reliable electrical connection.

[0037] In this embodiment, the simulated IGBT system is used to replace the real IGBT. As another implementation, the simulated IGBT system may include two bridge arm simulation modules, namely an upper bridge arm module and a lower bridge arm module, to simulate a half-bridge IGBT power module. For example, the 2SP0320T2B0-12 product from Concept can simultaneously send two drive signals. The positive voltage range of the drive signals is +16V to +14V, and the negative voltage range is -8V to -12V. When the rise time / fall time of the drive signals transmitted by the two bridge arm simulation modules is ≤300ns, it indicates that the drive function is normal. When the controller receives the drive signal from the IGBT driver board, it begins to perform the switching action of the switching transistor. When a simulated fault occurs, if the blocking time displayed by the IGBT driver board is ≤200ms, it indicates that the fault protection function is normal.

[0038] As another implementation, the simulated IGBT system may also include four bridge arm simulation modules, namely two upper bridge arm modules and two lower bridge arm modules, to simulate a full-bridge IGBT module. Additionally, if multiple IGBT driver boards need to be tested simultaneously, an additional number of bridge arm simulation modules can be added as needed.

[0039] The above description is merely a preferred embodiment of this application and is not intended to limit the application. For example, the transistor in this embodiment can be replaced by other controllable switching transistors, such as thyristors. Therefore, the scope of patent protection of this application is determined by the claims. Any equivalent structural changes made based on the description and drawings of this application should also be included within the scope of protection of this application.

Claims

1. An IGBT driver board test system, characterized by, Includes controllers and analog IGBT systems, wherein: The simulated IGBT system includes at least one bridge arm simulation module. Each bridge arm simulation module includes a controllable switch, with its two ends forming the C and E interfaces of the simulated IGBT. When the controllable switch is turned off, the C and E interfaces of the simulated IGBT are disconnected. The simulated IGBT system also includes a G interface of the simulated IGBT, which is not connected to the controllable switch. The C, E, and G interfaces of the simulated IGBT are also used to connect to the C acquisition port, E acquisition port, and G drive port of the IGBT driver board under test, respectively. The controller is used to communicate with the IGBT driver board under test. It is also used to sample the G and E interfaces of the simulated IGBT, collect the drive signals received from these interfaces, and control the connection of the controllable switch. At the start of the test, the controller sends a drive signal to the IGBT driver board and receives the drive signal output by the simulated IGBT driver board through its G and E interfaces. Upon receiving the drive signal, it controls the controllable switch to turn on, thus simulating the IGBT system's conduction. The controller compares the waveform of the received drive signal with a preset drive signal waveform range to determine whether the IGBT driver board under test can output the drive signal normally, thereby achieving the drive test.

2. The IGBT driver board test system of claim 1, wherein, When the comparison results are consistent, it is determined that the IGBT driver board under test can output the drive signal normally. When the comparison results are inconsistent, or no drive signal is received, it is determined that the IGBT driver board under test cannot be driven normally or cannot be driven, and the IGBT driver board under test is determined to be faulty, thereby realizing the drive test.

3. The IGBT driver board test system of claim 1, wherein, The controller is used to control the controllable switch to turn off when the controllable switch is in the on state, simulating the fault state of the IGBT failing to conduct normally, and to determine whether the IGBT driver board under test stops outputting drive signals, thereby realizing fault protection testing.

4. The IGBT driver board test system of claim 3, wherein, If the controller determines that the IGBT driver board under test stops outputting the drive signal and the blocking time is less than or equal to 200ms, then the fault protection function of the IGBT driver board is considered to be normal. If the blocking time is greater than 200ms, then the fault protection function of the IGBT driver board is considered to be abnormal.

5. The IGBT driver board test system of claim 1 or 2 or 3, wherein, The controllable switching transistor is a bipolar transistor. The collector of the bipolar transistor serves as the C interface of the analog IGBT, the emitter of the bipolar transistor serves as the E interface of the analog IGBT, and the base of the bipolar transistor is connected to the controller.

6. The IGBT driver board test system of claim 3, wherein, When the controller determines that the IGBT driver board under test has not stopped outputting the drive signal and cannot receive the fault signal sent by the IGBT driver board, it determines that the fault protection function of the IGBT driver board is abnormal.

7. The IGBT driver board test system of claim 1 or 2 or 3, wherein, The controller is connected to a display.

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