An iv test probe array test detection system

Abstract

The application discloses an IV test probe array test detection system, and technical scheme points are as follows: the array test probe detection system comprises an array probe base plate and a control module, a plurality of groups of voltage array probes and current array probes are arranged on the array probe base plate, a voltage welding point is arranged at one end of the array probe base plate, a plurality of groups of resistors are sequentially and electrically connected to the voltage welding point, the voltage array probes are electrically connected in series with one group of the resistors at intervals, a current welding point is arranged at the lower part of the voltage welding point, a controllable resistor plate and an IV test instrument are electrically connected to the control module, a plurality of groups of relays are electrically connected to the controllable resistor plate and the IV test instrument, and a plurality of groups of detection probes are respectively and electrically connected to the relays; the device can completely eliminate grading errors, the voltage array probes are connected through the series resistor structure, and the average grid line potential between voltage probes can be measured, and in addition, unnecessary large mechanical stress is not applied to the measured unit.

Description

Technical Field

[0001] This invention relates to the field of photovoltaic cell manufacturing, and in particular to an IV test probe array testing and detection system. Background Technology

[0002] Testing and sorting is a crucial step in photovoltaic cell manufacturing. It directly impacts product quality and grade, thus demanding high standards and requirements for testing equipment. Testing and sorting necessitate the use of an IV (In-Volume Index) analyzer, such as... Figure 1 As shown, the IV tester measures the IV characteristics of solar cells. It can measure silicon solar cells, and the system automatically calculates key parameters such as open-circuit voltage, short-circuit current, fill factor (FF), Jsc (short-circuit current density), Voc (open-circuit voltage), maximum power, efficiency, etc. Testing these parameters requires contact between the probe array and the main grid of the solar cell. The contact condition and arrangement of the probe array directly affect the accuracy of all data. In a typical probe array design, current and voltage probes are arranged alternately on a single probe array. All current and voltage probes are connected in series and then converged to a digital source meter for a four-wire IV scan. This means that under illumination, a dynamic load scan is performed at the current interface, simultaneously recording the current and voltage values. Because the current and voltage probes are not in the same position on the main grid, the voltage value read is not the voltage at the current tap. This will have at least two effects: (1) The voltage value read is higher than the voltage at the current needle, and the FF and efficiency are both higher. The degree of the higher value is related to the distance between the voltage needle and the two adjacent current needles, as well as the line resistance of the solar cell grid. The greater the distance, the greater the grid line resistance, and the greater the deviation. (2) Since all voltage needles are short-circuited and then converged to the digital source meter, when the voltage values ​​at different positions of the solar cell are different, it will cause current flow between the voltage needles to make the voltage of the entire plane tend to be consistent. For solar cells with poor uniformity, especially large-size cells such as 182 and 210, the fluctuation caused by non-uniformity will also affect the FF and efficiency. The worse the uniformity, the greater the fluctuation.

[0003] In summary, the IV testing equipment used in the past had a high false positive rate. It would often sort good cells into poor cells and vice versa, or put cells of different voltages together. These false positives caused huge economic losses to the company.

[0004] Referring to the existing Chinese patent with publication number CN205397505U, it discloses a photovoltaic cell backside inspection system, which has a vacuum adsorption plate (1), three adsorption section conveyor belts (2), a front inspection section belt (3), a rear inspection section belt (4), and a cylinder; the vacuum adsorption plate (1) is connected to the air pump by an air pipe and has a vacuum adsorption function; the three adsorption section conveyor belts (2) run close to the bottom of the vacuum adsorption plate (1); the cell (6) is conveyed by the front inspection section belt (3) to the loading station (11) and then lifted by the cylinder; the vacuum adsorption plate (1) sucks the cell (6) onto the adsorption section conveyor belt (2); the adsorption section conveyor belt (2) moves the cell (6) to the inspection station (12); and the rear inspection adsorption section conveyor belt (2) moves the cell (6) to the unloading station (13).

[0005] The aforementioned photovoltaic cell backside inspection system simplifies the inspection and conveying equipment, significantly reducing machine length and lowering costs. However, this system still has some drawbacks, such as the extremely high false positive rate of previously used IV testing equipment. It often sorts good cells into poor cell categories, and vice versa, or groups cells of different voltages together. These errors cause significant economic losses for the company. Summary of the Invention

[0006] In view of the problems mentioned in the background art, the purpose of this invention is to provide an IV test probe array test and detection system to solve the problems mentioned in the background art.

[0007] The above-mentioned technical objective of the present invention is achieved through the following technical solution:

[0008] An IV test probe array testing system includes a probe array base plate and a control module. Several sets of voltage and current probe arrays are fixedly mounted on the probe array base plate, spaced apart from each other. A voltage solder joint is provided at one end of the probe array base plate, and several sets of resistors are electrically connected sequentially to the voltage solder joint. Each pair of spaced voltage probe arrays is electrically connected in series with one of the resistors. A current solder joint is provided below the voltage solder joint, and the current solder joint is electrically connected to the several sets of current probe arrays. A controllable resistance plate and an IV test instrument are electrically connected to the controllable resistance plate and the IV test instrument. Several sets of relays are electrically connected to the relays, and detection probes are electrically connected to each relay. The controllable resistance plate and the IV test instrument are electrically connected to each other. A display screen is electrically connected to the control module.

[0009] By adopting the above technical solution, the voltage and current pins are driven by the pin header substrate to make contact with the battery cell, enabling the voltage and current pins to detect the battery cell. Then, the voltage pins transmit the detected voltage to the controllable resistor board and IV test instrument through a resistor, and the current pins transmit the detected current to the controllable resistor board and IV test instrument. In turn, the IV test instrument transmits the data information to the control module, and the control module displays the data information on the display screen and stores it in the storage module.

[0010] Preferably, the control module is electrically connected to a storage module, which includes at least one ROM storage module and one RAM storage module.

[0011] By adopting the above technical solutions, the stored content can be kept in order, and the ROM storage module can store the running program body of the system, while the RAM storage module can store the running log.

[0012] Preferably, the control module is electrically connected to a power module, which includes a driver, a steering motor, a track motor, a transmission motor, and a lifting cylinder.

[0013] By adopting the above technical solution, the power module can realize the transportation and steering of battery cells, as well as the control and adjustment of the detection pin header.

[0014] Preferably, the driver is electrically connected to the control module, and the driver is electrically connected to the steering motor, the track motor, the transmission motor, and the lifting cylinder.

[0015] By adopting the above technical solution, the control module can control and adjust the steering motor, track motor, transmission motor and lifting cylinder through the driver.

[0016] Preferably, at least two sets of mounting holes are provided at both ends of the pin header base plate, and the at least two sets of mounting holes are respectively fixedly connected to the output end of the lifting cylinder. The two ends of the pin header base plate are threadedly connected to the output screw of the track motor through sliding seats.

[0017] By adopting the above technical solution, the mounting hole connects to the lifting cylinder to achieve lifting adjustment, and the track motor can drive the pin header base plate to achieve movement adjustment.

[0018] Preferably, the control module is also electrically connected to a communication module and a lighting source.

[0019] Preferably, the control module is electrically connected to a power supply module for supplying power to the lighting source.

[0020] By adopting the above technical solution, the communication module can transmit detection parameters and transmit information in case of failure. The detection of the spectrometer, illumination source, probe array, and battery cells are all conducted in a dark box. In order to prevent external light from affecting the accuracy of the detection, the illumination source can provide supplementary illumination during the detection. The intensity of the light source can be adjusted according to the test data requirements.

[0021] Preferably, the power module also includes a robotic arm, which is also electrically connected to the driver.

[0022] By adopting the above technical solution, the robotic arm can remove and place battery cells, and then enable the pin header to perform inspection.

[0023] In summary, the present invention has the following main beneficial effects:

[0024] First, the dual detection system of the present invention can completely eliminate grading errors. Its fast detection speed and high detection accuracy can effectively reduce the waste caused by manual re-grading due to incorrect grading by the detection equipment.

[0025] Secondly, by using a series configuration and employing more test probes, the impact of contact voltage variations on the grid line measurement position can be minimized. A contact geometry suitable for calibrating IV measurements is proposed, which consists of a row of series resistors comprising several voltage probes, with each resistor terminal connected to one voltage probe. The position of the probes is used to measure the average grid line potential between the voltage probes. This contact geometry is optimal due to its low sensitivity to changes in grid line resistivity and contact resistance. Furthermore, this geometry does not impose unnecessarily large mechanical stresses on the unit under test. Attached Figure Description

[0026] Figure 1 This is a schematic diagram illustrating the testing principle of an IV detector;

[0027] Figure 2 This is a schematic diagram of the detection pin header of the present invention;

[0028] Figure 3 This is a schematic diagram of the system structure of the present invention;

[0029] Figure 4 This is a schematic diagram of the power module of the present invention.

[0030] Reference numerals: 1. Pin header board; 2. Voltage pin header; 3. Current pin header; 4. Voltage solder joint; 5. Resistor; 6. Current solder joint; 7. Mounting hole. Detailed Implementation

[0031] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0032] Example 1

[0033] refer to Figures 2-4 An IV test probe array testing system includes a probe array base plate 1 and a control module. Several sets of voltage probe arrays 2 and current probe arrays 3 are fixedly mounted on the probe array base plate 1, spaced apart from each other. A voltage solder joint 4 is provided at one end of the probe array base plate 1, and several sets of resistors 5 are electrically connected sequentially to the voltage solder joint 4. Two voltage probe arrays 2 are connected in series with a set of resistors 5. A current solder joint 6 is provided below the voltage solder joint 4, and the current solder joint 6 is electrically connected to the several sets of current probe arrays 3. A controllable resistor plate and an IV test instrument are electrically connected to the controllable resistor plate and the IV test instrument. Several sets of relays are electrically connected to the relays, and detection probes are electrically connected to each relay. The controllable resistor plate and the IV test instrument are electrically connected. A display screen is electrically connected to the control module.

[0034] By adopting the above technical solution, the voltage pin header 2 and current pin header 3 are driven by the pin header substrate 1 to make contact with the battery cell, so that the voltage pin header 2 and current pin header 3 can detect the battery cell. Then, the voltage pin header 2 transmits the detected voltage to the controllable resistor plate and IV test instrument through the resistor 5, and the current pin header 3 transmits the detected current to the controllable resistor plate and IV test instrument. In turn, the IV test instrument transmits the data information to the control module. The control module displays the data information on the display screen and stores it in the storage module.

[0035] refer to Figure 3 To achieve the goal of storing parameters and program bodies separately, the control module is electrically connected to a storage module, which includes at least one ROM storage module and one RAM storage module. The effect is that the stored content will not be confused, and the ROM storage module can store the system's running program body, while the RAM storage module can store the running logs.

[0036] To ensure a stable power supply and operation of the control module, the power supply module includes a step-down circuit, a rectifier circuit, a filter circuit, and a voltage regulator circuit. The step-down circuit converts the high voltage from the mains grid to a low voltage; the rectifier circuit converts the AC voltage from the mains grid to DC voltage; the filter circuit filters out AC voltage from the DC voltage; and the voltage regulator circuit stabilizes voltage fluctuations.

[0037] refer to Figure 4 For the purpose of powering the system, the control module is electrically connected to a power module, which includes a driver, a steering motor, a track motor, a transmission motor, and a lifting cylinder. The power module enables the transport and steering of the battery cells, as well as the control and adjustment of the detection pins.

[0038] refer to Figure 4 To enable the power module to control its operation, the driver is electrically connected to the control module, and in turn, the driver is electrically connected to the steering motor, track motor, transmission motor, and lifting cylinder. The result is that the control module, through the driver, can control and adjust the steering motor, track motor, transmission motor, and lifting cylinder.

[0039] refer to Figure 2 To enable the power module to connect and adjust the pin header base plate 1, at least two sets of mounting holes 7 are provided at both ends of the pin header base plate 1. These mounting holes 7 are fixedly connected to the output end of the lifting cylinder, and both ends of the pin header base plate 1 are threadedly connected to the output screw of the track motor via sliding seats. The effect is that the mounting holes 7 connect to the lifting cylinder, enabling lifting and adjusting, and the track motor drives the pin header base plate 1 to move and adjust.

[0040] refer to Figure 3 To achieve the purpose of communication transmission and simulated lighting for the system, the control module is also electrically connected to a communication module and a lighting source. The effect is that the communication module can transmit detection parameters and transmit information in case of faults, while the lighting source can provide supplementary illumination during detection.

[0041] refer to Figure 4 To facilitate the transfer of battery cells, the power module also includes a robotic arm, which is electrically connected to the actuator. The robotic arm can remove and place battery cells, allowing the pin headers to perform inspection.

[0042] Operating principle and advantages:

[0043] During use, the battery cells are transported by the transmission motor in the power module, then gripped and picked up by a robotic arm, and placed at the testing point. The track motor and lifting cylinder are then activated to control and adjust the pin header board 1, enabling the pin header board 1 to drive the voltage pin header 2 and current pin header 3 to adhere to the upper and lower sides of the battery cell. The control module then activates the lighting source to simulate sunlight, allowing the battery cell to generate electricity. At this time, after the voltage pin header 2 detects the voltage, the voltage fluctuation detected between each pair of voltage pin header 2 is transmitted to the controllable resistance board and IV test instrument through the resistor 5 and voltage welding point 4. The current pin header 3 also transmits the detected current fluctuation to the controllable resistance board and IV test instrument. The IV test instrument displays the parameters on the display screen, stores them in the storage module, and transmits the data information through the communication module, completing the entire testing of the battery cell.

[0044] After the light source intensity is manually adjusted to a preset value on the industrial control touch screen, it is equivalent to ensuring that the voltage and current output can be stable under a fixed light intensity. This allows for the testing of fixed data for the solar cells under the same lighting conditions. We have already entered the data of different grades of cells, such as A-cells and B-cells, into the system. After each solar cell is tested, the robotic arm automatically sorts the cells by comparing them with the previously entered data.

[0045] Furthermore, when testing each grid cell on the battery cell, several sets of pin header boards 1 will be set up, and the voltage pin headers 2 and current pin headers 3 on the several sets of pin header boards 1 will be used to test each grid cell on the battery cell.

[0046] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An IV test probe array testing and detection system, comprising a probe array substrate (1) and a control module, characterized in that: Several sets of voltage pins (2) and current pins (3) are fixedly mounted on the pin header substrate (1). The sets of voltage pins (2) and current pins (3) are spaced apart from each other. A voltage solder joint (4) is provided at one end of the pin header substrate (1). Several sets of resistors (5) are electrically connected to the voltage solder joint (4) in sequence. The voltage pins (2) spaced apart from each other are electrically connected in series with a set of resistors (5). A current solder joint (6) is provided at the lower part of the voltage solder joint (4). The current solder joint (6) is connected to several sets of resistors (5). The current pin group (3) is electrically connected, and the control module is electrically connected to a controllable resistor plate and an IV test instrument. Several sets of relays are electrically connected to the controllable resistor plate and the IV test instrument. Detection probes are electrically connected to the several sets of relays respectively. The controllable resistor plate and the IV test instrument are electrically connected. The control module is electrically connected to a display screen. The control module is also electrically connected to an illumination source and a power module. The light intensity of the illumination source is adjustable, and the power module includes a robotic arm for transporting battery cells.

2. The IV test probe array testing and detection system according to claim 1, characterized in that: The control module is electrically connected to a storage module, which includes at least one set of ROM storage modules and one set of RAM storage modules.

3. The IV test probe array testing and detection system according to claim 1, characterized in that: The control module is electrically connected to a power supply module for supplying power to the lighting source.

4. The IV test probe array testing and detection system according to claim 3, characterized in that: The power supply module includes a step-down circuit, a rectifier circuit, a filter circuit, and a voltage regulator circuit.

5. The IV test probe array testing and detection system according to claim 1, characterized in that: The power module includes a driver, a steering motor, a track motor, a transmission motor, and a lifting cylinder.

6. The IV test probe array testing and detection system according to claim 5, characterized in that: The driver is electrically connected to the control module, and the driver is also electrically connected to the steering motor, the track motor, the transmission motor, and the lifting cylinder.

7. The IV test probe array testing and detection system according to claim 6, characterized in that: At least two sets of mounting holes (7) are provided at both ends of the pin header substrate (1).

8. The IV test probe array testing and detection system according to claim 7, characterized in that: At least two sets of mounting holes (7) are fixedly connected to the output end of the lifting cylinder, and the two ends of the pin header base plate (1) are threadedly connected to the output screw of the track motor through sliding seats.

9. The IV test probe array testing and detection system according to claim 1, characterized in that: The control module is also electrically connected to a communication module and a lighting source.

10. The IV test probe array testing and detection system according to claim 5, characterized in that: The robotic arm is also electrically connected to the actuator.

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