AFE data acquisition automatic scheduling method based on BMS, storage device and mobile terminal

By using the AFE chip in the BMS system to automatically complete data acquisition and report it to the MCU through interrupt signals, the problem of tight MCU resources is solved, and the low power consumption and flexible scheduling configuration of AFE are achieved.

CN112882415BActive Publication Date: 2025-03-04SHENZHEN PENGSHEN TECH CO LTD
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Patent Information

Application Number
CN202110043937.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2021-01-13
Publication Date
2025-03-04
Estimated Expiration
2041-01-13

AI Technical Summary

Technical Problem

In BMS systems, the MCU needs to handle a large number of functions, resulting in resource shortage. The existing acquisition methods cannot effectively reduce the workload of the MCU.

Method used

The automatic scheduling method of AFE data acquisition based on BMS is adopted. Data acquisition is automatically completed within the basic scheduling cycle through the AFE chip, and an interrupt signal is sent to the MCU when the configured interrupt granularity is reached. The MCU reads the data and then wakes up or lets the AFE chip go to sleep.

Benefits of technology

It reduces the resource burden of the MCU, optimizes the working power consumption of AFE, and adapts to the scheduling time requirements under different working states through simple register configuration.

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Abstract

The present invention discloses an automatic scheduling method, storage device and mobile terminal for AFE data acquisition based on BMS. The automatic scheduling method includes the following steps: the AFE chip performs current acquisition according to the number of current acquisition granularities configured by the MSR_I register during the entire scheduling time; the AFE chip is awakened 5ms before the end of the previous basic scheduling cycle, and the next basic scheduling cycle is started after the AFE chip is awakened and data measurement and acquisition is performed; after the basic scheduling cycle is completed, when the configured interrupt granularity is reached, the AFE chip sends an interrupt signal to the MCU, and the MCU reads the data collected by the AFE chip after receiving the mid-segment signal. The present invention saves MCU resources and optimizes the working power consumption of the AFE.
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Description

Technical Field

[0001] The present invention relates to the field of automatic scheduling, and in particular to an automatic scheduling method for AFE data acquisition based on BMS. Background Art

[0002] In BMS (battery management system, BMS, lithium battery management system), AFE (analog front end, AFE) is often used to collect data on voltage, temperature, and current signals. Generally, instructions are issued by an external or embedded MCU (MCU, microcontroller), and AFE performs related data collection work.

[0003] With the development of the intelligence of the entire BMS system, the MCU in the BMS needs to process more and more functions, and the resources are relatively tight.

[0004] Therefore, it is necessary to improve the existing acquisition method to reduce the workload of MCU. Summary of the invention

[0005] In order to solve the above technical problems, an automatic scheduling method for AFE data acquisition is proposed, which can reduce the workload of MCU.

[0006] To achieve the above object, the technical solution adopted by the present invention is as follows: A method for automatic scheduling of AFE data acquisition based on BMS, suitable for execution in a computer, the method comprising the following steps:

[0007] Step 1: The AFE chip collects current according to the number of current collection granularities configured by the MSR_I register during the entire scheduling time. One current collection cycle corresponds to one basic scheduling granularity.

[0008] Step 2: Wake up the AFE chip 5ms before the end of the previous basic scheduling cycle. After the AFE chip wakes up, start the next basic scheduling cycle and perform data measurement and collection;

[0009] The order of AFE chip measurement and collection in any basic scheduling cycle is cell voltage collection, battery pack voltage collection, auxiliary temperature sensor voltage collection, chip temperature collection and battery pack current collection;

[0010] Step 3: After the basic scheduling cycle is completed, when the configured interrupt granularity is reached, the AFE chip sends an interrupt signal to the MCU. After receiving the interrupt signal, the MCU reads the data collected by the AFE chip.

[0011] The basic scheduling cycle is enabled / disabled in the following way:

[0012] Start by writing 1 to the register enable bit, and disable by writing 0, using a slow clock and automatic monitoring mode;

[0013] The basic scheduling granularity refers to the configurable minimum measurement granularity unit, and the time length is 62.5mS;

[0014] The basic scheduling cycle refers to the data collection process completed by AFE within a basic scheduling granule;

[0015] Interrupt granularity refers to the number of basic scheduling granules specified by the configuration.

[0016] Preferably, in step 3, when the interrupt granularity is reached, the AFE chip remains in an awake state and waits for the MCU to complete data reading. After the MCU has finished reading the data, it issues an instruction to put the AFE chip into sleep;

[0017] If the interrupt granularity is reached, the AFE chip automatically enters sleep mode and continues to collect data in the next basic scheduling cycle.

[0018] Preferably, whenever the AFE chip detects an overvoltage / undervoltage / overcurrent / short circuit / overtemperature state, the AFE chip immediately issues an interrupt alarm and performs a protection operation.

[0019] Preferably, the interrupt granularity can be configured as 1 / 2 / 4 / 8 / 16 / 32 basic scheduling granules.

[0020] Preferably, the countdown starts from 5 ms after the end of the basic scheduling particle, and if the particle needs a scan operation, it will automatically wake up to perform measurement.

[0021] A storage device stores a plurality of instructions, wherein the instructions are suitable for being loaded by a processor and executing the operations described in the above method.

[0022] A mobile terminal comprises a processor for executing various instructions and a storage device for storing a plurality of instructions, wherein the instructions are suitable for being loaded by the processor and executing the operations described in the above method.

[0023] Beneficial technical effects of the present invention: The present invention provides a new design applied to AFE, in which AFE automatically completes data collection periodically, reports the completion of data collection to MCU through interrupt signal, and then MCU reads relevant data. This saves MCU resources and optimizes the working power consumption of AFE. The scheduling time requirements under different working states can be switched through simple register configuration. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1The present invention is a flowchart of the steps of a method for automatic scheduling of AFE data acquisition based on BMS.

[0025] Figure 2 It is a schematic diagram of the scheduling process of the present invention;

[0026] Figure 3 This is a schematic diagram showing the scheduling function of the present invention. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with embodiments, but the scope of protection claimed in the present invention is not limited to the following specific embodiments.

[0028] like Figure 1 As shown, a BMS-based AFE data acquisition automatic scheduling method is suitable for execution in a computer, and the method includes the following steps:

[0029] Step 1: The AFE chip (Analog Front End) performs current integration (current integration is current collection) according to the current integration granularity number (the current integration granularity number is the granularity number of current collection, and the granularity number refers to the number of basic scheduling particles) configured in register MSR_I (MSR_I is the name of the register) during the entire scheduling time.

[0030] Step 2: If Figure 2 As shown, the AFE chip automatically wakes up 5ms before the end of the previous basic scheduling cycle. After the AFE chip wakes up, the next basic scheduling cycle is started and data measurement and collection are performed;

[0031] The order of AFE chip measurement and collection in any basic scheduling cycle is cell voltage collection, battery pack voltage collection, auxiliary temperature sensor voltage collection, chip temperature collection and battery pack current collection;

[0032] Step 3: After the basic scheduling cycle of the AFE chip is completed, when the configured interrupt granularity is reached, the AFE chip sends an interrupt signal to the MCU. After receiving the interrupt signal, the MCU reads the data collected by the AFE chip.

[0033] The basic scheduling cycle is enabled / disabled in the following way:

[0034] Start by writing 1 to the register enable bit, and disable by writing 0, using a slow clock and automatic monitoring mode;

[0035] The basic scheduling granularity refers to the configurable minimum measurement granularity unit, and the time length is 62.5mS;

[0036] The basic scheduling cycle refers to the data collection process completed by AFE within a basic scheduling granule;

[0037] Interrupt granularity refers to the number of basic scheduling particles specified by the configuration, which can generally be configured as 1 / 2 / 4 / 8 / 16 / 32 basic scheduling particles. When the interrupt granularity is configured as 2 basic scheduling particles, the AFE chip will send an interrupt signal after 2 basic scheduling particles.

[0038] Preferably, in step 3, when the interrupt granularity is reached, the AFE chip remains awake and waits for the MCU to complete data reading, and enters sleep mode when entering the next basic scheduling granularity. After the MCU finishes reading the data, it can also issue an instruction to let the AFE chip quickly enter sleep mode.

[0039] If the interrupt granularity is not reached, the AFE chip automatically enters sleep mode and continues to collect data in the next basic scheduling cycle.

[0040] Preferably, whenever the AFE chip detects an overvoltage / undervoltage / overcurrent / short circuit / overtemperature state, the AFE chip immediately issues an interrupt alarm and suspends the data collection function.

[0041] In each basic scheduling granule, the following operations can be performed:

[0042] Current Analog-to-Digital Converter (Current ADC):

[0043] The current analog-to-digital converter is always collecting current (can be turned off); the current analog-to-digital converter can be configured with a current collection cycle of 1, 2, or 4 basic scheduling particles; the current analog-to-digital converter can store up to 4 particles of data.

[0044] SCAN (SCAN is a centralized operation mode defined by the system, using one command to perform multiple data measurement and collection) measurement:

[0045] The countdown starts from 5ms after the end of the basic scheduling particle. If the particle needs a scan operation, it will automatically wake up for measurement.

[0046] The SCAN operation measures the cell voltage, battery pack voltage, auxiliary temperature sensor voltage, chip temperature, battery pack current in the order and corresponding configuration;

[0047] The alarm flag and result registers are updated synchronously.

[0048] Sleep:

[0049] When the measurement is finished, if no interrupt is issued (the interrupt granularity has been set to be greater than 1), it will automatically enter sleep mode; sleep configuration.

[0050] Interrupt:

[0051] When the basic scheduling granule is finished, an interrupt will be issued according to the configuration. You can choose to issue an interrupt once 1 / 2 / 4 / 8 / 16 / 32 basic scheduling granules are completed;

[0052] After the interrupt is issued, the AFE remains awake and waits until the MCU reads the data and enters the next basic scheduling granule before it can enter sleep mode. If a quick sleep mode is required, the MCU can issue a command to put the AFE into sleep mode immediately after reading the data.

[0053] The scheduling configuration is shown in the following table:

[0054] Table 1

[0055]

[0056]

[0057] Scheduling function display:

[0058] like Figure 3 As shown in the figure, the interrupt granularity is configured as 2 basic scheduling granularities, and it can be seen that:

[0059] An interrupt is sent every 2 basic scheduling particles (Schedule[6:4]=1);

[0060] A SCAN operation is performed once for each basic scheduling particle (Schedule[3:1]=1), that is, one SCAN execution particle is equal to one basic scheduling particle;

[0061] An AUX measurement is performed every 2 SCAN execution particles (Schedule[13:12]=2).

[0062] A storage device stores a plurality of instructions, wherein the instructions are suitable for being loaded by a processor and executing the operations described in the above method.

[0063] A mobile terminal comprises a processor for executing various instructions and a storage device for storing a plurality of instructions, wherein the instructions are suitable for being loaded by the processor and executing the operations described in the above method.

[0064] According to the disclosure and teaching of the above description, those skilled in the art to which the present invention belongs may also make changes and modifications to the above embodiments. Therefore, the present invention is not limited to the specific embodiments disclosed and described above, and some modifications and changes to the invention should also fall within the scope of protection of the claims of the present invention. In addition, although some specific terms are used in this specification, these terms are only for the convenience of description and do not constitute any limitation to the invention.

Claims

1. A BMS-based AFE data acquisition automatic scheduling method, suitable for low-power lithium battery management system, characterized in that: The method comprises the following steps: Step 1: The AFE chip collects current according to the number of current collection granularities configured by the MSR_I register during the entire scheduling time. One current collection cycle corresponds to one basic scheduling granularity. Step 2: 5ms before the end of the previous basic scheduling cycle, the AFE chip automatically wakes up, and after waking up, the next basic scheduling cycle is started and data measurement and collection is performed; The order of AFE chip measurement and collection in any basic scheduling cycle is cell voltage collection, battery pack voltage collection, auxiliary temperature sensor voltage collection, chip temperature collection and battery pack current collection. All measurements can be configured and selected. Step 3: After the basic scheduling cycle is completed, when the configured interrupt granularity is reached, the AFE chip sends an interrupt signal to the MCU. After receiving the interrupt signal, the MCU reads the data collected by the AFE chip. The issuance of this interrupt signal can be configured and selected; The basic scheduling cycle is enabled / disabled in the following way: Write 1 to start by enabling the register enable bit, write 0 to disable, use slow clock, automatic monitoring mode; The basic scheduling granularity refers to the configurable minimum measurement granularity unit, and the time length is 62.5mS; The basic scheduling cycle refers to the data collection process completed by AFE within a basic scheduling granule; Interrupt granularity refers to the number of basic scheduling granules specified by the configuration; In each basic scheduling granule, the following operations can be performed: The current analog-to-digital converter is always collecting current: the current analog-to-digital converter stores up to 4 particles of data; SCAN measurement: starts from the 5ms countdown after the end of the basic scheduling particle. If the particle needs a scan operation, it will automatically wake up for measurement. Sleep: When the measurement is finished, if no interrupt is issued, it will automatically enter sleep; Interrupt: When the basic scheduling granule is completed, an interrupt will be issued according to the configuration. Select 1 / 2 / 4 / 8 / 16 / 32 to issue an interrupt after the basic scheduling granule is completed.

2. The automatic scheduling method for AFE data acquisition based on BMS according to claim 1, characterized in that: In step 3, when the interrupt granularity is reached, the AFE chip remains in an awake state and waits for the MCU to complete data reading. After the MCU has finished reading the data, it issues a command to put the AFE chip into sleep; If the interrupt granularity is not reached and the data reading is completed, the AFE chip automatically enters the sleep mode and continues to collect data in the next basic scheduling cycle.

3. The automatic scheduling method for AFE data acquisition based on BMS according to claim 1, characterized in that: Whenever the AFE chip detects overvoltage / undervoltage / overcurrent / short circuit / overtemperature, it will immediately send out an interrupt alarm and perform protection operations.

4. A storage device, wherein a plurality of instructions are stored in the storage device, characterized in that: The instructions are suitable for being loaded by a processor and executing the method according to any one of claims 1-3.

5. A mobile terminal comprising a processor for executing instructions and a storage device for storing a plurality of instructions, characterized in that: The instructions are suitable for being loaded by the processor and executing the method according to any one of claims 1-3.

Citation Information

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