Method and device for calibrating temperature measuring equipment

Abstract

The present invention provides a calibration method and device for a temperature measuring device, the method comprising: obtaining a first voltage value of a thermopile at a first calibration temperature and a second voltage value at a second calibration temperature, and obtaining a first resistance value of a thermistor at the first calibration temperature and a second resistance value at the second calibration temperature; determining a first sensitivity and a second sensitivity of the thermistor according to the first resistance value and the second resistance value respectively; determining a third sensitivity of the thermopile and a third resistance value of the thermistor at an ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity; calibrating the temperature measuring device according to the third sensitivity and the third resistance value. The present invention does not require the temperature measuring device to be placed in a temperature control device for static use, shortens the calibration time of the temperature measuring device, eliminates the error caused by the difference between the ambient temperature set by the temperature control device and the actual ambient temperature, and improves the calibration accuracy of the temperature measuring device.

Description

Technical Field

[0001] The invention relates to a correction technology for temperature measuring equipment, and in particular to a correction method and device for temperature measuring equipment. Background Art

[0002] Most temperature measuring devices on the market, such as forehead thermometers, ear thermometers, and industrial temperature measuring guns, use non-contact sensors (thermopiles) to measure the infrared energy emitted by the target object to achieve measurement. The sensor consists of two interface components: thermistor and thermopiles. Thermal energy generates a tiny voltage difference through different metal materials in the thermopile. This voltage difference can be converted and sampled by the analog-to-digital converter (ADC) in the microcontroller to infer the temperature of the target object.

[0003] Temperature measuring equipment needs to be calibrated before leaving the factory. Currently, temperature measuring equipment needs to be left at the ambient temperature set in the temperature control device for a period of time (for example, 30 minutes) to complete thermal equilibrium before temperature calibration can be performed.

[0004] When the temperature measuring device is taken out of the temperature control device for calibration, if the room temperature of the production workshop is greatly different from the temperature of the temperature control device, the temperature measuring device will be inaccurately calibrated. It can be seen that the temperature measuring device has the problem of long calibration time and low calibration accuracy. Summary of the invention

[0005] The invention provides a calibration method and device for a temperature measuring device, which are used to solve the problems of long calibration time and low calibration accuracy of the temperature measuring device.

[0006] In one aspect, the present invention provides a method for calibrating a temperature measuring device, comprising:

[0007] Acquire a first voltage value of a thermopile of a temperature measuring device at a first calibration temperature and a second voltage value at a second calibration temperature, and acquire a first resistance value of a thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature;

[0008] determining a first sensitivity of the thermistor according to the first resistance value, and determining a second sensitivity of the thermistor according to the second resistance value;

[0009] Determine a third sensitivity of the thermopile and a third resistance value of the thermistor at a first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity;

[0010] The temperature measuring device is calibrated according to the third sensitivity and the third resistance value.

[0011] In one embodiment, the step of obtaining a first voltage value of a thermopile of a temperature measuring device at a first calibration temperature and a second voltage value at a second calibration temperature, and obtaining a first resistance value of a thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature comprises:

[0012] Controlling the temperature measuring device to measure the black body furnace outputting a first calibration temperature, to obtain a first voltage value of the thermopile at the first calibration temperature and a first resistance value of the thermistor at the first calibration temperature;

[0013] The temperature measuring device is controlled to measure the black body furnace outputting a second calibration temperature to obtain a second voltage value of the thermopile at the second calibration temperature and a second resistance value of the thermistor at the second calibration temperature.

[0014] In one embodiment, the step of determining the first sensitivity of the thermistor according to the first resistance value and determining the second sensitivity of the thermistor according to the second resistance value comprises:

[0015] Obtaining a first mapping table corresponding to the first calibration temperature and a second mapping table corresponding to the second calibration temperature, wherein the first mapping table includes the resistance value and sensitivity of the thermistor at the first calibration temperature, and the second mapping table includes the resistance value and sensitivity of the thermistor at the second calibration temperature;

[0016] The first sensitivity corresponding to the first resistance value is determined in the first mapping table, and the second sensitivity corresponding to the second resistance value is determined in the second mapping table.

[0017] In one embodiment, the step of determining the third sensitivity of the thermopile and the third resistance value of the thermistor at the first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity comprises:

[0018] Determine a first corresponding relationship between the third sensitivity and a second ambient temperature according to the first voltage, the first correction temperature, and a first preset formula, wherein the second ambient temperature is determined according to the first correction temperature;

[0019] Determine a second corresponding relationship between the third sensitivity and a third ambient temperature according to the second voltage, the second correction temperature and a first preset formula, wherein the third ambient temperature is determined according to the second correction temperature;

[0020] Determine a third corresponding relationship between the third resistance value and the second ambient temperature according to the first resistance value, the first sensitivity and a second preset formula;

[0021] Determine a fourth corresponding relationship between the third resistance value and the third ambient temperature according to the second resistance value, the second sensitivity and a second preset formula;

[0022] The third resistance value and the third sensitivity are determined according to the first corresponding relationship, the second corresponding relationship, the third corresponding relationship, and the fourth corresponding relationship.

[0023] In one embodiment, the step of calibrating the temperature measuring device according to the third sensitivity and the third resistance value includes:

[0024] Obtaining a difference between a third resistance value currently determined and a third resistance value determined last time;

[0025] When the difference is less than the preset difference, the sensitivity of the electric thermal pile in the temperature measuring device is updated to the currently determined third sensitivity, and the resistance value of the thermistor in the temperature measuring device is updated to the currently determined third resistance value.

[0026] In one embodiment, after the step of obtaining the difference between the third resistance value currently determined and the third resistance value determined last time, the method further includes:

[0027] When the difference is greater than or equal to the preset difference, determining a fourth resistance value of the thermistor according to the currently determined third sensitivity and a fifth corresponding relationship, wherein the fifth corresponding relationship is determined according to the first corresponding relationship and the third corresponding relationship;

[0028] determining a fourth sensitivity of the thermopile according to the fourth resistance value and a sixth corresponding relationship, wherein the sixth corresponding relationship is determined according to the second corresponding relationship and the fourth corresponding relationship;

[0029] The fourth resistance value is updated to the currently determined third resistance value, and the fourth sensitivity is updated to the currently determined third sensitivity, and the step of obtaining the difference between the currently determined third resistance value and the last determined third resistance value is returned to be executed.

[0030] In one embodiment, after the step of calibrating the temperature measuring device according to the third sensitivity and the third resistance value, the method further includes:

[0031] Acquire a fifth voltage value of the electric heating pile in the temperature measuring device and a fifth resistance value of the thermistor when the temperature measuring device measures the temperature of the target object;

[0032] determining a seventh corresponding relationship between the target temperature of the target object and the current ambient temperature according to the third sensitivity, the fifth voltage value and the first preset formula;

[0033] determining an eighth corresponding relationship between the target temperature and the current ambient temperature according to the third resistance value, the fifth resistance value and a second preset formula;

[0034] The target temperature is determined according to the seventh corresponding relationship and the eighth corresponding relationship.

[0035] In one embodiment, the first calibration temperature and the second calibration temperature are temperatures within a measuring temperature range of the temperature measuring device.

[0036] On the other hand, the present invention also provides a calibration device for a temperature measuring device, comprising:

[0037] An acquisition module, used to acquire a first voltage value of a thermopile of a temperature measuring device at a first calibration temperature and a second voltage value at a second calibration temperature, and to acquire a first resistance value of a thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature;

[0038] a determination module, configured to determine a first sensitivity of the thermistor according to the first resistance value, and to determine a second sensitivity of the thermistor according to the second resistance value;

[0039] The determination module is further configured to determine a third sensitivity of the thermopile and a third resistance value of the thermistor at a first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity;

[0040] A calibration module is used to calibrate the temperature measuring device according to the third sensitivity and the third resistance value.

[0041] On the other hand, the present invention also provides a calibration device for a temperature measuring device, comprising: a memory and a processor;

[0042] The temperature measuring device measures the temperature of the target object through the electric heating pile and the thermistor in the temperature measuring device;

[0043] The memory stores computer-executable instructions;

[0044] The processor executes the computer-executable instructions stored in the memory, so that the processor executes the calibration method of the temperature measuring device as described above.

[0045] On the other hand, the present invention further provides a computer-readable storage medium, in which computer-executable instructions are stored. When the computer-executable instructions are executed by a processor, they are used to implement the calibration method of the temperature measuring device as described above.

[0046] On the other hand, the present invention further provides a computer program product, comprising a computer program, and when the computer program is executed by a processor, the calibration method of the temperature measuring device as described above is implemented.

[0047] The temperature measuring device calibration method and device provided by the present invention obtain a first voltage value of a thermopile of the temperature measuring device at a first calibration temperature and a second voltage value at a second temperature, and obtain a first resistance value of a thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature, and determine a first sensitivity of the thermistor based on the first resistance value, and determine a second sensitivity of the thermistor based on the second resistance value, thereby determining a third sensitivity of the thermopile and a third resistance value of the thermistor at an ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity and the second sensitivity, and finally calibrate the temperature measuring device based on the third sensitivity and the third resistance value. The present invention can calculate the sensitivity of the thermopile and the resistance value of the thermistor at the ambient temperature by measuring the voltage value of the thermopile at the calibration temperature and the resistance value of the thermistor at the calibration temperature in the temperature measuring device. That is, the sensitivity of the thermopile and the resistance value of the thermistor at the ambient temperature can be obtained without placing the temperature measuring device in the temperature control device for static placement, thus shortening the calibration time of the temperature measuring device, eliminating the error caused by the difference between the ambient temperature set by the temperature control device and the actual ambient temperature, and improving the calibration accuracy of the temperature measuring device. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0049] Figure 1 A system architecture diagram of a method for implementing a temperature measurement device calibration method according to the present invention;

[0050] Figure 2 It is a flow chart of a first embodiment of a calibration method for a temperature measuring device according to the present invention;

[0051] Figure 3 It is a flow chart of a second embodiment of a calibration method for a temperature measuring device according to the present invention;

[0052] Figure 4 This is a detailed flow chart of step S10 in the third embodiment of the calibration method for a temperature measuring device of the present invention;

[0053] Figure 5 This is a detailed flow chart of step S20 in the fourth embodiment of the calibration method for a temperature measuring device of the present invention;

[0054] Figure 6 This is a detailed flow chart of step S30 in the fifth embodiment of the calibration method for a temperature measuring device of the present invention;

[0055] Figure 7 It is a schematic diagram of the functional modules of the correction device of the temperature measuring device of the present invention;

[0056] Figure 8 It is a schematic diagram of the hardware structure of the correction device of the temperature measuring equipment of the present invention.

[0057] The above drawings show clear embodiments of the present disclosure, which will be described in more detail below. These drawings and text descriptions are not intended to limit the scope of the present disclosure in any way, but to illustrate the concepts of the present disclosure to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0058] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0059] The present invention provides a method for calibrating a temperature measuring device. Figure 1 The system architecture diagram shown in the figure is implemented. Figure 1As shown, after the black body furnace 100 stably outputs the first calibration temperature, the temperature measuring device 200 measures the temperature of the black body furnace (the dotted line indicates that the temperature measuring device 200 measures the temperature of the black body furnace 100), and obtains the first voltage value of the electric heating pile of the temperature measuring device 200 at the first calibration temperature and the first resistance value of the thermistor of the temperature measuring device 200 at the first calibration temperature; the black body furnace 100 then stably outputs the second calibration temperature, and the temperature measuring device 200 measures the temperature of the black body furnace, thereby obtaining the second voltage value of the electric heating pile at the second calibration temperature and the second resistance value of the thermistor at the second calibration temperature. The temperature measuring device 200 transmits the first resistance value, the second resistance value, the first voltage value and the second voltage value to the calibration device 300 of the temperature measuring device, or the calibration personnel reads the first resistance value, the second resistance value, the first voltage value and the second voltage value from the temperature measuring device 200, and inputs the first resistance value, the second resistance value, the first voltage value and the second voltage value into the calibration device 300 of the temperature measuring device. The temperature measuring device calibration device 300 can calibrate the temperature measuring device based on the first voltage value, the second voltage value, the first resistance value and the second resistance value. The temperature measuring device 200 can be a forehead thermometer or an ear thermometer for measuring human body temperature, and the temperature measuring device 200 can also be an industrial temperature measuring gun.

[0060] In the prior art, the calibration of the temperature measuring device requires the calibration of thermistors and thermopiles. For the calibration of thermistors, the temperature measuring device needs to be placed in a temperature control device with the ambient temperature set and allowed to stand for about 30 minutes, so that the temperature measuring device can be calibrated after thermal equilibrium is completed. According to the use environment requirements of the temperature measuring device, the ambient temperature can be 25°C or three calibration temperatures, and the three calibration temperatures are 10°C, 25°C and 40°C, that is, the temperature measuring device needs to stand in the temperature control device for 30 minutes or 90 minutes. When the temperature measuring device is taken out of the temperature control device for calibration operation, if the difference between the room temperature of the calibration environment and the ambient temperature set by the temperature control device is large, it will affect the calibration accuracy. In addition, the calibration of the temperature measuring device needs to be completed quickly, that is, the shorter the time for the temperature measuring device to perform the calibration operation, the better. If the calibration personnel are not proficient in the calibration operation, the calibration time will increase, resulting in low calibration accuracy of the temperature measuring device.

[0061] In addition, when the temperature measuring device performs thermopile calibration, it is necessary to set calibration points through a black body furnace or a constant temperature water bath (a constant temperature water bath is a type of temperature control device) to calibrate the parameters, and a large amount of memory is required for recording. For example, a negative temperature coefficient thermistor impedance and temperature curve mapping table, as well as a thermopile voltage and temperature curve mapping table are required for parameter calibration. It can be seen that the calibration device of the temperature measuring device needs to store a lengthy mapping table for calibration, which increases the calibration cost.

[0062] The calibration method of the temperature measuring device provided by the present invention aims to solve the problems existing in the prior art, which include the problem that the calibration of the thermistor requires too long a static standing time, the problem that the temperature measuring device is taken out of the temperature control device for too short an operating time, and the large storage capacity consumed by the thermistor parameters and the thermopile parameters.

[0063] The following specific embodiments are used to describe in detail the technical solutions of the present invention and how the technical solutions of the present application solve the above-mentioned technical problems. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present invention will be described below in conjunction with the accompanying drawings.

[0064] Reference Figure 2 , Figure 2 The first embodiment of the calibration method of the temperature measuring device of the present invention comprises the following steps:

[0065] Step S10, obtaining a first voltage value of the thermopile of the temperature measuring device at a first calibration temperature and a second voltage value at a second calibration temperature, and obtaining a first resistance value of the thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature.

[0066] In this embodiment, the execution subject is a calibration device of the temperature measuring device. For the convenience of description, the term "device" is used below to refer to the calibration device of the temperature measuring device. The temperature measuring device has a measuring temperature range. When the temperature measuring device is calibrated, it is necessary to determine the first calibration temperature and the second calibration temperature within the measuring temperature range, that is, the first calibration temperature and the second calibration temperature are temperatures within the measuring temperature range of the measuring device. For example, if the temperature measuring device is a forehead thermometer, then the temperature measuring device is a device for measuring human body temperature, and the temperature of the human body is 35°C to 41°C, that is, the measuring temperature range of the temperature measuring device is 35°C to 41°C. The first calibration temperature can be set to 35°C, and the second calibration temperature can be set to 41°C. Of course, the first calibration temperature and the second calibration temperature can be any temperature between 35°C and 41°C.

[0067] The temperature measuring device is provided with a thermopile and a thermistor. When measuring an object with a first calibration temperature, the temperature measuring device records a first voltage value of the thermopile and a first resistance value of the thermistor. For example, if the first calibration temperature is 35°C, the first voltage value is recorded as V ther35 , the first resistance value is recorded as R amb35 When the temperature measuring device measures an object with a second calibration temperature, it records the second voltage value of the thermopile and the second resistance value of the thermistor. For example, if the second calibration temperature is 41°C, the second voltage value is recorded as V ther41 , the second resistance value is recorded as R amb41 .

[0068] The first resistance value, the second resistance value, the first voltage value and the second voltage value can be stored in the device in advance, and when calibration is required, the device extracts the first voltage value, the second voltage value, the first resistance value and the second resistance value.

[0069] In step S20 , a first sensitivity of the thermistor may be mapped and determined according to the first resistance value, and a second sensitivity of the thermistor may be mapped and determined according to the second resistance value.

[0070] Thermistors have corresponding sensitivities at different temperatures, and the sensitivity of thermistors is related to the resistance value of thermistors at the temperature. The device can measure the resistance value of thermistors at different temperatures, and then calculate the sensitivity of thermistors at different temperatures through the measured resistance value, and then build a mapping relationship between temperature, resistance value of thermistors and sensitivity of thermistors based on temperature, resistance value and sensitivity, and store the mapping relationship.

[0071] After obtaining the first resistance value and the second resistance value, the device can determine the first sensitivity of the thermistor based on the first resistance value, the first correction temperature and the mapping relationship, and then determine the second sensitivity of the thermistor through the second resistance value, the second correction temperature and the mapping relationship.

[0072] Step S30, determining a third sensitivity of the thermopile and a third resistance value of the thermistor at the first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity and the second sensitivity.

[0073] The device stores the mapping relationship between the resistance value of the thermistor, the sensitivity of the thermopile, the resistance value of the thermistor at the calibration temperature, and the voltage value of the thermopile at the calibration temperature. Based on the first voltage value, the first resistance value, the first sensitivity, and the mapping relationship, the device can determine the first relationship between the resistance value of the thermistor and the sensitivity of the thermopile; based on the second voltage value, the second resistance value, the second sensitivity, and the mapping relationship, the device can determine the second relationship between the resistance value of the thermistor and the sensitivity of the thermopile, thereby obtaining the third sensitivity of the thermopile and the third resistance value of the thermistor at the first ambient temperature based on the first relationship and the second relationship. The first ambient temperature can be understood as the temperature at which the temperature measuring device is placed on the temperature control device in the prior art. For example, the first ambient temperature is 25°C.

[0074] It should be noted that the single-chip microcomputer in the device has been upgraded from the previous 8-bit MCU to a 32-bit MCU, and the operating frequency has been increased from the previous 2MHz to 48MHz or 72MHz, so that the single-chip microcomputer of the device can quickly calculate and solve the simultaneous equations (the simultaneous equations of the first relationship and the second relationship) to obtain the third sensitivity of the thermopile and the third resistance value of the thermistor at the first ambient temperature.

[0075] Step S40: calibrate the temperature measuring device according to the third sensitivity and the third resistance value.

[0076] After obtaining the third sensitivity and the third resistance value, the device can replace the sensitivity of the thermopile and the resistance value of the thermistor stored in the temperature measuring device, thereby completing the calibration of the temperature measuring device.

[0077] In this embodiment, the calibration of the temperature measuring device does not need to use a negative temperature coefficient thermistor impedance to temperature curve mapping table or a thermopile voltage to temperature curve mapping table, so there is no need to store lengthy mapping tables, which saves memory space and reduces the cost of the calibration system. At the same time, there is no need to place the temperature measuring device in a temperature control device that has been set to an ambient temperature, which eliminates the static time of the temperature measuring device, shortens the calibration time of the temperature measuring device, and avoids the problem of calibration errors caused by the temperature measuring device being taken out of the temperature control device and placed at an actual temperature with a large temperature difference. In addition, when calibrating the temperature measuring device, there is no need to place the temperature measuring device in a temperature control device that has been set to an ambient temperature, so that there is no requirement for the calibration time of the temperature measuring device, that is, the calibration of the temperature measuring device does not require the operating proficiency of the calibration personnel.

[0078] In the technical solution provided in this embodiment, a first voltage value of the thermopile of the temperature measuring device at the first calibration temperature and a second voltage value at the second temperature are obtained, and a first resistance value of the thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature are obtained, and a first sensitivity of the thermistor is determined based on the first resistance value, and a second sensitivity of the thermistor is determined based on the second resistance value, so that a third sensitivity of the thermopile and a third resistance value of the thermistor at the first ambient temperature are determined according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity and the second sensitivity, and finally the temperature measuring device is calibrated based on the third sensitivity of the thermopile and the third resistance value of the thermistor at the first ambient temperature. The present invention can calculate the sensitivity of the thermopile and the resistance value of the thermistor at the ambient temperature by measuring the voltage value of the thermopile at the calibration temperature and the resistance value of the thermistor at the calibration temperature in the temperature measuring device. That is, the sensitivity of the thermopile and the resistance value of the thermistor at the ambient temperature can be obtained without placing the temperature measuring device in the temperature control device for static placement, thus shortening the calibration time of the temperature measuring device, eliminating the error caused by the difference between the ambient temperature set by the temperature control device and the actual ambient temperature, and improving the calibration accuracy of the temperature measuring device.

[0079] Reference Figure 3 , Figure 3 The second embodiment of the calibration method for a temperature measuring device is based on the first embodiment, and step S10 includes:

[0080] Step S11, controlling the temperature measuring device to measure the black body furnace outputting the first calibration temperature, to obtain a first voltage value of the thermopile at the first calibration temperature and a first resistance value of the thermistor at the first calibration temperature.

[0081] Step S12, controlling the temperature measuring device to measure the black body furnace outputting the second calibration temperature, to obtain a second voltage value of the thermopile at the second calibration temperature and a second resistance value of the thermistor at the second calibration temperature.

[0082] In this embodiment, a black body furnace is used to output a correction temperature. First, the black body furnace is controlled to output a first correction temperature, and when the black body furnace stably outputs the first correction temperature, the temperature measuring device can be controlled to measure the black body furnace, and the device can obtain the first voltage value of the thermopile at the first correction temperature and the first resistance value of the thermistor at the first correction temperature. The black body furnace stably outputs the first correction temperature means that the difference between each temperature output by the black body furnace in the current time period and the first correction temperature is small, that is, each difference is less than the preset difference, and the preset difference is a small value, for example, 0.2°C.

[0083] Control the blackbody furnace to output the second calibration temperature, that is, adjust the power of the blackbody furnace so that the temperature output by the blackbody furnace to the outside is the second calibration temperature. When the blackbody furnace stably outputs the second calibration temperature, the temperature measuring device can be controlled to measure the blackbody furnace, and then the second voltage value of the thermopile at the second calibration temperature and the second resistance value of the thermistor at the second calibration temperature can be detected. The blackbody furnace stably outputs the second calibration temperature, which means that the difference between each temperature output by the blackbody furnace in the current time period and the second calibration temperature is small, that is, each difference is less than the preset difference, and the preset difference is a small value, for example, 0.2°C. Of course, it can be determined based on time whether the blackbody furnace stably outputs the calibration temperature. For example, after setting the calibration temperature and power, the blackbody furnace can stably output the calibration temperature after running for 10 minutes.

[0084] In addition, two black body furnaces may be used, one black body furnace outputting a first correction temperature and the other black body furnace outputting a second correction temperature, thereby saving waiting time for stable correction temperature output.

[0085] In the technical solution provided in this embodiment, the device measures the blackbody furnace that outputs the first correction temperature and the second correction temperature by controlling the temperature measuring device to accurately obtain the first voltage value, the second voltage value, the first resistance and the second resistance value.

[0086] Reference Figure 4 , Figure 4 The third embodiment of the calibration method of the temperature measuring device is based on the first or second embodiment, and step S20 includes:

[0087] Step S21, obtaining a first mapping table corresponding to a first calibration temperature and a second mapping table corresponding to a second calibration temperature, wherein the first mapping table includes the resistance value and sensitivity of the thermistor at the first calibration temperature, and the second mapping table includes the resistance value and sensitivity of the thermistor at the second calibration temperature.

[0088] Step S22, determining a first sensitivity corresponding to a first resistance value in a first mapping table, and determining a second sensitivity corresponding to a second resistance value in a second mapping table.

[0089] In this embodiment, a plurality of mapping tables are stored in the device, and each mapping table corresponds to the resistance value and sensitivity of a thermistor measured at a calibration temperature.

[0090] The device obtains a first mapping table based on a first calibration temperature, the first mapping table including the resistance value and sensitivity of the thermistor at the first calibration temperature; the device determines a second mapping table corresponding to a second calibration temperature, the second mapping table including the resistance value and sensitivity of the thermistor at the second calibration temperature.

[0091] The device can find the first resistance value corresponding to the first resistance value of the thermistor at the first calibration temperature in the first mapping table, and can find the second sensitivity corresponding to the second resistance value of the thermistor at the second calibration temperature in the second mapping table.

[0092] In the technical solution provided in this embodiment, a mapping table of the resistance value and sensitivity of the thermistor at different temperatures is stored in the device, so that the first sensitivity of the thermistor is accurately determined in the mapping table based on the first correction temperature and the first resistance value, and the second sensitivity of the thermistor is accurately determined in the mapping table through the second correction temperature and the second resistance value.

[0093] Reference Figure 5 , Figure 5 This is a fourth embodiment of the calibration method of the temperature measuring device of the present invention, based on any one of the first to third embodiments, step S30 includes:

[0094] Step S31, determining a first corresponding relationship between a third sensitivity and a second ambient temperature according to the first voltage, the first correction temperature and a first preset formula, wherein the second ambient temperature is determined according to the first correction temperature.

[0095] In this embodiment, the sensitivity K value of the thermopile can be provided by the manufacturer of the thermopile, but the K value of each thermopile is different. The K value provided by the manufacturer is significantly different from the actual K value. Therefore, the temperature measurement device needs to calibrate the sensitivity of the thermopile.

[0096] Based on the Seebeck effect and the Stefan-Boltzmann law, the mathematical model of the thermopile in a good temperature measurement device is characterized by a first preset formula, which is:

[0097]

[0098] Among them, V ther is the output voltage of the Thermopile, T obj is the target temperature, T amb is the ambient temperature, and K is the sensitivity of the thermopile.

[0099] The mathematical model of thermistor in a good temperature measuring device is characterized by a second preset formula, which is:

[0100]

[0101] Among them, R amb is the resistance value of the thermistor at ambient temperature, R refis the resistance value of the thermistor at the reference ambient temperature, T amb is the ambient temperature, T ref is the reference ambient temperature and Beta is the sensitivity of the thermistor.

[0102] After obtaining the first voltage, the second voltage, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity, the device substitutes the first voltage and the first correction temperature into the first preset formula, and the first correction temperature can be regarded as the target temperature in the first preset formula. Taking the first correction temperature as 35°C as an example, the first voltage and the first correction temperature are substituted into the first preset formula to obtain the first corresponding relationship between the third sensitivity of the thermopile and the second ambient temperature. The first corresponding relationship is:

[0103] V ther35 =K×{(35+273.15) 4 -(T amb35 +273.15) 4}-----(3)

[0104] Among them, V ther35 is the first voltage, K is the third sensitivity of the thermopile, T amb35 is the second ambient temperature, which is determined according to the first correction temperature. For example, T amb35 The subscript 35 in is the first correction temperature.

[0105] Step S32, determining a second corresponding relationship between a third sensitivity of the thermopile and a third ambient temperature according to the second voltage, the second correction temperature and the first preset formula, wherein the third ambient temperature is determined according to the second correction temperature.

[0106] The device substitutes the second voltage and the second correction temperature into the first preset formula, and the second correction temperature can be regarded as the target temperature in the first preset formula. Taking the second correction temperature of 41°C as an example, the second voltage and the second correction temperature are substituted into the first preset formula to obtain the second corresponding relationship between the third sensitivity of the thermopile and the third ambient temperature. The second corresponding relationship is:

[0107] V ther41 =K×{(41+273.15) 4 -(T amb41 +273.15) 4}-----(4)

[0108] Among them, V ther41 is the first voltage, K is the third sensitivity of the thermopile, T amb41 is the third ambient temperature, which is determined according to the third correction temperature. For example, T amb41 The subscript 41 in is the second correction temperature.

[0109] Step S33, determining a third corresponding relationship between the third resistance value and the second ambient temperature according to the first resistance value, the first sensitivity and the second preset formula.

[0110] The device substitutes the first resistance value and the first sensitivity into the second preset formula, and the first correction temperature can be regarded as the target temperature in the second preset formula. Taking the first correction temperature as 35°C as an example, the first resistance value and the first sensitivity are substituted into the second preset formula to obtain the third corresponding relationship between the third resistance value of the thermistor and the second ambient temperature. The third corresponding relationship is:

[0111]

[0112] Among them, R amb35 is the first resistance value, R ref25 is the third resistance value of the thermistor at the first ambient temperature, T amb35 is the second ambient temperature.

[0113] In order to find the second ambient temperature T amb35 , Formula 5 can be transformed by transposition to obtain the third corresponding relationship:

[0114]

[0115] Step S34, determining a fourth corresponding relationship between the third resistance value and the third ambient temperature according to the second resistance value, the second sensitivity and the second preset formula.

[0116] The device substitutes the second resistance value and the second sensitivity into the second preset formula, and the second correction temperature can be regarded as the target temperature in the second preset formula. Taking the second correction temperature of 41°C as an example, the second resistance value and the second sensitivity are substituted into the second preset formula to obtain the fourth corresponding relationship between the third resistance value and the second ambient temperature. The fourth corresponding relationship is:

[0117]

[0118] Among them, R amb41 is the first resistance value, R ref25 is the third resistance value of the thermistor at the first ambient temperature, T amb41 is the third ambient temperature.

[0119] In order to find the third ambient temperature T amb41 , Formula 6 can be transformed by transposition to obtain the fourth corresponding relationship:

[0120]

[0121] Step S35 , determining the third resistance value and the third sensitivity according to the first corresponding relationship, the second corresponding relationship, the third corresponding relationship and the fourth corresponding relationship.

[0122] The first corresponding relationship is the corresponding relationship between the third sensitivity and the second ambient temperature, and the first corresponding relationship specifically refers to Formula 3; the second corresponding relationship is the corresponding relationship between the third sensitivity and the third ambient temperature, and the second corresponding relationship specifically refers to Formula 4; the third corresponding relationship is the corresponding relationship between the third resistance value and the second ambient temperature, and the third corresponding relationship specifically refers to Formula 5 or Formula 7; the fourth corresponding relationship is the corresponding relationship between the third resistance value and the third ambient temperature, and the fourth corresponding relationship specifically refers to Formula 6 or Formula 8; It can be seen that the four corresponding relationships constitute a quaternary linear equation of the third resistance value, the third sensitivity, the second ambient temperature, and the third ambient temperature. The device can perform equation combination based on the four corresponding relationships to calculate the third resistance value and the third sensitivity. For example, Formula 7 (the third corresponding relationship) can be substituted into Formula 3 (the first corresponding relationship), and Formula 8 (the fourth corresponding relationship) can be substituted into Formula 4 (the second corresponding relationship) to obtain the equation group:

[0123]

[0124]

[0125] The third resistance value R of the thermistor can be solved by formula 9 and formula 10. ref25 and a third sensitivity K of the thermopile.

[0126] In the technical solution provided in this embodiment, the device obtains a group of equations consisting of four corresponding relationships based on the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, the second sensitivity, the first correction temperature and the second correction temperature, and then accurately determines the third resistance value of the thermistor and the third sensitivity of the thermopile based on the group of equations.

[0127] Reference Figure 6 , Figure 6 This is a fifth embodiment of the calibration method of the temperature measuring device of the present invention. Based on the fourth embodiment, step S40 includes:

[0128] Step S41, obtaining a difference between a third resistance value currently determined and a third resistance value determined last time.

[0129] Step S42, when the difference is less than the preset difference, the sensitivity of the electric heating pile in the temperature measuring device is updated to the currently determined third sensitivity, and the resistance value of the thermistor in the temperature measuring device is updated to the currently determined third resistance value.

[0130] In this embodiment, after obtaining the third resistance value and the third sensitivity, the device needs to compare the currently determined third resistance value with the third resistance value determined last time to determine whether an error occurs in the calculation process, that is, the device calculates the third resistance and the third sensitivity in the temperature measuring device multiple times, and only when the difference between the two adjacent third resistance values ​​is small, can it be determined that the currently determined third resistance value and the currently determined third sensitivity are accurate.

[0131] In this regard, the device obtains the difference between the third resistance value currently determined and the third resistance value determined last time, and determines whether the difference is less than a preset difference. The preset difference is a smaller difference, for example, the preset difference is 0.0005. If the difference is less than the preset difference, the sensitivity of the electric heating pile of the temperature measuring device is updated to the third sensitivity currently determined, and the resistance value of the thermistor is updated to the third resistance value currently determined, thereby completing the calibration of the temperature measuring device.

[0132] If the difference is greater than or equal to the preset difference, it can be determined that the third resistance value and the third sensitivity of the last measurement or the current measurement have a calculation error. The device substitutes the currently determined third sensitivity into the fifth corresponding relationship to determine the fourth resistance value of the thermistor. The fifth corresponding relationship is determined based on the first corresponding relationship and the third corresponding relationship, and the fifth corresponding relationship is the above formula 9. The device then substitutes the currently determined fourth resistance value into the sixth corresponding relationship to determine the fourth sensitivity of the thermopile. The sixth corresponding relationship is determined based on the second corresponding relationship and the fourth corresponding relationship, and the sixth corresponding relationship is the above formula 10.

[0133] The device updates the fourth resistance value to the currently determined third resistance value, and updates the fourth sensitivity to the third sensitivity, and returns to execute step S41, that is, it is determined again whether the difference between the currently determined third resistance value and the last determined third resistance value is less than the preset difference. Thus, the third resistance value and the third sensitivity with a smaller error can be obtained to complete the calibration of the temperature measuring device.

[0134] In the technical solution provided in this embodiment, the device obtains the difference between the currently determined third resistance value and the last determined third resistance value, and when the difference is less than the preset difference, updates the sensitivity of the electric heating pile in the temperature measuring device to the currently determined third sensitivity, and updates the resistance value of the thermistor to the third resistance value, thereby accurately completing the calibration of the temperature measuring device.

[0135] In one embodiment, after step S40, the method further includes:

[0136] A fifth voltage value of the electric heating pile in the temperature measuring device and a fifth resistance value of the thermistor are obtained when the temperature measuring device measures the temperature of the target object.

[0137] A seventh corresponding relationship between the target temperature of the target object and the current ambient temperature is determined according to the third sensitivity, the fifth voltage value, and the first preset formula.

[0138] An eighth corresponding relationship between the target temperature and the current ambient temperature is determined according to the third resistance value, the fifth resistance value and the second preset formula.

[0139] The target temperature is determined according to the seventh corresponding relationship and the eighth corresponding relationship.

[0140] In this embodiment, after the temperature measuring device completes the calibration, the temperature measuring device can perform normal temperature measurement. Specifically, the device obtains the fifth voltage value of the electric heating pile and the fifth resistance value of the thermistor when the temperature measuring device measures the temperature of the target object, and then substitutes the third sensitivity and the fifth voltage value into the first preset formula to obtain the seventh corresponding relationship between the target temperature of the target object and the current ambient temperature. The device then substitutes the third resistance value and the fifth resistance value into the second preset formula to obtain the eighth corresponding relationship. Based on the seventh corresponding relationship and the eighth corresponding relationship, the device can accurately obtain the target temperature T obj .

[0141] The present invention also provides a calibration device for a temperature measuring device, referring to Figure 7 , the calibration device 700 of the temperature measuring device comprises:

[0142] An acquisition module 701 is used to acquire a first voltage value of a thermopile of a temperature measuring device at a first calibration temperature and a second voltage value at a second calibration temperature, and to acquire a first resistance value of a thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature;

[0143] A determination module 702, configured to determine a first sensitivity of the thermistor according to the first resistance value, and to determine a second sensitivity of the thermistor according to the second resistance value;

[0144] A determination module 702, configured to determine a third sensitivity of the thermopile and a third resistance value of the thermistor at a first ambient temperature according to the first voltage value, the second voltage value, the first resistance value, the second resistance value, the first sensitivity, and the second sensitivity;

[0145] The calibration module 703 is used to calibrate the temperature measuring device according to the third sensitivity and the third resistance value.

[0146] In one embodiment, the calibration device 700 of the temperature measuring device includes:

[0147] A control module, used for controlling the temperature measuring device to measure the black body furnace outputting the first calibration temperature, to obtain a first voltage value of the thermopile at the first calibration temperature and a first resistance value of the thermistor at the first calibration temperature;

[0148] The control module is used to control the temperature measuring device to measure the black body furnace outputting the second calibration temperature to obtain the second voltage value of the thermopile at the second calibration temperature and the second resistance value of the thermistor at the second calibration temperature.

[0149] In one embodiment, the calibration device 700 of the temperature measuring device includes:

[0150] An acquisition module 701 is used to acquire a first mapping table corresponding to a first calibration temperature and a second mapping table corresponding to a second calibration temperature, wherein the first mapping table includes a resistance value and a sensitivity of the thermistor at the first calibration temperature, and the second mapping table includes a resistance value and a sensitivity of the thermistor at the second calibration temperature;

[0151] The determination module 702 is configured to determine a first sensitivity corresponding to a first resistance value in a first mapping table, and to determine a second sensitivity corresponding to a second resistance value in a second mapping table.

[0152] In one embodiment, the calibration device 700 of the temperature measuring device includes:

[0153] A determination module 702, configured to determine a first corresponding relationship between a third sensitivity and a second ambient temperature according to the first voltage, the first correction temperature and a first preset formula, wherein the second ambient temperature is determined according to the first correction temperature;

[0154] A determination module 702, configured to determine a second corresponding relationship between a third sensitivity and a third ambient temperature according to the second voltage, the second correction temperature and a first preset formula, wherein the third ambient temperature is determined according to the second correction temperature;

[0155] A determination module 702, configured to determine a third corresponding relationship between a third resistance value and a second ambient temperature according to the first resistance value, the first sensitivity and a second preset formula;

[0156] A determination module 702, configured to determine a fourth corresponding relationship between a third resistance value and a third ambient temperature according to the second resistance value, the second sensitivity and a second preset formula;

[0157] The determination module 702 is used to determine the third resistance value and the third sensitivity according to the first corresponding relationship, the second corresponding relationship, the third corresponding relationship and the fourth corresponding relationship.

[0158] In one embodiment, the calibration device 700 of the temperature measuring device includes:

[0159] An acquisition module 701 is used to acquire a difference between a third resistance value currently determined and a third resistance value determined last time;

[0160] The updating module is used to update the sensitivity of the electric heating pile in the temperature measuring device to the currently determined third sensitivity and update the resistance value of the thermistor in the temperature measuring device to the currently determined third resistance value when the difference is less than the preset difference.

[0161] In one embodiment, the calibration device 700 of the temperature measuring device includes:

[0162] A determination module 702, configured to determine a fourth resistance value of the thermistor according to the currently determined third sensitivity and a fifth corresponding relationship when the difference is greater than or equal to a preset difference, wherein the fifth corresponding relationship is determined according to the first corresponding relationship and the third corresponding relationship;

[0163] A determination module 702, configured to determine a fourth sensitivity of the thermopile according to the fourth resistance value and a sixth corresponding relationship, wherein the sixth corresponding relationship is determined according to the second corresponding relationship and the fourth corresponding relationship;

[0164] An updating module is used to update the fourth resistance value to the currently determined third resistance value, and update the fourth sensitivity to the currently determined third sensitivity, and return to execute the step of obtaining the difference between the currently determined third resistance value and the last determined third resistance value.

[0165] In one embodiment, the calibration device 700 of the temperature measuring device includes:

[0166] An acquisition module 701 is used to acquire a fifth voltage value of the electric heating pile and a fifth resistance value of the thermistor in the temperature measuring device when the temperature measuring device measures the temperature of the target object;

[0167] A determination module 702, configured to determine a seventh corresponding relationship between a target temperature of the target object and a current ambient temperature according to the third sensitivity, the fifth voltage value and the first preset formula;

[0168] A determination module 702, configured to determine an eighth corresponding relationship between the target temperature and the current ambient temperature according to the third resistance value, the fifth resistance value and the second preset formula;

[0169] The determination module 702 is configured to determine the target temperature according to the seventh corresponding relationship and the eighth corresponding relationship.

[0170] Figure 8 The invention is a block diagram of a correction device for a temperature measuring device according to an exemplary embodiment.

[0171] The calibration device of the temperature measuring device may include: a processor 81, such as a CPU, a memory 82 and a transceiver 83. Those skilled in the art will understand that Figure 8The structure shown in the figure does not constitute a limitation on the correction device of the temperature measuring device, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently. The memory 82 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0172] The processor 81 can call the computer program stored in the memory 82 to complete all or part of the steps of the above-mentioned temperature measurement device calibration method.

[0173] The transceiver 83 is used to receive information sent by an external device and send information to the external device.

[0174] A non-transitory computer-readable storage medium, when the instructions in the storage medium are executed by a processor of a correction device of a temperature measuring device, enables the correction device of the temperature measuring device to execute the correction method of the temperature measuring device.

[0175] A computer program product comprises a computer program. When the computer program is executed by a processor of a correction device of a temperature measuring device, the correction device of the temperature measuring device can execute the correction method of the temperature measuring device.

[0176] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. The present invention is intended to cover any variations, uses or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are to be regarded as exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0177] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A method for calibrating a temperature measuring device, characterized in that: include: Acquire a first voltage value of a thermopile of a temperature measuring device at a first calibration temperature and a second voltage value at a second calibration temperature, and acquire a first resistance value of a thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature; Determining a first sensitivity of the thermistor according to the first resistance value at the first calibration temperature and a preset mapping table, and determining a second sensitivity of the thermistor according to the second resistance value at the second calibration temperature and the mapping table; the mapping table stores a mapping relationship between calibration temperature, resistance value of the thermistor and sensitivity of the thermistor; determining a first corresponding relationship between a third sensitivity of the thermopile and a second ambient temperature according to the first voltage value, the first correction temperature, and a first preset formula, wherein the second ambient temperature is determined according to the first correction temperature; determining a second corresponding relationship between a third sensitivity of the thermopile and a third ambient temperature according to the second voltage value, the second correction temperature and a first preset formula, wherein the third ambient temperature is determined according to the second correction temperature; Determine a third corresponding relationship between a third resistance value of the thermistor at the first ambient temperature and the second ambient temperature according to the first resistance value, the first sensitivity and a second preset formula; Determine a fourth corresponding relationship between a third resistance value of the thermistor at the first ambient temperature and the third ambient temperature according to the second resistance value, the second sensitivity and a second preset formula; Determine a third resistance value of the thermistor at a first ambient temperature and a third sensitivity of the thermopile according to a set of equations formed by the first corresponding relationship, the second corresponding relationship, the third corresponding relationship and the fourth corresponding relationship; the first ambient temperature is a temperature at which the temperature control device places the temperature measuring device; The temperature measuring device is calibrated according to the third sensitivity and the third resistance value.

2. The calibration method of the temperature measuring device according to claim 1, characterized in that: The step of obtaining a first voltage value of a thermopile of a temperature measuring device at a first calibration temperature and a second voltage value at a second calibration temperature, and obtaining a first resistance value of a thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature comprises: Controlling the temperature measuring device to measure the black body furnace outputting a first calibration temperature, to obtain a first voltage value of the thermopile at the first calibration temperature and a first resistance value of the thermistor at the first calibration temperature; The temperature measuring device is controlled to measure the black body furnace outputting a second calibration temperature to obtain a second voltage value of the thermopile at the second calibration temperature and a second resistance value of the thermistor at the second calibration temperature.

3. The calibration method of the temperature measuring device according to claim 1, characterized in that: The step of determining the first sensitivity of the thermistor according to the first resistance value at the first calibration temperature and a preset mapping table, and determining the second sensitivity of the thermistor according to the second resistance value at the second calibration temperature and the mapping table comprises: Obtaining a first mapping table corresponding to the first calibration temperature and a second mapping table corresponding to the second calibration temperature, wherein the first mapping table includes the resistance value and sensitivity of the thermistor at the first calibration temperature, and the second mapping table includes the resistance value and sensitivity of the thermistor at the second calibration temperature; The first sensitivity corresponding to the first resistance value is determined in the first mapping table, and the second sensitivity corresponding to the second resistance value is determined in the second mapping table.

4. The calibration method of the temperature measuring device according to claim 1, characterized in that: The step of calibrating the temperature measuring device according to the third sensitivity and the third resistance value comprises: Obtaining a difference between a third resistance value currently determined and a third resistance value determined last time; When the difference is less than the preset difference, the sensitivity of the electric thermal pile in the temperature measuring device is updated to the currently determined third sensitivity, and the resistance value of the thermistor in the temperature measuring device is updated to the currently determined third resistance value.

5. The calibration method of the temperature measuring device according to claim 4, characterized in that: After the step of obtaining the difference between the third resistance value currently determined and the third resistance value determined last time, the method further includes: When the difference is greater than or equal to the preset difference, determining a fourth resistance value of the thermistor according to the currently determined third sensitivity and a fifth corresponding relationship, wherein the fifth corresponding relationship is determined according to the first corresponding relationship and the third corresponding relationship; determining a fourth sensitivity of the thermopile according to the fourth resistance value and a sixth corresponding relationship, wherein the sixth corresponding relationship is determined according to the second corresponding relationship and the fourth corresponding relationship; The fourth resistance value is updated to the currently determined third resistance value, and the fourth sensitivity is updated to the currently determined third sensitivity, and the step of obtaining the difference between the currently determined third resistance value and the last determined third resistance value is returned to be executed.

6. The calibration method of the temperature measuring device according to any one of claims 1 to 5, characterized in that: After the step of calibrating the temperature measuring device according to the third sensitivity and the third resistance value, the method further includes: Acquire a fifth voltage value of the electric heating pile in the temperature measuring device and a fifth resistance value of the thermistor when the temperature measuring device measures the temperature of the target object; determining a seventh corresponding relationship between the target temperature of the target object and the current ambient temperature according to the third sensitivity, the fifth voltage value and the first preset formula; determining an eighth corresponding relationship between the target temperature and the current ambient temperature according to the third resistance value, the fifth resistance value and a second preset formula; The target temperature is determined according to the seventh corresponding relationship and the eighth corresponding relationship.

7. The method for calibrating a temperature measuring device according to any one of claims 1 to 5, characterized in that: The first correction temperature and the second correction temperature are temperatures within the measuring temperature range of the temperature measuring device.

8. A calibration device for a temperature measuring device, characterized in that: include: An acquisition module, used to acquire a first voltage value of a thermopile of a temperature measuring device at a first calibration temperature and a second voltage value at a second calibration temperature, and to acquire a first resistance value of a thermistor of the temperature measuring device at the first calibration temperature and a second resistance value at the second calibration temperature; a determination module, configured to determine a first sensitivity of the thermistor according to the first resistance value at the first calibration temperature and a preset mapping table, and to determine a second sensitivity of the thermistor according to the second resistance value at the second calibration temperature and the mapping table; The determination module is further used to determine a first corresponding relationship between a third sensitivity of the thermopile and a second ambient temperature according to the first voltage value, the first correction temperature and a first preset formula, the second ambient temperature being determined according to the first correction temperature; determine a second corresponding relationship between a third sensitivity of the thermopile and a third ambient temperature according to the second voltage value, the second correction temperature and a first preset formula, the third ambient temperature being determined according to the second correction temperature; determine a third corresponding relationship between a third resistance value of the thermistor at the first ambient temperature and the second ambient temperature according to the first resistance value, the first sensitivity and a second preset formula; Determine a fourth corresponding relationship between the third resistance value of the thermistor at the first ambient temperature and the third ambient temperature according to the second resistance value, the second sensitivity and a second preset formula; determine the third resistance value of the thermistor at the first ambient temperature and the third sensitivity of the thermopile according to a group of equations consisting of the first corresponding relationship, the second corresponding relationship, the third corresponding relationship and the fourth corresponding relationship; the first ambient temperature is the temperature at which the temperature control device places the temperature measuring device; A calibration module is used to calibrate the temperature measuring device according to the third sensitivity and the third resistance value.

9. A calibration device for a temperature measuring device, characterized in that: include: Memory and processor; The temperature measuring device measures the temperature of the target object through the electric heating pile and the thermistor in the temperature measuring device; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory, so that the processor executes the calibration method of the temperature measuring device according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions, and when the computer-executable instructions are executed by a processor, they are used to implement the calibration method of the temperature measuring device according to any one of claims 1 to 7.

11. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the calibration method of the temperature measuring device according to any one of claims 1 to 7 is implemented.

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