A B-type sleeve phased array nondestructive testing calibration test block

Abstract

The present invention discloses a B-type sleeve phased array nondestructive testing calibration test block, comprising: a first step, a second step and a third step connected in sequence from top to bottom, a first row of defect groups are provided on the side surface of the first step adjacent to the first top surface, and a second row of defect groups are provided on the top surface of the second step; the first row of defect groups includes a plurality of first defects, which are arranged at intervals and arranged along a first oblique preset angle; the second row of defect groups includes a plurality of second defects, which are arranged at intervals and arranged along a second oblique preset angle; wherein the first row of defect groups and the second row of defect groups are arranged staggered. The B-type sleeve phased array nondestructive testing calibration test block adopts the first row of defect groups and the second row of defect groups, which are both inclinedly arranged, which can not only simulate various actual defects of the B-type sleeve welding joint, but also avoid interference between the defects, thereby greatly improving the precision and accuracy of ultrasonic phased array detection.

Description

Technical Field

[0001] The invention relates to the technical field of ultrasonic phased array detection, and in particular to a B-type sleeve phased array nondestructive detection calibration test block. Background Art

[0002] It is easy for lack of fusion to occur between weldments. To prevent lack of fusion, high-temperature welding is generally performed with higher voltage and current. High voltage and high current welding cannot be used between type B sleeves and vent pipes. The vent pipe is a gas with a certain flow rate, and excessive heating may cause safety hazards. Therefore, a single-layer single-pass welding process with lower current and voltage is used, which is bound to produce lack of fusion defects. Lack of fusion defects are second only to more harmful cracks, and are prone to develop into cracks under later stress. Therefore, detection of lack of fusion is extremely important.

[0003] Ultrasonic phased array is an important detection method for welding unfusion process. It is a combination of ultrasonic probe chips. It consists of multiple piezoelectric chips arranged in a certain pattern, and then each chip is stimulated one by one according to a predetermined delay time. The ultrasonic waves emitted by all chips form an overall wavefront, which can effectively control the shape and direction of the emitted ultrasonic beam (wavefront).

[0004] The accuracy of the equivalent size of the unfused defect in the welding between the B-type sleeve and the ventilation pipe and the applicability of the detection method require special test blocks for adjustment and setting to reduce the interference between defects and improve the precision and accuracy of detection. Summary of the invention

[0005] In view of this, it is necessary to provide a B-type sleeve phased array nondestructive testing calibration test block to solve the technical problem of mutual interference between adjacent defects during B-type sleeve test block phased array nondestructive testing.

[0006] According to one aspect of the present invention, there is provided a B-type sleeve phased array nondestructive testing calibration test block, comprising:

[0007] A first step, a second step and a third step are staggered and connected in sequence from top to bottom, the top surface of the second step includes a first top surface and a second top surface, the first step has a first side surface, the first top surface is adjacent to the first side surface, the second top surface is connected to the bottom surface of the first step, the first side surface is provided with a first column of defect groups, and the first top surface is provided with a second column of defect groups;

[0008] The first defect group includes a plurality of first defects, wherein the plurality of first defects are arranged at intervals and arranged along a first oblique preset angle;

[0009] The second defect group includes a plurality of the second defects, and the plurality of the second defects are arranged at intervals and arranged along a second oblique preset angle;

[0010] Among them, the first step is used to simulate the B-type sleeve ring layer, the second step is used to simulate the welding single-layer single-pass unfused layer, the third step is used to simulate the ventilation tube layer, and the first column defect group and the second column defect group are staggered.

[0011] According to some embodiments, a connection line between the first top surface and the second top surface coincides with a vertical projection of the first side surface;

[0012] The second step and the third step are flush with each other at the side of the bottom of the first step.

[0013] According to some embodiments, twice the sum of the thickness of the second step and the third step is less than the thickness of the first step.

[0014] According to some embodiments, the first oblique preset angle and the second oblique preset angle range from 30° to 60°.

[0015] According to some embodiments, each of the first defects in the first defect group is arranged with equal spacing;

[0016] The second defects in the second defect group are arranged at equal intervals.

[0017] According to some embodiments, a first number of defects in the first column defect group is different from a second number of defects in the second column defect group.

[0018] According to some embodiments, the number of first defects in the first defect column group is set to 7, and the number of second defects in the second defect column group is set to 5.

[0019] According to some embodiments, the first defect is a first flat-bottomed hole, and the second defect is a second flat-bottomed hole;

[0020] The first flat-bottom hole and the second flat-bottom hole are both flat-bottom holes with the same hole diameter.

[0021] According to some embodiments, the hole axis of the first flat-bottom hole is perpendicular to the side surface of the first step adjacent to the first top surface;

[0022] The hole axis of the second flat-bottom hole is perpendicular to the top surface of the second step.

[0023] According to some embodiments, the hole depth of the first flat-bottom hole is greater than the hole depth of the second flat-bottom hole;

[0024] The thickness of the second step is equal to the depth of the second flat-bottom hole.

[0025] Compared with the prior art, the present invention has the following beneficial effects:

[0026] During actual testing, the ultrasonic phased array detection device detects defects on the test block, and then compares them with the defects in the actual workpiece detection, so as to accurately obtain the size and position of the defects detected by the ultrasonic phased array detection device during actual testing. The above-mentioned unequally arranged first column defect group and second column defect group can not only simulate various actual defects of the B-type sleeve welding joint, but also avoid interference between various defects, thereby greatly improving the precision and accuracy of ultrasonic phased array detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without paying any creative work.

[0028] Figure 1 A schematic diagram of the three-dimensional structure of a B-type sleeve phased array nondestructive testing calibration test block provided by the present invention;

[0029] Figure 2 A schematic diagram of the dimensionally marked three-dimensional structure of a B-type sleeve phased array nondestructive testing calibration test block provided by the present invention;

[0030] Figure 3 for Figure 2 The front view shown;

[0031] Figure 4 for Figure 2 The top view shown;

[0032] Figure 5 A grid size view of a B-type sleeve phased array nondestructive testing calibration test block provided by the present invention.

[0033] In the figure: a first step 100 , a first side surface 110 , a first column of defect groups 111 , a second step 200 , a first top surface 210 , a second column of defect groups 211 , a second top surface 220 , and a third step 300 . DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0035] See also Figure 1As shown, the present invention provides a B-type sleeve phased array detection calibration test block, which includes a first step 100, a second step 200 and a third step 300 that are staggered and connected in sequence from top to bottom, the top surface of the second step 200 includes a first top surface 210 and a second top surface 220, the first step 100 has a first side surface 110, the first top surface 210 is adjacent to the first side surface 110, the second top surface 220 is connected to the bottom surface of the first step 100, the first side surface 110 is provided with a first column defect group 111, and the first top surface 210 is provided with a second column defect group 211. The first column defect group 111 includes a plurality of first defects, and the plurality of first defects are arranged at intervals and arranged along a first oblique preset angle. The second defect group 211 includes a plurality of second defects, which are spaced apart and arranged along a second oblique preset angle. The first defect group 111 and the second defect group 211 are staggered. In the step surface view, the first defects and the second defects may also be staggered.

[0036] By machining the first defect group 111 and the second defect group 211 on the B-type sleeve phased array detection calibration test block, the ultrasonic phased array detection device is used to detect the defects on the test block, and then the defects are compared with the defects in the actual workpiece detection, so as to accurately obtain the size and position of the defects detected by the ultrasonic phased array detection device during actual detection. And the use of the above-mentioned skew and inclined first defect group 111 and second defect group 211 can not only simulate various actual defects of the B-type sleeve welding joint, but also avoid interference between various defects, thereby greatly improving the precision and accuracy of ultrasonic phased array detection.

[0037] It is worth noting that the first step 100 is used to simulate the B-type sleeve ring layer, the second step 200 is used to simulate the welding single-layer single-pass unfused layer, and the third step 300 is used to simulate the ventilation tube layer.

[0038] like Figure 1 As shown, the connecting line of the first top surface 210 and the second top surface 220 coincides with the vertical projection of the first side surface 110, and the second step 200 and the third step 300 are flush with the side surface at the bottom of the first step 100. The sum of the thickness of the second step 200 and the third step 300 is twice less than the thickness of the first step 100.

[0039] like Figure 2-5 As shown, the B-type sleeve phased array detection and calibration test block is cut and processed from a special low-alloy steel forging with a thickness of 76mm, a width of 150mm, and a length of 370mm, wherein the first step 100 has a thickness of 50.5mmmm, a width of 150mm, and a length of 250mm, the second step 200 has a thickness of 5mm, a width of 40mm, and a length of 150mm, and the third step 300 has a thickness of 20mm, a width of 80mm, and a length of 150mm.

[0040] The first defect group 111 includes a plurality of first defects, which are arranged at intervals and arranged along a first oblique preset angle. The second defect group 211 includes a plurality of second defects, which are arranged at intervals and arranged along a second oblique preset angle. The first defect group 111 and the second defect group 211 are staggered, which can effectively avoid interference between two adjacent defect holes during the probe detection and debugging process of ultrasonic phased array detection.

[0041] According to some embodiments, in order to reduce the interference between two adjacent defect holes during the probe detection and debugging process of ultrasonic phased array detection, the first column defect group 111 and the second column defect group 211 may be staggered, or each first defect and each second defect may be staggered in the view in the direction of the step surface of the test block.

[0042] In addition, the first oblique preset angle can be obliquely upward or obliquely downward; the second oblique preset angle can be obliquely left or obliquely right, and the first oblique preset angle and the second oblique preset angle are in the range of 30° to 60°. Each first defect in the first column defect group 111 is arranged at an equal distance; each second defect in the second column defect group 211 is arranged at an equal distance. The number of first defects in the first column defect group 111 is different from the number of second defects in the second column defect group 211. In this embodiment, there are 7 first defects in the first column defect group 111, and 5 second defects in the second column defect group 211.

[0043] In this embodiment, the first defect is a first flat bottom hole, and the second defect is a second flat bottom hole. The hole axis of the first flat bottom hole is perpendicular to the first side surface 110 , and the hole axis of the second flat bottom hole is perpendicular to the first top surface 210 .

[0044] Since the welding process of the B-type sleeve and the ventilation pipe adopts a multi-layer and multi-pass welding process, and the welding thickness of each layer in this welding process is 2.5mm±0.5mm, the phased array detection process needs to judge the welding thickness size of each layer. The first flat-bottom hole and the second flat-bottom hole on the B-type sleeve phased array test block are flat-bottom holes with the same aperture, and the aperture size is in the range of 2.5mm-3mm. When the thickness of the first step 100 is constant, the number of holes punched by 3mm is small, which saves time and effort when debugging the aperture. That is, the aperture size of the first flat-bottom hole and the second flat-bottom hole in this embodiment is preferably 3mm.

[0045] In addition, each first defect in the first column defect group 111 is arranged at an equal distance, and each second defect in the second column defect group 211 is arranged at an equal distance. That is, two adjacent first flat-bottom holes are arranged at an equal distance, and two adjacent second flat-bottom holes are arranged at an equal distance. When the first oblique preset angle and the second oblique preset angle are both 45°, and the aperture size of the first flat-bottom hole and the second flat-bottom hole is preferably 3mm, the hole center distance between the first flat-bottom hole and the second flat-bottom hole is 6mm. During the ultrasonic phased array debugging and detection process, the interference between two adjacent flat-bottom holes in the ultrasonic phased array detection probe detection debugging process can be effectively avoided.

[0046] The hole depth of the first flat-bottom hole is greater than that of the second flat-bottom hole. When ultrasonic phased array detection is used to identify defective holes in a test block, it is generally applicable to flat-bottom holes with a depth of 5 mm. As the hole depth decreases, the reflected signal received by the ultrasonic phased array is likely to come from the surface of the test block, thereby affecting the precision and accuracy of defective hole detection on the test block. Since the wall thickness of the second step 200 and the third step 300 is half of that of the first step 100, when the hole depth of the second flat-bottom hole is 5 mm, the hole depth of the first flat-bottom hole is 10 mm. In this embodiment, the thickness of the second step 200 is set to be the same as the depth of the second flat-bottom hole.

[0047] Thus, during actual testing, the ultrasonic phased array detection device detects defects on the test block, and then compares them with defects in actual workpiece testing, thereby accurately obtaining the size and position of the defects detected by the ultrasonic phased array detection device during actual testing. The above-mentioned skewed and inclined first column defect group 111 and second column defect group 211 can not only simulate various actual defects of the B-type sleeve welding joint, but also avoid interference between various defects, thereby greatly improving the precision and accuracy of ultrasonic phased array testing.

[0048] The same or similar numbers in the drawings of this embodiment correspond to the same or similar parts; in the description of the present invention, it should be understood that if the terms "upper", "lower", "left", "right" and the like indicate directions or positional relationships based on the directions or positional relationships shown in the drawings, it is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction. Therefore, the terms describing the positional relationship in the drawings are only used for illustrative purposes and cannot be understood as limitations on this patent. For ordinary technicians in this field, the specific meanings of the above terms can be understood according to specific circumstances.

Claims

1. A B-type sleeve phased array nondestructive testing calibration test block, characterized in that: include: A first step, a second step and a third step are staggered and connected in sequence from top to bottom, the top surface of the second step includes a first top surface and a second top surface, the first step has a first side surface, the first top surface is adjacent to the first side surface, the second top surface is connected to the bottom surface of the first step, the first side surface is provided with a first column of defect groups, and the first top surface is provided with a second column of defect groups; The first defect group includes a plurality of first defects, wherein the plurality of first defects are arranged at intervals and arranged along a first oblique preset angle; The second defect group includes a plurality of second defects, and the plurality of second defects are arranged at intervals and along a second oblique preset angle; Wherein, the first column defect group and the second column defect group are arranged in a staggered manner; A connecting line between the first top surface and the second top surface coincides with a vertical projection of the first side surface; The second step and the third step are flush with the side surface of the bottom of the first step; Two times the sum of the thickness of the second step and the third step is less than the thickness of the first step; The first oblique preset angle and the second oblique preset angle range from 30° to 60°.

2. A B-type sleeve phased array nondestructive testing calibration test block according to claim 1, characterized in that: Each of the first defects in the first defect group is arranged with equal spacing; The second defects in the second defect group are arranged at equal intervals.

3. A B-type sleeve phased array nondestructive testing calibration test block according to claim 2, characterized in that: A first number of defects in the first column defect group is different from a second number of defects in the second column defect group.

4. A B-type sleeve phased array nondestructive testing calibration test block according to claim 3, characterized in that: There are 7 first defects in the first defect group, and there are 5 second defects in the second defect group.

5. A B-type sleeve phased array nondestructive testing calibration test block according to claim 4, characterized in that: The first defect is a first flat-bottom hole, and the second defect is a second flat-bottom hole; The first flat-bottom hole and the second flat-bottom hole are both flat-bottom holes with the same hole diameter.

6. A B-type sleeve phased array nondestructive testing calibration test block according to claim 5, characterized in that: The hole axis of the first flat-bottom hole is perpendicular to the side surface of the first step adjacent to the first top surface; The hole axis of the second flat-bottom hole is perpendicular to the top surface of the second step.

7. A B-type sleeve phased array nondestructive testing calibration test block according to claim 6, characterized in that: The hole depth of the first flat bottom hole is greater than the hole depth of the second flat bottom hole; The thickness of the second step is equal to the depth of the second flat-bottom hole.

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