Cooking utensil testing method, device, computer equipment and storage medium

Abstract

The present application relates to a cooking utensil testing method, device, computer equipment, computer-readable storage medium and computer program product. The cooking utensil testing method includes: obtaining a test mode of the cooking utensil to be tested; determining the parameters of the mica sheet used for the cooking test according to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, and outputting prompt information; obtaining the temperature of the mica sheet with the corresponding parameters during the no-load cooking test of the cooking utensil to be tested, and obtaining and outputting the cooking test result based on the temperature; the mica sheet is arranged on the holding part of the cooking utensil to be tested based on the above prompt information. Using the above cooking utensil testing method is equivalent to using a mica sheet matching the corresponding test mode to replace food for a cooking test. Due to the sheet-like properties and good thermal conductivity of the mica sheet, the large-area heating process of the food during the cooking process can be simulated, which is conducive to improving the reliability of the cooking test results.

Description

Technical Field

[0001] The present application relates to the technical field of household appliances, and in particular to a cooking appliance testing method, device, computer equipment, computer-readable storage medium and computer program product. Background Art

[0002] With the continuous improvement of people's living standards, various cooking appliances have emerged, such as ovens, steamers, smart rice cookers, etc. It is usually necessary to conduct cooking tests on cooking appliances to evaluate the cooking effects of cooking appliances.

[0003] The traditional cooking utensil testing method uses a thermocouple to collect the air temperature at a certain point in the cooking utensil, and then infers the temperature of the food after being heated to evaluate the cooking effect. Since the air temperature at a certain point in the cooking utensil cannot achieve a good fit with the actual food temperature, the traditional cooking utensil testing method has the disadvantage of unreliable test results. Summary of the invention

[0004] Based on this, it is necessary to provide a cooking appliance testing method, apparatus, computer equipment, computer readable storage medium and computer program product to improve the reliability of cooking appliance testing results in order to address the problem of unreliable test results of traditional cooking appliance testing methods.

[0005] In the first aspect, the present application proposes a cooking utensil testing method. The cooking utensil testing method includes:

[0006] obtaining a test mode of the cooking appliance to be tested;

[0007] According to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, the parameters of the mica sheet used for the cooking test are determined, and prompt information is output;

[0008] The temperature of the mica sheet with the parameter is obtained during the no-load cooking test of the cooking utensil to be tested, and based on the temperature, the cooking test result is obtained and output; the mica sheet is arranged on the holding part of the cooking utensil to be tested based on the prompt information.

[0009] In one embodiment, the method further includes: determining the parameters of the mica sheet used for the cooking test according to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, and outputting the prompt information before outputting the prompt information;

[0010] Based on response surface methodology, the corresponding relationship between the test mode and the mica sheet parameters was established.

[0011] In one embodiment, the establishment of the correspondence between the test mode and the mica sheet parameters based on the response surface analysis method includes:

[0012] Based on response surface methodology, the parameter combination of mica sheets for no-load cooking test was determined;

[0013] Obtaining the temperature of each parameter mica sheet under different test modes, and determining the cooking test result corresponding to each parameter mica sheet based on the temperature;

[0014] Determine the mica sheet parameters under each of the test modes according to each of the cooking test results and the actual cooking results of the food under the corresponding test mode;

[0015] According to each of the test modes and its corresponding mica sheet parameters, a corresponding relationship between the test mode and the mica sheet parameters is established.

[0016] In one embodiment, the number of mica sheets in each parameter mica sheet is more than two, and obtaining the temperature of each parameter mica sheet under different test modes and determining the cooking test result corresponding to each parameter mica sheet based on the temperature includes:

[0017] Get the temperature of mica sheets of various parameters under different test modes;

[0018] According to the temperature, the temperature control accuracy and temperature uniformity of the cooking utensil to be tested are calculated, and based on the temperature control accuracy and the temperature uniformity, the cooking test results corresponding to the mica sheets of each parameter are determined.

[0019] In one embodiment, the number of the mica sheets of the parameter is more than two, and each of the mica sheets is arranged at a different position of the holding part of the cooking utensil to be tested based on the prompt information; the temperature of the mica sheet of the parameter during the no-load cooking test of the cooking utensil to be tested is obtained, and based on the temperature, the cooking test result is obtained and outputted, including:

[0020] The temperature of the mica sheet with corresponding parameters during the no-load cooking test of the cooking utensil to be tested is obtained, and the heating temperature uniformity and heating temperature variation of the cooking utensil to be tested are determined according to the temperature, and based on the heating temperature uniformity and the heating temperature variation, the cooking test result of the cooking utensil to be tested is obtained and output.

[0021] In one embodiment, the cooking utensil to be tested is a baking cooking utensil, and the test mode includes a heat convection mode and a heat radiation mode.

[0022] In one of the embodiments, the parameters of the mica sheet include the size and thickness of the mica sheet, and the placement position of the mica sheet in the containing portion.

[0023] In a second aspect, the present application proposes a cooking utensil testing device, the cooking utensil testing device comprising:

[0024] A test mode acquisition module, used to acquire the test mode of the cooking appliance to be tested;

[0025] A mica sheet parameter determination module, used to determine the parameters of the mica sheet used for the cooking test according to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, and output prompt information;

[0026] A test result determination module is used to obtain the temperature of the mica sheet of the parameter during the no-load cooking test of the cooking utensil to be tested, and based on the temperature, obtain and output the cooking test result; the mica sheet is arranged on the holding part of the cooking utensil to be tested based on the prompt information.

[0027] In one embodiment, the cooking utensil testing device further comprises:

[0028] The corresponding relationship establishment module is used to establish the corresponding relationship between the test mode and the mica sheet parameters based on the response surface analysis method.

[0029] In one embodiment, the corresponding relationship establishing module includes:

[0030] A parameter combination determination unit, used for determining a parameter combination of a mica sheet used for a no-load cooking test based on a response surface analysis method;

[0031] A cooking test result determination unit, used to obtain the temperature of each parameter mica sheet under different test modes, and determine the cooking test result corresponding to each parameter mica sheet based on the temperature;

[0032] A mica sheet parameter determination unit, used to determine the mica sheet parameters in each of the test modes according to each of the cooking test results and the actual cooking results of the food in the corresponding test mode;

[0033] The corresponding relationship establishing unit is used to establish the corresponding relationship between the test mode and the mica sheet parameter according to each of the test modes and the mica sheet parameter corresponding thereto.

[0034] In one embodiment, the number of mica sheets in each parameter mica sheet is more than two, and the cooking test result determination unit is specifically used for:

[0035] Get the temperature of mica sheets of various parameters under different test modes;

[0036] According to the temperature, the temperature control accuracy and temperature uniformity of the cooking utensil to be tested are calculated, and based on the temperature control accuracy and the temperature uniformity, the cooking test results corresponding to the mica sheets of each parameter are determined.

[0037] In one embodiment, the number of mica sheets of the parameter is more than two, and each of the mica sheets is arranged at a different position of the holding part of the cooking utensil to be tested based on the prompt information; the test result determination module is specifically used for:

[0038] The temperature of the mica sheet with corresponding parameters during the no-load cooking test of the cooking utensil to be tested is obtained, and the heating temperature uniformity and heating temperature variation of the cooking utensil to be tested are determined according to the temperature, and based on the heating temperature uniformity and the heating temperature variation, the cooking test result of the cooking utensil to be tested is obtained and output.

[0039] In one embodiment, the cooking utensil to be tested is a baking cooking utensil, and the test mode includes a heat convection mode and a heat radiation mode.

[0040] In one of the embodiments, the parameters of the mica sheet include the size and thickness of the mica sheet, and the placement position of the mica sheet in the containing portion.

[0041] In a third aspect, the present application further provides a computer device. The computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the following steps when executing the computer program:

[0042] obtaining a test mode of the cooking appliance to be tested;

[0043] According to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, the parameters of the mica sheet used for the cooking test are determined, and prompt information is output;

[0044] The temperature of the mica sheet with the parameter is obtained during the no-load cooking test of the cooking utensil to be tested, and based on the temperature, the cooking test result is obtained and output; the mica sheet is arranged on the holding part of the cooking utensil to be tested based on the prompt information.

[0045] In a fourth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0046] obtaining a test mode of the cooking appliance to be tested;

[0047] According to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, the parameters of the mica sheet used for the cooking test are determined, and prompt information is output;

[0048] The temperature of the mica sheet with the parameter is obtained during the no-load cooking test of the cooking utensil to be tested, and based on the temperature, the cooking test result is obtained and output; the mica sheet is arranged on the holding part of the cooking utensil to be tested based on the prompt information.

[0049] In a fifth aspect, the present application further provides a computer program product. The computer program product includes a computer program, and when the computer program is executed by a processor, the following steps are implemented:

[0050] obtaining a test mode of the cooking appliance to be tested;

[0051] According to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, the parameters of the mica sheet used for the cooking test are determined, and prompt information is output;

[0052] The temperature of the mica sheet with the parameter is obtained during the no-load cooking test of the cooking utensil to be tested, and based on the temperature, the cooking test result is obtained and output; the mica sheet is arranged on the holding part of the cooking utensil to be tested based on the prompt information.

[0053] The above-mentioned cooking utensil testing method, device, computer equipment, computer-readable storage medium and computer program product determine the mica sheet parameters used for the cooking test according to the correspondence between the test mode and the mica sheet parameters, and arrange the mica sheet with the corresponding parameters on the holding part of the cooking utensil to be tested, and obtain the cooking test result according to the temperature of the mica sheet during the no-load cooking test, which is equivalent to using the mica sheet matching the corresponding test mode instead of the food for the cooking test. Due to the sheet-like properties and good thermal conductivity of the mica sheet, the large-area heating process of the food during the cooking process can be simulated, which is conducive to improving the reliability of the cooking test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0054] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the conventional technology, the drawings required for use in the embodiments or the conventional technology descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0055] Figure 1 is a flow chart of a cooking utensil testing method in one embodiment;

[0056] Figure 2 is a flow chart of a cooking utensil testing method in another embodiment;

[0057] Figure 3 It is a flow chart of establishing the correspondence between the test mode and the mica sheet parameters based on the response surface analysis method in one embodiment;

[0058] Figure 4 A flowchart of obtaining the temperature of each parameter mica sheet under different test modes and determining the cooking test result corresponding to each parameter mica sheet based on the temperature in an embodiment;

[0059] Figure 5 is a block diagram of a cooking utensil testing device in one embodiment;

[0060] Figure 6 is a block diagram of a cooking utensil testing device in another embodiment;

[0061] Figure 7 It is a block diagram of the composition of a corresponding relationship establishment module in one embodiment;

[0062] Figure 8 1 is a block diagram of a computer device in one embodiment. DETAILED DESCRIPTION

[0063] In order to facilitate understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the present application are provided in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0064] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0065] When used herein, the singular forms "a", "an", and "said / the" may also include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" etc. specify the presence of stated features, wholes, steps, operations, components, parts or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts or combinations thereof.

[0066] The thermal radiation and thermal convection processes are affected by many factors. Among them, the main factors affecting thermal radiation are: temperature, blackness, angular coefficient (geometric position), area size, intermediate medium, etc.; the main factors affecting thermal convection are: fluid flow state, whether the fluid has phase change, the physical properties of the fluid, the structural characteristics of the heated surface, etc. Therefore, the area of ​​the heated medium has an important influence on the absorption of temperature. The inventors have found that the reason why the cooking utensil testing method in the traditional technology has the disadvantage of unreliable test results is that the use of thermocouples to directly collect single-point temperature ignores the influence of the heated area and cannot accurately evaluate the large-area heating of food. Based on this, the present application proposes a cooking utensil testing method, device, computer equipment, computer-readable storage medium and computer program product, which uses mica sheets instead of food for cooking tests, and determines the food temperature at the location of the mica sheet according to the temperature of the mica sheet to improve the reliability of the cooking utensil test results.

[0067] In one embodiment, Figure 1 As shown, the present application provides a cooking appliance testing method, including steps S200 to S600.

[0068] Step S200: Acquire the test mode of the cooking appliance to be tested.

[0069] Among them, the specific type of the cooking utensil to be tested is not unique, for example, it can be a steam oven, an oven, a steamer or an intelligent rice cooker, etc. Correspondingly, the test mode of the cooking utensil to be tested may refer to a heating mode or a working procedure. For example, the roasted chicken wing mode or the roasted sweet potato mode of the oven. Specifically, the tester can send the test mode of the cooking utensil to be tested to the processor through an interactive device according to actual needs. The interactive device can be a touch screen or a host computer. Furthermore, the specific way in which the processor obtains the test mode of the cooking utensil to be tested can be active acquisition or passive reception.

[0070] In one embodiment, the cooking utensil to be tested is a baking cooking utensil, and the test modes include a thermal convection mode and a thermal radiation mode. Among them, the thermal convection mode and the thermal radiation mode correspond to two different heating modes. In the thermal convection mode, convection heat transfer is used as the main heat transfer method in the cooking utensil to be tested. Correspondingly, in the thermal radiation mode, radiation heat transfer is used as the main heat transfer method in the cooking utensil to be tested. Due to the different heat transfer methods, the heating temperature is also different, which in turn causes differences in cooking effects. Differentiating the test modes by the heat transfer method is equivalent to dividing the test modes based on the heat transfer mechanism, which can reduce the number of test modes, thereby simplifying the test process and improving efficiency.

[0071] Step 400: According to the test mode and the correspondence between the test mode and the mica sheet parameters, the parameters of the mica sheet used for the cooking test are determined, and prompt information is output.

[0072] Among them, the mica sheet refers to a sheet of mica whose ratio of thickness to length and thickness to width is less than a set threshold, so as to simulate the scene of food being heated over a large area in a cooking utensil as much as possible. The mica sheet can be a natural mica sheet or a synthetic mica sheet. Furthermore, the mica sheet parameters refer to the characteristic parameters of the mica sheet used for cooking tests. The characteristic parameters include the inherent parameters and usage parameters of the mica sheet. The inherent parameters include the type, shape, size, thickness and quantity of the mica sheet. The usage parameters include the placement position and fixing method of the mica sheet in the cooking utensil.

[0073] In one embodiment, the parameters of the mica sheet include the size and thickness of the mica sheet, and the placement position of the mica sheet in the holding part. Among them, the size of the mica sheet refers to the size of the mica sheet in the length and width direction, such as 1cm*1cm, 4cm*4cm or 7cm*7cm. The size of the mica sheet should be smaller than the size of the holding part of the cooking utensil to be tested. The thickness of the mica sheet can be characterized by multiples of the standard thickness. Further, assuming that the mica sheets used are all mica sheets of standard thickness, the thickness of the mica sheet can be measured by the number of mica sheets stacked in the thickness direction, for example, the thickness is the thickness of one, two or three stacked sheets. In addition, more than two mica sheets can be bonded together by bonding. Taking the case where the cooking utensil to be tested is a steam oven as an example, the placement position of the mica sheet in the holding part refers to the number of layers where the shelf for placing the mica sheet is located, such as the middle layer, the top layer or the bottom layer, and the specific placement position of the mica sheet on the shelf, such as centered or along the edge. It can be understood that the placement position of the mica sheet in the containing portion can directly represent the relative position of the mica sheet and the heating tube.

[0074] Mica sheets have good thermal conductivity. During the heating process, the temperature of the mica sheets is mainly affected by three factors: the size and thickness of the mica sheets and the relative position of the mica sheets and the heat source. Based on this, defining the above parameters as the parameters of the mica sheets can simplify the process of determining the mica sheet parameters without affecting the accuracy of the cooking test results.

[0075] Specifically, the processor determines the parameters of the mica sheet used for the cooking test according to the acquired test mode and the correspondence between the pre-stored test mode and the mica sheet parameters, and outputs corresponding prompt information.

[0076] It can be understood that the prompt information includes the determined parameters of the mica sheet. Furthermore, the output method of the prompt information is not unique, for example, text information including the parameters of the mica sheet can be directly output, or the parameters of the mica sheet can be output in a combination of text and graphics. The output object of the prompt information is also not unique, for example, it can be a display device, a mobile terminal or a host computer.

[0077] Step 600: obtaining the temperature of the mica sheet of the parameter during the no-load cooking test of the cooking appliance to be tested, and based on the temperature, obtaining and outputting the cooking test result.

[0078] Among them, the no-load cooking test refers to a cooking test in which no food is placed during the test. The mica sheet is set on the holding part of the cooking utensil to be tested based on the prompt information output in step S400. The holding part corresponds to the area in the cooking utensil to be tested for holding food, such as a steaming plate in an oven or a steamer, or the body of a smart rice cooker. Specifically, the tester can set the mica sheet of corresponding parameters on the holding part of the cooking utensil to be tested according to the prompt information; the prompt information can also be output to the mica sheet conveying device to instruct the mica sheet conveying device to automatically select the mica sheet of corresponding parameters according to the prompt information, and place the mica sheet on the holding part of the cooking utensil to be tested.

[0079] Furthermore, cooking in a narrow sense refers to the process of heating food to make it cooked. Based on this, taking food as the research object, the cooking process can be expressed as the temperature change process of food caused by heating, and the temperature change process of food is directly related to the heating temperature of the cooking process, which will ultimately affect the cooking effect of the food. Take the case where the cooking utensil to be tested is an oven, and the food used for the cooking test is white bread slices as an example: if the heating temperature is too low, the white bread slices may not be colored; if the heating temperature is too high, the white bread slices may be burnt; if the heating temperature rises too slowly, the white bread slices may lose too much moisture, affecting the taste. In short, according to the cooking requirements of the corresponding food, the relationship between the heating temperature change and the cooking effect can be established.

[0080] Based on this, the heating temperature of the location of the mica sheet can be determined according to the temperature of the mica sheet during the no-load cooking test of the cooking utensil to be tested, and the heating temperature change during the test can be obtained based on the heating temperature. The heating temperature change corresponds to the food temperature change during the actual cooking process. Combined with the correspondence between the food temperature change and the cooking effect, the cooking effect of the cooking utensil to be tested is determined. Finally, based on the cooking effect, the cooking test result is obtained and output.

[0081] Furthermore, there is no unique way to determine the heating temperature of the mica sheet according to the temperature of the mica sheet. For example, the temperature of the mica sheet can be simply equated with the heating temperature of the mica sheet to simplify the calculation process and improve work efficiency; or an error coefficient can be introduced according to the difference in properties of the mica sheet and the food used for cooking tests specified in the enterprise standard / national standard test requirements, such as specific heat capacity, thermal conductivity, etc., and the heating temperature of the mica sheet can be obtained by combining the temperature of the mica sheet and the error coefficient.

[0082] In addition, the output object and output method of the cooking test results are not unique. For example, the output object of the cooking test results can be a display device, a mobile terminal or a host computer; the output method of the cooking test results can be text, a picture or a combination of text and pictures. Furthermore, according to the degree of deviation between the heating temperature change and the preset ideal heating temperature change curve, multiple levels of cooking effects can be set to obtain the cooking effect rating of the tested cooking appliance as the cooking test result output.

[0083] It is understandable that during the test, multiple mica sheets can be used and arranged at different positions of the holding part of the cooking utensil to be tested, so as to obtain the heating temperature of multiple positions. In one embodiment, the cooking utensil to be tested is an oven; the mica sheets are arranged on the grill of the oven. Among them, the arrangement of the mica sheets on the grill is not unique. For example, when using one mica sheet, the mica sheet can be arranged in the middle or on both sides of the grill; when using multiple mica sheets, the mica sheets can be arranged in an array on the grill with a certain gap, or multiple mica sheets can be spliced ​​to form a whole with the edges facing each other and arranged in the middle or on both sides of the grill.

[0084] The above cooking utensil testing method determines the mica sheet parameters used for the cooking test according to the correspondence between the test mode and the mica sheet parameters, and arranges the mica sheet with the corresponding parameters on the holding part of the cooking utensil to be tested. The cooking test result is obtained according to the temperature of the mica sheet during the no-load cooking test, which is equivalent to using the mica sheet matching the corresponding test mode instead of the food for the cooking test. Due to the sheet-like properties and good thermal conductivity of the mica sheet, the large-area heating process of the food during the cooking process can be simulated, which is conducive to improving the reliability of the cooking test results.

[0085] In one embodiment, the number of mica sheets corresponding to the parameters is more than two, and each mica sheet is arranged at a different position of the holding part of the cooking utensil to be tested based on the prompt information output in step S400. Step S600 includes: obtaining the temperature of the mica sheet corresponding to the parameters during the no-load cooking test of the cooking utensil to be tested, determining the heating temperature uniformity and heating temperature variation of the cooking utensil to be tested based on the temperature, and obtaining and outputting the cooking test result of the cooking utensil to be tested based on the heating temperature uniformity and heating temperature variation.

[0086] Specifically, according to the temperature of the mica sheet at different positions of the holding part at the same time, the heating temperature of the corresponding position can be determined, and then the uniformity of the heating temperature at different positions of the holding part can be obtained, that is, the heating temperature uniformity of the oven; according to the temperature of the mica sheet at the same position of the holding part at different times, the heating temperature at the corresponding time can be determined, and then the heating temperature change at that position can be obtained, that is, the heating temperature change of the oven.

[0087] Among them, the heating temperature uniformity can be characterized by parameters such as the range, standard deviation, variance or coefficient of variation of the heating temperature at different positions of the holding part. Specifically, the parameter corresponding to the moment with the worst uniformity, or the average value of the corresponding parameters at different times can be taken to characterize the heating temperature uniformity during the test. The heating temperature change can be quantitatively characterized by the distance between the heating temperature change curve and the preset ideal heating temperature change curve. Furthermore, the position with the largest deviation from the preset ideal heating temperature change curve can be selected as the research object to obtain the heating temperature change; it is also possible to select one or more specific positions on the holding part, and obtain the heating temperature change based on the average temperature of the selected position at different times.

[0088] In addition, based on the heating temperature uniformity and heating temperature variation, there is not only one way to obtain the cooking test result of the cooking utensil to be tested.

[0089] In one embodiment, multiple uniformity thresholds can be set, corresponding to multiple uniformity levels: when the heating temperature uniformity is less than the first uniformity threshold, the uniformity level is B; when the heating temperature uniformity is greater than or equal to the first uniformity threshold and less than the second uniformity threshold, the uniformity level is A; when the heating temperature uniformity is greater than or equal to the second uniformity threshold, the uniformity level is S. Among them, the temperature uniformity of level S is the best. Similarly, multiple temperature change deviation thresholds can be set, corresponding to multiple temperature change levels. Then, according to the temperature uniformity level and the temperature change level, the cooking effect rating of the tested cooking appliance is obtained and output as the cooking test result.

[0090] In another embodiment, a cooking effect score can be obtained based on the heating temperature uniformity and the heating temperature variation, and the contribution rate of the two to the cooking effect, and output as a cooking test result. The sum of the contribution rate of the heating temperature uniformity to the cooking effect and the contribution rate of the heating temperature variation to the cooking effect is less than or equal to 1.

[0091] In the above embodiment, on the one hand, more than two mica sheets are used and arranged at different positions of the holding part respectively, so that the temperature of the mica sheets at different positions during the cooking test can be obtained, and then the heating temperature information at different positions of the holding part can be obtained to determine the cooking conditions of food at different positions of the grill, thereby improving the scientific and comprehensive nature of the cooking utensil testing method; on the other hand, based on the uniformity of the heating temperature and the change of the heating temperature, the cooking effect is evaluated from different dimensions, which is conducive to improving the accuracy of the cooking test results.

[0092] In one embodiment, Figure 2 As shown, before step S200, step S100 is also included: establishing a corresponding relationship between the test mode and the mica sheet parameters based on the response surface analysis method.

[0093] Among them, the response surface analysis method, namely the response surface design method (RSM), is to establish a mathematical model including the linear terms, square terms of each significant factor and the first-order interaction terms between any two factors by designing a reasonable limited number of experiments, accurately study the relationship between each factor and the response value, and quickly and effectively determine the optimal conditions of the multi-factor system. Specifically, based on the response surface analysis method, a limited number of no-load cooking tests are carried out on the cooking utensils to be tested with different combinations of test modes and mica sheet parameters, and the corresponding relationship between the test mode and the mica sheet parameters can be established.

[0094] Taking a certain brand of 57L built-in oven as an example, the test modes include convection mode and radiation mode, and the mica sheet parameters include the size and thickness of the mica sheet and the number of layers of the grill where the mica sheet is placed. The corresponding relationship between the test mode and the mica sheet parameters is as follows: in convection mode, the mica sheet size is 1cm*1cm, the mica sheet thickness is three layers of standard thickness mica sheets stacked, and the grill where the mica sheet is placed is the middle grill (usually ovens above 40L are equipped with five layers of grills, and the middle grill refers to the third grill, that is, the distance between the mica sheet and the heating tube is half the height of the inner cavity of the cooking utensil); in radiation mode, the mica sheet size is 7cm*7cm, the mica sheet thickness is one layer of standard thickness mica sheets, and the grill where the mica sheet is placed is the middle grill.

[0095] In the above embodiment, the correspondence between the test mode and the mica sheet parameters is established based on the response surface analysis method. Since this method has the advantages of less number of tests, short cycle, high precision, etc., it is beneficial to improve work efficiency.

[0096] In one embodiment, Figure 3 As shown, step S100 includes steps S120 to S180.

[0097] Step S120: Determine the parameter combination of the mica sheet for the no-load cooking test based on the response surface analysis method.

[0098] As mentioned above, the parameters of mica sheets include the inherent parameters and usage parameters of mica sheets. The inherent parameters include the type, shape, size, thickness and quantity of mica sheets. The usage parameters include the placement and fixing method of the mica sheets in the cooking utensil. Taking the cooking utensil to be tested as an oven, the parameters of the mica sheets include the size and thickness of the mica sheets, as well as the placement of the mica sheets in the holding part. Correspondingly, the influencing factors selected in the analysis process include the size of the mica sheets, the thickness of the mica sheets, and the placement of the mica sheets in the holding part. Combined with the enterprise standard test requirements, each influencing factor selects a three-level selection range: the size of the mica sheets includes 1cm*1cm, 4cm*4cm and 7cm*7cm; the thickness of the mica sheets includes the stacked thickness of one sheet, two sheets and three sheets; the placement of the mica sheets in the holding part includes the top layer, the middle layer and the bottom layer of the grill.

[0099] Specifically, based on the response surface analysis method, according to the above factors and factor levels, the parameter combination of the mica sheet used for the no-load cooking test can be determined, and the corresponding instruction information is output to instruct the tester to select the mica sheet with the corresponding parameters to conduct the no-load cooking test. Furthermore, relevant software (such as Design-Expert) can be built into the processor to assist in determining the parameter combination of the mica sheet.

[0100] Step S140: acquiring the temperature of each parameter mica sheet under different test modes, and determining the cooking test result corresponding to each parameter mica sheet based on the temperature.

[0101] Specifically, based on the parameter combination of the mica sheet determined in step S120, for a specific test mode, different cooking utensils to be tested of the same model are used, or the same cooking utensil to be tested is used, and no-load cooking tests are performed based on mica sheets of different parameters, and then the processor obtains the cooking test results corresponding to the mica sheets of different parameters under different test modes. Furthermore, the method in which the processor determines the cooking test results corresponding to the mica sheets of different parameters based on the temperature of the mica sheet is not unique. For example, based on the temperature of the mica sheet, the temperature change of the mica sheet during the no-load cooking test can be obtained, corresponding to the heating temperature change during the cooking process, and the cooking test results can be obtained based on the corresponding relationship between the temperature change and the cooking effect of the food.

[0102] In one embodiment, the number of mica sheets in each parameter mica sheet is more than two sheets, such as Figure 4 As shown, step S140 includes step S142 and step S144.

[0103] Step S142: Obtain the temperature of each parameter mica sheet under different test modes.

[0104] The temperature of each parameter mica sheet under different test modes refers to the temperature set of all mica sheets under the corresponding parameters at all sampling moments during the no-load cooking test under the corresponding test mode. Specifically, a thermocouple can be attached above the center of the mica sheet to detect the temperature of the mica sheet.

[0105] Step S144: according to the temperature, the temperature control accuracy and temperature uniformity of the cooking utensil to be tested are calculated, and based on the temperature control accuracy and temperature uniformity, the cooking test results corresponding to the mica sheets of each parameter are determined.

[0106] Specifically, according to the temperature of the mica sheet at a certain moment, the heating temperature of the position where the mica sheet is located at the same moment, that is, the actual temperature, can be determined. Then, the actual temperature and the theoretical temperature at the corresponding position are subtracted to calculate the temperature control error curve of the cooking utensil to be tested, and then the temperature control accuracy of the cooking utensil to be tested can be obtained. According to the temperature of different mica sheets at the same moment, the heating temperature of the corresponding position can be determined, and then the temperature uniformity of different positions of the holding part can be obtained. Among them, the temperature uniformity can be characterized by parameters such as the range, standard deviation, variance or coefficient of variation of the heating temperature at different positions of the holding part. Specifically, the parameter corresponding to the moment with the worst uniformity or the average value of the corresponding parameters at different moments can be taken to characterize the temperature uniformity during the test.

[0107] Furthermore, based on the temperature control accuracy and temperature uniformity, and in comparison with the temperature control accuracy and temperature uniformity required by the relevant standards, the degree of deviation between the cooking utensil to be tested and the corresponding requirements can be obtained, and then the cooking test results corresponding to the mica sheets of each parameter can be determined based on the degree of deviation. Comprehensively considering the temperature control accuracy and temperature uniformity, and evaluating the cooking effect from different dimensions, is conducive to improving the accuracy of the cooking test results corresponding to the mica sheets of each parameter.

[0108] Step S160: Determine the mica sheet parameters in each test mode according to each cooking test result and the actual cooking result of the food in the corresponding test mode.

[0109] Step S180: establishing a correspondence between the test modes and the mica sheet parameters according to the test modes and the mica sheet parameters corresponding thereto.

[0110] Among them, the actual cooking result of the food in the corresponding test mode refers to the cooking test result obtained by using the food for load cooking test in the corresponding test mode. The actual cooking result can be evaluated according to the color and taste of the food. Take the case where the cooking utensil to be tested is an oven and the test food is a plurality of bread slices as an example. Under the same test mode, each bread slice is placed at a different position on the grill (the position is consistent with the placement position of the mica sheet in the no-load cooking test) to perform a load cooking test. After the test, the color difference and coloring effect are evaluated by comparing the color baking effect of the bread slices at each position to obtain the actual cooking result.

[0111] Specifically, according to the cooking test results corresponding to each parameter mica sheet and the actual cooking results of the food under the corresponding test mode, the difference between each cooking test result and the actual cooking result is obtained, and then according to each difference degree, the parameter of the mica sheet corresponding to the cooking test result with the smallest difference degree is determined as the mica sheet parameter under the test mode. Finally, according to each test mode and its corresponding mica sheet parameter, the corresponding relationship between the test mode and the mica sheet parameter can be established.

[0112] In the above embodiment, by comparing the actual cooking results of food under different test modes and determining the mica sheet parameters under the corresponding mode, it can be ensured that the no-load cooking test performed using the mica sheet can achieve a good correspondence with the loaded cooking test, which is beneficial to improving the accuracy of the cooking utensil test results.

[0113] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0114] Based on the same inventive concept, the embodiment of the present application also provides a cooking utensil testing device for implementing the cooking utensil testing method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more cooking utensil testing device embodiments provided below can refer to the limitations of the cooking utensil testing method above, and will not be repeated here.

[0115] In one embodiment, Figure 5 As shown, a cooking utensil testing device 100 is provided, comprising a test mode acquisition module 120, a mica sheet parameter determination module 140 and a test result determination module 160, wherein:

[0116] A test mode acquisition module 120, used to acquire a test mode of the cooking appliance to be tested;

[0117] The mica sheet parameter determination module 140 is used to determine the parameters of the mica sheet used for the cooking test according to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, and output prompt information;

[0118] The test result determination module 160 is used to obtain the temperature of the mica sheet with corresponding parameters during the no-load cooking test of the cooking utensil to be tested, and based on the temperature, obtain and output the cooking test result; the mica sheet is set on the holding part of the cooking utensil to be tested based on the prompt information.

[0119] In one embodiment, Figure 6 As shown, the cooking utensil testing device 100 further includes a corresponding relationship establishing module 110 for establishing a corresponding relationship between the test mode and the mica sheet parameters based on the response surface analysis method.

[0120] In one embodiment, Figure 7 As shown, the corresponding relationship establishing module 110 includes a parameter combination determining unit 112, a cooking test result determining unit 114, a mica sheet parameter determining unit 116 and a corresponding relationship establishing unit 118, wherein:

[0121] A parameter combination determination unit 112, for determining a parameter combination of a mica sheet for a no-load cooking test based on a response surface analysis method;

[0122] A cooking test result determination unit 114 is used to obtain the temperature of each parameter mica sheet under different test modes, and determine the cooking test result corresponding to each parameter mica sheet based on the temperature;

[0123] The mica sheet parameter determination unit 116 is used to determine the mica sheet parameters in each test mode according to each cooking test result and the actual cooking result of the food in the corresponding test mode;

[0124] The corresponding relationship establishing unit 118 is used to establish the corresponding relationship between the test mode and the mica sheet parameter according to each test mode and its corresponding mica sheet parameter.

[0125] In one embodiment, the number of mica sheets in each parameter mica sheet is more than two, and the cooking test result determination unit 114 is specifically used to: obtain the temperature of each parameter mica sheet under different test modes; calculate the temperature control accuracy and temperature uniformity of the cooking utensil to be tested according to the temperature, and determine the cooking test results corresponding to each parameter mica sheet based on the temperature control accuracy and temperature uniformity.

[0126] In one embodiment, the number of mica sheets corresponding to the parameters is more than two, and each mica sheet is arranged at a different position of the holding part of the cooking utensil to be tested based on the prompt information; the test result determination module 160 is specifically used to: obtain the temperature of the mica sheet corresponding to the parameters during the no-load cooking test of the cooking utensil to be tested, determine the heating temperature uniformity and heating temperature variation of the cooking utensil to be tested according to the temperature, and obtain and output the cooking test result of the cooking utensil to be tested based on the heating temperature uniformity and heating temperature variation.

[0127] In one embodiment, the cooking utensil to be tested is a baking cooking utensil, and the test modes include a heat convection mode and a heat radiation mode.

[0128] In one embodiment, the parameters of the mica sheet include the size and thickness of the mica sheet, and the placement position of the mica sheet in the containing portion.

[0129] Each module in the cooking utensil testing device can be implemented in whole or in part by software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each module.

[0130] In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Figure 8As shown. The computer device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be achieved through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a cooking utensil testing method is implemented. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covered on the display screen, or a key, trackball or touchpad set on the computer device housing, or an external keyboard, touchpad or mouse, etc.

[0131] Those skilled in the art will understand that Figure 8 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0132] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above-mentioned method embodiments when executing the computer program.

[0133] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0134] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0135] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0136] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0137] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A cooking utensil testing method, characterized in that: include: obtaining a test mode of the cooking appliance to be tested; According to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, the parameters of the mica sheet used for the cooking test are determined, and prompt information is output; Acquire the temperature of the mica sheet of the parameter during the no-load cooking test of the cooking utensil to be tested, and obtain and output the cooking test result based on the temperature; The mica sheet is arranged on the holding portion of the cooking utensil to be tested based on the prompt information.

2. The cooking utensil testing method according to claim 1, characterized in that: The method further includes determining the parameters of the mica sheet used for the cooking test according to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, and outputting the prompt information before: Based on response surface methodology, the corresponding relationship between the test mode and the mica sheet parameters was established.

3. The cooking utensil testing method according to claim 2, characterized in that: The corresponding relationship between the test mode and the mica sheet parameters is established based on the response surface analysis method, including: Based on response surface methodology, the parameter combination of mica sheets for no-load cooking test was determined; Acquire the temperature of each parameter mica sheet under different test modes, and determine the cooking test result corresponding to each parameter mica sheet based on the temperature; Determine the mica sheet parameters under each of the test modes according to each of the cooking test results and the actual cooking results of the food under the corresponding test mode; According to each of the test modes and its corresponding mica sheet parameters, a corresponding relationship between the test mode and the mica sheet parameters is established.

4. The cooking utensil testing method according to claim 3, characterized in that: The number of mica sheets in each parameter mica sheet is more than two sheets, and the obtaining of the temperature of each parameter mica sheet under different test modes, and determining the cooking test result corresponding to each parameter mica sheet based on the temperature, includes: Get the temperature of mica sheets of various parameters under different test modes; According to the temperature, the temperature control accuracy and temperature uniformity of the cooking utensil to be tested are calculated, and based on the temperature control accuracy and the temperature uniformity, the cooking test results corresponding to the mica sheets of each parameter are determined.

5. The cooking utensil testing method according to claim 1, characterized in that: The number of the mica sheets of the parameter is more than two, and each of the mica sheets is arranged at a different position of the holding part of the cooking utensil to be tested based on the prompt information; the temperature of the mica sheet of the parameter during the no-load cooking test of the cooking utensil to be tested is obtained, and based on the temperature, a cooking test result is obtained and outputted, including: The temperature of the mica sheet with corresponding parameters during the no-load cooking test of the cooking utensil to be tested is obtained, and the heating temperature uniformity and heating temperature variation of the cooking utensil to be tested are determined according to the temperature, and based on the heating temperature uniformity and the heating temperature variation, the cooking test result of the cooking utensil to be tested is obtained and output.

6. The cooking utensil testing method according to any one of claims 1 to 5, characterized in that: The cooking utensil to be tested is a baking cooking utensil, and the test mode includes a heat convection mode and a heat radiation mode.

7. The cooking utensil testing method according to any one of claims 1 to 5, characterized in that: The parameters of the mica sheet include the size and thickness of the mica sheet, and the placement position of the mica sheet in the containing portion.

8. A cooking utensil testing device, characterized in that: include: A test mode acquisition module, used to acquire the test mode of the cooking appliance to be tested; A mica sheet parameter determination module, used to determine the parameters of the mica sheet used for the cooking test according to the test mode and the corresponding relationship between the test mode and the mica sheet parameters, and output prompt information; a test result determination module, for obtaining the temperature of the mica sheet of the parameter during the no-load cooking test of the cooking utensil to be tested, and obtaining and outputting the cooking test result based on the temperature; The mica sheet is arranged on the holding portion of the cooking utensil to be tested based on the prompt information.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

Images