A tower test circuit, system and method

Abstract

The present application is applicable to the field of tower test technology, and provides a tower test circuit, system and method, wherein the tower test circuit includes a power module, an overcurrent detection module, n DC switches, n coupling modules, n+2 two-to-one switches, two n-to-one switches, an attenuation module, a modulation and demodulation module, a control module, an interface conversion module and an RS485 module. The present application controls the on and off of n DC switches, n coupling modules, n+2 two-to-one switches and two n-to-one switches through a control module to switch the test circuit, so that based on only one tower test circuit, the transmission intensity and receiving sensitivity of the on-off keying signal of the BTS port of the tower and the RS485 signal channel of the RET port can be tested to ensure that the performance of the AISG signal of the tower meets the requirements. At the same time, according to the requirements of the AISG protocol, the transmission power and receiving sensitivity of the modem of the AISG signal are tested, which is conducive to the realization of automated testing.

Description

Technical Field

[0001] The present application belongs to the field of tower mounted amplifier (TMA) testing technology, and in particular, relates to a tower mounted amplifier testing circuit, system and method. Background Art

[0002] When testing the antenna interface standard group (AISG) signal of the tower, it is necessary to test the transmission strength and receiving sensitivity of the on-off keying (OOK) signal of the base transceiver station (BTS) port of the tower and the RS485 signal channel of the remote electrical tilt (RET) port to ensure that the performance of the AISG signal of the tower meets the requirements. At the same time, according to the AISG protocol requirements, the modem of the AISG signal should meet the transmission power of 3dBm±2dBm and the receiving sensitivity of -15dBm±3dBm.

[0003] However, existing tower test solutions usually require the use of multiple different devices to test different indicators, making it difficult to achieve automated testing. Summary of the invention

[0004] The embodiments of the present application provide a tower test circuit, system and method to solve the problem that existing tower test solutions usually require multiple different devices to test different indicators and are difficult to implement automated testing.

[0005] A first aspect of an embodiment of the present application provides a tower test circuit, including a power supply module, an overcurrent detection module, n DC switches, n coupling modules, n+2 two-to-one switches, two n-to-one switches, an attenuation module, a modulation and demodulation module, a control module, an interface conversion module and an RS485 module;

[0006] The input end of the power module constitutes the power end of the tower release test circuit, the first output end of the power module is electrically connected to the input end of the overcurrent detection module, and the second output end of the power module is electrically connected to the overcurrent detection module, the modulation and demodulation module and the power end of the control module;

[0007] The input and output of the i-th DC switch are electrically connected to the output of the overcurrent detection module and the input of the i-th coupling module, respectively; the input and output of the i-th coupling module constitute the i-th BTS end of the tower release test circuit; the input, first output and second output of the i-th two-to-one switch are electrically connected to the output of the i-th coupling module, the i-th input of the first n-to-one switch and the i-th input of the second n-to-one switch, respectively; the input, first output and second output of the n+1-th two-to-one switch are electrically connected to the output of the first n-to-one switch, the first input of the n+2-th two-to-one switch and the input of the attenuation module, respectively; the second input and output of the n+2-th two-to-one switch are electrically connected to the output of the attenuation module and the input of the modulation and demodulation module, respectively; and the output of the second n-to-one switch constitutes the test equipment end of the tower release test circuit;

[0008] The UART ends of the modulation and demodulation module and the control module are electrically connected to the UART end of the interface conversion module, the USB end of the interface conversion module constitutes the control device end of the tower release test circuit, the 2n+4 switch control ends of the control module are electrically connected to the controlled ends of n DC switches, n+2 two-choose-one switches and two n-choose-one switches, the detection end and the UART end of the control module are electrically connected to the output end of the overcurrent detection module and the UART end of the RS485 module, and the RS485 end of the RS485 module constitutes the RET end of the tower release test circuit;

[0009] Among them, i=1,2,…,n and n≥2.

[0010] In one embodiment, the power module includes an AC-DC conversion unit and a DC conversion unit;

[0011] The input end and the first output end of the AC / DC conversion unit constitute the input end and the first output end of the power module respectively, the second output end of the AC / DC conversion unit is electrically connected to the input end of the DC conversion unit, and the output end of the DC conversion unit constitutes the second output end of the power module.

[0012] In one embodiment, the i-th coupling module includes an i-th decoupling inductor and an i-th coupling capacitor;

[0013] The first end of the i-th decoupling inductor constitutes the input end of the i-th coupling module, the second end of the i-th decoupling inductor and the first end of the i-th coupling capacitor are electrically connected to constitute the input and output ends of the i-th coupling module, and the second end of the i-th coupling capacitor constitutes the output end of the i-th coupling module.

[0014] In one embodiment, the attenuation module includes an adjustable attenuator with an attenuation range of -5dBm to -20dBm.

[0015] In one embodiment, the tower release test circuit further includes an n+1th DC switch;

[0016] The input end of the n+1th DC switch is electrically connected to the UART transmitting end of the interface conversion module and the UART receiving end of the control module;

[0017] The output terminal and the controlled terminal of the n+1th DC switch are electrically connected to the UART receiving terminal of the modulation and demodulation module and the 2n+5th switch control terminal of the control module respectively;

[0018] The UART receiving end of the interface conversion module, the UART transmitting end of the modulation and demodulation module and the UART transmitting end of the control module are electrically connected.

[0019] In one embodiment, n=2 or n=4.

[0020] In one embodiment, the DC switch is a single-pole single-throw switch, the two-to-one switch is a single-pole double-throw switch, and the n-to-one switch is a single-pole multi-throw switch.

[0021] A second aspect of the embodiments of the present application provides a tower test system, including an AC power supply, a tower, a test device, a control device, and the tower test circuit provided by the first aspect;

[0022] The power supply end, test equipment end and control equipment end of the tower test circuit are electrically connected to the AC power supply, test equipment and control equipment respectively, and the n BTS ends and RET ends of the tower test circuit are electrically connected to the n BTS ports and RET ports of the tower respectively.

[0023] A third aspect of the embodiments of the present application provides a tower placement test method implemented by the tower placement test system provided by the second aspect, comprising the following steps performed by a control device:

[0024] Control the input and output ends of the i-th DC switch to be connected, supply power to the i-th BTS end of the tower amplifier, and perform overcurrent detection on the i-th BTS end of the tower amplifier;

[0025] If the i-th BTS end of the tower is overcurrent, the input and output ends of the i-th DC switch are controlled to be disconnected and the test is terminated;

[0026] If the i-th BTS end of the tower is not overcurrent, keep the input and output of the i-th DC switch connected, control the input and first output of the i-th two-to-one switch to be connected, the i-th input and output of the first n-to-one switch to be connected, the input and first output of the n+1-th two-to-one switch to be connected, and the first input and output of the n+2-th two-to-one switch to be connected, and scan the i-th BTS port and RET port of the tower according to the AISG standard protocol to perform communication detection without signal attenuation on the tower and the RET port of the tower;

[0027] Keep the input and output of the i-th DC switch connected, the input and the first output of the i-th two-to-one switch connected, and the i-th input and output of the first n-to-one switch connected, control the on-off state of the n+1-th two-to-one switch to switch the input and the second output connected, and the on-off state of the n+2-th two-to-one switch to switch the second input and the output connected, scan the i-th BTS port and RET port of the tower according to the AISG standard protocol, so as to perform communication detection with signal attenuation on the tower and the RET port of the tower;

[0028] Keep the input and output of the i-th DC switch connected, control the on-off state of the i-th two-to-one switch to switch the input and the second output to be connected, and the i-th input and output of the second n-to-one switch to be connected, set the RS485 module to a continuous output state, and obtain the amplitude of the AISG signal detected by the test equipment and transmitted to the i-th BTS port via the RET port of the tower amplifier, so as to perform AISG signal transmission strength detection on the i-th BTS port of the tower amplifier;

[0029] If the amplitude of the AISG signal of the ith BTS port on the tower is within the preset amplitude range, it is determined that the test has passed.

[0030] In one embodiment, when the tower release test circuit further includes an n+1th DC switch, the tower release test method further includes:

[0031] When scanning the i-th BTS port and RET port of the tower according to the AISG standard protocol, the input and output ends of the n+1-th DC switch are controlled to be turned on;

[0032] When the AISG signal transmission strength detection is performed on the i-th BTS port on the tower, the input and output ends of the n+1-th DC switch are controlled to be disconnected.

[0033] The first aspect of the embodiment of the present application provides a tower-mounted test circuit, including a power module, an overcurrent detection module, n DC switches, n coupling modules, n+2 two-to-one switches, two n-to-one switches, an attenuation module, a modulation and demodulation module, a control module, an interface conversion module and an RS485 module; the control module controls the on and off of the n DC switches, n coupling modules, n+2 two-to-one switches and two n-to-one switches to realize the switching of the test line, so that based on only one tower-mounted test circuit, the transmission intensity and receiving sensitivity of the on-off keying signal of the BTS port of the tower and the RS485 signal channel of the RET port can be tested to ensure that the performance of the AISG signal of the tower meets the requirements. At the same time, according to the requirements of the AISG protocol, the transmission power and receiving sensitivity of the modem of the AISG signal are tested, and there is no need to use multiple different devices to realize the testing of different indicators, which is conducive to the realization of automated testing.

[0034] It can be understood that the beneficial effects of the second and third aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0036] Figure 1 This is a first structural schematic diagram of a tower release test circuit provided in an embodiment of the present application;

[0037] Figure 2 It is a second structural schematic diagram of the tower release test circuit provided in an embodiment of the present application;

[0038] Figure 3 It is a structural schematic diagram of a tower test system provided in an embodiment of the present application;

[0039] Figure 4 It is a flow chart of the tower release test method provided in the embodiment of the present application. DETAILED DESCRIPTION

[0040] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0041] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0042] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0043] As used in the specification and appended claims of this application, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce [described condition or event] is detected" or "in response to detecting [described condition or event]", depending on the context.

[0044] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0045] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways. "Multiple" means two or more.

[0046] like Figure 1 As shown, the embodiment of the present application provides a tower test circuit 10, including a power supply module 1, an overcurrent detection module 2, two DC switches K1 and K2, two coupling modules 31 and 32, six two-choose-one switches K3-K8, an attenuation module 4, a modulation and demodulation module 5, a control module 6, an interface conversion module 7 and an RS485 module 8;

[0047] The input end of the power module 1 constitutes the power end AC of the tower discharge test circuit 10, the first output end of the power module 1 is electrically connected to the input end of the overcurrent detection module 2, and the second output end of the power module 1 is electrically connected to the overcurrent detection module 2, the modulation and demodulation module 5 and the power end of the control module 6;

[0048] The input end and the output end of the first DC switch K1 are electrically connected to the output end of the overcurrent detection module 2 and the input end of the first coupling module 31 respectively;

[0049] The input end and the output end of the second DC switch K2 are electrically connected to the output end of the overcurrent detection module 2 and the input end of the second coupling module 32 respectively;

[0050] The input and output terminals of the first coupling module 31 constitute the first BTS terminal BTS1 of the tower test circuit 10;

[0051] The input and output terminals of the second coupling module 32 constitute the second BTS terminal BTS2 of the tower test circuit 10;

[0052] The input end, the first output end and the second output end of the first two-to-one switch K3 are electrically connected to the output end of the first coupling module 31, the first input end of the fifth two-to-one switch K7 and the first input end of the sixth two-to-one switch K8 respectively;

[0053] The input end, the first output end and the second output end of the second two-to-one switch K4 are electrically connected to the output end of the second coupling module 32, the second input end of the fifth two-to-one switch K7 and the second input end of the sixth two-to-one switch K8 respectively;

[0054] The input end, the first output end and the second output end of the third two-to-one switch K5 are electrically connected to the output end of the fifth two-to-one switch K7, the first input end of the fourth two-to-one switch K6 and the input end of the attenuation module 4 respectively;

[0055] The second input end and the output end of the fourth two-to-one switch K6 are electrically connected to the output end of the attenuation module 4 and the input end of the modulation and demodulation module 5 respectively, and the output end of the sixth two-to-one switch K8 constitutes the test equipment end TEXT of the tower release test circuit 10;

[0056] The UART terminals of the modulation and demodulation module 5 and the control module 6 are electrically connected to the UART terminal of the interface conversion module 7;

[0057] The USB end of the interface conversion module 7 constitutes the control device end USB of the tower release test circuit 10;

[0058] The eight switch control ends of the control module 6 are electrically connected to the controlled ends of the two DC switches K1 and K2 and the six two-choice switches K3~K8 respectively. The detection end and UART end of the control module 6 are electrically connected to the output end of the overcurrent detection module 2 and the UART end of the RS485 module 8 respectively. The RS485 end of the RS485 module constitutes the RET end RET of the tower release test circuit.

[0059] In application, the power supply module can be realized by an AC / DC conversion (AC to DC) device and a DC conversion (DC to DC) device; wherein the AC / DC conversion device is used to convert an AC power supply (for example, a mains AC power supply) into a DC power supply (for example, a 24V DC power supply) for overcurrent detection of the tower amplifier and output it to the BTS port of the tower amplifier to power the tower amplifier, and the DC conversion device is used to further convert the DC power supply output by the AC / DC conversion device into a DC power supply (for example, a 5V or 3.3V DC power supply) suitable for the overcurrent detection module, the modulation and demodulation module and the control module and output it to the power supply end of the overcurrent detection module, the modulation and demodulation module and the control module to power the overcurrent detection module, the modulation and demodulation module and the control module.

[0060] In the application, the overcurrent detection module can be implemented by a comparison device, which is used to detect the current when the power module outputs the DC power to the BTS port placed on the tower. If the current is greater than the preset current value, the first alarm signal is output to the control module, so that the control module outputs the second alarm signal to the control device through its control device end to realize an overcurrent alarm.

[0061] In the application, the tower test circuit includes n DC switches, n coupling modules, n+2 two-to-one switches and two n-to-one switches. The connection relationship between these components and other modules is as follows:

[0062] The input and output of the i-th DC switch are electrically connected to the output of the overcurrent detection module and the input of the i-th coupling module, respectively; the input and output of the i-th coupling module constitute the i-th BTS end of the tower release test circuit; the input, first output and second output of the i-th two-to-one switch are electrically connected to the output of the i-th coupling module, the i-th input of the first n-to-one switch and the i-th input of the second n-to-one switch, respectively; the input, first output and second output of the n+1-th two-to-one switch are electrically connected to the output of the first n-to-one switch, the first input of the n+2-th two-to-one switch and the input of the attenuation module, respectively; the second input and output of the n+2-th two-to-one switch are electrically connected to the output of the attenuation module and the input of the modulation and demodulation module, respectively; the output of the second n-to-one switch constitutes the test equipment end of the tower release test circuit; and the 2n+4 switch control ends of the control module are electrically connected to the controlled ends of the n DC switches, the n+2 two-to-one switches and the two n-to-one switches, respectively;

[0063] Among them, i=1,2,…,n and n≥2.

[0064] In application, the tower release test circuit includes at least two DC switches, and the number of coupling modules and two-choice switches is determined by the number of DC switches. Specifically, the number of coupling modules is equal to the number of DC switches, and the number of two-choice switches is equal to the number of DC switches plus 2. The value of n can be 2 or 4, that is, n=2 or n=4. When the number of DC switches in the tower release test circuit is two, it can be applied to test a tower release with two BTS ports; when the number of DC switches in the tower release test circuit is four, it can be applied to both a tower release with two BTS ports and a tower release with four BTS ports for communication testing.

[0065] Figure 1 FIG. 4 exemplarily shows a schematic diagram of the structure of the tower test circuit when n=2.

[0066] In the application, the on-off state of the DC switch is controlled by the electric control signal output by the control module. The DC switch can be implemented by an analog single-pole single-throw switch or an electronic switch tube (for example, a field effect tube or a triode). When the DC switch is an analog single-pole single-throw switch, the two fixed ends of the analog single-pole single-throw switch are used as the input end and the output end, and one moving end is used as the controlled end; when the DC switch is an electronic switch tube, the source and drain (or collector and emitter) of the electronic switch tube are used as the input end and the output end, and the gate (or base) is used as the controlled end.

[0067] In application, the coupling module can be implemented by at least one decoupling inductor and at least one coupling capacitor. When the coupling module includes multiple decoupling inductors, the multiple decoupling inductors are connected in series; when the coupling module includes multiple coupling capacitors, the multiple coupling capacitors can be connected in series, in parallel, or in a mixed series-parallel connection. The coupling inductor is used to realize the coupling transmission of large current signals, specifically for coupling the large current signal output by the power module for powering the tower to the BTS port of the tower; the coupling capacitor is used to realize the coupling transmission of small current signals, specifically for coupling the AISG signal output by the tower to the attenuation module, the modulation and demodulation module or the test equipment.

[0068] In application, the two-choice switch can be realized by a simulated single-pole double-throw switch that can be controlled by an electrical control signal output by a control module, or a switch device or chip with corresponding functions. When the two-choice switch is a simulated single-pole double-throw switch, the three fixed ends of the simulated single-pole double-throw switch serve as corresponding input ends or output ends, and one moving end serves as a controlled end.

[0069] In applications, the n-to-one switch can be realized by an analog single-pole-n-throw switch that can be controlled by an electrical control signal output by a control module, or a switch device or chip with corresponding functions. When the two-to-one switch is an analog single-pole-n-throw switch, the n+1 fixed ends of the analog single-pole-n-throw switch serve as corresponding input ends or output ends, and one moving end serves as a controlled end.

[0070] In the application, the attenuation module can be implemented by an attenuator, which is used to attenuate the AISG signal output from the BTS port of the tower. An attenuation module with adjustable or non-adjustable attenuation value can be selected according to actual needs. For example, the attenuator can be an adjustable attenuator with an attenuation range of -5dBm to -20dBm, or a non-adjustable attenuator with an attenuation value of -15dBm.

[0071] In applications, the modulation and demodulation module can be implemented by a modem capable of modulating and demodulating AISG signals. The modem should comply with a transmit power of 3dBm±2dBm and a receive sensitivity of -15dBm±3dBm.

[0072] In applications, the control module can be implemented by a central processing unit (CPU), a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general processor can be a microcontroller unit (MCU) or any conventional processor, etc.

[0073] In the application, the interface conversion module can be implemented through a USB interface to UART interface module, which is used to realize the conversion of the interface and communication protocol between the USB interface and the UART interface; wherein the USB interface is used for external control devices, and the UART interface is used for electrical connection with the modem module and the control module.

[0074] In application, the RS485 module can be implemented by an RS485 chip or circuit to realize the electrical connection between the control module and the RET port of the tower amplifier, so that the control module can simulate the antenna behavior and perform communication test on the RET port of the tower amplifier.

[0075] In application, the tower test circuit can be integrated into a tower test device, and its power supply end, BTS end, control device end and RET end can each be provided with an interface for connecting to an external device, so as to facilitate connecting the external device for testing.

[0076] like Figure 2 As shown, in one embodiment, the power module 1 includes an AC-DC conversion unit 11 and a DC conversion unit 12;

[0077] The input end and the first output end of the AC / DC conversion unit 11 respectively constitute the input end and the first output end of the power module 1, the second output end of the AC / DC conversion unit 11 is electrically connected to the input end of the DC conversion unit 12, and the output end of the DC conversion unit 12 constitutes the second output end of the power module 1.

[0078] like Figure 2 As shown, in one embodiment, the first coupling module 31 includes a first decoupling inductor L1 and a first coupling capacitor C1, and the second coupling module 32 includes a second decoupling inductor L2 and a second coupling capacitor C2;

[0079] The first end of the first decoupling inductor L1 constitutes the input end of the first coupling module 31, the second end of the first decoupling inductor L1 and the first end of the first coupling capacitor C1 are electrically connected to constitute the input and output ends of the first coupling module 31, and the second end of the first coupling capacitor C1 constitutes the output end of the first coupling module 31;

[0080] The first end of the second decoupling inductor L2 constitutes the input end of the second coupling module 32, the second end of the second decoupling inductor L2 and the first end of the second coupling capacitor C2 are electrically connected to constitute the input and output ends of the second coupling module 32, and the second end of the second coupling capacitor C2 constitutes the output end of the second coupling module 32.

[0081] like Figure 2 As shown, in one embodiment, the tower release test circuit 10 further includes a third DC switch K9;

[0082] The input end of the third DC switch K9 is electrically connected to the UART transmitting end of the interface conversion module 7 and the UART receiving end of the control module 6;

[0083] The output end and the controlled end of the third DC switch K9 are electrically connected to the UART receiving end UART_RX of the modulation and demodulation module 5 and the ninth switch control end of the control module 6 respectively;

[0084] The UART receiving end of the interface conversion module 7, the UART transmitting end UART_TX of the modulation and demodulation module 5 and the UART transmitting end of the control module are electrically connected.

[0085] In the application, the tower test circuit includes n coupling modules, each coupling module includes a decoupling inductor and a coupling capacitor, and the connection relationship between the decoupling inductor and the coupling capacitor in each coupling module is specifically as follows:

[0086] The i-th coupling module includes the i-th decoupling inductor and the i-th coupling capacitor;

[0087] The first end of the i-th decoupling inductor constitutes the input end of the i-th coupling module, the second end of the i-th decoupling inductor and the first end of the i-th coupling capacitor are electrically connected to constitute the input and output ends of the i-th coupling module, and the second end of the i-th coupling capacitor constitutes the output end of the i-th coupling module.

[0088] The tower test circuit provided in the embodiment of the present application can be used to test the transmission strength and receiving sensitivity of the on-off keying signal of the BTS port of the tower and the RS485 signal channel of the RET port to ensure that the performance of the AISG signal of the tower meets the requirements. At the same time, according to the requirements of the AISG protocol, the transmission power and receiving sensitivity of the modem of the AISG signal are tested. There is no need to use multiple different devices to implement the testing of different indicators, which is conducive to realizing automated testing; according to the number of BTS ends of the tower test circuit, it can also be applied to test towers with a corresponding number of BTS ports.

[0089] like Figure 3 As shown, the embodiment of the present application provides a tower release test system, including an AC power supply 20, a tower release 30, a test device 40, a control device 50 and a tower release test circuit 10;

[0090] The power supply end AC, the test equipment end TEXT and the control equipment end USB of the tower test circuit 10 are electrically connected to the AC power supply 20, the test equipment 30 and the control equipment 40 respectively, and the two BTS ends BTS1 and BTS2 and the RET end RET of the tower test circuit 10 are electrically connected to the two BTS ports and the RET port of the tower 30 respectively.

[0091] In application, the tower test circuit includes n BTS terminals, and the n BTS terminals are electrically connected to n BTS ports of the tower, respectively.

[0092] Figure 3 The structural diagram of the tower test system when n=2 is shown as an example.

[0093] In the application, the test equipment can be a spectrum analyzer or a detector, and the control equipment can be a computing device capable of data processing such as a personal computer (PC) or a laptop. The control equipment is used to output control instructions to the BTS port, the test equipment and the control module of the tower amplifier to control the working state of the tower amplifier, the test equipment and the control module. Specifically, the control equipment is used to control the on / off state of each switch in the tower amplifier test circuit through the control module, set the port state of the RS485 module, and control the test equipment to perform AISG signal test on the tower amplifier.

[0094] like Figure 4 As shown, the embodiment of the present application provides a tower test method based on a tower test system, which can be executed by controlling a tower test circuit and a test device when a control device runs a corresponding computer program, including the following steps S101 to S106:

[0095] Step S101, control the input and output ends of the i-th DC switch to be connected, supply power to the i-th BTS end of the tower, and perform overcurrent detection on the i-th BTS end of the tower; if the i-th BTS end of the tower is overcurrent, proceed to step S102; if the i-th BTS end of the tower is not overcurrent, proceed to step S103.

[0096] In the application, in step S101, the control device controls the ith DC switch to close, connects the electrical connection path between the AC power supply and the ith BTS end of the tower, supplies power to the ith BTS end of the tower to perform overcurrent detection on the ith BTS end of the tower.

[0097] Step S102: Control the input and output ends of the i-th DC switch to be disconnected and terminate the test.

[0098] In the application, in step S102, when an overcurrent is detected at the i-th BTS end of the tower, it indicates that the overcurrent detection of the i-th BTS end of the tower is unqualified. At this time, it is necessary to control the i-th DC switch to disconnect, stop supplying power to the i-th BTS end of the tower and terminate the entire test process.

[0099] Step S103, keep the input and output of the i-th DC switch connected, control the input and the first output of the i-th two-to-one switch to be connected, the i-th input and the output of the first n-to-one switch to be connected, the input and the first output of the n+1-th two-to-one switch to be connected, and the first input and the output of the n+2-th two-to-one switch to be connected, scan the i-th BTS port and the RET port of the tower according to the AISG standard protocol to perform communication detection without signal attenuation on the tower and the RET port of the tower, and enter step S104.

[0100] In the application, in step S103, when it is detected that the i-th BTS end of the tower is not overcurrent, it indicates that the overcurrent detection of the i-th BTS end of the tower is qualified. At this time, the input end and the first output end of the i-th two-to-one switch can be controlled to be connected, the i-th input end and the output end of the first n-to-one switch can be connected, the input end and the first output end of the n+1-th two-to-one switch can be connected, and the first input end and the output end of the n+2-th two-to-one switch can be connected. Scan the i-th BTS port and RET port of the tower according to the AISG standard protocol to perform communication detection without signal attenuation on the tower and the RET port of the tower. At this time, the control device can scan the virtual device of the tower itself and the RET port of the tower test circuit. Perform communication detection without signal attenuation, and the communication detection without signal attenuation can specifically be AISG signal + 3dBm tower communication detection and AISG signal + 3dBmRET port communication detection;

[0101] Step S104, keep the input and output of the i-th DC switch connected, the input and the first output of the i-th two-to-one switch connected, and the i-th input and output of the first n-to-one switch connected, control the on-off state of the n+1-th two-to-one switch to switch the input and the second output connected, and the on-off state of the n+2-th two-to-one switch to switch the second input and the output connected, scan the i-th BTS port and RET port of the tower according to the AISG standard protocol, so as to perform communication detection with signal attenuation on the tower and the RET port of the tower, and enter step S105.

[0102] In the application, in step S104, after completing the communication detection of the tower amplifier without signal attenuation, the input end and the second output end of the n+1th two-to-one switch are controlled to be connected and the second input end and the output end of the n+2th two-to-one switch are controlled to be connected, so as to scan the tower amplifier according to the AISG standard protocol to scan the i-th BTS end and RET port of the tower amplifier, so as to perform communication detection of the tower amplifier and the RET port of the tower amplifier without signal attenuation. At this time, the control device can scan the virtual device of the tower amplifier itself and the RET port of the tower amplifier test circuit. The communication detection with signal attenuation can specifically be the tower communication detection of AISG signal +3dBm-attenuation module's attenuation value and the tower RET port communication detection of AISG signal +3dBm-attenuation module's attenuation value; wherein, the attenuation range of the attenuation value of the attenuation module is -5dBm to -20dBm, specifically -15dBm, that is, the communication detection with signal attenuation can specifically be the tower communication detection of AISG signal -2dBm to -18dBm and the RET port communication detection of AISG signal -2dBm to -18dBm, specifically the tower communication detection of AISG signal -12dBm and the RET port communication detection of AISG signal -12dBm.

[0103] In application, the execution order of steps S103 and S104 can be exchanged, that is, the tower and the RET port of the tower can be tested for communication with signal attenuation first, and then the tower and the RET port of the tower can be tested for communication without signal attenuation.

[0104] Step S105, keep the input and output ends of the i-th DC switch connected, control the on-off state of the i-th two-to-one switch to switch the input end and the second output end to be connected, and the i-th input and output ends of the second n-to-one switch to be connected, set the RS485 module to a continuous output state, obtain the amplitude of the AISG signal detected by the test equipment and transmitted to the i-th BTS port via the RET port of the tower, so as to perform AISG signal transmission strength detection on the i-th BTS port of the tower, and enter step S106.

[0105] In the application, in step S105, after completing the communication detection of the tower with signal attenuation, the input end and the second output end of the i-th two-to-one switch are controlled to be connected, and the i-th input end and output end of the second n-to-one switch are connected, and the RS485 module is set to a continuous output state. At this time, the test equipment detects the amplitude of the AISG signal transmitted from the RET port of the tower to the i-th BTS port, and sends the detection result to the control equipment. The control equipment obtains the amplitude of the AISG signal sent by the test equipment and determines whether it is within the preset amplitude range, so as to realize the detection of the AISG signal transmission intensity of the i-th BTS port of the tower. The preset amplitude range can be set according to actual needs, for example, 1dBm~5dBm;

[0106] Step S106: If the amplitude of the AISG signal of the i-th BTS port on the tower is within the preset amplitude range, it is determined that the test has passed, and the process returns to step S101 with i=i++.

[0107] In the application, in step S106, when the amplitude of the AISG signal transmitted by the i-th BTS port of the tower is within the preset amplitude range, it is determined that the AISG signal transmission strength test of the i-th BTS port of the tower has passed, otherwise, it is determined that the AISG signal transmission strength test of the i-th BTS port of the tower has failed.

[0108] In the application, after step S106, after the AISG signal transmission strength test of the i-th BTS end of the tower is passed, if i=i+1, return to execute steps S101 to S106 again to implement the relevant tests on the i+1-th BTS port and RET port of the tower.

[0109] In one embodiment, when the tower test circuit further includes an n+1th DC switch (for example, Figure 2The tower release test circuit including the third DC switch K9 shown in the figure), the tower release test method also includes the following steps:

[0110] When scanning the i-th BTS port and RET port of the tower according to the AISG standard protocol, the input and output ends of the n+1-th DC switch are controlled to be turned on;

[0111] When the AISG signal transmission strength detection is performed on the i-th BTS port on the tower, the input and output ends of the n+1-th DC switch are controlled to be disconnected.

[0112] In the application, in order to prevent the current of the command signal output by the control device from interfering with the i-th BTS port of the tower under test, the n+1-th DC switch is closed only when the i-th BTS port and RET port of the tower are scanned according to the AISG standard protocol (that is, in step S103 and step S104), and the n+1-th DC switch is opened at other times (that is, in step S105 and step S106).

[0113] The tower placement test method provided in the embodiment of the present application can implement the following test items for the tower placement AISG signal:

[0114] 1. Overcurrent detection;

[0115] 2. AISG signal +3dBm tower communication detection;

[0116] 3. AISG signal +3dBmRET port communication detection;

[0117] 4. AISG signal -2dBm~-18dBm tower communication detection;

[0118] 5. AISG signal -2dBm~-18dBm RET port communication detection;

[0119] 6. Test the AISG signal transmission strength of the tower BTS port.

[0120] In application, the tower test circuit may also include a memory. Those skilled in the art will appreciate that Figure 1 and Figure 2 This is only an example of a tower release test circuit and does not constitute a limitation on the tower release test circuit. The tower release test circuit may include more or fewer components than shown in the figure, or a combination of certain components, or different components.

[0121] In application, the memory may be an internal storage unit of the control module in some embodiments, for example, the memory of the control module. The memory may also be an external storage device of the control module in other embodiments, for example, a smart media card (SMC), a secure digital (SD) card, a flash card, etc., equipped in the tower test circuit. The memory may also include both an internal storage unit of the control module and an external storage device. The memory is used to store application programs, boot loaders, data, and other programs, such as program codes of computer programs. The memory may also be used to temporarily store data that has been output or is to be output.

[0122] It should be noted that the information interaction, execution process, etc. between the above-mentioned devices / modules are based on the same concept as the method embodiment of the present application. Their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0123] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, only the division of the above-mentioned functional modules is used as an example for illustration. In actual applications, the above-mentioned function allocation can be completed by different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. The functional modules in the embodiment can be integrated into a processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The above-mentioned integrated modules can be implemented in the form of hardware or in the form of software functional modules. In addition, the specific names of the functional modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0124] The embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned tower test method embodiment can be implemented.

[0125] An embodiment of the present application provides a computer program product. When the computer program product runs on a control device, the control device can implement the steps in the above-mentioned tower test method embodiment.

[0126] If the integrated module is implemented in the form of a software function module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the process in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the steps of the above-mentioned various method embodiments can be implemented. Among them, the computer program includes a computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may at least include: any entity or device capable of carrying the computer program code to the motor controller, a recording medium, a computer memory, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), an electric carrier signal, a telecommunication signal, and a software distribution medium. For example, a USB flash drive, a mobile hard disk, a disk or an optical disk.

[0127] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0128] Those of ordinary skill in the art will appreciate that the modules and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0129] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the modules is only a logical function division. There may be other division methods in actual implementation, such as multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or modules, which can be electrical, mechanical or other forms.

[0130] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical modules, that is, they may be located in one place or distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0131] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A tower test circuit, characterized in that: It includes a power supply module, an overcurrent detection module, n DC switches, n coupling modules, n+2 two-to-one switches, two n-to-one switches, an attenuation module, a modulation and demodulation module, a control module, an interface conversion module and an RS485 module; The input end of the power module constitutes the power end of the tower release test circuit, the first output end of the power module is electrically connected to the input end of the overcurrent detection module, and the second output end of the power module is electrically connected to the overcurrent detection module, the modulation and demodulation module and the power end of the control module; The input and output of the i-th DC switch are electrically connected to the output of the overcurrent detection module and the input of the i-th coupling module, respectively; the input and output of the i-th coupling module constitute the i-th BTS end of the tower release test circuit; the input, first output and second output of the i-th two-to-one switch are electrically connected to the output of the i-th coupling module, the i-th input of the first n-to-one switch and the i-th input of the second n-to-one switch, respectively; the input, first output and second output of the n+1-th two-to-one switch are electrically connected to the output of the first n-to-one switch, the first input of the n+2-th two-to-one switch and the input of the attenuation module, respectively; the second input and output of the n+2-th two-to-one switch are electrically connected to the output of the attenuation module and the input of the modulation and demodulation module, respectively; and the output of the second n-to-one switch constitutes the test equipment end of the tower release test circuit; The UART ends of the modulation and demodulation module and the control module are electrically connected to the UART end of the interface conversion module, the USB end of the interface conversion module constitutes the control device end of the tower release test circuit, the 2n+4 switch control ends of the control module are electrically connected to the controlled ends of n DC switches, n+2 two-choose-one switches and two n-choose-one switches, the detection end and the UART end of the control module are electrically connected to the output end of the overcurrent detection module and the UART end of the RS485 module, and the RS485 end of the RS485 module constitutes the RET end of the tower release test circuit; Where i = 1, 2, ..., n and n ≥ 2; The overcurrent detection module is used to detect the current when the power module outputs the DC power to the BTS port of the tower. If the current is greater than the preset current value, a first alarm signal is output to the control module to trigger the control device end of the control module to output a second alarm signal to the control device.

2. The tower test circuit according to claim 1, characterized in that: The power module includes an AC / DC conversion unit and a DC conversion unit; The input end and the first output end of the AC / DC conversion unit constitute the input end and the first output end of the power module respectively, the second output end of the AC / DC conversion unit is electrically connected to the input end of the DC conversion unit, and the output end of the DC conversion unit constitutes the second output end of the power module.

3. The tower test circuit according to claim 1, characterized in that: The i-th coupling module includes the i-th decoupling inductor and the i-th coupling capacitor; The first end of the i-th decoupling inductor constitutes the input end of the i-th coupling module, the second end of the i-th decoupling inductor and the first end of the i-th coupling capacitor are electrically connected to constitute the input and output ends of the i-th coupling module, and the second end of the i-th coupling capacitor constitutes the output end of the i-th coupling module.

4. The tower test circuit according to claim 1, characterized in that: The attenuation module includes an adjustable attenuator with an attenuation range of -5dBm to -20dBm.

5. The tower test circuit according to claim 1, characterized in that: Also includes an n+1th DC switch; The input end of the n+1th DC switch is electrically connected to the UART transmitting end of the interface conversion module and the UART receiving end of the control module; The output terminal and the controlled terminal of the n+1th DC switch are electrically connected to the UART receiving terminal of the modulation and demodulation module and the 2n+5th switch control terminal of the control module respectively; The UART receiving end of the interface conversion module, the UART transmitting end of the modulation and demodulation module and the UART transmitting end of the control module are electrically connected.

6. The tower test circuit according to any one of claims 1 to 5, characterized in that: n=2 or n=4.

7. The tower test circuit according to any one of claims 1 to 5, characterized in that: The DC switch is a single-pole single-throw switch, the two-to-one switch is a single-pole double-throw switch, and the n-to-one switch is a single-pole multiple-throw switch.

8. A tower test system, characterized in that: It comprises an AC power supply, a tower amplifier, a test device, a control device and a tower amplifier test circuit as claimed in any one of claims 1 to 7; The power supply end, test equipment end and control equipment end of the tower test circuit are electrically connected to the AC power supply, test equipment and control equipment respectively, and the n BTS ends and RET ends of the tower test circuit are electrically connected to the n BTS ports and RET ports of the tower respectively.

9. A tower test method implemented based on the tower test system of claim 8, characterized in that: The process comprises the following steps executed by the control device: Control the input and output ends of the i-th DC switch to be connected, supply power to the i-th BTS end of the tower amplifier, and perform overcurrent detection on the i-th BTS end of the tower amplifier; If the i-th BTS end of the tower is overcurrent, the input and output ends of the i-th DC switch are controlled to be disconnected and the test is terminated; If the i-th BTS end of the tower is not overcurrent, keep the input and output of the i-th DC switch connected, control the input and first output of the i-th two-to-one switch to be connected, the i-th input and output of the first n-to-one switch to be connected, the input and first output of the n+1-th two-to-one switch to be connected, and the first input and output of the n+2-th two-to-one switch to be connected, and scan the i-th BTS port and RET port of the tower according to the AISG standard protocol to perform communication detection without signal attenuation on the tower and the RET port of the tower; Keep the input and output of the i-th DC switch connected, the input and the first output of the i-th two-to-one switch connected, and the i-th input and output of the first n-to-one switch connected, control the on-off state of the n+1-th two-to-one switch to switch the input and the second output connected, and the on-off state of the n+2-th two-to-one switch to switch the second input and the output connected, scan the i-th BTS port and RET port of the tower according to the AISG standard protocol, so as to perform communication detection with signal attenuation on the tower and the RET port of the tower; Keep the input and output of the i-th DC switch connected, control the on-off state of the i-th two-to-one switch to switch the input and the second output to be connected, and the i-th input and output of the second n-to-one switch to be connected, set the RS485 module to a continuous output state, and obtain the amplitude of the AISG signal detected by the test equipment and transmitted to the i-th BTS port via the RET port of the tower amplifier, so as to perform AISG signal transmission strength detection on the i-th BTS port of the tower amplifier; If the amplitude of the AISG signal of the ith BTS port on the tower is within the preset amplitude range, it is determined that the test has passed.

10. The tower test method according to claim 9, characterized in that: When the tower release test circuit further includes an n+1th DC switch, the tower release test method further includes: When scanning the i-th BTS port and RET port of the tower according to the AISG standard protocol, the input and output ends of the n+1-th DC switch are controlled to be turned on; When the AISG signal transmission strength detection is performed on the i-th BTS port on the tower, the input and output ends of the n+1-th DC switch are controlled to be disconnected.

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