Capacitance detection method and device under high pulse voltage and different operating temperatures
By generating and boosting pulse voltages based on high-voltage DC power supply and energy storage capacitors, it is used to detect the capacitance characteristics of high-voltage ceramic capacitors, and the problem of the inability of the existing technology to detect capacitance at different temperatures is solved, and the consistency control of capacitance characteristics and product specification is achieved.
Patent Information
- Application Number
- CN202010856251.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2020-08-24
- Publication Date
- 2025-04-11
- Estimated Expiration
- 2040-08-24
AI Technical Summary
The prior art cannot effectively detect the capacitance characteristics of high-voltage ceramic capacitors at high pulse voltages and different operating temperatures, making it difficult to achieve product consistency and standardization.
The energy storage capacitor is charged through a high-voltage DC power supply, chopped into a pulse voltage, and raised it to the high pulse voltage, and sent to the measured capacitor, while changing its operating temperature to detect the capacitor characteristics.
Capacitance detection at high pulse voltage and different operating temperatures is realized, meeting the requirements for the consistency of capacitance characteristics of high-voltage ceramic capacitors and product specification improvement.
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Figure CN114184921B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of capacitance detection, and in particular to a capacitance detection method and device under high pulse voltage and different operating temperatures. Background Art
[0002] In the field of laser power supply, high-voltage ceramic capacitors are core electronic devices that work under high pulse voltage conditions of tens of kilovolts, with pulse widths of several microseconds to tens of nanoseconds. Due to the lack of capacitance measurement technology under these conditions, it is not possible to conduct systematic research and experiments on the capacitance characteristics of such capacitors under various working conditions. Therefore, the actual capacitance characteristics of capacitors from different batches and manufacturers under these working conditions and the parameters at different working temperatures cannot be determined, which greatly restricts the consistency of the products and is not conducive to the standardization, improvement and enhancement of the products. Summary of the invention
[0003] The embodiments of the present invention provide a capacitance detection method and device under high pulse voltage and different operating temperatures, so as to at least solve the technical problem that conventional testing methods in the prior art cannot detect the capacitance characteristics of capacitors under high pulse voltage and different operating temperatures.
[0004] According to an embodiment of the present invention, a capacitance detection method under high pulse voltage and different operating temperatures is provided, comprising the following steps:
[0005] The energy storage capacitor is charged by the DC high voltage of the high voltage DC power supply;
[0006] Chopping the DC high voltage output by the energy storage capacitor into a pulse voltage;
[0007] The pulse voltage is increased to a high pulse voltage and transmitted to the capacitor under test;
[0008] The working temperature of the capacitor under test is changed to obtain the capacitance characteristics of the capacitor under high pulse voltage and different working temperatures.
[0009] Furthermore, the method specifically comprises the following steps:
[0010] The energy storage capacitor is charged by the kilovolt-level DC high voltage of the high-voltage DC power supply;
[0011] The kilovolt-level DC high voltage outputted by the energy storage capacitor is chopped into a kilovolt-level pulse voltage;
[0012] The kilovolt pulse voltage is increased to the ten-thousand-volt pulse voltage and transmitted to the capacitor under test;
[0013] By changing the working temperature of the capacitor under test, the capacitance characteristics of the capacitor under a 10,000-volt pulse voltage and different working temperatures can be obtained.
[0014] Furthermore, the capacitance characteristics include changes in capacitance charge and discharge characteristics of the measured capacitance under high pulse voltage with temperature.
[0015] According to another embodiment of the present invention, there is provided a capacitance detection device under high pulse voltage and different operating temperatures, comprising:
[0016] A high-voltage charging module is used to charge the energy storage capacitor through the DC high voltage of the high-voltage DC power supply;
[0017] A pulse voltage generating module is used to chop the DC high voltage outputted by the energy storage capacitor into a pulse voltage;
[0018] A boost module is used to boost the pulse voltage to a high pulse voltage and transmit it to the capacitor under test;
[0019] The test module is used to change the working temperature of the capacitor under test to obtain the capacitance characteristics of the capacitor under high pulse voltage and different working temperatures.
[0020] Furthermore, the high-voltage charging module includes: a high-voltage DC power supply, an energy storage capacitor C 1 , a first signal generating device, and a first power switch device; when the first signal generating device drives the first power switch device to turn on according to the first driving timing, the high voltage DC power supply provides a kilovolt DC voltage for the energy storage capacitor C 1 Charge.
[0021] Furthermore, the pulse voltage generating module includes: a second signal generating device and a second power switching device; when the second signal generating device drives the second power switching device to turn on according to the second driving timing, the DC high voltage generated by the high voltage charging module is chopped into a pulse voltage to the boost module.
[0022] Furthermore, the boost module includes: a boost transformer and an insulating medium; the boost transformer boosts the pulse voltage to a 10,000 volt pulse voltage and provides it to the capacitor C2 under test in the test module, and the boost transformer is immersed in the insulating medium in the boost module.
[0023] Furthermore, the test module includes: a capacitor C to be tested 2 , test probe, temperature control module, discharge resistor, insulating medium; measured capacitance C 2 Receive the 10,000 volt pulse voltage output by the boost module and discharge it through the discharge resistor, and the measured capacitor C 2 Connect the test probes at both ends, and measure the capacitance C after setting different working temperatures by the temperature control module. 2 The voltage value on the temperature control module and the measured capacitor C 2 , test probes, and discharge resistors are immersed in the insulating medium within the test module.
[0024] Furthermore, when the energy storage capacitor C 1Capacitance C 1 >Measured capacitance C 2 Capacitance C 2 When Among them, VC 2max Refers to the measured capacitance C 2 The maximum voltage charged, VC 1 Refers to the voltage value on the energy storage capacitor. If the energy storage capacitor C is known 1 The capacitance of the energy storage capacitor C 1 and the measured capacitance C 2 The voltage ratio between them is used to calculate the measured capacitance C 2 Capacitance value.
[0025] Furthermore, the high-voltage pulse voltage output by the boost module is applied to the capacitor C under test through the two connecting terminals of the test module. 2 When charging, the test probe and the capacitor C 2 The two test points at both ends are connected to measure the measured capacitance C in real time 2 The voltage value at both ends; the measured capacitance C 2 The output end is connected to the bleeder resistor through two connection terminals.
[0026] The capacitance detection method and device at high pulse voltage and different working temperatures in the embodiment of the present invention first charges the energy storage capacitor through the DC high voltage of the high-voltage DC power supply, then chops the DC high voltage output by the energy storage capacitor into a pulse voltage, and then raises the pulse voltage to a high pulse voltage and transmits it to the capacitor under test. By changing the working temperature of the capacitor under test, the capacitance characteristics of the capacitor under high pulse voltage and different working temperatures are obtained, which can meet the capacitance testing requirements under high pulse voltage and different working temperature conditions. BRIEF DESCRIPTION OF THE DRAWINGS
[0027] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:
[0028] Figure 1 It is a flow chart of the capacitance detection method of the present invention under high pulse voltage and different working temperatures;
[0029] Figure 2 It is a module diagram of the capacitance detection device of the present invention at high pulse voltage and different working temperatures;
[0030] Figure 3 It is a schematic diagram of two-way driving waveforms in the present invention;
[0031] Figure 4 It is a structural schematic diagram of the test module in the present invention. DETAILED DESCRIPTION
[0032] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.
[0033] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.
[0034] The present invention provides a capacitance detection method and device under high pulse voltage and different operating temperatures to solve the problem that conventional testing methods in the prior art cannot detect the capacitance characteristics of high-voltage ceramic capacitors under high pulse voltage and different operating temperatures. The lack of a corresponding detection method limits the control of the consistency of the capacitance characteristics of high-voltage ceramic capacitors, is not conducive to the standardization and specification of products, and also limits the selection of capacitors from different manufacturers.
[0035] Example 1
[0036] According to an embodiment of the present invention, a capacitance detection method under high pulse voltage and different operating temperatures is provided. Figure 1 , including the following steps:
[0037] S101: charging the energy storage capacitor through the DC high voltage of the high voltage DC power supply;
[0038] S102: Chopping the DC high voltage output by the energy storage capacitor into a pulse voltage;
[0039] S103: Raising the pulse voltage to a high pulse voltage and transmitting it to the capacitor under test;
[0040] S104: Changing the operating temperature of the capacitor under test to obtain capacitance characteristics of the capacitor under high pulse voltage and different operating temperatures.
[0041] The capacitance detection method under high pulse voltage and different working temperatures in the embodiment of the present invention first charges the energy storage capacitor through the DC high voltage of the high-voltage DC power supply, then chops the DC high voltage output by the energy storage capacitor into a pulse voltage, and then raises the pulse voltage to a high pulse voltage and transmits it to the capacitor under test. By changing the working temperature of the capacitor under test, the capacitance characteristics of the capacitor under high pulse voltage and different working temperatures are obtained, which can meet the capacitance testing requirements under high pulse voltage and different working temperature conditions.
[0042] The method specifically comprises the following steps:
[0043] The energy storage capacitor is charged by the kilovolt-level DC high voltage of the high-voltage DC power supply;
[0044] The kilovolt-level DC high voltage outputted by the energy storage capacitor is chopped into a kilovolt-level pulse voltage;
[0045] The kilovolt pulse voltage is increased to the ten-thousand-volt pulse voltage and transmitted to the capacitor under test;
[0046] By changing the working temperature of the capacitor under test, the capacitance characteristics of the capacitor under a 10,000-volt pulse voltage and different working temperatures can be obtained.
[0047] The capacitance characteristics include the change of the capacitance charge and discharge characteristics of the measured capacitor under high pulse voltage with temperature.
[0048] Example 2
[0049] According to another embodiment of the present invention, a capacitance detection device under high pulse voltage and different operating temperatures is provided. Figure 2 ,include:
[0050] A high-voltage charging module is used to charge the energy storage capacitor through the DC high voltage of the high-voltage DC power supply;
[0051] A pulse voltage generating module is used to chop the DC high voltage outputted by the energy storage capacitor into a pulse voltage;
[0052] A boost module is used to boost the pulse voltage to a high pulse voltage and transmit it to the capacitor under test;
[0053] The test module is used to change the working temperature of the capacitor under test to obtain the capacitance characteristics of the capacitor under high pulse voltage and different working temperatures.
[0054] The capacitance detection device under high pulse voltage and different working temperatures in the embodiment of the present invention first charges the energy storage capacitor through the DC high voltage of the high-voltage DC power supply, then chops the DC high voltage output by the energy storage capacitor into a pulse voltage, and then raises the pulse voltage to a high pulse voltage and transmits it to the capacitor under test. By changing the working temperature of the capacitor under test, the capacitance characteristics of the capacitor under high pulse voltage and different working temperatures are obtained, which can meet the capacitance testing requirements under high pulse voltage and different working temperature conditions.
[0055] The capacitance detection device of the present invention at high pulse voltage and different operating temperatures is described in detail below with reference to specific embodiments.
[0056] Figure 2 The capacitance detection device of the present invention comprises a high-voltage charging module, a pulse voltage generating module, a boosting module and a testing module connected in sequence.
[0057] The high-voltage charging module includes a high-voltage DC power supply, an energy storage capacitor C 1 , a first signal generating device and a first power switching device; a high voltage DC power supply provides a kilovolt DC voltage, when the first signal generating device is in accordance with Figure 3 When the first power switch device is turned on by the drive timing of Drive1, the kilovolt DC voltage provided by the high voltage DC power supply is the energy storage capacitor C 1 Charging. Energy storage capacitor C 1 The capacitance is slightly larger than the measured capacitance C 2 The capacitance value of the first power switch device is greater than the power switch conduction time of the energy storage capacitor C 1 The charging time of the energy storage capacitor C 1 When the voltage is charged to the maximum, the first power switch device is turned off.
[0058] The pulse voltage generating module includes a second signal generating device and a second power switching device; wherein the second signal generating device is configured according to Figure 3 The second power switch device is driven to conduct with the driving timing of Drive2, and the DC high voltage generated by the high-voltage charging module is chopped into a pulse voltage to the step-up transformer; the step-up module includes a step-up transformer and an insulating medium; the step-up transformer increases the pulse voltage signal to a 10,000-volt pulse voltage and provides it to the capacitor C under test. 2 The step-up transformer is immersed in an insulating medium to ensure safe insulation of 10,000-volt pulse voltage.
[0059] The test module includes the measured capacitance C 2 , test probe, temperature control module, bleeder resistor. The capacitor C 2 Receive the 10,000 volt pulse voltage output by the boost module, and the measured capacitor C 2 Connect the test probes at both ends to measure the capacitance C 2The voltage value on the temperature control module and the measured capacitor C 2 , test probe, and bleeder resistor are immersed in the insulating medium to ensure that the temperature of the entire test module is controllable, thereby simulating the measured capacitance C 2 Different working temperatures. Finally, the high voltage pulse voltage is discharged through the discharge resistor to ensure the safety of the entire capacitance detection device.
[0060] From the energy storage capacitor C 1 To the measured capacitance C 2 During the charging and discharging process, the energy storage capacitor C 1 With the measured capacitance C 2 There is the following relationship: When the energy storage capacitor C 1 Capacitance C 1 >Measured capacitance C 2 Capacitance C 2 When
[0061] Among them, VC 2max Refers to the measured capacitance C 2 The maximum voltage charged, VC 1 Refers to the voltage value on the energy storage capacitor. Then it is known that the energy storage capacitor C 1 The capacitance of the energy storage capacitor C 1 and the measured capacitance C 2 The voltage ratio between them can be used to calculate the measured capacitance C 2 By changing the measured capacitance C 2 The working temperature can be obtained by measuring the capacitance C 2 Capacitance characteristics at high pulse voltage and different operating temperatures.
[0062] Figure 3 This is a schematic diagram of the two-way driving waveform in the present invention. First, the two-stage power switch device consisting of the first power switch device and the second power switch device is turned off, and the high-voltage DC power supply provides a high-voltage DC voltage. The first signal generating device drives the first power switch device with the driving timing of Drive1. The first power switch device is turned on to store the energy capacitor C 1 Charging, waiting for energy storage capacitor C 1 When charging is completed, the first power switch device is turned off. After the first power switch device is turned off, the second signal generating device drives the second power switch device with the driving timing of Drive2, and the second power switch device is turned on, and the energy storage capacitor C 1 Start discharging, the measured capacitance C 2 Start charging. Energy storage capacitor C 1 The voltage in the capacitor is boosted by the boost module and then transferred to the capacitor C under test. 2 The capacitor to be measured C 2 After charging is completed, the second power switch device is turned off and the measured capacitor C 2The next cycle begins after the discharge is completed.
[0063] Figure 4 The entire test module includes a capacitor C 2 , test probe, temperature control module and bleeder resistor. All test modules are immersed in insulating medium. The high voltage pulse voltage output by the boost module is added to the capacitor C under test through the connection terminals 1 and 2 of the test module. 2 The test probe is connected to test point 1 and test point 2 to measure the measured capacitance C in real time. 2 The voltage value at both ends. The measured capacitance C 2 The output end is connected to the discharge resistor through the connection terminal 3 and the connection terminal 4. The test module is filled with liquid insulating medium, all parts are immersed in the insulating medium, and the operating temperature of the entire test module is controlled by the temperature control module.
[0064] The present invention proposes a capacitance detection method and device under high pulse voltage and different working temperatures, using a high voltage DC power supply to provide a kilovolt DC voltage, a first signal generating device to control a first power switch device to be an energy storage capacitor C 1 Charging, energy storage capacitor C 1 When fully charged, the first power switch device is turned off, and the second power switch device is turned on. The energy storage capacitor C is boosted by the boost module. 1 The voltage in the capacitor rises to the 10,000 volt microsecond level and the pulse voltage is sent to the capacitor C under test. 2 Charging. According to the energy storage capacitor C 1 - Capacitor C to be measured 2 During the charging process, when the energy storage capacitor C 1 >Measured capacitance C 2 When Among them, VC 2max Refers to the measured capacitance C 2 The maximum voltage charged, VC 1 Refers to the voltage value on the energy storage capacitor, through the energy storage capacitor C 1 and the measured capacitance C 2 The voltage ratio between them can be used to calculate the measured capacitance C 2 Control the capacitance C 2 The working temperature is tested by testing the capacitance C 2 The change of the high pulse voltage can be used to calculate the measured capacitance C 2 The capacitance characteristics of the capacitor change with temperature. Finally, the high pulse voltage is discharged through the discharge resistor to ensure the safety of the entire capacitance detection device.
[0065] Compared with the prior art, the present invention has the following beneficial effects:
[0066] A high voltage DC power supply is used to provide a kilovolt DC voltage, and a first signal generating device is used to control the first power switch device to be an energy storage capacitor C 1 The energy storage capacitor C 1 The voltage in the capacitor rises to the 10,000 volt microsecond level and the pulse voltage is sent to the capacitor C under test. 2 Charge and control the measured capacitance C 2 The working temperature is tested by testing the capacitance C 2 The change of capacitor charging and discharging characteristics with temperature under high pulse voltage can meet the capacitor testing requirements under high pulse voltage and different operating temperature conditions.
[0067] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.
[0068] In the above embodiments of the present invention, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0069] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the system embodiments described above are only schematic. For example, the division of units can be a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.
[0070] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed over multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.
[0071] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.
[0072] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server or a network device, etc.) to perform all or part of the steps of the methods of each embodiment of the present invention. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, magnetic disk or optical disk and other media that can store program codes.
[0073] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principle of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.
Claims
1. A capacitance detection method under high pulse voltage and different operating temperatures, characterized in that: The following steps are involved: The energy storage capacitor is charged by the DC high voltage of the high voltage DC power supply; Chopping the DC high voltage output by the energy storage capacitor into a pulse voltage; The pulse voltage is increased to a high pulse voltage and transmitted to the capacitor under test; Changing the working temperature of the capacitor under test, obtaining the capacitance characteristics of the capacitor under high pulse voltage and different working temperatures; The capacitance detection method at high pulse voltage and different working temperatures is implemented based on a capacitance detection device at high pulse voltage and different working temperatures, and the capacitance detection device at high pulse voltage and different working temperatures includes: A high-voltage charging module is used to charge the energy storage capacitor through the DC high voltage of the high-voltage DC power supply; A pulse voltage generating module is used to chop the DC high voltage outputted by the energy storage capacitor into a pulse voltage; A boost module is used to boost the pulse voltage to a high pulse voltage and transmit it to the capacitor under test; A test module is used to change the working temperature of the capacitor under test to obtain the capacitance characteristics of the capacitor under high pulse voltage and different working temperatures; The test module comprises: the measured capacitor C2, a test probe, a temperature control module, a discharge resistor, and an insulating medium; the measured capacitor C2 receives the 10,000-volt pulse voltage output by the boost module and discharges it through the discharge resistor, and the two ends of the measured capacitor C2 are connected to the test probe, and the temperature control module sets different working temperatures and then measures the voltage value on the measured capacitor C2; the temperature control module, the measured capacitor C2, the test probe, and the discharge resistor are immersed in the insulating medium in the test module; When the capacitance C1 of the energy storage capacitor C1> the capacitance C2 of the measured capacitor C2, there is a voltage ratio Among them, VC 2max Refers to the maximum voltage charged on the measured capacitor C2, VC1 refers to the voltage value on the energy storage capacitor; the capacitance of the measured capacitor C2 is calculated by the voltage ratio between the energy storage capacitor C1 and the measured capacitor C2 when the capacitance of the energy storage capacitor C1 is known.
2. The capacitance detection method under high pulse voltage and different operating temperatures according to claim 1 is characterized in that: The method specifically comprises the following steps: The energy storage capacitor is charged by the kilovolt-level DC high voltage of the high-voltage DC power supply; The kilovolt-level DC high voltage outputted by the energy storage capacitor is chopped into a kilovolt-level pulse voltage; The kilovolt pulse voltage is increased to the ten-thousand-volt pulse voltage and transmitted to the capacitor under test; By changing the working temperature of the capacitor under test, the capacitance characteristics of the capacitor under a 10,000-volt pulse voltage and different working temperatures can be obtained.
3. The capacitance detection method under high pulse voltage and different operating temperatures according to claim 1, characterized in that: The capacitance characteristics include the change of the capacitance charge and discharge characteristics of the measured capacitance under high pulse voltage with temperature.
4. The capacitance detection method under high pulse voltage and different operating temperatures according to claim 1, characterized in that: The high-voltage charging module includes: a high-voltage DC power supply, an energy storage capacitor C1, a first signal generating device, and a first power switching device; when the first signal generating device drives the first power switching device to turn on according to a first driving timing, the high-voltage DC power supply provides a kilovolt DC voltage to charge the energy storage capacitor C1.
5. The capacitance detection method under high pulse voltage and different operating temperatures according to claim 1, characterized in that: The pulse voltage generating module includes: a second signal generating device and a second power switching device; when the second signal generating device drives the second power switching device to turn on according to a second driving timing, the DC high voltage generated by the high voltage charging module is chopped into a pulse voltage to the boost module.
6. The capacitance detection method under high pulse voltage and different operating temperatures according to claim 1, characterized in that: The boost module includes: a boost transformer and an insulating medium; the boost transformer boosts the pulse voltage to a 10,000 volt pulse voltage and provides it to the capacitor C2 under test in the test module; the boost transformer is immersed in the insulating medium in the boost module.
7. The capacitance detection method under high pulse voltage and different operating temperatures according to claim 1, characterized in that: The high-voltage pulse voltage output by the boost module is added to the measured capacitor C2 for charging through the two connecting terminals of the test module. The test probe is connected to the two test points at both ends of the measured capacitor C2 to measure the voltage value at both ends of the measured capacitor C2 in real time; the output end of the measured capacitor C2 is connected to the discharge resistor through two connecting terminals.
Citation Information
Patent Citations
Charge-discharge service life detection device of high-voltage ceramic capacitor
CN103969527A