Thin film transmittance adjustment method, system, terminal and medium suitable for roller coating film layer process

Abstract

The present application provides a thin film transmittance adjustment method, system, terminal and medium suitable for roller coating film layer process, including: fitting the thin film transmittance based on the transmission spectrum optimization algorithm, obtaining the actual thin film optical parameters through the thin film transmittance; determining the correlation between the actual thin film optical parameters and the coating process parameters; adjusting the coating process parameters to adjust and change the actual thin film optical parameters, and then adjust the thin film transmittance. The present invention can realize the association of thin film optical parameters with coating process parameters, change the thin film optical parameters by adjusting the coating process parameters, and then automatically adjust the thin film transmittance. The whole process realizes automated process adjustment, eliminating the subjectivity of manual adjustment and the problems of error in the adjustment method. The automated adjustment of the film system process is of great significance to the continuous, stable and efficient production of the coating line, reducing production and maintenance costs, and adjusting the production rhythm process, and has high practical value.

Description

Technical Field

[0001] The present application relates to the field of roller coating equipment, and in particular to a thin film transmittance adjustment method, system, terminal and medium suitable for roller coating film layer technology. Background Art

[0002] The roll coating method is simple and low-cost, and has been widely used in actual production. At present, the most commonly used coating materials for roll coating are SiO2 and TiO2.

[0003] When designing a film system, designers usually calculate and design the transmittance of the film system based on the theoretical refractive index of the film. In the actual production process, the designed film system is used for continuous and stable production. However, the optical transmittance of the film prepared by roller coating technology is greatly affected by the stability of materials and equipment as well as the ambient temperature and humidity. Changes in any link will have a great impact on the coating results. When the transmittance of the film system deviates greatly from the design, it is necessary to make timely adjustments. Production personnel often make mistakes in the adjustment method when adjusting the coating parameters based on experience, and the adjustment amount is improperly controlled, and the subjectivity is relatively large, which affects production operations and increases production maintenance costs. Automatic problem detection and automatic process adjustment are of great significance to the continuous and stable production of equipment.

[0004] In the actual roller coating production process, the actual coating result can be calculated based on the transmittance measured by the online detection equipment. If there is a deviation from the theoretical value, the coating parameters can be adjusted in time, such as changing the pressure of the pressure roller and the roller speed to change the roller coating thickness or changing the coating liquid composition to adjust the refractive index of the film layer. Summary of the invention

[0005] In view of the above-mentioned shortcomings of the prior art, the purpose of the present application is to provide a thin film transmittance adjustment method, system, terminal and medium suitable for roller coating film layer process, so as to solve the problem of inconvenient thin film transmittance adjustment in the prior art.

[0006] To achieve the above-mentioned purpose and other related purposes, the first aspect of the present application provides a method for adjusting the transmittance of a thin film for a roller coating film layer process, comprising: fitting the thin film transmittance based on a transmittance spectrum optimization algorithm, and obtaining actual thin film optical parameters through the thin film transmittance; determining the correlation between the actual thin film optical parameters and the coating process parameters; and adjusting the actual thin film optical parameters by adjusting the coating process parameters, thereby adjusting the thin film transmittance.

[0007] In some embodiments of the first aspect of the present application, the film transmittance is fitted based on the transmission spectrum optimization algorithm, and the actual film optical parameters are obtained through the film transmittance. The process includes: calculating the film transmittance using a matrix method; taking the average value of the relative error between the calculated value and the measured value of the film transmittance as the objective function; the objective function is used to characterize the degree of proximity between a set of assumed optical parameters and the actual optical parameters; and taking the film optical parameters obtained when the objective function is minimized as the actual film optical parameters.

[0008] In some embodiments of the first aspect of the present application, the correlation between the actual thin film optical parameters and the coating process parameters includes: the relationship between the refractive index n in the actual thin film optical parameters and the raw materials, pore-forming agent, and mixing ratio of the coating solution in the coating process parameters.

[0009] In some embodiments of the first aspect of the present application, the refractive index is monitored; if the monitored change rate of the refractive index exceeds a preset threshold, an alarm signal is issued to prompt the coating solution to be replaced.

[0010] In some embodiments of the first aspect of the present application, the correlation between the actual thin film optical parameters and the coating process parameters includes: the relationship between the film thickness in the actual thin film optical parameters and the pressure roller pressing amount, pressure roller rotation rate, and conveying roller rate in the coating process parameters.

[0011] In some embodiments of the first aspect of the present application, it also includes: when the production rhythm changes, corresponding adjustments are made based on the relationship between the film thickness and the pressing amount of the pressure roller, the rotation rate of the pressure roller, and the conveying roller rate to keep the coating thickness unchanged.

[0012] In some embodiments of the first aspect of the present application, it also includes: monitoring the refractive index and film thickness; if it is monitored that the rate of change of the refractive index has not changed significantly but the rate of change of the film thickness exceeds a preset threshold, the film thickness value is stabilized by adjusting the pressure roller pressure, the pressure roller rotation rate or the conveying roller rate.

[0013] To achieve the above-mentioned purpose and other related purposes, the second aspect of the present application provides a thin film transmittance adjustment system suitable for a roller coating film layer process, including: a fitting module, used to fit the thin film transmittance based on a transmission spectrum optimization algorithm, and obtain actual thin film optical parameters through the thin film transmittance; a relationship module, used to determine the correlation between the actual thin film optical parameters and the coating process parameters; an adjustment module, used to adjust the actual thin film optical parameters by adjusting the coating process parameters, thereby adjusting the thin film transmittance.

[0014] To achieve the above-mentioned purpose and other related purposes, the third aspect of the present application provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the thin film transmittance adjustment method suitable for roller coating film layer process is implemented.

[0015] To achieve the above-mentioned purpose and other related purposes, the fourth aspect of the present application provides an electronic terminal, including: a processor and a memory; the memory is used to store computer programs, and the processor is used to execute the computer programs stored in the memory, so that the terminal executes the thin film transmittance adjustment method suitable for roller coating film layer process.

[0016] As described above, the film transmittance adjustment method, system, terminal and medium applicable to the roller coating film layer process of the present application have the following beneficial effects: through the technical solution of the present invention, it is possible to associate the film optical parameters with the coating process parameters, and by adjusting the coating process parameters, the film optical parameters are changed, and then the film transmittance is automatically adjusted. The whole process realizes automated process adjustment, eliminating the subjectivity of manual adjustment and the problems of error in the adjustment method. The automated adjustment of the film system process is of great significance to the continuous, stable and efficient production of the coating line, reducing production and maintenance costs, and adjusting the production rhythm process, and has high practical value. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 Shown is a flow chart of a thin film transmittance adjustment method applicable to a roll coating film layer process in one embodiment of the present application.

[0018] Figure 2A Shown is a schematic diagram comparing the SiO2 fitting and measured results in one embodiment of the present application.

[0019] Figure 2B Shown is a schematic diagram comparing the TiO2 fitting and measured results in one embodiment of the present application.

[0020] Figure 2C Shown is a schematic diagram of a curve showing the relationship between the refractive index of SiO2 and wavelength in one embodiment of the present application.

[0021] Figure 2D Shown is a schematic diagram of a curve showing the relationship between the refractive index of TiO2 and wavelength in one embodiment of the present application.

[0022] Figure 3 Shown is a schematic structural diagram of a thin film transmittance adjustment system suitable for a roll coating film layer process in one embodiment of the present invention.

[0023] Figure 4 Shown is a schematic diagram of the structure of an electronic terminal in one embodiment of the present application. DETAILED DESCRIPTION

[0024] The following describes the embodiments of the present application through specific examples, and those skilled in the art can easily understand other advantages and effects of the present application from the contents disclosed in this specification. The present application can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict.

[0025] It should be noted that in the following description, with reference to the accompanying drawings, several embodiments of the present application are described in the accompanying drawings. It should be understood that other embodiments may also be used, and mechanical composition, structure, electrical and operational changes may be made without departing from the spirit and scope of the present application. The following detailed description should not be considered restrictive, and the scope of the embodiments of the present application is limited only by the claims of the published patents. The terms used here are only for describing specific embodiments and are not intended to limit the present application. Spatially related terms, such as "upper", "lower", "left", "right", "below", "below", "lower", "above", "upper", etc., may be used in the text to facilitate the description of the relationship between an element or feature shown in the figure and another element or feature.

[0026] In this application, unless otherwise clearly specified and limited, the terms "install", "connect", "connect", "fix", "hold" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0027] Furthermore, as used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless there is an indication to the contrary in the context. It should be further understood that the terms "comprise", "include" indicate the presence of the described features, operations, elements, components, items, kinds, and / or groups, but do not exclude the presence, occurrence or addition of one or more other features, operations, elements, components, items, kinds, and / or groups. The terms "or" and "and / or" used herein are interpreted as inclusive, or mean any one or any combination. Therefore, "A, B or C" or "A, B and / or C" means "any of the following: A; B; C; A and B; A and C; B and C; A, B and C". Exceptions to this definition will only occur when the combination of elements, functions or operations is inherently mutually exclusive in some way.

[0028] In order to solve the problems in the above-mentioned background technology, the present invention uses the transmittance spectrum optimization method to fit the optical parameters of the transmittance spectrum curve film. The optical parameters of the film are associated with the coating process parameters, and the optical parameters of the film are changed by adjusting the coating process parameters to adjust the transmittance of the film system. The entire process realizes automated process adjustment, eliminating the subjective nature of manual adjustment and the error of the adjustment method. The automated adjustment of the film system process is of great significance to the continuous, stable and efficient production of the coating line, reducing production and maintenance costs, and adjusting the production rhythm process. It has high practical value.

[0029] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the technical solution in the embodiments of the present invention is further described in detail through the following embodiments and in combination with the accompanying drawings. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the invention.

[0030] like Figure 1 , which shows a flow chart of a thin film transmittance adjustment method applicable to a roller coating film layer process in one embodiment of the present invention.

[0031] It should be noted that the film transmittance adjustment method provided in this embodiment can be applied to various types of hardware devices. For example, it can be applied to controllers, such as ARM (Advanced RISC Machines) controllers, FPGA (Field Programmable Gate Array) controllers, SoC (System on Chip) controllers, DSP (Digital Signal Processing) controllers, or MCU (Microcontroller Unit) controllers, etc.; it can also be applied to desktop computers, laptops, tablet computers, smart phones, smart bracelets, smart watches, smart helmets, smart TVs, personal digital assistants (Personal Digital Assistant, referred to as PDA) and other personal computers; it can also be applied to servers, and the servers can be arranged on one or more physical servers according to various factors such as functions and loads, or they can be composed of distributed or centralized server clusters, which are not limited in this embodiment.

[0032] In this embodiment, the thin film transmittance adjustment method applicable to the roll coating film layer process mainly includes steps S11 to S13. Hereinafter, the above steps will be explained in detail with reference to specific examples.

[0033] Step S11: Fitting the film transmittance based on the transmission spectrum optimization algorithm, and obtaining the actual film optical parameters through the film transmittance.

[0034] It should be noted that the optical parameters of the film in this example include but are not limited to the refractive index n, extinction coefficient k, film thickness d, and wavelength λ of light in a vacuum. It should be understood that the refractive index n represents the ratio of the propagation speed of light in a vacuum to the propagation speed of light in a medium; the higher the refractive index of a material, the stronger its ability to refract incident light. The extinction coefficient k represents the absorption of light by the medium, and there is a certain conversion relationship between it and the absorption coefficient α.

[0035] In some feasible implementations, the film transmittance is fitted based on the transmission spectrum optimization algorithm, and the actual film optical parameters are obtained through the film transmittance, and the specific process includes:

[0036] Step S111: Calculate the film transmittance using the matrix method. Specifically, the film transmittance can be calculated using the following formula 1:

[0037]

[0038] Where T is the film transmittance, η0 is the refractive index of air, η s is the refractive index of the substrate, η0 is the refractive index of air, B and C are two matrices related to the refractive index δ r is the phase thickness of the rth film, η r is the refractive index of the rth layer of film (light is incident vertically).

[0039] Step S112: taking the average value of the relative error between the calculated value and the measured value of the film transmittance as the objective function; the objective function is used to characterize the degree of proximity between a set of assumed optical parameters and actual optical parameters.

[0040] Specifically, let the objective function be G, then the objective function G can be calculated by the following formula 2:

[0041]

[0042] Among them, G represents the similarity between the assumed set of optical parameters and the actual optical parameters, T i is the calculated value of film transmittance, T f It is the measured value of film transmittance.

[0043] Step S113: taking the thin film optical parameters obtained when the objective function is minimized as the actual thin film optical parameters.

[0044] According to the above formula 2, the smaller G is, the closer the assumed set of optical parameters is to the real optical parameters; by continuously searching within the search range of refractive index n, extinction coefficient k, and film thickness d, the minimum G is finally obtained; therefore, the set of optical parameters corresponding to the minimum G value is the optical parameters closest to the actual situation, that is, the actual thin film optical parameters.

[0045] Therefore, the above steps can effectively calculate the optical parameters of the dielectric film. This method obtains the optimal numerical solution by continuously optimizing the optical parameter value within a certain numerical range based on the measured film transmission spectrum. This method has a simple calculation process, high calculation accuracy, and can calculate thin films.

[0046] Step S12: determining the correlation between the actual thin film optical parameters and the coating process parameters.

[0047] In some achievable implementations, the correlation between the actual thin film optical parameters and the coating process parameters includes: the relationship between the refractive index n in the actual thin film optical parameters and the raw materials, pore-forming agents, and mixing ratios of the coating solution in the coating process parameters. Specifically, the refractive index n is affected by the raw materials, pore-forming agents, and mixing ratios of the coating solution. When the coating material remains unchanged, the refractive index can be adjusted by adjusting the mixing ratio, pH value, and pore-forming agents.

[0048] Preferably, the refractive index can be monitored, and if the change rate of the refractive index exceeds a preset threshold, an alarm signal is issued to prompt the replacement of the coating liquid. For example, in the production process, if the refractive index has a large deviation, such as the change in the refractive index is greater than 5%, the equipment alarms and the coating liquid needs to be replaced.

[0049] In some achievable embodiments, the correlation between the actual thin film optical parameters and the coating process parameters includes: the relationship between the film thickness d in the actual thin film optical parameters and the roller pressing amount a, roller rotation rate V1, and conveying roller rate V2 in the coating process parameters; the specific relationship can be expressed by the following formula 3:

[0050]

[0051] Among them, k is a coefficient, a represents the pressing amount of the pressure roller, V1 represents the rotation rate of the pressure roller, V2 represents the speed of the conveying roller, n1, n2, n3 represent the unknown variables related to the pressing amount of the pressure roller, the rotation rate of the pressure roller, and the conveying rate of the conveying roller, respectively, and the unknown variables need to be calculated by the program.

[0052] By debugging the equipment, the relationship between the film thickness d and the pressure roller pressure a, the pressure roller rotation rate V1, and the conveying roller rate V2 was found out. The factor analysis method was used to analyze the influence of the three factors on the thickness. According to the difficulty of adjusting different parameters in the actual production process, the actual method of changing the film thickness was given.

[0053] In some preferred embodiments, when the production rhythm changes, the relationship between the film thickness d and the pressing amount a of the pressure roller, the rotation rate V1 of the pressure roller, and the speed V2 of the conveying roller is adjusted accordingly to keep the coating thickness constant. For example, if the production rhythm needs to be accelerated, the relationship d=f(a, V1, V2) can be used to increase the glass conveying speed while adjusting the relevant quantities, so that the coating thickness remains constant, thereby ensuring the production quality and stable operation of the equipment.

[0054] Preferably, the refractive index and film thickness can be monitored. If the change rate of the refractive index does not change significantly but the change rate of the film thickness exceeds a preset threshold, the film thickness value is stabilized by adjusting the pressure roller pressure a, the pressure roller rotation rate V1 or the conveying roller rate V2. For example, when the refractive index does not change significantly and the thickness change rate is greater than 5%, it is necessary to accurately adjust the relevant quantities according to d=f(a, v1, v2). After comprehensive analysis by factor analysis and equipment debugging: the change in pressure has a greater impact on the thickness and uniformity of the film. In general production processes, for specific film materials, the pressure should be monitored to maintain stability. The glass transmission speed and roller speed have a similar effect on the film thickness, but the glass transmission speed is closely related to the production rhythm. Therefore, when the thickness changes, the coating speed is usually changed to keep the thickness stable. When the production rhythm changes, the coating roller speed is accurately adjusted to ensure the stability of the coating thickness.

[0055] Step S13: adjusting the coating process parameters to change the actual thin film optical parameters, thereby adjusting the thin film transmittance.

[0056] Therefore, the technical solution of the present invention can realize the association between the optical parameters of the thin film and the coating process parameters. By adjusting the coating process parameters, the optical parameters of the thin film can be changed, and then the transmittance of the thin film can be automatically adjusted. The whole process realizes automated process adjustment, eliminating the subjectivity of manual adjustment and errors in adjustment methods.

[0057] In order for those skilled in the art to better understand the technical content of the present invention, the following will be explained with reference to specific embodiments:

[0058] Through Matlab programming, the characteristic matrix and other calculation functions are input, the thin film transmittance is measured, and the optical parameters of the material are fitted using the optimization algorithm. For example, the optical parameters of the thin film prepared by roller coating are calculated using the measured SiO2 thin film transmittance and the measured TiO2 thin film transmittance.

[0059] First, the optical parameter values ​​are preliminarily estimated based on previous production conditions, initial values ​​are assigned to the film thickness and refractive index, and then a search is performed within a certain range.

[0060] For SiO2, the refractive index a value range is set between 1.2 and 1.5, with a step size of 0.01; the b value range is set between 10000 and 80000, with a step size of 100; the thickness range is set between 70 and 150nm, with a step size of 2nm, and the extinction coefficient is set to k = 0.001, G = 0.0058, thickness d = 102nm, n = 1.44 + 3800 / λ^2. This is close to the actual film thickness d = 100nm and the refractive index n = 1.43 + 4168 / λ^2 measured by the ellipsometer. The comparison between the SiO2 fitting and the measured results is as follows Figure 2A As shown; the relationship between the refractive index of SiO2 and the wavelength is shown in Figure 2C It should be noted that the values ​​of a and b are values ​​related to the refractive index, which need to be calculated by the program.

[0061] For the TiO2 refractive index a value range, set it between 1.8 and 2.5, with a step size of 0.01; the b value range is set between 20000 and 50000 with a step size of 100; the thickness range is set between 100 and 200nm, with a step size of 2nm, and the extinction coefficient is set to k=0.001. The transmittance is calculated through the characteristic matrix and compared with the measured value to obtain the objective function. After calculating all values ​​within the range, the minimum value Gmin of the objective function is obtained. At this time, the corresponding thickness and refractive index are the true values ​​of the film. After calculation, the optimal added objective function G=0.0293, thickness d=178nm, n=1.91+43000 / λ^2, k=0.001. Comparison of TiO2 fitting and measured results is shown in Figure 2. Figure 2B As shown in the figure, the fitted value and the measured value are almost completely consistent; the relationship curve between the refractive index of TiO2 and the wavelength is shown in Figure 2D shown.

[0062] The refractive index is adjusted mainly by adjusting the raw material ratio, pH value and porosity of the coating solution. During the production process, if the refractive index has a large deviation, such as the refractive index change is greater than 5%, the equipment alarms and the coating solution needs to be replaced.

[0063] When the refractive index has not changed significantly and the thickness change rate is greater than 5%, it is necessary to accurately adjust the relevant quantities based on d=f(a, v1, v2). After comprehensive analysis by factor analysis and equipment debugging: changes in the clamping amount have a greater impact on the thickness and uniformity of the film. In general, during production, for specific film materials, the clamping amount should be monitored to remain stable. The glass transmission speed and roller speed have a similar effect on the film thickness, but the glass transmission speed is closely related to the production rhythm. Therefore, when the thickness changes, the coating speed is usually changed to keep the thickness stable. When the production rhythm changes, accurately adjust the coating roller speed to ensure stable coating thickness.

[0064] When the coating data is sufficient, MATLAB programming can be used to calculate the correlation coefficient d=f(a, v1, v2). After comprehensive analysis by factor analysis and equipment debugging, this equipment determines the relationship between film thickness and coating roller speed based on the measured film thickness and coating machine speed conditions, under the premise of determining the coating machine compression amount and transmission speed. The curve fitting result is d=12.1v1+80.4. When the thickness changes, the coating roller speed is accurately adjusted through the formula to stabilize the thickness. In the electronic control interface, the adjustment coefficient is directly associated with the thickness change rate. When the thickness changes, the coating machine speed is automatically adjusted according to the adjustment coefficient to achieve stable and efficient production of the coating machine.

[0065] like Figure 3 , which shows a schematic diagram of the structure of a thin film transmittance adjustment system suitable for a roll coating film layer process in an embodiment of the present invention. The thin film transmittance adjustment system 300 provided in this embodiment includes: a fitting module 301 , a relationship module 302 and an adjustment module 303 .

[0066] The fitting module 301 is used to fit the film transmittance based on the transmission spectrum optimization algorithm, and obtain the actual film optical parameters through the film transmittance. The relationship module 302 is used to determine the correlation between the actual film optical parameters and the coating process parameters. The adjustment module 303 is used to adjust the coating process parameters to adjust and change the actual film optical parameters, thereby adjusting the film transmittance.

[0067] It should be understood that the division of the various modules of the above device is only a division of logical functions. In actual implementation, they can be fully or partially integrated into one physical entity, or they can be physically separated. And these modules can all be implemented in the form of software called by processing elements; they can also be all implemented in the form of hardware; some modules can also be implemented in the form of software called by processing elements, and some modules can be implemented in the form of hardware. For example, the fitting module can be a separately established processing element, or it can be integrated in a chip of the above device. In addition, it can also be stored in the memory of the above device in the form of program code, and called and executed by a processing element of the above device. The implementation of other modules is similar. In addition, these modules can be fully or partially integrated together, or they can be implemented independently. The processing element described here can be an integrated circuit with signal processing capabilities. In the implementation process, each step of the above method or each module above can be completed by an integrated logic circuit of hardware in the processor element or instructions in the form of software.

[0068] For example, the above modules may be one or more integrated circuits configured to implement the above methods, such as one or more application specific integrated circuits (ASICs), or one or more digital signal processors (DSPs), or one or more field programmable gate arrays (FPGAs). For another example, when a module is implemented in the form of a processing element scheduling program code, the processing element may be a general-purpose processor, such as a central processing unit (CPU) or other processors that can call program code. For another example, these modules may be integrated together and implemented in the form of a system-on-a-chip (SOC).

[0069] like Figure 4 As shown, a structural schematic diagram of another electronic terminal provided by an embodiment of the present invention is shown. The electronic terminal provided in this example includes: a processor 41, a memory 42, and a communicator 43; the memory 42 is connected to the processor 41 and the communicator 43 through a system bus and completes communication with each other, the memory 42 is used to store computer programs, the communicator 43 is used to communicate with other devices, and the processor 41 is used to run the computer program, so that the electronic terminal executes each step of the thin film transmittance adjustment method applicable to the roller coating film layer process as described above.

[0070] The system bus mentioned above can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The system bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one thick line is used in the figure, but it does not mean that there is only one bus or one type of bus. The communication interface is used to realize the communication between the database access device and other devices (such as clients, read-write libraries, and read-only libraries). The memory may include random access memory (RAM), and may also include non-volatile memory, such as at least one disk storage.

[0071] The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0072] The present invention also provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the thin film transmittance adjustment method suitable for the roller coating film layer process is implemented.

[0073] Those skilled in the art can understand that all or part of the steps of implementing the above-mentioned method embodiments can be completed by hardware related to the computer program. The aforementioned computer program can be stored in a computer-readable storage medium. When the program is executed, the steps of the above-mentioned method embodiments are executed; and the aforementioned storage medium includes: ROM, RAM, magnetic disk or optical disk and other media that can store program codes.

[0074] In the embodiments provided in the present application, the computer readable and writable storage medium may include a read-only memory, a random access memory, an EEPROM, a CD-ROM or other optical disk storage device, a disk storage device or other magnetic storage device, a flash memory, a USB flash drive, a mobile hard disk, or any other medium that can be used to store a desired program code in the form of an instruction or data structure and can be accessed by a computer. In addition, any connection can be appropriately referred to as a computer-readable medium. For example, if the instruction is sent from a website, a server or other remote source using a coaxial cable, an optical fiber cable, a twisted pair, a digital subscriber line (DSL), or wireless technologies such as infrared, radio, and microwaves, the coaxial cable, optical fiber cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwaves are included in the definition of the medium. However, it should be understood that computer readable and writable storage media and data storage media do not include connections, carriers, signals, or other temporary media, but are intended to be non-temporary, tangible storage media. Disk and disc, as used in this application, includes compact disc (CD), laser disc, optical disc, digital versatile disc (DVD), floppy disk and Blu-ray disc where disks usually reproduce data magnetically, while discs reproduce data optically with lasers.

[0075] In summary, the present application provides a thin film transmittance adjustment method, system, terminal and medium suitable for roller coating film layer process. Through the technical solution of the present invention, it is possible to associate the thin film optical parameters with the coating process parameters. By adjusting the coating process parameters, the thin film optical parameters are changed, and then the thin film transmittance is automatically adjusted. The entire process realizes automated process adjustment, eliminating the subjectivity of manual adjustment and the problems of error in the adjustment method. The automated adjustment of the film system process is of great significance to the continuous, stable and efficient production of the coating line, reducing production and maintenance costs, and adjusting the production rhythm process, and has high practical value. Therefore, the present application effectively overcomes the various shortcomings of the prior art and has a high industrial utilization value.

[0076] The above embodiments are merely illustrative of the principles and effects of the present application and are not intended to limit the present application. Anyone familiar with the technology may modify or change the above embodiments without violating the spirit and scope of the present application. Therefore, all equivalent modifications or changes made by a person of ordinary skill in the art without departing from the spirit and technical ideas disclosed in the present application shall still be covered by the claims of the present application.

Claims

1. A method for adjusting the transmittance of a thin film suitable for a roller coating film layer process, characterized in that: include: Fitting the film transmittance based on the transmission spectrum optimization algorithm, and obtaining the actual film optical parameters through the film transmittance; Determining the correlation between the actual thin film optical parameters and the coating process parameters; By adjusting the coating process parameters to adjust and change the actual thin film optical parameters, and then adjust the thin film transmittance; The correlation between the actual thin film optical parameters and the coating process parameters includes: the relationship between the film thickness d in the actual thin film optical parameters and the roller pressing amount a, roller rotation rate V1, and conveying roller rate V2 in the coating process parameters; The relationship between the film thickness d in the actual film optical parameters and the roller pressing amount a, roller rotation rate V1, and conveying roller rate V2 in the coating process parameters is expressed as follows: In the formula, k is a coefficient, a represents the pressing amount of the pressure roller, V1 represents the rotation rate of the pressure roller, V2 represents the conveying roller rate, and n1, n2, and n3 represent unknowns related to the pressing amount a of the pressure roller, the rotation rate V1 of the pressure roller, and the conveying rate V2 of the conveying roller, respectively.

2. The thin film transmittance adjustment method suitable for roller coating film layer process according to claim 1 is characterized in that: The process of fitting the film transmittance based on the transmission spectrum optimization algorithm and obtaining the actual film optical parameters through the film transmittance includes: Calculate the film transmittance using the matrix method; The average value of the relative error between the calculated value and the measured value of the film transmittance is used as the objective function; the objective function is used to characterize the degree of proximity between a set of assumed optical parameters and actual optical parameters; The thin film optical parameters obtained when the objective function is minimized are used as the actual thin film optical parameters.

3. The thin film transmittance adjustment method applicable to the roll coating film layer process according to claim 1 is characterized in that: The correlation between the actual thin film optical parameters and the coating process parameters includes: the relationship between the refractive index n in the actual thin film optical parameters and the raw materials, pore-forming agent and mixing ratio of the coating solution in the coating process parameters.

4. The thin film transmittance adjustment method applicable to the roll coating film layer process according to claim 3 is characterized in that: Also includes: The refractive index is monitored; if the change rate of the refractive index exceeds a preset threshold, an alarm signal is issued to prompt the coating solution to be replaced.

5. The thin film transmittance adjustment method applicable to the roll coating film layer process according to claim 1 is characterized in that: Also includes: When the production rhythm changes, corresponding adjustments are made based on the relationship between the film thickness and the pressure roller pressure, pressure roller rotation rate, and conveyor roller rate to keep the coating thickness unchanged.

6. The thin film transmittance adjustment method for roller coating film layer process according to claim 1, characterized in that: Also includes: The refractive index and film thickness are monitored; if it is monitored that the rate of change of the refractive index has not changed significantly but the rate of change of the film thickness exceeds a preset threshold, the film thickness value is stabilized by adjusting the pressure roller pressure, the pressure roller rotation rate or the conveying roller rate.

7. A thin film transmittance adjustment system suitable for roller coating film layer process, characterized in that: include: A fitting module, used for fitting the film transmittance based on a transmission spectrum optimization algorithm, and obtaining actual film optical parameters through the film transmittance; A relationship module, used to determine the correlation between the actual thin film optical parameters and the coating process parameters; An adjustment module, used for adjusting the coating process parameters to change the actual thin film optical parameters, thereby adjusting the thin film transmittance; The adjustment module is also used for the correlation between the actual thin film optical parameters and the coating process parameters, including: the relationship between the film thickness d in the actual thin film optical parameters and the pressure roller pressing amount a, the pressure roller rotation rate V1, and the conveying roller rate V2 in the coating process parameters; The relationship between the film thickness d in the actual film optical parameters and the roller pressing amount a, roller rotation rate V1, and conveying roller rate V2 in the coating process parameters is expressed as follows: In the formula, k is a coefficient, a represents the pressing amount of the pressure roller, V1 represents the rotation rate of the pressure roller, V2 represents the conveying roller rate, and n1, n2, and n3 represent unknowns related to the pressing amount a of the pressure roller, the rotation rate V1 of the pressure roller, and the conveying rate V2 of the conveying roller, respectively.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the thin film transmittance adjustment method applicable to the roller coating film layer process as described in any one of claims 1 to 6 is implemented.

9. An electronic terminal, characterized in that: include: Processor and memory; The memory is used to store computer programs; The processor is used to execute the computer program stored in the memory so that the terminal executes the thin film transmittance adjustment method applicable to the roller coating film layer process as described in any one of claims 1 to 6.

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