A test needle

Abstract

The present invention belongs to the field of chip or component testing technology, and discloses a test needle. The test needle includes a test needle body, a socket and an elastic member. The test needle body includes a contact end and a connection end that are relatively arranged. The contact end is used to contact the test point, and a plurality of test needle bodies are arranged in parallel; one end of the socket is slidably sleeved on the connection end, and the other end of the socket is used to contact the first surface of the circuit board and the hole wall of the connection hole of the circuit board; one end of the elastic member is connected to the connection end, and the other end of the elastic member is connected to the socket, and the elastic member is configured to provide thrust to the test needle body. The test needle provided by the present invention increases the contact area between the test needle and the circuit board by providing a socket, and the socket contacts the first surface of the circuit board and the hole wall of the connection hole of the circuit board, further increasing the current passing through the test needle during testing. The test needle has a simple structure and is easy to disassemble. It is suitable for testing large-current test pieces and has a wide range of applications.

Description

Technical Field

[0001] The present invention relates to the technical field of chip or component testing, and in particular to a testing needle. Background Art

[0002] Semiconductor chips, such as insulated-gate bipolar transistor (IGBT) chips, field-effect transistor (MOSFET) chips, fast recovery diode (FRD) chips, as well as automotive chips, power chips, and power devices, are core components in the production of power semiconductor modules. Their performance directly determines the quality of the module. Furthermore, stable, efficient, and adaptable testing methods are crucial for chip functionality and lifespan testing.

[0003] In the existing technology, chips need to be tested after they are manufactured, and the devices used for chip testing all adopt a conductive pin structure, that is, conductive pins are used to contact the chip terminals with the PCB board. However, with the rapid development of information technology, the operating frequency and operating speed of chips are getting higher and higher. The existing conductive pins can no longer withstand the large currents applied during testing. Such conductive pins usually include multiple components such as springs and sleeves. The structure is relatively complex, not easy to replace, and cannot achieve long-term and high-life use. Summary of the Invention

[0004] The purpose of the present invention is to provide a test needle, aiming to solve the problem in the prior art that the test needle has a complex structure and is not suitable for testing high-current test pieces.

[0005] To achieve this object, the present invention adopts the following technical solutions:

[0006] A test needle, comprising:

[0007] A test needle body, the test needle body comprising a contact end and a connection end arranged opposite to each other, the contact end being used to contact a test point, and a plurality of the test needle bodies being arranged parallel to each other;

[0008] a sleeve member, one end of which is slidably sleeved on the connecting end, and the other end of which is used to contact the first surface of the circuit board and the hole wall of the connecting hole of the circuit board;

[0009] An elastic member, one end of which is connected to the connecting end, and the other end of which is connected to the sleeve member, wherein the elastic member is configured to provide a thrust to the test needle body.

[0010] Optionally, the socket is a cylindrical structure, and the socket includes a first cylinder, a second cylinder and a third cylinder connected in sequence along the axial direction. The first cylinder is sleeved on the test needle body, the outer diameter of the second cylinder is larger than the outer diameter of the third cylinder, and the end of the second cylinder away from the first cylinder can abut against the first surface of the circuit board, and the outer wall of the third cylinder abuts against the inner wall of the connecting hole of the circuit board.

[0011] Optionally, the test needle further includes a fixing seat connected to an end of the third cylinder away from the second cylinder.

[0012] Optionally, the fixing seat is a cylindrical structure, and the diameter of the fixing seat is larger than the inner diameter of the connecting hole of the circuit board.

[0013] Optionally, the test needle further includes an auxiliary seat, one end of the auxiliary seat is connected to the end of the third cylinder away from the second cylinder, the auxiliary seat contacts the second surface of the circuit board, and the other end of the auxiliary seat is connected to the fixed seat.

[0014] Optionally, the first cylinder, the second cylinder and the third cylinder are coaxially arranged.

[0015] Optionally, the test needle further includes an auxiliary needle, the second cylinder is sleeved on the outside of the auxiliary needle, one end of the auxiliary needle is connected to the auxiliary seat, and the other end of the auxiliary needle is connected to the connecting end.

[0016] Optionally, the elastic member is disposed in the second cylinder and extends along the axial direction of the second cylinder, one end of the elastic member is connected to the connecting end, and the other end of the elastic member is connected to the fixing seat.

[0017] Optionally, the needle tip of the contact end is a pointed needle or a multi-claw needle.

[0018] Optionally, the outer diameter of the second cylinder is 0.05mm-50mm.

[0019] Beneficial effects of the present invention: The test needle provided by the present invention, by providing a test needle body, the contact end of the test needle body contacts the test point, and a plurality of test needle bodies are arranged in parallel with each other, thereby increasing the contact area between the test needle and the test point, thereby increasing the test current tested by the test needle; by providing a socket, the socket contacts the first surface of the circuit board and the hole wall of the connection hole of the circuit board, thereby increasing the contact area between the test needle and the circuit board, further increasing the current passing through the test needle during testing; by providing an elastic member, one end of the elastic member is connected to the connection end, and the other end of the elastic member is connected to the socket, and the elastic member is configured to provide a thrust to the test needle body. During testing, the contact end of the test needle body needs to pierce the passivation layer on the surface of the test point. The provision of the elastic member can provide a thrust to the test needle body, thereby improving test efficiency. The test needle has a simple structure, is easy to disassemble, is suitable for testing high-current test pieces, and has a wide range of applications. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 is a schematic structural diagram of a test needle provided by an embodiment of the present invention;

[0021] Figure 2 1 is a schematic diagram of the structure of a test needle including an auxiliary seat provided in an embodiment of the present invention;

[0022] Figure 3 1 is a schematic structural diagram of a test needle including an auxiliary needle and an auxiliary seat provided in an embodiment of the present invention;

[0023] Figure 4 This is a schematic diagram of the structure of a test needle inserted into a passivation layer or a protective layer according to an embodiment of the present invention;

[0024] Figure 5 This is a schematic diagram of the structure of a test needle inserted into a solder ball according to an embodiment of the present invention;

[0025] Figure 6 It is a structural schematic diagram of a test needle provided by an embodiment of the present invention, in which the needle head is a multi-claw needle.

[0026] In the picture:

[0027] 10. Test pin; 20. Circuit board; 30. Guide frame; 40. Chip;

[0028] 1. Test needle body; 2. Socket; 21. First cylinder; 22. Second cylinder; 23. Third cylinder; 3. Elastic member; 4. Fixing seat; 5. Auxiliary needle; 6. Auxiliary seat;

[0029] 201. First surface; 202. Second surface. DETAILED DESCRIPTION

[0030] The present invention will be further described in detail below with reference to the accompanying drawings and examples. It will be understood that the specific embodiments described herein are intended only to illustrate the present invention and are not intended to limit the present invention. It should also be noted that, for ease of description, the accompanying drawings only illustrate portions relevant to the present invention, not all structures.

[0031] In the description of the present invention, unless otherwise expressly specified or limited, the terms "connected," "connected," and "fixed" should be understood in a broad sense. For example, they may refer to fixed connections, detachable connections, or integration; mechanical connections or electrical connections; direct connections or indirect connections through an intermediate medium; and internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention in specific circumstances.

[0032] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Furthermore, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.

[0033] In the description of this embodiment, the terms "upper," "lower," "right," and other orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely for ease of description and simplified operation. They do not indicate or imply that the devices or components referred to must have, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on the present invention. Furthermore, the terms "first" and "second" are used solely for descriptive purposes and have no special meanings.

[0034] This embodiment provides a test needle, such as Figures 1-6 As shown, the test needle 10 includes a test needle body 1, a socket 2 and an elastic member 3. The test needle body 1 includes a contact end and a connecting end arranged opposite to each other. The contact end is used to contact the test point, and several test needle bodies 1 are arranged parallel to each other; one end of the socket 2 is slidably sleeved on the connecting end, and the other end of the socket 2 is used to contact the first surface 201 of the circuit board 20 and the hole wall of the connecting hole of the circuit board 20; one end of the elastic member 3 is connected to the connecting end, and the other end of the elastic member 3 is connected to the socket 2. The elastic member 3 is configured to provide thrust to the test needle body 1.

[0035] The test needle 10 provided by the present invention comprises a test needle body 1, wherein the contact end of the test needle body 1 contacts the test point, and multiple test needle bodies 1 are arranged parallel to each other, thereby increasing the contact area between the test needle 10 and the test point, thereby increasing the test current tested by the test needle 10. Furthermore, a socket 2 is provided, wherein the socket 2 contacts the first surface 201 of the circuit board 20 and the wall of the connection hole of the circuit board 20, thereby increasing the contact area between the test needle 10 and the circuit board 20, further increasing the current passing through the test needle 10 during testing. Furthermore, an elastic member 3 is provided, wherein one end of the elastic member 3 is connected to the connection end and the other end of the elastic member 3 is connected to the socket 2. The elastic member 3 is configured to provide a thrust to the test needle body 1. During testing, the contact end of the test needle body 1 needs to pierce the passivation layer or protective layer on the surface of the test point. The provision of the elastic member 3 can provide a thrust to the test needle body 1, thereby improving testing efficiency. The test needle 10 has a simple structure, is easy to disassemble, is suitable for testing high-current test pieces, and has a wide range of applications.

[0036] Optionally, the socket 2 is a cylindrical structure, comprising a first barrel 21, a second barrel 22, and a third barrel 23 connected in sequence along the axial direction. The first barrel 21 is sleeved onto the test needle body 1. The outer diameter of the second barrel 22 is greater than the outer diameter of the third barrel 23. The end surface of the second barrel 22 away from the first barrel 21 can abut against the first surface 201 of the circuit board 20, and the outer wall of the third barrel 23 abuts against the inner wall of the connection hole of the circuit board 20. This arrangement increases the contact area between the second barrel 22 and the first surface 201 of the circuit board 20, thereby increasing the maximum test current allowed by the test needle 10. In this embodiment, the socket 2 is made of metal to ensure conductivity.

[0037] The outer diameter of the second barrel 22 is preferably 0.05 mm to 50 mm. This arrangement can ensure that the second barrel 22 has a sufficiently large contact area with the first surface 201 of the circuit board 20, while reducing the processing accuracy, which is beneficial to processing and manufacturing.

[0038] Optionally, the first barrel 21, the second barrel 22 and the third barrel 23 are coaxially arranged. This arrangement reduces the processing difficulty of the socket 2 and improves the processing efficiency of the socket 2.

[0039] In order to prevent the test needle body 1 from detaching from the first cylinder 21, a clamping piece is provided at the connecting end of the test needle body 1. The inner diameter of the first cylinder 21 is smaller than the inner diameter of the second cylinder 22, so that the clamping piece is clamped to the inner end surface of the second cylinder 22 to prevent the test needle body 1 from being pushed by the elastic part 3 during the test process, causing the test needle body 1 to detach from the first cylinder 21.

[0040] Optionally, the test needle 10 further includes a fixing base 4, which is connected to an end of the third barrel 23 away from the second barrel 22. The fixing base 4 facilitates installation and fixation of the third barrel 23.

[0041] Furthermore, the fixing base 4 is a cylindrical structure, and the diameter of the fixing base 4 is larger than the inner diameter of the connection hole of the circuit board 20. This arrangement increases the installation stability between the fixing base 4 and the circuit board 20 and improves the reliability of the test pin 10.

[0042] To further increase the test current of the test pin 10, as Figure 2 As shown, the test needle 10 further includes an auxiliary base 6, one end of which is connected to the end of the third barrel 23 away from the second barrel 22, the auxiliary base 6 contacts the second surface 202 of the circuit board 20, and the other end of the auxiliary base 6 is connected to the fixed base 4. By providing the auxiliary base 6, which is located at the end of the third barrel 23 away from the second barrel 22 and contacts the second surface 202 of the circuit board 20, the contact area between the test needle 10 and the circuit board 20 is further increased, thereby increasing the maximum test current of the test needle 10.

[0043] like Figure 3 As shown, the test needle 10 optionally further includes an auxiliary needle 5. The second barrel 22 is sleeved on the outside of the auxiliary needle 5. One end of the auxiliary needle 5 is connected to the auxiliary socket 6, and the other end of the auxiliary needle 5 is connected to the connection end. By providing the auxiliary needle 5, with both ends of the auxiliary needle 5 connected to the auxiliary socket 6 and the connection end respectively, when the test needle 10 is energized, the current of the auxiliary needle 5 is connected to the circuit board 20 through the auxiliary socket 6, thereby increasing the test current allowed to pass through the test needle 10 and further expanding the application range of the test needle 10.

[0044] Optionally, the elastic member 3 is disposed within the second barrel 22 and extends axially along the second barrel 22, with one end of the elastic member 3 connected to the connecting end and the other end of the elastic member 3 connected to the fixing seat 4. By disposing the elastic member 3 within the second barrel 22 and extending axially along the second barrel 22, when the contact end of the test needle 10 contacts the test point, the elastic member 3 can provide a thrust to the test needle body 1 along the axial direction of the second barrel 22, so that the contact end of the test needle body 1 pierces the passivation layer of the test piece, ensuring that the test needle body 1 is in full contact with the test piece.

[0045] Optionally, the needle at the contact end is a sharp needle or a multi-claw needle. Figure 1-Figure 4 As shown, when the needle tip at the contact end is a sharp needle, the test needle 10 may include a single test needle body 1 or two test needle bodies 1. When the test needle 10 includes two test needle bodies 1, the needle tips of the two needle tips may be arranged facing each other to adapt to tests under different large currents, especially tests of test pieces whose test points are pins or PADs. Usually, an anti-oxidation protective layer is provided on the pins or PADs, and the material of the anti-oxidation protective layer is generally tin. Or, as Figure 5As shown, the test needle 10 may also include two test needle bodies 1, and the needle tips of the two needles may be arranged back to back or facing each other to adapt to the test piece with the test point being a solder ball. In this embodiment, the test piece is a chip 40. Figure 6 As shown, the needle tip at the contact end may also be a multi-claw needle to increase the contact area between the contact end and the test piece, improve the reliability of the test, thereby ensuring the power-on effect and the test accuracy. In other embodiments, those skilled in the art may set the shape of the needle tip according to the actual application scenario.

[0046] Optionally, the height of the test needle 10 along the axial direction of the socket 2 is 0.2 mm to 100 mm. This configuration facilitates processing and manufacturing while ensuring the practicality of the test needle 10. In this embodiment, the height of the test needle 10 is 5 mm. In other embodiments, those skilled in the art may adjust the height of the test needle 10 based on actual application.

[0047] Optionally, the fixing base 4 is detachably connected to the third barrel 23. This arrangement facilitates disassembly and installation. When installing the test needle 10 and the circuit board 20, the socket 2 is first placed on the circuit board 20, the guide frame 30 is placed on the outside of the socket 2, and the test needle body 1 and the elastic member 3 are then inserted into the socket 2 from the side of the circuit board 20 where the second surface is located. Finally, the fixing base 4 is connected to the third barrel 23, thereby improving the installation stability between the test needle 10 and the circuit board 20.

[0048] Alternatively, the diameter of the fixing base 4 is the same as the inner diameter of the connection hole of the circuit board 20, and the fixing base 4 and the third cylindrical body 23 are integrally formed. This arrangement facilitates processing and reduces production costs. When installing the test needle 10 and the circuit board 20, the test needle 10 is directly inserted into the connection hole of the circuit board 20.

[0049] In this embodiment, the elastic member 3 is a spring, which is easy to manufacture and has low cost. In other embodiments, those skilled in the art can set the type of the elastic member 3 according to the actual application scenario.

[0050] Obviously, the above embodiments of the present invention are merely examples for the purpose of clearly illustrating the present invention and are not intended to limit the embodiments of the present invention. A person skilled in the art would be able to make various obvious changes, readjustments, and substitutions without departing from the scope of protection of the present invention. It is not necessary and impossible to enumerate all embodiments here. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the claims of the present invention.

Claims

1. A test needle, characterized in that: include: A test needle body (1), the test needle body (1) comprising a contact end and a connection end arranged opposite to each other, the contact end being used to contact a test point, and a plurality of the test needle bodies (1) being arranged parallel to each other; a sleeve member (2), one end of the sleeve member (2) being slidably sleeved on the connection end, and the other end of the sleeve member (2) being used to contact the first surface (201) of the circuit board (20) and the hole wall of the connection hole of the circuit board (20); The sleeve (2) is a cylindrical structure, comprising a first cylinder (21), a second cylinder (22) and a third cylinder (23) connected in sequence along the axial direction, the first cylinder (21) being sleeved on the test needle (1), the outer diameter of the second cylinder (22) being larger than the outer diameter of the third cylinder (23), the end surface of the second cylinder (22) away from the first cylinder (21) being able to abut against the first surface (201) of the circuit board (20), and the outer wall of the third cylinder (23) abutting against the inner wall of the connection hole of the circuit board (20); an elastic member (3), the elastic member (3) being arranged in the second cylinder (22) and extending along the axial direction of the second cylinder (22), the elastic member (3) being configured to provide the test needle (1) with an axial thrust along the second cylinder (22); The test needle further comprises a fixing seat (4), wherein the fixing seat (4) is connected to an end of the third cylinder (23) away from the second cylinder (22); The test needle further includes an auxiliary seat (6), one end of the auxiliary seat (6) is connected to an end of the third cylinder (23) away from the second cylinder (22), the auxiliary seat (6) is in contact with the second surface (202) of the circuit board (20), and the other end of the auxiliary seat (6) is connected to the fixed seat (4); The test needle further comprises an auxiliary needle (5), the second cylinder (22) is sleeved on the outside of the auxiliary needle (5), one end of the auxiliary needle (5) is connected to the auxiliary seat (6), and the other end of the auxiliary needle (5) is connected to the connecting end.

2. The test needle according to claim 1, characterized in that The fixing seat (4) is a cylindrical structure, and the diameter of the fixing seat (4) is larger than the inner diameter of the connection hole of the circuit board (20).

3. The test needle according to claim 2, characterized in that The first cylinder (21), the second cylinder (22) and the third cylinder (23) are coaxially arranged.

4. The test needle according to any one of claims 1 to 3, characterized in that: The needle head of the contact end is a sharp needle or a multi-claw needle.

5. The test needle according to claim 2 or 3, characterized in that: The outer diameter of the second cylinder (22) is 0.05 mm-50 mm.

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