Equipment inspection method, device, terminal and storage medium

Abstract

The present invention provides a device inspection method, apparatus, terminal, and storage medium. The method comprises: obtaining a state quantity and an analog quantity of a target device; wherein the target device includes multiple components, each corresponding to at least one state quantity and at least one analog quantity; determining the operating status of each component based on each state quantity and each analog quantity; and determining the operating status of the target device based on the operating status of each component. The present invention determines the operating status of a target device by determining the corresponding relationship between the state quantity, analog quantity, and components in the target device. This method can efficiently and accurately determine the operating status of the target device, thereby improving inspection effectiveness.

Description

Technical Field

[0001] The present invention relates to the field of equipment operation and maintenance technology, and in particular to an equipment inspection method, device, terminal and storage medium. Background Art

[0002] Currently, to ensure the normal operation of electrical equipment, regular inspections are required. Typically, staff follow an inspection route and conduct visual inspections and functional tests on each device in turn.

[0003] One functional testing method involves connecting a test device to the device under test, sending a test signal and receiving a response signal from the device under test. This method requires frequent establishment of a connection between the test device and the device under test. Another functional testing method involves staff transcribing the operating parameters displayed by the device under test. This testing method can only determine whether the operating parameters of the device under test are within a safe operating range, and cannot determine the status of the device's internal components based on the device's operating status. As can be seen from the above, existing equipment inspection methods are inefficient and ineffective. Summary of the Invention

[0004] The present invention provides an equipment inspection method, device, terminal and storage medium to solve the problem of poor inspection effect of current equipment inspection methods.

[0005] In a first aspect, the present invention provides an equipment inspection method, comprising:

[0006] Acquire a state quantity and an analog quantity of a target device; wherein the target device includes a plurality of devices, and each device corresponds to at least one state quantity and at least one analog quantity;

[0007] Determine the operating status of each device based on each state quantity and each analog quantity;

[0008] An operating state of the target device is determined based on the operating states of the individual components.

[0009] In one possible implementation, determining the operating state of each component based on each state quantity and each analog quantity includes:

[0010] Determining a standard value of an analog quantity corresponding to the first device based on a state quantity corresponding to the first device; the first device is any device in the target device;

[0011] The operating state of the first component is determined based on the state quantity, the analog quantity and the analog quantity standard value corresponding to the first component.

[0012] In one possible implementation, determining the operating state of the first component based on the state quantity, the analog quantity, and the analog quantity standard value corresponding to the first component includes:

[0013] Calculating a difference between an analog quantity corresponding to the first device and a standard value of the analog quantity to obtain a first deviation;

[0014] If the state quantity corresponding to the first device is abnormal and the first deviation is not within the preset threshold range, then the operating state of the first device is determined to be faulty;

[0015] If the state quantity corresponding to the first device is abnormal and the first deviation is within a preset threshold range, historical data of the analog quantity corresponding to the first device is obtained, and the state of the first device is determined based on the historical data of the analog quantity corresponding to the first device.

[0016] In one possible implementation, determining the state of the first component based on historical data of an analog quantity corresponding to the first component includes:

[0017] Calculating the difference between the historical data of the analog quantity corresponding to the first device and the standard value of the analog quantity to obtain a second deviation;

[0018] If the second deviation is not within the preset threshold range, determining that the operating state of the first component is a fault;

[0019] If the second deviation is within the preset threshold range, it is determined that the operating state of the first component is normal.

[0020] In one possible implementation, determining the operating state of the first component based on the state quantity, the analog quantity, and the analog quantity standard value corresponding to the first component includes:

[0021] Calculating a difference between an analog quantity corresponding to the first device and a standard value of the analog quantity to obtain a first deviation;

[0022] If the state quantity corresponding to the first device is normal and the first deviation is within the preset threshold range, then it is determined that the operating state of the first device is normal;

[0023] If the state quantity corresponding to the first device is normal and the first deviation is not within the preset threshold range, it is determined that the operating state of the first device is at risk.

[0024] In one possible implementation, determining the operating status of the target device based on the operating status of each component includes:

[0025] The operating state of the target device is calculated based on the operating state of each component and the preset weight of each component.

[0026] In one possible implementation, obtaining the state quantity and analog quantity of the target device includes:

[0027] The state quantity and analog quantity of the target device are obtained through the serial port and / or data transmission unit of the target device.

[0028] In a second aspect, the present invention provides an equipment inspection device, comprising:

[0029] An acquisition module, configured to acquire a state quantity and an analog quantity of a target device; wherein the target device includes a plurality of devices, each device corresponding to at least one state quantity and at least one analog quantity;

[0030] A device state determination module, configured to determine the operating state of each device based on each state quantity and each analog quantity;

[0031] The device status determination module is used to determine the operating status of the target device based on the operating status of each component.

[0032] In a third aspect, the present invention provides a terminal comprising a memory, a processor, and a computer program stored in the memory and runnable on the processor. When the processor executes the computer program, the steps of the equipment inspection method as shown in the first aspect or any possible implementation of the first aspect are implemented.

[0033] In a fourth aspect, the present invention provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the equipment inspection method shown in the first aspect or any possible implementation of the first aspect.

[0034] The present invention provides a device inspection method, apparatus, terminal, and storage medium. The method comprises: obtaining a state quantity and an analog quantity of a target device; wherein the target device includes multiple components, each corresponding to at least one state quantity and at least one analog quantity; determining the operating state of each component based on each state quantity and each analog quantity; and determining the operating state of the target device based on the operating state of each component. The present invention determines the operating state of the target device by determining the corresponding relationship between the state quantity, analog quantity, and components in the target device. This method can efficiently and accurately determine the operating state of the target device, thereby improving inspection effectiveness. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0036] Figure 1 This is a flow chart of an implementation of the equipment inspection method provided by an embodiment of the present invention;

[0037] Figure 2 Schematic diagram of the structure of the equipment inspection device provided by an embodiment of the present invention;

[0038] Figure 3 is a schematic diagram of a terminal provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0039] In the following description, specific details such as particular system structures and techniques are provided for purposes of illustration, not limitation, to facilitate a thorough understanding of the embodiments of the present invention. However, it will be apparent to those skilled in the art that the present invention may be practiced in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.

[0040] In order to make the purpose, technical solutions and advantages of the present invention more clear, specific embodiments will be described below with reference to the accompanying drawings.

[0041] See also Figure 1 , which shows a flow chart for implementing the device inspection method provided by an embodiment of the present invention, and is described in detail as follows:

[0042] Step 101: Acquire the state quantity and analog quantity of the target device; wherein the target device includes multiple devices, and each device corresponds to at least one state quantity and at least one analog quantity.

[0043] In this embodiment, the state quantity and analog quantity of the target device can be determined by the target device. The state quantity is used to indicate the operating status of the device, such as whether the output is overvoltage or whether the device is overtemperature, and the analog quantity is used to indicate the specific numerical value of the device operating parameters, such as voltage, current, temperature, etc.

[0044] Step 102: Determine the operating status of each component based on each state quantity and each analog quantity.

[0045] In this embodiment, a function of the target device relies on a corresponding component. If the corresponding component fails, the function in the target device will be abnormal, and the corresponding state quantity will also be abnormal. Therefore, when the state quantity is abnormal, it can be inferred that the component corresponding to the state quantity may be faulty. Similarly, analog quantities can also be used to infer whether the corresponding component in the target device is faulty. However, when the target device is faulty, the analog quantity detected by the target device and the state quantity determined may be inaccurate. Analyzing the analog quantity or the state quantity alone may make it difficult to detect the device fault. Combining the analog quantity and the state quantity for judgment can improve accuracy.

[0046] Step 103: Determine the operating status of the target device based on the operating status of each component.

[0047] In this embodiment, the target device contains multiple components, each of which has a different degree of importance to the normal operation of the target device. After determining the operating status of each component, a comprehensive evaluation is performed on the operating status of the target device, and different levels of reminders can be issued for different degrees of faults.

[0048] In some embodiments, determining the operating status of each device based on each state quantity and each analog quantity includes:

[0049] Determining a standard value of an analog quantity corresponding to the first device based on a state quantity corresponding to the first device; the first device is any device in the target device;

[0050] The operating state of the first component is determined based on the state quantity, the analog quantity and the analog quantity standard value corresponding to the first component.

[0051] In this embodiment, when the state quantity corresponding to the first device is normal, the analog quantity standard value is the standard value of the analog quantity corresponding to the normal operating state of the first device. When the state quantity corresponding to the first device is abnormal, the analog quantity standard value is the standard value of the analog quantity corresponding to the abnormal operating state of the first device. The relationship between the state quantity, the analog quantity, and the analog quantity standard value can be used to further determine the actual operating state of the first device.

[0052] In some embodiments, determining the operating state of the first device based on the state quantity, the analog quantity, and the analog quantity standard value corresponding to the first device includes:

[0053] Calculating a difference between an analog quantity corresponding to the first device and a standard value of the analog quantity to obtain a first deviation;

[0054] If the state quantity corresponding to the first device is abnormal and the first deviation is not within the preset threshold range, then the operating state of the first device is determined to be faulty;

[0055] If the state quantity corresponding to the first device is abnormal and the first deviation is within a preset threshold range, historical data of the analog quantity corresponding to the first device is obtained, and the state of the first device is determined based on the historical data of the analog quantity corresponding to the first device.

[0056] In this embodiment, an abnormal state quantity corresponding to the first device indicates an abnormal operating state of the first device. A first deviation within a preset threshold also indicates an abnormal operating state of the first device. If the state quantity and the operating states corresponding to the analog quantity are consistent, the operating state of the first device can be determined to be abnormal. If the first deviation is outside the preset threshold, the operating state of the first device is normal. In this case, a discrepancy between the state quantity and the operating states corresponding to the analog quantity requires further determination based on historical analog quantity data to avoid misjudgment.

[0057] In some embodiments, determining the state of the first device based on historical data of an analog quantity corresponding to the first device includes:

[0058] Calculating the difference between the historical data of the analog quantity corresponding to the first device and the standard value of the analog quantity to obtain a second deviation;

[0059] If the second deviation is not within the preset threshold range, determining that the operating state of the first component is a fault;

[0060] If the second deviation is within the preset threshold range, it is determined that the operating state of the first component is normal.

[0061] In this embodiment, if the second deviation is outside the preset threshold range, it indicates that the historical operating state of the first device is abnormal, and the state quantity also indicates that the operating state of the first device is abnormal. In this case, the operating state of the first device can be determined to be abnormal. If the second deviation is within the preset threshold range, it indicates that the historical operating state of the first device is normal, and the current analog quantity also indicates that the historical operating state of the first device is normal. There is a high possibility that the state quantity has been misjudged, and therefore the operating state of the first device is determined to be normal.

[0062] In this embodiment, to ensure the accuracy of the judgment, historical data can also be reviewed in batches. Specifically, historical data within one month before the current moment can be calculated first. If the result shows that the operating status of the first device is normal, historical data within two months and historical data within three months before the current moment can be reviewed. If the results show that the operating status of the first device is normal in all cases, the operating status of the first device is determined to be normal. If there is historical data showing that the operating status of the first device is abnormal, the operating status of the first device is determined to be abnormal.

[0063] In some embodiments, determining the operating state of the first device based on the state quantity, the analog quantity, and the analog quantity standard value corresponding to the first device includes:

[0064] Calculating a difference between an analog quantity corresponding to the first device and a standard value of the analog quantity to obtain a first deviation;

[0065] If the state quantity corresponding to the first device is normal and the first deviation is within the preset threshold range, then it is determined that the operating state of the first device is normal;

[0066] If the state quantity corresponding to the first device is normal and the first deviation is not within the preset threshold range, it is determined that the operating state of the first device is at risk.

[0067] In this embodiment, if the first deviation is within the preset threshold range, it indicates that the operating state of the first device is normal. In this case, the analog value and the operating state corresponding to the state value are consistent, and the operating state of the first device can be determined to be normal. If the first deviation is not within the preset threshold range and the state value is normal, it indicates that the operating state of the first device is normal, but the analog value deviates significantly from the standard value, which may indicate that the device is in a critical state, and a fault may occur. In this case, it is necessary to indicate that the operating state of the first device is at risk.

[0068] In some embodiments, determining the operating state of the target device based on the operating states of the various components includes:

[0069] The operating state of the target device is calculated based on the operating state of each component and the preset weight of each component.

[0070] In this embodiment, the preset weight of a component is determined based on its importance to the target device. Each component's normal operating status can be set to 0, and its abnormal operating status to 1. The target device's operating status value = Σ(value corresponding to the nth component's operating status) × the weight of the nth component. If the target device's operating status value is greater than a status threshold, the target device's operating status is abnormal.

[0071] In some embodiments, obtaining the state quantity and analog quantity of the target device includes:

[0072] The state quantity and analog quantity of the target device are obtained through the serial port and / or data transmission unit of the target device.

[0073] In this embodiment, the device inspection method is applied to a terminal other than the target device. This terminal can establish and maintain communication with multiple target devices for inspection purposes. The terminal obtains state and analog quantities from the target device via a serial port or data transmission unit, improving the efficiency of obtaining state and analog quantities. Specifically, the terminal can be configured with a protocol to enable communication between the terminal and the target device.

[0074] In this embodiment, inspection details can be imported into the terminal in the form of a table. The table content can include the step number, operation name, operation meaning, whether it is required, whether to upload a document, whether the operating status is normal, analog standard value, and deviation threshold, thus reducing the workload of personnel before the inspection. After the inspection is completed, the corresponding configurable options can be selected based on the inspection results to automatically fill in the table to form an inspection report, making the inspection results more intuitive and readable.

[0075] An embodiment of the present invention provides a device inspection method comprising: obtaining a state quantity and an analog quantity of a target device; wherein the target device includes multiple components, each corresponding to at least one state quantity and at least one analog quantity; determining the operating status of each component based on each state quantity and each analog quantity; and determining the operating status of the target device based on the operating status of each component. By determining the operating status of the target device based on the corresponding relationship between the state quantity, analog quantity, and components in the target device, the embodiment of the present invention can efficiently and accurately determine the operating status of the target device, thereby improving inspection effectiveness.

[0076] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0077] The following are device embodiments of the present invention. For details not fully described therein, reference may be made to the corresponding method embodiments described above.

[0078] Figure 2 The following is a schematic diagram showing the structure of an equipment inspection device provided by an embodiment of the present invention. For ease of explanation, only the parts related to the embodiment of the present invention are shown, which are described in detail as follows:

[0079] like Figure 2 As shown, the equipment inspection device 2 includes:

[0080] An acquisition module 21 is configured to acquire a state quantity and an analog quantity of a target device; wherein the target device includes a plurality of devices, each device corresponding to at least one state quantity and at least one analog quantity;

[0081] A device state determination module 22, configured to determine the operating state of each device based on each state quantity and each analog quantity;

[0082] The device status determination module 23 is configured to determine the operating status of the target device based on the operating status of each component.

[0083] In some embodiments, the device state determination module 22 is specifically configured to:

[0084] Determining a standard value of an analog quantity corresponding to the first device based on a state quantity corresponding to the first device; the first device is any device in the target device;

[0085] The operating state of the first component is determined based on the state quantity, the analog quantity and the analog quantity standard value corresponding to the first component.

[0086] In some embodiments, the device state determination module 22 is specifically configured to:

[0087] Calculating a difference between an analog quantity corresponding to the first device and a standard value of the analog quantity to obtain a first deviation;

[0088] If the state quantity corresponding to the first device is abnormal and the first deviation is not within the preset threshold range, then the operating state of the first device is determined to be faulty;

[0089] If the state quantity corresponding to the first device is abnormal and the first deviation is within a preset threshold range, historical data of the analog quantity corresponding to the first device is obtained, and the state of the first device is determined based on the historical data of the analog quantity corresponding to the first device.

[0090] In some embodiments, the device state determination module 22 is specifically configured to:

[0091] Calculating the difference between the historical data of the analog quantity corresponding to the first device and the standard value of the analog quantity to obtain a second deviation;

[0092] If the second deviation is not within the preset threshold range, determining that the operating state of the first component is a fault;

[0093] If the second deviation is within the preset threshold range, it is determined that the operating state of the first component is normal.

[0094] In some embodiments, the device state determination module 22 is specifically configured to:

[0095] Calculating a difference between an analog quantity corresponding to the first device and a standard value of the analog quantity to obtain a first deviation;

[0096] If the state quantity corresponding to the first device is normal and the first deviation is within the preset threshold range, then it is determined that the operating state of the first device is normal;

[0097] If the state quantity corresponding to the first device is normal and the first deviation is not within the preset threshold range, it is determined that the operating state of the first device is at risk.

[0098] In some embodiments, the device status determination module 23 is specifically configured to:

[0099] The operating state of the target device is calculated based on the operating state of each component and the preset weight of each component.

[0100] In some embodiments, the acquisition module 21 is specifically configured to:

[0101] The state quantity and analog quantity of the target device are obtained through the serial port and / or data transmission unit of the target device.

[0102] The equipment inspection apparatus provided in an embodiment of the present invention includes: an acquisition module for acquiring state quantities and analog quantities of a target device; wherein the target device includes multiple components, each corresponding to at least one state quantity and at least one analog quantity; a component state determination module for determining the operating state of each component based on each state quantity and each analog quantity; and a device state determination module for determining the operating state of the target device based on the operating state of each component. By determining the operating state of a target device based on the corresponding relationship between the state quantities, analog quantities, and components in the target device, the embodiment of the present invention can efficiently and accurately determine the operating state of the target device, thereby improving inspection effectiveness.

[0103] Figure 3 Schematic diagram of a terminal provided by an embodiment of the present invention. Figure 3 As shown, the terminal 3 of this embodiment includes: a processor 30, a memory 31, and a computer program 32 stored in the memory 31 and executable on the processor 30. When the processor 30 executes the computer program 32, the steps of each of the aforementioned device inspection method embodiments are implemented. Alternatively, when the processor 30 executes the computer program 32, the functions of each module in the aforementioned device embodiments are implemented.

[0104] Exemplarily, the computer program 32 may be divided into one or more modules, which are stored in the memory 31 and executed by the processor 30 to implement the present invention. The one or more modules may be a series of computer program instruction segments capable of implementing specific functions, and the instruction segments are used to describe the execution process of the computer program 32 in the terminal 3.

[0105] The terminal 3 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The terminal 3 may include, but is not limited to, a processor 30 and a memory 31. Those skilled in the art will understand that Figure 3 It is only an example of terminal 3 and does not constitute a limitation on terminal 3. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the terminal may also include input and output devices, network access devices, buses, etc.

[0106] The processor 30 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor.

[0107] The memory 31 may be an internal storage unit of the terminal 3, such as a hard disk or memory of the terminal 3. The memory 31 may also be an external storage device of the terminal 3, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash memory card, etc. equipped on the terminal 3. Furthermore, the memory 31 may include both an internal storage unit of the terminal 3 and an external storage device. The memory 31 is used to store the computer program and other programs and data required by the terminal. The memory 31 may also be used to temporarily store data that has been output or is about to be output.

[0108] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the division of the above-mentioned functional modules is used as an example for illustration. In actual applications, the above-mentioned functions can be distributed and completed by different functional modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional modules in the embodiment can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of a software functional unit. In addition, the specific names of the functional modules are only for the convenience of distinguishing each other and are not used to limit the scope of protection of this application. The specific working process of the modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0109] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.

[0110] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present invention.

[0111] In the embodiments provided by the present invention, it should be understood that the disclosed devices / terminals and methods can be implemented in other ways. For example, the device / terminal embodiments described above are merely illustrative. For example, the division of the modules or units is merely a logical functional division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed can be through some interface, indirect coupling or communication connection of devices or units, and can be electrical, mechanical, or other forms.

[0112] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0113] In addition, the functional units in the various embodiments of the present invention may be integrated into a single processing unit, each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0114] If the integrated module is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present invention can implement all or part of the processes in the above-mentioned embodiment method by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, it can implement the steps of the above-mentioned various device inspection method embodiments. The computer program includes computer program code, which can be in source code form, object code form, executable file, or some intermediate form. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal, and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media does not include electric carrier signals and telecommunication signals.

[0115] The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention, and should all be included in the scope of protection of the present invention.

Claims

1. A device inspection method, characterized in that: Applied to a terminal other than the target device, the method includes: Obtaining a state quantity and an analog quantity of a target device; wherein the target device includes a plurality of devices, each device corresponding to at least one state quantity and at least one analog quantity, the state quantity being an operating state determined by the target device itself, and the analog quantity being a numerical value of an operating parameter detected by the target device; Determine the operating state of each device based on each state quantity and each analog quantity; Determining the operating state of the target device based on the operating states of the various components; Determining the operating state of each device based on each state quantity and each analog quantity includes: Calculating a difference between an analog quantity corresponding to a first device and a standard value of the analog quantity to obtain a first deviation; the first device is any device in the target device; If the state quantity corresponding to the first device is abnormal and the first deviation is within a preset threshold range, obtaining historical data of the analog quantity corresponding to the first device, and determining the state of the first device based on the historical data of the analog quantity corresponding to the first device; If the state quantity corresponding to the first component is normal and the first deviation is not within a preset threshold range, it is determined that the operating state of the first component is at risk.

2. The equipment inspection method according to claim 1, characterized in that: Determining the operating state of each device based on each state quantity and each analog quantity includes: determining an analog quantity standard value corresponding to the first component based on a state quantity corresponding to the first component; The operating state of the first component is determined based on the state quantity, analog quantity and analog quantity standard value corresponding to the first component.

3. The equipment inspection method according to claim 2, characterized in that: The determining the operating state of the first component based on the state quantity, analog quantity, and analog quantity standard value corresponding to the first component includes: If the state quantity corresponding to the first component is abnormal and the first deviation is not within a preset threshold range, it is determined that the operating state of the first component is a fault.

4. The equipment inspection method according to claim 3, characterized in that: The determining the state of the first component based on historical data of the analog quantity corresponding to the first component includes: Calculating a difference between historical data of the analog quantity corresponding to the first device and a standard value of the analog quantity to obtain a second deviation; If the second deviation is not within a preset threshold range, determining that the operating state of the first component is a fault; If the second deviation is within a preset threshold range, it is determined that the operating state of the first component is normal.

5. The equipment inspection method according to claim 2, characterized in that: The determining the operating state of the first component based on the state quantity, analog quantity, and analog quantity standard value corresponding to the first component includes: If the state quantity corresponding to the first component is normal and the first deviation is within a preset threshold range, it is determined that the operating state of the first component is normal.

6. The equipment inspection method according to claim 1, characterized in that: The determining the operating state of the target device based on the operating state of each component includes: The operating status of the target device is calculated based on the operating status of each component and the preset weight of each component.

7. The equipment inspection method according to any one of claims 1 to 6, characterized in that: The step of obtaining the state quantity and analog quantity of the target device includes: The state quantity and analog quantity of the target device are obtained through the serial port and / or data transmission unit of the target device.

8. An equipment inspection device, characterized in that: Applicable to a terminal other than a target device, the device comprises: an acquisition module, configured to acquire a state quantity and an analog quantity of a target device; wherein the target device includes a plurality of components, each component corresponding to at least one state quantity and at least one analog quantity, the state quantity being an operating state determined by the target device itself, and the analog quantity being a numerical value of an operating parameter detected by the target device; A device state determination module, configured to determine the operating state of each device based on each state quantity and each analog quantity; A device status determination module, configured to determine the operating status of the target device based on the operating status of each device; The device state determination module is specifically used for: Calculating a difference between an analog quantity corresponding to a first device and a standard value of the analog quantity to obtain a first deviation; the first device is any device in the target device; If the state quantity corresponding to the first device is abnormal and the first deviation is within a preset threshold range, obtaining historical data of the analog quantity corresponding to the first device, and determining the state of the first device based on the historical data of the analog quantity corresponding to the first device; If the state quantity corresponding to the first component is normal and the first deviation is not within a preset threshold range, it is determined that the operating state of the first component is at risk.

9. A terminal comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the steps of the device inspection method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the equipment inspection method according to any one of claims 1 to 7 are implemented.

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