Method and device for determining measurement and control instruction loop constraint fault

Abstract

The present invention discloses a method and apparatus for determining loop constraint faults in measurement and control instructions. The method comprises: obtaining multiple measurement and control instructions having constraint relationships; constructing a matrix-formed measurement and control instruction logical relationship based on the constraint relationships between the measurement and control instructions; generating matrix-formed fault diagnosis information based on the measurement and control instruction logical relationship based on a predetermined instruction constraint transfer function, wherein the instruction constraint transfer function is generated based on the measurement and control instruction logical relationship and the transmission order of the constraint relationships between the measurement and control instructions; and determining, in response to a matrix element value in the fault diagnosis information being a predetermined value, that a loop constraint fault has formed between the multiple measurement and control instructions. The present invention can quickly and accurately detect logical errors between measurement and control instructions, preventing loop constraint faults from being introduced into measurement and control activities.

Description

Technical Field

[0001] The present invention relates to the field of aerospace measurement and control technology, and in particular to a method and device for determining a measurement and control instruction loop constraint fault. Background Art

[0002] Usually, space measurement and control missions use timing as the main line of state constraints. To complete a mission, it is necessary to plan the mission in advance, set measurement and control targets for each stage, gradually refine the collaborative work procedures of each system and each discipline at different stages, arrange measurement and control instructions according to the timing design, form an operation command sequence, and describe the state changes and constraint relationships of each system and each discipline in the form of a timeline. It can concisely describe the linear characteristics of space measurement and control mission planning in the time dimension, and can insert and delete instructions according to the intensity of the task during the mission cycle, respond to the adjustment of measurement and control activities in a timely manner, and flexibly adapt to changes in mission requirements.

[0003] So far, in the aerospace measurement and control activities that have been completed or are still being carried out, due to the clear division of labor among the subsystems and the lack of coupling between the measurement and control instructions, the design and arrangement of the measurement and control instructions only need to consider the timing relationship, without considering the constraints between the measurement and control instructions, and there is no diagnosis of loop constraint faults.

[0004] In recent years, with the increasing complexity of space exploration activities, the cross-correlations between TT&C instructions have become increasingly close. Consequently, when designing and choreographing TT&C instructions, it's necessary to consider not only the timing relationships between instructions but also interdependent constraints. A complex space exploration activity requires the coordinated cooperation of multiple systems and disciplines, involving the orchestration of a large number of interdependent instructions. If the design is incomplete, loop constraints between instructions are highly likely to cause failures. Currently, designers can only rely on their engineering experience to avoid this problem. Once a loop constraint problem occurs, it's only revealed when a failure occurs during instruction execution.

[0005] The existing method of avoiding measurement and control instruction loop constraint failures by relying solely on the designer's engineering experience has the following problems:

[0006] (1) The reliability of manual means is too low and is completely subject to the engineering experience and working conditions of the designers;

[0007] (2) Manual methods are too inefficient to quickly detect logical errors from a large number of instructions;

[0008] (3) The accuracy of manual methods is too low. They can only check simple loop constraints between two instructions. If loop constraints occur between more than three instructions, manual methods will have a high probability of missing detection.

[0009] In other words, the existing method of relying solely on the engineering experience of designers to avoid measurement and control instruction loop constraint failures has problems such as low efficiency and low accuracy, and is obviously unable to meet current needs and adapt to the current situation. Summary of the Invention

[0010] In view of this, the present invention provides a method and apparatus for determining a measurement and control instruction loop constraint fault to solve at least one of the above-mentioned problems.

[0011] According to a first aspect of the present invention, a method for determining a measurement and control instruction loop constraint fault is provided, the method comprising:

[0012] Obtain multiple measurement and control instructions with constraint relationships;

[0013] Construct the logical relationship of measurement and control instructions in matrix form according to the constraint relationship between each measurement and control instruction;

[0014] generating fault diagnosis information in matrix form according to the measurement and control instruction logical relationship based on a predetermined instruction constraint transfer function, wherein the instruction constraint transfer function is generated based on the measurement and control instruction logical relationship and the constraint relationship transmission order between each measurement and control instruction;

[0015] In response to the matrix element value in the fault diagnosis information being a predetermined value, it is determined that a cyclic constraint fault is formed between the multiple measurement and control instructions.

[0016] According to a second aspect of the present invention, a device for determining a measurement and control instruction loop constraint fault is provided, the device comprising:

[0017] An instruction acquisition unit, used to acquire multiple measurement and control instructions with constraint relationships;

[0018] A measurement and control instruction logic relationship construction unit is used to construct a matrix-form measurement and control instruction logic relationship based on the constraint relationship between each measurement and control instruction;

[0019] a fault diagnosis information generating unit, configured to generate fault diagnosis information in a matrix form according to the measurement and control instruction logical relationship based on a predetermined instruction constraint transfer function, wherein the instruction constraint transfer function is generated based on the measurement and control instruction logical relationship and the constraint relationship transmission order between each measurement and control instruction;

[0020] The fault determination unit is used to determine that a cyclic constraint fault is formed between the multiple measurement and control instructions in response to the matrix element value in the fault diagnosis information being a predetermined value.

[0021] According to a third aspect of the present invention, an electronic device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above method when executing the program.

[0022] According to a fourth aspect of the present invention, there is provided a computer-readable storage medium having a computer program stored thereon, which implements the steps of the above method when executed by a processor.

[0023] It can be seen from the above technical solution that a measurement and control instruction logical relationship in matrix form is constructed according to the constraint relationship between the multiple measurement and control instructions obtained, and then based on a predetermined instruction constraint transfer function, fault diagnosis information in matrix form is generated according to the measurement and control instruction logical relationship. When the matrix element value in the fault diagnosis information is a predetermined value, it is determined that a loop constraint fault is formed between the multiple measurement and control instructions. Through this technical solution, manual means can be replaced to quickly and accurately detect logical errors between measurement and control instructions, avoiding bringing loop constraint faults into measurement and control activities. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0025] Figure 1 is a flow chart of a method for determining a measurement and control instruction cycle constraint fault according to an embodiment of the present invention;

[0026] Figure 2 This is a schematic diagram of a single-layer loop constraint formed between two instructions;

[0027] Figure 3 It is a schematic diagram of the multi-layer loop constraints formed between three instructions;

[0028] Figure 4 This is another diagram of multi-layer loop constraints formed between multiple instructions;

[0029] Figure 5 is a flow chart of fault diagnosis of measurement and control instruction loop constraints according to an embodiment of the present invention;

[0030] Figure 6 is a structural block diagram of a device for determining a measurement and control instruction cycle constraint fault according to an embodiment of the present invention;

[0031] Figure 7 FIG. 6 is a schematic block diagram of a system structure of an electronic device 600 according to an embodiment of the present invention. DETAILED DESCRIPTION

[0032] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0033] In order to better understand this application, the applicant explains the following terms:

[0034] TT&C instructions: refers to the control commands sent by ground TT&C equipment to spacecraft during space TT&C activities, which are used to control the spacecraft to perform specific tasks.

[0035] Constraints: Certain conditions are required for the ground to send certain TT&C commands to the spacecraft, or for the spacecraft to execute certain TT&C commands. For example, if command A must be executed before command B, then command A is said to be a constraint on command B, or command B is said to be constrained by command A.

[0036] Single-layer loop constraint: Instructions constrain each other. That is, if instruction A is designed to constrain instruction B, and instruction B is designed to constrain instruction A, a single-layer loop constraint is formed between instructions A and B, causing a logical error and inability to execute.

[0037] Multi-layer loop constraints: Single-layer loop constraints are the simplest and easiest to detect logical errors. If the constraints between multiple instructions are propagated layer by layer, a multi-layer loop constraint is formed. For example, if the design arranges instruction A to constrain instruction B, instruction B to constrain instruction C, and instruction C to constrain instruction A, this will eventually cause instruction C to constrain itself, forming a multi-layer loop constraint.

[0038] With the increasing number of space measurement and control missions and space test activities, various activities are no longer simply carried out in a time sequence. More consideration is needed for the coordination and cooperation between subsystems and mutual support. The design and arrangement process should be combined with information such as satellite resources, payloads, and mission phase status. The planning strategy for specific models should be considered, and the measurement and control needs of the spacecraft itself, the payload needs, and the scientific data reception needs should be taken into account. When designing and arranging measurement and control instructions, attention should be paid to avoiding and resolving conflicts between instructions to avoid logical errors.

[0039] Given the existing practice of relying solely on designers' engineering experience to avoid measurement and control instruction loop constraint failures, which suffers from low efficiency and accuracy, an embodiment of the present invention provides a solution for determining measurement and control instruction loop constraint failures. This solution can replace manual methods, quickly and accurately detecting logical errors between measurement and control instructions, and preventing loop constraint failures from entering measurement and control activities. The following describes the embodiment of the present invention in detail with reference to the accompanying drawings.

[0040] It should be noted that the acquisition, storage, use, and processing of data in the technical solution of this application comply with the relevant provisions of national laws and regulations.

[0041] Figure 1 is a flow chart of a method for determining a measurement and control instruction cycle constraint fault according to an embodiment of the present invention. Figure 1 As shown, the method includes:

[0042] Step 101: Acquire multiple measurement and control instructions with constraint relationships.

[0043] Step 102: construct a matrix-formed logical relationship of the measurement and control instructions based on the constraint relationship between the measurement and control instructions.

[0044] Specifically, the constraint relationships between each pair of measurement and control instructions can be obtained; then, the measurement and control instruction logical relationship in the matrix form is constructed according to the constraint relationships between each pair of measurement and control instructions.

[0045] Step 103, based on a predetermined instruction constraint transfer function, fault diagnosis information in matrix form is generated according to the measurement and control instruction logical relationship, and the instruction constraint transfer function is generated based on the measurement and control instruction logical relationship and the constraint relationship transmission order between each measurement and control instruction.

[0046] Specifically, based on a predetermined instruction constraint transfer function, fault diagnosis information corresponding to the constraint relationship transmission order can be generated according to the measurement and control instruction logical relationship and the constraint relationship transmission order.

[0047] The constraint relationship transmission order here is mainly aimed at the multi-layer loop constraints formed between multiple instructions.

[0048] Step 104 : In response to the matrix element value in the fault diagnosis information being a predetermined value, determining that a cyclic constraint fault is formed between the plurality of measurement and control instructions.

[0049] When there is a constraint relationship between the measurement and control instructions, the corresponding matrix element value in the measurement and control instruction logical relationship is set to 1. At this time, when the diagonal matrix element value in the fault diagnosis information is not 0 (for example, the diagonal matrix element value can be 1, 2, etc.), it can be determined that a cyclic constraint fault is formed between the multiple measurement and control instructions.

[0050] By constructing a matrix-form measurement and control instruction logical relationship based on the constraint relationship between the multiple measurement and control instructions obtained, and then generating matrix-form fault diagnosis information based on the measurement and control instruction logical relationship based on a predetermined instruction constraint transfer function, when the matrix element value in the fault diagnosis information is a predetermined value, it is determined that a loop constraint fault is formed between the multiple measurement and control instructions. Through the embodiment of the present invention, manual means can be replaced to quickly and accurately detect logical errors between measurement and control instructions, thereby avoiding bringing loop constraint faults into measurement and control activities.

[0051] In the embodiment of the present invention, the method for determining a measurement and control instruction loop constraint fault mainly includes three key points: (1) describing the constraint relationship between instructions (corresponding to the above step 101), (2) constructing a logical matrix of the constraint relationship between instructions (corresponding to the above step 102), and (3) constructing and determining the instruction loop constraint diagnosis matrix (corresponding to the above steps 103 and 104). The following describes each key point separately.

[0052] (1) Description of the constraint relationship between instructions

[0053] The constraint relationship between instructions can be expressed as a binary relationship. For example, assuming v1 and v2 represent two test instructions respectively, the design arranges that instruction v2 can only be executed after instruction v1 is executed. That is, instruction v2 is constrained on instruction v1. Such a constraint relationship can be recorded as<v1,v2> On the contrary, if instruction v1 is constrained on instruction v2, such a constraint relationship can be recorded as<v2,v1> .

[0054] Let V={v1,v2,…,v i ,…,v n}, i = 1, 2, ..., n, where v i Indicates a test instruction.

[0055] Let E={e1,e2,…,e k ,…,e m}, k = 1, 2, ..., m; m = n × (n-1), where e k = <v u ,v j >, i=1,2,…,n; j=1,2,…,n,e k Indicates v j Constrained in v i On the contrary, <v j ,v i > represents v i Constrained in v j superior.

[0056] If v j Not with v i If the condition is set, the constraint relationship is empty, and the symbol Indicates that

[0057] Figure 2 shows a single-level loop constraint formed between two instructions, such as Figure 2 As shown, due to setting<v1,v2> and<v2,v1> , that is, v1, v2, form a single-layer loop constraint. Corresponding to the above identification symbols, we have: V = {v1, v2}; E = {e1, e2}; where e1 =<v1,v2> , e2=<v2,v1> .

[0058] Figure 3 It shows the multi-layer loop constraints formed between the three instructions, such as Figure 3 As shown, the transmission order of the constraint relationship is<v1,v2> 、<v2,v3> and<v3,v1> , the constraint relationship is transmitted twice, and finally v1 takes itself as the constraint condition, forming a multi-layer loop constraint. The specific transmission process can be seen in the following (3) Construction and judgment of the instruction loop constraint diagnosis matrix. Corresponding to the above identification symbols, there are: V = {v1,v2,v3}; e = {e1,e2,e3}; where e1 =<v1,v2> , e2=<v2,v3> , e3=<v3,v1> .

[0059] See also Figure 3 , there are 3 vertices representing instructions. According to the design of the above identification symbols, n should be 3, and correspondingly, m should be n×(n-1)=3×2=6. In fact, due to That is, in theory, there should be 6 sets of constraints e j ,j=1,2,3,4,5,6. In fact, since the constraint relationship represented by e4, e5, and e6 has not been established, the constraint relationship is empty and is omitted here and abbreviated as E={e1,e2,e3}.

[0060] Figure 4 It shows the multi-layer loop constraints formed between multiple instructions, such as Figure 4As shown, the constraint relationship is<v1,v2> 、<v2,v3> 、<v3,v6> 、<v6,v5> 、<v5,v4> and<v4,v1> The multiple conductions eventually lead to v1 taking itself as the constraint condition, forming a multi-layer loop constraint; at the same time,<v1,v2> 、<v2,v5> 、<v5,v4> and<v4,v1> Multiple transmissions will also cause v1 to use itself as a constraint condition, forming another multi-layer loop constraint. Corresponding to the above identification symbols, there are: V = {v1,v2,v3,v4,v5,v6}; E = {e1,e2,e3,e4,e5,e6,e7}; where e1 =<v1,v2> , e2=<v2,v3> , e3=<v3,v6> , e4=<v6,v5> ,,e5=<v5,v4> , e6=<v4,v1> , e7=<v2,v5> .

[0061] Through the representation of V and E, the constraint relationship between instructions can be accurately described.

[0062] (2) Construction of the logical matrix of constraints between instructions

[0063] Note that the instruction constraint relationship logic matrix is This matrix corresponds to the above-mentioned logical relationship of measurement and control instructions.

[0064] Among them, the matrix elements Right now,

[0065] When element a ij =1, indicating instruction v j Constraints on instruction v i superior;

[0066] When element a ij =0, indicating instruction v j Not with instruction v i As a condition.

[0067] In particular, a ii =0, it means any instruction v i None of them are based on themselves.

[0068] From this we can see that:

[0069] Figure 2 The logic matrix corresponding to the single-layer loop constraint shown

[0070] Figure 3 The logic matrix corresponding to the multi-layer loop constraint shown

[0071] Figure 4 The logic matrix corresponding to the multi-layer loop constraint shown

[0072] (3) Construction and determination of instruction loop constraint diagnosis matrix

[0073] After completing the construction of the inter-instruction constraint logic matrix, first calculate the instruction constraint transfer function to obtain the instruction loop constraint diagnosis matrix (corresponding to the above-mentioned fault diagnosis information). Then, by judging the values of the diagonal elements of the diagnosis matrix, it is determined whether there are loop constraints between instructions, as follows:

[0074] 1) Define the instruction constraint transfer function as

[0075]

[0076] Among them, Z l is the diagnostic matrix corresponding to the lth transmission (or conduction), W l is the weight matrix corresponding to the lth transmission diagnosis, W l =A l , l≤n-1.

[0077] 2) Calculate the instruction constraint transfer function one by one to obtain the corresponding diagnostic matrix Z l . Each time an operation is completed, the diagnosis matrix Z l The diagonal elements of Make a judgment:

[0078] i. If there is a diagonal element If the value of is not 0, it means that the constraint relationship has been transmitted l times, and finally leads to instruction v i Using itself as a constraint condition, a circular constraint is formed.

[0079] ii. If any diagonal element If the values of are all 0, it means that the constraint relationship will not form a circular constraint after l transmissions.

[0080] If after n-1 operations and diagnoses, the diagnosis matrix Z n-1 Any diagonal element of If the values of are all 0, it means that the constraint relationship between the instructions does not form a loop constraint.

[0081] by Figure 2 The corresponding logic matrix For example, the matrix element a 12 =1, indicating that instruction v2 is constrained on instruction v1, a 21 =1, indicating that instruction v1 is constrained on instruction v2. The matrix after one transmission is: Diagonal elements of the diagnostic matrix Both are not 0, indicating that the constraint relationship is transmitted once, which eventually leads to instructions v1 and v2 taking themselves as constraints, forming a circular constraint.

[0082] Then Figure 3 The corresponding logic matrix For example, the diagnostic matrix after one conduction is:

[0083] The diagnostic matrix after 2 conductions is:

[0084] From the above diagnosis matrix, we can see that after two transmissions, the diagonal element values of the diagnosis matrix are not 0. At this time, it can be seen that v1, v2, and v3 are all constrained by themselves, forming a multi-layer cyclic constraint.

[0085] Figure 5 This is the fault diagnosis flow chart of the measurement and control instruction loop constraint, such as Figure 5 As shown, the process includes:

[0086] Step 1: Figure 5 As shown in the symbol 1, the description of the constraint relationship between instructions. According to the description method of the constraint relationship between instructions, the constraint relationship between any two instructions is determined to be e k = <v i ,v j >, k=1,2,…,m;i=1,2,…,n;j=1,2,…,n;m=n×(n-1), the meanings of the identification symbols are as described above.

[0087] Step 2: Figure 5 As shown in the symbol 2, the construction of the logic matrix of the constraint relationship between instructions. According to the construction method of the logic matrix of the constraint relationship between instructions, a logic matrix is established according to the constraint relationship between any two instructions, and the matrix elements are assigned values, where the matrix elements are:

[0088]

[0089] The meaning of each identification symbol is as described above.

[0090] Step 3: Figure 5 As shown in the symbol 3, the diagnostic matrix of the loop constraint is calculated. According to the instruction constraint transfer function, the corresponding diagnostic matrix after the constraint relationship is transmitted l times is calculated, and the diagonal elements of the diagnostic matrix are The value of is judged:

[0091] i. If there is a diagonal element If the value of is not 0, it is determined that the constraint relationship has been transmitted l times, and finally leads to instruction v iTaking itself as a constraint condition, a cyclic constraint is formed, and the diagnosis ends;

[0092] ii. If the value of any diagonal element is 0, it is determined that after l transmissions of the constraint relationship, a cyclic constraint is not formed: If l < n - 1, set l = l + 1 and repeat step 3; If l = n - 1, it means that the constraint relationship between the instructions does not form a cyclic constraint, and the diagnosis ends.

[0093] The method for diagnosing cyclic constraint faults of measurement and control instructions in the embodiments of the present invention first traverses all instructions cyclically according to the design arrangement of the measurement and control instructions, compares them pairwise. If there is a constraint relationship between two instructions, a logical connection between the instructions is constructed, and finally a logical matrix of the constraint relationship between the instructions is established. The value of the corresponding matrix element is determined according to the constraint relationship between the instructions, and then matrix operations are performed successively, and the value of the diagonal element of the diagnostic matrix is judged, so as to diagnose whether there is a cyclic constraint between the instructions. In this way, it can replace the manual inspection method, is no longer restricted by the engineering experience and working status of the designers, and improves the reliability and stability of the fault diagnosis.

[0094] At the same time, the embodiments of the present invention can also quickly and accurately find logical errors from a large number of measurement and control instructions with complex designs and tight couplings, improving the efficiency of fault diagnosis; moreover, it can detect all cyclic constraint faults in the measurement and control instructions, reducing the situation of missed detection and improving the completeness of fault diagnosis; at the same time, it can also discover problems in advance during the planning stage of the measurement and control activities, and will not bring faults into the task implementation process, effectively ensuring the safety of the measurement and control tasks.

[0095] Based on a similar inventive concept, the embodiments of the present invention also provide a device for determining cyclic constraint faults of measurement and control instructions, and this device can preferably be applied to the process in the above method embodiments.

[0096] Figure 6 is the structural block diagram of the device for determining cyclic constraint faults of measurement and control instructions, as Figure 6 shown, this device includes: an instruction acquisition unit 1, a measurement and control instruction logical relationship construction unit 2, a fault diagnosis information generation unit 3, and a fault determination unit 4, where:

[0097] The instruction acquisition unit 1 is used to acquire multiple measurement and control instructions with a constraint relationship, and this instruction acquisition unit 1 can implement the description operation of the constraint relationship between the instructions in the above method embodiments.

[0098] The measurement and control instruction logical relationship construction unit 2 is used to construct the measurement and control instruction logical relationship in matrix form according to the constraint relationship between each measurement and control instruction, and this measurement and control instruction logical relationship construction unit 2 can execute the construction operation of the logical matrix of the constraint relationship between the instructions in the above method embodiments.

[0099] Specifically, the measurement and control instruction logical relationship construction unit 2 includes: a constraint relationship acquisition module and a measurement and control instruction logical relationship construction module, wherein:

[0100] A constraint relationship acquisition module is used to obtain the constraint relationships between each pair of measurement and control instructions;

[0101] The measurement and control instruction logical relationship construction module is used to construct the measurement and control instruction logical relationship in the matrix form according to the constraint relationship between each measurement and control instruction.

[0102] The fault diagnosis information generating unit 3 is used to generate fault diagnosis information in matrix form according to the logical relationship of the measurement and control instructions based on a predetermined instruction constraint transfer function. The instruction constraint transfer function is generated based on the logical relationship of the measurement and control instructions and the transmission order of the constraint relationship between each measurement and control instruction.

[0103] Specifically, the fault diagnosis information generating unit may generate fault diagnosis information corresponding to the constraint relationship transmission order based on a predetermined instruction constraint transfer function and according to the measurement and control instruction logical relationship and the constraint relationship transmission order.

[0104] The fault diagnosis information generating unit 3 can realize the generation of the cyclic constraint diagnosis matrix in the above method embodiment.

[0105] Fault determination unit 4 is configured to determine, in response to predetermined values of matrix elements in the fault diagnosis information (i.e., the aforementioned diagnosis matrix), whether a cyclic constraint fault exists between the plurality of measurement and control instructions. Fault determination unit 4 may determine whether a cyclic constraint fault exists between the plurality of measurement and control instructions based on the values of the diagonal elements of the aforementioned diagnosis matrix.

[0106] When there is a constraint relationship between the measurement and control instructions, the corresponding matrix element value in the measurement and control instruction logical relationship can be set to 1. When the diagonal matrix element value in the fault diagnosis information is not 0 (for example, the diagonal matrix element value can be 1, 2, etc.), the fault determination unit can determine that a cyclic constraint fault is formed between the multiple measurement and control instructions.

[0107] The measurement and control instruction logical relationship construction unit 2 constructs a matrix-form measurement and control instruction logical relationship based on the constraint relationship between the multiple measurement and control instructions obtained by the instruction acquisition unit 1. Subsequently, the fault diagnosis information generation unit 3 generates matrix-form fault diagnosis information based on the predetermined instruction constraint transfer function and the measurement and control instruction logical relationship. When the matrix element value in the fault diagnosis information is a predetermined value, the fault determination unit 4 determines that a loop constraint fault is formed between the multiple measurement and control instructions. Through the embodiment of the present invention, manual means can be replaced to quickly and accurately detect logical errors between measurement and control instructions, thereby avoiding bringing loop constraint faults into measurement and control activities.

[0108] The specific execution process of the above-mentioned units and modules can be found in the description of the above-mentioned method embodiment, which will not be repeated here.

[0109] In actual operation, the above-mentioned units and modules can be provided in combination or individually, and the present invention is not limited thereto.

[0110] This embodiment further provides an electronic device, which may be a desktop computer, a tablet computer, a mobile terminal, etc., but this embodiment is not limited thereto. In this embodiment, the electronic device may be implemented with reference to the above-mentioned method embodiment and the embodiment of the measurement and control instruction cycle constraint fault determination device, the contents of which are incorporated herein and repeated parts are not repeated here.

[0111] Figure 7 FIG. 6 is a schematic block diagram of a system structure of an electronic device 600 according to an embodiment of the present invention. Figure 7 As shown, the electronic device 600 may include a central processor 100 and a memory 140; the memory 140 is coupled to the central processor 100. It should be noted that this figure is exemplary; other types of structures may be used to supplement or replace this structure to implement telecommunication functions or other functions.

[0112] In one embodiment, the measurement and control instruction cycle constraint fault determination function may be integrated into the central processing unit 100. The central processing unit 100 may be configured to perform the following control:

[0113] Obtain multiple measurement and control instructions with constraint relationships;

[0114] Construct the logical relationship of measurement and control instructions in matrix form according to the constraint relationship between each measurement and control instruction;

[0115] generating fault diagnosis information in matrix form according to the measurement and control instruction logical relationship based on a predetermined instruction constraint transfer function, wherein the instruction constraint transfer function is generated based on the measurement and control instruction logical relationship and the constraint relationship transmission order between each measurement and control instruction;

[0116] In response to the matrix element value in the fault diagnosis information being a predetermined value, it is determined that a cyclic constraint fault is formed between the multiple measurement and control instructions.

[0117] From the above description, it can be seen that the electronic device provided in the embodiment of the present application constructs a matrix-form measurement and control instruction logical relationship based on the constraint relationship between the multiple measurement and control instructions obtained, and then generates matrix-form fault diagnosis information based on the measurement and control instruction logical relationship based on a predetermined instruction constraint transfer function. When the matrix element value in the fault diagnosis information is a predetermined value, it is determined that a loop constraint fault is formed between the multiple measurement and control instructions. Through the embodiment of the present invention, manual means can be replaced to quickly and accurately detect logical errors between measurement and control instructions, thereby avoiding bringing loop constraint faults into measurement and control activities.

[0118] In another embodiment, the measurement and control instruction loop constraint fault determination device can be configured separately from the central processing unit 100. For example, the measurement and control instruction loop constraint fault determination device can be configured as a chip connected to the central processing unit 100, and the measurement and control instruction loop constraint fault determination function can be realized through the control of the central processing unit.

[0119] like Figure 7 As shown, the electronic device 600 may further include: a communication module 110, an input unit 120, an audio processor 130, a display 160, and a power supply 170. It is worth noting that the electronic device 600 does not necessarily have to include Figure 7 In addition, the electronic device 600 may also include all components shown in Figure 7 For components not shown, reference may be made to the prior art.

[0120] like Figure 7 As shown, the central processing unit 100 is sometimes also referred to as a controller or an operation control unit, and may include a microprocessor or other processor device and / or logic device. The central processing unit 100 receives inputs and controls the operations of various components of the electronic device 600 .

[0121] Memory 140 may be, for example, one or more of a cache, flash memory, hard drive, removable media, volatile memory, non-volatile memory, or other suitable devices. It may store the aforementioned failure-related information and may also store programs that execute the relevant information. The CPU 100 may execute the programs stored in memory 140 to implement information storage or processing.

[0122] The input unit 120 provides input to the CPU 100. The input unit 120 may be, for example, a keypad or touch input device. The power supply 170 is used to provide power to the electronic device 600. The display 160 is used to display objects such as images and text. The display may be, for example, an LCD display, but is not limited thereto.

[0123] The memory 140 may be a solid-state memory, such as a read-only memory (ROM), a random access memory (RAM), or a SIM card. Alternatively, it may be a memory that retains information even when power is off, can be selectively erased, and is provided with more data. Examples of such memory are sometimes referred to as EPROMs. The memory 140 may also be some other type of device. The memory 140 includes a buffer memory 141 (sometimes referred to as a buffer). The memory 140 may include an application / function storage unit 142 for storing application programs and function programs or processes for executing the operations of the electronic device 600 via the central processing unit 100.

[0124] The memory 140 may also include a data storage unit 143 for storing data, such as contacts, digital data, pictures, sounds, and / or any other data used by the electronic device. The driver storage unit 144 of the memory 140 may include various driver programs for communication functions of the electronic device and / or for executing other functions of the electronic device (such as messaging applications, address book applications, etc.).

[0125] The communication module 110 is a transmitter / receiver 110 that transmits and receives signals via an antenna 111. The communication module (transmitter / receiver) 110 is coupled to the central processor 100 to provide input signals and receive output signals, which may be the same as in a conventional mobile communication terminal.

[0126] Based on different communication technologies, multiple communication modules 110 may be provided in the same electronic device, such as a cellular network module, a Bluetooth module, and / or a wireless local area network module. The communication module (transmitter / receiver) 110 is also coupled to a speaker 131 and a microphone 132 via an audio processor 130 to provide audio output via the speaker 131 and receive audio input from the microphone 132, thereby implementing common telecommunication functions. The audio processor 130 may include any suitable buffer, decoder, amplifier, etc. Furthermore, the audio processor 130 is also coupled to the central processing unit 100, enabling local recording via the microphone 132 and playback of stored audio via the speaker 131.

[0127] An embodiment of the present invention further provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the steps of the above-mentioned measurement and control instruction cycle constraint fault determination method are implemented.

[0128] In summary, the fault diagnosis method for loop constraints of measurement and control instructions provided by the embodiment of the present invention can replace manual means, and can quickly and accurately detect logical errors between measurement and control instructions, avoiding bringing loop constraint faults into measurement and control activities.

[0129] Preferred embodiments of the present invention have been described above with reference to the accompanying drawings. Many features and advantages of these embodiments are apparent from this detailed description, and thus the appended claims are intended to cover all such features and advantages of these embodiments that fall within their true spirit and scope. Furthermore, since numerous modifications and changes will readily occur to those skilled in the art, the embodiments of the present invention are not intended to be limited to the precise construction and operation illustrated and described, but are intended to cover all suitable modifications and equivalents that fall within the scope thereof.

[0130] It will be understood by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Thus, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0131] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowcharts and / or block diagrams, as well as combinations of processes and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowcharts and / or block diagrams. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0132] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.

[0133] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1A step that specifies a function in one or more boxes.

[0134] Specific embodiments are used in the present invention to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core ideas. At the same time, for those skilled in the art, according to the ideas of the present invention, there may be changes in the specific implementation methods and application scopes. In summary, the contents of this specification should not be understood as limiting the present invention.

Claims

1. A method for determining a measurement and control instruction loop constraint fault, characterized in that: The method comprises: Obtain multiple measurement and control instructions with constraint relationships; Construct the logical relationship of measurement and control instructions in matrix form according to the constraint relationship between each measurement and control instruction; generating fault diagnosis information in matrix form according to the measurement and control instruction logical relationship based on a predetermined instruction constraint transfer function, wherein the instruction constraint transfer function is generated based on the measurement and control instruction logical relationship and the constraint relationship transmission order between each measurement and control instruction; In response to the matrix element value in the fault diagnosis information being a predetermined value, it is determined that a cyclic constraint fault is formed between the multiple measurement and control instructions, including: when the diagonal matrix element value in the fault diagnosis information is not 0, it is determined that a cyclic constraint fault is formed between the multiple measurement and control instructions.

2. The method according to claim 1, characterized in that The logical relationship of measurement and control instructions in matrix form is constructed based on the constraint relationship between each measurement and control instruction, including: Obtain the constraint relationship between each measurement and control instruction; The measurement and control instruction logical relationship in the matrix form is constructed according to the constraint relationship between each measurement and control instruction.

3. The method according to claim 1, characterized in that Based on a predetermined instruction constraint transfer function, generating fault diagnosis information in matrix form according to the measurement and control instruction logical relationship includes: Based on a predetermined instruction constraint transfer function, fault diagnosis information corresponding to the constraint relationship transmission order is generated according to the measurement and control instruction logical relationship and the constraint relationship transmission order.

4. The method according to claim 1, wherein When there is a constraint relationship between the measurement and control instructions, the corresponding matrix element value in the measurement and control instruction logical relationship is 1, and in response to the matrix element value in the fault diagnosis information being a predetermined value, determining that a cyclic constraint fault is formed between the multiple measurement and control instructions includes: In response to the diagonal matrix element value in the fault diagnosis information being not 0, it is determined that a cyclic constraint fault is formed between the multiple measurement and control instructions.

5. A device for determining a measurement and control instruction loop constraint fault, characterized in that: The device comprises: An instruction acquisition unit, used to acquire multiple measurement and control instructions with constraint relationships; A measurement and control instruction logic relationship construction unit is used to construct a matrix-form measurement and control instruction logic relationship based on the constraint relationship between each measurement and control instruction; a fault diagnosis information generating unit, configured to generate fault diagnosis information in a matrix form according to the measurement and control instruction logical relationship based on a predetermined instruction constraint transfer function, wherein the instruction constraint transfer function is generated based on the measurement and control instruction logical relationship and the constraint relationship transmission order between each measurement and control instruction; A fault determination unit is used to determine that a cyclic constraint fault is formed between the multiple measurement and control instructions in response to the matrix element value in the fault diagnosis information being a predetermined value, including: when the diagonal matrix element value in the fault diagnosis information is not 0, it is determined that a cyclic constraint fault is formed between the multiple measurement and control instructions.

6. The device according to claim 5, characterized in that The measurement and control instruction logical relationship construction unit includes: A constraint relationship acquisition module is used to obtain the constraint relationships between each pair of measurement and control instructions; The measurement and control instruction logical relationship construction module is used to construct the measurement and control instruction logical relationship in the matrix form according to the constraint relationship between each measurement and control instruction.

7. The device according to claim 5, characterized in that The fault diagnosis information generating unit is specifically used for: Based on a predetermined instruction constraint transfer function, fault diagnosis information corresponding to the constraint relationship transmission order is generated according to the measurement and control instruction logical relationship and the constraint relationship transmission order.

8. The device according to claim 5, characterized in that When there is a constraint relationship between the measurement and control instructions, the corresponding matrix element value in the measurement and control instruction logical relationship is 1, and the fault determination unit is specifically configured to: In response to the diagonal matrix element value in the fault diagnosis information being not 0, it is determined that a cyclic constraint fault is formed between the multiple measurement and control instructions.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the program, the steps of the method according to any one of claims 1 to 4 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.

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