Interface testing method and device, storage medium and electronic equipment

By using feedback data as new expected feedback data in interface testing, the problem of low efficiency in interface testing is solved, and efficient automated updates of interface testing are achieved.

CN114546842BActive Publication Date: 2025-11-11QINGDAO HAIER TECH +1
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Patent Information

Application Number
CN202210122966.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-02-09
Publication Date
2025-11-11
Estimated Expiration
2042-02-09

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Abstract

This invention discloses an interface testing method, apparatus, storage medium, and electronic device. The method includes: acquiring a target test case and expected feedback data for the target test case, wherein the target test case is used to test a target interface, and the expected feedback data is the data predicted when the target interface passes the test; performing a first target test on the target interface according to the target test case to obtain first feedback data, wherein the first feedback data is the data returned when the target interface completes the first target test; if the comparison result between the first feedback data and the expected feedback data does not meet a preset comparison condition, and the first feedback data meets the test pass condition, determining that the target interface has passed the test, and using the first feedback data as new expected feedback data for the target test case. This invention solves the technical problem of low efficiency in interface testing.
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Citation Information

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