Detection method, detection device and storage medium for display panel

Abstract

The present application relates to a detection method, a detection device and a storage medium for a display panel, wherein the display panel includes a display substrate and a pad arranged on an edge area of ​​the display substrate, and the detection method includes: insulating a detection electrode and the pad from each other and arranging them relatively spaced apart; applying a voltage to the pad to perform a lighting test on the display panel; monitoring the amount of charge on the detection electrode during the application of the voltage to the pad; determining a defect detection result of the pad based on the amount of charge, so that when the display panel is subjected to a lighting test, damage abnormalities in the edge area of ​​the display panel can be detected in time to reduce losses.

Description

[Technical field]

[0001] The present application relates to the field of display technology, and in particular to a detection method, a detection device and a storage medium for a display panel. [Background technology]

[0002] During the manufacturing process of display panels, edge areas of the display panels will come into contact with various positioning and needle-piercing mechanisms. When the positioning mechanism is worn or the needle-piercing mechanism is stuck, a large number of edge areas of the display panels will be damaged.

[0003] However, in the prior art, when performing a lighting test on a display panel, it is impossible to detect abnormal damage in the edge area of ​​the display panel, which leads to continuous expansion of the abnormality and further causes expansion of losses. [Summary of the invention]

[0004] The embodiments of the present application provide a detection method, a detection device and a storage medium for a display panel, so that when performing a lighting test on the display panel, damage abnormalities in the edge area of ​​the display panel can be detected in time, thereby reducing losses.

[0005] In order to solve the above problems, an embodiment of the present application provides a detection method for a display panel, which display panel includes a display substrate and a pad arranged on an edge area of ​​the display substrate, and the detection method includes: insulating the detection electrode and the pad from each other and arranging them relatively spaced apart; applying a voltage to the pad to perform a lighting test on the display panel; monitoring the amount of charge on the detection electrode during the application of the voltage to the pad; and determining a defect detection result of the pad based on the amount of charge.

[0006] The step of applying voltage to the pad specifically includes: electrically connecting a probe of a lighting test device to the pad; and applying voltage to the probe through a signal generator in the lighting test device that is electrically connected to the probe.

[0007] The step of monitoring the charge amount on the detection electrode specifically includes: monitoring the charge amount on the detection electrode through a charge amount monitor electrically connected to the detection electrode.

[0008] Among them, determining the defect detection result of the pad according to the charge amount specifically includes: determining the facing area of ​​the pad and the detection electrode according to the charge amount; when the facing area is smaller than the preset area, determining that the pad is damaged as the defect detection result of the pad.

[0009] Among them, determining the defect detection result of the pad according to the charge amount specifically includes: when a change in the charge amount is monitored during the application of voltage to the pad, determining that the pad is damaged during the lighting test as the defect detection result of the pad.

[0010] The display panel further includes a color filter substrate arranged opposite to the display substrate, the side of the display substrate provided with the solder pad faces the color filter substrate, and the orthographic projection of the color filter substrate on the display substrate is outside the orthographic projection of the solder pad on the display substrate.

[0011] Among them, the display substrate includes a substrate and a thin film transistor and multiple signal lines arranged on the substrate. The signal line is electrically connected to the thin film transistor. There is at least one pad, and each pad is electrically connected to at least one signal line, which is used to provide the voltage to at least one signal line when the display panel is lit for testing.

[0012] There are multiple solder pads, and the multiple solder pads are arranged in a row at intervals along the edge of the display substrate.

[0013] In order to solve the above problems, an embodiment of the present application also provides a detection device for a display panel, which display panel includes a display substrate and a pad arranged on the edge area of ​​the display substrate, and the detection device includes: an opposing module, used to insulate the detection electrode and the pad from each other and arrange them relatively spaced apart; a testing module, used to apply a voltage to the pad to perform a lighting test on the display panel; a monitoring module, used to monitor the amount of charge on the detection electrode during the application of the voltage to the pad; and a determination module, used to determine the defect detection result of the pad based on the charge amount.

[0014] The test module is specifically used to: electrically connect the probe of the lighting test equipment to the pad; and apply voltage to the probe through a signal generator in the lighting test equipment that is electrically connected to the probe.

[0015] The monitoring module is specifically used to monitor the charge amount on the detection electrode through a charge amount monitor electrically connected to the detection electrode.

[0016] The determination module is specifically used to: determine the facing area between the pad and the detection electrode according to the charge amount; when the facing area is smaller than the preset area, determine that the pad is damaged as a defect detection result of the pad.

[0017] The determination module is specifically used for: when a change in charge amount is monitored during the period of applying voltage to the pad, determining that the pad is damaged during the lighting test is a defect detection result of the pad.

[0018] The display panel further includes a color filter substrate arranged opposite to the display substrate, the side of the display substrate provided with the solder pad faces the color filter substrate, and the orthographic projection of the color filter substrate on the display substrate is outside the orthographic projection of the solder pad on the display substrate.

[0019] Among them, the display substrate includes a substrate, a thin film transistor and a plurality of signal lines arranged on the substrate, the signal line is electrically connected to the thin film transistor, the number of the pad is at least one, and each pad is electrically connected to at least one signal line, which is used to provide voltage to at least one signal line when the display panel is lit for testing.

[0020] There are multiple solder pads, and the multiple solder pads are arranged in a row at intervals along the edge of the display substrate.

[0021] An embodiment of the present application further provides a computer-readable storage medium, which stores a computer program, and the computer program is suitable for being loaded by a processor to execute any of the above-mentioned detection methods.

[0022] The beneficial effects of the present application are as follows: Different from the prior art, the detection method, detection device and storage medium for a display panel provided by the present application insulate the detection electrode and the pad on the display substrate from each other and set them relatively spaced apart, then apply voltage to the pad to perform a lighting test on the display panel, and monitor the amount of charge on the detection electrode during the period of applying the voltage to the pad, and then determine the defect detection result of the pad based on the charge amount, so that when the display panel is lit up for testing, the damage abnormality in the edge area of ​​the display panel can be detected in time to reduce losses.

Brief Description of the Drawings

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0024] Figure 1 is a flow chart of a detection method for a display panel provided in an embodiment of the present application;

[0025] Figure 2 is a schematic diagram of a top view of the structure of a display panel provided in an embodiment of the present application;

[0026] Figure 3 yes Figure 2 A schematic cross-sectional view of the display panel taken along line PP';

[0027] Figure 4 is a schematic diagram of a scene of a detection system for a display panel provided in an embodiment of the present application;

[0028] Figure 5 is a schematic diagram of a top view of a display substrate with a pad provided on an edge region provided in an embodiment of the present application;

[0029] Figure 6 yes Figure 5 A schematic cross-sectional view of a display substrate with a solder pad disposed on a middle edge region taken along line AA';

[0030] Figure 7 is another schematic cross-sectional view of the display panel provided in an embodiment of the present application;

[0031] Figure 8 It is a schematic diagram of the structure of a detection device for a display panel provided in an embodiment of the present application. [Specific implementation method]

[0032] The present application is further described in detail below in conjunction with the accompanying drawings and examples. It is particularly noted that the following examples are only used to illustrate the present application, but are not intended to limit the scope of the present application. Similarly, the following examples are only some embodiments of the present application rather than all embodiments, and all other embodiments obtained by those of ordinary skill in the art without making creative work are within the scope of protection of the present application.

[0033] See also Figure 1 , Figure 1 FIG. 1 is a flow chart of a detection method for a display panel provided in an embodiment of the present application. Figure 1 As shown, the detection method for a display panel may include the following steps:

[0034] S11: The detection electrode and the pad are insulated from each other and arranged relative to each other with a gap.

[0035] In this embodiment, if Figure 2 and Figure 3 As shown, the display panel 20 used in the above detection method may include a display substrate 21 and a pad 22, wherein the display substrate 21 may include an edge area C1 and a display area C2 connected to the edge area C1, and the pad 22 is arranged on the edge area C1 of the display substrate 21.

[0036] Specifically, the display panel 20 may further include a color filter substrate 23 disposed opposite to the display substrate 21, wherein the side of the display substrate 21 provided with the pad 22 faces the color filter substrate 23, and the orthographic projection of the color filter substrate 23 on the display substrate 21 is located outside the orthographic projection of the pad 22 on the display substrate 21. Specifically, the color filter substrate 23 may be located on the display area C2 of the display substrate 21, and the pad 22 may be located on the edge area C1 of the display substrate 21.

[0037] Furthermore, the inventors have found that, during the manufacturing process of the display panel 20, since the terminal region of the display panel 20 only has the display substrate 21, that is, the color filter substrate 23 does not exist directly above the edge region C1 of the display substrate 21, the terminal region of the display panel 20 is relatively prone to the problem of the edge region C1 of the display substrate 21 being defective. In order to solve this problem, the present embodiment insulates the detection electrode 31 from the pad 22 on the edge region C1 of the display substrate 21 and sets them relatively spaced apart, so that the damage abnormality of the edge region C1 of the display substrate 21 can be converted into a corresponding electrical signal through the detection electrode, so that the damage abnormality of the edge region C1 of the display panel 20 can be detected based on the electrical signal.

[0038] Specifically, the detection electrode 31 may be a metal plate.

[0039] In a specific embodiment, Figure 4 As shown, the detection electrode 31 can be arranged on the side of the display substrate 21 away from the pad 22, and the detection electrode 31 is opposite to the pad 22, so as to achieve the purpose of insulating the detection electrode 31 and the pad 22 from each other and setting them relatively spaced apart.

[0040] Furthermore, it can be understood that after the above-mentioned detection electrode 31 and the above-mentioned welding pad 22 are insulated from each other and relatively spaced apart, the detection electrode 31 and welding pad 22 that are insulated from each other and relatively spaced apart will form a capacitor, and the detection electrode 31 and welding pad 22 that are insulated from each other and relatively spaced apart will correspond to the two plates of the capacitor.

[0041] In a possible application scenario, the detection electrode 31 can be arranged on a workbench (not shown in the figure), and when it is necessary to perform a lighting test on the display panel 20, the display panel 20 can be placed on the workbench, and the pad 22 in the display panel 20 is opposite to the detection electrode 31 on the workbench. Specifically, after the display panel 20 is placed on the workbench, the surface of the display substrate 21 in the display panel 20 that is away from the pad 22 can contact the detection electrode 31 on the workbench.

[0042] S12: applying voltage to the pad to perform a lighting test on the display panel.

[0043] In this embodiment, if Figure 4 As shown, a lighting test device may be used to apply a voltage to the pad 22. Specifically, the step S12 may include:

[0044] S121 : The probe 41 of the lighting test equipment is electrically connected to the pad 22 .

[0045] The probe 41 may be a spring probe or a retractable probe, and the needle of the probe 41 may abut against a side of the pad 22 away from the display substrate 21 to achieve electrical connection between the probe 41 and the pad 22 .

[0046] S122: applying voltage to the probe 41 through the signal generator 42 electrically connected to the probe 41 in the lighting test equipment.

[0047] The signal generator 42 is electrically connected to the probe 41 to provide a voltage electrical signal to the probe 41. The probe 41 transmits the received voltage electrical signal to the pad 22, thereby achieving the purpose of applying voltage to the pad 22.

[0048] In some specific embodiments, Figure 5 and Figure 6 As shown, the display substrate 21 may specifically include a substrate 211 and a plurality of thin film transistors 212 and a plurality of signal lines 213 disposed on the substrate 211. The plurality of signal lines 213 are electrically connected to the plurality of thin film transistors 212, respectively, and the signal lines may specifically be data lines or scan lines. The substrate 211 may be made of glass or hard resin, or may be one of organic polymers such as polyimide, polycarbonate, polyethylene terephthalate, polyethersulfone substrate, etc.

[0049] Specifically, the number of the above-mentioned pads 22 can be at least one, and each pad 22 can be electrically connected to at least one signal line 213, and is used to provide a test signal (that is, the above-mentioned voltage) to the at least one signal line 213 when the above-mentioned display panel 20 is lit for testing, so as to detect whether the signal line 213 has a short circuit or other defects.

[0050] In some embodiments, the thin film transistor 212 and the signal line 213 may be disposed on the substrate 211 in the display area C2, and the pad 22 may be disposed on the substrate 211 in the edge area C1. In addition, in some specific embodiments, the display substrate 21 may further include a plurality of binding traces 214, which are connected to the plurality of signal lines 213 in a one-to-one correspondence, that is, each signal line 213 may be connected to a corresponding pad 22 through its corresponding binding trace 214.

[0051] In some embodiments, Figure 5As shown, each pad 22 can be electrically connected to a plurality of signal lines 213, and accordingly, the pad 22 can be referred to as a shorting bar. Specifically, the signal lines 213 included in the display substrate 21 can be divided into a plurality of signal line groups, each signal line group including a plurality of signal lines 213. Furthermore, the signal lines 213 in the same signal line group can be connected to the same pad (or shorting bar) 22, and the signal lines 213 in different signal line groups can be connected to different pads (or shorting bars) 22.

[0052] Furthermore, in a specific implementation, when there are multiple pads 22, the multiple pads 22 can be arranged in a row along the edge of the display substrate 21 (or the substrate 211), so that the signal line 213 located in the display area C2 can be connected to the corresponding pad (or short-circuit bar) 22 nearby, so as to reduce the length required for the binding trace 214, thereby reducing the voltage drop on the binding trace 214 and reducing power consumption.

[0053] In some specific embodiments, Figure 2 As shown, the plurality of pads 22 may be arranged in a row at equal intervals along the edge of the display substrate 21 , and the plurality of pads 22 may have the same shape and size, for example, all are square.

[0054] It can be understood that when it is necessary to perform a lighting test on the above-mentioned display panel 20, the signal generator 42 in the above-mentioned lighting test equipment can be turned on to trigger the signal generator 42 to provide the above-mentioned voltage electrical signal to the above-mentioned probe 41. Thereafter, the voltage electrical signal will be transmitted to the relevant signal line 213 through the probe 41, the pad 22, and the binding trace 214 in sequence, thereby lighting up the relevant pixels (for example, red pixels, green pixels or blue pixels) electrically connected to the signal line 213, so that the above-mentioned display panel 20 displays the picture required for the test (for example, a red picture, a green picture or a blue picture).

[0055] Furthermore, after the lighting test is finished, for a good display panel that has passed the screen test, the portion where the pad 22 is connected to the binding trace 214 can be cut off by laser, so that the display panel 20 can be used for the next step of assembling the driving circuit module.

[0056] S13: During the period of applying the voltage to the pad, the amount of charge on the detection electrode is monitored.

[0057] In one embodiment, Figure 4As shown, the charge amount on the detection electrode 31 can be monitored by a charge amount monitor 32 electrically connected to the detection electrode 31. Specifically, after being turned on, the charge amount monitor 32 can monitor the charge amount on the detection electrode 31 in real time, and can obtain the change of the charge amount on the detection electrode 31 over time.

[0058] In the present embodiment, since the detection electrode 31 and the pad 22 which are insulated from each other and relatively spaced apart form a capacitor, an induced charge will be generated on the detection electrode 31 during the period of applying voltage to the pad 22 (i.e., during the lighting test of the display panel 20), and after the application of voltage to the pad 22 is stopped (i.e., after the lighting test of the display panel 20 is ended), the charge on the detection electrode 31 will disappear.

[0059] Specifically, according to the calculation formula of the charge Q carried by the plates of the capacitor (that is, Q=CU, where C=εS / d, S is the facing area of ​​the plates, d is the distance between the plates, ε is the dielectric constant of the medium between the plates, and U is the voltage difference between the plates), since d and ε are constants, and U is equal to the voltage applied to the above-mentioned pad 22, which is also a constant, the charge amount Q on the plates of the above-mentioned capacitor (that is, the charge amount on the above-mentioned detection electrode 31) is only related to the facing area S of the plates of the capacitor (that is, the facing area between the above-mentioned detection electrode 31 and the pad 22).

[0060] In a specific embodiment, for a capacitor composed of the detection electrode 31 and the pad 22, the facing area S of the capacitor's plates (that is, the facing area of ​​the detection electrode 31 and the pad 22) can be equal to the cross-sectional area of ​​the pad 22 of the capacitor.

[0061] Specifically, the cross-sectional area of ​​the detection electrode 31 of the capacitor may be no less than the initial cross-sectional area of ​​the pad 22, and the positive projection of the detection electrode 31 of the capacitor on the pad 22 may completely cover the pad 22, thereby ensuring that the facing area of ​​the detection electrode 31 of the capacitor and the pad 22 is the cross-sectional area of ​​the pad 22 of the capacitor, so that the amount of charge on the above-mentioned detection electrode 31 is only related to the cross-sectional area of ​​the above-mentioned pad 22.

[0062] It should be noted that the initial cross-sectional area of ​​the pad 22 refers to the cross-sectional area required when the pad 22 is formed, that is, the cross-sectional area before the pad 22 is damaged. Figure 7As shown, if the pad 22 is damaged, the cross-sectional area of ​​the pad 22 (that is, the area directly facing the detection electrode 31 of the capacitor and the pad 22) will decrease, so that the charge on the detection electrode 31 of the capacitor will decrease accordingly, and the value measured by the charge monitor will decrease. Therefore, the defect of the pad 22 on the edge area C1 of the display substrate 21 can be determined by monitoring the charge on the detection electrode 31.

[0063] S14: Determine the defect detection result of the pad according to the charge amount.

[0064] In one embodiment, the above S14 may specifically include:

[0065] S1-1: Determine the facing area between the pad and the detection electrode according to the charge amount.

[0066] Specifically, the facing area can be expressed as S, and S=Qd / (εU), where d is the spacing distance between the pad 22 and the detection electrode 31, ε is the dielectric constant of the medium between the pad 22 and the detection electrode 31, U is the voltage applied to the pad 22, and Q is the amount of charge monitored on the detection electrode 31. In addition, since d and ε are constants, and U and Q are known values, the above-mentioned facing area (that is, the cross-sectional area of ​​the pad 22) S can be calculated by the above-mentioned calculation formula S=Qd / (εU).

[0067] S1-2: When the facing area is smaller than the preset area, determining that the pad is damaged is a defect detection result of the pad.

[0068] The preset area may be the initial cross-sectional area of ​​the pad 22 , that is, the cross-sectional area of ​​the pad 22 when it is not damaged.

[0069] Specifically, when the facing area between the pad 22 and the detection electrode 31 (that is, the cross-sectional area of ​​the pad 22) is smaller than the preset area, it can be determined that the pad 22 is damaged, and the damage of the pad 22 can be used as the defect detection result of the pad 22; when the facing area between the pad 22 and the detection electrode 31 is not smaller than the preset area, it can be determined that the pad 22 is not damaged, and the non-damage of the pad 22 can be used as the defect detection result of the pad 22.

[0070] Moreover, in some specific embodiments, if the above-mentioned facing area calculated during the application of voltage to the pad 22 is not a fixed value, the minimum value of the above-mentioned facing area calculated can be compared with the above-mentioned preset area, and when the minimum value of the above-mentioned facing area obtained by comparison is smaller than the above-mentioned preset area, it is determined that the above-mentioned pad 22 is damaged as the defect detection result of the pad 22; conversely, that is, when the minimum value of the above-mentioned facing area obtained by comparison is not smaller than the above-mentioned preset area, it is determined that the above-mentioned pad 22 is not damaged as the defect detection result of the pad 22.

[0071] In another embodiment, the above S14 may specifically include:

[0072] S2-1: When a change in the amount of charge is monitored during the application of voltage to the pad, it is determined that the pad is damaged during the lighting test as a defect detection result of the pad.

[0073] Specifically, from the calculation formula S=Qd / (εU) of the above-mentioned facing area (that is, the cross-sectional area of ​​the pad 22), it can be known that the cross-sectional area of ​​the above-mentioned pad 22 is proportional to the amount of charge on the above-mentioned detection electrode 31. Therefore, during the period of applying voltage to the above-mentioned pad 22, if it is monitored that the amount of charge on the above-mentioned detection electrode 31 has changed (for example, decreased), it means that during the period of applying voltage to the above-mentioned pad 22, the above-mentioned pad has been damaged, for example, pierced by the probe of the above-mentioned lighting test equipment; conversely, if it is monitored that the amount of charge on the above-mentioned detection electrode 31 has not changed, it means that during the period of applying voltage to the above-mentioned pad 22, the above-mentioned pad has not been damaged.

[0074] Furthermore, in a specific embodiment, the above S14 may further include: when during the period of applying voltage to the above-mentioned pad 22, it is monitored that the amount of charge on the above-mentioned detection electrode 31 has not changed, and it is determined that the area directly facing the above-mentioned pad 22 and the detection electrode 31 is smaller than the above-mentioned preset area, it can be determined that the above-mentioned pad 22 is damaged before the lighting test, for example, it is worn by the positioning mechanism, and the damage of the above-mentioned pad 22 before the lighting test can be used as a defect detection result of the pad 22; when during the period of applying voltage to the above-mentioned pad 22, it is monitored that the amount of charge on the above-mentioned detection electrode 31 has changed, and before the change in the amount of charge on the above-mentioned detection electrode 31 is monitored, it is determined that the area directly facing the above-mentioned pad 22 and the detection electrode 31 is smaller than the above-mentioned preset area. If the area of ​​the above-mentioned pad 22 is smaller than the preset area, it can be determined that the pad 22 is damaged not only before the lighting test, but also during the lighting test. Therefore, the pad 22 being damaged both before and during the lighting test can be taken as the defect detection result of the pad 22. When, during the application of voltage to the pad 22, it is monitored that the amount of charge on the detection electrode 31 changes, and before the change in the amount of charge on the detection electrode 31 is monitored, it is determined that the facing area of ​​the pad 22 and the detection electrode 31 is not smaller than the preset area. Therefore, it can be determined that the pad 22 is damaged only during the lighting test. Therefore, the pad 22 being damaged only during the lighting test can be taken as the defect detection result of the pad 22.

[0075] It should be noted that, in the embodiment where the number of the above-mentioned pads 22 is multiple, the number of the above-mentioned detection electrodes 31 can also be multiple, and the multiple detection electrodes 31 can be arranged one-to-one corresponding to the multiple pads 22 to form corresponding multiple capacitors. In addition, this embodiment monitors the charge amounts on the multiple detection electrodes 31 respectively, and determines the defect detection results of each corresponding pad 22 according to the charge amounts on each detection electrode 31 obtained by monitoring.

[0076] Furthermore, the inventors have found that in some embodiments, in order to improve the lighting effect, the above-mentioned multiple pads 22 are connected in series, so that when a pad 22 is damaged, the lighting screen is still displayed normally, but this will also make the damaged pad 22 unable to be detected by the lighting test. In response to this problem, this embodiment can monitor the defect of each pad 22 in the display panel 20 by linking the defect of each pad 22 in the display panel 20 with an electrical signal (that is, the amount of charge on the corresponding detection electrode 31), thereby solving the problem that the damaged pad 22 cannot be detected by the lighting test due to the series connection of the above-mentioned multiple pads 22.

[0077] In some embodiments, after determining the defect detection results of each pad 22 on the edge region C1 of the display substrate 21, it can be determined whether to classify the display panel 20 as a defective product based on the defect detection results. For example, the display panel 20 whose defect detection results indicate that the pad 22 is damaged can be classified as a defective product. Thus, it is avoided that when performing a lighting test on the display panel 20, such defective display panels 20 cannot be intercepted, and then such defective display panels 20 are treated as good products and flowed to the back end for operation, resulting in a large waste of polarizers and other module consumables, and also a large waste of production time.

[0078] At the same time, when the defect detection result indicates that the pad 22 is damaged during the lighting test, the relevant personnel can also be prompted to confirm whether there is an abnormality with the probe of the above-mentioned lighting test equipment (for example, the probe is stuck and cannot be retracted to the normal height, etc.), so as to avoid the problem that such abnormality cannot be discovered in time, resulting in a large number of pads 22 of the display panel 20 and the edge area C1 of the display substrate 21 being damaged during the lighting test.

[0079] From the above, it can be seen that the detection method for the display panel in this embodiment insulates the detection electrode and the pad on the display substrate from each other and sets them relatively spaced apart, then applies a voltage to the pad to perform a lighting test on the display panel, and monitors the amount of charge on the detection electrode during the period of applying the voltage to the pad, and then determines the defect detection result of the pad based on the charge amount. Thus, when the display panel is lit up for testing, abnormal damage in the edge area of ​​the display panel can be detected in time to reduce losses.

[0080] Based on the detection method described in the above embodiment, this embodiment will be further described from the perspective of the detection device. Figure 8 , Figure 8 The detection device for a display panel provided in an embodiment of the present application is specifically described, which may include: an opposing module 501, a testing module 502, a monitoring module 503 and a determining module 504, wherein:

[0081] (1) Opposing module 501

[0082] The opposing module 501 is used to insulate the detection electrode and the pad from each other and to arrange them relatively spaced apart.

[0083] In this embodiment, the display panel used by the detection device may include a display substrate and the pad provided on the edge region of the display substrate. The detection electrode is used to convert the damage abnormality of the edge region of the display panel into an electrical signal and may be a metal plate.

[0084] (2) Test module 502

[0085] The testing module 502 is used to apply voltage to the pad to perform a lighting test on the display panel.

[0086] In one embodiment, the test module 502 may be specifically used for:

[0087] Electrically connect the probe of the lighting test equipment to the pad;

[0088] A voltage is applied to the probe by means of a signal generator in the lighting test equipment which is electrically connected to the probe.

[0089] (3) Monitoring module 503

[0090] The monitoring module 503 is used to monitor the amount of charge on the detection electrode during the period of applying voltage to the pad.

[0091] The monitoring module 503 may be specifically used to monitor the charge on the detection electrode via a charge monitor electrically connected to the detection electrode.

[0092] (4) Determination module 504

[0093] The determination module 504 is used to determine the defect detection result of the pad according to the charge amount.

[0094] In one embodiment, the determination module 504 may be specifically used to:

[0095] Determine the facing area of ​​the pad and the detection electrode according to the charge amount;

[0096] When the facing area is smaller than the preset area, it is determined that the pad is damaged as a defect detection result of the pad.

[0097] In another embodiment, the determination module 504 may be specifically used to:

[0098] When a change in the amount of charge is monitored during the application of voltage to the pad, it is determined that the pad is damaged during the lighting test as a defect detection result of the pad.

[0099] In the above embodiment, the display panel may specifically be a liquid crystal display panel (Liquid Crystal Display, LCD) or an organic light-emitting diode display panel (Organic Light-Emitting Diode, OLED).

[0100] In a specific embodiment, the above-mentioned display panel may also include a color filter substrate arranged opposite to the display substrate, wherein the side of the display substrate on which the solder pad is provided faces the color filter substrate, and the orthographic projection of the color filter substrate on the display substrate is located outside the orthographic projection of the solder pad on the display substrate.

[0101] In some embodiments, the above-mentioned display substrate may include a substrate and a thin film transistor and a plurality of signal lines arranged on the substrate, the signal line is electrically connected to the thin film transistor, the number of the pads is at least one, and each pad is electrically connected to at least one signal line, for providing a test signal (i.e., the above-mentioned voltage) to at least one signal line when performing a lighting test on the display panel.

[0102] In some embodiments, there may be a plurality of the pads, and the plurality of pads may be arranged in a row at intervals along the edge of the display substrate.

[0103] It should be noted that, in specific implementation, the above modules can be implemented as independent entities, or can be arbitrarily combined and implemented as the same or several entities. The specific implementation of the above modules can refer to the previous detection method embodiments, which will not be repeated here.

[0104] As can be seen from the above, the detection device for the display panel in this embodiment includes an opposing module, which is used to insulate the detection electrode and the pad on the display substrate from each other and arrange them relatively spaced apart; a testing module, which is used to apply voltage to the pad to perform a lighting test on the display panel; a monitoring module, which is used to monitor the amount of charge on the detection electrode during the application of voltage to the pad; and a determination module, which is used to determine the defect detection result of the pad based on the charge amount, so that when the display panel is subjected to a lighting test, the damage abnormality in the edge area of ​​the display panel can be detected in time to reduce losses.

[0105] Accordingly, an embodiment of the present application further provides a computer-readable storage medium, which stores a computer program, and the computer program can be loaded by a processor to execute the steps in any one of the detection methods for display panels provided in the embodiments of the present application. For example, the computer program can execute the following steps:

[0106] The detection electrode and the pad are insulated from each other and arranged relatively spaced apart;

[0107] Applying voltage to the pad to perform a lighting test on the display panel;

[0108] monitoring the amount of charge on the detection electrode during application of the voltage to the pad;

[0109] The defect detection result of the pad is determined based on the charge amount.

[0110] The specific implementation of the above operations can be found in the previous embodiments, which will not be described in detail here.

[0111] The computer-readable storage medium may include: a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

[0112] Since the computer program stored in the computer-readable storage medium can execute the steps in any one of the detection methods for display panels provided in the embodiments of the present application, the beneficial effects that can be achieved by any one of the detection methods for display panels provided in the embodiments of the present application can be achieved. Please refer to the previous embodiments for details and will not be repeated here.

[0113] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application should be included in the protection scope of the present application.

Claims

1. A detection method for a display panel, characterized in that: The display panel includes a display substrate and a pad, the display substrate has an edge area and a display area, the edge area is located on one side of the display area, the pad is arranged in the edge area, and the detection method includes: The detection electrode and the pad are insulated from each other and arranged relatively spaced apart, the detection electrode is arranged in the edge area, and the detection electrode and the pad are respectively arranged on two sides of the display substrate that are arranged in opposite directions; Applying voltage to the pad to perform a lighting test on the display panel; monitoring the amount of charge on the detection electrode during application of the voltage to the pad; A defect detection result of the pad is determined according to the charge amount.

2. The detection method according to claim 1, characterized in that: The applying voltage to the pad specifically includes: electrically connecting a probe of a lighting test device to the pad; A voltage is applied to the probe through a signal generator in the lighting test device which is electrically connected to the probe.

3. The detection method according to claim 1, characterized in that: The monitoring of the charge amount on the detection electrode specifically includes: The charge amount on the detection electrode is monitored by a charge amount monitor electrically connected to the detection electrode.

4. The detection method according to claim 1, characterized in that: Determining the defect detection result of the pad according to the charge amount specifically includes: Determine the facing area of ​​the pad and the detection electrode according to the charge amount; When the facing area is smaller than a preset area, it is determined that the pad is damaged as a defect detection result of the pad.

5. The detection method according to claim 1, characterized in that: Determining the defect detection result of the pad according to the charge amount specifically includes: When a change in the charge amount is monitored during the application of the voltage to the pad, it is determined that the pad is damaged during the lighting test as a defect detection result of the pad.

6. The detection method according to claim 1, characterized in that: The display panel also includes a color filter substrate arranged opposite to the display substrate, the side of the display substrate provided with the solder pad faces the color filter substrate, and the orthographic projection of the color filter substrate on the display substrate is located outside the orthographic projection of the solder pad on the display substrate.

7. The detection method according to claim 1, characterized in that: The display substrate includes a substrate, a thin film transistor and a plurality of signal lines arranged on the substrate, the signal line is electrically connected to the thin film transistor, there is at least one solder pad, and each solder pad is electrically connected to at least one signal line, for providing the voltage to at least one signal line when the display panel is subjected to a lighting test.

8. The detection method according to claim 1, characterized in that: There are a plurality of pads, and the pads are arranged in a row at intervals along the edge of the display substrate.

9. A detection device for a display panel, characterized in that: The display panel includes a display substrate and a pad, the display substrate has an edge region and a display region, the edge region is located on one side of the display region, the pad is provided in the edge region, and the detection device includes: An opposing module, used to insulate the detection electrode and the pad from each other and to arrange them relatively spaced apart, and to arrange the detection electrode and the pad on two sides of the display substrate that are opposite to each other; A testing module, used for applying a voltage to the pad to perform a lighting test on the display panel; A monitoring module, used for monitoring the amount of charge on the detection electrode during the period of applying the voltage to the pad; A determination module is used to determine a defect detection result of the pad according to the charge amount.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and the computer program is suitable for being loaded by a processor to execute the detection method according to any one of claims 1 to 8.

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