The invention provides a probability distribution sampling enhancement method based on a photoelectric probability
bit array in-situ sensing circuit, and the method comprises the steps: directly building a Sigmoid nonlinear mapping relation between incident
light intensity and output probability at a
physical level of a device through employing the intrinsic photoelectric
response characteristics of a photoelectric probability bit unit of the circuit and a
random noise mechanism; the method comprises the steps of
optical image input, in-situ photoelectric response and probability bit
stream generation, repeated continuous sampling and probability distribution integral
processing on a binary probability bit
stream, and image gray scale reconstruction. According to the method,
continuous simulation gray information is successfully recovered from the
noise flow which seems to be disordered and fluctuates randomly in a high-fidelity mode, the method is an
image enhancement means and is a bridge between probability calculation hardware and actual visual application, the recognition precision of a
system in a complex
visual task is remarkably improved, and the recognition efficiency of the
system is improved. And the
system is endowed with strong image reconstruction capability and high-accuracy reverse
image generation capability in the environment of serious loss of
original data.