A projector for illuminating at least one object

Abstract

A projector (110) for illuminating at least one object (112) with at least one illumination pattern (114) is provided. The projector (110) comprises at least one array (118) of vertical cavity surface emitting lasers (VCSELs) (120). Each of the VCSELs (120) is configured to generate at least one light beam. The projector (110) comprises at least one optical system (122) configured to generate a characteristic beam profile for each of the light beams generated by the VCSELs (120) of the array (118). The beam profiles of adjacent VCSELs (120) of the array (118) differ in lateral and / or axial directions, such that the light beams of the VCSELs (120) of the array (118) can be assigned to corresponding VCSELs (120) in three-dimensional space.

Description

Technical Field

[0001] The present invention relates to a projector, a detector and a method for determining the position of at least one object. The device, method and use according to the present invention can be used, for example, in various fields of daily life, games, traffic technology, production technology, security technology, photography such as digital photography or video photography for art, documentation or technical purposes, medical technology, home care, smart life or in science. Moreover, the present invention can be used in particular for scanning one or more objects and / or for scanning scenes, such as for generating depth profiles of objects or scenes, for example, in the fields of architecture, metrology, archeology, medicine, engineering or manufacturing. However, other applications are also possible. Background Art

[0002] A large number of optical devices and methods are known from the prior art for 3D measurement using structured light methods. Typically, in these devices and methods, a point pattern is projected and the reflected pattern is recorded and evaluated. For example, the pattern is generated by combining a light emitting diode (LED) and a diffractive optical element (DOE). However, for complex objects, the so-called correspondence problem must be solved, i.e. which point of the object is generated by which light beam. Several methods are known for solving the correspondence problem, which methods are, however, complex and time-consuming.

[0003] US 2016 / 178915 describes an optoelectronic device comprising a semiconductor substrate, an array of light emitters arranged in a two-dimensional pattern on the substrate, a projection lens, and a diffractive optical element (DOE). The projection lens is mounted on the semiconductor substrate and configured to collect and focus light emitted by the light emitters to project a light beam containing a light pattern corresponding to the two-dimensional pattern of the light emitters onto the substrate. The DOE is mounted on the substrate and configured to generate and project multiple overlapping copies of the pattern.

[0004] WO 2016 / 154218 A1 describes a tracking system for generating a structured light pattern in a local area. The system includes a laser array that generates light. The laser array includes a plurality of lasers and an optical element. The plurality of lasers are grouped into at least two laser subsets, and each of the at least two laser subsets is independently switchable. The optical element includes a plurality of units each aligned with a corresponding subset of the laser array. Each unit receives light from a corresponding laser of the laser array, and each unit individually applies modulation to the received light passing through the unit to form a corresponding portion of a structured light pattern projected onto the local area.

[0005] WO 2009 / 153446 A2 describes a device for projecting structured light in the form of stripes or other patterns using a laser source, the device comprising an optical head comprising three consecutive elements mounted on a substrate, namely a laser source comprising a VCSEL, a collimating diffractive optical element, and a light structuring diffractive optical element. The laser source comprises at least one VCSEL matrix, which is obtained by combining M strips of N VCSELs to obtain (M×N) VCSELs. The diffractive optical elements are phase diffractive optical elements that convert the light emitted by the laser source into a structured light pattern. They are made of a matrix of (M x N) diffractive optical sub-elements mounted in front of each VCSEL and connected to the laser source to define an integrated optical head.

[0006] Problems to be solved by the present invention

[0007] Therefore, the object of the present invention is to provide an apparatus and a method that face the above-mentioned technical challenges of known apparatus and methods. In particular, the object of the present invention is to provide an apparatus and a method that allow to reliably determine the position of an object in space, preferably with low technical effort and low requirements in terms of technical resources and costs. Summary of the invention

[0008] This problem is solved by the invention having the features of the independent patent claims. Advantageous developments of the invention which can be realized individually or in combination appear in the dependent claims and / or in the following description and detailed examples.

[0009] As used hereinafter, the terms "having", "including" or "comprising" or any grammatical variants thereof are used in a non-exclusive manner. Thus, these terms may refer to a situation where no other features are present in the entity described herein in addition to the features introduced by these terms, or to a situation where one or more other features are present. As an example, the expressions "A has B", "A includes B", and "A contains B" may refer to a situation where no other elements are present in A in addition to B (i.e., A consists solely and exclusively of B), or to a situation where one or more other elements (e.g., element C, elements C and D, or even other elements) are present in entity A in addition to B.

[0010] In addition, it should be noted that the term "at least one", "one or more" or similar expressions indicating that a feature or element can exist once or more than once will generally be used only once when introducing the corresponding feature or element. In the following, in most cases, when referring to the corresponding feature or element, the expression "at least one" or "one or more" will not be repeated, but the fact that the corresponding feature or element can exist once or more than once is acknowledged.

[0011] In addition, as used below, the terms "preferably", "more preferably", "particularly", "more particularly", "specifically", "more specifically" or similar terms may be used in conjunction with optional features without limiting the alternative possibilities. Therefore, the features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. As will be appreciated by those skilled in the art, the present invention may be implemented through the use of alternative features. Similarly, the features introduced by "in an embodiment of the present invention" or similar expressions are intended to be optional features, without any limitation on alternative embodiments of the present invention, without any limitation on the scope of the present invention, and without any limitation on the possibility of combining the features introduced in this manner with other optional or non-optional features of the present invention.

[0012] In a first aspect of the invention, a projector for illuminating at least one object with at least one illumination pattern is disclosed.

[0013] As used herein, the term "object" may refer to any object, in particular a surface or area configured to at least partially reflect at least one light beam incident on the object. The light beam may originate from a projector illuminating the object, wherein the light beam is reflected or scattered by the object. As used herein, the term "projector", also denoted as light projector, may refer to an optical device configured to project at least one illumination pattern onto an object, in particular onto a surface of an object.

[0014] The projector includes at least one array of vertical cavity surface emitting lasers (VCSELs). Each of the VCSELs is configured to generate at least one light beam. The projector includes at least one optical system configured to generate a characteristic beam profile for each of the light beams generated by the VCSELs of the array. Cyclic or random repetition of the light profile within the pattern is possible. The light profiles of adjacent VCSELs of the array differ in the lateral and / or axial directions, so that the light beams of the VCSELs of the array can be assigned to corresponding VCSELs in three-dimensional space.

[0015] As used herein, the term "pattern" may refer to any known or predetermined arrangement including a plurality of arbitrarily shaped features, such as symbols. A pattern may include a plurality of features. A pattern may include an arrangement of periodic or non-periodic features. As used herein, the term "irradiation pattern" refers to a pattern of an irradiated object. In particular, an illumination pattern refers to a single beam and its pattern generated by one of the VCSELs, while the set or entirety of all illumination patterns generated by the VCSEL array may be represented as a collective illumination pattern. The illumination pattern may include at least one pattern selected from the group comprising: at least one dot pattern, in particular a pseudo-random dot pattern; a random dot pattern or a quasi-random pattern; at least one Sobol pattern; at least one quasi-periodic pattern; at least one pattern including at least one predetermined feature; at least one regular pattern; at least one triangular pattern; at least one hexagonal pattern; at least one rectangular pattern including at least one pattern of convex uniform tiles; at least one line pattern including at least one line; at least one line pattern including at least two lines, such as parallel or crossed lines. For example, the projector may be configured to generate and / or project a point cloud or non-point features. For example, the projector can be configured to generate a point cloud or non-point features so that the illumination pattern may include multiple point features or non-point features. The illumination pattern may include a regular and / or constant and / or periodic pattern, such as a triangular pattern, a rectangular pattern, a hexagonal pattern, or a pattern including further convex tiles. The illumination pattern may include as many features per area as possible so that a hexagonal pattern may be preferred. The distance between two features of the corresponding illumination pattern and / or the area of ​​at least one illumination feature may depend on the blur circle in the image determined by at least one detector as described below.

[0016] The projector comprises at least one array of vertical cavity surface emitting lasers (VCSELs). As used herein, the term "vertical cavity surface emitting laser" refers to a semiconductor laser diode configured for laser beam emission perpendicular to the top surface. Examples for VCSELs can be found, for example, at https: / / en.wikipedia.org / wiki / Vertical-cavity_surface-emitting_laser. VCSELs are generally known to the skilled person, such as from WO 2017 / 222618A.

[0017] Each of the VCSELs is configured to generate at least one light beam. As used herein, the term "light" generally refers to a line perpendicular to the wavefront of light pointing in the direction of energy flow. As used herein, the term "beam" generally refers to a collection of light rays. In the following, the terms "light" and "beam" will be used as synonyms. As further used herein, the term "beam" generally refers to an amount of light, specifically an amount of light traveling substantially in the same direction, including the possibility that the light beam has an expansion angle or an enlarged angle.

[0018] The VCSEL may be configured to emit a light beam at a wavelength range from 800 to 1000 nm. For example, the VCSEL may be configured to emit a light beam at 808 nm, 850 nm, 940 nm, or 980 nm. Preferably, the VCSEL emits light at 940 nm, because terrestrial solar radiation has a local minimum irradiance at this wavelength, for example as described in CIE 085-1989 "Solar Spectral Irradiance".

[0019] The array of VCSELs can be a two-dimensional or one-dimensional array. The array of VCSELs can include a plurality of VCSELs arranged in a rectangular shape. As further used herein, the term "matrix" generally refers to an arrangement of a plurality of elements in a predetermined geometric order. The matrix can specifically be or can include a rectangular matrix having one or more rows and one or more columns. The rows and columns can specifically be arranged in a rectangular manner. However, it should be outlined that other arrangements are feasible, such as non-rectangular arrangements. As an example, a circular arrangement is also feasible, in which the elements are arranged in concentric circles or ellipses about a center point. For example, the matrix can be a single row of pixels. Other arrangements are feasible. The VCSELs can be arranged on a common substrate or on different substrates. The array can include up to 2500 VCSELs. For example, the array can include 38x25 VCSELs, such as a high-power array with 3.5W. For example, the array can include 10x27 VCSELs with 2.5W. For example, the array can include 96 VCSELs with 0.9W. For example, the size of an array of 2500 elements can reach 2mm x 2mm.

[0020] Compared to light emitting diodes (LEDs), arrays of VCSELs can have high radiant power. Moreover, compared to LEDs, VCSELs can have higher spatial and temporal coherence. This can allow for improved shaping and / or modification of the beam profile by the optical system and increased spectral power density.

[0021] The projector includes at least one optical system configured to generate a characteristic beam profile for each of the light beams generated by the VCSELs of the array. As used herein, the term "optical system" generally refers to at least one optical device comprising at least two components. The optical system may include at least one array of optical elements. The array of optical elements may include a plurality of optical elements arranged in a matrix. The matrix of optical elements may specifically be or may include a rectangular matrix having one or more rows and one or more columns. The rows and columns may specifically be arranged in a rectangular manner. However, it should be outlined that other arrangements are feasible, such as non-rectangular arrangements. As an example, a circular arrangement is also feasible, in which the elements are arranged in concentric circles or ellipses about a center point. For example, the matrix may be a single row of pixels. Other arrangements are feasible.

[0022] As used herein, the term "beam profile" relates to the spatial distribution of the intensity of the light beam, in particular in at least one plane perpendicular to the propagation of the light beam. The beam profile may be a transverse intensity profile of the light beam. The beam profile may be a cross-section of the light beam. The beam profile may be selected from: a trapezoidal beam profile; a triangular beam profile; a linear combination of a cone beam profile and a Gaussian beam profile. However, other embodiments are possible. As used herein, the term "characteristic beam profile" relates to the fact that the beam profiles of the VCSELs of the array, in particular the beam profiles of adjacent VCSELs, are different. The beam profiles of adjacent VCSELs of the array differ in the lateral and / or axial direction. As used herein, the term "axial direction" refers to a direction along the optical axis of the optical system, in particular the longitudinal direction. As used herein, the term "optical axis" generally refers to an axis of mirror symmetry or rotational symmetry of the optical system. The optical axis may be a line of symmetry of an optical arrangement of the optical system. As used herein, the term "lateral direction" refers to a direction perpendicular to the axial direction, in particular the transversal direction. The beam profiles of the VCSELs of the array, in particular the adjacent VCSELs of the array, may differ by one or more of shape, orientation, and cross-section. The lateral and axial directions constitute a three-dimensional space. As used herein, the term "shape" generally refers to the spatial distribution of the intensity of the light beam, especially in at least one plane perpendicular to the propagation of the light beam, such as extension and / or profile. As used herein, the term "orientation" generally refers to the propagation direction of the light beam relative to the optical axis of the optical system, especially the angle between the propagation direction of the light beam and the optical axis. As used herein, the term "cross-section" generally refers to the area of ​​the light beam in at least one plane perpendicular to the propagation of the light beam. Different beam profiles allow the light beams generated by the VCSELs of the array to be assigned to the corresponding VCSELs. In particular, if adjacent light beams are different in shape, it is possible to determine which VCSEL of the array the light beam is generated from based on the shape of the light beam. For example, the light beams may differ in shape and orientation. Preferably, the difference in beam profiles is as large as possible to allow simple allocation. In the case where the beam profiles of all VCSELs in the array are different in shape, orientation and cross-section, the allocation may be the simplest. However, it may be sufficient that the beam profiles of adjacent light beams differ in at least one parameter.

[0023] The light generated by a single VCSEL may not overlap or merge into a common pattern with the light of other VCSELs. Instead, the beam profile of each VCSEL may remain identifiable in itself. This may allow the beam profiles of adjacent VCSELs to be different, so that they are distinguishable and the beam profile of the corresponding generated light beam changes in the propagation direction of the light beam, thereby enhancing the distance determination. The present invention particularly proposes that each VCSEL has a separate optical element. This is in contrast to known devices. For example, WO 2016 / 154218 A1 describes 3D measurement using structured light, in which multiple images with different patterns need to be performed sequentially. For this process, the array laser proposed in WO 2016 / 154218 A1 is divided into at least two independently switchable subgroups. The lasers of each subgroup share common optics. Therefore, in contrast to the device proposed in WO 2016 / 154218 A1, the present invention only requires a single image. Temporal modulation of the laser or pattern is not necessary.

[0024] Each of the optical elements may have a structured surface. The structured surfaces of the optical elements may be different. In particular, the structured surfaces of two adjacent optical elements of the array may be different. As used herein, the term "structured surface" may generally refer to a surface of an optical element having a predefined arbitrary structure. The structured surface may be a separate printed and / or embossed structure. However, other manufacturing techniques, such as molding or injection molding are possible. The optical element may be manufactured or produced using three-dimensional holographic lithography, such as described by J. Gavin in Optics Letters, Vol. 36 (2011), No. 13, 2495-2497.

[0025] The optical elements may each be or may include at least one lens having a structured surface. The structured surface may be a surface having a separate embossed and / or embossed structure. However, other manufacturing techniques, such as molding or injection molding are possible. The structured surface may cause the light beam incident on the optical element to be adjusted to have a non-point-shaped or non-point-shaped beam profile. The optical element may be a refractive optical element. Preferably, the optical element may be a refractive-diffractive hybrid element. As used herein, the term "refractive optical element" refers to a structured surface having at least one refractive structure. As used herein, the term "refractive-diffractive hybrid element" refers to a structured surface having at least one refractive structure and at least one diffractive structure or a structure having refractive and diffractive properties. The refractive element and / or the refractive structure may have a radius, in particular, for example, the diameter of a microlens, which depends on the distance between adjacent VCSELs. For example, the distance may be in the range of from 40 μm to 70 μm. The diameter may be similar, such as 40 μm. However, the diameter may also depend strongly on the optical properties and the refractive index. Diffractive elements and / or diffractive structures may be advantageous because they can be produced very flat. Each of the diffractive elements may include at least one substrate, also denoted as substrate. The substrate may be a glass substrate. The substrate may have a thickness of 1 mm. The refractive elements and / or refractive structures may have a thickness D diff , which corresponds to the optical path difference The diffractive and refractive elements and / or structures may have a diameter smaller than the distance between two VCSELs of the array, for example, the diameter may be smaller than 70 μm. The diffractive elements and / or structures may be circularly symmetrical and planar. However, asymmetric embodiments are possible. For example, the diffractive structures may be arranged on a curved surface, such as a curved surface on the concave or convex side of a refractive lens.

[0026] The optical element may include at least one material including at least one polymer. The material may be a polymer material that can be used for 2-photon stimulated polymerization, such as Nanoscribe IP-Dip, OrmoComp., Nanoscribe IP-G, Nanoscribe IP-L, Nanoscribe IP-S. For molding processes, such as injection molding or hot stamping, plastics such as those available from Zeonex, https: / / www.zeonex.com / optics.aspx.html, or Trogamid myCX from Evonik, https: / / www.campusplastics.com / campus / de / datasheet / TROGAMID%C2%AE+myCX+nc+(nf) / Evonik+Industries+AG / 66 / bf801790, may be used. For glass molding, several glass materials may be used, such as those listed in https: / / refractiveindex.info / ?shelf=glass&book=BK7&page=SCHOTT.

[0027] The optical element can be arranged as close as possible in front of the array of VCSELs in the propagation direction of the light beam. For example, the optical element can be designed as a rod lens with a high refractive index. The rod lens can be arranged as close as possible in front of the array of VCSELs in the propagation direction of the light beam. Due to the higher refractive index of the lens material, the convergence angle can be reduced and the optical path length can be increased, so that the local coherence is increased, thereby allowing improved shaping of the light beam.

[0028] The structured surface can be configured so that the cross-section of the beam profile can be different depending on the distance between the projector and the object. This can be ensured by using optical elements with a specific predefined and / or predetermined geometry. The required geometry can be determined by using iterative wave-light calculations. In particular, the desired intensity distribution at different distances relative to the optical element can be used as the basis for an iterative design. Between different planes, for example between a VCSEL, an optical element, a projection plane with shape 1 and a projection plane with shape 2, at least one wave-light propagation algorithm such as Fresnel propagation or Rayleigh-Sommerfeld diffraction integral can be used. The propagation can proceed from plane to plane and back to the VCSEL. Since VCSELs can emit partially coherent radiation, point light sources that are incoherent with respect to each other can be used for simulation. The point light sources can be weighted with respect to their intensity distribution.

[0029] The present invention is different from conventional strip projection. The illumination pattern may include distinct and separate features that do not touch or overlap each other. Specifically, the illumination pattern may not include closed features generated by the overlap or superposition of radiation from adjacent vertical cavity surface emitting lasers.

[0030] Each VCSEL can generate a closed and individual feature. Therefore, the number of features generated can correspond to the number of VCSELs. By requiring the optical system to be configured to generate a characteristic beam profile for each of the light beams generated by the VCSELs of the array, the light emitted by each of the VCSELs can be identified and / or located. The beam profiles generated for adjacent individual VCSELs are different, and in particular, the beam profiles of adjacent VCSELs of the array are different in the lateral and / or axial directions. In order to study the 3D space using the projection of different features in the lateral and / or axial directions, the light beams of the VCSELs can be assigned to corresponding VCSELs in the three-dimensional space. The micro-optical element of each of the VCSELs can generate not only one pattern, but also multiple patterns, such as axially and / or laterally shifted.

[0031] The optical system may be configured to generate multiple illumination patterns in a lateral dimension. As used herein, the term "lateral dimension" refers to a dimension perpendicular to the axial direction, in particular a transverse dimension. For example, the optical system may be configured to generate at least two illumination features having different angles relative to the optical axis for each of the VCSELs in the array. This may be accomplished using, for example, a plurality of illumination features provided by the VCSELs from the array. The method can be implemented using a ray tracing routine enabled by a commercial software package of . Additionally or alternatively, an iterative method based on at least one wave light propagation method can be used, such as Rayleigh-Sommerfeld, Fresnel propagation and / or Fraunhofer propagation. The iterative process can then alternate between propagation from the optical system to different lateral projected illumination patterns and back to the optical system. During the updating process of the optical system, a number of different lateral illumination patterns can be considered, resulting in a certain percentage of each illumination pattern contributing to the updated optical system, for example if two illumination patterns with the same weight should be generated, then in each iteration step the corresponding retrieved wave light solution will contribute 50% to the wave light description of the optical system. The process can be repeated until the error measure can be minimized for all projected illumination patterns. The error measure can be obtained from the difference between the desired illumination pattern and the simulated illumination pattern. The projection direction between at least two illumination patterns may not be too large. The two patterns may be projected on the same plane. Thus, the iterative process will only occur between the optical system and the plane of the desired at least two illumination patterns.

[0032] The optical system may be configured to generate a plurality of different illumination patterns in an axial dimension. As used herein, the term "axial dimension" refers to a dimension along the optical axis of the optical system, in particular the longitudinal dimension. The optical system may be configured to focus different illumination patterns for each VCSEL at different depths of field. Specifically, the optical system may be configured to focus the illumination patterns at different focal planes, in particular the object plane, wherein the focal plane is a plane perpendicular to the optical axis of the optical system, having different coordinates along the optical axis. The optical system may be configured so that in each of the focal planes, only one of the illumination patterns is focused, while the other illumination patterns are not focused. The optical system may be configured so that in each of the focal planes, different illumination patterns are focused. The optical system may include at least one device for intermediate projection of the illumination pattern. For example, for applications with a distance of several meters between the VCSEL array and the object, the device for intermediate projection may be designed for telecentric imaging, so that the characteristic size of the imaging pattern is constant for all axial object positions. Additionally or alternatively, the imaging scale may be determined from design data or by calibration. A plurality of different illumination patterns in the axial dimension may allow the use of triangulation methods and / or methods of aligning the detector and the projector, in particular on a common axis. For this purpose, the detector may comprise at least one zoom optic and / or at least one electro-optical tunable system for traversing the measurement range. By adapting different illumination patterns for different depths of the VCSELs of the array, the number of distinguishable depth steps within the depth of field of the detector may be increased to the number of VCSELs in the array.

[0033] For example, the optical system may be configured to generate a plurality of different illumination patterns in the axial dimension. Each of the different illumination patterns may comprise a plurality of light spots.

[0034] For example, the optical system may be configured to generate a plurality of different illumination patterns in the axial dimension. Each of the different illumination patterns may be asymmetric and may include a plurality of spots.

[0035] For example, the optical system may be configured to generate a plurality of different illumination patterns in the lateral dimension. Each of the different illumination patterns may comprise a plurality of light spots.

[0036] For example, the optical system may be configured to generate a plurality of different illumination patterns in the lateral dimension. Each of the different illumination patterns may be asymmetric and include a plurality of spots.

[0037] In a further aspect of the invention, a detector for determining the position of at least one object is disclosed. The detector comprises at least one projector according to the invention, such as according to one or more of the embodiments disclosed above or according to one or more of the embodiments disclosed in more detail below.

[0038] As used herein, the term "position" refers to at least one information item about the location and / or orientation of an object and / or at least one part of an object in space. Thus, at least one information item may imply at least one distance between at least one point of an object and at least one detector. The information item may particularly refer to the x, y and z coordinates of the object point in space. The distance may be a longitudinal coordinate or may contribute to the longitudinal coordinate of a point of an object. Additionally or alternatively, at least one other information item about the location and / or orientation of an object and / or at least one part of an object may be determined. As an example, additionally, at least one transverse coordinate of an object and / or at least one part of an object may be determined. Thus, the position of an object may imply at least one longitudinal coordinate of an object and / or at least one part of an object. Additionally or alternatively, the position of an object may imply at least one transverse coordinate of an object and / or at least one part of an object. Additionally or alternatively, the position of an object may imply at least one orientation information of an object indicating the orientation of an object in space.

[0039] Detectors include:

[0040] at least one projector according to the invention for illuminating an object with at least one illumination pattern;

[0041] - at least one sensor element of a matrix of optical sensors, the optical sensors each having a photosensitive area, wherein each optical sensor is designed to generate at least one sensor signal in response to illumination of its respective photosensitive area by a reflected light beam propagating from the object to the detector, wherein the sensor element is configured to determine at least one reflected image;

[0042] - at least one evaluation device, wherein the evaluation device is configured for selecting at least one reflection characteristic of the reflection image and for assigning said reflection characteristic to one of the VCSELs of the array.

[0043] As used herein, the term "sensor element" generally refers to a device or a combination of multiple devices configured to sense at least one parameter. In the present case, the parameter may be an optical parameter in particular, and the sensor element may be an optical sensor element in particular. The sensor element may be formed as a single single device or a combination of several devices. As further used herein, the term "matrix" generally refers to an arrangement of multiple elements in a predetermined geometric order. As will be outlined in more detail below, a matrix may specifically be or may include a rectangular matrix having one or more rows and one or more columns. The rows and columns may specifically be arranged in a rectangular manner. However, it should be outlined that other arrangements are feasible, such as non-rectangular arrangements. As an example, a circular arrangement is also feasible, in which the elements are arranged in concentric circles or ellipses about a center point. For example, a matrix may be a single row of pixels. Other arrangements are feasible.

[0044] As used herein, an "optical sensor" generally refers to a photosensitive device for detecting a light beam, such as for detecting an illumination and / or a light spot generated by at least one light beam. As further used herein, a "photosensitive area" generally refers to an area of ​​an optical sensor that can be illuminated from the outside by at least one light beam, generating at least one sensor signal in response to the illumination. The photosensitive area can specifically be located on the surface of the corresponding optical sensor. However, other embodiments are also feasible. The optical sensors of the matrix can specifically be equal in size, sensitivity and one or more of other optical, electrical and mechanical properties. The photosensitive areas of all optical sensors of the matrix can specifically be located in a common plane, which preferably faces the object, so that the light beam propagating from the object to the detector can generate a light spot on the common plane.

[0045] As used herein, the term "optical sensor each having at least one photosensitive area" refers to a configuration having a plurality of individual optical sensors each having one photosensitive area, as well as a configuration of an optical sensor having a combination of a plurality of photosensitive areas. Thus, further, the term "optical sensor" refers to a photosensitive device configured to generate one output signal, however, in this document, a photosensitive device (e.g., at least one CCD and / or CMOS device) configured to generate two or more output signals is referred to as two or more optical sensors. Each optical sensor may be implemented such that there is exactly one photosensitive area in the respective optical sensor, such as by providing exactly one photosensitive area that can be irradiated, in response to which irradiation, generating exactly one uniform sensor signal for the entire optical sensor. Thus, each optical sensor may be a single area optical sensor. However, the use of a single area optical sensor makes the arrangement of the detector particularly simple and efficient. Thus, as an example, commercially available photosensors (such as commercially available silicon photodiodes) each having exactly one sensitive area may be used in this arrangement. However, other embodiments are also possible. Thus, as an example, an optical device comprising two, three, four or more photosensitive areas may be used, which in the context of the present invention are considered to be two, three, four or more optical sensors. As outlined above, the sensor element comprises a matrix of optical sensors. Thus, as an example, the optical sensor may be a pixelated optical device or form part of a pixelated optical device. As an example, the optical sensor may be a part of or form part of at least one CCD and / or CMOS device having a matrix of pixels, each pixel forming a photosensitive area.

[0046] The optical sensor may specifically be or may comprise a photodetector, preferably an inorganic photodetector, more preferably an inorganic semiconductor photodetector, most preferably a silicon photodetector. In particular, the optical sensor may be sensitive in the infrared spectral range. All optical sensors of the matrix or at least groups of optical sensors of the matrix may specifically be identical. The same group of optical sensors of the matrix may specifically be provided for different spectral ranges, or all optical sensors may be identical in terms of spectral sensitivity. Further, the optical sensors may be identical in terms of size and / or with regard to their electronic or optoelectronic properties.

[0047] In particular, the optical sensor may be or may include an inorganic photodiode that is sensitive in the infrared spectral range, preferably in the range of 780 nm to 3.0 microns. In particular, the optical sensor may be sensitive in a portion of the near infrared region in the range of 700 nm to 1000 nm for which silicon photodiodes are specifically suitable. An infrared optical sensor that can be used for the optical sensor may be a commercially available infrared optical sensor, such as a commercially available infrared optical sensor under the trade name HertzstueckTM from TrinamiX GmbH, D-67056 Ludwigshafen am Rhein, Germany. Thus, as an example, the optical sensor may include at least one optical sensor of the intrinsic photovoltaic type, more preferably, at least one semiconductor photodiode selected from the group consisting of a Ge photodiode, an InGaAs photodiode, an extended InGaAs photodiode, an InAs photodiode, an InSb photodiode, and a HgCdTe photodiode. Additionally or alternatively, the optical sensor may include at least one optical sensor of extrinsic photovoltaic type, more preferably including at least one semiconductor photodiode selected from the group consisting of Ge:Au photodiode, Ge:Hg photodiode, Ge:Cu photodiode, Ge:Zn photodiode, Si:Ga photodiode, Si:As photodiode. Additionally or alternatively, the optical sensor may include at least one bolometer, preferably a bolometer selected from the group consisting of VO bolometer and amorphous Si bolometer.

[0048] The matrix may comprise independent optical sensors. Thus, the matrix may comprise inorganic photodiodes. However, alternatively, a commercially available matrix may be used, such as one or more of a CCD detector (such as a CCD detector chip) and / or a CMOS detector (such as a CMOS detector chip).

[0049] Thus, in general, the optical sensors of the detector may form a sensor array or may be part of a sensor array, such as the matrix mentioned above. Thus, as an example, the detector may comprise an optical sensor array, such as a rectangular array having m rows and n columns, wherein m, n are independently positive integers. Preferably, more than one column and more than one row are given, i.e., n>1, m>1. Thus, as an example, n may be 2 to 16 or higher, and m may be 2 to 16 or higher. Preferably, the ratio of the number of rows to the number of columns is close to 1. As an example, n and m may be selected such that 0.3≤m / n≤3, such as by selecting m / n=1:1, 4:3, 16:9 or the like. For example, the array may be a square array with an equal number of rows and columns, for example by selecting m=2, n=2 or m=3, n=3, etc.

[0050] The matrix can be a rectangular matrix with at least one row (preferably multiple rows) and multiple columns. As an example, the rows and columns can be oriented substantially vertically, wherein, with respect to the term "substantially vertical", reference can be made to the definition given above. Therefore, as an example, a tolerance of less than 20°, specifically less than 10°, or even less than 5° is acceptable. In order to provide a wide range of views, the matrix can specifically have at least 10 rows, preferably at least 50 rows, and more preferably at least 100 rows. Similarly, the matrix can have at least 10 columns, preferably at least 50 columns, and more preferably at least 100 columns. The matrix can include at least 50 optical sensors, preferably at least 100 optical sensors, and more preferably at least 500 optical sensors. The matrix can include a plurality of pixels in the range of millions of pixels. However, other embodiments are also feasible. Therefore, in an expected axial rotationally symmetrical setting, a circular arrangement or a concentric arrangement of optical sensors (also referred to as pixels) in the matrix is ​​preferably adopted.

[0051] Preferably, the sensor element may be oriented substantially perpendicular to the optical axis of the detector. Again, with regard to the term "substantially perpendicular", reference may be made to the definitions and tolerances given above. The optical axis may be a straight optical axis, or may be bent, or even split, such as by using one or more deflection elements and / or by using one or more beam splitters, wherein in the latter case the substantially perpendicular orientation may indicate a local optical axis in a corresponding branch or beam path of the optical arrangement.

[0052] The reflected light beam may propagate from the object towards the detector. The reflected light beam may originate from the object. The projector may illuminate the object with at least one illumination pattern and the light is reflected or scattered by the object and thereby, at least partially, directed towards the detector as a reflected light beam.

[0053] The reflected light beam may specifically fully illuminate the sensor element, such that the sensor element is completely within the light beam, wherein the width of the light beam is greater than the matrix. Conversely, preferably, the reflected light beam may specifically produce a light spot smaller than the matrix over the entire matrix, such that the light spot is completely within the matrix. A person skilled in the art of optics can easily adjust this by selecting one or more suitable lenses or elements that have a focusing or defocusing effect on the light beam, such as by using a suitable delivery device, as will be outlined in more detail below.

[0054] As further used herein, a "sensor signal" generally refers to a signal generated by an optical sensor in response to illumination caused by a light beam. Specifically, the sensor signal may be or may include at least one electrical signal, such as at least one analog electrical signal and / or at least one digital electrical signal. More specifically, the sensor signal may be or may include at least one voltage signal and / or at least one current signal. More specifically, the sensor signal may include at least one photocurrent. Further, the raw sensor signal may be used, or the detector, optical sensor or any other element may be configured to process or pre-process the sensor signal to generate a secondary sensor signal, which may also be used as the sensor signal, such as by pre-processing such as filtering.

[0055] The photosensitive area can specifically be oriented towards the object. As used herein, the term "oriented towards the object" generally refers to the situation where the corresponding surface of the photosensitive area is fully or partially visible from the object. In particular, at least one interconnection line between at least one point of the object and at least one point of the corresponding photosensitive area can form an angle other than 0° with the surface element of the photosensitive area, such as an angle in the range of 20° to 90°, preferably 80 to 90°, such as 90°. Therefore, when the object is located on the optical axis or close to the optical axis, the light beam propagating from the object toward the detector can be substantially parallel to the optical axis. As used herein, the term "substantially vertical" refers to the condition of vertical orientation, with a tolerance of, for example, ±20° or less, preferably a tolerance of ±10° or less, more preferably a tolerance of ±5° or less. Similarly, the term "substantially parallel" refers to the condition of parallel orientation, with a tolerance of, for example, ±20° or less, preferably a tolerance of ±10° or less, more preferably a tolerance of ±5° or less.

[0056] The optical sensor may be sensitive in one or more of the ultraviolet, visible or infrared spectral ranges. Specifically, the optical sensor may be sensitive in the visible spectral range from 500nm to 780nm, most preferably at 650nm to 750nm or at 690nm to 700nm. Specifically, the optical sensor may be sensitive in the near infrared region. Specifically, the optical sensor may be sensitive in a portion of the near infrared region in the range of 700nm to 1000nm for which a silicon photodiode is specifically suitable. The optical sensor may be sensitive in the infrared spectral range, specifically in the range of 780nm to 3.0 microns. For example, the optical sensors may each individually be or may include at least one element selected from the group comprising: a photodiode, a photocell, a photoconductor, a phototransistor, or any combination thereof. For example, the optical sensor may be or may include at least one element selected from the group comprising: a CCD sensor element, a CMOS sensor element, a photodiode, a photocell, a photoconductor, a phototransistor, or any combination thereof. Any other type of photosensitive element may be used. As will be outlined in more detail below, the photosensitive element may generally be made entirely or partially of inorganic materials and / or may be made entirely or partially of organic materials. Most commonly, one or more photodiodes may be used, such as commercially available photodiodes, for example, inorganic semiconductor photodiodes.

[0057] As used herein, the term "reflected image" refers to an image determined by an optical sensor that includes a plurality of reflected features. As used herein, the term "reflected features" refers to features within an image plane generated by an object in response to illumination with at least one illumination feature. A reflected image may include at least one reflection pattern that includes a reflected feature. As used herein, the term "determining at least one reflected image" refers to one or more of imaging, recording, and generating a reflected image.

[0058] As used herein, the term "selecting at least one reflective feature" refers to one or more of identifying, determining and selecting at least one reflective feature of the reflective image. The evaluation device may be configured to perform at least one image analysis and / or image processing in order to identify the reflective feature. The image analysis and / or image processing may use at least one feature detection algorithm. Image analysis and / or image processing may include one or more of the following: filtering; selection of at least one region of interest; formation of a difference image between an image created by a sensor signal and at least one offset; inversion of a sensor signal by inverting the image created by the sensor signal; formation of a difference image between images created by sensor signals at different times; background correction; decomposition into color channels; decomposition into chroma; saturation; and brightness channels; frequency decomposition; singular value decomposition; applying a Canny edge detector; applying Gaussian and Laplace filters; applying a difference of Gaussian filter; applying a Sobel operator; applying a Laplace operator; applying a Scharr operator; applying a Prewitt operator; applying a Roberts operator; applying a Kirsch operator; applying a high pass filter; applying a low pass filter; applying a Fourier transform; applying a Radon transform; applying a Hough transform; applying a wavelet transform; thresholding; creating a binary image. The region of interest may be manually determined by a user or may be automatically determined, such as by identifying an object within an image generated by an optical sensor.

[0059] As used herein, the term "assigning said reflection characteristic to one of the VCSELs of the array" refers to a particularly unambiguous determination of one VCSEL of the array that has emitted the illumination characteristic that has caused the selected reflection characteristic. In known 3D sensing devices, such as devices using triangulation or structured light techniques, solving this correspondence problem is complex and time consuming. The present invention proposes the use of a characterized, in particular distinguishable, beam profile for the illumination characteristic and therefore for the reflection characteristic, so that one VCSEL of the array that has emitted the illumination characteristic that has caused the selected reflection characteristic can be immediately, easily and unambiguously identified.

[0060] The detector may be configured to determine at least one distance information of the object by using a triangulation technique and / or a depth-from-photon-ratio technique and / or a depth from focus and / or a depth from defocus.

[0061] The evaluation device may be configured to determine at least one longitudinal coordinate z of a selected reflection feature of the reflection image by evaluating the combined signal Q of the sensor signals from the sensor elements. DPRAs used herein, the term "combined signal Q" refers to a signal generated by combining sensor signals, in particular by one or more of the following: dividing the sensor signals, dividing multiples of the sensor signals or dividing a linear combination of the sensor signals. The evaluation device may be configured to derive the combined signal Q by one or more of the following: dividing the sensor signals, dividing multiples of the sensor signals or dividing a linear combination of the sensor signals. The evaluation device may be configured to use the combined signal Q with the longitudinal coordinate z DPR The longitudinal coordinate is determined by at least one predetermined relationship between . For example, the evaluation device can be configured to derive the combined signal Q by the following formula:

[0062]

[0063] where x and y are transverse coordinates, A1 and A2 are different regions of at least one beam profile of the reflected light beam at the sensor location, and E(x, y, z o ) indicates the distance z between the objects o The beam profile is given at . Area A1 and area A2 may be different. In particular, A1 and A2 are not congruent. Therefore, one or more of the shape or content of A1 and A2 may be different. In general, the beam profile depends on the brightness L(z o ) and beam shape S(x, y; z o ), E(x, y; z o ) = L·S. Thus, by deriving the combined signal, the longitudinal coordinate can be determined independently of the brightness. In addition, using the combined signal allows the distance z to be determined independently of the object size. o The combined signal thus allows the distance z to be determined independently of the material properties and / or reflection properties and / or scattering properties of the object and independently of modifications of the light source, such as by manufacturing inaccuracies, heat, water, dirt, damage on the lens, etc. o .

[0064] Each of the sensor signals may include at least one information of at least one region of the beam profile of the light beam. As used herein, the term "region of the beam profile" generally refers to any region of the beam profile at the sensor location for determining the combined signal Q. The photosensitive regions may be arranged such that a first sensor signal includes information of a first region of the beam profile, and a second sensor signal includes information of a second region of the beam profile. The first region of the beam profile and the second region of the beam profile may be one or both of adjacent regions or overlapping regions. The first region of the beam profile and the second region of the beam profile may not be congruent in region.

[0065] The evaluation device may be configured to determine and / or select a first region of the beam profile and a second region of the beam profile. The first region of the beam profile may include substantially edge information of the beam profile, and the second region of the beam profile may include substantially center information of the beam profile. The beam profile may have a center, i.e. a maximum of the beam profile and / or a center point of a beam profile plateau and / or a geometric center of the light spot, and a descending edge extending from the center. The second region may include an inner region of the cross section, and the first region may include an outer region of the cross section. As used herein, the term "substantially center information" generally means that the proportion of edge information (i.e. the proportion of the intensity distribution corresponding to the edge) is lower compared to the proportion of center information (i.e. the proportion of the intensity distribution corresponding to the center). Preferably, the center information has a proportion of edge information of less than 10%, more preferably less than 5%, and most preferably, the center information does not include any edge content. As used herein, the term "substantially edge information" generally means that the proportion of center information is lower compared to the proportion of edge information. The edge information may include information of the entire beam profile, in particular, information from the center region and the edge region. The edge information has a proportion of center information of less than 10%, preferably less than 5%, and more preferably, the edge information does not include any center content. If at least one area of ​​the beam profile is close to or around the center and includes substantially center information, the at least one area may be determined and / or selected as the second area of ​​the beam profile. If at least one area of ​​the beam profile includes at least some parts of the descending edge of the cross section, the at least one area may be determined and / or selected as the first area of ​​the beam profile. For example, the entire area of ​​the cross section may be determined as the first area. The first area of ​​the beam profile may be area A2, and the second area of ​​the beam profile may be area A1.

[0066] Other choices of the first area A1 and the second area A2 are also possible. For example, the first area may include a substantially outer area of ​​the beam profile, while the second area may include a substantially inner area of ​​the beam profile. For example, in the case of a two-dimensional beam profile, the beam profile may be divided into a left part and a right part, wherein the first area may include a substantially left part area of ​​the beam profile, and the second area may include a substantially right part area of ​​the beam profile.

[0067] The edge information may comprise information about the number of photons in a first region of the beam profile, and the center information may comprise information about the number of photons in a second region of the beam profile. The evaluation device may be configured to determine an area integral of the beam profile. The evaluation device may be configured to determine the edge information by integrating and / or summing the first area. The evaluation device may be configured to determine the center information by integrating and / or summing the second area. For example, the beam profile may be a trapezoidal beam profile, and the evaluation device may be configured to determine the integral of the trapezoid. Furthermore, when a trapezoidal beam profile is assumed, the determination of the edge signal and the center signal may be replaced by using an equivalent evaluation of the characteristics of the trapezoidal beam profile, such as determining the slope and position of the edges and the height of the center flat top, and deriving the edge signal and the center signal by geometric considerations.

[0068] Additionally or alternatively, the evaluation device may be configured to determine one or both of the center information or the edge information from at least one slice or cut of the light spot. This may be achieved, for example, by replacing the surface integral in the combined signal Q by a line integral along the slice or cut. To improve accuracy, several slices or cuts through the light spot may be used and averaged. In the case of an elliptical light spot profile, averaging several slices or cuts results in improved distance information.

[0069] The evaluation device may be configured to derive the combined signal Q by one or more of: dividing edge information and center information, dividing edge information and multiples of center information, dividing a linear combination of edge information and center information. Thus, essentially, the photon ratio may be used as the physical basis of the method.

[0070] For example, the evaluation device may be configured to evaluate the sensor signal by:

[0071] a) determining at least one optical sensor having the highest sensor signal and forming at least one center signal;

[0072] b) evaluating the sensor signals of the optical sensors of the matrix and forming at least one sum signal;

[0073] c) determining at least one combined signal by combining the center signal and the sum signal; and

[0074] d) Determining at least one longitudinal coordinate z of the selected feature by evaluating the combined signal.

[0075] As explained, for example, in WO 2012 / 110924 A1 or WO 2014 / 097181 A1, there is usually a predetermined or determinable relationship between the size of the spot (such as the diameter, beam waist or equivalent diameter of the spot) and the longitudinal coordinate of the object from which the light beam propagates towards the detector. Without wishing to be bound by this theory, the light spot can be characterized by two measurement variables: a measurement signal measured in a small measurement patch at or near the center of the spot (also called a center signal), and an integrated signal or a sum signal integrated over the spot (with or without the center signal). For a light beam with a certain total power that does not change when the beam is widened or focused, the sum signal should be independent of the spot size of the spot and, therefore, should be independent of the distance between the object and the detector, at least when a linear optical sensor within its corresponding measurement range is used. However, the center signal depends on the spot size. Therefore, the center signal usually increases when the light beam is focused and decreases when the light beam is defocused. By comparing the center signal with the sum signal, therefore, an information item about the size of the light spot generated by the light beam and, therefore, about the longitudinal coordinate of the object can be generated. As an example, the comparison of the center signal and the sum signal may be done by forming a combined signal Q from the center signal and the sum signal and by using a predetermined or determinable relationship between the longitudinal coordinate and the quotient signal for deriving the longitudinal coordinate.

[0076] The use of a matrix of optical sensors provides a number of advantages and benefits. Thus, the center of a light spot generated by a light beam on a sensor element, such as on a common plane of the photosensitive areas of the optical sensors of the matrix of sensor elements, can vary with the lateral position of the object. By using a matrix of optical sensors, the detector according to the invention can adapt to these changes in conditions and, therefore, the center of the light spot can be determined simply by comparing the sensor signals. Thus, the detector according to the invention can select the center signal and the determined sum signal alone and, from these two signals, derive a combined signal containing information about the longitudinal coordinates of the object. By evaluating the combined signal, therefore, the longitudinal coordinates of the object can be determined. Thus, the use of a matrix of optical sensors provides significant flexibility with respect to the position of the object, in particular with respect to the lateral position of the object.

[0077] The lateral position of the light spot on the matrix of optical sensors, such as the lateral position of at least one optical sensor generating the sensor signal, can even be used as an additional information item from which at least one information item about the lateral position of the object can be derived, as disclosed, for example, in WO 2014 / 198629 A1. Additionally or alternatively, as will be outlined in more detail below, the detector according to the invention can comprise at least one additional lateral detector for detecting at least one lateral coordinate of the object in addition to the at least one longitudinal coordinate.

[0078] Thus, according to the invention, the term "center signal" generally refers to at least one sensor signal comprising substantially center information of the beam profile. For example, the center signal may be the signal of at least one optical sensor having the highest sensor signal of a plurality of sensor signals generated by optical sensors of the entire matrix or of a region of interest within the matrix, wherein the region of interest may be predetermined or determinable within an image generated by the optical sensors of the matrix. As used herein, the term "highest sensor signal" refers to one or both of a local maximum or a maximum in the region of interest. The center signal may be generated from a single optical sensor or, as will be outlined in more detail below, from a group of optical sensors, wherein, in the latter case, as an example, the sensor signals of the group of optical sensors may be added, integrated or averaged in order to determine the center signal. The group of optical sensors generating the center signal may be a group of adjacent optical sensors, such as having an optical sensor less than a predetermined distance from the actual optical sensor having the highest sensor signal, or may be a group of optical sensors generating sensor signals within a predetermined range from the highest sensor signal. The group of optical sensors generating the center signal may be selected to be as large as possible in order to allow for a maximum dynamic range. The evaluation device may be configured to determine the center signal by integration of a plurality of sensor signals, for example a plurality of optical sensors around the optical sensor having the highest sensor signal. For example, the beam profile may be a trapezoidal beam profile and the evaluation device may be configured to determine the integral of the trapezoid, in particular the integral of the plateau of the trapezoid.

[0079] As outlined above, the center signal may typically be a single sensor signal, such as a sensor signal from an optical sensor at the center of the light spot, or may be a combination of multiple sensor signals, such as a combination of sensor signals generated by an optical sensor at the center of the light spot, or a secondary sensor signal derived by processing sensor signals derived from one or more of the aforementioned possibilities. The determination of the center signal may be performed electronically, as the comparison of the sensor signals may be realized fairly simply by conventional electronics, or may be performed completely or partially by software. Specifically, the center signal can be selected from: the highest sensor signal; the average value of a sensor signal group within a predetermined tolerance range from the highest sensor signal; the average value of sensor signals from an optical sensor group including an optical sensor with the highest sensor signal and a predetermined adjacent optical sensor group; the sum of sensor signals from an optical sensor group including an optical sensor with the highest sensor signal and a predetermined adjacent optical sensor group; the sum of a sensor signal group within a predetermined tolerance range from the highest sensor signal; the average value of a sensor signal group greater than a predetermined threshold; the sum of a sensor signal group greater than a predetermined threshold; the integral of sensor signals from an optical sensor group including an optical sensor with the highest sensor signal and a predetermined adjacent optical sensor group; the integral of a sensor signal group within a predetermined tolerance range from the highest sensor signal; the integral of a sensor signal group greater than a predetermined threshold.

[0080] Similarly, the term "sum signal" generally refers to a signal comprising essentially edge information of the beam profile. For example, the sum signal may be derived by adding the sensor signals, integrating over the sensor signals or averaging over the sensor signals of the entire matrix or a region of interest within the matrix, wherein the region of interest may be predetermined or determinable within an image generated by the optical sensors of the matrix. When adding, integrating or averaging the sensor signals, the actual optical sensors generating the sensor signals may be omitted from the addition, integration or averaging, or may be included in the addition, integration or averaging. The evaluation device may be configured to determine the sum signal by integrating the signals of the entire matrix or a region of interest within the matrix. For example, the beam profile may be a trapezoidal beam profile, and the evaluation device may be configured to determine the integral of the entire trapezoid. Furthermore, when a trapezoidal beam profile is assumed, the determination of the edge signal and the center signal may be replaced by using an equivalent evaluation of the characteristics of the trapezoidal beam profile (such as determining the slope and position of the edges and the height of the central plateau) and deriving the edge signal and the center signal by geometric considerations.

[0081] Similarly, the center signal and the edge signal may also be determined by using a segmentation of the beam profile, such as a circular segmentation of the beam profile. For example, the beam profile may be divided into two parts via a secant or a chord that does not pass through the center of the beam profile. Thus, one part substantially contains edge information, while the other part substantially contains center information. For example, in order to further reduce the amount of edge information in the center signal, the edge signal may be further subtracted from the center signal.

[0082] Additionally or alternatively, the evaluation device may be configured to determine one or both of the center information or the edge information from at least one slice or cut of the light spot. This may be achieved, for example, by replacing the surface integral of the combined signal Q by a line integral along the slice or cut. To improve accuracy, several slices or cuts through the light spot may be used and averaged. In the case of an elliptical light spot profile, averaging several slices or cuts results in improved distance information.

[0083] The combined signal may be a signal generated by combining the center signal and the sum signal. Specifically, the combination may include one or more of the following: forming a quotient of the center signal and the sum signal, or vice versa; forming a quotient of a multiple of the center signal and a multiple of the sum signal, or vice versa; forming a quotient of a linear combination of the center signal and a linear combination of the sum signal, or vice versa. Additionally or alternatively, the combined signal may include any signal or signal combination containing at least one information item about the comparison between the center signal and the sum signal.

[0084] The evaluation device can be configured to determine at least one longitudinal coordinate z of the object by using at least one known, determinable or predetermined relationship between the sensor signals. DPR In particular, the evaluation device is configured to determine at least one coordinate z of the object by using at least one known, determinable or predetermined relationship between a quotient signal derived from the sensor signal and the longitudinal coordinate. DPR .

[0085] The raw sensor signal of the optical sensor can be used to evaluate or derive a secondary sensor signal thereof. As used herein, the term "secondary sensor signal" generally refers to a signal, such as an electronic signal, more preferably an analog and / or digital signal, obtained by processing (such as by filtering, averaging, demodulating, etc.) one or more raw signals. Therefore, an image processing algorithm can be used to generate a secondary sensor signal from the entirety of the sensor signals of the matrix or from a region of interest within the matrix. Specifically, a detector (such as an evaluation device) can be configured to transform the sensor signal of the optical sensor so as to generate a secondary optical sensor signal, wherein the evaluation device is configured to perform steps a)-d) by using the secondary optical sensor signal. The transformation of the sensor signal may specifically include at least one transformation selected from the group comprising: filtering; selection of at least one region of interest; formation of a difference image between an image created by the sensor signal and at least one offset; inversion of the sensor signal by inverting the image created by the sensor signal; formation of a difference image between images created by the sensor signal at different times; background correction; decomposition into color channels; decomposition into chrominance; saturation; and brightness channels; frequency decomposition; singular value decomposition; applying a Canny edge detector; applying Gaussian and Laplace filters; applying a Gaussian difference filter; applying a Sobel operator; applying a Laplace operator; applying a Scharr operator; applying a Prewitt operator; applying a Roberts operator; applying a Kirsch operator; applying a high pass filter; applying a low pass filter; applying a Fourier transform; applying a Radon transform; applying a Hough transform; applying a wavelet transform; thresholding; creating a binary image. The region of interest may be manually determined by a user or may be automatically determined, such as by identifying an object within an image generated by the optical sensor. As an example, a vehicle, a person or another type of predetermined object can be determined by automatic image recognition within the image, i.e. within the totality of the sensor signals generated by the optical sensor, and the region of interest can be selected such that the object is located within the region of interest. In this case, the evaluation (such as determination of the longitudinal coordinates) can be performed only for the region of interest. However, other embodiments are possible.

[0086] As outlined above, the detection of the center of the light spot (i.e. the detection of the center signal and / or of at least one optical sensor generating the center signal) can be performed completely or partly electronically or completely or partly by using one or more software algorithms. In particular, the evaluation device can include at least one center detector for detecting at least one highest sensor signal and / or for forming the center signal. The center detector can in particular be implemented completely or partly in software and / or can be implemented completely or partly in hardware. The center detector can be fully or partly integrated into at least one sensor element and / or can be implemented completely or partly independently of the sensor element.

[0087] As outlined above, the sum signal can be derived from all sensor signals of the matrix, from sensor signals within a region of interest, or from one of these possibilities with sensor signals generated from optical sensors contributing to the excluded center signal. In each case, a reliable sum signal can be generated that can be reliably compared with the center signal in order to determine the longitudinal coordinate. In general, the sum signal may be selected from the group comprising: an average value over all sensor signals of the matrix; a sum of all sensor signals of the matrix; an integral of all sensor signals of the matrix; an average value over all sensor signals of the matrix except sensor signals from those optical sensors contributing to the center signal; a sum of all sensor signals of the matrix except sensor signals from those optical sensors contributing to the center signal; an integral of all sensor signals of the matrix except sensor signals from those optical sensors contributing to the center signal; a sum of sensor signals of optical sensors within a predetermined range from the optical sensor with the highest sensor signal; an integral of sensor signals of optical sensors within a predetermined range from the optical sensor with the highest sensor signal; a sum of sensor signals greater than a certain threshold of optical sensors located within a predetermined range from the optical sensor with the highest sensor signal; an integral of sensor signals greater than a certain threshold of optical sensors located within a predetermined range from the optical sensor with the highest sensor signal. However, other options exist.

[0088] The summing may be performed in whole or in part in software and / or may be performed in whole or in part in hardware. The summing is usually possible by purely electronic means, which can usually be easily implemented into a detector. Therefore, in the field of electronics, summing devices are generally known for summing two or more electrical signals (both analog and digital signals). Therefore, the evaluation device may comprise at least one summing device for forming the sum signal. The summing device may be fully or partially integrated into the sensor element or may be implemented in whole or in part independently of the sensor element. The summing device may be implemented in whole or in part in one or both of hardware or software.

[0089] As outlined above, the comparison between the center signal and the sum signal can specifically be performed by forming one or more quotient signals. Therefore, in general, the combined signal can be a quotient signal Q derived by one or more of the following: forming a quotient of the center signal and the sum signal, or vice versa; forming a quotient of multiples of the center signal and multiples of the sum signal, or vice versa; forming a quotient of a linear combination of the center signal and a linear combination of the sum signal, or vice versa; forming a quotient of the center signal and a linear combination of the sum signal and the center signal, or vice versa; forming a quotient of the sum signal and a linear combination of the sum signal and the center signal, or vice versa; forming a quotient of the power of the center signal and the power of the sum signal, or vice versa. However, there are other options. The evaluation device can be configured to form one or more quotient signals. The evaluation device can also be configured to determine at least one longitudinal coordinate by evaluating at least one quotient signal.

[0090] The evaluation device can in particular be configured to use the combined signal Q and the longitudinal coordinate z DPR , so as to determine at least one longitudinal coordinate. Therefore, for the reasons disclosed above and due to the dependence of the characteristics of the light spot on the longitudinal coordinate, the combined signal Q is usually a monotonic function of the longitudinal coordinate of the object and / or the size of the light spot (such as the diameter of the light spot or an equivalent diameter). Thus, as an example, in particular in the case of using a linear optical sensor, the sensor signal s center and signals sum The simple quotient Q = s center / s sum Without wishing to be bound by theory, it is believed that this is due to the fact that in the preferred arrangement described above, the central signal s decreases as the amount of light reaching the detector decreases. center and signals sum Both decrease as a square function with increasing distance from the light source. However, since in the optical setup as used in the experiment the spot in the image plane grows and thus spreads over a larger area, the central signal s center Ratio and signal sumDecreases more rapidly. Therefore, the quotient of the center signal and the sum signal decreases continuously with the increase of the diameter of the beam or the diameter of the spot on the photosensitive area of ​​the optical sensor of the matrix. Further, since the total power of the beam forms a factor in the center signal and the sensor signal, the quotient is usually independent of the total power of the beam. Therefore, the combined signal Q can form a secondary signal that provides a unique and clear relationship between the center signal and the sum signal and the size or diameter of the beam. On the other hand, since the size or diameter of the beam depends on the distance between the object from which the beam propagates toward the detector and the detector itself, that is, depends on the longitudinal coordinate of the object, a unique and clear relationship between the center signal and the sum signal on the one hand and the longitudinal coordinate on the other hand can exist. For the latter, one or more of the prior art documents mentioned above, such as WO 2014 / 097181 A1, can be referred to, for example. The predetermined relationship can be determined by analytical considerations, such as by assuming a linear combination of Gaussian beams, by empirical measurement results, such as measuring the combined signal and / or the center signal and the sum signal as a function of the longitudinal coordinate of the object or the secondary signal derived therefrom, or the measurement results of both.

[0091] Thus, in general, the evaluation device may be configured for determining the longitudinal coordinate by evaluating the combined signal Q. The determination may be a one-step process, such as by directly combining the center signal and the sum signal and deriving its longitudinal coordinate, or may be a multi-step process, by first deriving the combined signal from the center signal and the sum signal and secondly by deriving the longitudinal coordinate from the combined signal. Both options, i.e., the option that steps c) and d) are separate and independent steps, and the option that steps c) and d) are fully or partially combined, shall be encompassed by the present invention.

[0092] The evaluation device may be configured to use at least one predetermined relationship between the combined signal and the longitudinal coordinate. The predetermined relationship may be one or more of an empirical relationship, a semi-empirical relationship, and an analytically derived relationship. The evaluation device may include at least one data storage device for storing the predetermined relationship, such as a lookup list or a lookup table.

[0093] The combined signal Q can be determined by using various means. As an example, a software device for deriving a quotient signal, a hardware device for deriving a quotient signal, or both can be used and implemented in the evaluation device. Thus, as an example, the evaluation device can include at least one divider, wherein the divider is configured to derive the quotient signal. The divider can be implemented in whole or in part as a software divider and / or a hardware divider. The divider can be fully or partially integrated into the sensor element transponder, or can be implemented in whole or in part independently of the sensor element.

[0094] The detector may include at least one further optical element selected from the group comprising: a transmission device, such as at least one lens and / or at least one lens system; at least one diffractive optical element. The term "transmission device" (also denoted "transmission system") may generally refer to one or more optical elements configured to modify a light beam, such as by modifying one or more of the beam parameters of the light beam, the width of the light beam or the direction of the light beam. The transmission device may be configured to direct the light beam onto the optical sensor. The transmission device may specifically include one or more of the following: at least one lens, for example, at least one lens selected from the group comprising: at least one focusable lens, at least one aspherical lens, at least one spherical lens, at least one Fresnel lens; at least one diffractive optical element; at least one concave mirror; at least one beam deflecting element, preferably at least one reflector; at least one beam splitting element, preferably at least one of a beam splitting cube or a beam splitting reflector; at least one multi-lens system. As used herein, the term "focal length" of the transmission device refers to the distance at which incident collimated light incident on the transmission device can be "focused", which may also be denoted as "focal point". Therefore, the focal length constitutes a measure of the ability of the transmission device to focus the incident light beam. Thus, the conveying device may comprise one or more imaging elements, which may have the effect of a converging lens. By way of example, the conveying device may have one or more lenses, in particular one or more refractive lenses, and / or one or more convex mirrors. In this example, the focal length may be defined as the distance from the center of a thin refractive lens to the main focus of the thin lens. For converging thin refractive lenses, such as convex or biconvex thin lenses, the focal length may be considered positive and may provide a distance at which a collimated light beam incident on the thin lens as the conveying device may be focused into a single spot. Furthermore, the conveying device may comprise at least one wavelength selective element, for example at least one optical filter. Furthermore, the conveying device may be designed to imprint a predefined beam profile on the electromagnetic radiation, for example at the location of a sensor region and in particular a sensor area. In principle, the above optional embodiments of the conveying device may be implemented individually or in any desired combination.

[0095] The conveying device may have an optical axis. In particular, the detector and the conveying device have a common optical axis. As used herein, the term "optical axis of the conveying device" generally refers to a mirror symmetry or rotational symmetry axis of a lens or lens system. The optical axis of the detector may be a symmetry line of the optical arrangement of the detector. The detector comprises at least one conveying device, preferably at least one conveying system having at least one lens. As an example, the conveying system may comprise at least one beam path, wherein the elements of the conveying system in the beam path are positioned in a rotationally symmetric manner about the optical axis. However, one or more optical elements located in the beam path may also be offset from the center or tilted about the optical axis. However, in this case, the optical axis may be defined sequentially, such as by connecting the centers of the optical elements in the beam path to each other, for example by connecting the centers of the lenses to each other, wherein, in this context, the optical sensor is not counted as an optical element. The optical axis may generally represent a beam path. Wherein, the detector may have a single beam path along which the light beam may travel from the object to the optical sensor, or may have multiple beam paths. As an example, a single beam path may be given, or the beam path may be divided into two or more partial beam paths. In the latter case, each partial beam path has its own optical axis. The optical sensors can be located in the same beam path or in a partial beam path. Alternatively, however, the optical sensors can also be located in different partial beam paths.

[0096] The conveyor may constitute a coordinate system, wherein the longitudinal coordinate l is a coordinate along the optical axis, and wherein d is a spatial offset from the optical axis. The coordinate system may be a polar coordinate system, wherein the optical axis of the conveyor forms the z-axis, and wherein the distance from the z-axis and the polar angle may be used as additional coordinates. Directions parallel or antiparallel to the z-axis may be considered longitudinal directions, and coordinates along the z-axis may be considered longitudinal coordinates z. Any direction perpendicular to the z-axis may be considered a transverse direction, and polar coordinates and / or polar angles may be considered transverse coordinates.

[0097] As further used herein, the term "evaluation device" generally refers to any device configured to perform specified operations, preferably by using at least one data processing device and more preferably by using at least one processor and / or at least one application specific integrated circuit. Thus, as an example, at least one evaluation device may include at least one data processing device having software code including a large number of computer commands stored thereon. The evaluation device may provide one or more hardware elements for performing one or more of the specified operations, and / or may provide one or more processors with software that runs thereon to perform one or more of the specified operations.

[0098] The operations mentioned above, including determining at least one longitudinal coordinate of the object, are performed by at least one evaluation device. Thus, as an example, one or more of the above relationships may be implemented in software and / or hardware, for example by implementing one or more lookup tables. Thus, as an example, the evaluation device may include one or more programmable devices, such as one or more computers, application specific integrated circuits (ASICs), digital signal processors (DSPs), or field programmable gate arrays (FPGAs), which are configured to perform the above-mentioned evaluations in order to determine at least one longitudinal coordinate of the object. However, additionally or alternatively, the evaluation device may also be implemented in whole or in part by hardware.

[0099] As outlined above, by evaluating the center signal and the sum signal, the detector can be enabled to determine at least one longitudinal coordinate of the object, including the option of determining the longitudinal coordinate of the entire object or one or more parts thereof. In addition, however, other coordinates of the object (including one or more lateral coordinates and / or rotational coordinates) can be determined by the detector (in particular by the evaluation device). Therefore, as an example, one or more lateral sensors can be used to determine at least one lateral coordinate of the object. As outlined above, the position of at least one optical sensor that generates the center signal can provide information about at least one lateral coordinate of the object, wherein, as an example, simple lens equations can be used for optical transformations and for deriving the lateral coordinates. Additionally or alternatively, one or more additional lateral sensors can be used and included by the detector. Various lateral sensors are generally known in the art, such as the lateral sensors disclosed in WO 2014 / 097181 A1 and / or other position sensitive devices (PSDs), such as quadrant diodes, CCDs or CMOS chips, etc. Additionally or alternatively, as an example, the detector according to the present invention may include one or more PSDs disclosed in RAStreet (Ed.): Technology and Applications of Amorphous Silicon, Springer-Verlag Heidelberg, 2010, pp. 346-349. Other embodiments are possible. These devices may also be generally implemented into the detector according to the present invention. As an example, a part of the light beam may be separated in the detector by at least one beam splitting element. As an example, the separated part may be directed toward a lateral sensor (such as a CCD or CMOS chip or a camera sensor), and the lateral position of the light spot generated by the separated part on the lateral sensor may be determined, thereby determining at least one lateral coordinate of the object. Therefore, the detector according to the present invention may be a one-dimensional detector, such as a simple distance measuring device, or may be implemented as a two-dimensional detector or even a three-dimensional detector. Further, as outlined above or as outlined in more detail below, by scanning a scene or environment in a one-dimensional manner, a three-dimensional image may also be created. Therefore, the detector according to the present invention may specifically be one of a one-dimensional detector, a two-dimensional detector or a three-dimensional detector. The evaluation device may also be configured to determine at least one lateral coordinate x, y of the object. The evaluation device can be configured to combine the information of the longitudinal coordinate and the transverse coordinate and to determine the position of the object in space.

[0100] Additionally or alternatively, the longitudinal coordinate z is determined by using the photon ratio depth technique DPRThe evaluation device may be configured to select at least one reflection feature of the reflection image and to assign the reflection feature to the corresponding VCSEL. The evaluation device may be configured to determine at least one longitudinal coordinate z by using at least one triangulation method. triang Alternatively, depth from focus or depth from defocus methods may also be applied. A focus measurement, typically some kind of high pass filter or high contrast search algorithm, is used to determine the focus maximum, as discussed in Subbarao, M. and Gopal, S., Depth from Defocus: A Spatial Domain Approach, International Journal of Computer Vision, 13, 3, 271-294, 1994.

[0101] The detector may also comprise one or more additional elements, such as one or more additional optical elements.Furthermore, the detector may be fully or partially integrated into at least one housing.

[0102] In a further aspect, the present invention discloses a method for determining the position of at least one object by using a detector, such as a detector according to the present invention (such as according to one or more of the embodiments disclosed above or disclosed in more detail below). However, other types of detectors may be used. The method comprises the following method steps, wherein these method steps may be performed in a given order or may be performed in a different order. In addition, there may be one or more other method steps that are not listed. In addition, one, more than one or even all method steps may be performed repeatedly.

[0103] The method comprises the following method steps:

[0104] - illuminating the object with at least one illumination pattern generated by at least one projector of the detector;

[0105] - determining at least one reflected image by using at least one sensor element of a matrix having optical sensors, the optical sensors each having a light-sensitive area, wherein each optical sensor is designed to generate at least one sensor signal in response to illumination of its respective light-sensitive area by a reflected light beam propagating from the object to the detector;

[0106] - selecting at least one reflection characteristic of the reflection image and assigning said reflection characteristic of the reflection image to one of the VCSELs of the array.

[0107] For details, options and definitions, reference may be made to the detector as discussed above.Thus, in particular, as outlined above, the method comprises using a detector according to the invention, such as a detector according to one or more of the embodiments given above or in more detail below.

[0108] The method may further comprise determining at least one longitudinal coordinate z of a selected reflection feature of the reflection image by evaluating a combined signal Q of the sensor signals from the sensor elements. DPR The combined signal Q is derived by one or more of the following: dividing the sensor signal, dividing a multiple of the sensor signal, dividing a linear combination of the sensor signals. DPR By using the combined signal Q and the longitudinal coordinate z DPR is determined by at least one predetermined relationship between them.

[0109] The method may further comprise determining a longitudinal coordinate z of a selected reflective feature of the reflective image. triang The selected reflection characteristics can be assigned to the corresponding VCSEL. The longitudinal coordinate z can be determined by using at least one triangulation method. triang Alternatively, depth from focus or depth from defocus methods may also be applied. A focus measurement, typically some kind of high pass filter or high contrast search algorithm, is used to determine the focus maximum, as discussed in Subbarao, M. and Gopal, S., Depth from Defocus: A Spatial Domain Approach, International Journal of Computer Vision, 13, 3, 271-294, 1994.

[0110] In a further aspect of the invention, the use of a detector according to the invention (such as according to one or more of the embodiments given above or in more detail below) is proposed, which, for the purpose of use, is selected from the group including: position measurement in traffic technology; entertainment applications; security applications; supervision applications; safety applications; human-machine interface applications; tracking applications; photographic applications; imaging applications or camera applications; composition applications for generating a map of at least one space; homing or tracking beacon detectors for vehicles; outdoor applications; mobile applications; communication applications; machine vision applications; robotics applications; quality control applications; manufacturing applications; gait monitoring applications; human monitoring applications; home care; smart life.

[0111] For further uses of the detector and the device of the present invention, reference is made to WO 2018 / 091649 A1, WO 2018 / 091638 A1 and WO 2018 / 091640 A1, the contents of which are included by reference.

[0112] In general, in the context of the present invention, the following embodiments are considered to be preferred:

[0113] Embodiment 1: A projector for illuminating at least one object using at least one illumination pattern, wherein the projector comprises at least one array of vertical cavity surface emitting lasers (VCSELs), wherein each of the VCSELs is configured to generate at least one light beam, wherein the projector comprises at least one optical system, wherein the at least one optical system is configured to generate a characteristic beam profile for each of the light beams generated by the VCSELs of the array, wherein the beam profiles of adjacent VCSELs of the array differ in lateral and / or axial directions so that the light beams of the VCSELs of the array can be assigned to corresponding VCSELs in three-dimensional space.

[0114] Embodiment 2: The projector according to the preceding embodiment, wherein the optical system comprises at least one array of optical elements, wherein each of the optical elements has a structured surface.

[0115] Embodiment 3: The projector according to the preceding embodiment, wherein the structured surfaces of the optical elements are different.

[0116] Embodiment 4: A projector according to any one of the preceding embodiments, wherein the optical element is a refractive optical element, preferably a refractive-diffractive hybrid element.

[0117] Embodiment 5: A projector according to any of the preceding embodiments, wherein the beam profiles of adjacent VCSELs of the array differ by one or more of shape, orientation, cross-section.

[0118] Embodiment 6: A projector according to any of the preceding embodiments, wherein the optical system is configured to generate different features in a lateral dimension.

[0119] Embodiment 7: A projector according to any of the preceding embodiments, wherein the optical system is configured to generate a plurality of different illumination patterns in an axial dimension.

[0120] Embodiment 8: The projector according to the preceding embodiment, wherein the optical system is configured to focus different illumination patterns for each VCSEL at different depths of field.

[0121] Embodiment 9: The projector according to any of the preceding embodiments, wherein the VCSEL is configured to emit a light beam at a wavelength range from 800 to 1000 nm, preferably at 940 nm.

[0122] Embodiment 10: A projector according to any of the preceding embodiments, wherein the VCSEL array is a two-dimensional or one-dimensional array, wherein the array comprises up to 2500 VCSELs.

[0123] Embodiment 11: A detector for determining a position of at least one object, the detector comprising:

[0124] - at least one projector for illuminating the object with at least one illumination pattern according to any of the preceding embodiments;

[0125] - at least one sensor element of a matrix of optical sensors, each of which has a photosensitive area, wherein each optical sensor is designed to generate at least one sensor signal in response to illumination of its respective photosensitive area by a reflected light beam propagating from the object to the detector, wherein the sensor element is configured to determine at least one reflected image;

[0126] - at least one evaluation device, wherein the evaluation device is configured for selecting at least one reflection characteristic of the reflection image and for assigning the reflection characteristic to one of the VCSELs of the array.

[0127] Embodiment 12: The detector according to the preceding embodiment, wherein the evaluation device is configured to determine at least one longitudinal coordinate z of the selected reflection feature of the reflection image by evaluating the combined signal Q from the sensor signals of the sensor elements. DPR , the evaluation device is configured to derive the combined signal Q by one or more of the following: dividing the sensor signal, dividing a multiple of the sensor signal, dividing a linear combination of the sensor signal. The evaluation device is configured to use the combined signal Q and the longitudinal coordinate z DPR The longitudinal coordinate is determined by at least one predetermined relationship between.

[0128] Embodiment 13: The detector according to any of the preceding embodiments relating to the detector, wherein the evaluation device is configured for selecting at least one reflection feature of the reflection image and for assigning the reflection feature to a corresponding VCSEL, wherein the evaluation device is configured for determining at least one longitudinal coordinate z by using at least one triangulation method triang .

[0129] Embodiment 14: A method for determining the position of at least one object by using at least one detector according to any one of the preceding embodiments relating to detectors, the method comprising the following steps:

[0130] - illuminating the object with at least one illumination pattern generated by at least one projector of the detector;

[0131] - determining at least one reflected image by using at least one sensor element of a matrix having optical sensors, each of which has a photosensitive area, wherein each optical sensor is designed to generate at least one sensor signal in response to illumination of its respective photosensitive area by a reflected light beam propagating from the object to the detector;

[0132] - selecting at least one reflection characteristic of the reflection image and assigning the reflection characteristic of the reflection image to one of the VCSELs of the array.

[0133] Embodiment 15: The method according to the preceding embodiment, wherein the method further comprises: determining at least one longitudinal coordinate z of the selected reflection feature of the reflection image by evaluating a combined signal Q from the sensor signals of the sensor elements DPR , wherein the combined signal Q is derived by one or more of the following: dividing the sensor signal, dividing a multiple of the sensor signal, dividing a linear combination of the sensor signal, wherein the longitudinal coordinate z DPR By using the combined signal Q and the longitudinal coordinate z DPR is determined by at least one predetermined relationship between them.

[0134] Embodiment 16: The method according to any one of the preceding embodiments, wherein the method further comprises: assigning the selected reflection characteristics to the corresponding VCSEL, and determining at least one longitudinal coordinate z by using at least one triangulation method. triang .

[0135] Embodiment 17: A use of a detector according to any one of the preceding embodiments involving detectors, for the purpose of use, selected from: position measurement in traffic technology; entertainment applications; security applications; supervision applications; safety applications; human-machine interface applications; logistics applications; tracking applications; outdoor applications; mobile applications; communication applications; photography applications; machine vision applications; robotics applications; quality control applications; manufacturing applications; gait monitoring applications; human body monitoring applications; home care; smart life. BRIEF DESCRIPTION OF THE DRAWINGS

[0136] Other optional details and features of the invention will be apparent from the following description of preferred exemplary embodiments in conjunction with the dependent claims. In this case, specific features can be implemented in a separate manner or by combining with other features. The invention is not limited to exemplary embodiments. Exemplary embodiments are schematically shown in the accompanying drawings. The same reference numerals in the various drawings refer to the same elements or elements with the same function, or elements that correspond to each other in terms of their functions.

[0137] Specifically, in the figure:

[0138] Figure 1 An embodiment of a projector according to the present invention is shown;

[0139] Figure 2 An embodiment of a detector according to the present invention is shown;

[0140] Figure 3 Another embodiment of a projector is shown;

[0141] Figure 4 Another embodiment of a detector is shown;

[0142] Figure 5 Another embodiment of a projector is shown; and

[0143] Figure 6 Another embodiment of a projector is shown; and

[0144] Figure 7 Another embodiment of a projector is shown. DETAILED DESCRIPTION

[0145] Figure 1 A first embodiment of a projector 110 for illuminating at least one object 112 with at least one illumination pattern 114 is shown in a highly schematic manner.

[0146] The illumination pattern 124 may include a plurality of features 116. The illumination pattern 114 may include an arrangement of periodic or non-periodic features. The illumination pattern 114 may include at least one pattern selected from the group comprising: at least one dot pattern, in particular a pseudo-random dot pattern; a random dot pattern or a quasi-random pattern; at least one Sobol pattern; at least one quasi-periodic pattern; at least one pattern including at least one predetermined feature; at least one regular pattern; at least one triangular pattern; at least one hexagonal pattern; at least one rectangular pattern including at least one pattern of convex uniform tiles; at least one line pattern including at least one line; at least one line pattern including at least two lines, such as parallel or crossed lines. For example, the projector 110 may be configured to generate and / or project a point cloud or non-point features. For example, the projector 110 may be configured to generate a point cloud or non-point features, so that the illumination pattern 114 may include a plurality of point features or non-point features. The illumination pattern 114 may include a regular and / or constant and / or periodic pattern, such as a triangular pattern, a rectangular pattern, a hexagonal pattern, or a pattern including further convex tiles. The illumination pattern may include as many features per area as possible so that a hexagonal pattern may be preferred.The distance between two features of the respective illumination pattern 114 and / or the area of ​​at least one illumination feature may depend on a confusion circle in an image determined by at least one detector as described below.

[0147] The projector 110 includes at least one array 118 of vertical cavity surface emitting lasers (VCSELs) 120. Each of the VCSELs 120 is configured to generate at least one light beam. The VCSELs 120 can be configured to emit a light beam at a wavelength range from 800 to 1000 nm. For example, the VCSELs 120 can be configured to emit a light beam at 808 nm, 850 nm, 940 nm, or 980 nm. Preferably, the VCSELs 120 emit light at 940 nm because terrestrial solar radiation has a local minimum irradiance at this wavelength, for example as described in CIE 085-1989 "Solar Spectral Irradiance".

[0148] The array 118 of VCSELs 120 may be a two-dimensional or one-dimensional array. The array 118 of VCSELs 120 may include a plurality of VCSELs arranged 118 in a rectangular shape. The matrix may specifically be or may include a rectangular matrix having one or more rows and one or more columns. The rows and columns may specifically be arranged in a rectangular manner. However, it should be outlined that other arrangements are feasible, such as non-rectangular arrangements. As an example, a circular arrangement is also feasible, in which the elements are arranged in concentric circles or ellipses about a center point. For example, the matrix may be a single row of pixels. Other arrangements are feasible. The VCSELs 120 may be arranged on a common substrate or on different substrates. The array 118 may include up to 2500 VCSELs. For example, the array 118 may include 38x25 VCSELs 120, such as a high power array with 3.5W. For example, the array 118 may include 10x27 VCSELs 120 with 2.5W. For example, the array 118 may include 96 VCSELs 120 with 0.9W. For example, the size of an array 118 of 2500 elements may be as large as 2 mm x 2 mm.

[0149] Compared to light emitting diodes (LEDs), the array 118 of VCSELs 120 may have high radiant power. Moreover, compared to LEDs, VCSELs 120 may have higher spatial and temporal coherence. This may allow for improved shaping and / or modification of the beam profile and increased spectral power density by the optical system.

[0150] The projector 110 includes at least one optical system 122, which is configured to generate a characteristic beam profile for each of the light beams generated by the VCSELs 120 of the array 118. The optical system 122 may include at least one array of optical elements 124. The array of optical elements 124 may include a plurality of optical elements arranged in a matrix. The matrix of optical elements 124 may specifically be or may include a rectangular matrix having one or more rows and one or more columns. The rows and columns may specifically be arranged in a rectangular manner. However, it should be outlined that other arrangements are feasible, such as non-rectangular arrangements. As an example, a circular arrangement is also feasible, in which the elements are arranged in concentric circles or ellipses about a center point. For example, the matrix may be a single row of pixels. Other arrangements are feasible.

[0151] The beam profile may be a transverse intensity profile of the light beam. The beam profile may be a cross section of the light beam. The beam profile may be selected from: a trapezoidal beam profile, a triangular beam profile, a conical beam profile, and a linear combination of Gaussian beam profiles. However, other embodiments are feasible. The beam profiles of adjacent VCSELs of the array are different in the lateral and / or axial direction. The axial direction may be a direction along the optical axis 126 of the optical system 122, in particular the longitudinal direction. The optical axis 126 may be a symmetry line of the optical arrangement of the optical system 122. The lateral direction may be a direction perpendicular to the axial direction, in particular the lateral direction. The beam profiles of the VCSELs 120 of the array 118, in particular the adjacent VCSELs of the array 118, may be different by one or more of shape, orientation, and cross section. Different beam profiles allow the light beams generated by the VCSELs 120 of the array 118 to be assigned to the corresponding VCSELs. In particular, if the adjacent light beams are different in shape, it is possible to determine which VCSEL 120 of the array 118 the light beams are generated from based on the shape of the light beams. For example, the light beams may be different in shape and orientation. Preferably, the difference in beam profiles is as large as possible in order to allow simple allocation. Allocation may be simplest in the case where the beam profiles of all VCSELs 120 in array 118 differ in shape, orientation and cross-section. However, it may be sufficient that the beam profiles of adjacent beams differ in at least one parameter.

[0152] Each of the optical elements 124 may have a structured surface 128. The structured surfaces 128 of the optical elements 124 may be different. In particular, the structured surfaces 128 of two adjacent optical elements of the array may be different. The optical elements 124 may be manufactured or produced by using three-dimensional holographic lithography, such as described in J. Gavin in Optics Letters, Vol. 36 (2011), No. 13, 2495-2497.

[0153] The optical elements 124 may each be or may include at least one lens having a structured surface 128, in particular a structured surface having individual imprinted and / or embossed structures. However, other manufacturing techniques, such as molding or injection molding are possible. The structured surface 128 may cause the light beam incident on the optical element to be adjusted to have a non-point-like or non-spot-shaped beam profile. The optical element 124 may be a refractive optical element. Preferably, the optical element 124 may be a refractive-diffractive hybrid element. The refractive element and / or the refractive structure may have a radius, in particular, for example, a diameter of a microlens, which depends on the distance between adjacent VCSELs 120. For example, the distance may be in the range from 40 μm to 70 μm. The diameter may be similar, such as 40 μm. However, the diameter may also strongly depend on the optical properties and the refractive index. The diffractive elements and / or the diffractive structures may be advantageous because they can be produced very flat. The diffractive elements may each include at least one substrate, also denoted as substrate. The substrate may be a glass substrate. The substrate may have a thickness of 1 mm. The refractive element and / or the refractive structure may have a thickness D diff , which corresponds to the optical path difference The diameter of the diffractive and refractive elements and / or structures may be smaller than the distance between two VCSELs 120 of the array 118, for example, the diameter may be less than 70 μm. The diffractive elements and / or structures may be circularly symmetrical and planar. However, asymmetric embodiments are possible. For example, the diffractive structures may be arranged on a curved surface, such as a curved surface on the concave or convex side of a refractive lens.

[0154] The optical element 124 may include at least one material including at least one polymer. The material may be a polymer material that can be used for 2-photon stimulated polymerization, such as Nanoscribe IP-Dip, OrmoComp., Nanoscribe IP-G, Nanoscribe IP-L, Nanoscribe IP-S. For molding processes, such as injection molding or hot stamping, plastics such as those available from Zeonix, https: / / www.zeonex.com / optics.aspx.html, or Trogamid myCX from Evonik, https: / / www.campusplastics.com / campus / de / datasheet / TROGAMID%C2%AE+myCX+nc+(nf) / Evonik+Industries+AG / 66 / bf801790, may be used. For glass molding, several glass materials may be used, such as those listed in https: / / refractiveindex.info / ?shelf=glass&book=BK7&page=SCHOTT.

[0155] The optical element 124 can be arranged as close as possible in front of the array 118 of VCSELs 120 in the propagation direction of the light beam. For example, the optical element 124 can be designed as a rod lens with a high refractive index. The rod lens can be arranged as close as possible in front of the array 118 of VCSELs 120 in the propagation direction of the light beam. Due to the higher refractive index of the lens material, the convergence angle can be reduced and the optical path length can be increased, so that the local coherence is increased, thereby allowing improved shaping of the light beam.

[0156] The structured surface 128 can be configured such that the cross-section of the beam profile can vary depending on the distance between the projector 110 and the object 112, such as Figure 3 As shown. Figure 3 In FIG. 1 , two different symbols are schematically depicted, representing features of different shapes depending on the distance from the optical element 124. The propagation and change of the beam profile shape is also depicted highly schematically. This can be ensured by using an optical element 124 with a specific predefined and / or predetermined geometry. The required geometry can be determined by using an iterative waveguide calculation, using Figure 3. In particular, the desired intensity distribution at different distances relative to the optical element 124 can be used as a basis for iterative design. Between different planes, for example, between the VCSEL 120, the optical element 124, the projection plane with shape 1 (indicated by reference numeral 130) and the projection plane with shape 2, the projection plane with shape 1 (indicated by reference numeral 132), at least one wave light propagation algorithm, such as Fresnel propagation or Rayleigh-Sommerfeld diffraction integral, can be used. The propagation can go from plane to plane and back to the VCSEL 120. Since the VCSEL 120 can emit partially coherent radiation, it can be simulated using point light sources that are incoherent with each other. The point light sources can be weighted with respect to their intensity distribution.

[0157] The optical system 122 can be configured to generate multiple illumination patterns 114 in the lateral dimension. For example, the optical system 122 can be configured to generate at least two illumination features 116 having different angles relative to the optical axis 126 for each of the VCSELs 120 of the array 118. For example, this can be done using, for example, a light source from The method can be implemented using a ray tracing routine enabled by a commercial software package of . Additionally or alternatively, an iterative method based on at least one wave light propagation method can be used, such as Rayleigh-Sommerfeld, Fresnel propagation and / or Fraunhofer propagation. The iterative process can then alternate between propagation from the optical system to different lateral projected illumination patterns and back to the optical system. During the updating process of the optical system, a number of different lateral illumination patterns can be considered, resulting in a certain percentage of each illumination pattern contributing to the updated optical system, for example if two illumination patterns with the same weight should be generated, then in each iteration step the corresponding retrieved wave light solution will contribute 50% to the wave light description of the optical system. The process can be repeated until the error measure can be minimized for all projected illumination patterns. The error measure can be obtained from the difference between the desired illumination pattern and the simulated illumination pattern. The projection direction between at least two illumination patterns may not be too large. The two patterns may be projected on the same plane. Thus, the iterative process will only occur between the optical system and the plane of the desired at least two illumination patterns. Figure 6 and Figure 7 A further embodiment of the projector 110 is shown. Figure 6 , a lateral pattern projection for two laterally spaced apart patterns 114 is shown. Specifically, Figure 6 Projection planes with different shaped patterns are shown. Figure 7 An embodiment with lateral pattern projection for three different lateral planes is shown.

[0158] Figure 2A detector 134 for determining the position of at least one object 112 is shown highly schematically. The detector 134 comprises at least one projector 110 according to the invention, such as Figure 1 and Figure 3 as described.

[0159] The detector 134 includes at least one sensor element 136 having a matrix of optical sensors 138. The optical sensors 138 each have a photosensitive area. Each optical sensor 138 is designed to generate at least one sensor signal in response to the illumination of its corresponding photosensitive area by a reflected light beam propagating from the object 112 to the detector 134. The sensor element 136 is configured to determine at least one reflected image. The sensor element 136 can be formed as a single single device or a combination of several devices. As will be outlined in more detail below, the matrix can specifically be or can include a rectangular matrix with one or more rows and one or more columns. The rows and columns can specifically be arranged in a rectangular manner. However, it should be outlined that other arrangements are feasible, such as non-rectangular arrangements. As an example, a circular arrangement is also feasible, in which the elements are arranged in concentric circles or ellipses about a center point. For example, the matrix can be a single row of pixels. Other arrangements are feasible. The photosensitive area can specifically be located on the surface of the corresponding optical sensor. However, other embodiments are also feasible. The optical sensors 138 of the matrix can specifically be equal in size, sensitivity and one or more of other optical, electrical and mechanical properties. The photosensitive areas of all optical sensors 138 of the matrix may in particular be located in a common plane, which preferably faces the object, so that a light beam propagating from the object to the detectors may generate a light spot on the common plane.

[0160] The optical sensor 138 may specifically be or may include a photodetector, preferably an inorganic photodetector, more preferably an inorganic semiconductor photodetector, most preferably a silicon photodetector. In particular, the optical sensor 138 may be sensitive in the infrared spectral range. All optical sensors 138 of the matrix or at least a group of optical sensors of the matrix may specifically be identical. The same group of optical sensors of the matrix may specifically be provided for different spectral ranges, or all optical sensors may be identical in terms of spectral sensitivity. Further, the optical sensors 138 may be identical in terms of size and / or with regard to their electronic or optoelectronic properties.

[0161] In particular, the optical sensor 138 may be or may include an inorganic photodiode that is sensitive in the infrared spectral range, preferably in the range of 780 nm to 3.0 microns. In particular, the optical sensor 138 may be sensitive in a portion of the near infrared region in the range of 700 nm to 1000 nm, for which silicon photodiodes are specifically suitable. An infrared optical sensor that can be used for the optical sensor may be a commercially available infrared optical sensor, such as a commercially available infrared optical sensor under the trade name HertzstueckTM from TrinamiX GmbH of D-67056 Ludwigshafen am Rhein, Germany. Thus, as an example, the optical sensor 138 may include at least one intrinsic photovoltaic type optical sensor, more preferably, at least one semiconductor photodiode selected from the following: a Ge photodiode, an InGaAs photodiode, an extended InGaAs photodiode, an InAs photodiode, an InSb photodiode, a HgCdTe photodiode. Additionally or alternatively, the optical sensor 138 may include at least one optical sensor of extrinsic photovoltaic type, more preferably at least one semiconductor photodiode selected from the group consisting of Ge:Au photodiode, Ge:Hg photodiode, Ge:Cu photodiode, Ge:Zn photodiode, Si:Ga photodiode, Si:As photodiode. Additionally or alternatively, the optical sensor 138 may include at least one bolometer, preferably a bolometer selected from the group consisting of VO bolometer and amorphous Si bolometer.

[0162] The matrix may comprise independent optical sensors. Thus, the matrix may comprise inorganic photodiodes. However, alternatively, a commercially available matrix may be used, such as one or more of a CCD detector (such as a CCD detector chip) and / or a CMOS detector (such as a CMOS detector chip).

[0163] The detector 134 includes at least one evaluation device 140. The evaluation device 140 is configured to select at least one reflection feature of the reflection image and to assign the reflection feature to one of the VCSELs 120 of the array 118. The reflection image may include at least one reflection pattern, and the at least one reflection pattern includes the reflection feature. The evaluation device 140 may be configured to perform at least one image analysis and / or image processing in order to identify the reflection feature. The image analysis and / or image processing may use at least one feature detection algorithm. Image analysis and / or image processing may include one or more of the following: filtering; selection of at least one region of interest; formation of a difference image between an image created by a sensor signal and at least one offset; inversion of a sensor signal by inverting the image created by the sensor signal; formation of a difference image between images created by sensor signals at different times; background correction; decomposition into color channels; decomposition into chroma; saturation; and brightness channels; frequency decomposition; singular value decomposition; applying a Canny edge detector; applying Gaussian and Laplace filters; applying a difference of Gaussian filter; applying a Sobel operator; applying a Laplace operator; applying a Scharr operator; applying a Prewitt operator; applying a Roberts operator; applying a Kirsch operator; applying a high pass filter; applying a low pass filter; applying a Fourier transform; applying a Radon transform; applying a Hough transform; applying a wavelet transform; thresholding; creating a binary image. The region of interest may be manually determined by a user or may be automatically determined, such as by identifying an object within an image generated by an optical sensor.

[0164] The evaluation device 140 can be configured to in particular unambiguously determine one VCSEL 120 of the array 118 that has emitted an illumination feature 116 that has caused the selected reflection feature. In known 3D sensing devices, such as devices using triangulation or structured light techniques, solving this corresponding problem is complex and time-consuming. The present invention proposes using a characterized, in particular distinguishable beam profile for the illumination feature and therefore for the reflection feature, so that one VCSEL 120 in the array 118 that has emitted an illumination feature that has caused the selected reflection feature can be immediately, easily and unambiguously identified.

[0165] The detector 134 may be configured to determine at least one distance information of the object by using triangulation and / or photon ratio depth techniques and / or depth of focus and / or depth from focus. For example, the evaluation device 140 may be configured to determine at least one longitudinal coordinate z of a selected reflection feature of the reflection image by evaluating the combined signal Q of the sensor signals from the sensor elements 136. DPRThe evaluation device 140 may be configured to derive the combined signal Q by one or more of the following: dividing the sensor signal, dividing a multiple of the sensor signal, dividing a linear combination of the sensor signal. The evaluation device 140 may be configured to use the combined signal Q and the longitudinal coordinate z DPR The longitudinal coordinate is determined by at least one predetermined relationship between the

[0166] The detector 134 may include at least one further optical element selected from the group comprising: a transmission device, such as at least one lens and / or at least one lens system; at least one diffractive optical element. The transmission device may be configured to direct the light beam onto the optical sensor 138. The transmission device may specifically include one or more of the following: at least one lens, for example, at least one lens selected from the following: at least one focus-adjustable lens, at least one aspherical lens, at least one spherical lens, at least one Fresnel lens; at least one diffractive optical element; at least one concave mirror; at least one beam deflection element, preferably at least one reflector; at least one beam splitting element, preferably at least one of a beam splitting cube or a beam splitting reflector; at least one multi-lens system. Thus, the transmission device may include one or more imaging elements, which may have the effect of a converging lens. For example, the transmission device may have one or more lenses, in particular one or more refractive lenses, and / or one or more convex mirrors. In this example, the focal length may be defined as the distance from the center of the thin refractive lens to the main focus of the thin lens. For a converging thin refractive lens, such as a convex or biconvex thin lens, the focal length may be considered positive and may provide a distance over which a collimated light beam incident on the thin lens as a transmission device may be focused into a single spot. Furthermore, the transmission device may comprise at least one wavelength selective element, e.g. at least one optical filter. Furthermore, the transmission device may be designed to imprint a predefined beam profile on the electromagnetic radiation, e.g. at the location of the sensor area and in particular the sensor zone. In principle, the above-mentioned optional embodiments of the transmission device may be implemented individually or in any desired combination.

[0167] The transmission device may have an optical axis. In particular, the detector 134 and the transmission device have a common optical axis. The optical axis of the detector may be a symmetry line of the optical arrangement of the detector 134. The detector 134 comprises at least one transmission device, preferably at least one transmission system having at least one lens. As an example, the transmission system may comprise at least one beam path, wherein the elements of the transmission system in the beam path are positioned in a rotationally symmetrical manner about the optical axis. However, one or more optical elements located in the beam path may also be off-center or tilted about the optical axis. However, in this case, the optical axis may be defined sequentially, such as by connecting the centers of the optical elements in the beam path to each other, for example by connecting the centers of the lenses to each other, wherein in this context, the optical sensor is not counted as an optical element. The optical axis may generally represent a beam path. Among them, the detector 134 may have a single beam path along which the light beam may travel from the object to the optical sensor, or may have multiple beam paths. As an example, a single beam path may be given, or the beam path may be divided into two or more partial beam paths. In the latter case, each partial beam path may have its own optical axis. The optical sensor 138 may be located in the same beam path or in a partial beam path. Alternatively, however, the optical sensor can also be located in a different partial beam path.

[0168] The conveyor may constitute a coordinate system, wherein the longitudinal coordinate l is a coordinate along the optical axis, and wherein d is a spatial offset from the optical axis. The coordinate system may be a polar coordinate system, wherein the optical axis of the conveyor forms the z-axis, and wherein the distance from the z-axis and the polar angle may be used as additional coordinates. Directions parallel or antiparallel to the z-axis may be considered longitudinal directions, and coordinates along the z-axis may be considered longitudinal coordinates z. Any direction perpendicular to the z-axis may be considered a transverse direction, and polar coordinates and / or polar angles may be considered transverse coordinates.

[0169] Figure 2 and 4 An embodiment of a projector 110 is shown in which the optical system 122 is configured to generate a plurality of different illumination patterns 114 in the axial dimension. Figure 2 and Figure 4, two object planes are exemplarily shown. For the object plane closer to the detector 134, three different symbols are shown, representing different features 116 of the illumination pattern. For the object plane at a greater distance from the detector 134, an exemplary one feature 116 is shown, wherein the feature 116 has changed from the object plane closer to the detector 134 to the object plane at the greater distance. The optical system 122 can be configured to focus different illumination patterns for each VCSEL at different depths of field. Specifically, the optical system 122 can be configured to focus the illumination patterns 114 at different focal planes, in particular object planes, wherein the focal planes are planes perpendicular to the optical axis 126 of the optical system 122, having different coordinates along the optical axis. The optical system 122 can be configured such that in each focal plane, only one of the illumination patterns 114 is focused, while the other illumination patterns 114 are not focused. In addition, in Figure 4 , an embodiment using a beam splitting device 144 is shown.

[0170] like Figure 5 As shown, the optical system 122 can be configured so that in each of the focal planes, a different illumination pattern 114 is focused. The optical system 122 may include at least one device for intermediate projection of the illumination pattern. For example, for applications with a distance of several meters between the array 118 of VCSELs 120 and the object 112, the device for intermediate projection can be designed for telecentric imaging so that the characteristic size of the imaging pattern remains unchanged for all axial object positions. Additionally or alternatively, the imaging scale can be determined from design data or by calibration. Multiple different illumination patterns 114 in the axial dimension can allow the use of triangulation methods and / or methods of aligning the detector 134 and the projector 110, particularly on a common axis. For this purpose, the detector 134 may include at least one zoom optical device and / or at least one electro-optical tunable system for traversing the measurement range. By adjusting different illumination patterns for different depths of the VCSELs 120 of the array 118, the number of distinguishable depth steps within the depth of field of the detector 134 can be increased to the number of VCSELs 120 in the array 118.

[0171] Reference Mark List

[0172] 110 Projector

[0173] 112 Objects

[0174] 114 Irradiation Pattern

[0175] 116 Irradiation Characteristics

[0176] 118 Array

[0177] 120 VCSEL

[0178] 122 Optical System

[0179] 124 Optical Components

[0180] 126 Optical Axis

[0181] 128 Structured Surface

[0182] 130 Projection plane

[0183] 132 Projection plane

[0184] 134 Detector

[0185] 136 Sensor element

[0186] 138 Optical Sensor

[0187] 140 Evaluation Device

[0188] 142 Another optical element

[0189] 144 Beam Splitting Device

Claims

1. A projector (110) for illuminating at least one object (112) with at least one illumination pattern (114), wherein: The projector (110) comprises at least one array (118) of vertical cavity surface emitting lasers (120), wherein each of the vertical cavity surface emitting lasers (120) is configured to generate at least one light beam, wherein the projector (110) comprises at least one optical system (122), wherein the at least one optical system (122) is configured to generate a characteristic beam profile for each of the light beams generated by the vertical cavity surface emitting lasers (120) of the array (118), wherein the array (118) The beam profiles of adjacent vertical cavity surface emitting lasers (120) of the array (118) are different in the lateral and / or axial directions so that the beams of the vertical cavity surface emitting lasers (120) of the array (118) can be distributed to corresponding vertical cavity surface emitting lasers (120) in three-dimensional space, wherein the optical system (122) is configured to generate a plurality of different illumination patterns (114) in the axial dimension, wherein the optical system (122) is configured to focus the different illumination patterns for each vertical cavity surface emitting laser at different depths of field.

2. The projector (110) according to claim 1, wherein: The optical system (122) includes at least one array of optical elements (124), wherein each of the optical elements (124) has a structured surface (128).

3. The projector (110) according to claim 2, wherein: The structured surfaces (128) of the optical elements (124) are different.

4. The projector (110) according to any one of claims 2 to 3, wherein: The optical element (124) is a refractive optical element.

5. The projector (110) according to any one of claims 2 to 3, wherein: The optical element (124) is a refractive-diffractive hybrid element.

6. The projector (110) according to any one of claims 1 to 3, wherein: The beam profiles of adjacent vertical cavity surface emitting lasers (120) of the array (118) differ by one or more of shape, orientation, and cross-section.

7. The projector (110) according to any one of claims 1 to 3, wherein: The optical system (122) is configured to generate different features in a lateral dimension.

8. The projector (110) according to any one of claims 1 to 3, wherein: The vertical cavity surface emitting laser (120) is configured to emit a light beam at a wavelength range from 800 to 1000 nm.

9. The projector (110) according to any one of claims 1 to 3, wherein: The vertical cavity surface emitting laser (120) is configured to emit a light beam at 940 nm.

10. A detector (134) for determining a position of at least one object (112), the detector (134) comprising: - at least one projector (110) for illuminating the object (112) with at least one illumination pattern (114) according to any of the preceding claims; at least one sensor element (136) of a matrix of optical sensors (138), each of which has a light-sensitive area, wherein each optical sensor (138) is designed to generate at least one sensor signal in response to illumination of its respective light-sensitive area by a reflected light beam propagating from the object (112) to the detector (134), wherein the sensor element (136) is configured to determine at least one reflected image; - at least one evaluation device (140), wherein the evaluation device (140) is configured for selecting at least one reflection characteristic of the reflection image and for assigning the reflection characteristic to one of the vertical cavity surface emitting lasers (120) of the array (118).

11. The detector (134) according to the preceding claim, wherein The evaluation device (140) is configured to determine at least one longitudinal coordinate z of a selected reflection feature of the reflection image by evaluating a combined signal Q based on the sensor signals of the sensor elements (136). DPR , wherein the evaluation device (140) is configured to derive the combined signal Q by one or more of the following: dividing the sensor signal, dividing a multiple of the sensor signal, dividing a linear combination of the sensor signals, wherein the evaluation device (140) is configured to use the combined signal Q and the longitudinal coordinate z DPR The longitudinal coordinate is determined by at least one predetermined relationship between.

12. The detector (134) according to any of the preceding claims relating to the detector (134), wherein: The evaluation device (140) is configured to select at least one reflection feature of the reflection image and to assign the reflection feature to a corresponding vertical cavity surface emitting laser (120), wherein the evaluation device (140) is configured to determine at least one longitudinal coordinate z by using at least one triangulation method triang .

13. A method for determining the position of at least one object (112) by using at least one detector (134) according to any one of the preceding claims relating to detectors, the method comprising the following steps: - illuminating the object (112) with at least one illumination pattern (114) generated by at least one projector (110) of the detector (134); - determining at least one reflection image by using at least one sensor element (136) of a matrix having optical sensors (138), each of which has a light-sensitive area, wherein each optical sensor (138) is designed to generate at least one sensor signal in response to illumination of its corresponding photosensitive area by a reflected light beam propagating from the object (112) to the detector (134); - selecting at least one reflection characteristic of the reflection image and assigning the reflection characteristic of the reflection image to one of the vertical cavity surface emitting lasers (120) of the array (118).

14. A use of a detector (134) according to any of the preceding claims relating to the detector, for the purpose of use, selected from: position measurement in traffic technology; entertainment applications; security applications; supervision applications; safety applications; human-machine interface applications; logistics applications; tracking applications; outdoor applications; mobile applications; communication applications; photography applications; machine vision applications; robotics applications; quality control applications; manufacturing applications; gait monitoring applications; human body monitoring applications; home care; smart life.

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