Method of testing a semiconductor device

Abstract

The application provides a testing method of semiconductor devices, comprising: writing test programs, one test program containing a UID number pool, one UID number pool being called by one test program, and the test programs called by semiconductor devices of the same model being the same; dividing semiconductor devices of the same model into M parts, and simultaneously testing N parts of the semiconductor devices by N testing machines, each testing machine selecting one part of the semiconductor devices for testing, wherein the test program of each testing machine selects a UID number segment, the UID number segments selected by different testing machines are different, each testing machine writes the corresponding UID number segment and UIDs in the UID number segment into the semiconductor devices, one UID is written into one semiconductor device, and N≤M.

Description

Technical Field

[0001] This invention relates to the field of semiconductor device testing, and in particular to a method for testing semiconductor devices. Background Technology

[0002] In semiconductor wafer testing, some chips require a unique UID (User ID) to identify them. One type of UID needs to be requested from the chip's user; this UID can only be used once, and different chips require unique UIDs. Therefore, UID resources are extremely valuable, making the rational allocation of UID usage crucial. For example, in applications like bank cards and access cards, once a UID is written to a chip, it cannot be erased and rewritten. The requirement is that the UID cannot be duplicated, and waste should be minimized during writing. If two chips are written with the same UID, the chip will be rendered unusable. If only one testing machine is writing the UID, there is no UID allocation issue. However, when multiple testing machines are testing simultaneously, it is necessary to rationally allocate UID usage intervals to prevent the reuse of the same UID.

[0003] However, to improve production efficiency, multiple test machines are usually allocated for testing simultaneously. Therefore, it's necessary to rationally allocate the usage range of UIDs so that different test machines use different UID numbers. In the testing process of existing semiconductor devices, different test machines typically use different test programs, each program independently accessing the same UID pool. When the UIDs in this pool are exhausted, testing must stop and wait for engineers to update the corresponding UID pool before continuing.

[0004] During testing, a single test program can only use one UID pool, and a single UID pool can only be used by one test program, thus preventing the reuse of UIDs by different test equipment. If multiple test equipment simultaneously tests multiple batches of the same model of semiconductor devices, different UID pools must be used. This results in test programs from being incompatible between different equipment. Furthermore, having only one test equipment use a single UID pool prevents the maximum utilization of the pool. Moreover, using different UID pools for multiple batches of the same model of semiconductor devices makes it difficult to track quality issues with that model of semiconductor device. Summary of the Invention

[0005] The purpose of this invention is to provide a testing method for semiconductor devices. When testing semiconductor devices of the same model, multiple testing machines can call the same test program, avoiding the situation where the same UID pool is used by different testing machines, thereby reducing the probability of chip scrap. Simultaneously, multiple testing machines can use the same UID pool at the same time, maximizing the use of the UID pool and improving testing efficiency.

[0006] To achieve the above objectives, the present invention provides a method for testing semiconductor devices, used to write a UID into a semiconductor device during semiconductor testing, comprising:

[0007] Write a test program, one of the test programs containing a UID pool, one of the UID pools being called by a test program, and the test programs called by semiconductor devices of the same model are the same.

[0008] Divide the aforementioned UID pool into several UID number segments; and

[0009] Semiconductor devices of the same model are divided into M parts, and N test machines are used to test the N parts of semiconductor devices simultaneously. Each test machine selects one part of the semiconductor device for testing. The test program of each test machine uses a UID number segment. The UID number segments selected by different test machines are different. Each test machine writes the corresponding UID number segment and its UID into the semiconductor device. One UID is written into one semiconductor device, and N≤M.

[0010] Optionally, in the semiconductor device testing method, the UID pool includes multiple UIDs, and each UID is stored in the UID pool by incrementing by one.

[0011] Optionally, in the semiconductor device testing method, each UID segment includes several UIDs, and each UID is stored in the UID segment by incrementing by one.

[0012] Optionally, in the semiconductor device testing method, a UID pool is divided into several UID segments.

[0013] Optionally, in the semiconductor device testing method, after the testing equipment calls the UID number segment, the number segment is marked as used.

[0014] Optionally, in the semiconductor device testing method, before the testing machine selects a UID segment, it further includes: determining whether the UID segment has been used; if it has not been used, then selecting the UID segment.

[0015] Optionally, in the semiconductor device testing method, after the UIDs included in the current UID segment of the testing equipment are used up, the next unused UID segment is automatically selected.

[0016] Optionally, in the semiconductor device testing method, the testing machine alarms after all the UID number segments are used up.

[0017] Optionally, in the semiconductor device testing method, the UID pool includes UIDs ranging from 0000000000 to 9999999999.

[0018] Optionally, in the semiconductor device testing method, the UID pool is divided into five UID segments: a first segment, a second segment, a third segment, a fourth segment, and a fifth segment. The first segment includes UIDs ranging from 0000000000 to 1999999999, the second segment includes UIDs ranging from 2000000000 to 3999999999, the third segment includes UIDs ranging from 4000000000 to 5999999999, the fourth segment includes UIDs ranging from 6000000000 to 7999999999, and the fifth segment includes UIDs ranging from 8000000000 to 9999999999.

[0019] Optionally, in the semiconductor device testing method, both the UID pool and the UID range are stored in a database.

[0020] In the semiconductor device testing method provided by this invention, when testing semiconductor devices of the same model, multiple testing machines can call the same test program, avoiding the situation where the same UID pool is called by different testing machines, thereby reducing the probability of chip scrap. Multiple testing machines using the same UID pool simultaneously maximizes the use of the UID pool, improving testing efficiency. Furthermore, the association of UIDs within the same UID pool, and the use of the same UID pool for semiconductor devices of the same model, also makes it easier to track quality issues in that batch of semiconductor devices. Attached Figure Description

[0021] Figure 1 This is a flowchart of a semiconductor device testing method according to an embodiment of the present invention. Detailed Implementation

[0022] The specific embodiments of the present invention will now be described in more detail with reference to the accompanying drawings. The advantages and features of the present invention will become clearer from the following description. It should be noted that the drawings are all in a very simplified form and use non-precise proportions, and are only used to facilitate and clarify the illustration of the embodiments of the present invention.

[0023] In the following text, the terms “first,” “second,” etc., are used to distinguish between similar elements and are not necessarily used to describe a specific order or chronological sequence. It should be understood that these terms, as used herein, may be replaced where appropriate. Similarly, if the methods described herein comprise a series of steps, and the order of these steps presented herein is not necessarily the only possible order in which they can be performed, and some described steps may be omitted and / or other steps not described herein may be added to the method.

[0024] Please refer to Figure 1 This invention provides a method for testing semiconductor devices, used to write a UID into a semiconductor device during semiconductor testing, comprising:

[0025] S1: Write a test program. A test program contains a UID pool. A UID pool is called by a test program. Furthermore, the test programs called by semiconductor devices of the same model are the same.

[0026] S2: Divide a UID pool into several UID number segments; and

[0027] S3: Divide semiconductor devices of the same model into M parts, and use N test machines to test the N parts of semiconductor devices simultaneously. Each test machine selects one part of the semiconductor device for testing. The test program of each test machine uses a UID number segment. The UID number segments selected by different test machines are different. Each test machine writes the corresponding UID number segment and its UID into the semiconductor device. One UID is written into one semiconductor device. N≤M, and M and N are both positive integers.

[0028] Preferably, the UID pool includes multiple UIDs, each of which is stored in the UID pool incremented by one. For example, the UIDs in the UID pool can be from 0000000000 to 9999999999, that is, the UIDs are 0000000000, 000000001, 0000000002, ..., and the UIDs are incremented by 1 sequentially until they reach 9999999999. In other embodiments of the present invention, other ranges of UIDs can also be used, and the changes in the UIDs can also follow other rules.

[0029] Preferably, each UID segment includes several UIDs. The UID pool can be divided into several UID segments equally or non-equally. When the UID pool is divided into several UID segments equally, each UID segment contains the same number of UIDs. For ease of management, this embodiment of the invention employs an method of evenly distributing the UID pool and a method of grouping adjacent segments of UIDs into one UID segment. Specifically, in this embodiment of the invention, the UID pool is divided into five equal UID segments: the first segment, the second segment, the third segment, the fourth segment, and the fifth segment. The first segment includes UIDs ranging from 0000000000 to 1999999999; the second segment includes UIDs ranging from 2000000000 to 3999999999; the third segment includes UIDs ranging from 40000000000 to 5999999999; the fourth segment includes UIDs ranging from 6000000000 to 7999999999; and the fifth segment includes UIDs ranging from 80000000000 to 9999999999. Since the UIDs are evenly distributed from the pool, each UID is incremented by one within each UID segment. If, as an example, this invention uses four testing machines—a first testing machine, a second testing machine, a third testing machine, and a fourth testing machine—to simultaneously test the same batch of semiconductor devices, the first testing machine can select any unused number segment from the five number segments, such as the first number segment, which is then marked as used. The second testing machine can select any unused number segment from the remaining four number segments, such as the second number segment, which is then marked as used. The third testing machine can select any unused number segment from the remaining three number segments, such as the third number segment, which is then marked as used. The fourth testing machine can select any unused number segment from the remaining two number segments, such as the fourth number segment, which is then marked as used. If the second number segment is exhausted, the second testing machine directly searches for an unused number segment, i.e., the fifth number segment, to continue testing.

[0030] Preferably, after the test machine calls a UID segment, the segment is marked as used. When writing test programs, already used UID segments can be marked as used, so that other test programs will not use the same UID segment based on the mark, thus preventing the problem of duplicate UID writing.

[0031] Preferably, before selecting a UID segment for the test machine, the following steps are also included: determining whether the UID segment has been used; if it has not been used, then the UID segment is selected.

[0032] Preferably, once the UIDs in the current UID segment of a test instrument are exhausted, the next unused UID segment is automatically selected. If the UID segment is not exhausted after the semiconductor device test is completed, it is marked as unused and can be reused for other semiconductor tests. Since different test programs use different UID pools, if multiple test instruments using different UID pools test the same type of semiconductor device (the same type of semiconductor refers to those with theoretically identical electrical characteristics; the same type of semiconductor may be divided into multiple batches, but the processes between batches are related and can be traced through the correlation of UID numbers), then if the program of one test instrument malfunctions, the test program of other test instruments cannot be directly copied. The operator needs to wait for engineers to modify the test program, wasting time and manpower. Furthermore, using the same UID pool for the same type of semiconductor device facilitates tracking. For example, if some semiconductor devices have quality problems, other semiconductor devices of the same type can be traced based on the correlation of UIDs. In this embodiment of the invention, when a UID segment is exhausted, the program does not need to be changed; it can automatically switch to the next unused UID segment. This not only reduces the number of times engineers need to change programs but also the number of times operators need to open programs, and it eliminates the waiting time between program switching. In short, it reduces the time spent testing semiconductor devices. Furthermore, reducing the number of times test programs need to be switched also reduces the probability of calling incorrect test programs or using duplicate or incorrect UID pools, thereby reducing the probability of chip failure.

[0033] Preferably, the test equipment alarms when all UID number segments are used up. After engineers have written the test program, the operator can directly call the program through the test equipment's interface when there is no need to change the program or the UID number pool. Once one UID number segment is used up, the next unused UID number segment is immediately called. This continues until all UID number segments are used up, at which point an alarm prompts engineers to write a new test program and replace the UID number pool.

[0034] Preferably, both the UID pool and the UID range are stored in a database. In this embodiment of the invention, both the UID pool and the UID range are stored in a database. The test program can be called by the test machine. The test program can be written by engineers through an engineer's host. Other devices such as routers and firewalls are also set up between the engineer's host, the test machine, and the database, which will not be described in detail here.

[0035] In summary, in the semiconductor device testing method provided by this invention, when testing semiconductor devices of the same model, multiple testing machines can call the same test program, avoiding the situation where the same UID pool is called by different testing machines, thereby reducing the probability of chip scrap. Multiple testing machines using the same UID pool simultaneously maximizes the use of the UID pool, improving testing efficiency. Furthermore, the association of UIDs within the same UID pool, and the use of the same UID pool for semiconductor devices of the same model, also makes it easier to track quality issues in that batch of semiconductor devices.

[0036] The above are merely preferred embodiments of the present invention and do not constitute any limitation on the present invention. Any equivalent substitutions or modifications made by those skilled in the art to the technical solutions and content disclosed in the present invention without departing from the scope of the present invention shall be deemed to have remained within the protection scope of the present invention.

Claims

1. A method of testing a semiconductor device for writing a UID into the semiconductor device during a semiconductor test, characterized by, The application comprises: writing test programs, one of which contains a UID number pool, one of which is called by a test program, and the same batch of semiconductor devices calls the same test program; dividing one of the UID number pools into several UID number segments; and dividing the same model of semiconductor devices into M parts, using N test machines to test N parts of the semiconductor devices at the same time, each of the test machines selecting one part of the semiconductor devices for testing, wherein the test program of each of the test machines selects a UID number segment, the UID number segments selected by different test machines are all different, each of the test machines writes the corresponding UID number segment and the UID therein into the semiconductor devices, one UID is written into one semiconductor device, and N≤M.

2. The method of testing a semiconductor device according to claim 1, wherein The UID number pool comprises a plurality of UIDs, each of which is saved in the UID number pool in an incremental manner.

3. The method of testing a semiconductor device of claim 1, wherein, Each of the UID number segments comprises a plurality of UIDs, each of which is saved in the UID number segment in an incremental manner.

4. The method of testing a semiconductor device of claim 1, wherein, One of the UID number pools is evenly divided into several UID number segments.

5. The method of testing a semiconductor device of claim 1, wherein, After the test machine calls a UID number segment, the segment is marked as used.

6. The method of testing a semiconductor device of claim 5, wherein, Before the test machine selects a UID number segment, it also includes judging whether the UID number segment has been used, if not, selecting the UID number segment.

7. The method of testing a semiconductor device of claim 6, wherein, After the current UID number segment of the test machine contains UIDs is used up, the next unused UID number segment is automatically selected.

8. The method of testing a semiconductor device of claim 1, wherein, After all of the UID number segments are used up, the test machine alarms.

9. The method of testing a semiconductor device of claim 1, wherein, The UIDs of the UID number pool include 0000000000-9999999999.

10. The method of testing a semiconductor device of claim 1, wherein, The UID number pool is divided into five UID number segments, namely the first number segment, the second number segment, the third number segment, the fourth number segment and the fifth number segment, the first number segment includes UIDs from 0000000000 to 1999999999, the second number segment includes UIDs from 2000000000 to 3999999999, the third number segment includes UIDs from 4000000000 to 5999999999, the fourth number segment includes UIDs from 6000000000 to 7999999999, and the fifth number segment includes UIDs from 8000000000 to 9999999999.

11. The method of testing a semiconductor device of claim 1, wherein, The UID number pool and the UID number segment are saved in the database.

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