A test stand and test method for solid state hard disk

Abstract

The present invention provides a test stand and a test method for a solid-state hard disk, comprising: a substrate, an automatic test unit, and an automatic transport unit: the substrate: a first test bench, a second test bench, and a third test bench are arranged on the substrate, a hard disk slot is arranged on the test bench, a buzzer is arranged on the left side of the test bench, and the buzzer is connected to the test bench through a data line; the automatic transport unit: the automatic transport unit comprises a slide rail, an automatic rotating rod, and a hard disk positioner, the hard disk positioner is fixed on the substrate and connected to the automatic rotating rod, and the end of the slide rail is provided with an automatic rotating rod; the automatic test unit: the automatic test unit comprises a test processor and a memory, the test processor is fixed inside the test bench, and the test processor is connected to the memory through a data line. The present invention can test multiple solid-state hard disks at the same time through the test stand, and there is no need to manually move the solid-state hard disks.

Description

Technical Field

[0001] The present invention relates to the field of solid state hard disks, and in particular to a test stand and a test method for solid state hard disks. Background Art

[0002] At present, solid-state drives on the market have gradually replaced traditional mechanical hard drives. After the solid-state drives are produced, they need to be tested for read-write ability, storage capacity, and life-endurance. However, the current solid-state drive test stand is inefficient and can only detect one solid-state drive at a time, and the solid-state drive needs to be manually inserted into the card slot, resulting in the solid-state drive test not being fully automated. For example, in CN201420498137-Solid-state drive test stand, although the solid-state drive test stand can test multiple solid-state drives at the same time, it does not realize the function of automatically transmitting solid-state drives. Therefore, a solid-state drive test stand can realize automatic detection of multiple solid-state drives at the same time, and can realize automatic transmission of solid-state drives. Improving the efficiency of solid-state drive testing is a direction we need to explore. Summary of the invention

[0003] The present invention provides a test stand and a test method for a solid state hard disk, which are used to solve the problem that the solid state hard disk test stand can only test one solid state hard disk at a time and needs manual replacement of the solid state hard disk.

[0004] A test rack for a solid state hard disk, comprising: a substrate, an automatic testing unit, and an automatic transport unit:

[0005] Base plate: The base plate is provided with a first test bench, a second test bench, and a third test bench. The test bench is provided with a hard disk slot. A buzzer is provided on the left side of the test bench. The buzzer is connected to the test bench through a data cable.

[0006] Automatic transport unit: The automatic transport unit includes a slide rail, an automatic rotating rod, and a hard disk positioner. The hard disk positioner is fixed on a base plate and connected to the automatic rotating rod. The end of the slide rail is provided with an automatic rotating rod.

[0007] Automatic test unit: The automatic test unit includes a test processor and a memory. The test processor is fixed inside the test bench, and the test processor and the memory are connected via a data line.

[0008] As an embodiment of the present invention, the first test bench, the second test bench and the third test bench are connected to a connecting device through data cables, and the connecting device is connected to a main power supply. When the main power supply is not powered, the connecting device is connected to a backup battery.

[0009] As an embodiment of the present invention, the test bench is connected to a display screen via a data line, and the test bench displays the test result via the display screen.

[0010] As an embodiment of the present invention, it also includes: a fixing clamp, which is located at the top of the automatic rotating rod, and the fixing clamp is electrically connected to the hard disk positioner through the automatic rotating rod, and is used to clamp and fix the solid state hard disk, and the slide rail includes a first slide rail and a second slide rail.

[0011] As an embodiment of the present invention, it also includes: a pressure sensor, one end of the pressure sensor is electrically connected to the hard disk slot through a data line, and the other end of the pressure sensor is connected to a buzzer.

[0012] As an embodiment of the present invention, a test device is further included. The test device is fixed inside the test bench. An interface of the test device is connected to a test processor, and another interface of the test device is connected to a memory.

[0013] As an embodiment of the present invention, the testing steps of the test stand include:

[0014] S1: moving the solid state hard disk through the first slide rail, transporting the solid state hard disk to the end of the first slide rail, and transmitting the position information of the solid state hard disk to the automatic rotating rod and the fixing clamp in real time through the hard disk locator;

[0015] S2: The automatic rotating rod and the fixing clamp grab the solid state hard disk according to the position information of the solid state hard disk, put it into the hard disk slot, perform hard disk testing, and obtain the test results;

[0016] S3: When the solid state hard disk test is completed, the fixing clip takes out the solid state hard disk and places the solid state hard disk on the second slide rail.

[0017] As an embodiment of the present invention, the S1 further includes the following steps:

[0018] S11: The three test benches are connected to a main power supply via a connecting device. When the main power supply is cut off, the connecting device is connected to a backup battery and performs power-off protection during a power-off.

[0019] As an embodiment of the present invention, the following steps are further included between S2 and S3:

[0020] S4: According to the test tasks in the test device, the solid state hard disk in the hard disk slot is subjected to a read and write test, a life test, and a storage test, and the test results are displayed on a display screen.

[0021] As an embodiment of the present invention, the S2 further includes the following steps:

[0022] S21: When the solid state hard disk is inserted into the hard disk slot, the contact port of the hard disk slot is detected. When the solid state hard disk data cannot be read through the contact port, the buzzer sounds an alarm.

[0023] S22: When the test result is abnormal, the buzzer sounds an alarm.

[0024] Other features and advantages of the present invention will be described in the following description, and partly become apparent from the description, or understood by practicing the present invention. The purpose and other advantages of the present invention can be realized and obtained by the structures particularly pointed out in the written description and the accompanying drawings.

[0025] The technical solution of the present invention is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0027] Figure 1 is a schematic diagram of a test stand for a solid state drive according to an embodiment of the present invention;

[0028] Figure 2 A flowchart of a testing method for a test stand for a solid state hard disk according to an embodiment of the present invention;

[0029] Figure 3 The present invention is a flowchart of buzzer operation steps of a testing method for a test stand for a solid state hard disk in an embodiment of the present invention. DETAILED DESCRIPTION

[0030] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention.

[0031] It should be noted that when a component is referred to as being "fixed to" or "disposed on" another component, it can be directly on the other component or indirectly on the other component. When a component is referred to as being "connected to" another component, it can be directly or indirectly connected to the other component.

[0032] It should be understood that the orientation or position relationship indicated by terms such as "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside" and "outside" are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0033] In addition, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations, and "multiple" means two or more, unless otherwise clearly and specifically limited. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0034] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

[0035] Embodiment 1:

[0036] The embodiment of the present invention provides a test stand for a solid state drive, comprising: a substrate, an automatic testing unit, and an automatic transport unit:

[0037] Base plate: The base plate is provided with a first test bench, a second test bench, and a third test bench. The test bench is provided with a hard disk slot. A buzzer is provided on the left side of the test bench. The buzzer is connected to the test bench through a data cable.

[0038] Automatic transport unit: The automatic transport unit includes a slide rail, an automatic rotating rod, and a hard disk positioner. The hard disk positioner is fixed on a base plate and connected to the automatic rotating rod. The end of the slide rail is provided with an automatic rotating rod.

[0039] Automatic test unit: The automatic test unit includes a test processor and a memory. The test processor is fixed inside the test bench, and the test processor and the memory are connected via a data line.

[0040] In an actual scenario: a solid-state hard disk test stand is composed of a fixing plate, a support column, a circuit board and other components. The support column is used to support the test stand, and the fixing plate is used to fix the support column. By providing multiple solid-state hard disk sockets on the fixing plate, multiple solid-state hard disks can be tested. However, inserting the solid-state hard disk requires manual operation, which is not smart enough.

[0041] When the present invention is implemented: first, three test benches are set on the base plate, each test bench is provided with three hard disk slots, a buzzer is provided on the left side of the test bench, and the buzzer is connected to the test bench through a data cable. When it is detected that the hard disk slot is not in contact with the solid-state hard disk, the buzzer sounds an alarm. When the solid-state hard disk is transported, the solid-state hard disk is placed on a slide rail, and the solid-state hard disk is transferred to one end close to the automatic rotating rod through the slide rail. The hard disk positioner is connected to the automatic rotating rod, and the hard disk position data is transferred to the automatic rotating rod. The automatic rotating rod moves the solid-state hard disk and inserts it into the hard disk slot for testing. The hard disk slot recognition error is reported through the buzzer, and after the test is completed, the solid-state hard disk is taken out and placed in another slide rail for solid-state hard disk transmission.

[0042] The beneficial effects of the above technical solution are as follows: in the present invention, three test benches are arranged on the substrate, and each test bench is provided with three hard disk slots. By providing multiple hard disk slots, multiple solid-state hard disks can be tested at the same time, thereby improving the working efficiency of the test stand. The hard disk position data is transmitted to the automatic rotating rod through the connection between the hard disk locator and the automatic rotating rod. The automatic rotating rod moves the solid-state hard disk and inserts it into the hard disk slot for testing. The solid-state hard disk is taken away through the automatic operation of the automatic rotating rod, thereby realizing the automatic replacement of the solid-state hard disk, freeing up manpower and avoiding waste of time due to staff errors.

[0043] Embodiment 2:

[0044] In one embodiment, the first test bench, the second test bench, and the third test bench are connected to a connecting device via data lines, and the connecting device is connected to a main power supply. When the main power supply is not powered, the connecting device is connected to a backup battery.

[0045] The working principle of the above technical solution is: in the present invention, the data lines of the three test benches are aggregated on a connecting device, and the connecting device is connected to the main power supply. When the connecting device detects that the connection with the main power supply is disconnected or suddenly disconnected, the power-off protection is immediately turned on and connected to the backup battery.

[0046] The beneficial effects of the above technical solution are as follows: in the present invention, the data lines of the three test benches are aggregated on the connecting device, and the power connections of the three test benches can be uniformly managed through the connecting device, and two power supply routes are set. When the main power supply cannot provide power to the test stand, there is a backup battery available, which provides double insurance for the power supply of the test stand and avoids sudden power outages that lead to test interruptions.

[0047] Embodiment 3:

[0048] In one embodiment, the test bench is connected to a display screen via a data line, and the test bench displays the test results via the display screen.

[0049] The working principle of the above technical solution is: in the present invention, the test bench is connected to the display screen through a data line, and the read-write test results, storage test results, and life test results are displayed in the form of charts through the display screen.

[0050] The beneficial effects of the above technical solution are as follows: in the present invention, the test bench is connected to the display screen via a data cable, and the read and write test results, storage test results, and life test results are displayed, and the test results can be displayed without connecting the test stand to a computer.

[0051] Embodiment 4:

[0052] In one embodiment, it also includes: a fixing clamp, which is located at the top of the automatic rotating rod, and the fixing clamp is electrically connected to the hard disk positioner through the automatic rotating rod, and is used to clamp and fix the solid state hard disk, and the slide rail includes a first slide rail and a second slide rail.

[0053] The working principle of the above technical solution is as follows: in the present invention, the solid-state hard disk on the slide rail can be moved to the hard disk slot through the automatic rotating rod, and a fixing clamp needs to be installed at the top of the automatic rotating rod. The hard disk locator is connected to the fixing clamp and the automatic rotating rod. The hard disk locator transmits the hard disk position information to the fixing clamp and the automatic rotating rod in real time. The fixing clamp and the automatic rotating rod fix and move the solid-state hard disk according to the real-time solid-state hard disk position information, and insert the solid-state hard disk into the hard disk slot. The slide rail includes a first slide rail and a second slide rail. The first slide rail is used to transfer the solid-state hard disk to the automatic rotating rod for solid-state hard disk testing. The second slide rail is used to clamp the solid-state hard disk out with the fixing clamp and put it into the second slide rail after the test is completed.

[0054] The beneficial effects of the above technical solution are as follows: in the present invention, by connecting the fixing clip and the automatic rotating rod to form a gripper that can move and fix the solid-state hard disk, the combination can realize the intelligent movement of the solid-state hard disk, and there is no need to manually insert the solid-state hard disk into the hard disk slot. The solid-state hard disk that has been tested and the solid-state hard disk to be tested can be distinguished by the first slide rail and the second slide rail to prevent confusion.

[0055] Embodiment 5:

[0056] In one embodiment, it further includes: a pressure sensor, one end of which is electrically connected to the hard disk slot via a data line, and the other end of which is connected to a buzzer.

[0057] The working principle of the above technical solution is as follows: in the present invention, a pressure sensor is connected to the hard disk slot to detect the contact port between the hard disk slot and the solid-state hard disk. When the pressure sensor detects that the pressure value of the port is too high or too low, an alarm is sounded through a buzzer, and the solid-state hard disk needs to be taken out and inserted again.

[0058] The beneficial effects of the above technical solution are as follows: in the present invention, by detecting the contact port between the hard disk slot and the solid-state hard disk, it is determined whether the contact between the hard disk slot and the solid-state hard disk is good. When it is detected that the pressure value is not within the normal range, an alarm is sounded through a buzzer, and the solid-state hard disk needs to be taken out and inserted again to ensure the correct placement of the solid-state hard disk.

[0059] Embodiment 6:

[0060] In one embodiment, a test device is further included. The test device is fixed inside the test bench. An interface of the test device is connected to a test processor, and another interface of the test device is connected to a memory.

[0061] The working principle of the above technical solution is as follows: In the present invention, test tasks are stored in the test device, and the test tasks include read-write test, storage test and life test. Each test has the voltage and current values ​​required by its own test task. The test device is connected to the test processor through the interface of the test device, and the voltage and current values ​​when testing the solid-state hard disk are adjusted to obtain the voltage and current values ​​required for the test. The read-write speed test is also performed on the tester through another interface of the test device and the memory.

[0062] The beneficial effects of the above technical solution are as follows: in the present invention, the interface of the test device is connected to the test processor, the test task is sent from the test device to the test processor, the voltage and current required for the test task are obtained by the test processor, and when the solid-state hard disk is tested, the voltage value and current value required for the solid-state hard disk test are adjusted to obtain the voltage value and current value. The voltage value and current value can be intelligently adjusted by the test processor, thereby improving the accuracy of the test.

[0063] Embodiment 7:

[0064] In one embodiment, the testing steps of the test frame include:

[0065] S1: moving the solid state hard disk through the first slide rail, transporting the solid state hard disk to the end of the first slide rail, and transmitting the position information of the solid state hard disk to the automatic rotating rod and the fixing clamp in real time through the hard disk locator;

[0066] S2: The automatic rotating rod and the fixing clamp grab the solid state hard disk according to the position information of the solid state hard disk, put it into the hard disk slot, perform hard disk testing, and obtain the test results;

[0067] S3: When the solid state hard disk test is completed, the fixing clip takes out the solid state hard disk and places the solid state hard disk on the second slide rail.

[0068] The working principle of the above technical scheme is as follows: in the present invention, the solid-state hard disk is moved by the first slide rail to the end of the first slide rail, and the hard disk locator transmits the position information of the solid-state hard disk to the automatic rotating rod and the fixed clamp in real time, and the automatic rotating rod moves up, down, left and right to approach the solid-state hard disk, and the fixed clamp fine-tunes the position to clamp the solid-state hard disk in the groove, and the automatic rotating rod drives the fixed clamp to insert the solid-state hard disk into the hard disk slot, and connects the hard disk slot and the solid-state hard disk port to read the hard disk information, and test the solid-state hard disk according to the test task of the test device, and send the read and write test results, storage test results, and life test results to the display screen to display in the form of charts. When the test is completed, the fixed clamp takes out the solid-state hard disk and puts it into the second slide rail to transfer the solid-state hard disk.

[0069] The beneficial effects of the above technical solution are: in the present invention, the hard disk locator transmits the position information of the solid-state hard disk to the automatic rotating rod and the fixing clamp in real time, obtains the hard disk position information, and combines the information to realize the position movement of the solid-state hard disk. The solid-state hard disks can be distinguished by two sliding rails to avoid the situation where one solid-state hard disk is measured multiple times.

[0070] Embodiment 8:

[0071] In one embodiment, the S1 further comprises the following steps:

[0072] S11: The three test benches are connected to a main power supply via a connecting device. When the main power supply is cut off, the connecting device is connected to a backup battery and performs power-off protection during a power-off.

[0073] The working principle of the above technical solution is as follows: in the present invention, three test benches are connected to a connecting device via a data cable, and the connecting device is connected to two power lines. When the connecting device is connected to the main power supply, the backup battery is not connected. When it is detected that the main power supply does not provide power or a sudden power outage occurs, the connecting device is connected to the backup battery, and when a sudden power outage occurs, the power-off protection is immediately turned on to prevent test interruption.

[0074] The beneficial effects of the above technical solution are as follows: in the present invention, the power lines of the three test benches are aggregated through a connecting device, and the main power supply and the backup battery are connected through two power lines to prevent the main power supply from failing to provide power or a sudden power outage, thereby preventing the test from being interrupted.

[0075] Embodiment 9:

[0076] In one embodiment, the steps between S2 and S3 further include:

[0077] S4: According to the test tasks in the test device, the solid state hard disk in the hard disk slot is subjected to a read and write test, a life test, and a storage test, and the test results are displayed on a display screen.

[0078] The working principle of the above technical solution is: in the present invention, the test device sends the test task to the test processor, and the test processor adjusts the voltage and current values ​​of the solid-state hard disk read and write test, life test, and storage test according to the voltage and current values ​​of the test task, and sends the test results to the display screen for final display.

[0079] The beneficial effect of the above technical solution is as follows: in the present invention, by sending the test results to a display screen for final display, there is no need to connect the test stand to another display screen for result display, thereby reducing unnecessary steps in solid-state hardware testing.

[0080] As an embodiment of the present invention: the voltage value and current value of each task are obtained by the test processor, and the current value and voltage value at both ends of the solid state drive are changed when the test starts. First, the difference between the original current and the ideal current and the difference between the original voltage and the ideal voltage are calculated. The calculation formula is as follows:

[0081]

[0082] Among them, I0 is the original current value at both ends of the solid state drive, ΔI is the difference between the original current value and the current value required for the test, I1 is the current value required for the test, U1 is the voltage value required for the measurement, i is the start time of the test, and M is the end time of the test.

[0083] By calculating the original current value and the ideal current value, the difference between the two values ​​is obtained. By calculating the original voltage value and the ideal voltage value, the difference between the two values ​​is obtained.

[0084] Then change the current and voltage values ​​at both ends of the SSD:

[0085]

[0086] By calculating the difference between the original current and the ideal current, the ideal current for the test task can be directly increased or decreased based on the original current. By calculating the difference between the original voltage and the ideal voltage, the ideal voltage for the test task can be directly increased or decreased based on the original voltage.

[0087] The beneficial effects of the above technical solution are as follows: by calculating the original current value and the ideal current value, the current difference and the voltage difference are obtained, and the ideal voltage and the ideal current in the test task are obtained according to the current difference and the voltage difference. Through calculation, the original current value and the voltage value can be changed more quickly.

[0088] Embodiment 10:

[0089] In one embodiment, the S2 further comprises the following steps:

[0090] S21: When the solid state hard disk is inserted into the hard disk slot, the contact port of the hard disk slot is detected. When the solid state hard disk data cannot be read through the contact port, the buzzer sounds an alarm.

[0091] S22: When the test result is abnormal, the buzzer sounds an alarm.

[0092] The working principle of the above technical solution is as follows: in the present invention, one end of the buzzer is connected to the hard disk slot, and is used to detect the contact port of the hard disk slot. By judging whether the contact between the hard disk slot and the solid-state hard disk is good according to the pressure value of the contact port, the other end of the buzzer is connected to the test bench, and when an abnormality is detected in the test result, the buzzer sounds an alarm.

[0093] The beneficial effects of the above technical solution are as follows: in the present invention, a buzzer alarm is used to remind the inspection personnel that an abnormal test problem occurs during the solid-state hard disk inspection, and at the same time, a buzzer alarm is used to remind the staff to perform a secondary solid-state hard disk placement operation.

[0094] Those skilled in the art will appreciate that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hard disk embodiment, a complete software embodiment, or an embodiment in combination with software and hard disk. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage and optical storage, etc.) containing computer-usable program code.

[0095] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0096] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0097] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process in the computer or other programmable device. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0098] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A test stand for a solid state drive, characterized in that: include: Substrate, automatic test unit, automatic transport unit: Base plate: The base plate is provided with a first test bench, a second test bench, and a third test bench. The test bench is provided with a hard disk slot. A buzzer is provided on the left side of the test bench. The buzzer is connected to the test bench through a data cable. Automatic transport unit: The automatic transport unit includes a slide rail, an automatic rotating rod, and a hard disk positioner. The hard disk positioner is fixed on a base plate and connected to the automatic rotating rod. The end of the slide rail is provided with an automatic rotating rod. Automatic test unit: The automatic test unit includes a test processor and a memory. The test processor is fixed inside the test bench, and the test processor and the memory are connected via a data line. Also included is a test device, the test device is fixed inside the test bench, an interface of the test device is connected to the test processor, and another interface of the test device is connected to the memory; The test steps of the test frame include: S1: moving the solid state hard disk through the first slide rail, transporting the solid state hard disk to the end of the first slide rail, and transmitting the position information of the solid state hard disk to the automatic rotating rod and the fixing clamp in real time through the hard disk locator; S2: The automatic rotating rod and the fixing clamp grab the solid state hard disk according to the position information of the solid state hard disk, put it into the hard disk slot, perform hard disk testing, and obtain the test results; S3: When the solid state hard disk test is completed, the fixing clip takes out the solid state hard disk and places the solid state hard disk on the second slide rail; The following steps are also included between S2 and S3: S4: According to the test tasks in the test device, a read and write test, a life test, and a storage test are performed on the solid state hard disk in the hard disk slot, and the test results are displayed on a display screen; The voltage and current values ​​of each task are obtained by testing the processor. When the test starts, the current and voltage values ​​at both ends of the solid-state drive are changed to calculate the difference between the original current and the ideal current and the difference between the original voltage and the ideal voltage. The calculation formula is as follows: Wherein, I0 is the original current value at both ends of the solid state drive, ΔI is the difference between the original current value and the current value required for the test, I1 is the current value required for the test, U1 is the voltage value required for the measurement, i is the start time of the test, and M is the end time of the test; By calculating the original current value and the ideal current value, the difference between the two values ​​is obtained; by calculating the original voltage value and the ideal voltage value, the difference between the two values ​​is obtained; Then change the current and voltage values ​​at both ends of the SSD: By calculating the difference between the original current and the ideal current, the ideal current for the test task is obtained by directly increasing or decreasing the original current. By calculating the difference between the original voltage and the ideal voltage, the ideal voltage for the test task is obtained by directly increasing or decreasing the original voltage.

2. A test stand for a solid state drive as claimed in claim 1, characterized in that: The first test bench, the second test bench and the third test bench are connected to a connecting device through data lines. The connecting device is connected to a main power supply. When the main power supply is not supplying power, the connecting device is connected to a backup battery.

3. A test stand for a solid state drive as claimed in claim 1, characterized in that: The test bench is connected to the display screen via a data line, and the test bench displays the test results via the display screen.

4. A test stand for a solid state drive as claimed in claim 1, characterized in that: Also includes: A fixing clamp is located at the top of the automatic rotating rod. The fixing clamp is electrically connected to the hard disk positioner through the automatic rotating rod and is used to clamp and fix the solid state hard disk. The slide rail includes a first slide rail and a second slide rail.

5. A test stand for a solid state drive as claimed in claim 1, characterized in that: Also includes: A pressure sensor, one end of which is electrically connected to the hard disk slot via a data line, and the other end of which is connected to a buzzer.

6. A test stand and test method for a solid state drive as claimed in claim 1, characterized in that: The S1 further comprises the following steps: S11: The three test benches are connected to a main power supply via a connecting device. When the main power supply is cut off, the connecting device is connected to a backup battery and performs power-off protection during a power-off.

7. A test stand and test method for a solid state drive as claimed in claim 1, characterized in that: The S2 further comprises the following steps: S21: When the solid state hard disk is inserted into the hard disk slot, the contact port of the hard disk slot is detected, and when the solid state hard disk data cannot be read through the contact port, the buzzer sounds an alarm; S22: When the test result is abnormal, the buzzer sounds an alarm.

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